1
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory ©2002, Micron Technology, Inc.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.
FLASH AND SRAM
COMBO MEMORY
MT28C3224P20
MT28C3224P18
Low Voltage, Extended Temperature
0.18µm Process Technology
FEATURES
Flexible dual-bank architecture
Support for true concurrent operations with no
latency:
Read bank b during program bank a and vice versa
Read bank b during erase bank a and vice versa
Organization: 2,048K x 16 (Flash)
256K x 16 (SRAM)
Basic configuration:
Flash
Bank a (8Mb Flash for data storage)
– Eight 4K-word parameter blocks
– Fifteen 32K-word blocks
Bank b (24Mb Flash for program storage)
– Forty-eight 32K-word main blocks
SRAM
4Mb SRAM for data storage
256K-words
F_VCC, VCCQ, F_VPP, S_VCC voltages
MT28C3224P20
1.80V (MIN)/2.20V (MAX) F_VCC read voltage
1.80V (MIN)/2.20V (MAX) S_VCC read voltage
1.80V (MIN)/2.20V (MAX) VCCQ
MT28C3224P18
1.70V (MIN)/1.90V (MAX) F_VCC read voltage
1.70V (MIN)/1.90V (MAX) S_VCC read voltage
1.70V (MIN)/1.90V (MAX) VCCQ
MT28C3224P20/P18
1.80V (TYP) F_VPP (in-system PROGRAM/ERASE)
1.0V (MIN) S_VCC (SRAM data retention)
12V ±5% (HV) F_VPP (production programming
compatibility)
Asynchronous access time
Flash access time: 80ns @ 1.80V F_VCC
SRAM access time: 85ns @ 1.80V S_VCC
Page Mode read access
Interpage read access: 80ns @ 1.80V F_VCC
Intrapage read access: 30ns @ 1.80V F_VCC
Low power consumption
Enhanced suspend options
ERASE-SUSPEND-to-READ within same bank
PROGRAM-SUSPEND-to-READ within same bank
ERASE-SUSPEND-to-PROGRAM within same bank
Read/Write SRAM during program/erase of Flash
Dual 64-bit chip protection registers for security
purposes
PROGRAM/ERASE cycles
100,000 WRITE/ERASE cycles per block
Cross-compatible command set support
Extended command set
Common flash interface (CFI) compliant
OPTIONS MARKING
Timing
80ns -80
85ns -85
Boot Block Configuration
Top T
Bottom B
Operating Voltage Range
VCC = 1.70V–1.90V 18
VCC = 1.80V–2.20V 20
Operating Temperature Range
Commercial (0oC to +70oC) None
Extended (-40oC to +85oC) ET
Package
66-ball FBGA (8 x 8 grid) FL
Part Number Example:
MT28C3224P20FL-80 BET
BALL ASSIGNMENT
66-Ball FBGA (Top View)
A
B
C
D
E
F
G
H
1 2 3 4 5 6 7 8 9 10 11 12
Top View
(Ball Down)
NC
NC
A14
A9
DQ11
A6
A0
A15
A10
A19
S_OE#
A7
A4
A20
A16
F_WE#
S_V
SS
F_WP#
S_LB#
A18
F_V
CC
A12
S_WE#
DQ6
S_CE2
DQ10
DQ8
A2
F_V
SS
F_V
SS
DQ14
DQ4
S_V
CC
DQ2
DQ0
A1
F_OE#
V
cc
Q
DQ7
DQ5
F_V
CC
DQ3
DQ1
S_CE1#
NC
NC
NC
NC
NC
A13
DQ15
DQ13
DQ12
DQ9
A3
F_CE#
NC
NC
A11
A8
NC
F_RP#
F_V
PP
S_UB#
A17
A5
2
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
Table 1
Cross Reference for Abbreviated Device Marks
PRODUCT SAMPLE MECHANICAL
PART NUMBER MARKING MARKING SAMPLE MARKING
MT28C3224P20FL-80 BET FW448 FX448 FY448
MT28C3224P20FL-80 TET FW446 FX446 FY446
MT28C3224P18FL-85 BET FW449 FX449 FY449
MT28C3224P18FL-85 TET FW450 FX450 FY450
GENERAL DESCRIPTION
The MT28C3224P20 and MT28C3224P18 combi-
nation Flash and SRAM memory devices provide a com-
pact, low-power solution for systems where PCB real
estate is at a premium. The dual-bank Flash devices
are high-performance, high-density, nonvolatile
memory with a revolutionary architecture that can sig-
nificantly improve system performance.
This new architecture features:
A two-memory-bank configuration supporting
dual-bank operation;
A high-performance bus interface providing a fast
page data transfer; and
A conventional asynchronous bus interface.
The devices also provide soft protection for blocks
by configuring soft protection registers with dedicated
command sequences. For security purposes, dual 64-
bit chip protection registers are provided.
The embedded WORD WRITE and BLOCK ERASE
functions are fully automated by an on-chip write state
machine (WSM). The WSM simplifies these operations
and relieves the system processor of secondary tasks.
An on-chip status register, one for each bank, can be
used to monitor the WSM status to determine the
progress of a PROGRAM/ERASE command.
The erase/program suspend functionality allows
compatibility with existing EEPROM emulation soft-
ware packages.
The devices take advantage of a dedicated power
source for the Flash memory (F_VCC) and a dedicated
power source for the SRAM memory (S_VCC), both at
1.70V–2.20V for optimized power consumption and im-
proved noise immunity. A dedicated I/O power supply
(VCCQ) is provided with an extended range (1.70V–
2.20V), to allow a direct interface to most common logic
controllers and to ensure improved noise immunity.
The separate S_VCC pin for the SRAM provides data
retention capability when required. The data reten-
tion S_VCC is specified as low as 1.0V. The
MT28C3224P20 and MT28C3224P18 devices support
two VPP voltage ranges, an in-circuit voltage of 0.9V–
2.2V and a production compatibility voltage of 12V ±5%.
The 12V ±5% VPP2 is supported for a maximum of 100
cycles and 10 cumulative hours.
The MT28C3224P20 and MT28C3224P18 devices
contain an asynchronous 4Mb SRAM organized as 256K-
words by 16 bits. These devices are fabricated using an
advanced CMOS process and high-speed/ultra-low-
power circuit technology.
The devices are packaged in a 66-ball FBGA pack-
age with 0.80mm pitch.
ARCHITECTURE AND MEMORY
ORGANIZATION
The Flash memory contains two separate memory
banks (bank a and bank b) for simultaneous READ and
WRITE operations. Bank a is 8Mb deep and contains 8
x 4K-word parameter blocks and fifteen 32K-word
blocks. Bank b is 24Mb deep, is equally sectored, and
contains forty-eight 32K-word blocks.
Figures 2 and 3 show the top and bottom memory
organizations.
DEVICE MARKING
Due to the size of the package, Micron’s standard
part number is not printed on the top of each device.
Instead, an abbreviated device mark comprised of a
five-digit alphanumeric code is used. The abbreviated
device marks are cross referenced to Micron part num-
bers in Table 1.
3
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
PART NUMBERING INFORMATION
Micron’s low-power devices are available with sev-
eral different combinations of features (see Figure 1).
Table 2
Valid Part Number Combinations
BOOT BLOCK OPERATING
ACCESS STARTING TEMPERATURE
PART NUMBER TIME (ns) ADDRESS RANGE
MT28C3224P20FL-80 BET 80 Bottom -40oC to +85oC
MT28C3224P20FL-80 TET 80 Top -40oC to +85oC
MT28C3224P18FL-85 BET 85 Bottom -40oC to +85oC
MT28C3224P18FL-85 TET 85 Top -40oC to +85oC
Figure 1
Part Number Chart
Valid combinations of features and their correspond-
ing part numbers are listed in Table 2.
MT 28C 322 4 P 20 FL-80 T ET
Micron Technology
Flash Family
28C = Dual-Supply Flash/SRAM Combo
Density/Organization/Banks
322 = 32Mb (2,048K x 16)
bank a = 1/4; bank b = 3/4
SRAM Density
4 = 4Mb SRAM (256K x 16)
Access Time
-80 = 80ns
-85 = 85ns
Read Mode Operation
P = Asynchronous/Page Read
Package Code
FL = 66-ball FBGA (8 x 8 grid)
Operating Temperature Range
None = Commercial (0ºC to +70ºC)
ET = Extended (-40ºC to +85ºC)
Boot Block Starting Address
B = Bottom boot
T = Top boot
Operating Voltage Range
20 = 1.80V–2.20V
18 = 1.70V–1.90V
4
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
BLOCK DIAGRAM
F_V
PP
S_OE#
S_CE2
S_CE1#
S_WE#
DQ0
DQ15
A18
A20
A0
A17
F_RP#
F_CE#
F_OE#
F_WE#
F_V
CC
F_WP#
F_
V
SS
FLASH
SRAM
S_
V
SS
S_UB#
S_LB#
2,048K x 16
256K x 16
Bank a
Bank b
S_V
CC
V
CC
Q
FLASH FUNCTIONAL BLOCK DIAGRAM
Address
Input
Buffer
X DEC
Y/Z DEC
Data Input
Buffer
Output
Multiplexer
Address
CNT/WSM
Output
Buffer
Status
Reg.
WSM
Program/
Erase
Pump Voltage
Generators
Address Latch
DQ0-DQ15
DQ0–DQ15
CSM
F_RST#
F_CE#
X DEC
Y/Z DEC
F_WE#
F_OE#
I/O Logic
A0–A20
Address
Multiplexer
Bank 2 Blocks
Y/Z Gating/Sensing
Data
Register
Bank 1 Blocks
Y/Z Gating/Sensing
ID Reg.
RCR
Block Lock
Device ID
Manufacturer’s ID
OTP
Query
PR Lock
Query/OTP
PR Lock
5
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
BALL DESCRIPTIONS
66-BALL FBGA
NUMBERS SYMBOL TYPE DESCRIPTION
H6, G9, G8, G7, A0–A20 Input Address Inputs: Inputs for the addresses during READ and WRITE
H5, H4, G6, G5, operations. Addresses are internally latched during READ and WRITE
B4, B6, B5, A4, cycles. Flash: A0–A20; SRAM: A0–A17.
A8, A7, A6, A5,
B3, G4, G3, E5,
A3
H7 F_CE# Input Flash Chip Enable: Activates the device when LOW. When CE# is HIGH,
the device is disabled and goes into standby power mode.
H9 F_OE# Input Flash Output Enable: Enables Flash output buffers when LOW. When
F_OE# is HIGH, the output buffers are disabled.
C3 F_WE# Input Flash Write Enable: Determines if a given cycle is a Flash WRITE cycle.
F_WE# is active LOW.
D4 F_RP# Input Reset. When F_RP# is a logic LOW, the device is in reset, which drives
the outputs to High-Z and resets the WSM. When F_RP# is a logic HIGH,
the device is in standard operation. When F_RP# transitions from logic
LOW to logic HIGH, the device resets all blocks to locked and defaults to
the read array mode.
E3 F_WP# Input Flash Write Protect. Controls the lock down function of the flexible
locking feature.
G10 S_CE1# Input SRAM Chip Enable1: Activates the SRAM when it is LOW. HIGH level
deselects the SRAM and reduces the power consumption to standby
levels.
D8 S_CE2 Input SRAM Chip Enable2: Activates the SRAM when it is HIGH. LOW level
deselects the SRAM and reduces the power consumption to standby
levels.
F5 S_OE# Input SRAM Output Enable: Enables SRAM output buffers when LOW. When
S_OE# is HIGH, the output buffers are disabled.
B8 S_WE# Input SRAM Write Enable: Determines if a given cycle is an SRAM WRITE cycle.
S_WE# is active LOW.
F3 S_LB# Input SRAM Lower Byte: When LOW, it selects the SRAM address lower byte
(DQ0–DQ7).
F4 S_UB# Input SRAM Upper Byte: When LOW, it selects the SRAM address upper byte
(DQ8–DQ15).
F9, F10, E9, DQ0–DQ15 Input/ Data Inputs/Outputs: Input array data on the second CE# and WE#
E10, C9, C10, Output cycle during PROGRAM command. Input commands to the command
C8, B10, F8, user interface when CE# and WE# are active. Output data when CE#
F7, E8, E6, D7, and OE# are active.
C7, B9, B7
(continued on next page)
6
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
BALL DESCRIPTIONS (continued)
66-BALL FBGA
NUMBERS SYMBOL TYPE DESCRIPTION
E4 F_VPP Input/ Flash Program/Erase Power Supply: [0.9V–2.2V or 11.4V–12.6V].
Supply Operates as input at logic levels to control complete device protection.
Provides backward compatibility for factory programming when driven
to 11.4V–12.6V. A lower F_VPP voltage range (0.0V–2.2V) is available.
Contact factory for more information.
D10, H3 F_VCC Supply Flash Power Supply: [1.70V–1.90V or 1.80V–2.20V]. Supplies power for
device operation.
A9, H8 F_VSS Supply Flash Specific Ground: Do not float any ground pin.
D9 S_VCC Supply SRAM Power Supply: [1.70V–1.90V or 1.80V–2.20V]. Supplies power for
device operation.
D3 S_VSS Supply SRAM Specific Ground: Do not float any ground pin.
A10 VCCQ Supply I/O Power Supply: [1.70–1.90V or 1.80V–2.20V].
A1, A2, A11, NC No Connect: Lead is not internally connected; it may be driven or
A12, C4, H1, floated.
H2, H10, H11,
H12
7
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
NOTE: 1. Two devices may not drive the memory bus at the same time.
2. Allowable Flash read modes include read array, read query, read configuration, and read status.
3. Outputs are dependent on a separate device controlling bus outputs.
4. Modes of the Flash and SRAM can be interleaved so that while one is disabled, the other controls outputs.
5. SRAM is enabled and/or disabled with the logical function: S_CE1# or S_CE2.
6. Simultaneous operations can exist, as long as the operations are interleaved such that only one device attempts to
control the bus outputs at a time.
7. Data output on lower byte only; upper byte High-Z.
8. Data output on upper byte only; lower byte High-Z.
9. Data input on lower byte only.
10. Data input on upper byte only.
TRUTH TABLE – FLASH
FLASH SIGNALS SRAM SIGNALS MEMORY OUPUT
MODES
F_RP# F_CE# F_OE# F_WE# S_CE1# S_CE2 S_OE# S_WE# S_UB# S_LB#
MEMORY DQ0–DQ15 NOTES
BUS CONTROL
Read H L L H SRAM must be High-Z Flash DOUT 1, 2, 3
Write H L H L Flash DIN 1
Standby H H X X Other High-Z 4
Output Disable H L H H SRAM any mode allowable Other High-Z 4, 5
Reset L X X X Other High-Z 4, 6
TRUTH TABLE – SRAM
FLASH SIGNALS SRAM SIGNALS MEMORY OUPUT
MODES
F_RP# F_CE# F_OE# F_WE# S_CE1# S_CE2 S_OE# S_WE# S_UB# S_LB#
MEMORY DQ0–DQ15 NOTES
BUS CONTROL
Read
DQ0–DQ15 L H L H L L SRAM DOUT 1, 3
DQ0–DQ7 L H L H H L SRAM DOUT LB 7
DQ8–DQ15 Flash must be High-Z L H L H L H SRAM DOUT UB 8
Write
DQ0–DQ15 L H H L L L SRAM DIN 1, 3
DQ0–DQ7 L H H L H L SRAM DIN LB 9
DQ8–DQ15 L H H L L H SRAM DIN UB 10
Standby H X X X X X Other High-Z 4
Flash any mode allowable X L X X X X Other High-Z 4
Output Disable L H X X X X Other High-Z 4
FLASH
8
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
Figure 2
Bottom Boot Block Device
Bank b = 24Mb
Block Block Size Address Range
(K-bytes/K-words) (x16)
70 64/32 1F8000h-1FFFFFh
69 64/32 1F0000h-1F7FFFh
68 64/32 1E8000h-1EFFFFh
67 64/32 1E0000h-1E7FFFh
66 64/32 1D8000h-1DFFFFh
65 64/32 1D0000h-1D7FFFh
64 64/32 1C8000h-1CFFFFh
63 64/32 1C0000h-1C7FFFh
62 64/32 1B8000h-1BFFFFh
61 64/32 1B0000h-1B7FFFh
60 64/32 1A8000h-1AFFFFh
59 64/32 1A0000h-1A7FFFh
58 64/32 198000h-19FFFFh
57 64/32 190000h-197FFFh
56 64/32 188000h-18FFFFh
55 64/32 180000h-187FFFh
54 64/32 178000h-17FFFFh
53 64/32 170000h-177FFFh
52 64/32 168000h-16FFFFh
51 64/32 160000h-167FFFh
50 64/32 158000h-15FFFFh
49 64/32 150000h-157FFFh
48 64/32 148000h-14FFFFh
47 64/32 140000h-147FFFh
46 64/32 138000h-13FFFFh
45 64/32 130000h-137FFFh
44 64/32 128000h-12FFFFh
43 64/32 120000h-127FFFh
42 64/32 118000h-11FFFFh
41 64/32 110000h-117FFFh
40 64/32 108000h-10FFFFh
39 64/32 100000h-107FFFh
38 64/32 0F8000h-0FFFFFh
37 64/32 0F0000h-0F7FFFh
36 64/32 0E8000h-0EFFFFh
35 64/32 0E0000h-0E7FFFh
34 64/32 0D8000h-0DFFFFh
33 64/32 0D0000h-0D7FFFh
32 64/32 0C8000h-0CFFFFh
31 64/32 0C0000h-0C7FFFh
30 64/32 0B8000h-0BFFFFh
29 64/32 0B0000h-0B7FFFh
28 64/32 0A8000h-0AFFFFh
27 64/32 0A0000h-0A7FFFh
26 64/32 098000h-097FFFh
25 64/32 090000h-097FFFh
24 64/32 088000h-087FFFh
23 64/32 080000h-087FFFh
Bank a = 8Mb
Block Block Size Address Range
(K-bytes/K-words) (x16)
22 64/32 078000h-07FFFFh
21 64/32 070000h-077FFFh
20 64/32 068000h-067FFFh
19 64/32 060000h-067FFFh
18 64/32 058000h-05FFFFh
17 64/32 050000h-057FFFh
16 64/32 048000h-04FFFFh
15 64/32 040000h-047FFFh
14 64/32 038000h-03FFFFh
13 64/32 030000h-037FFFh
12 64/32 028000h-02FFFFh
11 64/32 020000h-027FFFh
10 64/32 018000h-01FFFFh
9 64/32 010000h-017FFFh
8 64/32 008000h-00FFFFh
7 8/4 007000h-007FFFh
6 8/4 006000h-006FFFh
5 8/4 005000h-005FFFh
4 8/4 004000h-004FFFh
3 8/4 003000h-003FFFh
2 8/4 002000h-002FFFh
1 8/4 001000h-001FFFh
0 8/4 000000h-000FFFh
FLASH
9
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
Figure 3
Top Boot Block Device
Bank b = 24Mb
Block Block Size Address Range
(K-bytes/K-words) (x16)
47 64/32 178000h-17FFFFh
46 64/32 170000h-177FFFh
45 64/32 168000h-16FFFFh
44 64/32 160000h-167FFFh
43 64/32 158000h-15FFFFh
42 64/32 150000h-157FFFh
41 64/32 148000h-14FFFFh
40 64/32 140000h-147FFFh
39 64/32 138000h-13FFFFh
38 64/32 130000h-137FFFh
37 64/32 128000h-12FFFFh
36 64/32 120000h-127FFFh
35 64/32 118000h-11FFFFh
34 64/32 110000h-117FFFh
33 64/32 108000h-10FFFFh
32 64/32 100000h-107FFFh
31 64/32 0F8000h-0FFFFFh
30 64/32 0F0000h-0F7FFFh
29 64/32 0E8000h-0EFFFFh
28 64/32 0E0000h-0E7FFFh
27 64/32 0D8000h-0DFFFFh
26 64/32 0D0000h-0D7FFFh
25 64/32 0C8000h-0CFFFFh
24 64/32 0C0000h-0C7FFFh
23 64/32 0B8000h-0BFFFFh
22 64/32 0B0000h-0B7FFFh
21 64/32 0A8000h-0AFFFFh
20 64/32 0A0000h-0A7FFFh
19 64/32 098000h-09FFFFh
18 64/32 090000h-097FFFh
17 64/32 088000h-08FFFFh
16 64/32 080000h-087FFFh
15 64/32 078000h-07FFFFh
14 64/32 070000h-077FFFh
13 64/32 068000h-06FFFFh
12 64/32 060000h-067FFFh
11 64/32 058000h-05FFFFh
10 64/32 050000h-057FFFh
9 64/32 048000h-04FFFFh
8 64/32 040000h-047FFFh
7 64/32 038000h-03FFFFh
6 64/32 030000h-037FFFh
5 64/32 028000h-02FFFFh
4 64/32 020000h-027FFFh
3 64/32 018000h-01FFFFh
2 64/32 010000h-017FFFh
1 64/32 008000h-00FFFFh
0 64/32 000000h-007FFFh
Bank a = 8Mb
Block Block Size Address Range
(K-bytes/K-words) (x16)
70 8/4 1FF000h-1FFFFFh
69 8/4 1FE000h-1FEFFFh
68 8/4 1FD000h-1FDFFFh
67 8/4 1FC000h-1FCFFFh
66 8/4 1FB000h-1FBFFFh
65 8/4 1FA000h-1FAFFFh
64 8/4 1F9000h-1F9FFFh
63 8/4 1F8000h-1F8FFFh
62 64/32 1F0000h-1F7FFFh
61 64/32 1E8000h-1EFFFFh
60 64/32 1E0000h-1E7FFFh
59 64/32 1D8000h-1DFFFFh
58 64/32 1D0000h-1D7FFFh
57 64/32 1C8000h-1CFFFFh
56 64/32 1C0000h-1C7FFFh
55 64/32 1B8000h-1BFFFFh
54 64/32 1B0000h-1B7FFFh
53 64/32 1A8000h-1AFFFFh
52 64/32 1A0000h-1A7FFFh
51 64/32 198000h-19FFFFh
50 64/32 190000h-197FFFh
49 64/32 188000h-18FFFFh
48 64/32 180000h-187FFFh
FLASH
10
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
FLASH MEMORY OPERATING MODES
COMMAND STATE MACHINE
Commands are issued to the command state ma-
chine (CSM) using standard microprocessor write tim-
ings. The CSM acts as an interface between external
microprocessors and the internal write state machine
(WSM). The available commands are listed in Table 3,
their definitions are given in Table 4 and their descrip-
tions in Table 5. Program and erase algorithms are
automated by the on-chip WSM. For more specific in-
formation about the CSM transition states, see Micron
technical note TN-28-33, “Command State Machine
Description and Command Definition.”
Once a valid PROGRAM/ERASE command is en-
tered, the WSM executes the appropriate algorithm,
which generates the necessary timing signals to con-
trol the device internally. A command is valid only if the
exact sequence of WRITEs is completed. After the WSM
completes its task, the write state machine status
(WSMS) bit (SR7) (see Table 7) is set to a logic HIGH
level (VIH), allowing the CSM to respond to the full com-
mand set again.
OPERATIONS
Device operations are selected by entering a stan-
dard JEDEC 8-bit command code with conventional
microprocessor timings into an on-chip CSM through
I/Os DQ0–DQ7. The number of bus cycles required to
activate a command is typically one or two. The first
operation is always a WRITE. Control signals F_CE#
and F_WE# must be at a logic LOW level (VIL), and F_OE#
and F_RP# must be at logic HIGH (VIH). The second
operation, when needed, can be a WRITE or a READ
depending upon the command. During a READ opera-
tion, control signals F_CE# and F_OE# must be at a
logic LOW level (VIL), and F_WE# and F_RP# must be at
logic HIGH (VIH).
Table 6 illustrates the bus operations for all the
modes: write, read, reset, standby, and output disable.
When the device is powered up, internal reset cir-
cuitry initializes the chip to a read array mode of opera-
tion. Changing the mode of operation requires that a
command code be entered into the CSM. For each one
of the two Flash memory partitions, an on-chip status
register is available. These two registers allow the moni-
toring of the progress of various operations that can
take place on a memory bank. One of the two status
registers is interrogated by entering a READ STATUS
REGISTER command onto the CSM (cycle 1), specify-
ing an address within the memory partition boundary,
and reading the register data on I/O pins DQ0–DQ7
(cycle 2). Status register bits SR0-SR7 correspond to
DQ0–DQ7 (see Table 7).
COMMAND DEFINITION
Once a specific command code has been entered,
the WSM executes an internal algorithm, generating
the necessary timing signals to program, erase, and
verify data. See Table 4 for the CSM command defini-
tions and data for each of the bus cycles.
STATUS REGISTER
The status register allows the user to determine
whether the state of a PROGRAM/ERASE operation is
pending or complete. The status register is monitored
by toggling F_OE# and F_CE# and reading the result-
ing status code on I/Os DQ0–DQ7. The high-order I/Os
(DQ8–DQ15) are set to 00h internally, so only the low-
Table 3
Command State Machine Codes For Device Mode Selection
COMMAND DQ0–DQ7 CODE ON DEVICE MODE
40h/10h Program setup/alternate program setup
20h Block erase setup
50h Clear status register
60h Protection configuration setup
70h Read status register
90h Read protection configuration register
98h Read query
B0h Program/erase suspend
C0h Protection register program/lock
D0h Program/erase resume – erase confirm
FFh Read array
FLASH
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order I/Os (DQ0–DQ7) need to be interpreted. Address
lines select the status register pertinent to the selected
memory partition.
Register data is updated and latched on the falling
edge of F_OE# or F_CE#, whichever occurs last. Latch-
ing the data prevents errors from occurring if the regis-
ter input changes during a status register read.
The status register provides the internal state of the
WSM to the external microprocessor. During periods
when the WSM is active, the status register can be polled
to determine the WSM status. Table 7 defines the sta-
tus register bits.
After monitoring the status register during a
PROGRAM/ERASE operation, the data appearing on
DQ0–DQ7 remains as status register data until a new
command is issued to the CSM. To return the device to
other modes of operation, a new command must be
issued to the CSM.
COMMAND STATE MACHINE OPERATIONS
The CSM decodes instructions for the commands
listed in Table 3. The 8-bit command code is input to
the device on DQ0–DQ7 (see Table 4 for command
definitions). During a PROGRAM or ERASE cycle, the
CSM informs the WSM that a PROGRAM or ERASE cycle
has been requested.
During a PROGRAM cycle, the WSM controls the
program sequences and the CSM responds to a PRO-
GRAM SUSPEND command only.
During an ERASE cycle, the CSM responds to an
ERASE SUSPEND command only. When the WSM has
completed its task, the WSMS bit (SR7) is set to a logic
HIGH level and the CSM responds to the full command
set. The CSM stays in the current command state until
the microprocessor issues another command.
The WSM successfully initiates an ERASE or PRO-
GRAM operation only when VPP is within its correct volt-
age range.
Table 4
Command Definitions
FIRST BUS CYCLE SECOND BUS CYCLE
COMMAND OPERATION ADDRESS1DATA OPERATION ADDRESS1DATA
READ ARRAY WRITE WA FFh
READ PROTECTION CONFIGURATION REGISTER WRITE IA 90h READ IA ID
READ STATUS REGISTER WRITE BA 70h READ BA SRD
CLEAR STATUS REGISTER WRITE BA 50h
READ QUERY WRITE QA 98h READ QA QD
BLOCK ERASE SETUP WRITE BA 20h WRITE BA D0h
PROGRAM SETUP/ALTERNATE PROGRAM SETUP WRITE WA 40h/10h WRITE WA WD
PROGRAM/ERASE SUSPEND WRITE BA B0h
PROGRAM/ERASE RESUME – ERASE CONFIRM WRITE BA D0h
LOCK BLOCK WRITE BA 60h WRITE BA 01h
UNLOCK BLOCK WRITE BA 60h WRITE BA D0h
LOCK DOWN BLOCK WRITE BA 60h WRITE BA 2Fh
PROTECTION REGISTER PROGRAM WRITE PA C0h WRITE PA PD
PROTECTION REGISTER LOCK WRITE LPA C0h WRITE LPA FFFDh
NOTE: 1. BA: Address within the block
IA: Identification code address
ID: Identification code data
LPA: Lock protection register address
PA: Protection register address
PD: Data to be written at location PA
QA: Query code address
QD: Query code data
SRD: Data read from the status register
WA: Word address of memory location to be written, or read
WD: Data to be written at the location WA
FLASH
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Table 5
Command Descriptions
CODE DEVICE MODE BUS CYCLE DESCRIPTION
10h Alt. Program Setup First Operates the same as a PROGRAM SETUP command.
20h Erase Setup First Prepares the CSM for an ERASE CONFIRM command. If the next
command is not an ERASE CONFIRM command, the command will
be ignored, and the device will go to read status mode and wait for
another command.
40h Program Setup First A two-cycle command: The first cycle prepares for a PROGRAM
operation, the second cycle latches addresses and data and initiates
the WSM to execute the program algorithm. The Flash outputs status
register data on the falling edge of F_OE# or F_CE#, whichever
occurs first.
50h Clear Status First The WSM can set the program status (SR4), and erase status (SR5) bits
Register in the status register to “1,” but it cannot clear them to “0.” Issuing
this command clears those bits to “0.”
60h Protection First Prepares the CSM for changes to the block locking status. If the next
Configuration command is not BLOCK UNLOCK, BLOCK LOCK or BLOCK LOCK
Setup DOWN, the command will be ignored, and the device will go to read
status mode.
70h Read Status First Places the device into read status register mode. Reading the device
Register outputs the contents of the status register for the addressed bank.
The device automatically enters this mode for the addressed bank
after a PROGRAM or ERASE operation has been initiated.
90h Read Protection First Puts the device into the read protection configuration mode so that
Configuration reading the device outputs the manufacturer/device codes or block
lock status.
98h Read Query First Puts the device into the read query mode so that reading the device
outputs common Flash interface information.
B0h Program Suspend First Suspends the currently executing PROGRAM/ERASE operation. The
status register indicates when the operation has been successfully
Erase Suspend First suspended by setting either the program suspend (SR2) or erase
suspend (SR6) and the WSMS bit (SR7) to a “1” (ready). The WSM
continues to idle in the suspend state, regardless of the state of all
input control pins except F_RP#, which immediately shuts down the
WSM and the remainder of the chip if F_RP# is driven to VIL.
C0h Program Device First Writes a specific code into the device protection register.
Protection Register
Lock Device First Locks the device protection register; data can no longer be changed.
Protection Register
(continued on the next page)
FLASH
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Table 5
Command Descriptions (continued)
CODE DEVICE MODE BUS CYCLE DESCRIPTION
D0h Erase Confirm Second If the previous command was an ERASE SETUP command, then the
CSM closes the address and data latches, and it begins erasing the
block indicated on the address pins. During programming/erase, the
device responds only to the READ STATUS REGISTER, PROGRAM
SUSPEND, or ERASE SUSPEND commands and outputs status register
data on the falling edge of F_OE# or F_CE#, whichever occurs last.
Program/Erase First If a PROGRAM or ERASE operation was previously suspended, this
Resume command resumes the operation.
FFh Read Array First During the array mode, array data is output on the data bus.
01h Lock Block Second If the previous command was PROTECTION CONFIGURATION SETUP,
the CSM latches the address and locks the block indicated on the
address bus.
2Fh Lock Down Second If the previous command was PROTECTION CONFIGURATION SETUP,
the CSM latches the address and locks down the block indicated on
the address bus.
D0h Unlock Block Second If the previous command was PROTECTION CONFIGURATION SETUP,
the CSM latches the address and unlocks the block indicated on the
address bus. If the block had been previously set to lock down, this
operation has no effect.
00h Invalid/Reserved Unassigned command that should not be used.
FLASH
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CLEAR STATUS REGISTER
The internal circuitry can set, but not clear, the block
lock status bit (SR1), the VPP status bit (SR3), the pro-
gram status bit (SR4), and the erase status bit (SR5) of
the status register. The CLEAR STATUS REGISTER com-
mand (50h) allows the external microprocessor to clear
these status bits and synchronize to the internal op-
erations. When the status bits are cleared, the device
returns to the read array mode.
READ OPERATIONS
The following READ operations are available: READ
ARRAY, READ PROTECTION CONFIGURATION REG-
ISTER, READ QUERY and READ STATUS REGISTER.
READ ARRAY
The array is read by entering the command code
FFh on DQ0–DQ7. Control signals F_CE# and F_OE#
must be at a logic LOW level (VIL), and F_WE# and F_RP#
must be at a logic HIGH level (VIH) to read data from the
array. Data is available on DQ0–DQ15. Any valid ad-
dress within any of the blocks selects that address and
allows data to be read from that address. Upon initial
power-up or device reset, the device defaults to the
read array mode.
READ CHIP PROTECTION IDENTIFICATION DATA
The chip identification mode outputs three types
of information: the manufacturer/device identifier, the
block locking status, and the protection register. Two
bus cycles are required for this operation: the chip iden-
tification data is read by entering the command code
90h on DQ0–DQ7 to the bank containing address 00h
and the identification code address on the address
lines. Control signals F_CE# and F_OE# must be at a
logic LOW level (VIL), and F_WE# and F_RP# must be at
a logic HIGH level (VIH) to read data from the protection
configuration register. Data is available on DQ0–DQ15.
After data is read from the protection configuration
register, the READ ARRAY command, FFh, must be is-
sued to the bank containing address 00h prior to issu-
ing other commands. See Table 9 for further details.
READ QUERY
The read query mode outputs common flash inter-
face (CFI) data when the device is read (see Table 11).
Two bus cycles are required for this operation. It is
possible to access the query by writing the read query
command code 98h on DQ0–DQ7 to the bank contain-
ing address 0h. Control signals F_CE# and F_OE# must
be at a logic LOW level (VIL), and F_WE# and F_RP#
must be at a logic HIGH level (VIH) to read data from the
query. The CFI data structure contains information
such as block size, density, command set, and electri-
cal specifications. To return to read array mode, write
the read array command code FFh on DQ0–DQ7.
READ STATUS REGISTER
The status register is read by entering the command
code 70h on DQ0–DQ7. Two bus cycles are required for
this operation: one to enter the command code and a
second to read the status register. In a READ cycle, the
address is latched and register data is updated on the
falling edge of F_OE# or F_CE#, whichever occurs last.
FLASH
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plished only by blocks; data at single address locations
within the array cannot be erased individually. The
block to be erased is selected by using any valid ad-
dress within that block. Block erasure is initiated by a
command sequence to the CSM: BLOCK ERASE setup
(20h) followed by BLOCK ERASE CONFIRM (D0h) (see
Table 4). A two-command erase sequence protects
against accidental erasure of memory contents.
When the BLOCK ERASE CONFIRM command is
complete, the WSM automatically executes a sequence
of events to complete the block erasure. During this
sequence, the block is programmed with logic 0s, data
is verified, all bits in the block are erased, and finally
verification is performed to ensure that all bits are cor-
rectly erased. Monitoring of the ERASE operation is
possible through the status register (see the Status
Register section).
During the execution of an ERASE operation, the
ERASE SUSPEND command (B0h) can be entered to
direct the WSM to suspend the ERASE operation. Once
the WSM has reached the suspend state, it allows the
CSM to respond only to the READ ARRAY, READ STA-
TUS REGISTER, READ QUERY, READ CHIP PROTEC-
TION CONFIGURATION, PROGRAM SETUP, PRO-
GRAM RESUME, ERASE RESUME and LOCK SETUP
(see the Block Locking section). During the ERASE SUS-
PEND operation, array data must be read from a block
other than the one being erased. To resume the ERASE
operation, an ERASE RESUME command (D0h) must
be issued to cause the CSM to clear the suspend state
previously set (see Figure 7). It is also possible that an
ERASE in any bank can be suspended and a WRITE to
another block in the same bank can be initiated. After
the completion of a WRITE, an ERASE can be resumed
by writing an ERASE RESUME command.
PROGRAMMING OPERATIONS
There are two CSM commands for programming:
PROGRAM SETUP and ALTERNATE PROGRAM SETUP
(see Table 3).
After the desired command code is entered (10h or
40h command code on DQ0–DQ7), the WSM takes over
and correctly sequences the device to complete the
PROGRAM operation. The WRITE operation may be
monitored through the status register (see the Status
Register section). During this time, the CSM only re-
sponds to a PROGRAM SUSPEND command until the
PROGRAM operation has been completed, after which
time all commands to the CSM become valid again.
The PROGRAM operation can be suspended by issuing
a PROGRAM SUSPEND command (B0h). Once the WSM
reaches the suspend state, it allows the CSM to re-
spond only to READ ARRAY, READ STATUS REGISTER,
READ PROTECTION CONFIGURATION, READ QUERY,
PROGRAM SETUP, or PROGRAM RESUME. During the
PROGRAM SUSPEND operation, array data should be
read from an address other than the one being pro-
grammed. To resume the PROGRAM operation, a PRO-
GRAM RESUME command (D0h) must be issued to
cause the CSM to clear the suspend state previously
set (see Figure 4 for programming operation and Figure
5 for program suspend and program resume).
Taking F_RP# to VIL during programming aborts the
PROGRAM operation.
ERASE OPERATIONS
An ERASE operation must be used to initialize all
bits in an array block to “1s.” After BLOCK ERASE con-
firm is issued, the CSM responds only to an ERASE
SUSPEND command until the WSM completes its task.
Block erasure inside the memory array sets all bits
within the address block to logic 1s. Erase is accom-
Table 6
Bus Operations
MODE F_RP# F_CE# F_OE# F_WE# ADDRESS DQ0–DQ15
Read (array, status registers, VIH VIL VIL VIH XDOUT
device identification register, or
query)
Standby VIH VIH X X X High-Z
Output Disable VIH VIH X X X High-Z
Reset VIL X X X X High-Z
Write VIH VIL VIH VIL XDIN
FLASH
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STATUS
BIT # STATUS REGISTER BIT DESCRIPTION
SR7 WRITE
STATE
MACHINE
STATUS
(WSMS) Check write state machine bit first to determine word
1 = Ready program or block erase completion, before checking
0 = Busy program or erase status bits.
SR6 ERASE SUSPEND STATUS (ESS) When ERASE SUSPEND is issued, WSM halts execution and
1 = BLOCK ERASE Suspended sets both WSMS and ESS bits to “1.” ESS bit remains set to
0 = BLOCK ERASE in “1” until an ERASE RESUME command is issued.
Progress/Completed
SR5 ERASE STATUS (ES) When this bit is set to “1,” WSM has applied the maximum
1 = Error in Block Erasure number of erase pulses to the block and is still unable to
0 = Successful BLOCK ERASE verify successful block erasure.
SR4 PROGRAM STATUS (PS) When this bit is set to “1,” WSM has attempted but failed to
1 = Error in PROGRAM program a word.
0 = Successful PROGRAM
SR3 VPP STATUS (VPPS) The VPP status bit does not provide continuous indication
1 = VPP Low Detect, Operation Abort of the VPP level. The WSM interrogates the VPP level only
0 = VPP = OK after the program or erase command sequences have been
entered and informs the system if VPP < 0.9V. The VPP level is
also checked before the PROGRAM/ERASE operation is
verified by the WSM. A factory option allows PROGRAM or
ERASE at 0V, in which case SR3 is held at “0.”
SR2 PROGRAM SUSPEND STATUS (PSS) When PROGRAM SUSPEND is issued, WSM halts execution
1 = PROGRAM Suspended and sets both WSM and PSS bits to “1.” PSS bit remains set to
0 = PROGRAM in Progress/Completed “1” until a PROGRAM RESUME command is issued.
SR1 BLOCK LOCK STATUS (BLS) If a PROGRAM or ERASE operation is attempted to one of
1 = PROGRAM/ERASE Attempted on a the locked blocks, this is set by the WSM. The operation
Locked Block; Operation Aborted specified is aborted, and the device is returned to read status
0 = No Operation to Locked Blocks mode.
SR0 RESERVED FOR FUTURE This bit is reserved for future.
ENHANCEMENT
Table 7
Status Register Bit Definition
WSMS ESS ES PS VPPS PSS BLS R
7654 3210
FLASH
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Figure 4
Automated Word Programming
Flowchart
NOTE: 1. Full status register check can be done after each word or after a sequence of words.
2. SR3 must be cleared before attempting additional PROGRAM/ERASE operations.
3. SR4 is cleared only by the CLEAR STATUS REGISTER command, but it does not prevent additional program operation
attempts.
BUS
OPERATION COMMAND COMMENTS
WRITE WRITE Data = 40h or 10h
PROGRAM Addr = Address of word to be
SETUP programmed
WRITE WRITE Data = Word to be
DATA programmed
Addr = Address of word to be
programmed
READ Status register data;
toggle OE# or CE# to update
status register.
Standby Check SR7
1 = Ready, 0 = Busy
Repeat for subsequent words.
Write FFh after the last word programming operation
to reset the device to read array mode.
BUS
OPERATION COMMAND COMMENTS
Standby Check SR1
1 = Detect locked block
Standby Check SR3
2
1 = Detect V
PP
low
Standby Check SR4
3
1 = Word program error
YES
NO
Full Status Register
Check (optional)
NO
YES
PROGRAM
SUSPEND?
SR7 = 1?
Issue PROGRAM SETUP
Command and
Word Address
Start
Word Program Passed
VPP Range Error
Word Program Failed
FULL STATUS REGISTER CHECK FLOW
Read Status Register
Bits
Issue Word Address
and Word Data
PROGRAM
SUSPEND Loop
1
YES
NO
SR1 = 0?
YES
NO
SR3 = 0?
YES
NO
SR4 = 0?
Word Program
Completed
Read Status Register
Bits
PROGRAM Attempted
on a Locked Block
FLASH
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Issue READ ARRAY
Command
PROGRAM
Complete
Finished
Reading
?
Issue PROGRAM
RESUME Command
YES
YES
NO
NO
SR2 = 1?
Start
PROGRAM Resumed
Read Status Register
Bits
Issue PROGRAM
SUSPEND Command
YES
NO
SR7 = 1?
Figure 5
PROGRAM SUSPEND/
PROGRAM RESUME Flowchart
BUS
OPERATION COMMAND COMMENTS
WRITE PROGRAM Data = B0h
SUSPEND
READ Status register data;
toggle OE# or CE# to update
status register.
Standby Check SR7
1 = Ready
Standby Check SR2
1 = Suspended
WRITE READ Data = FFh
MEMORY
READ Read data from block other
than that being programmed.
WRITE PROGRAM Data = D0h
RESUME
FLASH
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YES
NO
Full Status Register
Check (optional)
NO
YES
ERASE
SUSPEND?
SR 7 = 1?
Start
BLOCK ERASE Passed
VPP Range Error
BLOCK ERASE Failed
FULL STATUS REGISTER CHECK FLOW
Read Status Register
Bits
ERASE
SUSPEND Loop
1
YES
NO
SR1 = 0?
YES
NO
YES
NO
BLOCK ERASE
Completed
Read Status Register
Bits
ERASE Attempted
on a Locked Block
SR3 = 0?
SR5 = 0?
Issue ERASE SETUP
Command and
Block Address
Issue BLOCK ERASE
CONFIRM Command
and Block Address
Figure 6
BLOCK ERASE Flowchart
NOTE: 1. Full status register check can be done after each block or after a sequence of blocks.
2. SR3 must be cleared before attempting additional PROGRAM/ERASE operations.
3. SR5 is cleared only by the CLEAR STATUS REGISTER command in cases where multiple blocks are erased before full
status is checked.
BUS
OPERATION COMMAND COMMENTS
WRITE WRITE Data = 20h
ERASE Block Addr = Address
SETUP within block to be erased
WRITE ERASE Data = D0h
Block Addr = Address
within block to be erased
READ Status register data;
toggle OE# or CE# to
update status register.
Standby Check SR7
1 = Ready, 0 = Busy
Repeat for subsequent blocks.
Write FFh after the last BLOCK ERASE operation to
reset the device to read array mode.
BUS
OPERATION COMMAND COMMENTS
Standby Check SR1
1 = Detect locked block
Standby Check SR32
1 = Detect VPP block
Standby Check SR4 and SR5
1 = BLOCK ERASE
command error
Standby Check SR53
1 = BLOCK ERASE error
FLASH
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READ
PROGRAM
Issue READ ARRAY
Command
PROGRAM
Loop
ERASE
Complete
READ or
PROGRAM?
YES
NO
Issue ERASE
RESUME Command
READ or
PROGRAM
Complete?
YES
NO
SR6 = 1?
Start
ERASE Continued
Read Status Register
Bits
Issue ERASE
SUSPEND Command
2
(Note 1)
YES
NO
SR7 = 1?
Figure 7
ERASE SUSPEND/ERASE RESUME
Flowchart
NOTE: 1. See BLOCK ERASE Flowchart for complete erasure procedure.
2. See Word Programming Flowchart for complete programming procedure.
BUS
OPERATION COMMAND COMMENTS
WRITE ERASE Data = B0h
SUSPEND
READ Status register data;
toggle OE# or CE# to
update status register.
Standby Check SR7
1 = Ready
Standby Check SR6
1 = Suspended
WRITE READ Data = FFh
MEMORY
READ Read data from block
other than that being
erased.
WRITE ERASE Data = D0h
RESUME
FLASH
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READ-WHILE-WRITE/ERASE
CONCURRENCY
It is possible for the device to read from one bank
while erasing/writing to another bank. Once a bank
enters the WRITE/ERASE operation, the other bank
automatically enters read array mode. For example,
during a READ CONCURRENCY operation, if a PRO-
GRAM/ERASE command is issued in bank a, then bank
a changes to the read status mode and bank b defaults
to the read array mode. The device reads from bank b if
the latched address resides in bank b (see Figure 8).
Similarly, if a PROGRAM/ERASE command is issued in
bank b, then bank b changes to read status mode and
bank a defaults to read array mode. When returning to
bank a, the device reads program/erase status if the
latched address resides in bank a. A correct bank ad-
dress must be specified to read status register after
returning from concurrent read in the other bank.
When reading the CFI or the chip protection regis-
ter, concurrent operation is not allowed on the top boot
device. Concurrent READ of the CFI or the chip protec-
tion register is only allowed when a PROGRAM or ERASE
operation is performed on bank b on the bottom boot
device. For a bottom boot device, reading of the CFI
table or the chip protection register is only allowed if
bank b is in read array mode. For a top boot device,
reading of the CFI table or the chip protection register
is only allowed if bank a is in read array mode.
Figure 8
READ-While-WRITE Concurrency
Bank a
1 - Erasing/writing to bank a
2 - Erasing in bank a can be
suspended, and a WRITE to
another block in bank a
can be initiated.
3 - After the WRITE in that block
is complete, an ERASE can
be resumed by writing an
ERASE RESUME command.
1 - Reading bank a
Bank b
1 - Reading from bank b
1 - Erasing/writing to bank b
2 - Erasing in bank b can be
suspended, and a WRITE to
another block in bank b
can be initiated.
3 - After the WRITE in that block
is complete, an ERASE can
be resumed by writing an
ERASE RESUME command.
BLOCK LOCKING
The Flash memory of the MT28C3224P20 and
MT28C3224P18 devices provide a flexible locking
scheme which allows each block to be individually
locked or unlocked with no latency.
The devices offer two-level protection for the blocks.
The first level allows software-only control of block lock-
ing (for data which needs to be changed frequently),
while the second level requires hardware interaction
before locking can be changed (code which does not
require frequent updates).
Control signals F_WP#, DQ0, and DQ1 define the
state of a block; for example, state [001] means F_WP#
= 0, DQ0 = 0 and DQ1 = 1.
Table 8 defines all of the possible locking states.
NOTE: All blocks are software-locked upon comple-
tion of the power-up sequence.
LOCKED STATE
After a power-up sequence completion, or after a
reset sequence, all blocks are locked (states [001] or
[101]). This means full protection from alteration. Any
PROGRAM or ERASE operations attempted on a locked
block will return an error on bit SR1 of the status regis-
ter. The status of a locked block can be changed to
unlocked or lock down using the appropriate software
commands. Writing the lock command sequence, 60h
followed by 01h, can lock an unlocked block.
UNLOCKED STATE
Unlocked blocks (states [000], [100], [110]) can be
programmed or erased. All unlocked blocks return to
the locked state when the device is reset or powered
down. An unlocked block can be locked or locked down
using the appropriate software command sequence,
60h followed by D0h. (See Table 4.)
LOCKED DOWN STATE
Blocks locked down (state [011]) are protected from
PROGRAM and ERASE operations, but their protection
status cannot be changed using software commands
alone. A locked or unlocked block can be locked down
by writing the lock down command sequence, 60h fol-
lowed by 2Fh. Locked down blocks revert to the locked
state when the device is reset or powered down.
FLASH
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MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
The LOCK DOWN function is dependent on the
F_WP# input. When F_WP# = 0, blocks in lock down
[011] are protected from program, erase, and lock sta-
tus changes. When F_WP# = 1, the LOCK DOWN func-
tion is disabled ([111]) and locked down blocks can be
individually unlocked by a software command to the
[110] state, where they can be erased and programmed.
These blocks can then be relocked [111] and unlocked
[110], as desired, as long as F_WP# remains HIGH.
When F_WP# goes LOW, blocks that were previously
locked down return to the lock down state [011] regard-
less of any changes made while F_WP# was HIGH. De-
vice reset or power-down resets all locks, including
those in lock down, to the locked state (see Table 9).
READING A BLOCK’S LOCK STATUS
The lock status of every block can be read in the
read device identification mode. To enter this mode,
write 90h to the bank containing address 00h. Subse-
quent READs at block address +00002 will output the
lock status of that block. The lowest two outputs, DQ0
and DQ1, represent the lock status. DQ0 indicates the
block lock/unlock status and is set by the LOCK com-
mand and cleared by the UNLOCK command. It is also
automatically set when entering lock down. DQ1 indi-
cates lock down status and is set by the LOCK DOWN
command. It can only be cleared by reset or power-
down, not by software. Table 8 shows the block locking
state transition scheme. After data is read from the
Table 8
Block Locking State Transition
ERASE/PROGRAM LOCK
F_WP# DQ1 DQ0 NAME ALLOWED LOCK UNLOCK DOWN
0 0 0 Unlocked Yes To [001] To [011]
0 0 1 Locked (Default) No To [000] To [011]
0 1 1 Lock Down No
1 0 0 Unlocked Yes To [101] To [111]
1 0 1 Locked No To [100] To [111]
1 1 0 Lock Down Yes To [111] To [111]
Disabled
1 1 1 Lock Down No To [110]
Disabled
ITEM ADDRESS2DATA
Manufacturer Code (x16) 00000h 002Ch
Device Code 00001h
·Top boot configuration 44B4h
·Bottom boot configuration 44B5h
Block Lock Configuration XX002h Lock
·Block is unlocked DQ0 = 0
·Block is locked DQ0 = 1
·Block is locked down DQ1 = 1
Chip Protection Register Lock 80h PR Lock
Chip Protection Register 1 81h–84h Factory Data
Chip Protection Register 2 85h–88h User Data
NOTE: 1. Other locations within the configuration address space are reserved by
Micron for future use.
2. “XX” specifies the block address of lock configuration.
Table 9
Chip Configuration Addressing1
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
protection configuration register, the READ ARRAY
command, FFh, must be issued to the bank containing
address 00h prior to issuing other commands.
LOCKING OPERATIONS DURING ERASE
SUSPEND
Changes to block lock status can be performed dur-
ing an ERASE SUSPEND by using the standard locking
command sequences to unlock, lock, or lock down. This
is useful in the case when another block needs to be
updated while an ERASE operation is in progress.
To change block locking during an ERASE opera-
tion, first write the ERASE SUSPEND command (B0h),
then check the status register until it indicates that the
ERASE operation has been suspended. Next, write the
desired lock command sequence to block lock, and the
lock status will be changed. After completing any de-
sired LOCK, READ, or PROGRAM operations, resume
the ERASE operation with the ERASE RESUME com-
mand (D0h).
If a block is locked or locked down during an ERASE
SUSPEND on the same block, the locking status bits
are changed immediately. When the ERASE is resumed,
the ERASE operation completes.
A locking operation cannot be performed during a
PROGRAM SUSPEND.
STATUS REGISTER ERROR CHECKING
Using nested locking or program command se-
quences during ERASE SUSPEND can introduce ambi-
guity into status register results.
Following protection configuration setup (60h), an
invalid command produces a lock command error (SR4
and SR5 are set to “1”) in the status register. If a lock
command error occurs during an ERASE SUSPEND,
SR4 and SR5 are set to “1” and remain at “1” after the
ERASE SUSPEND command is issued. When the ERASE
is complete, any possible error during the ERASE can-
not be detected via the status register because of the
previous locking command error.
A similar situation happens if an error occurs during
a program operation error nested within an ERASE
SUSPEND.
CHIP PROTECTION REGISTER
A 128-bit chip protection register can be used to
fullfill the security considerations in the system (pre-
venting device substitution).
The 128-bit security area is divided into two 64-bit
segments. The first 64 bits are programmed at the
manufacturing site with a unique 64-bit number. The
other segment is left blank for customers to program as
desired. (See Figure 9).
READING THE CHIP PROTECTION REGISTER
The chip protection register is read in the device
identification mode, loading the 90h command. Once
in this mode, READ cycles from addresses shown in
Table 9 retrieve the specified information. To return to
the read array mode, write the READ ARRAY command
(FFh).
PAGE READ MODE
The initial portion of the page mode cycle is the
same as the asynchronous access cycle. Holding CE#
LOW and toggling addresses A0–A1 allows random ac-
cess of other words in the page.
The page size can be customized at the factory to
four or eight words as required; but if no specification is
made, the normal size is four words.
ASYNCHRONOUS READ CYCLE
When accessing addresses in a random order or
when switching between pages, the access time is given
by tAA.
When F_CE# and F_OE# are LOW, the data is placed
on the data bus and the processor can read the data.
Figure 9
Protection Register Memory Map
4 Words
Factory-Programmed
4 Words
User-Programmed
PR Lock 0
88h
85h
84h
81h
80h
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
STANDBY MODE
Icc supply current is reduced by applying a logic
HIGH level on F_CE# and F_RP# to enter the standby
mode. In the standby mode, the outputs are placed in
High-Z. Applying a CMOS logic HIGH level on F_CE#
and F_RP# reduces the current to ICC3 (MAX). If the
device is deselected during an ERASE operation or dur-
ing programming, the device continues to draw cur-
rent until the operation is complete.
AUTOMATIC POWER SAVE (APS) MODE
Substantial power savings are realized during peri-
ods when the Flash array is not being read and the
device is in the active mode. During this time the de-
vice switches to the automatic power save (APS) mode.
When the device switches to this mode, ICC is reduced
to a level comparable to ICC3. Further power savings can
be realized by applying a logic HIGH level on CE# to
place the device in standby mode. The low level of
power is maintained until another operation is initi-
ated. In this mode, the I/Os retain the data from the
last memory address read until a new address is read.
This mode is entered automatically if no addresses or
control signals toggle.
VPP/VCC PROGRAM AND ERASE
VOLTAGES
The Flash memory devices provide in-system
programming and erase with VPP in the 0.9V–2.2V range.
In addition to the flexible block locking, the VPP pro-
gramming voltage can be held LOW for absolute hard-
ware write protection of all blocks in the Flash device.
When VPP is below VPPLK, any PROGRAM or ERASE op-
eration results in an error, prompting the correspond-
ing status register bit (SR3) to be set.
A factory option provides in-system programming
and erase with VPP in the 0.0V–2.2V range.
VPP at 12V ±5% (VPP2) is supported for a maximum
of 100 cycles and 10 cumulative hours. The device
can withstand 100,000 WRITE/ERASE operations when
VPP = VCC.
During WRITE and ERASE operations, the WSM
monitors the VPP voltage level. WRITE/ERASE opera-
tions are allowed only when VPP is within the ranges
specified in Table 10.
When VCC is below VLKO or VPP is below VPPLK, any
WRITE/ERASE operation is prevented.
DEVICE RESET
To correctly reset the device, the RST# signal must
be asserted (RST# = VIL) for a minimum of tRP. After
reset, the device can be accessed for a READ operation
with a delayed access time of tRWH from the rising edge
of RST#. The circuitry used for generating the RST#
signal needs to be common with the rest of the system
reset to ensure that correct system initialization occurs.
Please refer to the timing diagram for further details.
POWER-UP SEQUENCE
The following power-up sequence is recommended
to properly initialize internal chip operations:
At power-up, RST# should be kept at VIL for 2µs
after VCC reaches VCC (MIN).
•VCCQ should not come up before VCC.
•VPP should be kept at VIL to maximize data
integrity.
When the power-up sequence is completed, RST#
should be brought to VIH. To ensure proper power-up,
the rise time of RST# (10%–90%) should be < 10µs.
Table 10
VPP Ranges (V)
DEVICE MIN MAX
In-System 0.9 2.2
In-Factory 11.4 12.6
FLASH
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MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
ABSOLUTE MAXIMUM RATINGS*
Voltage to Any Ball Except VCC and VPP
with Respect to VSS ............................ -0.5V to +2.45V
VPP Voltage (for BLOCK ERASE and PROGRAM
with Respect to VSS) ....................... -0.5V to +13.5V**
VCC and VCCQ Supply Voltage
with Respect to VSS ............................ -0.3V to +2.45V
Output Short Circuit Current............................... 100mA
Operating Temperature Range .............. -40oC to +85oC
Storage Temperature Range ................. -55oC to +125oC
Soldering Cycle ........................................... 260oC for 10s
*Stresses greater than those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only and functional
operation of the device at these or any other conditions
above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.
**Maximum DC voltage on VPP may overshoot to +13.5V
for periods <20ns.
RECOMMENDED OPERATING CONDITIONS
PARAMETER SYMBOL MIN MAX UNITS NOTES
Operating temperature tA -40 +85 oC
VCC supply voltage (MT28C3224P18) F_VCC, S_VCC 1.70 1.90 V
VCC supply voltage (MT28C3224P20) F_VCC, S_VCC 1.80 2.20 V
I/O supply voltage (MT28C3224P18) VCCQ 1.70 1.90 V
I/O supply voltage (MT28C3224P20) VCCQ 1.80 2.20 V
VPP voltage (when used as logic control) VPP10.9 2.2 V
VPP in-factory programming voltage VPP211.4 12.6 V
Data retention supply voltage S_VDR 1.0 V
Block erase cycling (VPP1)VPP = VPP1VPP1 100,000 Cycles
VPP = VPP2VPP2 100 Cycles 1
FLASH ELECTRICAL SPECIFICATIONS
NOTE: 1. VPP = VPP2 is a maximum of 10 cumulative hours.
Figure 11
Output Load Circuit
I/O
14.5K
30pF
VCC
VSS
14.5K
OutputTest PointsInput
V
CC
V
SS
AC test inputs are driven at VCC for a logic 1 and VSS for a logic 0. Input timing begins at VCC/2, and output timing ends
at VCCQ/2. Input rise and fall times (10% to 90%) < 5ns.
V
CC
Q/2V
CC
/2
Figure 10
AC Input/Output Reference Waveform
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
COMBINED DC CHARACTERISTICS1
VCC/VCCQ = 1.70V–1.90V
or 1.80V–2.20V
DESCRIPTION CONDITIONS SYMBOL MIN TYP MAX UNITS NOTES
Input Low Voltage VIL 0 0.4 V 2
Input High Voltage VIH VCCQ - VCCQV 2
0.4
Output Low Voltage VOL 0.10 V
IOL = 100µA (Flash)
Output Low Voltage VOL 0.3 V
IOL = 100µA (SRAM)
Output High Voltage VOH VCCQ - V
IOH = -100µA (Flash) 0.1
Output High Voltage VOH VCCQ - V
IOH = -100µA (SRAM) 0.3
VPP Lockout Voltage VPPLK 0.4 V
VPP During PROGRAM/ERASE VPP10.9 2.2 V
Operations VPP211.4 12.6 V 3
VCC Program/Erase Lock Voltage VLKO 1–V
Input Leakage Current IL––1µA
Output Leakage Current IOZ ––1µA
VCC Read Current ICC14, 5
Asynchronous Random Read 15 mA
100ns cycle
Asynchronous Page Read ICC2––5mA4, 5
100ns/35ns cycle
F_VCC plus S_VCC Standby Current ICC3–2560µA
F_VCC Program Current ICC4––55mA
F_VCC Erase Current ICC5–1845mA
F_VCC plus S_VCC ICC6–660µA6
Erase Suspend Current
F_VCC plus S_VCC ICC7–660µA6
Program Suspend Current
Read-While-Write Current ICC8––80mA
NOTE: 1. All currents are in RMS unless otherwise noted.
2. VIL may decrease to -0.4V and VIH may increase to VCCQ + 0.3V for durations not to exceed 20ns.
3. 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 10 cumulative hours.
4. APS mode reduces ICC to approximately ICC3 levels.
5. Test conditions: Vcc = VCC (MAX), CE# = VIL, OE# = VIH. All other inputs = VIH or VIL.
6. ICC6 and ICC7 values are valid when the device is deselected. Any READ operation performed while in suspend mode will
add a current draw of ICC1 or ICC2.
7. Operating current is a linear function of operating frequency and voltage. Operating current can be calculated using
the formula shown with operating frequency (f) expressed in MHz and operating voltage (V) in volts.
Example: When operating at 2 MHz at 2V, the device will draw a typical active current of 0.8*2*2 = 3.2mA in the page
access mode. This parameter is specified with the outputs disabled to avoid external loading effects. The user must add
current required to drive output capacitance expected in the actual system.
(continued on next page)
FLASH
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2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
COMBINED DC CHARACTERISTICS (continued)1
VCC/VCCQ = 1.70V–1.90V
or 1.80V–2.20V
DESCRIPTION CONDITIONS SYMBOL MIN TYP MAX UNITS NOTES
S_VCC Read/Write Operating VIN = VIH or VIL ICC9–1225mA7
Supply Current – Page Access chip enabled, IOL = 0
Mode
VPP Current IPP1
(Read, Standby, Erase Suspend, VPP VCC ––1µA
Program Suspend) VPP VCC 200 µA
NOTE: 1. All currents are in RMS unless otherwise noted.
2. VIL may decrease to -0.4V and VIH may increase to VCCQ + 0.3V for durations not to exceed 20ns.
3. 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 10 cumulative hours.
4. APS mode reduces ICC to approximately ICC3 levels.
5. Test conditions: Vcc = VCC (MAX), CE# = VIL, OE# = VIH. All other inputs = VIH or VIL.
6. ICC6 and ICC7 values are valid when the device is deselected. Any READ operation performed while in suspend mode will
add a current draw of ICC1 or ICC2.
7. Operating current is a linear function of operating frequency and voltage. Operating current can be calculated using
the formula shown with operating frequency (f) expressed in MHz and operating voltage (V) in volts.
Example: When operating at 2 MHz at 2V, the device will draw a typical active current of 0.8*2*2 = 3.2mA in the page
access mode. This parameter is specified with the outputs disabled to avoid external loading effects. The user must add
current required to drive output capacitance expected in the actual system.
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
CAPACITANCE
(TA = +25ºC; f = 1 MHz)
PARAMETER/CONDITION SYMBOL TYP MAX UNITS
Input Capacitance C 7 12 pF
Output Capacitance COUT 13 15 pF
FLASH READ CYCLE TIMING REQUIREMENTS
-80 -85
VCC = 1.80V2.20V VCC = 1.70V1.90V
PARAMETER SYMBOL MIN MAX MIN MAX UNITS
Address to output delay tAA 80 85 ns
CE# LOW to output delay tACE 80 85 ns
Page address access tAPA 30 35 ns
OE# LOW to output delay tAOE 25 30 ns
F_RP# HIGH to output delay tRWH 200 250 ns
CE# or OE# HIGH to output High-Z tOD 25 25 ns
Output hold from address, CE# or OE# change tOH 0 0 ns
READ cycle time tRC 80 85 ns
FLASH
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2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
FLASH WRITE CYCLE TIMING REQUIREMENTS
-80/-85
PARAMETER SYMBOL MIN MAX UNITS
Reset HIGH recovery to WE# going LOW tRS 150 ns
CE# setup to WE# going LOW tCS 0 ns
Write pulse width tWP 50 ns
Data setup to WE# going HIGH tDS 50 ns
Address setup to WE# going HIGH tAS 50 ns
CE# hold from WE# HIGH tCH 0 ns
Data hold from WE# HIGH tDH 0 ns
Address hold from WE# HIGH tAH 1.5 ns
Write pulse width HIGH tWPH 30 ns
WP# setup to WE# going HIGH tRHS 0 ns
VPP setup to WE# going HIGH tVPS 200 ns
Write recovery before READ tWOS 50 ns
Write recovery before READ in opposite bank tWOA 0 ns
WP# hold from valid SRD tRHH 0 ns
VPP hold from valid SRD tVPPH 0 ns
WE# HIGH to data valid tWB tAA + 50 ns
FLASH ERASE AND PROGRAM CYCLE TIMING REQUIREMENTS
-80/-85
PARAMETER TYP MAX UNITS
4KW parameter block program time 40 800 ms
32KW parameter block program time 320 6,400 ms
Word program time 8 10,000 µs
4KW parameter block erase time 0.3 6 s
32KW parameter block erase time 0.5 6 s
Program suspend latency 510µs
Erase suspend latency 520µs
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
TWO-CYCLE PROGRAMMING/ERASE OPERATION
VALID ADDRESS VALID ADDRESS VALID ADDRESS
UNDEFINED
t
CH
t
DH
t
RHS
t
DS
A0–A20
OE#
CE#
WE#
V
PP
RST#
WP#
V
IH
V
IH
V
IL
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IPPLK
V
IL
V
IPPH
t
AS
t
AH
t
WPH
t
RS
t
WP
t
WOS
t
CS
t
WB
CMD CMD/
DATA
DQ0–DQ15
V
OH
V
OL
t
RHH
t
VPS
t
VPPH
STATUS
High-Z
NOTE: 1. The WRITE cycles for the WORD PROGRAMMING command are followed by a READ ARRAY DATA cycle.
-80/-85
SYMBOL MIN MAX UNITS
WRITE TIMING PARAMETERS
-80/-85
SYMBOL MIN MAX UNITS
tRS 150 ns
tCS 0 ns
tWP 50 ns
tDS 50 ns
tAS 50 ns
tCH 0 ns
tDH 0 ns
tAH 1.5 ns
tRHS 0 ns
tVPS 200 ns
tWOS 50 ns
tRHH 0 ns
tVPPH 0 ns
tWB tAA+50 ns
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
SINGLE ASYNCHRONOUS READ OPERATION
VALID ADDRESS
UNDEFINED
t
OD
t
AA
t
ACE
t
OH
A0–A20
OE#
CE#
WE#
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
t
RC
t
RWH
DQ0–DQ15
RP#
VOH
VOL
VALID OUTPUT
High-Z
t
AOE
-80 -85
VCC = 1.80V–2.20V VCC = 1.70V–1.90V
SYMBOL MIN MAX MIN MAX UNITS
READ TIMING PARAMETERS
-80 -85
VCC = 1.80V–2.20V VCC = 1.70V–1.90V
SYMBOL MIN MAX MIN MAX UNITS
tAA 80 85 ns
tACE 80 85 ns
tAOE 25 30 ns
tRWH 200 250 ns
tOD 25 25 ns
tOH 0 0 ns
tRC 80 85 ns
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
ASYNCHRONOUS PAGE MODE READ OPERATION
VALID ADDRESS
VALID
ADDRESS
VALID
ADDRESS
VALID
ADDRESS
VALID
OUTPUT
VALID
OUTPUT
VALID
OUTPUT
VALID
OUTPUT
UNDEFINED
t
OD
t
AA
t
ACE
t
OH
tA
PA
t
AOE
t
RMH
A0–A1
F_OE#
F_CE#
F_WE#
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
VALID ADDRESS
A2–A20 V
IH
V
IL
F_RP#
V
IH
V
IL
DQ0–DQ15
V
OH
V
OL
High-Z
-80 -85
VCC = 1.80V–2.20V VCC = 1.70V–1.90V
SYMBOL MIN MAX MIN MAX UNITS
READ TIMING PARAMETERS
-80 -85
VCC = 1.80V–2.20V VCC = 1.70V–1.90V
SYMBOL MIN MAX MIN MAX UNITS
tAA 80 85 ns
tACE 80 85 ns
tA P A 30 35 n s
tAOE 25 30 ns
tRWH 200 250 ns
tOD 25 25 ns
tOH 0 0 ns
FLASH
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
RESET OPERATION
F_OE#
DQ0–DQ15
VIH
VIL
F_RST# VIH
VIL
F_CE# VIH
VIL
VOH
VOL
tRWH
tRP
READ TIMING PARAMETERS
-80 -85
VCC = 1.80V–2.20V VCC = 1.70V–1.90V
SYMBOL MIN MAX MIN MAX UNITS
tRWH 200 250 ns
tRP 100 100 ns
FLASH
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2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
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2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
Table 11
CFI
OFFSET DATA DESCRIPTION
00 2Ch Manufacturer Code
01 B4h Top boot block device code
B5h Bottom boot block device code
02–0F reserved Reserved
10, 11 0051,0052 “QR”
12 0059 “Y”
13, 14 0003, 0000 Primary OEM command set
15, 16 0039, 0000 Address for primary extended table
17, 18 0000, 0000 Alternate OEM command set
19, 1A 0000, 0000 Address for OEM extended table
1B 0017 VCC MIN for Erase/Write; Bit7–Bit4 Volts in BCD; Bit3–Bit0 100mV in BCD
1C 0022 VCC MAX for Erase/Write; Bit7–Bit4 Volts in BCD; Bit3–Bit0 100mV in BCD
1D 00B4 VPP MIN for Erase/Write; Bit7–Bit4 Volts in Hex; Bit3–Bit0 100mV in BCD
1E 00C6 VPP MAX for Erase/Write; Bit7–Bit4 Volts in Hex; Bit3–Bit0 100mV in BCD
1F 0003 Typical timeout for single byte/word program, 2n µs, 0000 = not supported
20 0000 Typical timeout for maximum size multiple byte/word program, 2n µs, 0000 = not
supported
21 0009 Typical timeout for individual block erase, 2n ms, 0000 = not supported
22 0000 Typical timeout for full chip erase, 2n ms, 0000 = not supported
23 000C Maximum timeout for single byte/word program, 2n µs, 0000 = not supported
24 0000 Maximum timeout for maximum size multiple byte/word program, 2n µs, 0000 = not
supported
25 0003 Maximum timeout for individual block erase, 2n ms, 0000 = not supported
26 0000 Maximum timeout for full chip erase, 2n ms, 0000 = not supported
27 0016 Device size, 2n bytes
28 0001 Bus interface x8 = 0, x16 = 1, x8/x16 = 2
29 0000 Flash device interface description 0000 = async
2A, 2B 0000, 0000 Maximum number of bytes in multi-byte program or page, 2n
2C 0003 Number of erase block regions within device (4K words and 32K words)
2D, 2E 002F, 0000 Top boot block device erase block region information 1, 8 blocks …
0007, 0000 Bottom boot block device erase block region information 1, 8 blocks …
2F, 30 0000, 0001 Erase block region information 1, 8 blocks …
0020, 0000 …of 8KB
31, 32 000E, 0000 7 blocks of ….
33, 34 0000, 0001 ……64KB
35, 36 0007, 0000 Top boot block device ……48 blocks of
002F, 0000 Bottom boot block device ……48 blocks of
(continued on the next page)
FLASH
35
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
Table 11
CFI (continued)
OFFSET DATA DESCRIPTION
37, 38 0020, 0000 Top boot block device……64KB
0000, 0001 Bottom boot block device……64KB
39, 3A 0050, 0052 “PR”
3B 0049 “I”
3C 0030 Major version number, ASCII
3D 0031 Minor version number, ASCII
3E 00E6 Optional Feature and Command Support
3F 0002 Bit 0 Chip erase supported no = 0
40 0000 Bit 1 Suspend erase supported = yes = 1
41 0000 Bit 2 Suspend program supported = yes = 1
Bit 3 Chip lock/unlock supported = no = 0
Bit 4 Queued erase supported = no = 0
Bit 5 Instant individual block locking supported = yes = 1
Bit 6 Protection bits supported = yes = 1
Bit 7 Page mode read supported = yes = 1
Bit 8 Synchronous read supported = yes = 1
Bit 9 Simultaneous operation supported = yes = 1
42 0001 Program supported after erase suspend = yes
43, 44 0003,0000 Bit 0 block lock status active = yes; Bit 1 block lock down active = yes
45 0018 VCC supply optimum; Bit7–Bit4 Volts in BCD; Bit3–Bit0 100mV in BCD
46 00C0 VPP supply optimum; Bit7–Bit4 Volts in Hex; Bit3–Bit0 100mV in BCD
47 0001 Number of protection register fields in JEDEC ID space
48, 49 0080, 0000 Lock bytes LOW address, lock bytes HIGH address
4A, 4B 0003, 0003 2n factory programmed bytes, 2n user programmable bytes
4C 0003 Background Operation
0000 = Not used
0001 = 4% block split
0002 = 12% block split
0003 = 25% block split
0004 = 50% block split
4D 0000 Burst Mode Type
0000 = No burst mode
00x1 = 4 words max
00x2 = 8 words max
00x3 = 16 words max
001x = Linear burst, and/or
002x = Interleaved burst, and/or
004x = Continuous burst
4E 0002 Page Mode Type
0000 = No page mode
0001 = 4-word page
0002 = 8-word page
0003 = 16-word page
0004 = 32-word page
4F 0004 SRAM density, 4Mb (256K x 16)
SRAM
36
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
SRAM OPERATING MODES
SRAM READ ARRAY
The operational state of the SRAM is determined by
S_CE1#, S_CE2, S_WE#, S_OE#, S_UB#, and S_LB#, as
indicated in the Truth Table. To perform an SRAM
READ operation, S_CE1#, and S_OE#, must be at VIL,
and S_CE2 and S_WE# must be at VIH. When in this
state, S_UB# and S_LB# control whether the lower byte
is read (S_UB# VIH, S_LB# VIL), the upper byte is read
(S_UB# VIL, S_LB# VIH), both upper and lower bytes are
read (S_UB# VIL, S_LB# VIL), or neither are read (S_UB#
VIH, S_LB# VIH) and the device is in a standby state.
While performing an SRAM READ operation, cur-
rent consumption may be reduced by reading within a
16-word page. This is done by holding S_CE1# and
SRAM FUNCTIONAL BLOCK DIAGRAM
DQ0–DQ7
WORD
ADDRESS
DECODE
LOGIC
PAGE
ADDRESS
DECODE
LOGIC
CONTROL
LOGIC
16K-PAGE
x16 WORD
x16 BIT
RAM ARRAY
WORD
MUX DQ8–DQ15
INPUT/
OUTPUT
MUX
AND
BUFFERS
S_CE1#
A4–A17
A0–A3
S_OE#
S_UB#
S_LB#
S_CE2
S_WE#
S_OE# at VIL, S_WE# and S_CE2 at VIH, and toggling
addresses A0–A3. S_UB# and S_LB# control the data
width as described above.
SRAM WRITE ARRAY
In order to perform an SRAM WRITE operation,
S_CE1# and S_WE# must be at VIL, and S_CE2 and
S_OE# must be at VIH. When in this state, S_UB# and
S_LB# control whether the lower byte is written (S_UB#
VIH, S_LB# VIL), the upper byte is written (S_UB# VIL,
S_LB# VIH), both upper and lower bytes are written
(S_UB# VIL, S_LB# VIL), or neither are written (S_UB#
VIH, S_LB# VIH) and the device is in a standby state.
SRAM
37
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
TIMING TEST CONDITIONS
Input pulse levels .................... 0.1V VCC to 0.9V VCC
Input rise and fall times .................................... 5ns
Input timing reference levels ......................... 0.5V
Output timing reference levels ..................... 0.5V
Operating Temperature ............... -40oC to +85oC
SRAM WRITE CYCLE TIMING
-80/-85
DESCRIPTION SYMBOL MIN MAX UNITS
Write cycle time tWC 85 ns
Chip enable to end of write tCW 50 ns
Address valid to end of write tAW 50 ns
Byte select to end of write tLBW, tUBW 50 ns
Address setup time tAS 0 ns
Write pulse width tWP 50 ns
Write recovery time tWR 0 ns
Write to High-Z output tWHZ 0 15 ns
Data to write time overlap tDW 50 ns
Data hold from write time tDH 0 ns
End write to Low-Z output tOW 0 ns
NOTE: For input/output contacts, refer to the Capacitance Table.
SRAM READ CYCLE TIMING
-80/-85
VCC = 1.70V–1.90V VCC = 1.80V–2.20V
DESCRIPTION SYMBOL MIN MAX MIN MAX UNITS
Read cycle time tRC 100 85 ns
Address access time tAA 100 85 ns
Chip enable to valid output tCO 100 85 ns
Output enable to valid output tOE 35 35 ns
Byte select to valid output tLB, tUB 100 85 ns
Chip enable to Low-Z output tLZ 0 0 ns
Output enable to Low-Z output tOLZ 0 0 ns
Byte select to Low-Z output tLBZ, tUBZ 0 0 ns
Chip enable to High-Z output tHZ 0 15 0 15 ns
Output disable to High-Z output tOHZ 0 15 0 15 ns
Byte select disable to High-Z output tLBHZ, tUBHZ 0 15 0 15 ns
Output hold from address change tOH 5 5 ns
SRAM
38
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
DON’T CARE
ADDRESS
S_CE1#
S_CE2
S_OE#
S_LB#, S_UB#
DATA-OUT
tRC
tAA tHZ (1, 2)
tCO
tLBLZ, tUBLZ tLBHZ, tUBHZ
DATA VALID
High-Z
tOE
tLZ(2)
tOLZ
tOHZ (1)
tLB, tUB
READ CYCLE 1
(S_CE1# = S_OE# = VIL; S_CE2, S_WE# = VIH)
ADDRESS
DATA-OUT
tRC
tAA
tOH
PREVIOUS
DATA VALID DATA VALID
READ CYCLE 2
(S_WE# = VIH)
READ TIMING PARAMETERS
-80/-85
VCC = 1.70V–1.90V VCC = 1.80V–2.20V
SYMBOL MIN MAX MIN MAX UNITS
tRC 100 85 ns
tAA 100 85 ns
tCO 100 85 ns
tOE 35 35 ns
tLB,
tUB 100 85 ns
tLZ 0 0 ns
-80/-85
VCC = 1.70V–1.90V VCC = 1.80V–2.20V
SYMBOL MIN MAX MIN MAX UNITS
tOLZ 0 0 ns
tHZ 0 15 0 15 ns
tOHZ 0 15 0 15 ns
tLBHZ,
tUBHZ 0 15 0 15 ns
tOH 5 5 ns
SRAM
39
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
WRITE CYCLE
(S_WE# CONTROL)
DON’T CARE
ADDRESS
S_CE1#
S_CE2
DATA-OUT
tWC
tAW tWR
tCW
tWHZ tOW
High-Z
S_LB#, S_UB#
tLBW, tUBW
S_WE#
DATA-IN
tAS tWP
tDH
tDW
DATA VALID
High-Z
-80/-85
SYMBOL MIN MAX UNITS
WRITE TIMING PARAMETERS
-80/-85
SYMBOL MIN MAX UNITS
tWC 85 ns
tCW 50 ns
tAW 50 ns
tLBW,
tUBW 50 ns
tAS 0 ns
tWP 50 ns
tWR 0 ns
tWHZ 0 15 ns
tDW 50 ns
tDH 0 ns
tOW 0 ns
SRAM
40
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
WRITE CYCLE 2
(S_CE1# CONTROL)
DON’T CARE
ADDRESS
S_CE1#
DATA-OUT
tWC
tAW tWR
tCW
tWHZ
tLZ
High-Z
S_LB#, S_UB#
S_WE#
DATA-IN
tAS
tWP
tLBW, tUBW
tDH
tDW
DATA VALID
-80/-85
SYMBOL MIN MAX UNITS
WRITE TIMING PARAMETERS
-80/-85
SYMBOL MIN MAX UNITS
tWC 85 ns
tCW 50 ns
tAW 50 ns
tLBW,
tUBW 50 ns
tAS 0 ns
tWP 50 ns
tWR 0 ns
tWHZ 0 15 ns
tDW 50 ns
tDH 0 ns
tOW 0 ns
41
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
66-BALL FBGA
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
E-mail: prodmktg@micron.com, Internet: http://www.micron.com, Customer Comment Line: 800-932-4992
Micron is a registered trademark and the Micron logo and M logo are trademarks of Micron Technology, Inc.
SOLDER BALL MATERIAL: EUTECTIC 63% Sn, 37% Pb or
62% Sn, 36% Pb, 2%Ag
SOLDER BALL PAD: Ø .27mm
MOLD COMPOUND: EPOXY NOVOLAC
SUBSTRATE: PLASTIC LAMINATE
1.40 MAX
0.80
(TYP)
8.80
0.80
(TYP)
8.00 ±0.10
12.00 ±0.10
4.40 ±0.05 6.00 ±0.05
66X Ø
0.35
BALL A12 BALL A1
BALL A1
BALL #1 ID
5.60
2.80 ±0.05
4.00 ±0.05
0.10
1.05 ±0.075
CC
SEATING PLANE
SOLDER BALL DIAMETER
REFERS TO POST REFLOW
CONDITION. THE PRE-
REFLOW DIAMETER IS Ø 0.33
C
L
C
L
NOTE: 1. All dimensions in millimeters.
2. Package width and length do not include mold protrusion; allowable mold protrusion is 0.27mm per side.
DATA SHEET DESIGNATION
No Marking: This data sheet contains minimum and maximum limits specified over the complete power supply
and temperature range for production devices. Although considered final, these specifications are
subject to change, as further product development and data characterization sometimes occur.
42
2 Meg x 16 Page Flash 256K x 16 SRAM Combo Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
MT28C3224P20_4.p65 – Rev. 4, Pub. 10/02 ©2002, Micron Technology, Inc.
2 MEG x 16 PAGE FLASH
256K x 16 SRAM COMBO MEMORY
REVISION HISTORY
Rev. 4 ................................................................................................................................................................................ 10/02
• ADVANCE designation removed.
Rev. 3, ADVANCE .............................................................................................................................................................. 7/02
• Updated Status Register Section
• Updated command descriptions
• Updated Read-While-Write Concurrency section
• Updated timing diagrams
• Changed Cout from 9 (TYP) and 12 (MAX) to 13 (TYP) and 15 (MAX)
• Changed tRHS from 200ns to 0ns
• Updated DC Characteristics
Rev. 2, ADVANCE .............................................................................................................................................................. 4/02
• Updated the DC CHARACTERISTICS table
• Updated the chip protection mode and register information
• Updated the block locking information
Rev. 2, ADVANCE .............................................................................................................................................................. 3/02
• Updated Table 4
• Updated Figure 9
• Updated notes for Combined DC Characteristics
Original document, Rev. 1, ADVANCE ....................................................................................................................... 12/01