CXK5T8512TM/TN -10LLX/12LLX 65536-word x 8-bit High Speed CMOS Static RAM Preliminary For the availability of this product, please contact the sales office. Description The CXK5T8512TM/TN is a high speed CMOS static RAM organized as 65536-words by 8-bits. Special feature are low power consumption and high speed. The CXK5T8512TM/TN is a suitable RAM for portable equipment with battery back up. Features * Extended operating temperature range: -25 to +85C * Wide supply voltage range operation: 2.7 to 3.6V * Fast access time: (Access time) 3.0V operation CXK5T8512TM/TN-10LLX 100ns (Max.) CXK5T8512TM/TN-12LLX 120ns (Max.) 3.3V operation CXK5T8512TM/TN-10LLX 85ns (Max.) CXK5T8512TM/TN-12LLX 100ns (Max.) * Low standby current: 14A (Max.) * Low data retention current: 12A (Max.) * Low power data retention: 2.0V (Min.) * Package line-up CXK5T8512TM 8mm x 20mm 32 pin TSOP package CXK5T8512TN 8mm x 13.4mm 32 pin TSOP package Function 65536-word x 8-bit static RAM CXK5T8512TM 32 pin TSOP (Plastic) CXK5T8512TN 32 pin TSOP (Plastic) Block Diagram A15 A13 A8 A11 A9 A7 A6 A5 A14 A12 Buffer A4 A3 A10 A0 A2 A1 Buffer Row Decoder Memory Matrix VCC 1024 x 512 GND I/O Gate Column Decoder OE Buffer WE CE1 CE2 I/O Buffer I/O1 I/O8 Structure Silicon gate CMOS IC Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. -1- PE96727-PS CXK5T8512TM/TN Pin Configuration (Top View) Pin Description Symbol A11 A9 A8 A13 WE CE2 A15 Vcc NC NC A14 A12 A7 A6 A5 A4 A11 A9 A8 A13 WE CE2 A15 Vcc NC NC A14 A12 A7 A6 A5 A4 1 2 3 4 A0 to A15 Address input 30 CE1 29 I/O8 I/O1 to I/O8 Data input output CE1, CE2 Chip enable 1, 2 input WE Write enable input OE Output enable input VCC Power supply GND Ground NC No connection 28 I/O7 27 I/O6 5 6 26 I/O5 7 8 25 I/O4 CXK5T8512TM (Standard Pinout) 9 10 24 GND 23 I/O3 11 22 I/O2 12 21 I/O1 13 20 A0 14 19 A1 15 16 18 A2 17 A3 32 OE 31 A10 1 2 30 CE1 29 I/O8 3 4 28 I/O7 27 I/O6 5 6 26 I/O5 7 8 25 I/O4 CXK5T8512TN (Standard Pinout) 9 10 24 GND 23 I/O3 11 22 I/O2 12 21 I/O1 13 20 A0 14 19 A1 15 16 18 A2 17 A3 Absolute Maximum Ratings Item (Ta = 25C, GND = 0V) Symbol Rating Unit V Supply voltage VCC Input voltage VIN -0.5 to +4.6 -0.51 to VCC + 0.5 Input and output voltage VI/O -0.51 to VCC + 0.5 V Allowable power dissipation PD 0.7 W Operating temperature Topr -25 to +85 C Storage temperature Tstg -55 to +150 C Soldering temperature * time Tsolder 235 * 10 C * s V 1 VIN, VI/O = -3.0V Min. for pulse width less than 50ns. Truth Table CE1 CE2 Description 32 OE 31 A10 OE WE Mode I/O pin VCC Current H x x x Not selected High Z ISB1, ISB2 x L x x Not selected High Z ISB1, ISB2 L H H H Output disable High Z ICC1, ICC2, ICC3 L H L H Read Data out ICC1, ICC2, ICC3 L H x L Write Data in ICC1, ICC2, ICC3 x: "H" or "L" -2- CXK5T8512TM/TN DC Recommended Operating Conditions Item (Ta = -25 to +85C, GND = 0V) VCC = 2.7 to 3.6V Symbol VCC = 3.3V 0.3V Min. Typ. Max. Min. Typ. Max. Supply voltage VCC 2.7 3.3 3.6 3.0 3.3 3.6 Input high voltage VIH -- VCC + 0.3 VCC + 0.3 VIL -- 0.4 2.2 -0.31 -- Input low voltage 2.4 -0.31 -- 0.6 Unit V 1 VIL = -3.0V Min. for pulse width less than 50ns. Electrical Characteristics * DC Characteristics Item (VCC = 2.7 to 3.6V, GND = 0V, Ta = -25 to +85C) Symbol Test conditions Min. Typ.1 Max. Unit Input leakage current ILI VIN = GND to VCC -1 -- +1 A Output leakage current ILO CE1 = VIH or CE2 = VIL or OE = VIH or WE = VIL VI/O = GND to VCC -1 -- +1 A Operating power supply current ICC1 CE1 = VIL, CE2 = VIH VIN = VIH or VIL IOUT = 0mA -- 1 3 mA ICC2 Min. cycle duty = 100% IOUT = 0mA 10LLX -- 252 353 12LLX -- 25 35 -- 5 10 mA ICC3 Cycle time 1s duty = 100% IOUT = 0mA CE1 0.2V CE2 Vcc - 0.2V VIL 0.2V VIH Vcc - 0.2V -- -- 14 ISB1 -25 to +85C CE2 0.2V CE1 Vcc - 0.2V -25 to +70C or CE2 Vcc - 0.2V +25C -- -- 7 -- 0.24 -- ISB2 CE1 = VIH or CE2 = VIL -- 0.12 1.4 mA Output high voltage VOH IOH = -2.0mA 2.4 -- -- V Output low voltage VOL IOL = 2.0mA -- -- 0.4 V Average operating current Standby current { 1 VCC = 3.3V, Ta = 25C 2 ICC2 = 30mA for 3.3V operation (VCC = 3.3V 0.3V) 3 ICC2 = 40mA for 3.3V operation (VCC = 3.3V 0.3V) -3- mA A CXK5T8512TM/TN I/O capacitance Item (Ta = 25C, f = 1MHz) Symbol Test conditions Min. Typ. Max. Unit Input capacitance CIN VIN = 0V -- -- 8 pF I/O capacitance CI/O VI/O = 0V -- -- 10 pF Note) This parameter is sampled and is not 100% tested. AC Characteristics * AC test conditions (Ta = -25 to +85C) Conditions Item VCC = 2.7 to 3.6V Input pulse high level VIH = 2.4V VIH = 2.2V Input pulse low level VIL = 0.4V VIL = 0.6V Input rise time tr = 5ns tf = 5ns tr = 5ns tf = 5ns Input fall time Input and output reference level Output load conditions -10LLX -12LLX 1.4V 1.4V CL1 = 100pF, 1TTL CL1 = 30pF, 1TTL CL1 = 100pF, 1TTL CL1 = 100pF, 1TTL 1 CL includes scope and jig capacitances. -4- * Test circuit VCC = 3.3V 0.3V TTL CL CXK5T8512TM/TN * Read cycle (WE = "H") VCC = 2.7 to 3.6V Item Read cycle time Address access time Chip enable access time (CE1) Chip enable access time (CE2) Output enable to output valid Output hold from address change Chip enable to output in low Z (CE1, CE2) Output enable to output in low Z (OE) Chip disable to output in high Z (CE1, CE2) Output disable to output in high Z (OE) Symbol tRC tAA tCO1 tCO2 tOE tOH tLZ1 tLZ2 tOLZ tHZ11 tHZ21 tOHZ1 -10LLX VCC = 3.3V 0.3V -12LLX -10LLX Min. Max. Min. Max. 100 -- 120 -- 85 -- 100 -- 120 -- 100 -- -- 100 -- Min. Max. -12LLX Unit Min. Max. -- 100 -- ns -- 85 -- 100 ns 120 -- 85 -- 100 ns -- 120 -- 85 -- 100 ns 50 -- 60 -- 40 -- 50 ns 10 -- 10 -- 10 -- 10 -- ns 10 -- 10 -- 10 -- 10 -- ns 5 -- 5 -- 5 -- 5 -- ns -- 40 -- 40 -- 35 -- 40 ns -- 35 -- 35 -- 30 -- 35 ns 1 tHZ1, tHZ2 and tOHZ are defined as the time required for outputs to turn to high impedance state and are not referred to as output voltage levels. * Write cycle VCC = 2.7 to 3.6V Item Symbol -10LLX Min. Write cycle time Address valid to end of write Chip enable to end of write Data to write time overlap Data hold from write time Write pulse width Address setup time Write recovery time (WE) Write recovery time (CE1, CE2) Output active from end of write Write to output in high Z 100 tWC 80 tAW 80 tCW 40 tDW 0 tDH 70 tWP 0 tAS 5 tWR 5 tWR1 5 tOW tWHZ2 -- VCC = 3.3V 0.3V -12LLX -10LLX Max. Min. Max. -- 120 -- 85 -- 100 -- -- 100 -- Min. Max. -12LLX Unit Min. Max. -- 100 -- ns 70 -- 80 -- ns -- 70 -- 80 -- ns 50 -- 35 -- 40 -- ns -- 0 -- 0 -- 0 -- ns -- 70 -- 60 -- 70 -- ns -- 0 -- 0 -- 0 -- ns -- 5 -- 5 -- 5 -- ns -- 5 -- 5 -- 5 -- ns -- 5 -- 5 -- 5 -- ns 40 -- 40 -- 35 -- 40 ns 2 tWHZ is defined as the time required for outputs to turn to high impedance state and is not referred to as output voltage level. -5- CXK5T8512TM/TN Timing Waveform * Read cycle (1) : CE1 = OE = VIL, CE2 = VIH, WE = VIH tRC Address tAA tOH Data out Previous data valid Data valid * Read cycle (2) : WE = VIH tRC Address tAA CE1 tCO1 HZ ttHZ1 tLZ1 CE2 tCO2 tLZ2 tHZ2 OE tOE tOHZ tOLZ Data out High impedance -6- Data valid CXK5T8512TM/TN * Write cycle (1) : WE control tWC Address tWR tAW OE tCW CE1 tCW CE2 tAS (1) tWP WE tDW tDH Data valid Data in tWHZ tOW Data out High impedance (2) (2) * Write cycle (2) : CE1 control tWC Address tAW OE tAS tWR1 (3) tCW CE1 tCW CE2 tWP WE tDW Data in Data valid Data out High impedance -7- tDH CXK5T8512TM/TN * Write cycle (3) : CE2 control tWC Address tAW OE tCW CE1 tWR1 (3) tCW tAS CE2 tWP WE tDW tDH Data valid Data in Data out High impedance 1 Write is executed when both CE1 and WE are at low and CE2 is at high simultaneously. 2 Do not apply the data input voltage of the opposite phase to the output while I/O pin is in output condition. 3 tWR1 is tested from either the rising edge of CE1 or the falling edge of CE2, whichever comes earlier, until the end of the write cycle. -8- CXK5T8512TM/TN Data retention waveform * Low supply voltage data retention waveform (1) (CE1 contol) tCDRS Data retention mode tR VCC 2.7V VIH VDR CE1 CE1 VCC - 0.2V GND * Low supply voltage data retention waveform (2) (CE2 contol) Data retention mode VCC 2.7V tCDRS tR CE2 VDR VIL CE2 0.2V GND Data Retention Characteristics Item Data retention voltage Data retention current Symbol Test conditions Min. Typ. Max. Unit 2.0 -- 3.6 V -25 to +85C -- -- 12 -25 to +70C -- -- 6 +25C -- -- 14 A VDR 1 ICCDR1 VCC = 3.0V1 ICCDR2 VCC = 2.0 to 3.6V1 -- 0.2 0.242 Chip disable to data retention mode 0 -- -- ns 5 -- -- ms Data retention setup time tCDRS Recovery time (Ta = -25 to +85C) tR 1 CE1 Vcc - 0.2V, CE2 Vcc - 0.2V (CE1 control) or CE2 0.2V (CE2 control) 2 Vcc = 3.3V, Ta = 25C -9- A CXK5T8512TM/TN Package Outline Unit: mm CXK5T8512TM 32PIN TSOP (PLASTIC) + 0.2 1.07 - 0.1 8.0 0.2 0.1 17 20.0 0.2 18.4 0.2 32 A 1 + 0.08 0.2 - 0.03 + 0.05 0.127 - 0.02 16 0.08 M 0.5 0.5 0.1 0.1 0.1 0 to 10 NOTE : "" Dimensions do not include mold protrusion. DETAIL A PACKAGE STRUCTURE PACKAGE MATERIAL EPOXY RESIN SONY CODE TSOP-32P-L01 LEAD TREATMENT SOLDER PLATING EIAJ CODE TSOP032-P-0820 LEAD MATERIAL 42 ALLOY PACKAGE WEIGHT 0.3g JEDEC CODE CXK5T8512TN 32PIN TSOP (PLASTIC) 8.0 0.1 32 1.2 MAX 0.1 13.4 0.3 11.8 0.1 17 A 16 1 0.145 0.08 M 0.5 + 0.1 0.05 - 0.05 0.5 0.2 0 to 10 DETAIL A NOTE: Dimension "" does not include mold protrusion. PACKAGE STRUCTURE PACKAGE MATERIAL EPOXY RESIN SONY CODE TSOP-32P-L02 LEAD TREATMENT SOLDER PLATING EIAJ CODE TSOP032-P-0813.4-C LEAD MATERIAL 42 ALLOY PACKAGE MASS 0.2g JEDEC CODE - 10 -