Data Sheet
V1.1 2009-08
Microcontrollers
32-Bit
TC1736
32-Bit Single-Chip Microcontroller
Edition 2009-08
Publishe d by
Infineon Technologies AG
81726 Munich, Germany
© 2009 Infineon Technologies AG
All Rights Reserved.
Legal Disclaimer
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characteristics. With respect to any examples or hints given herein, any typical values st ated herein and/or any
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and liabilities of any kind, incl uding without limitation, w arranties of non-infringement of intellectual property right s
of any third party.
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For further information on technology, delivery terms and conditions and prices, please contact the nearest
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Data Sheet
V1.1 2009-08
Microcontrollers
32-Bit
TC1736
32-Bit Single-Chip Microcontroller
TC1736
Data Sheet V1.1, 2009-08
Trademarks
TriCore® is a trademark of Infineon Technologies AG.
TC1736 Data Sheet
Revision History: V1.1, 2009-08
Previous Version: V1.0
Page Subjects (major changes since last revision)
Page 5-95 IDD for 40 MHz variant and the test condition is updated.
Page 5-115 The thermal resistance values are updated, the method used for the
specified thermal resistances is included.
Page 5-116 The package name is corrected.
Previous Version: V0.2
Page 2-25 Text which describes the endurance of PFlash and DFlash is enhanced.
Page 3-56 Input spike-filter info is added to PORST.
Page 3-56 A footnote is added to VDDMF .
Page 5-82 The spike-filters parameters are included, tSF1, tSF2.
Page 5-85 The maximum limit for IOZ1 is updated.
Page 5-93 The temperature sensor measurement time parameter is added.
Page 5-95 IDD for 40 MHz variant is added.
Page 5-101 The condition for HWCFG is deleted from hold time from PORST rising
edge.
Page 5-102 The power, pad, reset timing figure is updated.
Page 5-103 The notes under the PLL sections are updated.
We Listen to Your Comments
Any information within this document that you feel is wrong, unclear or missing at all?
Your feedback will help us to continuously improve the quality of this document.
Please send your proposal (including a reference to this document) to:
mcdocu.comments@infineon.com
TC1736
Table of Contents
Data Sheet 1 V1.1, 2009-08
Table of Contents
1 Summary of Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
2 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1 About this Document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1.1 Related Documentations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1.2 Text Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.1.3 Reserved, Undefined, and Unimplemented Terminology . . . . . . . . . . . . 9
2.1.4 Register Access Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.1.5 Abbreviations and Acronyms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.2 System Architecture of the TC1736 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2.2.1 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2.2.2 System Features of the TC1736 device . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3 High-Performance 32-Bit TriCore CPU . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.4 On-Chip System Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.4.1 Flexible Interrupt System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.4.2 Direct Memory Access Controller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.4.3 System Timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.4.4 System Control Unit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.4.4.1 Clock Generation Unit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.4.4.2 Features of the Watchdog Timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.4.4.3 Reset Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.4.4.4 External Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.4.5 General Purpose I/O Ports and Peripheral I/O Lines . . . . . . . . . . . . . . . 23
2.4.6 Program Memory Unit (PMU) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
2.4.6.1 Boot ROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
2.4.6.2 Overlay RAM and Data Acquisition . . . . . . . . . . . . . . . . . . . . . . . . . . 24
2.4.6.3 Emulation Memory Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
2.4.6.4 Tuning Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
2.4.6.5 Program and Data Flash . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
2.4.7 Data Access Overlay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
2.4.8 TC1736 Development Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
2.5 On-Chip Peripheral Units . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
2.5.1 Asynchronous/Synchronous Serial Interfaces . . . . . . . . . . . . . . . . . . . . 32
2.5.2 High-Speed Synchronous Serial Interfaces . . . . . . . . . . . . . . . . . . . . . . 34
2.5.3 Micro Second Channel Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
2.5.4 MultiCAN Controller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
2.5.5 Micro Link Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
2.5.6 General Purpose Timer Array (GPTAv5) . . . . . . . . . . . . . . . . . . . . . . . . 43
2.5.6.1 Functionality of GPTA0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
2.5.7 Analog-to-Digital Converter (ADC0, ADC1) . . . . . . . . . . . . . . . . . . . . . . 46
2.5.8 Fast Analog to Digital Converter (FADC) . . . . . . . . . . . . . . . . . . . . . . . . 47
TC1736
Table of Contents
Data Sheet 2 V1.1, 2009-08
2.6 On-Chip Debug Support (OCDS) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
2.6.1 On-Chip Debug Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
2.6.2 Real Time Trace . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
2.6.3 Calibration Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
2.6.4 Tool Interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52
2.6.5 Self-Test Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
2.6.6 FAR Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
3Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
3.1 TC1736 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
3.1.1 Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
3.1.2 Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
3.2 Pin Definitions and Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
3.2.1 Reset Behavior of the Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
4 Identification Registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
5 Electrical Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
5.1 General Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
5.1.1 Parameter Interpretation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
5.1.2 Pad Driver and Pad Classes Summary . . . . . . . . . . . . . . . . . . . . . . . . . 77
5.1.3 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
5.1.4 Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
5.2 DC Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
5.2.1 Input/Output Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
5.2.2 Analog to Digital Converters (ADC0/ADC1) . . . . . . . . . . . . . . . . . . . . . 85
5.2.3 Fast Analog to Digital Converter (FADC) . . . . . . . . . . . . . . . . . . . . . . . . 90
5.2.4 Oscillator Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
5.2.5 Temperature Sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
5.2.6 Power Supply Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
5.3 AC Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
5.3.1 Testing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
5.3.2 Output Rise/Fall Times . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
5.3.3 Power Sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
5.3.4 Power, Pad and Reset Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
5.3.5 Phase Locked Loop (PLL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
5.3.6 JTAG Interface Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106
5.3.7 DAP Interface Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 108
5.3.8 Peripheral Timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
5.3.8.1 Micro Link Interface (MLI) Timing . . . . . . . . . . . . . . . . . . . . . . . . . . 110
5.3.8.2 Micro Second Channel (MSC) Interface Timing . . . . . . . . . . . . . . . 112
5.3.8.3 SSC Master / Slave Mode Timing . . . . . . . . . . . . . . . . . . . . . . . . . . 113
5.4 Package and Reliability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
5.4.1 Package Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
TC1736
Table of Contents
Data Sheet 3 V1.1, 2009-08
5.4.2 Package Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
5.4.3 Flash Memory Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
5.4.4 Quality Declarations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
TC1736
Summary of Features
Data Sheet 4 V1.1, 2009-08
1 Summary of Features
High-performance 32-bit super-scalar TriCore V1.3.1 CPU with 4-stage pipeline
Superior real-time performance
Strong bit handling
Fully integrated DSP capabilities
Single precision Floating Point Unit (FPU)
Up to 80 MHz operation at full temperature range
Multiple on-chip memories
Up to 36 Kbyte Data Memory (LDRAM)
8 Kbyte Code Scratchpad Memory (SPRAM)
Up to 1 Mbyte Program Flash Memory (PFlash)
32 Kbyte Data Flash Memory (DFlash, represents 8Kbyte EEPROM)
Instruction Cache: up to 8Kbyte (ICACHE, configurable)
4 Kbyte Overlay Memory (OVRAM)
16 Kbyte BootROM (BROM)
8-Channel DMA Controller
Sophisticated interrupt system with 255 hardware priority arbitration levels serviced
by CPU
High performing on-chip bus structure
64-bit Local Memory Buses between CPU, Flash and Data Memory
32-bit System Peripheral Bus (SPB) for on-chip peripheral and functional units
One bus bridges (LFI Bridge)
Versatile On-chip Peripheral Units
Two Asynchronous/Synchronous Serial Channels (ASC) with baud rate generator,
parity, framing and overrun error detection
Two High-Speed Synchronous Serial Channels (SSC) with programmable data
length and shift direction
One serial Micro Second Bus interface (MSC) for serial port expansion to external
power devices
One High-Speed Micro Link interface (MLI) for serial inter-processor
communication
One MultiCAN Module with 2CAN nodes and 64 free assignable message objects
for high efficiency data handling via FIFO buffering and gateway data transfer
One General Purpose Timer Array Modules (GPTA) providing a powerful set of
digital signal filtering and timer functionality to realize autonomous and complex
Input/Output management
24 analog input lines for ADC
2 independent kernels (ADC0, ADC1)
Analog supply voltage range from 3.3 V to 5 V (single supply)
Performance for 12 bit resolution (@fADCI =10 MHz)
2 different FADC input channels
Extreme fast conversion, 21 cycles of fFADC clock (262.5 ns @ fFADC = 80 MHz)
TC1736
Summary of Features
Data Sheet 5 V1.1, 2009-08
10-bit A/D conversion (higher resolution can be achieved by averaging of
consecutive conversions in digital data reduction filter)
70 digital general purpose I/O lines (GPIO), 4 input lines
Digital I/O ports with 3.3 V capability
On-chip debug support for OCDS Level 1 (CPU, DMA, On Chip Bus)
Dedicated Emulation Device chip available (TC1736ED)
multi-core debugging, real time tracing, and calibration
four/five wire JTAG (IEEE 1149.1) or two wire DAP (Device Access Port) interface
Power Management System
Clock Generation Unit with PLL
Core supply voltage of 1.5 V
I/O voltage of 3.3 V
Full automotive temperature range: -40° to +125°C
Package variants:
PG-LQFP-144-10
TC1736
Summary of Features
Data Sheet 6 V1.1, 2009-08
Ordering Information
The ordering code for Infineon microcontrollers provides an exact reference to the
required product. This ordering code identifies:
The derivative itself, i.e. its function set, the temperature range, and the supply
voltage
The package and the type of delivery.
For the available ordering codes for the TC1736 please refer to the “Product Catalog
Microcontrollers”, which summarizes all available microcontroller variants.
This document describes the derivatives of the device.The Table 1 enumerates these
derivatives and summarizes the differences.
Table 1 TC1736 Derivative Synopsis
Derivative Ambient
Temperature Range PFlash LDRAM CPU
frequency
SAK-TC1736-128F80HL TA = -40oC to +125oC1 Mbyte 36 Kbyte 80MHz
SAK-TC1736-96F40HL TA = -40oC to +125oC 768 Kbyte 32 Kbyte 40 MHz
TC1736
Introduction
Data Sheet 7 V1.1, 2009-08
2 Introduction
The TC1736 32-Bit Single-Chip Microcontroller is a cost-optimized version of the
TC1767 32-Bit Single-Chip Microcon troller with less pin count and less functionalities. In
comparison to the TC1767, the TC1736 provides:
Less memories in general
•No PCP
Reduced functionality of the GPTA with less I/Os
Two CAN nodes only
Less analog inputs
Reduced CPU clock frequency
No LVDS capability for MSC0 output lines
The TC1736 Emulation Device is implemented as a TC1767 emulation device in a QFP-
144 package variant.
2.1 About this Document
This document is designed to be read primarily by design engineers and software
engineers who need a detailed description of the interactions of the TC1736 functional
units, registers, instructions, and exceptions.
This TC1736 Data Sheet describes the features of the TC1736 with respect to the
TriCore Architecture. Where the TC1736 directly implements TriCore architectural
functions, this manual simply refers to those functions as features of the TC1736. In all
cases where this manual describes a TC1736 feature without referring to the TriCore
Architecture, this means that the TC1736 is a direct implementation of the TriCore
Architecture.
Where the TC1736 implements a subset of TriCore architectural features, this manual
describes the TC1736 implementation, and then describes how it differs from the TriCore
Architecture. The differences between the TC1736 and the TriCore Architecture are
documented in the section for each subject.
2.1.1 Related Documentations
A complete description of the TriCore architecture is found in the document entitled
“TriCore Architecture Manual”. The architecture of the TC1736 is described separately
this way because of the configurable nature of the TriCore specification: Different
versions of the architecture may contain a different mix of systems components. The
TriCore architecture, however, remains constant across all derivative designs in order to
maintain compatibility.
This Data Sheets together with the “TriCore Architecture Manual” are required to
understand the complete functionalities of the TC1736 microcontroller .
TC1736
Introduction
Data Sheet 8 V1.1, 2009-08
Intro, V1.1
2.1.2 Text Conventions
This document uses the following text conventions for named components of the
TC1736:
Functional units of the TC1736 are given in plain UPPER CASE. For example: “The
SSC supports full-duplex and half-duplex synchronous communication”.
Pins using negative logic are indicated by an overline. For example: “The external
reset pin, ESR0, has dual-functionality.”.
Bit fields and bits in registers are in general referenced as
“Module_Register name.Bit field” or “Module_Register name.Bit”. For example: “The
Current CPU Priority Number bit field CPU_ICR.CCPN is cleared”. Most of the
register names contain a module name prefix, separated by an underscore character
“_” from the actual register name (for example, “ASC0_CON”, where “ASC0” is the
module name prefix, and “CON” is the kernel register name). In chapters describing
the kernels of the peripheral modules, the registers are mainly referenced with their
kernel register names. The peripheral module implementati on sections mainly refer
to the actual register names with module prefixes.
Variables used to describe sets of processing units or registers appear in mixed
upper and lower cases. For example, register name “MSGCFGn” refers to multiple
“MSGCFG” registers with variable n. The boundary of the variables are always given
where the register expression is first used (for example, “n = 0-31”), and may be
repeated when necessary.
The default radix is decimal. Hexadecimal constants are suffixed with a subscript
letter “H”, as in 100H. Binary constants are suffixed with a subscript letter “B”, as in:
111B.
When the extent of register fields, groups register bits, or groups of pins are
collectively named in the body of the document, they are represented as
“NAME[A:B]”, which defines a range for the named group from B to A. Individual bits,
signals, or pins are given as “NAME[C]” where the range of the variable C is given in
the text. For example: CFG[2:0] and SRPN[0].
Units are abbreviated as follows:
MHz = Megahertz
µs = Microseconds
kBaud, kbit = 1000 characters/bits p e r second
MBaud, Mbit = 1,000,000 characters/bits per second
Kbyte, KB = 1024 bytes of memory
Mbyte, MB = 1048576 bytes of memory
In general, the k prefix scales a unit by 1000 whereas the K prefix scales a unit by
1024. Hence, the Kbyte unit scales the expression preceding it by 1024. The
kBaud unit scales the expression preceding it by 1000. The M prefix scales by
1,000,000 or 1048576, and µ scales by .000001. For example, 1 Kbyte is
1024 bytes, 1 Mbyte is 1024 ×1024 bytes, 1 kBaud/kbit are 1000 characters/bits
TC1736
Introduction
Data Sheet 9 V1.1, 2009-08
per second, 1 MBaud/Mbit are 1000000 characters/bits per second, and 1 MHz is
1,000,000 Hz.
Data format quantities are defined as follows:
Byte = 8-bit quantity
Half-word = 16-bit quantity
Word = 32-bit quantity
Double-word = 64-bit quantity
2.1.3 Reserved, Undefined, and Unimplemented Terminology
In tables where register bit fields are defined, the following conventions are used to
indicate undefined and unimplemented function. Further more, types of bits and bit fields
are defined using the abbreviations as shown in Table 2-1.
Table 2-1 Bit Function Terminology
Function of Bits Description
Unimplemented,
Reserved Register bit fields named 0 indicate unimplemented functions
with the following behavior.
Reading these bit fields returns 0.
These bit fields should be written with 0 if the bit field is
defined as r or rh.
These bit fields have to be written with 0 if the bit field is
defined as rw.
These bit fields are reserved. The detailed description of these
bit fields can be found in the register descriptions.
rw The bit or bit field can be read and written.
rwh As rw, but bit or bit field can be also set or reset by hardware.
rThe bit or bit field can only be read (read-only).
wThe bit or bit field can only be written (write-only). A read to this
register will always give a default value back.
rh This bit or bit field can be modified by hardware (read-hardware,
typical example: status flags). A read of this bit or bit field give
the actual status of this bit or bit field back. Writing to this bit or
bit field has no effect to the setting of this bit or bit field.
TC1736
Introduction
Data Sheet 10 V1.1, 2009-08
Intro, V1.1
2.1.4 Register Access Modes
Read and write access to registers and memory locations are sometimes restricted. In
memory and register access tables, the terms as defined in Table 2-2 are used.
sBits with this attribute are “sticky” in one direction. If their reset
value is once overwritten by software, they can be switched
again into their reset state only by a reset operation. Software
cannot switch this type of bit into its reset state by writing the
register. This attribute can be combined to “rws” or “rwhs”.
fBits with this attribute are readable only when they are accessed
by an instruction fetch. Normal data read operations will return
other values.
Table 2-2 Access Terms
Symbol Description
U Access Mode: Access permitted in User Mode 0 or 1.
Reset Value: Value or bit is not changed by a reset operation.
SV Access permitted in Supervisor Mode.
R Read-only register.
32 Only 32-bit word accesses are permitted to this register/address range.
E Endinit-protected register/address.
PW Password-protected register/address.
NC No change, indicated register is not changed.
BE Indicates that an access to this address range generates a Bus Error.
nBE Indicates that no Bus Error is generated when accessing this address
range, even though it is either an access to an undefined address or the
access does not follow the given rules.
nE Indicates that no Error is generated when accessing this address or
address range, even though the access is to an undefined address or
address range. True for CPU accesses (MTCR/MFCR) to undefined
addresses in the CSFR range.
Table 2-1 Bit Function Terminology (cont’d)
Function of Bits Description
TC1736
Introduction
Data Sheet 11 V1.1, 2009-08
2.1.5 Abbreviations and Acronyms
The following acronyms and terms are used in this document:
ADC Analog-to-Digital Converter
AGPR Address General Purpose Register
ALU Arithmetic and Logic Unit
ASC Asynchronous/Synchronous Serial Controller
BCU Bus Control Unit
BROM Boot ROM & Test ROM
CAN Controller Area Network
CISC Complex Instruction Set Computing
CPS CPU Slave Interface
CPU Central Processing Unit
CSA Context Save Area
CSFR Core Special Function Register
DAP Device Access Port
DAS Device Access Server
DFLASH Data Flash Memory
DGPR Data General Purpose Register
DMA Direct Memory Access
DMI Data Memory Interface
ERU External Request Unit
EMI Electro-Magnetic Interference
FADC Fast Analog-to-Digital Converter
FAM Flash Array Module
FCS Flash Command State Machine
FIM Flash Interface and Control Module
FPI Flexible Peripheral Interconnect (Bus)
FPU Floating Point Unit
GPIO General Purpose Input/Output
GPR General Purpose Register
GPTA General Purpose Timer Array
TC1736
Introduction
Data Sheet 12 V1.1, 2009-08
Intro, V1.1
ICACHE Instruction Cache
I/O Input / Output
JTAG Joint Test Action Group = IEEE1149.1
LBCU Local Memory Bus Control Unit
LDRAM Local Data RAM
LFI Local Memory-to-FPI Bus Interface
LMB Local Memory Bus
LTC Local Timer Cell
MLI Micro Link Interface
MMU Memory Management Unit
MSB Most Significant Bit
MSC Micro Second Channel
NC Non-Connected
NMI Non-Maskable Interrupt
OCDS On-Chip Debug Support
OVRAM Overlay Memory
PMU Program Memory Unit
PLL Phase Locked Loop
PFLASH Program Flash Memory
PMI Program Memory Interface
PMU Program Memory Unit
RAM Random Access Memory
RISC Reduced Instruction Set Computing
SBCU System Peripheral Bus Control Unit
SCU System Control Unit
SFR Special Function Register
SPB System Peripheral Bus
SPRAM Scratch-Pad RAM
SRAM Static Data Memory
SRN Service Request Node
SSC Synchronous Serial Controller
TC1736
Introduction
Data Sheet 13 V1.1, 2009-08
2.2 System Architecture of the TC1736
The TC1736 combines three powerful technologies within one silicon die, achieving new
levels of power, speed, and economy for embedded applications:
Reduced Instruction Set Computing (RISC) processor architecture
Digital Signal Processing (DSP) operations and addressing modes
On-chip memories and peripherals
DSP operations and addressing modes provide the computational power necessary to
efficiently analyze complex real-world signals. The RISC load/store architecture
provides high computational bandwidth with low system cost. On-chip memory and
peripherals are designed to support even the most demanding high-bandwidth real-time
embedded control-systems tasks.
Additional High-level features of the TC1736 include:
Program Memory Unit – instruction memory and instruction cache
Serial communication interfaces – flexible synchronous and asynchronous modes
DMA Controller – DMA operations and interrupt servicing
General-purpose timers
High-performance on-chip buses
On-chip debugging and emulation facilities
Flexible interconnections to external components
Flexible power-management
System Features
Maximum CPU clock frequency: 80 MHz
Maximum System Peripheral Bus frequency: 80 MHz
The TC1736 is a high-performance microcontroller with TriCore CPU, program and data
memories, buses, bus arbitration, an interrupt controller, a DMA controller and several
on-chip peripherals. The TC1736 is designed to meet the needs of the most demanding
embedded control systems applications where the competing issues of
price/performance, real-time responsiveness, computational power, data bandwidth,
and power consumption are key design elements.
The TC1736 offers several versatile on-chip peripheral units such as serial controllers,
timer units, and Analog-to-Digital converters. Within the TC1736, all these peripheral
units are connected to the TriCore CPU/system via the System Peripheral Bus (SPB)
and the Local Memory Bus (LMB). Several I/O lines on the TC1736 ports are reserved
for these peripheral units to communicate with the external world.
STM System Timer
WDT Watchdog Timer
TC1736
Introduction
Data Sheet 14 V1.1, 2009-08
Intro, V1.1
2.2.1 Block Diagram
Figure 2-1 shows the block diagram of the TC1736.
Figure 2-1 TC1736 Block Diagram
GPTA
DMA
8 Channel
System Peri pheral Bus (SPB)
TC1736_BlockDiag
MultiCAN
(2 Nodes)
STM
LFI Bri dge
Abbreviations:
ICACHE: Instruction Cache
SPRAM: Scratch-Pad RAM
LDRAM: Local Dat a RAM
OVRAM: Overlay RAM
B ROM: B oot ROM
PFl ash: Program Flash
DFlash: Data Flash
TriCore
TM
CPU
PMI
8 KB SPRAM/
ICACHE
(configurable)
DMI
Up t o 3 6 KB LDRAM
CPS
FPU
Local Memory Bus (LMB)
MSC0
LBCU
PMU
Up to 1 MB PFLASH
32 KB DFLASH
16 KB BROM
4 KB OVRAM
SCU
ASC0
ASC1
SSC0
SSC1
PLL
ADC0
(3.3-5V)
ADC1
(3.3-5V)
FADC
(3.3V)
A nalog Inputs
MLI0
OCDSGPTA0 Ports
SBCU
16 44
TC1736
Introduction
Data Sheet 15 V1.1, 2009-08
2.2.2 System Features of the TC1736 device
The TC1736 has the following features:
Packages
PG-LQFP-144-10 package, 0.5 mm pitch
Clock Frequencies
Maximum CPU clock frequency: 80 MHz
Maximum SPB clock frequency: 80 MHz
TC1736
Introduction
Data Sheet 16 V1.1, 2009-08
Intro, V1.1
2.3 High-Performance 32-Bit TriCore CPU
TriCore (TC1.3.1) Architectural Highlights
Unified RISC MCU/DSP
32-bit architecture with 4 Gbytes unified data, program, and input/output address
space
Fast automatic context-switching
Multiply-accumulate unit
Floating point unit
Saturating integer arithmetic
High-performance on-chip peripheral bus (FPI Bus)
Register based design with multiple variable register banks
Bit handling
Packed data operations
Zero overhead loop
Precise exceptions
Flexible power management
High-Efficiency TriCore Instruction Set
16/32-bit instructions for reduced code size
Data types include: Boolean, array of bits, character, signed and unsigned integer,
integer with saturation, signed fraction, double-word integers, and IEEE-754 single-
precision floating point
Data formats include: Bit, 8-bit byte, 16-bit half-word, 32-bit word, and 64-bit double-
word data formats
Powerful instruction set
Flexible and efficient addressing mode for high code density
Integrated CPU related On-Chip Memories
8 KB instruction memory
configurable as SPRAM and ICACHE in 4 KB granularity
Up to 36 KB data memory (LDRAM)
On-chip SRAMs with parity error detection
TC1736
Introduction
Data Sheet 17 V1.1, 2009-08
2.4 On-Chip System Units
The TC1736 32-Bit Single-Chip Microcontroller offers several versatile on-chip system
peripheral units such as DMA controller, embedded Flash module, interrupt system and
ports.
2.4.1 Flexible Interrupt System
The TC1736 includes a programmable interrupt system with the following features:
Features
Fast interrupt response
Hardware arbitration
Programmable service request nodes (SRNs)
Flexible interrupt-prioritizing scheme with 255 interrupt priority levels per SRN to
choose from
Each SRN is mapped to the CPU interrupt system
2.4.2 Direct Memory Access Controller
The TC1736 includes a fast and flexible DMA controller with 8 independent DMA
channels (one DMA engine).
Features
independent DMA channels
Up to 16 selectable request inputs per DMA channel
2-level programmable priority of DMA channels within the DMA Sub-Block
Software and hardware DMA request
Hardware requests by selected on-chip peripherals and external inputs
3-level programmable priority of the DMA Sub-Block at the on-chip bus interfaces
Buffer capability for move actions on the buses (a t least 1 move per bus is buffered)
Individually programmable operation modes for each DMA channel
Single Mode: stops and disables DMA channel after a predefined number of DMA
transfers
Continuous Mode: DMA channel remains enabled after a predefined number of
DMA transfers; DMA transaction can be repeated
Programmable address modification
Two shadow register modes (with or without automatic re-set and direct write
access).
Full 32-bit addressing capability of each DMA channel
4 Gbyte address range
Data block move supports > 32 Kbyte per DMA transaction
Circular buffer addressing mode with flexible circular buffer sizes
TC1736
Introduction
Data Sheet 18 V1.1, 2009-08
Intro, V1.1
Programmable data width of DMA transfer/transaction: 8-bit, 16-bit, or 32-bit
Register set for each DMA channel
Source and destination address register
Channel control and status register
Transfer count register
Flexible interrupt generation (the service request node logic for the MLI channel is
also implemented in the DMA module)
DMA module is working on FPI frequency, LMB interface on LMB frequency.
Dependant on the target/destination address, Read/write requests from the Move
Engine are directed to the FPI, LMB, MLI or to the the Cerberus.
TC1736
Introduction
Data Sheet 19 V1.1, 2009-08
2.4.3 System Timer
The TC1736’s STM is designed for global system timing applications requiring both high
precision and long range.
Features
Free-running 56-bit counter
All 56 bits can be read synchronous ly
Different 32-bit portions of the 56-bit counter can be read synchronously
Flexible interrupt generation based on compare match with partial STM content
Driven b y maximum 80 MHz (= fSYS, default after reset = fSYS/2)
Counting starts automatically after a reset operation
STM registers are reset by an application reset if bit ARSTDIS.STMDIS is cleared. If
bit ARSTDIS.STMDIS is set, the STM registers are not reset.1).
STM can be halted in debug/suspend mode
Special STM register semantics provide synchronous views of the entire 56-bit counter,
or 32-bit subsets at different levels of resolution.
The maximum clock period is 256 ×fSTM. At fSTM = 80 MHz, for example, the STM counts
28.56 years before overflowing. Thus, it is capable of continuously timing the entire
expected product life time of a system without overflowing.
The STM can be optionally disabled for power-saving purposes, or suspended for
debugging purposes via its clock control register. In suspend mode of the TC1736
(initiated by writing an appropriate value to STM_CLC register), the STM clock is
stopped but all registers are still readable.
Due to the 56-bit width of the STM, it is not possible to read its entire content with one
instruction. It needs to be read with two load instructions. Since the timer would continue
to count between the two load operations, there is a chance that the two values read are
not consistent (due to possible overflow from the low part of the timer to the high part
between the two read operations). To enable a synchronous and consistent reading of
the STM content, a capture register (STM_CAP) is implemented. It latches the content
of the high part of the STM each time when one of the registers STM_TIM0 to STM_TIM5
is read. Thus, STM_CAP holds the upper value of the timer at exactly the same time
when the lower part is read. The second read operation would then read the content of
the STM_CAP to get the complete timer value.
The STM can also be read in sections from seven registers, STM_TIM0 through
STM_TIM6, that select increasingly higher-order 32-bit ranges of the STM. These can
be viewed as individual 32-bit timers, each with a different resolution and timing range.
The content of the 56-bit System Timer can be compared against the content of two
compare values stored in the STM_CMP0 and STM_CMP1 registers. Service requests
1) “STM registers” means all registers except STM_CLC, STM_SRC0, and STM_SRC1.
TC1736
Introduction
Data Sheet 20 V1.1, 2009-08
Intro, V1.1
can be generated on a compare match of the STM with the STM_CMP0 or STM_CMP1
registers.
Figure 2-2 provides an overview on the STM module. It shows the options for reading
parts of STM content.
Figure 2-2 General Block Diagram of the STM Module Registers
STM Module
00HSTM_CAP
STM_TIM6
STM_TIM5
00H
56-bit Sy st em Tim er
Address
Decoder
Clock
Control
MCB06185_mod
Compare Register 0
Interrupt
Control
Compare Register 1
PORST
STM_TIM4
STM_TIM3
STM_TIM2
STM_TIM1
STM_TIM0
STM_CMP1
STM_CMP0
Enable /
Disable
fSTM
STM
IR0
31 23 15 7 0
31 23 15 7 0
55 47 39 31 23 15 7 0
STM
IR1
to DMA etc.
TC1736
Introduction
Data Sheet 21 V1.1, 2009-08
2.4.4 System Control Unit
The following SCU introduction gives an overview about the TC1736 System Control
Unit (SCU).
2.4.4.1 Clock Generation Unit
The Clock Generation Unit (CGU) allows a very flexible clock generation for the TC1736.
During user program execution the frequency can be programmed for an optimal ratio
between performance and power consumption.
2.4.4.2 Features of the Watchdog Timer
The main features of the WDT are summarized here.
16-bit Watchdog counter
Selectable input frequency: fFPI/256 or fFPI/16384
16-bit user-definable reload value for normal Wa tchdog operation, fixed reload value
for Time-Out and Prewarning Modes
Incorporation of the ENDINIT bit and monitoring of its modifications
Sophisticated Password Access mechanism with fixed and user-definable password
fields
Access Error Detection: Invalid password (during first access) or invalid guard bits
(during second access) trigger the Watchdog reset generation
Overflow Error Detection: An overflow of the counter triggers the Watchdog reset
generation
Watchdog function can be disabled; access protection and ENDINIT monitor function
remain enabled
Double Reset Detection: If a Watchdog induced reset occurs twice, a severe system
malfunction is assumed and the TC1736 is held in reset until a system / class 0 reset
occurs.
2.4.4.3 Reset Operation
The following reset request triggers are available:
1 External power-on hardware reset request trigger; PORST, (cold reset)
2 External System Request reset triggers; ESR0 and ESR1 (warm reset)
Watchdog Timer (WDT) reset request trigger, (warm reset)
Software reset (SW), (warm reset)
Debug (OCDS) reset request trigger, (warm reset)
JTAG reset (special reset)
TC1736
Introduction
Data Sheet 22 V1.1, 2009-08
Intro, V1.1
There are two basic types of reset request triggers:
Trigger sources that do not depend on a clock, such as the PORST. This trigger force
the device into an asynchronous reset assertion independently of any clock. The
activation of an asynchronous reset is asynchronous to the system clock, whereas
its de-assertion is synchronized.
Trigger sources that need a clock in order to be asserted, such as the input signals
ESR0 and ESR1, the WDT trigger, the parity trigger, or the SW trigger.
2.4.4.4 External Interface
The SCU provides interface pads for system purpose. Various functions are covered by
these pins. Due to the different tasks some of the pads can not be shared with other
functions but most of them can be shared with other functions. The following functions
are covered by the SCU controlled pads:
Reset request triggers
Reset indication
Trap request triggers
Interrupt request triggers
Non SCU module triggers
The first three points are covered by the ESR pads and the last two points by the ERU
pads.
TC1736
Introduction
Data Sheet 23 V1.1, 2009-08
2.4.5 General Purpose I/O Ports and Peripheral I/O Lines
The TC1736 includes a flexible Ports structure with the following features:
Features
70 digital General-Purpose Input/Output (GPIO) port lines
Input/output functionality individually programmable for each port line
Programmable input characteristics (pull-up, pull-down, no pull device)
Programmable output driver strength for EMI minimization (weak, medium, strong)
Programmable output characteristics (push-pull, open drain)
Programmable alternate output functions
Output lines of each port can be updated port-wise or set/reset/toggled bit-wise
2.4.6 Program Memory Unit (PMU)
The devices of the AudoF family contain at least one Program Memory Unit. This is
named “PMU0”. Some devices contain additional PMUs which are named “PMU1”, …
In the TC1736, the PMU0 contains the following submodules:
The Flash command and fetch control interface for Program Flash and Data Flash.
The Overlay RAM interface with Online Data Acquisition (OLDA) support.
The Boot ROM interface.
The Emulation Memory interface.
The Local Memory Bus LMB slave interface.
Following memories are controlled by and belong to the PMU0:
1 Mbyte of Program Flash memory (PFlash)
32 Kbyte of Data Flash memory (DFlash, represents 8 Kbyte EEPROM)
16 Kbyte of Boot ROM (BROM)
4 Kbyte Overlay RAM (OVRAM)
TC1736
Introduction
Data Sheet 24 V1.1, 2009-08
Intro, V1.1
The following figure shows the block diagram of the PMU0:
Figure 2-3 PMU0 Basic Block Diagram
2.4.6.1 Boot ROM
The internal 16 Kbyte Boot ROM (BROM) is divided into two parts, used for:
firmware (Boot ROM), and
factory test routines (Test ROM).
The different sections of the firmware in Boot ROM provide startup and boot operations
after reset. The TestROM is reserved for special routines, which are used for testing,
stressing and qualification of the component.
2.4.6.2 Overlay RAM and Data Acquisition
The overlay memory OVRAM is provided in the PMU especially for redirection of data
accesses to program memory to the OVRAM by using the data overlay function. The
data overlay functionality itself is controlled in the DMI module.
PMU0
PMU0_BasicBlockDiag_generic
PMU
Control
Overlay RAM
Interface
Em ulati on M em o ry
(ED c hip only)
F lash Inter face M odul e
DFLASH
PFLASH
64 ROM C ont rol
BROM
64
Emulation
Memory
Interface
OVRAM
64
To/From
Loc al Memory Bus
LMB Inter face
Slave
64
64
64
64
TC1736
Introduction
Data Sheet 25 V1.1, 2009-08
For online data acquisition (OLDA) of application or calibration data a virtual 32 KB
memory range is provided which can be accessed without error reporting. Accesses to
this OLDA range can also be redirected to an overlay memory.
2.4.6.3 Emulation Memory Interface
In TC1736 Emulation Device, an Emulation Memory (EMEM) is provided, which can fully
be used for calibration via program memory or OLDA overlay. The Emulation Memory
interface shown in Figure 2-3 is a 64-bit wide memory interface that controls the CPU-
accesses to the Emulation Memory in the TC1736 Emulation Device. In the TC1736
production device, the EMEM interface is always disabled.
2.4.6.4 Tuning Protection
Tuning protection is required by the user to absolutely protect control data (e.g. for
engine control), serial number and user software, stored in the Flash, from being
manipulated, and to safely detect changed or disturbed data. For the internal Flash,
these protection requirements are excellently fulfilled in the TC1736 with
Flash read and write protection with user-specific protection levels, and with
dedicated HW and firmware, supporting the internal Flash read protection, and with
the Alternate Boot Mode.
Special tuning protection support is provided for external Flash, which must also be
protected.
2.4.6.5 Program and Data Flash
The embedded Flash modules of PMU0 includes 1 Mbyte of Flash memory for c ode or
constant data (called Program Flash) and additionally 32 Kbyte of Flash memory used
for emulation of EEPROM data (called Data Flash). The Program Flash is realized as
one independent Flash bank, whereas the Data Flash is built of two Flash banks,
allowing the following combinations of concurrent Flash operations:
Read code or data from Program Flash, while one bank of Data Flash is busy with a
program or erase operation.
Read data from one bank of Data Flash, while the other bank of Data Fl ash is busy
with a program or erase operation.
Program one bank of Data Flash while erasing the other bank of Data Flash, read
from Program Flash.
Both, the Program Flash and the Data Flash, provide error correction of single-bit errors
within a 64-bit read double-word, resulting in an extremely low failure rate. Read
accesses to Program Flash are executed in 256-bit width, to Data Flash in 64-bit width
(both plus ECC). Single-cycle burst transfers of up to 4 double-words and sequential
prefetching with control of prefetch hit are supported for Program Flash.
TC1736
Introduction
Data Sheet 26 V1.1, 2009-08
Intro, V1.1
The minimum programming width is the page, including 256 bytes in Program Flash and
128 bytes in Data Flash. Concurrent programming and erasing in Data Flash is
performed using an automatic erase suspend and resume function.
A basic block diagram of the Flash Module is shown in the following figure.
Figure 2-4 Basic Block Diagram of Flash Module
All Flash operations are controlled simply by transferring command sequences to the
Flash which are based on JEDEC standard. This user interface of the embedded Flash
is very comfortable, because all operations are controlled with high level commands,
such as “Erase Sector”. State transition s, such as termination of command execution, or
errors are reported to the user by maskable interrupts. Command sequences are
normally written to Flash by the CPU, but may also be issued by the DMA controller (or
OCDS).
The Flash also features an advanced read/write protection architecture, including a read
protection for the whole Flash array (optionally without Data Flash) and separate write
protection for all sectors (only Program Flash). Write protected sectors can be made re-
programmable (enabled with passwords), or they can be locked for ever (ROM function).
Each sector can be assigned to up to three different users for write protection. The
different users are organized hierarchically.
Program Flash Features and Functions
1 Mbyte on-chip Program Flash in PMU0.
Any use for instruction code or constant data.
256 bit read interface (burst transfer operation).
Page
Write
Buffers
256 byte
and
128 byte
PF-Read
Buffer
256 + 32 bi t
and
DF-Read
Buffer
64+8 bit
Voltage Cont r ol
Flash Arr ay M odule
FAM
Bank 0
Program
Flash
ECC Block
8
ECC Code
WR_DATA
RD_DATA
Flash I nterface& Cont r ol Module
FIM
64
64
64
64
R e ad B us
Write Bus
Fl ash Co m m and
S tat e M achi ne F CS
Addr Bus
Control
FSI
Address
Control
Flash_BasicBlockDiagram_generic.vsd
PMU
Bank 1
Data
Flash
Bank 0
Bank 1
Flash FSI & Ar ray
Redundancy
Control
SFRs
FSRAM
Microcode
8
TC1736
Introduction
Data Sheet 27 V1.1, 2009-08
Dynamic correction of single-bit errors during read access.
Transfer rate in burst mode: One 64-bit double-word per clock cycle.
Sector architec ture:
Eight 16 Kbyte, one 128 K byte and three 256 Kbyte sectors.
Each sector separately erasable.
Each sector lockable for protection against erase and program (write protection).
One additional configuration sector (not accessible to the user).
Optional read protection for whole Flash, with sophisticated read access supervision.
Combined with whole Flash write protection — thus supporting protection against
Trojan horse programs.
Sector specific write protection with support of re-programmability or locked forever.
Comfortable password checking for temporary disable of write or read protection.
User controlled configuration blocks (UCB) in configuration sector for keywords and
for sector-specific lock bits (one block for every user; up to three users).
Pad supply voltage (VDDP) also used for program and erase (no VPP pin).
Efficient 256 byte page program operation.
All Flash operations controlled by CPU per command sequences (unlock sequences)
for protection against unintended operation.
End-of-busy as well as error reporting with interrupt and bus error trap.
Write state machine for automatic program and erase, including verification of
operation quality.
Support of margin check.
Delivery in erased state (read all zeros).
Global and sector status information.
Overlay support with SRAM for calibration applications.
Configurable wait state selection for different CPU frequencies.
Endurance = 1000; minimum 1000 program/erase cycles per physical sector;
reduced endurance of 100 per 16 KB sector.
Operating lifetime (incl. Retention): 20 years with endurance=1000.
For further operating conditions see data sheet section “Flash Memory Parameters”.
Data Flash Features and Functions
32 Kbyte on-chip Flash, configured in two independent Flash banks of equal size.
64 bit read interface.
Erase/program one bank while data read access from the other bank.
Programming one bank while erasing the other bank using an automatic
suspend/resume function.
Dynamic correction of single-bit errors during read access.
Sector architec ture:
Two sectors of equal size.
Each sector separately erasable.
128 byte pages to be written in one step.
TC1736
Introduction
Data Sheet 28 V1.1, 2009-08
Intro, V1.1
Operational control per command sequences (unlock sequences, same as those of
Program Flash) for protection against unintended operation.
End-of-busy as well as error reporting with interrupt and bus error trap.
Write state machine for automatic program and erase.
Margin check for detection of problematic Flash bits.
Endurance = 30000 (can be device dependent); i.e. 30000 program/erase cycles per
sector are allowed, with a retention of min. 5 years.
Dedicated DFlash status information.
Other characteristics: Same as Program Flash.
TC1736
Introduction
Data Sheet 29 V1.1, 2009-08
2.4.7 Data Access Overlay
The data overlay functionality provides the capability to redirect data accesses by the
TriCore to program memory (internal Program Flash or external memory) to the Overlay
SRAM in the PMU, or to the Emulation Memory in Emulation Device ED. This
functionality makes it possible, for example, to modify the application’s test and
calibration parameters (which are typically stored in the program memory) during run
time of a program. Note that read and write data accesses from/to program memory are
redirected.
Attention: As the address translation is implemented in the DMI, it is only effective
for data accesses by the TriCore. Instruction fetches by the TriCore or
accesses by any other master (including the debug interface) are not
affected!
Summary of Features and Functions
16 overlay ranges (“blocks”) configurable for Program Flash and external memory
Support of 4 Kbyte embedded Overlay SRAM (OVRAM) in PMU
Support of up to 256 Kbyte overlay/calibration memory in Emulation Device (EMEM)
Support of Online Data Acquisition into range of up to 32 KB and of its overlay
Support of different overlay memory selections for every enabled overlay block
Sizes of overlay blocks selectable from 16 byte to 2 Kbyte for redirection to OVRAM
Sizes of overlay blocks selectable from 1 Kbyte to 128 Kbyte for redirection to EMEM
All configured overlay ranges can be enabled with only one register write access
TC1736
Introduction
Data Sheet 30 V1.1, 2009-08
Intro, V1.1
2.4.8 TC1736 Development Support
Overview about the TC1736 development environment:
Complete Development Support
A variety of software and hardware development tools for the 32-bit microcontroller
TC1736 are available from experienced international tool suppliers. The development
environment for the Infineon 32-bit microcontroller includes the following tools:
Embedded Development Environment for TriCore Products
The TC1736 On-chip Debug Support (OCDS) provides a JTAG port for
communication between external hardware and the system
The System Timer (STM) with high-precision, long-range timing capabilities
The TC1736 includes a power management system, a watchdog timer as well as
reset logic
TC1736
Introduction
Data Sheet 31 V1.1, 2009-08
2.5 On-Chip Peripheral Units
The TC1736 micro controller offers several versatile on-chip peripheral units such as
serial controllers, timer units, and Analog-to-Digital converters. Several I/O lines on the
TC1736 ports are reserved for these peripheral units to communicate with the external
world.
On-Chip Peripheral Units
Two Asynchronous/Synchronous Serial Channels (ASC0, ASC1) with baud rate
generator, parity, framing and overrun error detection
Two Synchronous Serial Channels (SSC0, SSC1) with programmable data length
and shift direction
One Micro Second Bus Interface (MSC0) for serial communication
One CAN Module with two CAN nodes (MultiCAN) for high-efficiency data handling
via FIFO buffering and gateway data transfer
One Micro Link Serial Bus Interfaces (MLI0) for serial multiprocessor communication
One General Purpose Timer Array (GPTA0) with a powerful set of digital signal
filtering and timer functionality to accomplish autonomous and complex Input/Output
management
Two Analog-to-Digital Converter Units (ADC0, ADC1) with 8-bit, 10-bit, or 12-bit
resolution.
One fast Analog-to-Digital Converter Unit (FADC)
TC1736
Introduction
Data Sheet 32 V1.1, 2009-08
Intro, V1.1
2.5.1 Asynchronous/Synchronous Serial Interfaces
The TC1736 includes two Asynchronous/Synchronous Serial Interfaces, ASC0 and
ASC1. Both ASC modules have the same functionality.
Figure 2-5 shows a global view of the Asynchronous/Synchronous Serial Interface
(ASC).
Figure 2-5 General Block Diagram of the ASC Interface
The ASC provides serial communication between the TC1736 and other
microcontrollers, microprocessors, or external peripherals.
The ASC supports full-duplex asynchronous communication and half-duplex
synchronous communication. In Synchronous Mode, data is transmitted or received
synchronous to a shift clock that is generated by the ASC internally. In Asynchronous
Mode, 8-bit or 9-bit data transfer, parity generation, and the number of stop bits can be
selected. Parity, framing, and overrun error detection are provided to increase the
reliability of data transfers. Transmission and reception of data is double-buffered. For
multiprocessor communication, a mechanism is included to distinguish address bytes
from data bytes. Testing is supported by a loop-back option. A 13-bit baud rate generator
provides the ASC with a separate serial clock signal, which can be accurately adjusted
by a prescaler implemented as fractional divider.
MCB05762_mod
Clock
Control
Address
Decoder
Interrupt
Control
f
ASC
ASC
Module
(Kernel) Port
Control
RXD
TXD
RXD
TXD
To DMA
EIR
TBIR
TIR
RIR
TC1736
Introduction
Data Sheet 33 V1.1, 2009-08
Features
Full-duplex asynchronous operating modes
8-bit or 9-bit data frames, LSB first
Parity-bit generation/checking
One or two stop bits
Baud rate from 5.0 Mbit/s to 1.19 bit/s (@ 80 MHz module clock)
Multiprocessor mode for automatic address/data byte detection
Loop-back capability
Half-duplex 8-bit synchronous operating mode
Baud rate from 10.0 Mbit/s to 813.8 bit/s (@ 80 MHz module clock)
Double-buffered transmitter/receiver
Interrupt generation
On a transmit buffer empty condition
On a transmit last bit of a frame condition
On a receive buffer full condition
On an error condition (frame, parity, overrun error)
Implementation features
Connections to DMA Controller
Connections of receiver input to GPTA (LTC) for baud rate detection and LIN break
signal measuring
TC1736
Introduction
Data Sheet 34 V1.1, 2009-08
Intro, V1.1
2.5.2 High-Speed Synchronous Serial Interfaces
The TC1736 includes two High-Speed Synchronous Serial Interfaces, SSC0 and SSC1.
Both SSC modules have the same functionality.
Figure 2-6 shows a global view of the Synchronous Serial interface (SSC) .
Figure 2-6 General Block Diagram of the SSC Interface
The SSC supports full-duplex and half-duplex serial synchronous communication up to
40 Mbit/s (@ 80 MHz module clock, Master Mode). The serial clock signal can be
generated by the SSC itself (Master Mode) or can be received from an external master
(Slave Mode). Data width, shift direction, clock polarity and phase are programmable.
This allows communication with SPI-compatible devices. Transmission and reception of
data are double-buffered. A shift clock generator provides the SSC with a separate serial
clock signal. One slave select input is available for slave mode operation. Eight
programmable slave select outputs (chip selects) are supported in Master Mode.
MCB06058_mod
Clock
Control
Address
Decoder
Interrupt
Control
fSSC
SSC
Module
(Kernel)
MRSTB
MTSR
Master
RIR
TIR
EIR
SLSI[7:1]
SLSI[7:1]
SLSO[7:0] SLSO[7:0]
MRST
MTSR
SCLK
MRSTA
MTSRB
MRST
MTSRA
SCLKB
SCLK
SCLKA
Slave
Slave
Master
Slave
Master
Port
Control
fCLC
Enable
M/S Select
DMA Reques ts
SLSOANDO[7:0] SLSOANDO[7:0]
SLSOANDI[7:0]
TC1736
Introduction
Data Sheet 35 V1.1, 2009-08
Features
Master and Slave Mode operation
Full-duplex or half-duplex operation
Automatic pad control possible
Flexible data format
Programmable number of data bits: 2 to 16 bits
Programmable shift direction: LSB or MSB shift first
Programmable clock polarity: Idle low or idle high state for the shift clock
Programmable clock/data phase: Data shift with leading or trailing edge of the shift
clock
Baud rate generation
Master Mode: 40.0 Mbit/s to 610.36 bit/s (@ 80 MHz module clock)
Slave Mode: 20 Mbit/s to 610.36 bit/s (@ 80 MHz module clock)
Interrupt generation
On a transmitter empty condition
On a receiver full condition
On an error condition (receive, phase, baud rate, transmit error)
Flexible SSC pin configuration
Seven slave select inputs SLSI[7:1] in Slave Mode
Eight programmable slave select outputs SLSO in Master Mode
Automatic SLSO generation with programmable timing
Programmable active level and enable control
Combinable with SLSO output signals from other SSC modules
TC1736
Introduction
Data Sheet 36 V1.1, 2009-08
Intro, V1.1
2.5.3 Micro Second Channel Interface
The Micro Second Channel (MSC) interface provides serial communication links
typically used to connect power switches or other peripheral devices. The serial
communication link includes a fast synchronous downstream channel and a slow
asynchronous upstream channel. Figure 2-7 shows a global view of the interface signals
of the MSC interface.
Figure 2-7 General Block Diagram of the MSC Interface
The downstream and upstream channels of the MSC module communicate with the
external world via nine I/O lines. Eight output lines are required for the serial
communication of the downstream channel (clock, data, and enable signals). One out of
eight input lines SDI[7:0] is used as serial data input signal for the upstream channel. The
source of the serial data to be transmitted by the downstream channel can be MSC
register contents or data that is provided on the ALTINL/ALTINH input lines. These input
lines are typica lly connected with other on-chip peripheral units (for example with a timer
unit such as the GPTA). An emergency stop input signal makes it possible to set bits of
the serial data stream to dedicated values in an emergency case.
Clock control, address decoding, and interrupt service request control are managed
outside the MSC module kernel. Service request outputs are able to trigger an interrupt
or a DMA request.
4
MSC
Module
(Kernel)
MCB06059
FCLN
Clock
Control
Address
Decoder
Interrupt
Control
f
MSC
fCLC
Downstream
Channel
Upstream
Channel
FCLP
EN0
EN1
EN2
EN3
SON
SOP
SDI[7:
0]
SR[3:0]
EMGSTOPMSC
ALTINL[15:0]
ALTINH[15:0]
To DMA 16
16 8
TC1736
Introduction
Data Sheet 37 V1.1, 2009-08
Features
Fast synchronous serial interface to connect power switches in particular, or other
peripheral devices via serial buses
High-speed synchronous serial transmission on downstream channel
Serial output clock frequency: fFCL =fMSC/2 (fMSCmax = 80 MHz)
Fractional clock divider for precise frequency control of serial clock fMSC
Command, data, and passive frame types
Start of serial frame: Software-contro lled, timer -controll ed, or free-running
Programmable upstream data frame length (16 or 12 bits)
Transmission with or without SEL bit
Flexible chip select generation indicates status during serial frame transmission
Emergency stop without CPU intervention
Low-speed asynchronous serial reception on upstream channel
Baud rate: fMSC divided by 4, 8, 16, 32, 64, 128, or 256 (fMSCmax = 80 MHz)
Standard asynchronous serial frames
Parity error checker
8-to-1 input multiplexer for SDI lines
Built-in spike filter on SDI lines
TC1736
Introduction
Data Sheet 38 V1.1, 2009-08
Intro, V1.1
2.5.4 MultiCAN Controller
The MultiCAN module provides two independent CAN nodes, representing two serial
communication interfaces. The number of available message objects 64.
Figure 2-8 Overview of the MultiCAN Module
The MultiCAN module contains two independently operating CAN nodes with Full-CAN
functionality that are able to exchange Data and Remote Frames via a gateway function.
Transmission and reception of CAN frames is handled in accordance to CAN
specification V2.0 B (active). Each CAN node can receive and transmit standard frames
with 11-bit identifiers as well as extended frames with 29-bit identifiers.
All two CAN nodes share a common set of message objects. Each message object can
be individually allocated to one of the CAN nodes. Besides serving as a storage
container for incoming and outgoing frames, message objects can be co mbined to build
gateways between the CAN nodes or to set up a FIFO buffer.
The message objects are organized in double-chained linked lists, where each CAN
node has its own list of message objects. A CAN node stor es f rames only into message
objects that are allocated to the message object list of the CAN node, and it transmits
only messages belonging to this message object list. A powerful, command-driven list
controller performs all message object list operations.
The bit timings for the CAN nodes are derived from the module timer clock (fCAN) and are
programmable up to a data rate of 1 Mbit/s. External bus transceivers are connected to
a CAN node via a pair of receive and transmit pins.
Mult iCAN Module Kernel
MCA06060_N2
CAN
Node 0
CAN Control
Message
Object
Buffer
64
Objects
CAN
Node 1
TXDC0
RXDC0
TXDC1
RXDC1
Linked
List
Control Port
Control
Clock
Control
Address
Decoder
Interrupt
Control
f
CAN
f
CLC
TC1736
Introduction
Data Sheet 39 V1.1, 2009-08
Features
Compliant with ISO 11898
CAN functionality according to CAN specification V2.0 B active
Dedicated control registers for each CAN node
Data transfer rates up to 1 Mbit/s
Flexible and powerful message transfer control and error handling capabilities
Advanced CAN bus bit timing analysis and baud rate detection for each CAN node
via a frame counter
Full-CAN functionality: A set of 64 message objects can be individually
Allocated (assigned) to any CAN node
Configured as transmit or receive object
Setup to handle frames with 11-bit or 29-bit identifier
Identified by a timestamp via a frame counter
Configured to remote monitoring mode
Advanced Acceptance Filtering
Each message object provides an individual acceptance mask to filter incoming
frames.
A message object can be configured to accept standard or extended frames or to
accept both standard and extended frames.
Message objects can be grouped into four priority classes for transmission and
reception.
The selection of the message to be transmitted first can be based on frame
identifier, IDE bit and RTR bit according to CAN arbitration rules, or on its order in
the list.
Advanced message object functionality
Message objects can be combined to build FIFO message buffers of arbitrary size,
limited only by the total number of message objects.
Message objects can be linked to form a gateway that automatically transfers
frames between 2 different CAN buses. A single gateway can link any two CAN
nodes. An arbitrary number of gateways can be defined.
Advanced data management
The message objects are organized in double-chained lists.
List reorganizations can be performed at any time, even during full operation of the
CAN nodes.
A powerful, command-driven list controller manages the organization of the list
structure and ensures consistency of the list.
Message FIFOs are based on the list structure and can easily be scaled in size
during CAN operation.
Static allocation commands offer compatibility with MultiCAN applications that are
not list-based.
Advanced interrupt handling
TC1736
Introduction
Data Sheet 40 V1.1, 2009-08
Intro, V1.1
Up to 16 interrupt output lines are available. Interrupt requests can be routed
individually to one of the 16 interrupt output lines.
Message post-processing notifications can be combined flexibly into a dedicated
register field of 256 notification bits.
TC1736
Introduction
Data Sheet 41 V1.1, 2009-08
2.5.5 Micro Link Interface
This TC1736 contains one Micro Link Interface, MLI0.
The Micro Link Interface (MLI) is a fast synchronous serial interface to exchange data
between microcontrollers or other devices, such as stand-alone peripheral components.
Figure 2-9 shows how two microcontrollers are typically connected together via their
MLI interfaces.
Figure 2-9 Typical Micro Link Interface Connection
Features
Synchronous serial communication between an MLI transmitter and an MLI receiver
Different system clock speeds supported in MLI transmitter and MLI receiver due to
full handshake protocol (4 lines between a transmitter and a receiver)
Fully transparent read/write access supported (= remote programming)
Complete address range of target device available
Specific frame protocol to transfer commands, addresses and data
Error detection by parity bit
32-bit, 16-bit, or 8-bit data transfers supported
Programmable baud rates
MLI transmitter baud rate: max. fMLI/2 (= 40 Mbit/s @ 80 MHz module clock)
MLI receiver baud rate: max. fMLI
Address range protection scheme to block unauthorized accesses
Multiple receiving devices supported
MCA06061
Controller 1
CPU
Peripheral
B
Peripheral
A
MLI
System Bus
Controller 2
CPU
Peripheral
D
Peripheral
C
MLI
System Bus
Memory Memory
TC1736
Introduction
Data Sheet 42 V1.1, 2009-08
Intro, V1.1
Figure 2-10 shows a general block diagram of the MLI module.
Figure 2-10 General Block Diagram of the MLI Modules
The MLI transmitter and MLI receiver communicate with other MLI receivers and MLI
transmitters via a four-line serial connection each. Several I/O lines of these connections
are available outside the MLI module kernel as a four-line output or input vector with
index numbering A, B, C and D. The MLI module internal I/O control blocks define which
signal of a vector is actually taken into account and also allow polarity inversions (to
adapt to different physical interconnection means).
4
MCB06062_mod
Port
Control
TREADY[D:A]
TVALID[D:A]
RCLK[D:A]
MLI
Transmitter
MLI
Receiver
MLI Module
TDATA
TCLK
RREADY[D:A]
RVALID[D:A]
RDATA[D:A]
Fract.
Divider I/O
Control
I/O
Control
Move
Engine
SR[7:0]
f
MLI
f
SYS
BRKOUT
4
4
4
4
4
TR[3:0]
TC1736
Introduction
Data Sheet 43 V1.1, 2009-08
2.5.6 General Purpose Timer Array (GPTAv5)
The TC1736 contains the General Purpose Timer Array (GPTA0). Figure 2-11 shows a
global view of the GPTA module.
The GPTA provides a set of timer, compare, and capture functionalities that can be
flexibly combined to form signal measurement and signal generation units. They are
optimized for tasks typical of engine, gearbox, and electrical motor control applications,
but can also be used to generate simple and complex signal waveforms required for
other industrial applications.
Figure 2-11 General Block Diagram of the GPTA Module in the TC1736
Signal
Generation Unit
MCB05910_TC1767
GT1
GT0
FPC5
FPC4
FPC3
FPC2
FPC1
FPC0
PDL1
PDL0
DCM2
DCM1
DCM0
DIGITAL
PLL
DCM3
GTC02
GTC01
GTC00
GTC31
Global
Timer
Cell Arra y
GTC03
GTC30
C lo ck Bus
GPTA0
C lock Generation Unit
Clock D istribu tion Unit
f
GPTA
LTC02
LTC01
LTC00
LTC63
Local
Timer
Cell Arra y
LTC03
LTC62
I/O Line Sharing U nit
Interrupt Sharing U nit
TC1736
Introduction
Data Sheet 44 V1.1, 2009-08
Intro, V1.1
2.5.6.1 Functionality of GPTA0
The General Purpose Timer Array (GPTA0) provides a set of hardware modules
required for high-speed digital signal processing:
Filter and Prescaler Cells (FPC) support input noise filtering and prescaler operation.
Phase Discrimination Logic units (PDL) decode the direction information output by a
rotation tracking system.
Duty Cycle Measurement Cells (DCM) provide pulse-width measurement
capabilities.
A Digital Phase Locked Loop unit (PLL) generates a programmable number of GPTA
module clock ticks during an input signal’s period.
Global Timer units (GT) driven by various clock sources are implemented to operate
as a time base for the associated Global Timer Cells.
Global Timer Cells (GTC) can be programmed to capture the contents of a Global
Timer on an external or internal event. A GTC may also be used to control an external
port pin depending on the result of an internal compare operation. GTCs can be
logically concatenated to provide a common external port pin with a complex signal
waveform.
Local Timer Cells (LTC) operating in Timer, Capture, or Compare Mode may also be
logically tied together to drive a common external port pin with a complex signal
waveform. LTCs – enabled in Timer Mode or Capture Mode – can be clocked or
triggered by various external or internal events.
On-chip Trigger and Gating Signals (OTGS) can be configured to provide trigger or
gating signals to integrated peripherals.
Input lines can be shared by an LTC and a GTC to trigger their programmed operation
simultaneously.
The following list summarizes the specific features of the GPTA units.
Clock Generation Unit
Filter and Prescaler Cell (FPC)
Six independent units
Three basic operating modes:
Prescaler, Delayed Debounce Filter, Immediate Debounce Filter
Selectable input sources:
Port lines, GPTA module clock, FPC output of preceding FPC cell
Selectable input clocks:
GPTA module clock, prescaled GPTA module clock, DCM cl ock, compen sated or
uncompensated PLL clock.
fGPTA/2 maximum input signal frequency in Filter Modes
Phase Discriminator Logic (PDL)
Two independent units
Two operating modes (2- and 3- sensor signals)
TC1736
Introduction
Data Sheet 45 V1.1, 2009-08
fGPTA/4 maximum in put signal frequency in 2-sensor Mode, fGPTA/6 maximum input
signal frequency in 3-sensor Mode
Duty Cycle Measurement (DCM)
Four independent units
0 - 100% margin and time-out handling
fGPTA maximum resolution
fGPTA/2 maximum input signal frequency
Digital Phase Locked Loop (PLL)
One unit
Arbitrary multiplication factor between 1 and 65535
fGPTA maximum resolution
fGPTA/2 maximum input signal frequency
Clock Distribution Unit (CDU)
One unit
Provides nine clock output signals:
fGPTA, divided fGPTA clocks, FPC1/FPC4 outputs, DCM clock, LTC prescaler clock
Signal Generation Unit
Global Timers (GT)
Two independent units
Two operating modes (Free-Running Timer and R eload Timer)
24-bit data width
fGPTA maximum resolution
fGPTA/2 maximum input signal frequency
Global Timer Cell (GTC)
32 units related to the Global Timers
Two operating modes (Capture, Compare and Capture after Compare)
24-bit data width
fGPTA maximum resolution
fGPTA/2 maximum input signal frequency
Local Timer Cell (LTC)
64 independent units
Three basic operating modes (Timer, Capture and Compare) for 63 units
Special compare modes for one unit
16-bit data width
fGPTA maximum resolution
fGPTA/2 maximum input signal frequency
Interrupt Sharing Unit
111 interrupt sources, generating up to 38 service requests
TC1736
Introduction
Data Sheet 46 V1.1, 2009-08
Intro, V1.1
On-chip Trigger Unit
16 on-chip trigger signals
I/O Sharing Unit
Interconnecting inputs and outputs from internal clocks, FPC, GTC, LTC, ports, and
MSC interface
2.5.7 Analog-to-Digital Converter (ADC0, ADC1)
The analog to digital converter module (ADC) allows the conversion of analog input
values into discrete digital values based on the successive approximation method.
The module contains 2 independent kernels (ADC0, ADC1) that can operate
autonomously or can be synchronized to each other. An ADC kernel is a unit used to
convert an analog input signal (done by an analog part) and provides means for
triggering conversions, data handling and storage (done by a digital part).
Figure 2-12 ADC Module with two ADC Kernels
Features of the Analog Part of each ADC Kernel
Input voltage range from 0V to analog supply voltage
Analog supply voltage range from 3.3 V to 5 V (single supply)
(5 V nominal supply voltage, performance degradation accepted for lower voltages)
ADC_2_kernels
AD
converter
anal og part kernel 0
conversion
control
di gi tal part kernel 0
...
analog
inputs data (resul t )
handling
request
control
bus
inter-
face
AD
converter
anal og part kernel 1
conversion
control
di gi tal part kernel 1
...
data (result)
handling
request
control
analog
inputs
TC1736
Introduction
Data Sheet 47 V1.1, 2009-08
Input multiplexer width of 16 possible analog input channels (not all of them are
necessarily available on pins)
VAREF and 1 alternative reference input at channel 0
Programmable sample time (in periods of fADCI)
Wide range of accepted analog clock frequencies fADCI
Multiplexer test mode (channel 7 input can be connected to ground via a resistor for
test purposes during run time by specific control bit)
Power saving mechanisms
Features of the Digital Part of each ADC Kernel
Independent result registers (16 independent registers)
5 conversion request sources (e.g. for external events, auto-scan, programmable
sequence, etc.)
Synchronization of the ADC kernels for concurrent conversion starts
Control an external analog multiplexer, respecting the additional set up time
Programmable sampling times for different channels
Possibility to cancel running conversions on demand with automatic restart
Flexible interrupt generation (possibility of DMA support)
Limit checking to reduce interrupt load
Programmable data reduction filter by adding conversion results
Support of conversion data FIFO
Support of suspend and power down modes
Individually programmable reference selection for each channel (with exception of
dedicated channels always referring to VAREF
2.5.8 Fast Analog to Digital Converter (FADC)
General Features
Extreme fast conversion, 21 cycles of fFADC clock (262.5 ns @ fFADC = 80 MHz)
10-bit A/D conversion (higher resolution can be achieved by averaging of
consecutive conversions in digital data reduction filter)
Successive approximation conversion method
Two differential input channels with impedance control overlaid with ADC1 inputs
Each differential input channel can also be used as single-ended input
Offset and gain calibration support for each channel
Programmable gain of 1, 2, 4, or 8 for each channel
Free-running (Channel Timers) or triggered conversion modes
Trigger and gating control for external signals
Built-in Channel Timers for internal triggering
Channel timer request periods independently selectable for each channel
Selectable, programmable digital anti-aliasing and data reduction filter block with four
independent filter units
TC1736
Introduction
Data Sheet 48 V1.1, 2009-08
Intro, V1.1
Figure 2-13 Block Diagram of the FADC Module with 2 Input Channels
SRx
MCB06065_m2
V
FAGND
V
DDAF
V
SSAF
V
DDMF
V
FAREF
V
SSMF
Interrupt
Control
TS[H:A]
GS[H:A]
Clock
Control
f
FADC
f
CLC
A/D
Converter
Stage
Data
Reduction
Unit
FAIN2P
FAIN2N
FAIN3P
FAIN3N
I nput S t ructure
Channel
Trigger
Control Channel
Timers
SRx
DMA
A/D
Control
V
DDIF
input
channel 2
input
channel 3
TC1736
Introduction
Data Sheet 49 V1.1, 2009-08
As shown in Figure 2-13, the main FADC functional blocks are:
An Input Structure containing the differential inputs and impedance control.
An A/D Converter Stage responsible for the analog-to-digital conversion including an
input multiplexer to select between the channel amplifiers
A Data Reduction Unit containing programmable anti-aliasing and data reduction
filters
A Channel Trigger Control block determining the trigger and gating conditions for the
FADC channels
A Channel Timer for each channel to independently trigger the conversions
An A/D Control block responsible for the overall FADC functionality
FADC Power Supply and References
The FADC module is supplied by the following power supply and reference voltage lines:
VDDMF / VSSMF: FADC Analog Channel Amplifier Power Supply (3.3 V)
VDDIF / VSSMF: FADC Analog Input Stage Power Supply (3.3 - 5 V),
the VDDIF supply does not appear as supply pin, because it is internally connected to
the VDDM supply of the ADC that is sharing the FADC input pins.
VDDAF / VSSAF: FADC Analog Part Power Supply (1.5 V),
to be fed in externally
VFAREF / VFAGND: FADC Reference Voltage (3.3 V max.) and FADC Reference
Ground
Input Structure
The input structure of the FADC in the TC1736 contains:
A differential analog input stage for each input channel to select the input impedance
(differential or single-ended measurement) and to decouple the FADC input signal
from the pins.
Input channels 2 and 3 are overlaid with ADC1 input signals (AN28, AN29, AN30,
AN31).
A channel amplifier for each input channel with a settling time (about 5µs) when
changing the characteristics of an input stage (changing between unused,
differential, single-ended N, or single-ended P mode).
TC1736
Introduction
Data Sheet 50 V1.1, 2009-08
Intro, V1.1
Figure 2-14 FADC Input Structure in TC1736
MCA06432_m2n
FAIN2N
FAIN2P
Anal og Input
Stages
Rp
Rn
Channel Ampli fi e r
Stages
gain
A/D
A/D
Control conversion
control
Converter Stage
CHNR
VDDAF VSSAF
FAIN3N
FAIN3P Rp
Rn
VDDIF VSSMF
VSSMF
VDDMF
VSSMF
VDDMF
TC1736
Introduction
Data Sheet 51 V1.1, 2009-08
2.6 On-Chip Debug Support (OCDS)
The TC1736 contains resources for different kinds of “debugging”, covering needs from
software development to real-time-tuning. These resources are either embedded in
specific modules (e.g. breakpoint logic of the TriCore) or part of a central peripheral
(known as CERBERUS).
2.6.1 On-Chip Debug Support
The classic software debug approach (start/stop, single-stepping) is supported by
several features labelled “OCDS Level 1”:
Run/stop and single-step execution for TriCore.
Means to request all kinds of reset without usage of sideband pins.
Halt-after-Reset for repeatable debug sessions.
Different Boot modes to use application software not yet programmed to the Flash.
A total of four hardware breakpoints for the TriCore based on instruction address,
data address or combination of both.
Unlimited number of software breakpoints (DEBUG instruction) for TriCore.
Debug event generated by access to a specific address via the system peripheral
bus.
Tool access to all SFRs and internal memories independent of the Core.
Two central Break S witches to collect debug events from all modules (TriCore, DM A,
BCU, break input pins) and distribute them selectively to breakable modules
(TriCore, break output pins).
Central Suspend Switch to suspend parts of the system (TriCore, Peripherals)
instead if breaking them as reaction to a debug event.
Dedicated interrupt resources to handle debug events inside TriCore (breakpoint
trap, software interrupt) and Cerberus, e.g. for implementing Monitor programs.
Access to all OCDS Level 1 resources also for TriCore for debug tools integrated into
the application code.
Triggered Transfer of data in response to a debug event; if target is programmed to
be a device interface simple variable tracing can be done.
In depth performance analysis and profiling support given by the Emulation Device
through MCDS Event Counters driven by a variety of trigger signals (e.g. cache hit,
wait state, interrupt accepted).
2.6.2 Real Time Trace
For detailed tracing of the system’s behavior a pin-compatible Emulation Device will be
available.1)
1) The OCDS L2 interface of AudoNG is not available.
TC1736
Introduction
Data Sheet 52 V1.1, 2009-08
Intro, V1.1
2.6.3 Calibration Support
Two main use cases are catered for by resources in addition the OCDS Level 1
infrastructure: Overlay of non-volatile on-chip memory and non-intrusive signaling:
4 KB SRAM for Overlay.
Can be split into up to 16 blocks which can overlay independent regions of on-chip
Data Flash.
Changing the configuration is triggered by a single SFR access to maintain
consistency.
Overlay configuration switch does not require the TriCore to be stopped or
suspended.
Invalidation of the Data Cache (maintaining write-back data) can be done
concurrently with the same SFR.
256 KB additional Overlay RAM on Emulation Device, shared with the trace
functionality.
A dedicated trigger SFR with 32 independent status bits is provided to centrally post
requests from application code to the host computer.
The host is notified automatically when the trigger SFR is updated by the TriCore. No
polling via a system bus is required.
2.6.4 Tool Interfaces
Three options exist for the communication channel between Tools (e.g. Debugger,
Calibration Tool) and TC1736:
Two wire DAP (Device Access Port) protocol for long connections or noisy
environments.
Four (or five) wire JTAG (IEEE 1149.1) for standardized manufacturing tests.
CAN (plus software linked into the application code) for low bandwidth deeply
embedded purposes.
DAP and JTAG are clocked by the tool.
Bit clock up to 40 MHz for JTAG, up to 80 MHz for DAP.
Hot attach (i.e. physical disconnect/reconnect of the host connection without reset of
the TC1736) for all interfaces.
Infineon standard DAS (Device Access Server) implementation for seamless,
transparent tool access over any supported interface.
Lock mechanism to prevent unaut horized tool access to critical application code.
TC1736
Introduction
Data Sheet 53 V1.1, 2009-08
2.6.5 Self-Test Support
Some manufacturing tests can be invoked by the application (e.g. after power-on) if
needed:
Hardware-accelerated checksum calculation (e.g. for Flash content).
2.6.6 FAR Support
To efficiently locate and identify faults after integration of a TC1736 into a system special
functions are available:
Boundary Scan (IEEE 1149.1) via JTAG and DAP.
SSCM (Single Scan Chain Mode1)) for structural scan testing of the chip itself.
1) This function requires access to some device pins (e.g. TESTMODE) in addition to those needed for OCDS.
TC1736
Pinning
Data Sheet 54 V1.1, 2009-08
3Pinning
3.1 TC1736 Pinning
Figure 3-1 shows the TC1736 logic symbol.
3.1.1 Logic Symbol
Figure 3-1 TC1736 Logic Symbol
TESTMODE
ESR0
PORST
Digital Circuitry
Power Supply
General C ontrol
AN[x:0]Analog Inp uts V
DDM
V
SSM
V
DDMF
V
SSMF
V
DDAF
V
AREF0
V
AGND0
V
FAREF
V
FAGND
V
DDFL3
Analog Pow er
Supply
TC1736_LogSym_144
V
DDOSC3
Alter nate Fu nctions
Oscillator
GPTA0, SCU
GPTA0, SS C1 ,
MLI0, MSC0
GPTA0, AS C0 /1 ,
SSC0/1, SCU, CAN
GPTA0, SCU
V
DDOSC
GPTA0, SSC0/1 ,
MLI0
V
SSOSC
TC1736
Port 0
12
Port 1
8
Port 2
14
Port 3
16
Port 4
2
Port 5
16
Port 9
2GPTA0
XTAL2
XTAL1
V
SS
9
V
DDP
9
V
DD
8
ESR1
TRST
TCK/DAP0
TDI/BRKIN/
BRKOUT
TDO/DAP2/
BRKIN/
BRKOUT
TMS / DAP1
OCDS /
JTAG Cont rol
GPTA0, SCU,
SSC1, OC DS
24
TC1736
Pinning
Data Sheet 55 V1.1, 2009-08
3.1.2 Pin Configuration
Figure 3-2 shows the pin configuration of the TC1736 package PG-LQFP-144-10.
Figure 3-2 Pin Configuration of PG-LQFP-144-10 Package (top view)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
45
46
47
48
49
50
51
52
53
TC1736 Pinning
39
40
41
42
43
44
37
38
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
97
96
95
94
93
92
91
90
89
100
99
98
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
143
144
133
134
135
136
137
138
140
141
142
139
PG-LQFP-144-10
VDDMF
VSSMF
VFAGND
VFAREF
OUT40/IN40/P5.0
OUT41/IN41/P5.1
OUT42/IN42/P5.2
OUT44/IN44/P5.4
OUT43/IN43/P5.3
OUT45/IN45/P5.5
OUT46/IN46/P5.6
OUT47/IN47/P5.7
RDATA0B/P5.8
RVALID0B/P5.9
RREADY0B/P5.10
RCLK0B/P5.11
SLSO07/TDATA0/P5.12
SLSO16/TVALID0B/P5.13
TREADY0B/P5.14
TCLK0/P5.15
VDD
VDDP
VSS
OUT80/P9.0
OUT81/P9.1
VDDP
1) VDD
AN29
AN28
AN7
AN25
AN23
AN30
AN31
VDDAF
VSS
TCLK0/OUT32/IN32/P2.0
TREADY0A/SLSO13/SLSO03/OUT33/IN33/P2.1
TVALID0/OUT34/IN34/P2.2
TDATA0/OUT35/IN35/P2.3
RCLK0A/OUT36/IN36/P2.4
RREADY0A/OUT37/IN37/P2.5
RVALID0A/OUT38/IN38/P2.6
RDATA0A/OUT39/IN39/P2.7
AN14
AN15
AN16
AN19
VDD
VDDP
VSS
VDD
VDDP
VSS
VSSM
AN13
AN0
AN1
AN2
AN3
AN4
AN5
AN6
AN8
AN9
AN10
AN11
AN12
VAGND0
VAREF0
VDDM
EXTCLK1/OUT54/OUT30/IN54/IN30/P4.2
P1.1/IN17/OUT17/OUT73
P1.4/IN20/OUT20/OUT76/EMGSTOP
P1.8/IN24/OUT24/IN48/OUT48/MTSR1B
P1.9/IN25/OUT25/IN49/OUT49/MRST1B
P1.10/IN26/OUT26/IN50/OUT50/SLSO17
P1.11/IN27/OUT27/IN51/OUT51/SCLK1B
P3.2/SCLK0/OUT86
P3.3/MRST0/OUT87
P3.4/MTSR0/OUT88
P3.5/SLSO00/SLSO10/SLSOANDO0
P3.6/SLSO01/SLSO11/SLSOANDO1
P3.8/SLSO06/TXD1/OUT90
VDD
VDDOSC
VDDOSC3
VSSOSC
VDDP
VSS
XTAL1
XTAL2
TMS/DAP1
TCK/DAP0
TESTMODE
VDD
VDDP
VSS
P3.7/SLSO02/SLSO12/SLSI01/OUT89
P1.15/BRKIN/BRKOUT
TRST
TDI/BRKIN/BRKOUT
P1.0/IN16/OUT16/OUT72/BRKIN/BRKOUT
PORST
ESR1
ESR0
P4.3/IN31/IN55/OUT31/OUT55/EXTCLK0
TDO/DAP2/BRKIN/BRKOUT
1) This p i n is used as standb y
power supply in emulation device.
VDDFL3
VDDP
VSS
VDD
VDDP
VSS
P0.0/IN0/OUT0/OUT56/HWCFG0
P0.1/IN1/OUT1/OUT57/HWCFG1
P0.2/IN2/OUT2/OUT58/HWCFG2
P0.3/IN3/OUT3/OUT59/HWCFG3
P0.4/IN4/OUT4/OUT60/HWCFG4
P0.5/IN5/OUT5/OUT61/HWCFG5
P0.6/IN6/OUT6/OUT62/REQ2/HWCFG6
P0.7/IN7/OUT7/OUT63/REQ3/HWCFG7
P0.12/IN12/OUT12/OUT68
P0.13/IN13/OUT13/OUT69
P0.14/IN14/OUT14/OUT70/REQ4
P0.15/IN15/OUT15/OUT71/REQ5
P2.8/SLSO04/SLSO14/EN00
P2.9/SLSO05/SLSO15/EN01
P2.10/MRST1A
P2.11/SCLK1A/FCLP0B
P2.12/MTSR1A/SOP0B
P2.13/SLSI11/SDI0
P3.0/RXD0A/OUT84
P3.1/TXD0/OUT85
P3.9/RXD1A/OUT91
P3.10/REQ0/OUT92
P3.11/REQ1/OUT93
P3.12/RXDCAN0/RXD0B/OUT94
P3.13/TXDCAN0/TXD0/OUT95
P3.14/RXDCAN1/RXD1B/OUT96
P3.15/TXDCAN1/TXD1B/OUT97
VDD
VDDP
VSS
TC1736
Pinning
Data Sheet 56 V1.1, 2009-08
3.2 Pin Definitions and Functions
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1)
Pin Symbol Ctrl. Type Function
Port 0
121 P0.0 I/O0 A1/
PU Port 0 General Purpose I/O Line 0
IN0 I GPTA0 Input 0
HWCFG0 I Hardware Configuration Input 0
OUT0 O1 GPTA0 Output 0F
OUT56 O2 GPTA0 Output 56
Reserved O3
122 P0.1 I/O0 A1/
PU Port 0 General Purpose I/O Line 1
IN1 I GPTA0 Input 1
HWCFG1 I Hardware Configuration Input 1
OUT1 O1 GPTA0 Output 1
OUT57 O2 GPTA0 Output 57
Reserved O3
123 P0.2 I/O0 A1/
PU Port 0 General Purpose I/O Line 2
IN2 I GPTA0 Input 2
HWCFG2 I Hardware Configuration Input 2
OUT2 O1 GPTA0 Output 2
OUT58 O2 GPTA0 Output 58
Reserved O3
124 P0.3 I/O0 A1/
PU Port 0 General Purpose I/O Line 3
IN3 I GPTA0 Input 3
HWCFG3 I Hardware Configuration Input 3
OUT3 O1 GPTA0 Output 3
OUT59 O2 GPTA0 Output 59
Reserved O3
TC1736
Pinning
Data Sheet 57 V1.1, 2009-08
134 P0.4 I/O0 A1/
PU Port 0 General Purpose I/O Line 4
IN4 I GPTA0 Input 4
HWCFG4 I Hardware Configuration Input 4
OUT4 O1 GPTA0 Output 4
OUT60 O2 GPTA0 Output 60
Reserved O3
135 P0.5 I/O0 A1/
PU Port 0 General Purpose I/O Line 5
IN5 I GPTA0 Input 5
HWCFG5 I Hardware Configuration Input 5
OUT5 O1 GPTA0 Output 5
OUT61 O2 GPTA0 Output 61
Reserved O3
141 P0.6 I/O0 A1/
PU Port 0 General Purpose I/O Line 6
IN6 I GPTA0 Input 6
HWCFG6 I Hardware Configuration Input 6
REQ2 I External Request Input 2
OUT6 O1 GPTA0 Output 6
OUT62 O2 GPTA0 Output 62
Reserved O3
142 P0.7 I/O0 A1/
PU Port 0 General Purpose I/O Line 7
IN7 I GPTA0 Input 7
HWCFG7 I Hardware Configuration Input 7
REQ3 I External Request Input 3
OUT7 O1 GPTA0 Output 7
OUT63 O2 GPTA0 Output 63
Reserved O3
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 58 V1.1, 2009-08
136 P0.12 I/O0 A1/
PU Port 0 General Purpose I/O Line 12
IN12 I GPTA0 Input 12
OUT12 O1 GPTA0 Output 12
OUT68 O2 GPTA0 Output 68
Reserved O3
137 P0.13 I/O0 A1/
PU Port 0 General Purpose I/O Line 13
IN13 I GPTA0 Input 13
OUT13 O1 GPTA0 Output 13
OUT69 O2 GPTA0 Output 69
Reserved O3
143 P0.14 I/O0 A1/
PU Port 0 General Purpose I/O Line 14
IN14 I GPTA0 Input 14
REQ4 I External Request Input 4
OUT14 O1 GPTA0 Output 14
OUT70 O2 GPTA0 Output 70
Reserved O3
144 P0.15 I/O0 A1/
PU Port 0 General Purpose I/O Line 15
IN15 I GPTA0 Input 15
REQ5 I External Request Input 5
OUT15 O1 GPTA0 Output 15
OUT71 O2 GPTA0 Output 71
Reserved O3
Port 1
92 P1.0 I/O0 A2/
PU Port 1 General Purpose I/O Line 0
IN16 I GPTA0 Input 16
BRKIN IOCDS Break Input
OUT16 O1 GPTA0 Output 16
OUT72 O2 GPTA0 Output 72
Reserved O3
BRKOUT OOCDS Break Output (controlled by OCDS
module)
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 59 V1.1, 2009-08
95 P1.1 I/O0 A1/
PU Port 1 General Purpose I/O Line 1
IN17 I GPTA0 Input 17
OUT17 O1 GPTA0 Output 17
OUT73 O2 GPTA0 Output 73
Reserved O3
86 P1.4 I/O0 A1/
PU Port 1 General Purpose I/O Line 4
IN20 I GPTA0 Input 20
EMGSTOP I Emergency Stop Input
OUT20 O1 GPTA0 Output 20
OUT76 O2 GPTA0 Output 76
Reserved O3
74 P1.8 I/O0 A2/
PU Port 1 General Purpose I/O Line 8
IN24 I GPTA0 Input 24
IN48 I GPTA0 Input 48
MTSR1B I SSC1 Slave Receive Input B (Slave Mode)
OUT24 O1 GPTA0 Output 24
OUT48 O2 GPTA0 Output 48
MTSR1B O3 SSC1 Master Transmit Output B (Master Mode)
75 P1.9 I/O0 A2/
PU Port 1 General Purpose I/O Line 9
IN25 I GPTA0 Input 25
IN49 I GPTA0 Input 49
MRST1B I SSC1 Master Receive Input B (Master Mode)
OUT25 O1 GPTA0 Output 25
OUT49 O2 GPTA0 Output 49
MRST1B O3 SSC1 Slave Transmit Output B (Slave Mode)
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 60 V1.1, 2009-08
76 P1.10 I/O0 A2/
PU Port 1 General Purpose I/O Line 10
IN26 I GPTA0 Input 26
IN50 I GPTA0 Input 50
OUT26 O1 GPTA0 Output 26
OUT50 O2 GPTA0 Output 50
SLSO17 O3 SSC1 Slave Select Output 7
77 P1.11 I/O0 A2/
PU Port 1 General Purpose I/O Line 11
IN27 I GPTA0 Input 27
IN51 I GPTA0 Input 51
SCLK1B I SSC1 Clock Input B
OUT27 O1 GPTA0 Output 27
OUT51 O2 GPTA0 Output 51
SCLK1B O3 SSC1 Clock Output B
93 P1.15 I/O0 A2/
PU Port 1 General Purpose I/O Line 15
BRKIN IOCDS Break Input
Reserved O1
Reserved O2
Reserved O3
BRKOUT OOCDS Break Output (controlled by OCDS
module)
Port 2
61 P2.0 I/O0 A2/
PU Port 2 General Purpose I/O Line 0
IN32 I GPTA0 Input 32
OUT32 O1 GPTA0 Output 32
TCLK0 O2 MLI0 Transmitter Clock Output 0
Reserved O3
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 61 V1.1, 2009-08
62 P2.1 I/O0 A2/
PU Port 2 General Purpose I/O Line 1
IN33 I GPTA0 Input 33
TREADY0A I MLI0 Transmitter Ready Input A
OUT33 O1 GPTA0 Output 33
SLSO03 O2 SSC0 Slave Select Output Line 3
SLSO13 O3 SSC1 Slave Select Output Line 3
63 P2.2 I/O0 A2/
PU Port 2 General Purpose I/O Line 2
IN34 I GPTA0 Input 34
OUT34 O1 GPTA0 Output 34
TVALID0 O2 MLI0 Transmitter Valid Output
Reserved O3
64 P2.3 I/O0 A2/
PU Port 2 General Purpose I/O Line 3
IN35 I GPTA0 Input 35
OUT35 O1 GPTA0 Output 35
TDATA0 O2 MLI0 Transmitter Data Output
Reserved O3
65 P2.4 I/O0 A2/
PU Port 2 General Purpose I/O Line 4
IN36 I GPTA0 Input 36
RCLK0A I MLI Receiver Clock Input A
OUT36 O1 GPTA0 Output 36
OUT36 O2 GPTA0 Output 36
Reserved O3
66 P2.5 I/O0 A2/
PU Port 2 General Purpose I/O Line 5
IN37 I GPTA0 Input 37
OUT37 O1 GPTA0 Output 37
RREADY0A O2 MLI0 Receiver Ready Output A
Reserved O3
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 62 V1.1, 2009-08
67 P2.6 I/O0 A2/
PU Port 2 General Purpose I/O Line 6
IN38 I GPTA0 Input 38
RVALID0A I MLI Receiver Valid Input A
OUT38 O1 GPTA0 Output 38
OUT38 O2 GPTA0 Output 38
Reserved O3
68 P2.7 I/O0 A2/
PU Port 2 General Purpose I/O Line 7
IN39 I GPTA0 Input 39
RDATA0A I MLI Receiver Data Input A
OUT39 O1 GPTA0 Output 39
OUT39 O2 GPTA0 Output 39
Reserved O3
132 P2.8 I/O0 A2/
PU Port 2 General Purpose I/O Line 8
SLSO04 O1 SSC0 Slave Select Output 4
SLSO14 O2 SSC1 Slave Select Output 4
EN00 O3 MSC0 Enable Output 0
128 P2.9 I/O0 A2/
PU Port 2 General Purpose I/O Line 9
SLSO05 O1 SSC0 Slave Select Output 5
SLSO15 O2 SSC1 Slave Select Output 5
EN01 O3 MSC0 Enable Output 1
129 P2.10 I/O0 A2/
PU Port 2 General Purpose I/O Line 10
MRST1A I SSC1 Master Receive Input A
MRST1A O1 SSC1 Slave Transmit Output
Reserved O2
Reserved O3
130 P2.11 I/O0 A2/
PU Port 2 General Purpose I/O Line 11
SCLK1A I SSC1 Clock Input A
SCLK1A O1 SSC1 Clock Output A
Reserved O2
FCLP0B O3 MSC0 Clock Output Positive B
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 63 V1.1, 2009-08
131 P2.12 I/O0 A2/
PU Port 2 General Purpose I/O Line 12
MTSR1A I SSC1 Slave Receive Input A
MTSR1A O1 SSC1 Master Transmit Output A
Reserved O2
SOP0B O3 MSC0 Serial Data Output Positive B
133 P2.13 I/O0 A1/
PU Port 2 General Purpose I/O Line 13
SLSI11 I SSC1 Slave Select Input 1
SDI0 I MSC0 Serial Data Input
Reserved O1
Reserved O2
Reserved O3
Port 3
112 P3.0 I/O0 A1/
PU Port 3 General Purpose I/O Line 0
RXD0A I ASC0 Receiver Input A (Async. & Sync. Mode)
RXD0A O1 ASC0 Clock Output (Synch. Mode)
RXD0A O2 ASC0 Clock Output (Synch. Mode)
OUT84 O3 GPTA0 Output 84
111 P3.1 I/O0 A1/
PU Port 3 General Purpose I/O Line 1
TXD0 O1 ASC0 Transmitter Output
TXD0 O2 ASC0 Transmitter Output
OUT85 O3 GPTA0 Output 85
105 P3.2 I/O0 A2/
PU Port 3 General Purpose I/O Line 2
SCLK0 I SSC0 Clock Input (Slave Mode)
SCLK0 O1 SSC0 Clock Output (Master Mode)
SCLK0 O2 SSC0 Clock Output (Master Mode)
OUT86 O3 GPTA0 Output 86
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 64 V1.1, 2009-08
106 P3.3 I/O0 A2/
PU Port 3 General Purpose I/O Line 3
MRST0 I SSC0 Master Receive Input (Master Mode)
MRST0 O1 SSC0 Slave Transmit Output (Slave Mode)
MRST0 O2 SSC0 Slave Transmit Output (Slave Mode)
OUT87 O3 GPTA0 Output 87
108 P3.4 I/O0 A2/
PU Port 3 General Purpose I/O Line 4
MTSR0 I SSC0 Slave Receive Input (Slave Mode)
MTSR0 O1 SSC0 Master Transmit Output (Master Mode)
MTSR0 O2 SSC0 Master Transmit Output (Master Mode)
OUT88 O3 GPTA0 Output 88
102 P3.5 I/O0 A2/
PU Port 3 General Purpose I/O Line 5
SLSO00 O1 SSC0 Slave Select Output 0
SLSO10 O2 SSC1 Slave Select Output 0
SLSOANDO0 O3 SSC0 AND SSC1 Slave Select Output 0
103 P3.6 I/O0 A2/
PU Port 3 General Purpose I/O Line 6
SLSO01 O1 SSC0 Slave Select Output 1
SLSO11 O2 SSC1 Slave Select Output 1
SLSOANDO1 O3 SSC0 AND SSC1 Slave Select Output 1
107 P3.7 I/O0 A2/
PU Port 3 General Purpose I/O Line 7
SLSI01 I SSC0 Slave Select Input 1
SLSO02 O1 SSC0 Slave Select Output 2
SLSO12 O2 SSC1 Slave Select Output 2
OUT89 O3 GPTA0 Output 89
104 P3.8 I/O0 A2/
PU Port 3 General Purpose I/O Line 8
SLSO06 O1 SSC0 Slave Select Output 6
TXD1 O2 ASC1 Transmitter Output
OUT90 O3 GPTA0 Output 90
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 65 V1.1, 2009-08
114 P3.9 I/O0 A1/
PU Port 3 General Purpose I/O Line 9
RXD1A I ASC1 Receiver Input A
RXD1A O1 ASC1 Receiver Output A (Synchronous Mode)
RXD1A O2 ASC1 Receiver Output A (Synchronous Mode)
OUT91 O3 GPTA0 Output 91
113 P3.10 I/O0 A1/
PU Port 3 General Purpose I/O Line 10
REQ0 I External Request Input 0
Reserved O1
Reserved O2
OUT92 O3 GPTA0 Output 92
120 P3.11 I/O0 A1/
PU Port 3 General Purpose I/O Line 11
REQ1 I External Request Input 1
Reserved O1
Reserved O2
OUT93 O3 GPTA0 Output 93
119 P3.12 I/O0 A1/
PU Port 3 General Purpose I/O Line 12
RXDCAN0 I CAN Node 0 Receiver Input
RXD0B I ASC0 Receiver Input B
RXD0B O1 ASC0 Receiver Output B (Synchronous Mode)
RXD0B O2 ASC0 Receiver Output B (Synchronous Mode)
OUT94 O3 GPTA0 Output 94
118 P3.13 I/O0 A2/
PU Port 3 General Purpose I/O Line 13
TXDCAN0 O1 CAN Node 0 Transmitter Output
TXD0 O2 ASC0 Transmitter Output
OUT95 O3 GPTA0 Output 95
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 66 V1.1, 2009-08
110 P3.14 I/O0 A1/
PU Port 3 General Purpose I/O Line 14
RXDCAN1 I CAN Node 1 Receiver Input
RXD1B I ASC1 Receiver Input B
RXD1B O1 ASC1 Receiver Output B (Synchronous Mode)
RXD1B O2 ASC1 Receiver Output B (Synchronous Mode)
OUT96 O3 GPTA0 Output 96
109 P3.15 I/O0 A2/
PU Port 3 General Purpose I/O Line 15
TXDCAN1 O1 CAN Node 1 Transmitter Output
TXD1 O2 ASC1 Transmitter Output
OUT97 O3 GPTA0 Output 97
Port 4
72 P4.2 I/O0 A2/
PU Port 4 General Purpose I/O Line 2
IN30 I GPTA0 Input 30
IN54 I GPTA0 Input 54
OUT30 O1 GPTA0 Output 30
OUT54 O2 GPTA0 Output 54
EXTCLK1 O3 External Clock 1 Output
73 P4.3 I/O0 A2/
PU Port 4 General Purpose I/O Line 3
IN31 I GPTA0 Input 31
IN55 I GPTA0 Input 55
OUT31 O1 GPTA0 Output 31
OUT55 O2 GPTA0 Output 55
EXTCLK0 O3 External Clock 0 Output
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 67 V1.1, 2009-08
Port 5
1 P5.0 I/O0 A1/
PU Port 5 General Purpose I/O Line 0
IN40 I GPTA0 Input 40
OUT40 O1 GPTA0 Output 40
Reserved O2
Reserved O3
2 P5.1 I/O0 A1/
PU Port 5 General Purpose I/O Line 1
IN41 I GPTA0 Input 41
OUT41 O1 GPTA0 Output 41
Reserved O2
Reserved O3
3 P5.2 I/O0 A1/
PU Port 5 General Purpose I/O Line 2
IN42 I GPTA0 Input 42
OUT42 O1 GPTA0 Output 42
Reserved O2
Reserved O3
4 P5.3 I/O0 A1/
PU Port 5 General Purpose I/O Line 3
IN43 I GPTA0 Input 43
OUT43 O1 GPTA0 Output 43
Reserved O2
Reserved O3
7 P5.4 I/O0 A1/
PU Port 5 General Purpose I/O Line 4
IN44 I GPTA0 Input 44
OUT44 O1 GPTA0 Output 44
Reserved O2
Reserved O3
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 68 V1.1, 2009-08
8 P5.5 I/O0 A1/
PU Port 5 General Purpose I/O Line 5
IN45 I GPTA0 Input 45
OUT45 O1 GPTA0 Output 45
Reserved O2
Reserved O3
9 P5.6 I/O0 A1/
PU Port 5 General Purpose I/O Line 6
IN46 I GPTA0 Input 46
OUT46 O1 GPTA0 Output 46
Reserved O2
Reserved O3
10 P5.7 I/O0 A1/
PU Port 5 General Purpose I/O Line 7
IN47 I GPTA0 Input 47
OUT47 O1 GPTA0 Output 47
Reserved O2
Reserved O3
15 P5.8 I/O0 A2/
PU Port 5 General Purpose I/O Line 8
RDATA0B I MLI0 Receiver Data Input B
Reserved O1
Reserved O2
Reserved O3
16 P5.9 I/O0 A2/
PU Port 5 General Purpose I/O Line 9
RVALID0B I MLI0 Receiver Data Valid Input B
Reserved O1
Reserved O2
Reserved O3
17 P5.10 I/O0 A2/
PU Port 5 General Purpose I/O Line 10
RREADY0B O1 MLI0 Receiver Ready Input B
Reserved O2
Reserved O3
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 69 V1.1, 2009-08
18 P5.11 I/O0 A2/
PU Port 5 General Purpose I/O Line 11
RCLK0B I MLI0 Receiver Clock Input B
Reserved O1
Reserved O2
Reserved O3
19 P5.12 I/O0 A2 Port 5 General Purpose I/O Line 12
TDATA0 O1 MLI0 Transmitter Data Output
SLSO07 O2 SSC0 Slave Select Output 7
Reserved O3
20 P5.13 I/O0 A2/
PU Port 5 General Purpose I/O Line 13
TVALID0B O1 MLI0 Transmitter Valid Input B
SLSO16 O2 SSC1 Slave Select Output 6
Reserved O3
21 P5.14 I/O0 A2/
PU Port 5 General Purpose I/O Line 14
TREADY0B I MLI0 Transmitter Ready Input B
Reserved O1
Reserved O2
Reserved O3
11 P5.15 I/O0 A2/
PU Port 5 General Purpose I/O Line 15
TCLK0 O1 MLI0 Transmitter Clock Output
Reserved O2
Reserved O3
Port 9
5 P9.0 I/O0 A1/
PU Port 9 General Purpose I/O Line 0
Reserved O1
OUT80 O2 GPTA0 Output 80
Reserved O3
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 70 V1.1, 2009-08
6 P9.1 I/O0 A2/
PU Port 9 General Purpose I/O Line 1
Reserved O1
OUT81 O2 GPTA0 Output 81
Reserved O3
Analog Input Port
57 AN0 I D Analog Input 0
56 AN1 I D Analog Input 1
55 AN2 I D Analog Input 2
54 AN3 I D Analog Input 3
53 AN4 I D Analog Input 4
52 AN5 I D Analog Input 5
51 AN6 I D Analog Input 6
34 AN7 I D Analog Input 7
50 AN8 I D Analog Input 8
49 AN9 I D Analog Input 9
48 AN10 I D Analog Input 10
47 AN11 I D Analog Input 11
46 AN12 I D Analog Input 12
45 AN13 I D Analog Input 13
40 AN14 I D Analog Input 14
39 AN15 I D Analog Input 15
38 AN16 I D Analog Input 16
37 AN19 I D Analog Input 19
36 AN23 I D Analog Input 23
35 AN25 I D Analog Input 25
33 AN28 I D Analog Input 28
32 AN29 I D Analog Input 29
31 AN30 I D Analog Input 30
30 AN31 I D Analog Input 31
44 VDDM ––ADC Analog Part Power Supply (3.3V - 5V)
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 71 V1.1, 2009-08
43 VSSM ––ADC Analog Part Ground
42 VAREF0 ––ADC Reference Voltage
41 VAGND0 ––ADC Reference Ground
26 VDDMF ––FADC Analog Part Power Supply (3.3V)2)
25 VDDAF ––FADC Analog Part Logic Power Supply (1.5V)
27 VSSMF ––FADC Analog Part Ground
VSSAF ––FADC Analog Part Ground
28 VFAREF ––FADC Reference Voltage
29 VFAGND ––FADC Reference Ground
12,
23,3)
58,
71,
78,
99,
125,
138
VDD ––Digital Core Power Supply (1.5V)
13,
22,
59,
70,
79,
100,
115,
126,
139
VDDP ––Port Power Supply (3.3V)
14,
24,
60,
69,
80,
101,
116,
127,
140
VSS -–Digital Ground
84 VDDOSC ––Main Oscillator and PLL Power Supply (1.5V)
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 72 V1.1, 2009-08
Legend for Table 3-1
Column “Ctrl.”:
I = Input (for GPIO port lines with IOCR bit field selection PCx = 0XXXB)
85 VDDOSC3 ––Main Oscillator Power Supply (3.3V)
83 VSSOSC ––Main Oscillator and PLL Ground
117 VDDFL3 ––Power Supply for Flash (3.3V)
81 XTAL1 I Main Oscillator Input
82 XTAL2 O Main Oscillator Output
87 TDI/BRKIN/
BRKOUT I/O A2/
PU JTAG Serial Data Input /
OCDS Break Input /
OCDS Break Output (controlled by OCDS
module)
88 TMS/DAP1 I/O A2/
PD JTAG State Machine Control Input /
Device Access Port Line 1
89 TDO/DAP2/
BRKIN/
BRKOUT
I/O A2/
PU JTAG Serial Data Output /
Device Access Port Line 2 /
OCDS Break Input /
OCDS Break Output (controlled by OCDS
module)
90 TRST IA1/
PD JTAG Reset Input
91 TCK/DAP0 I A1/
PD JTAG Clock Input /
Device Access Port Line 0
94 TESTMODE IPUTest Mode Select Input
96 ESR1 I/O A2/
PD External System Request Reset Input 1
97 PORST IPDPower On Reset Input
(input pad with input spike-filter)
98 ESR0 I/O A2/
PD External System Request Reset Input 0
1) TC1736ED : PG-LQFP-144-10
2) This pin is also connected to the analog power supply for comparator of the ADC module.
3) For the emulation device (ED), this pin is bonded to VDDSB (ED Stand By RAM supply). In th e non ED device,
this pin is bonded to a VDD pad.
Table 3-1 Pin Definitions and Functions (PG-LQFP-144-10 Package)1) (cont’d)
Pin Symbol Ctrl. Type Function
TC1736
Pinning
Data Sheet 73 V1.1, 2009-08
O=Output
O0 = Output with IOCR bit field selection PCx = 1X00B
O1 = Output with IOCR bit field selection PCx = 1X01B (ALT1)
O2 = Output with IOCR bit field selection PCx = 1X10B(ALT2)
O3 = Output with IOCR bit field selection PCx = 1X11(ALT3)
Column “Type”:
A1 = Pad class A1 (LVTTL)
A2 = Pad class A2 (LVTTL)
D = Pad class D (ADC)
PU = with pull-up devi ce connected during reset (PORST = 0)
PD = with pull-down device connected during reset (PORST = 0)
TR = tri-state during reset (PORST = 0)
3.2.1 Reset Behavior of the Pins
Table 3-2 describes the pull-up/pull-down behavior of the System I/O pins during power-
on reset.
Table 3-2 List of Pull-up/Pull-down PORST Reset Behavior of the Pins
Pins PORST =0 PORST=1
All GPIOs,TDI, TESTMODE Pull-up
PORST, TRST, TCK, TMS Pull-down
ESR0 The open-drain driver is
used to drive low.1)
1) Valid additionally after deactivation of PORST until the internal reset phase has finished. See the SCU chapter
for details.
Pull-up2)
2) See the SCU_IOCR register description.
ESR1 Pull-down3)
3) see the SCU_IOCR register description.
TDO Pull-up High-impedance
TC1736
Identification Registers
Data Sheet 74 V1.1, 2009-08
4Identification Registers
The Identification Registers uniquely identify a module or the whole device.
Table 4-1 TC1736 Identification Registers
Short Name Value Address Stepping
ADC0_ID 0058 C000HF010 1008H
ADC1_ID 0058 C000HF010 1408H
ASC0_ID 0000 4402HF000 0A08H
ASC1_ID 0000 4402HF000 0B08H
CAN_ID 002B C061HF000 4008H
CBS_JDPID 0000 6350HF000 0408H
CBS_JTAGID 1015 B083HF000 0464H
CPS_ID 0015 C007HF7E0 FF08H
CPU_ID 000A C006HF7E1 FE18H
DMA_ID 001A C004HF000 3C08H
DMI_ID 0008 C005HF87F FC08H
FADC_ID 0027 C003HF010 0408H
FLASH0_ID 0056 C001HF800 2008H
FPU_ID 0054 C003HF7E1 A020H
GPTA0_ID 0029 C005HF000 1808H
LBCU_ID 000F C005HF87F FE08H
LFI_ID 000C C006HF87F FF08H
MCHK_ID 001B C001HF010 C208H
MLI0_ID 0025 C007HF010 C008H
MSC0_ID 0028 C003HF000 0808H
PMI_ID 000B C005HF87F FD08H
PMU0_ID 0050 C001HF800 0508H
SBCU_ID 0000 6A0CHF000 0108H
SCU_CHIPID 0000 9201HF000 0640H
SCU_ID 0052 C001HF000 0508H
SCU_MANID 0000 1820HF000 0644H
SCU_RTID 0000 0000HF000 0648HAA-step
TC1736
Identification Registers
Data Sheet 75 V1.1, 2009-08
SSC0_ID 0000 4511HF010 0108H
SSC1_ID 0000 4511HF010 0208H
STM_ID 0000 C006HF000 0208H
Table 4-1 TC1736 Identification Registers (cont’d)
Short Name Value Address Stepping
TC1736
Electrical Parameters
Data Sheet 76 V1.1, 2009-08
5 Electrical Parameters
5.1 General Parameters
5.1.1 Parameter Interpretation
The parameters listed in this section partly represent the characteristics of the TC1736
and partly its requirements on the system. To aid interpreting the parameters easily
when evaluating them for a design, they are marked with an two-letter abbreviation in
column “Symbol”:
CC
Such parameters indicate Controller Characteristics which are a distinctive feature of
the TC1736 and must be regarded for a system design.
SR
Such parameters indicate System Requirements which must provided by the
microcontroller system in which the TC1736 designed in.
TC1736
Electrical Parameters
Data Sheet 77 V1.1, 2009-08
5.1.2 Pad Driver and Pad Classes Summary
This section gives an overview on the different pad driver classes and its basic
characteristics. Mo re details (mainly DC parameters) are defined in the Section 18.2.1.
Table 2 Pad Driver and Pad Classes Overview
Class Power
Supply Type Sub Class Speed
Grade Load Leakage1)
1) Values are for TJmax = 150 °C.
Termination
A3.3 V LVTTL
I/O,
LVTTL
outputs
A1
(e.g. GPIO) 6 MHz 100 pF 500 nA No
A2
(e.g. serial
I/Os)
40
MHz 50 pF 6 µASeries
termination
recommended
DE5V ADC see Table 18-7
TC1736
Electrical Parameters
Data Sheet 78 V1.1, 2009-08
5.1.3 Absolute Maximum Ratings
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent
damage to the device. This is a stress rating only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
During absolute maximum rating overload conditions (VIN > related VDD or VIN <VSS) the
voltage on the related VDD pins with respect to ground (VSS) must not exceed the values
defined by the absolute maximum ratings.
Table 3 Absolute Maximum Rating Parameters
Parameter Symbol Values Unit Note /
Test Con
dition
Min. Typ. Max.
Ambient temperature TASR -40 125 °C Under bias
Storage temperature TST SR -65 150 °C–
Junction temperature TJ SR -40 150 °C Under bias
Voltage at 1.5 V power supply
pins with respect to VSS1)
1) Applicable for VDD, VDDOSC, VDDPLL, and VDDAF.
VDD SR ––2.25 V
Voltage at 3.3 V power supply
pins with respect to VSS2)
2) Applicable for VDDP, VDDFL3, and VDDMF.
VDDP SR 3.75 V
Voltage at 5 V power supply
pins with respect to VSS
VDDM SR 5.5 V
Voltage on any Class A input
pin and dedicated input pins
with respect to VSS
VIN SR -0.5 VDDP + 0.5
or max. 3.7 VWhatever
is lower
Voltage on any Class D
analog input pin with respect
to VAGND
VAIN
VAREFx SR
-0.5 VDDM + 0.5 V
Voltage on any Class D
analog input pin with respect
to VSSAF, if the FADC is
switched through to the pin.
VAINF
VFAREF SR
-0.5 VDDM + 0.5 V
TC1736
Electrical Parameters
Data Sheet 79 V1.1, 2009-08
5.1.4 Operating Conditions
The following operating conditions must not be exceeded in order to ensure correct
operation of the TC1736. All parameters specified in the following table refer to these
operating conditions, unless otherwise noted.
Table 4 Operating Condition Parameters
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
Digital suppl y vo lta ge 1) VDD SR
VDDOSC SR 1.42 1.582) V–
VDDP SR
VDDOSC3 SR 3.13 3.473) V For Class A pins
(3.3 V ±5%)
VDDFL3 SR 3.13 3.473) V–
Analog supply voltages VDDMF SR 3.13 3.473) VFADC
VDDAF SR 1.42 1.582) VFADC
VDDM SR 4.75 5.25 V For Class DE
pins, ADC
Digital ground voltage VSS SR 0 V
Ambient temperature
under bias TASR -40 +125 °C–
Analog supply voltages See separate
specification
Page 18-12,
Page 18-17
Overload current at
class D pins IOV -1 3 mA 4)
Sum of overload current
at class D pins Σ|IOV| 10 mA per single ADC
Overload coupling
factor for analog inputs5) KOVAP ––5×10-5 0 < IOV < 3 mA
KOVAN ––5×10-4 -1 mA < IOV < 0
CPU & LMB Bus
Frequency fCPU SR 80
40 MHz Derivative
dependent
FPI Bus Frequency fSYS SR 80 MHz 6)
Short circuit current ISC SR -5 +5 mA 6)
TC1736
Electrical Parameters
Data Sheet 80 V1.1, 2009-08
Absolute sum of sh ort
circuit currents of a pin
group (see Table 5)
Σ|ISC_PG|
SR 20 mA See note
Inactive device pin
current IID SR -1 1 mA All power supply
voltages VDDx =0
Absolute sum of sh ort
circuit currents of the
device
Σ|ISC_D|SR 100 mA See note4)
External load
capacitance CLSR pF Depending on pin
class. See DC
characteristics
1) Digital supply voltages applied to the TC1736 must be static regulated voltages which allow a typical voltage
swing of ±5%.
2) Voltage overshoot up to 1.7 V is permissible at Power-Up and PORST low, provided the pulse duration is le ss
than 100 µs and the cumulated summary of the pulses does not exceed 1 h.
3) Voltage overshoot up to 4 V is permissible at Power-Up and PORST low, provided the pulse duration is less
than 100 µs and the cumulated summary of the pulses does not exceed 1 h.
4) See additional document “TC1767 Pin Reliability in Overlo ad“ for definition of overl oad current on digital pins.
5) The overload coupling factor (kA) defines the worst case relation of an overload condition (IOV) at one pin to
the resulting leakage current (IleakTOT) into an adjacent pin: IleakTOT = ±kA × |IOV| + IOZ1.
Thus under overload conditions an additional error leakage voltage (VAEL) will be induced onto an adjacent
analog input pin due to the resistance of the analog input source (RAIN). That means VAEL = RAIN ×
|IleakTOT|.
The definition of adjacent pins is related to their order on the silicon.
The Injected leakage current always flows in the opposite direction from the causing overload current.
Therefore, the total leakage current must be calculated as an algebraic sum of the both component leakage
currents (the own leakage current IOZ1 and the optional injected leakage current).
6) Applicable for digital outputs.
Table 4 Operating Condition Parameters
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
TC1736
Electrical Parameters
Data Sheet 81 V1.1, 2009-08
Table 5 Pin Groups for Overload/Short-Circuit Current Sum Parameter
Group Pins
1 P5.[14:8]
2 P2.[7:0]
3 P4.[3:2]; P1.[11:8]
4 P1.4; TDI/BRKIN/BRKOUT; TMS/DAP1; TDO/DAP2/BRKIN/BRKOUT;
TRST, TCK/DAP0; P1.[1:0]; P1.15; TESTMODE; ESR0; PORST; ESR1
5 P3.[10:0]; P3.[15:14]
6 P3.[13:11]; P0.[3:0]
7 P2.[13:8]; P0.[5:4]; P0.[13:12]
8 P0.[7:6]; P0.[15:14]; P5.[7:0]; P5.15; P9.[1:0]
TC1736
Electrical Parameters
Data Sheet 82 V1.1, 2009-08
5.2 DC Parameters
5.2.1 Input/Output Pins
Table 6 Input/Output DC-Characteristics (Operating Conditions apply)
Parameter Symbol Values Unit Note / Test Condition
Min. Typ. Max.
General Parameters
Pull-up current1) |IPUH|CC 10 100 µAVIN < VIHAmin;
class A1/A2/Input pads.
Pull-down
current1) |IPDL|CC 10 150 µAVIN >VILAmax;
class A1/A2/Input pads.
Pin capacitance1)
(Digital I/O) CIO CC ––10pF
f = 1 MHz
TA = 25 °C
Input only Pads (VDDP = 3.13 to 3.47 V = 3.3 V ± 5%)
Input low voltage VILI SR -0.3 0.36 ×
VDDP
V–
Input high voltage VIHI SR 0.62 ×
VDDP
VDDP+
0.3 or
max.
3.6
V Whatever is lower
Ratio VIL/VIH CC 0.58
Input high voltage
TRST, TCK VIHJ SR 0.64 ×
VDDP
VDDP+
0.3 or
max.
3.6
V Whatever is lower
Input hysteresis HYSICC 0.1 ×
VDDP
–– V4)
Input leakage
current2) IOZI CC ––±3000
±6000 nA ((VDDP/2)-1) < VIN <
((VDDP/2)+1)
Otherwise
Spike filter always
blocked pulse
duration
tSF1 CC 10 ns
TC1736
Electrical Parameters
Data Sheet 83 V1.1, 2009-08
Spike filter pass-
through pulse
duration
tSF2 CC 100 ns
Class A Pads (VDDP = 3.13 to 3.47 V = 3.3V ± 5%)
Output low voltage
2)3) VOLA CC ––0.4V
IOL = 2 mA for medium
and strong driver mode,
IOL =500µA for weak
driver mode
Output high
voltage2) 3) VOHA CC 2.4 V IOH = -2 mA for medium
and strong driver mode,
IOH = -500 µA for weak
driver mode
VDDP -
0.4 –– VIOH = -1.4 mA for medium
and strong driver mode,
IOH = -400 µA for weak
driver mode
Input low voltage
Class A1/2 pins VILA SR -0.3 0.36 ×
VDDP
V–
Input high voltage
Class A1 pins VIHA1 SR 0.62 ×
VDDP
VDDP+
0.3 or
max.
3.6
V Whatever is lower
Ratio VIL/VIH SR 0.58
Input high voltage
Class A2 pins VIHA2 SR 0.60 ×
VDDP
VDDP+
0.3 or
max.
3.6
V Whatever is lower
Ratio VIL/VIH CC 0.60
Input hysteresis HYSA
CC 0.1 ×
VDDP
–– V4)
Input leakage
current Class A2
pins
IOZA2 ––±3000
±6000
nA ((VDDP/2)-1) < VIN <
((VDDP/2)+1)
Otherwise2)
Table 6 Input/Output DC-Characteristics (cont’d)(Operating Conditions apply)
Parameter Symbol Values Unit Note / Test Condition
Min. Typ. Max.
TC1736
Electrical Parameters
Data Sheet 84 V1.1, 2009-08
Input leakage
current
Class A1 pins
IOZA1 CC ––±500 nA 0 V <VIN < VDDP
Class D Pads
See ADC Characteristics
1) Not subject to production test, verified by design / characterization.
2) Only one of these parameters is tested, the other is verified by design characterization
3) Maximum resistance of the driver RDSON, defined for P_MOS / N_MOS transistor separately:
25 / 20 for strong driver mode, IOH / L <2mA,
200 / 150 for medium driver mode, IOH / L < 400 uA,
600 / 400 for weak driver mode, IOH / L < 100 uA,
verified by design / characterization.
4) Function verified by design, value verified by design characterization.
Hysteresis is implemented to avoid metastable states and switching due to internal ground bounce.
It cannot be guaranteed that it suppresses switching due to external system noise.
Table 6 Input/Output DC-Characteristics (cont’d)(Operating Conditions apply)
Parameter Symbol Values Unit Note / Test Condition
Min. Typ. Max.
TC1736
Electrical Parameters
Data Sheet 85 V1.1, 2009-08
5.2.2 Analog to Digital Converters (ADC0/ADC1)
All ADC parameters are optimized for and valid in the range of VDDM = 5V ±5%.
Table 7 ADC Characteristics (Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
Analog supply
voltage VDDM SR 4.75 5 5.25 V
3.13 3.3 3.471) V–
VDD SR 1.42 1.5 1.582) V Power supply for
ADC digital part,
internal supply
Analog ground
voltage VSSM SR -0.1 0.1 V
Analog reference
voltage14) VAREFx SR VAGNDx+1
VVDDM VDDM+
0.05
1)3)4)
V–
Analog reference
ground14) VAGNDx SR VSSMx -
0.05V 0VAREF -
1V V–
Analog input
voltage range VAIN SR VAGNDx VAREFx V–
Analog reference
voltage range5)14) VAREFx-
VAGNDx SR VDDM/2 VDDM +
0.05 V–
Converter Clock fADC SR 1 80 MHz
Internal ADC
clocks fADCI CC 0.5 10 MHz
Sample time tSCC 2 257 TADCI
Total unadjusted
error5) TUE6) CC ±4 LSB 12-bit conversion,
without noise7)8)
––±2 LSB 10-bit conversion8)
––±1 LSB 8-bit conversi on 8)
DNL error9) 5) EADNL CC ±1.5 ±3.0 LSB 12-bit conversion
without noise8)10)
INL error9)5) EAINL CC ±1.5 ±3.0 LSB 12-bit conversion
without noise8)10)
Gain error9)5) EAGAIN CC ±0.5 ±3.5 LSB 12-bit conversion
without noise8)10)
TC1736
Electrical Parameters
Data Sheet 86 V1.1, 2009-08
Offset error9)5) EAOFF CC ±1.0 ±4.0 LSB 12-bit conversion
without noise8)10)
Input leakage
current at analog
inputs of ADC0/1
11) 12) 13)
IOZ1 CC -300 100 nA (0% VDDM) < VIN <
(3% VDDM)
-100 200 nA (3% VDDM) < VIN <
(97% VDDM)
-100 300 nA (97% VDDM) < VIN <
(100% VDDM)
Input leakage
current at
VAREF0/1,
per module
IOZ2 CC ±1.5 µA0V<VAREF <
VDDM, no conversion
running
Input current at
VAREF0/114),
per module
IAREF CC 35 75 µA
rms 0V<VAREF <
VDDM15)
Total
capacitance of
the voltage
reference
inputs16)14)
CAREFTOT
CC –2040pF
8)
Switched
capacitance at
the positive
reference
voltage input14)
CAREFSW
CC –1530pF
8)17)
Resistance of
the reference
voltage input
path16)
RAREF CC 500 1000 500 Ohm increased
for AN[1:0] used as
reference input8)
Total
capacitance of
the analog
inputs16)
CAINTOTCC –2530pF
6)8)
Table 7 ADC Characteristics (cont’d) (Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
TC1736
Electrical Parameters
Data Sheet 87 V1.1, 2009-08
Switched
capacitance at
the analog
voltage inputs
CAINSW CC 7 20 pF 8)18)
ON resistance of
the transmission
gates in the
analog voltage
path
RAIN CC 700 1500 8)
ON resistance
for the ADC test
(pull-down for
AIN7)
RAIN7T CC 180 550 90019) Test feature
available only for
AIN7 8) 20)
Current through
resistance for the
ADC test (pull-
down for AIN7)
IAIN7T CC 15
rms 30
peak mA Test feature
available only for
AIN78)
1) Voltage overshoot up to 4 V is permissible at Power-Up and PORST low, provided the pulse duration is less
than 100 µs and the cumulated summary of the pulses does not exceed 1 h.
2) Voltage overshoot up to 1.7 V is permissible at Power-Up and PORST low, provided th e pulse duration is less
than 100 µs and the cumulated summary of the pulses does not exceed 1 h.
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
overshoot).
4) If the reference voltage VAREF increases or the VDDM decreases, so that
VAREF =(VDDM + 0.05 V to VDDM + 0.07 V), then the accuracy of the ADC decreases by 4 LSB12.
5) If a reduced reference voltage in a range of VDDM/2 to VDDM is used, then the ADC converter errors increase.
If the reference voltage is reduced with the factor k (k<1), then TUE, DN L, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to VDDM/2 is used, then there are additional decrease in the
ADC speed and accuracy.
6) TUE is tested at VAREF =5.0V, VAGND = 0 V and VDDM =5.0V
7) ADC module capability.
8) Not subject to production test, verified by design / characterization.
9) The sum of DNL/INL/Gain/Offset errors does not exceed the related TUE total unadjusted error.
10)For 10-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with factor 0.25.
For 8-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with 0.0625.
11)The leakage current definition is a continuous function, as shown in Figure 18-3. The numerical values defined
determine the characteristic points of the given continuous linear approximation - they do not define step
function.
Table 7 ADC Characteristics (cont’d) (Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
TC1736
Electrical Parameters
Data Sheet 88 V1.1, 2009-08
Figure 1 ADC0/ADC1 Clock Circuit
12)Only one of these parameters is tested, the other is verified by design characterization.
13)The leakage current decreases typically 30% for junction temperature decrease of 10oC.
14)Applies to AINx, when used as auxiliary reference inputs.
15)IAREF_MAX is valid for the minimum specified conversion time. The current flowing during an ADC conversion
with a duration of up to tC= 25µs can be calculated with the formula IAREF_MAX =QCONV/tC. Every conversion
needs a total charge of QCONV = 150pC from VAREF.
All ADC conversions with a duration longer than tC = 25µs consume an IAREF_MAX = 6µA.
16)For the definition of the parameters see also Figure 18-2.
17)This represents an equivalent switched capacitance. This capacitance is not switched to the reference voltage
at once. Instead of this smaller capacitances are successively switched to the reference voltage.
18)The sampling capacity of the conversion C-Network is pre-charged to VAREF/2 before the sampling moment.
Because of the parasitic elements the vol tage measured at AINx deviates from VAREF/2, and is typically 1.35V.
19)RAIN7T = 1400 Ohm maximum and 830 Ohm typical in the VDDM =3.3V± 5% range.
20)The DC current at the pin is limited to 3 mA for the operational lifetime.
ADC_clocking
anal og part
analog clock
f
ADCI
digital clock
f
ADCD
f
ADC
arbiter
di vi der f or
f
ADCD
registers
interrupts,
etc.
clock
generation
di vi der f or
f
ADCI
ADC k e r n el
TC1736
Electrical Parameters
Data Sheet 89 V1.1, 2009-08
Figure 2 ADC0/ADC1 Input Circuits
Figure 3 ADC0/ADC1Analog Inputs Leakage
Table 8 Conversion Time (Operating Conditions apply)
Parameter Symbol Value Unit Note
Conversion
time with
post-calibration
tCCC 2 ×TADC +(4+STC+n)× TADCI µs n = 8, 10, 12 for
n - bit conversion
TADC =1/fADC
TADCI =1/fADCI
Conversion
time without
post-calibration
2×TADC +(2+STC+n)× TADCI
Reference V oltage Input Circuitry
Analog Input Circ uitry
Analog_InpRefDiag
REXT
=
VAIN CEXT
RAIN, On
CAINTOT - CAINSW
CAINSW
ANx
VAREF
RAREF, On
CAREFTOT - CAREFSW CAREFSW
VAGNDx
VAREFx
RAIN7T
VAGNDx
VIN[VDDM%]
200nA
300nA
3% 100%97%
Ioz1
-300nA
-100nA
AD C Leakage 10.vsd
100nA
TC1736
Electrical Parameters
Data Sheet 90 V1.1, 2009-08
5.2.3 Fast Analog to Digital Converter (FADC)
All parameters apply to FADC used in differential mode, which is the default and the
intended mode of operation, and which takes advantage of many error cancelation
effects inherent to differential measurements in general.
Table 9 FADC Characteristics (Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
DNL error EFDNL CC ±1 LSB 9)
INL error EFINL CC ±4 LSB 9)
Gradient error9) EFGRAD
CC ±5 % Without calibration
gain 1, 2, 4
±6 % Without calibration
gain 8
Offset error9)1) EFOFF2)
CC ––±20
3) mV With calibration1)
––±90
3) mV Without calibration
Reference error of
internal VFAREF/2 EFREF CC ––±60mV
Analog supply
voltages VDDMF SR 3.13 3.474) V–
VDDAF SR 1.42 1.585) V–
Analog ground
voltage VSSAF SR -0.1 0.1 V
Analog reference
voltage VFAREF SR 3.13 3.474)6) V Nominal 3.3 V
Analog reference
ground VFAGND SR VSSAF -
0.05 V VSSAF +
0.05 V V–
Analog input voltage
range VAINF SR VFAGND VDDMF V–
Analog supply
currents IDDMF SR 10 mA
IDDAF SR 10 mA 7)
Input current at
VFAREF
IFAREF CC 120 µA
rms Independent of
conversion
Input leakage current
at VFAREF 8) IFOZ2 CC ±500 nA 0 V < VIN <VDDMF
Input leakage current
at VFAGND8) IFOZ3 CC ––±8µA0V<
VIN <VDDMF
TC1736
Electrical Parameters
Data Sheet 91 V1.1, 2009-08
The calibration procedure should run after each power-up, when all power supply
voltages and the reference voltage have stabilized.
Conversion time tC_FADC CC 21 CLK
of
fFADC
For 10-bit conv.
Converter clock fFADC SR 10 80 MHz
Input resistance of
the analog voltage
path (Rn, Rp)
RFAIN CC 100 200 k9)
Channel amplifier
cutoff frequency9) fCOFF CC 2– MHz
Settling time of a
channel amplifier
(after changing
channel amplifier
input)9)
tSET CC 5 µs–
1) Calibration should be performed at each power-up. In case of continuous operation, calibration should be
performed minimum once per week, or on regular basis in order to compensate for temperature changes.
2) The offset error voltage drifts over the whole temperature range maximum ±6 LSB.
3) Applies when the gain of the channel equals one. For the other gain settings, the offset error increases; it must
be multiplied with the applied gain.
4) Voltage overshoots up to 4 V are permissible, provided the pulse duration is less than 100 µs and the
cumulated summary of the pulses does not exceed 1 h.
5) Voltage overshoots up to 1.7 V are permissible, provided the pulse duration is less than 100 µs and the
cumulated sum of the pulses does not exceed 1 h.
6) A running conversion may become inexact in case of violating the normal operating conditions (voltage
overshoots).
7) Current peaks of up to 40 mA with a duration of max. 2 ns may occur
8) This value applies in power-down mode.
9) Not subject to production test, verified by design / characterization.
Table 9 FADC Characteristics (Operating Conditions apply) (cont’d)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
TC1736
Electrical Parameters
Data Sheet 92 V1.1, 2009-08
Figure 4 FADC Input Circuits
FADC_InpRefDiag
=
+
-
+
-
R
N
FAINxN
FAINxP
V
FAGND
FADC Analog Input Stage
R
P
V
FAREF
/2
V
FAREF
FADC Reference Voltage
Input Circuitry
V
FAGND
V
FAREF
I
FAREF
TC1736
Electrical Parameters
Data Sheet 93 V1.1, 2009-08
5.2.4 Oscillator Pins
Note: It is strongly recommended to measure the oscillation allowance (negative
resistance) in the final target system (layout) to determine the optimal par ameters
for the oscillator operation. Refer to the limits specified by the crystal supplier.
5.2.5 Temperature Sensor
Table 10 Oscillator Pins Characteristics (Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
Frequency range fOSC CC 8 25 MHz External Crystal
Mode selected
Input low voltage at
XTAL11)
1) If the XTAL1 pin is driven by a crystal, reaching a minimum amplitude (peak-to-peak) of 0.3 ×VDDOSC3 is
sufficient.
VILX SR -0.2 0.3 ×
VDDOSC3
V–
Input high voltage at
XTAL11) VIHX SR 0.7 ×
VDDOSC3
VDDOSC3
+ 0.2 V–
Input current at
XTAL1 IIX1 CC ±25 µA0 V < VIN < VDDOSC3
Table 11 Temperature Sensor Characteristics (Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
Temperature sensor range TSR SR -40 150 °C Junction
temperature
Temperature sensor
measurement time tTSMT SR 100 µs–
Start-up time after reset tTSST SR 10 µs–
Sensor accuracy TTSA CC ±CCalibrated
TC1736
Electrical Parameters
Data Sheet 94 V1.1, 2009-08
The following formula calculates the temperature measured by the DTS in [oC] from the
RESULT bitfield of the DTSSTAT register.
(1)
Tj DTSSTATRESULT 619
228,
------------------------------------------------------------------=
TC1736
Electrical Parameters
Data Sheet 95 V1.1, 2009-08
5.2.6 Power Supply Current
The default test conditions (differences explicitl y specified) are:
VDD =1.58V, VDDP = 3.47 V, Tj=150oC. All other operating conditions apply.
Table 12 Power Supply Currents, Maximum Power Consumption
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
Core active mode
supply current 1) 2)
1) Infineon Power Loop: CPU running, all periphera ls active. The power consumption of each custom appli cation
will most probably be lower than this value, but must be evaluated separately.
2) The IDD maximum value is 190 mA at fCPU = 40 MHz, constant TJ= 150oC, for the Infineon Max Power Loop.
The dependency in this range is, at constant junction temperature, linear.
fCPU/fSYS = 1:1 mode.
IDD CC 250 mA fCPU=80 MHz
fCPU/fSYS =1:1
Realistic core active
mode supply current 3)4)
3) The IDD maximum value is 110 mA at fCPU = 40 MH z , co nst a nt TJ= 150oC, for the Realistic Pattern.
The dependency in this range is, at constant junction temperature, linear.
fCPU/fSYS = 1:1 mode.
––150mAVDD =1.53V,
TJ=150
oC
FADC 3.3 V analog
supply current IDDMF CC 10 mA
FADC 1.5 V analog
supply current IDDAF CC 10 mA 4)
Flash memory 3.3 V
supply current IDDFL3R CC 60 mA continuously
reading the Flash
memory 5)
IDDFL3E CC 61 mA Flash memory
erase-verify6)
Oscillator 1.5 V supply IDDOSC CC 3 mA 4)
Oscillator 3.3 V supply IDDOSC3 CC 10 mA 4)
Pad currents,sum of
VDDP 3.3 V supplies IDDP CC 14 mA 4) 7)
IDDP_FP CC 34 mA IDDP including Data
Flash programming
current 4) 8)
ADC 5 V power supply IDDM CC 2 3 mA ADC0 / 1
Maximum Average
Power Dissipation1) PDSR 800 mW worst case
TA=125
oC,
PD×RΘJA < 25oC
TC1736
Electrical Parameters
Data Sheet 96 V1.1, 2009-08
4) Not tested in production separately, verified by design / characterization.
5) This value assumes worst case of reading flash line with all cells era sed. In case of 50% cells written with “1”
and 50% cells written with “0”, the maximum current drops down to 53 mA.
6) Relevant for the power supply dimensioning, not for thermal considerations.
In case of erase of Data Flash, internal fla sh array loading effects may generate transient current spikes of up
to 15 mA for maximum 5 ms.
7) No GPIO activity
8) This value is relevant for the power supply dimensioning not for thermal considerations.
The currents caused by the GPIO activity depend on the particular application and should be added
separately.
TC1736
Electrical Parameters
Data Sheet 97 V1.1, 2009-08
5.3 AC Parameters
All AC parameters are defined with the temperature compensation disabled. That
means, keeping the pads constantly at maximum strength.
5.3.1 Testing Waveforms
Figure 5 Rise/Fall Time Parameters
Figure 6 Testing Waveform, Output Delay
Figure 7 Testing Waveform, Output High Impedance
10%
90%
10%
90%
V
SS
V
DDP
t
R
rise_fall_vddp.vsd
t
F
mct04881_vddp.vsd
V
DDP
/ 2 Test P oint s V
DDP
/ 2
V
SS
V
DDP
MCT04880_new
V
Load
+ 0.1 V V
OH
- 0.1 V
Timing
Reference
Points
V
Load
- 0.1 V V
OL
- 0. 1 V
TC1736
Electrical Parameters
Data Sheet 98 V1.1, 2009-08
5.3.2 Output Rise/Fall Times
Table 13 Output Rise/Fall Times (Operating Conditions apply)
Parameter Symbol Values Unit Note / Test Condition
Min. Typ. Max.
Class A1 Pads
Rise/fall times1)
1) Not all parameters are subject to production test, but verified by design/characterization and test correlation.
tRA1, tFA1 ––50
140
18000
150
550
65000
ns Regular (medium) driver, 50 pF
Regular (medium) driver, 150 pF
Regular (medium) driver, 20 nF
Weak driver, 20 pF
Weak driver, 150 pF
Weak driver, 20 000 pF
Class A2 Pads
Rise/fall times
1) tRA2, tFA2 ––3.7
7.5
7
18
50
140
18000
150
550
65000
ns Strong driver, sharp edge, 50 pF
Strong driver, sharp edge, 100pF
Strong driver, med. edge, 50 pF
Strong driver, soft edge, 50 pF
Medium driver, 50 pF
Medium driver, 150 pF
Medium driver, 20 000 pF
Weak driver, 20 pF
Weak driver, 150 pF
Weak driver, 20 000 pF
TC1736
Electrical Parameters
Data Sheet 99 V1.1, 2009-08
5.3.3 Power Sequencing
Figure 8 5 V / 3.3 V / 1.5 V Power-Up/Down Sequence
The following list of rules applies to the power-up/down sequence:
All ground pins VSS must be externally connected to one single star point in the
system. Regarding the DC current component, all ground pins are internally directly
connected.
1. At any moment,
each power supply must be higher than any lower_power_supply - 0.5 V, or:
VDD5 > VDD3.3 - 0.5 V; VDD5 > VDD1.5 - 0.5 V;VDD3.3 > VDD1.5 - 0.5 V, see Figure 18-8.
2. During power-up and power-down, the voltage difference between the power supply
pins of the same voltage (3.3 V, 1.5 V, and 5 V) with different names (for example
VDDP, VDDFL3 ...), that are internaly connected via diodes must be lower than 100 mV.
On the other hand, all power supply pins with the same name (for example all VDDP
), are internaly directly connected. It is recommended that the power pins of the same
voltage are driven by a single power supply.
Powe r-Up 8.vsd
1.5V
3.3V
5V
t
V+-5%
+-5%
+-5%
t
-12%
-12%
PORST
0.5V
0.5V 0.5V
VDDP
VAREF
power
down power
fail
TC1736
Electrical Parameters
Data Sheet 100 V1.1, 2009-08
3. The PORST signal may be deactivated after all VDD5, VDD3.3, VDD1.5, and VAREF power-
supplies and the oscillator have reached stable operation, within the normal
operating conditions.
4. At normal power down the PORST signal should be activated within the normal
operating range, and then the power supplies may be switched off. Care must be
taken that all Flash write or delete sequences have been completed.
5. At power fail the PORST signal must be activated at latest when any 3.3 V or 1.5 V
power supply voltage falls 12% below the nominal level. The same limit of 3.3 V-12%
applies to the 5 V power supply too. If, under these conditions, the PORST is
activated during a Flash write, only the memory row that was the target of the write
at the moment of the power loss will contain unreliable content. In order to ensure
clean power-down behavior, the PORST signal should be activated as close as
possible to the normal operating voltage range.
6. In case of a power-loss at any power-supply, all power supplies must be powered-
down, conforming at the same time to the rules number 2 and 4.
7. Although not necessary, it is additionally recommended that all power supplies are
powered-up/down together in a controlled way, as tight to each other as possible.
8. Adit ionally, regarding the ADC reference voltage VAREF:
VAREF must power-up at the same time or later than VDDM, and
VAREF must power-down eather earlier or at latest to satisfy the condition
VAREF <VDDM + 0.5 V. This is required in order to prevent discharge of VAREF filter
capacitance through the ESD diodes through the VDDM power supply. In case of
discharging the reference capacitance through the ESD diodes, the current must
be lower than 5 mA.
TC1736
Electrical Parameters
Data Sheet 101 V1.1, 2009-08
5.3.4 Power, Pad and Reset Timing
Table 14 Power, Pad and Reset Timing Parameters
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
Min. VDDP voltage to
ensure defined pad
states1)
1) This parameter is valid under assumption that PORST signal is constantly at low level during the power-
up/power-down of the VDDP.
VDDPPA CC 0.6 V
Oscillator start-up time2) tOSCS CC 10 ms
Minimum PORST active
time after power
supplies are stable at
operating levels
tPOA SR 10 ms
ESR0 pulse width tHD CC program
mable3)5) –– fSYS
PORST rise time tPOR SR 50 ms
Setup time to PORST
rising edge4) tPOS SR 0 ns
Hold time from PORST
rising edge tPOH SR 100 ns TESTMODE
TRST
Setup time to ESR0
rising edge tHDS SR 0 ns
Hold time from ESR0
rising edge tHDH SR 16 ×
1/fSYS5) –– nsHWCFG
Ports inactive after
PORST reset active6)7) tPIP CC 150 ns
Ports inactive after
ESR0 reset active (and
for all logic)
tPI CC 8 ×
1/fSYS
ns
Power on Reset Boot
Time8) tBP CC 2.5 ms
Application Reset Boot
Time9) tBCC 150 960 µsfCPU=80MHz
1.7 ms fCPU=40MHz
TC1736
Electrical Parameters
Data Sheet 102 V1.1, 2009-08
Figure 9 Power, Pad and Reset Timing
2) tOSCS is defined from the moment when VDDOSC3 = 3.13 V until the oscillations reach an amplitude a t XTAL1 of
0,3 ×VDDOSC3. This parameter is verified by device characterization. The external oscillator circuitry must be
optimized by the customer and checked for negative resistance as recommended and specified by crystal
suppliers.
3) Any ESR0 activation is internally prolonged to SCU_RSTCNTCON.RELSA FPI bus clock (fFPI) cycles.
4) Applicable for input pins TESTMODE and TRST pins.
5) fFPI =fCPU /2
6) Not subject to production test, verified by design / characterization.
7) This parameter includes the delay of the analog spike filter in the PORST pad.
8) The duration of the boo t-time is defined b etween the rising e dge of the PORST and the moment when the first
user instruction has entered the CPU and its processing starts.
9) The duration of the boot time is defined between the following events:
1. Hardware reset: the falling edge of a sh ort ESR0 pu lse and the moment when the first user instruction has
entered the CPU and its processing starts, if the ESR0 pulse is shorter than
SCU_RSTCNTCON.RELSA ×TFPI.
If the ESR0 pulse is longer than SCU_RSTCNTCON.RELSA ×TFPI, only the time beyond it should be added
to the boot time (ESR 0 falling edge to first user instruction).
2. Software reset: the moment of starting the software reset and the moment when the first user instruction
has entered the CPU and its processing starts
reset_beh2
As progr am med
VDDP
Pads
Pad-state undefined
VDD
V
DDPPA
V
DDPPA
t
hd
t
POA
t
POA
TRST
TESTMODE
ESR0
PORST t
POH
HWCFG
t
HDH
t
PIP
t
PI
T r i-state or pu l l devi ce active
t
hd
t
POH
t
HDH
t
PIP
t
PI
t
PIP
t
PI
t
PI
t
HDH
t
PI
V
DDP
-12%
V
DD
-12%
TC1736
Electrical Parameters
Data Sheet 103 V1.1, 2009-08
5.3.5 Phase Locked Loop (PLL)
Note: All PLL characteristics defined on this and the next page are not subject to
production test, but verified by design characterization.
Phase Locked Loop Operation
When PLL operation is enabled and configured, the PLL clock fVCO (and with it the LMB-
Bus clock fLMB) is constantly adjusted to the selected frequency. The PLL is constantly
adjusting its output frequency to correspond to the input frequency (from crystal or clock
source), resulting in an accumulated jitter that is limited. This means that the relative
deviation for periods of more than one clock cycle is lower than for a single clock cycle.
This is especially important for bus cycles using waitstates and for the operation of
timers, serial interfaces, etc. For all slower operations and longer periods (e.g. pulse train
generation or measurement, lower baudrates, etc.) the deviation caused by the PLL jitter
is negligible.
Two formulas are defined for the (absolute) approximate maximum value of jitter Dm in
[ns] dependent on the K2 - factor, the LMB clock frequency fLMB in [MHz], and the
number m of consecutive fLMB clock periods.
(2)
(3)
Table 15 PLL Parameters (Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Con
dition
Min. Typ. Max.
Accumulated jitter |Dm|– 7 ns
VCO frequency range fVCO 400 800 MHz
VCO input frequency range fREF 8–16MHz
PLL base frequency1)
1) The CPU base frequency with which the application software starts after PORST is calculated by dividing the
limit values by 16 (this is the K2 factor after reset).
fPLLBASE 50 200 320 MHz
PLL lock-in time tL––200µs–
for K2 100()and m fLMB MHz[]()2()
Dmns[] 740
K2 fLMB MHz[]×
---------------------------------------------5+


1001,K2×()m1()×
05,fLMB MHz[]1×
---------------------------------------------------------------- 0 01,K2×+


×=
else Dmns[] 740
K2 fLMB MHz[]×
---------------------------------------------5+=
TC1736
Electrical Parameters
Data Sheet 104 V1.1, 2009-08
With rising number m of clock cycles the maximum jitter increases linearly up to a value
of m that is defined by the K2-factor of the PLL. Beyond this value of m the maximum
accumulated jitter remains at a constant value. Further, a lower LMB-Bus clock
frequency fLMB results in a higher absolute maximum jitter value.
Figure 18-10 gives the jitter curves for several K2 / fLMB combinations.
Figure 10 Approximated Maximum Accumulated PLL Jitter for Typical LMB-
Bus Clock Frequencies fLMB
Note: The specified PLL jitter values are v alid if the capacitive load per output pi n does
not exceed CL= 20 pF with the maximum driver and sharp edge. In case of
applications with many pins with hi gh loads, driver st rengths and toggle rates the
specified jitter values could be exceeded.
Note: The maximum peak-to-peak noise on the pad supply voltage, measured between
VDDOSC3 at pin 85 and VSSOSC at pin 83, is limited to a peak-to-peak voltage of
VPP = 100 mV for noise frequencies below 300 KHz and VPP =40mV for noise
frequencies above 300 KHz.
The maximum peak-to peak noise on the pad supply votage, measured between
VDDOSC at pin 84 and VSSOSC at pin 83, is limited to a peak-to-peak voltage of
VPP = 100 mV for noise frequencies below 300 KHz and VPP =40mV for noise
frequencies above 300 KHz.
0
±0.0
m
ns
Dm
±2.0
±4.0
±6.0
±10.0
20 40 60 80 100 120
±8.0
o
TC1736_PLL_JITT
fLMB = 40 MHz (K2 = 10)
fLMB = 40 MHz (K2 = 20)
fLMB = 80 MHz (K2 = 10)
= Max. jitter
= Number of consec utive fLMB periods
= K2-divider of PLL
Dm
m
K2
o
±7.0
fLMB = 80 MHz (K2 = 6)
±1.0
TC1736
Electrical Parameters
Data Sheet 105 V1.1, 2009-08
These conditions can be achieved by appropriate blocking of the supply voltage
as near as possible to the supply pins and using PCB supply and ground planes.
TC1736
Electrical Parameters
Data Sheet 106 V1.1, 2009-08
5.3.6 JTAG Interface Timing
The following parameters are applicable for communication through the JTAG debug
interface. The JTAG module is fully compliant with IEEE1149.1-2000.
Note: These parameters are not subject to production test but verified by design and/or
characterization.
Table 16 JTAG Interface Timing Parameters
(Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
TCK clock period t1 SR25––ns
TCK high time t2 SR12––ns
TCK low time t3 SR10––ns
TCK clock rise time t4 SR––4ns
TCK clock fall time t5 SR––4ns
TDI/TMS setup
to TCK rising edge t6 SR6––ns
TDI/TMS hold
after TCK rising edge t7 SR6––ns
TDO valid after TCK falling
edge1) (propagation delay)
1) The falling edge on TCK is used to generate the TDO timing .
t8 CC 13 ns CL=50pF
t8 CC––3nsC
L=20pF
TDO hold after TCK falling
edge1) t18 CC2––ns
TDO high imped. to valid
from TCK falling edge1)2)
2) The setup time for TDO is given implicitly by the TCK cycle time.
t9 CC 14 ns CL=50pF
TDO valid to high imped.
from TCK falling edge1) t10 CC 13.5 ns CL=50pF
TC1736
Electrical Parameters
Data Sheet 107 V1.1, 2009-08
Figure 11 Test Clock Timing (TCK)
Figure 12 JTAG Timing
MC_JTAG_TCK
0.9
VDDP
0.5
VDDP
t1
t2t3
0.1
VDDP
t5t4
t
6
t
7
t
6
t
7
t
9
t
8
t
10
TCK
TMS
TDI
TDO
MC_JTAG
t
18
TC1736
Electrical Parameters
Data Sheet 108 V1.1, 2009-08
5.3.7 DAP Interface Timing
The following parameters are applicable for communication through the DAP debug
interface.
Note: These parameters are not subject to production test but verified by design and/or
characterization.
Figure 13 Test Clock Timing (DAP0)
Table 17 DAP Interface Timing Parameters
(Operating Conditions apply)
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
DAP0 clock period t11 SR 12.5 ns
DAP0 high time t12 SR4––ns
DAP0 low time t13 SR4––ns
DAP0 clock rise time t14 SR––2ns
DAP0 clock fall time t15 SR––2ns
DAP1 setup
to DAP0 rising edge t16 SR6––ns
DAP1 hold
after DAP0 rising edge t17 SR6––ns
DAP1 valid
per DAP0 clock period1)
1) The Host has to find a suitable sampling point by analyzing the sync telegram response.
t19 SR8––ns80 MHz,
CL=20pF
t19 SR10––ns40 MHz,
CL=50pF
MC_DAP0
0.9
VDDP
0.5
VDDP
t11
t12 t13
0.1
VDDP
t15 t14
TC1736
Electrical Parameters
Data Sheet 109 V1.1, 2009-08
Figure 14 DAP Timing Host to Device
Figure 15 DAP Timing Device to Host
t
16
t
17
DAP0
DAP1
MC_DAP1_RX
DAP1
MC_DAP1_TX
t
11
t
19
TC1736
Electrical Parameters
Data Sheet 110 V1.1, 2009-08
5.3.8 Peripheral Timings
Note: Peripheral timing parameters are not subject to production test. They are verified
by design / characterization.
5.3.8.1 Micro Link Interface (MLI) Timing
Figure 16 MLI Interface Timing
Note: The generation of RREADYx is in the input clock domain of the receiver. The
reception of TREADYx is asynchronous to TCLKx.
t27
t25 t26
t16 t17
t15
t15
MLI_Tmg_2.vsd
TDATAx
TVALIDx
TCLKx
RDATAx
RVALIDx
RCLKx
TREADYx
RREADYx
t10
t13
t11
t12
t14
t20
t27
MLI Transmitter Ti ming
MLI Receiver Timi ng
t23
t21
t22
t24
TC1736
Electrical Parameters
Data Sheet 111 V1.1, 2009-08
Table 18 MLI Transmitter/Receiver Timing
(Operating Conditions apply), CL = 50 pF
Parameter Symbol Values Unit Note /
Test Co
ndition
Min. Typ. Max.
MLI Transmitter Timing
TCLK clock period t10 CC 2 ×TMLI –– ns
1)
1) TMLImin. = TSYS = 1/fSYS. When fSYS = 80 MHz, t10 = 25 ns and t20 = 12.5 ns.
TCLK high time t11 CC 0.45 ×t10 0.5 ×t10 0.55 ×t10 ns 2)3)
2) The following formula is valid: t11 +t12 =t10
3) The min./max. TCLK low/high times t11/t12 include the PLL jitter of fSYS. Fractional divider settings must be
regarded additionally to t11/t12.
TCLK low time t12 CC 0.45 ×t10 0.5 ×t10 0.55 ×t10 ns 2)3)
TCLK rise time t13 CC 4)
4) For high-speed MLI interface, strong driver sharp edge selection (class A2 pad) is recommended for TCLK.
ns
TCLK fall time t14 CC 4) ns
TDATA/TVALID output
delay time t15 CC -3 4.4 ns
TREADY setup time to
TCLK rising edge t16 SR 18 ns
TREADY hold time from
TCLK rising edge t17 SR 0 ns
MLI Receiver Timing
RCLK clock period t20 SR 1 ×TMLI –– ns
1)
RCLK high time t21 SR 0.5 ×t20 –ns
5)6)
5) The following formula is valid: t21 +t22 =t20
6) The min. and max. value of is parameter can be adjusted by considering the other receiver timing parameters.
RCLK low time t22 SR 0.5 ×t20 –ns
5)6)
RCLK rise time t23 SR 4 ns 7)
RCLK fall time t24 SR 4 ns 7)
RDATA/RVALID setup
time to RCLK falling edge t25 SR 4.2 ns
RDATA/RVALID hold time
from RCLK rising edge t26 SR 2.2 ns
RREADY output delay time t27 CC 0 16 ns
TC1736
Electrical Parameters
Data Sheet 112 V1.1, 2009-08
5.3.8.2 Micro Second Channel (MSC) Interface Timing
Figure 17 MSC Interface Timing
Note: Sample the data at SOP with the falling edge of FCLP in the target device.
7) The RCLK max. input rise/fall times are best case parameters for fSYS = 80 MHz. For reduction of EMI, slower
input signal rise/fall times can be used for longer RCLK clock periods.
Table 19 MSC Interface Timing (Operating Conditions apply), CL = 50 pF
Parameter Symbol Values Unit Note /
Test Con
dition
Min. Typ. Max.
FCLP clock period1)2)
1) FCLP signal rise/fall times are the same as the A2 Pads rise/fall times.
2) FCLP signal high and low can be minimum 1 ×TMSC.
t40 CC 2 ×TMSC3)
3) TMSCmin = TSYS = 1/fSYS. When fSYS = 80 MHz, t40 = 25 ns
––ns
SOP/ENx outputs delay
from FCLP rising edge t45 CC -10 10 ns
SDI bit time t46 CC 8 ×TMSC –ns
SDI rise time t48 SR 100 ns
SDI fall time t49 SR 100 ns
MSC_Tmg_1.vsd
t45 t45
t40
0.1 VDDP
0.9 VDDP
t46
t48
0.1 VDDP
0.9 VDDP
t49
t46
SOP
EN
FCLP
SDI
TC1736
Electrical Parameters
Data Sheet 113 V1.1, 2009-08
5.3.8.3 SSC Master / Slave Mode Timing
Table 20 SSC Master/Slave Mode Timing
(Operating Conditions apply), CL = 50 pF
Parameter Symbol Values Unit Note /
Test Con
dition
Min. Typ. Max.
Master Mode Timing
SCLK clock period t50 CC 2 ×TSSC –– ns
1)2)3)
1) SCLK signal rise/fall times are the same as the A2 Pads rise/fall times.
2) SCLK signal high and low times can be minimum 1 ×TSSC.
3) TSSCmin = TSYS = 1/fSYS. When fSYS = 80 MHz, t50 = 25 ns.
MTSR/SLSOx delay from
SCLK rising edge t51 CC 0 8 ns
MRST setup to SCLK
falling edge t52 SR 13 ns 3)
MRST hold from SCLK
falling edge t53 SR 0 ns 3)
Slave Mode Timing
SCLK clock period t54 SR 4 ×TSSC –– ns
1)3)
SCLK duty cycle t55/t54 SR 45 55 %
MTSR setup to SCLK
latching edge t56 SR TSSC +5 ns 3)4)
4) Fractional divider switched off, SSC internal baud rate generation used.
MTSR hold from SCLK
latching edge t57 SR TSSC +5 ns 3)4)
SLSI setup to first SCLK
latching edge t58 SR TSSC +5 ns 3)
SLSI hold from last SCLK
latching edge t59 SR 7 ns
MRST delay from SCLK
shift edge t60 CC 0 15 ns
SLSI to valid data on MRST t61 CC 10 ns
TC1736
Electrical Parameters
Data Sheet 114 V1.1, 2009-08
Figure 18 SSC Master Mode Timing
Figure 19 SSC Slave Mode Timing
SSC_TmgMM
SCLK1)2)
MTSR1)
t51 t51
MRST1)
t53
Data
valid
t52
SLSOx2)
t51
1) This timing is based on the following setup: CON.PH = CON.PO = 0.
2) The transition at SLSOx is based on the following setup: SSOTC .TRAIL = 0
and the first SCLK high pulse is in the first one of a transmission.
t50
SSC_TmgSM
SCLK1)
t55
MTSR1)
t57
Data
valid
t56
SLSI t58
1) This timing is based on the follow ing setup: CON.PH = CON.PO = 0.
t54
t55
t59
Last latching
SCLK edge
First latching
SCLK edge
t57
Data
valid
t56
MRST1)
t60
First shift
SCLK edge
t60
t61
TC1736
Electrical Parameters
Data Sheet 115 V1.1, 2009-08
5.4 Package and Reliability
5.4.1 Package Parameters
Table 21 Thermal Parameters (Operating Conditions apply)
Device Package RΘJCT1)
1) The top and bottom thermal resistances between the case and the amb ient (RTCAT, RTCAB) are to be combined
with the thermal resistances between the junction and the case given above (RTJCT, RTJCB), in order to calculate
the total thermal resistance between th e junction and the ambient ( RTJA). The thermal resistances between the
case and the ambient (RTCAT, RTCAB) depend on the external system (PCB, case) characteristics, and are
under user responsibility.
The junction temperature can be calculated using the following equation: TJ=TA+RTJA ×PD, where the RTJA
is the total thermal resistance between the junction and the ambient. This total junction ambient resistance
RTJA can be obtained from the upper four partial thermal resistances.
Thermal resistances as measured by the ‘cold plate method’ (MIL SPEC-883 Method 1012.1).
RΘJCB1) RΘJLeads1) Unit Note
TC1736 PG-LQFP-144-10 8.0 7.5 34.0 K/W
TC1736
Electrical Parameters
Data Sheet 116 V1.1, 2009-08
5.4.2 Package Outline
Figure 20 PG-LQFP-144-10, Plastic Thin Quad Flat Package
You can find all of our packages, sorts of packing and others in our Infineon Internet
Page “Products”: http://www.infineon.com/products.
GPP09243
1) Does not include plastic or metal protrusion of 0.25 max. per side
2) Does not include dambar protrusion of 0.08 max. per side
0.5
2)
0.22 0.08 DA-B
M
C
±0.05
17.5
144x
C0.08
0.1
±0.05
1.6 MAX.
±0.05
1.4
D
A
20
1)
0.2 A-B 4x
HD
22 A-B
0.2 144x
D
B
20
1)
22
Index Marking
1
144
H
±0.15
0.6
7˚ MAX.
0.12
+0.08
-0.03
TC1736
Electrical Parameters
Data Sheet 117 V1.1, 2009-08
5.4.3 Flash Memory Parameters
The data retention time of the TC1736’s Flash memory (i.e. the time after which stored
data can still be retrieved) depends on the number of times the Flash memory has been
erased and programmed.
Table 22 Flash Parameters
Parameter Symbol Values Unit Note /
Test Condition
Min. Typ. Max.
Program Flash
Retention Time,
Physical Sector1)2)
1) Storage and inactive time included.
2) At average weighted junction temperature Tj= 100oC, or
the retention time at average weighted temperature of Tj=110
oC is minimum 10 years, or
the retention time at average weighted temperature of Tj=150
oC is minimum 0.7 years.
tRET CC 20 years Max. 1000
erase/program
cycles
Program Flash
Retention Time
Logical Sector1)2)
tRETL CC 20 years Max. 100
erase/program
cycles
Data Flash
Endurance
per 16 KB Sector
NECC 30 000 cycles Max. data
retention time
5years
Data Flash Endurance,
EEPROM Emulation
(4 ×8 KB)
NE8 CC 120000 cycles Max. data
retention time
5years
Programming Time
per Page3)
3) In case the Program Verify feature detects weak bits, these bits will be programmed once more. The
reprogramming takes additional 5 ms.
tPR CC 5 ms
Program Flash Erase
Time per 256-KB Sector tERP CC 5 s fCPU = 80 MHz
Data Flash Erase Time
for 2 x 16-KB Sector tERD CC 1.25 s fCPU = 80 MHz
Wake-up time tWU CC 4000/fCPU
+180 µs–
TC1736
Electrical Parameters
Data Sheet 118 V1.1, 2009-08
5.4.4 Quality Declarations
Table 23 Quality Parameters
Parameter Symbol Values Unit Note / Test Condition
Min. Typ. Max.
Operation
Lifetime1)
1) This lifetime refers only to the time when the device is powered on.
tOP 24000 hours 2) 3)
2) For worst-case temperature profile equivalent to:
2000 hours at Tj = 150oC
16000 hours at Tj = 125oC
6000 hours at Tj = 110oC
3) This 30000 hours worst-case temperature profile is also covered:
300 hours at Tj = 150oC
1000 hours at Tj = 140oC
1700 hours at Tj = 130oC
24000 hours at Tj = 120oC
3000 hours at Tj = 110oC
ESD susceptibility
according to
Human Body
Model (HBM)
VHBM 2000 V Conforming to
JESD22-A114-B
ESD susceptibility
according to
Charged Device
Model (CDM)
VCDM 500 V Conforming to
JESD22-C101-C
Moisture
Sensitivity Level MSL 3 Conforming to Jedec
J-STD-020C for 240°C
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