MIL-M-38510/315D
27 October 2003
SUPERSEDING
MIL-M-38510/315C
17 JANUARY 1984
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, LOW-POWER SCHOTTKY TTL,
COUNTERS, MONOLITHIC SILICON
This specification is approved for use by all Departments
and Agencies of the Department of Defense.
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, low power Schottky TTL,
binary and decade counters. Two product assurance classes and a choice of case outlines/lead finish are provided
for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have
been superseded by MIL-PRF-38535, (see 6.3).
1.2 Part or Identifying Number (PIN). The PIN should be in accordance with MIL-PRF-38535, and as specified
herein.
1.2.1 Device types. The device types should be as follows:
Device type Circuit
01 Decade counter
02 4-bit binary counter
03 Synchronous 4-bit decade counter (asynchronous clear)
04 Synchronous 4-bit binary counter (asynchronous clear)
05 Synchronous 4-bit up/down decade counter
06 Synchronous 4-bit up/down binary counter
07 Synchronous 4-bit up/down decade counter (with clear)
08 Synchronous 4-bit up/down binary counter (with clear)
09 Synchronous 4-bit up/down binary counter (with mode control)
10 Divide-by-twelve counter
11 Synchronous 4-bit decade counter (with synchronous clear)
12 Synchronous 4-bit binary counter (with synchronous clear)
13 Synchronous 4-bit decade counter (with mode control)
1.2.2 Device class. The device class should be the product assurance level as defined in MIL-PRF-38535.
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43216-5000, or emailed to
bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this
address infor mat ion us ing the ASSIST Online databa se at ww w . dodssp.d aps .mil.
AMSC N/A FSC 5962
INCH
-
POUND
Inactive for new design after 18 April 1997.
MIL-M-38510/315D
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1.2.3 Case outlines. The case outlines should be as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style
A GDFP5-F14 or CDFP6-F14 14 Flat pack
B GDFP4-F14 14 Flat pack
C GDIP1-T14 or CDIP2-T14 14 Dual-in-line
D GDFP1-F14 or CDFP2-F14 14 Flat pack
E GDIP1-T16 or CDIP2-T16 16 Dual-in-line
F GDFP2-F16 or CDFP3-F16 16 Flat pack
2 CQCC1-N20 20 Square leadless chip carrier
1.3 Absolute maximum ratings.
Supply voltage range ............................................................................. -0.5 V dc to 7.0 V dc
Input voltage range ................................................................................ -1.2 V dc at -18 mA to 5.5 V dc
Storage temperatur e range .................................................................... -65° to +150°C
Maximum power dissipation, (PD) 1/ :
Device type 05, 06, 07, 08................................................................. 187 mW
Device type 01, 02, 10....................................................................... 83 mW
Device type 03, 04, 11, 12................................................................. 176 mW
Device type 09, 13 ............................................................................ 193 mW
Lead temperature (solderin g, 10 seco nds) ............................................. 300°C
Thermal resistance, junction to case (θJC):
Cases A, B, C, D, E, F, and 2 (See MIL-STD-1835)
Junction temperature (TJ) 3/.................................................................... 175°C
1.4 Recommended operating conditions. 2/
Maximum low level output current (IoL) ................................................... 4.0 mA
Supply voltage (VCC) .............................................................................. 4.5 V dc minimum to 5.5 V dc maximum
Minimum high-level input voltage (VIH) ................................................... 2.0 V dc
Maximum low-level input voltage (VIL) .................................................... 0.7 V dc
Normalized fanout (each output)
Types 01, 02, 05, 06, 07, 08, 1 0........................................................ 10 maximum
Types 03, 04, 09, 11, 12, 13..............................................................
Low-level...................................................................................... 10 maximum
High-level ..................................................................................... 20 maximum
Width of input count pulse, tp(IN)
Types 01, 02, 10
Input A, reset................................................................................ 15 ns minimum
Input B.......................................................................................... 30 ns minimum
Types 07, 08..................................................................................... 20 ns minimum
Width of reset pulse, tp(reset)
Types 01, 02, 10 ............................................................................... 25 ns minimum
Count enable time
Type 09, enable ............................................................................... 40 ns minimum
_______
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ A change of states on the U/D input for device types 09 and 13 is not recommended
when the clock input is low. This may result in an erroneous count.
3/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in
screening conditions in accordance with MIL-PRF-38535.
MIL-M-38510/315D
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Input clock frequency, fclock
Types 01, 02, 10
Input A.......................................................................................... 0 to 29 MHz
Types 03, 04, 11, 12 ......................................................................... 0 to 22 MHz
Types 09, 13..................................................................................... 0 to 18 MHz
Types 07, 08..................................................................................... 0 to 20 MHz
Types 05, 06..................................................................................... 0 to 25 MHz
Width of clock pul se, tw(clock)
Types 03, 06, 09, 11, 12, 13.............................................................. 25 ns minimum
Types 04........................................................................................... 30 ns minimum
Types 05........................................................................................... 20 ns minimum
Width of clear pulse, tw (clear)
Types 03, 04, 05, 06, 07, 08, 11, 12..................................................20 ns minimum
Setup time, t(setup)
Types 03, 11, 12
Enable P....................................................................................... 25 ns minimum
Load ............................................................................................. 25 ns minimum
Clear (types 11 and 12 only) ........................................................ 20 ns minimum
Type 04
Enable P....................................................................................... 35 ns minimum
Load ............................................................................................. 35 ns minimum
Data inputs
Types 03, 09, 11, 12, 13 ......................................................... 20 ns minimum
Type 04................................................................................... 25 ns minimum
Types 07, 08 ........................................................................ 30 ns minimum
Type 05
Data, L inputs............................................................................... 15 ns minimum
U/D input..................................................................................... 30 ns minimum
EP, ET inputs ............................................................................... 15 ns minimum
Type 06
Data, L inputs............................................................................... 25 ns minimum
U/D input..................................................................................... 30 ns minimum
EP, ET, inputs .............................................................................. 25 ns minimum
Hold time at any input, t(hold)
Types 09, 13..................................................................................... 0 ns minimum
Types 07, 08..................................................................................... 10 ns minimum
Types 05, 06
Data, EP, ET inputs...................................................................... 5 ns minimum
L, U/D inputs ............................................................................... 0 ns minimum
Types 03, 04, 11, 12 ......................................................................... 10 ns minimum
Types 03, 04, 11, 12 tW (clear)......................................................... 0 ns minimum
Case operating temperature range (Tc)................................................... -55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section
does not include documents cited in other sections of this specification or recommended for additional information or as
examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they
must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are
listed.
MIL-M-38510/315D
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2.2 Government documents.
2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the
extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or
contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard for Microelectronics.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines
(Copies of these documents are available online at http://assist.daps.dla.mil;quicksearch/ or www.dodssp.daps.mil or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein,
the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations
unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract
award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified
herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not
affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections and logic diagrams. The terminal connections and logic diagrams shall be as specified on
figures 1 and 2.
3.3.2 Truth tables. The truth tables and logic equations shall be as specified on figure 3.
3.3.4 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the
qualifying activity and the preparing activity (DSCC-VAS) upon request.
3.3.5 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
MIL-M-38510/315D
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3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply
over the full recommended case operating temperature range, unless otherwise specified.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in
table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 12
(see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to
qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained
under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-
PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test
prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B.
MIL-M-38510/315D
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TABLE I. Electrical performance characteristics.
Limits
Test Symbol Conditions
-55°C < TC < +125°C
unless otherw ise sp eci f ied
Device
types Min Max Unit
Low-level output voltage VOL V
CC = 4.5 V, VIH = 2.0 V
VIL = 0.7 V, IOL = 4 mA 1/ All - 0.4 V
High-level output voltage VOH V
CC = 4.5 V, VIH = 2.0 V
VIL = 0.7 V, IOH = -400m µA All 2.5 - V
Input clamp voltag e VIC TC = 25°C, VCC = 4.5 V
IIN = -18 mA
All - -1.5 V
Low-level input current
at reset inputs IIL1 01, 02,
10
-30 -400 µA
Low-level input current
at input A IIL2 01, 02,
10 -0.5 -2.4 mA
01, 10 -0.4 -3.2 mA Low-level input current
at input B IIL3 02 -0.4 -1.6 mA
Low-level input current
at data, clear, EnP IIL4 03, 04 -30 -400
µA
Low-level input current
at data, EnP IIL4 01, 12 -30 -400
µA
Low-level input current
at clear IIL4 01, 12 -30 -760
µA
Low-level input current
at load IIL5 03, 04,
11, 12 -30 -800 µA
Low-level input current
at EnT IIL5 03, 04,
11, 12 -30 -860 µA
03, 04, Low-level input current
at clock IIL6 11, 12 0 -.630 mA
09 -.15 -1.08 Low-level input current
at EnG IIL7 13 -.36 -1.08
mA
Low-level input current
at data, clock, down/up IIL8 09, 13 -120 -400
µA
Low-level input current
at load IIL8 09, 13 -100 -400
µA
Low-level input current
at data IIL9 07, 08 -100 -400
µA
Low-level input current
at load IIL10 07, 08 -100 -400
µA
Low-level input current at
clear, count up, count down IIL11 07, 08 -120 -400
µA
Low-level input current
at data IIL12 05, 06 -3.0 -400
µA
Low-level input current
at clock, down/up IIL13 05, 06 -135 -370
µA
Low-level input current
at EP IIL14 05, 06 -150 -385
µA
Low-level input current
at ET IIL15
VCC = 5.5 V, VIN = 0.4 V
05, 06 -280 -760 µA
See footnotes at end of table.
MIL-M-38510/315D
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TABLE I. Electrical performance characteristics.
Limits
Test Symbol Conditions
-55°C < TC < +125°C
unless otherw ise sp eci f ied
Device
types Min Max Unit
High-level input current
at reset inputs IIH1 VCC = 5.5 V, VIN = 2.7 V
01, 02
10 - 20
µA
High-level input current
at reset inputs IIH2 VCC = 5.5 V, VIN = 5.5 V 01, 02
10 - 100
µA
High-level input current
at input A IIH3 VCC = 5.5 V, VIN = 2.7 V 01, 02
10 - 80
µA
High-level input current
at input A IIH4 VCC = 5.5 V, VIN = 5.5 V 01, 02,
10 - 400
µA
01 - 160 High-level input current
at input B IIH5 V
CC = 5.5 V, VIN = 2.7 V 02, 10 - 80 µA
01 - 800 High-level input current
at input B IIH6 V
CC = 5.5 V, VIN = 5.5 V 02, 10 - 400 µA
High-level input current
at load, clock, EnT IIH9 V
CC = 5.5 V, VIN = 2.7 V 03, 04,
11, 12 - 40
µA
High-level input current
at load, clock, EnT IIH10 V
CC = 5.5 V, VIN = 5.5 V 03, 04,
11, 12 - 200
µA
High-level input current
at data, EnP IIH11 V
CC = 5.5 V, VIN = 2.7 V 03, 04,
11, 12 - 20
µA
High-level input current
at data, EnP IIH12 V
CC = 5.5 V, VIN = 5.5 V 03, 04,
11, 12 - 100
µA
03, 04, - 20 High-level input current
at clear IIH13 V
CC = 5.5 V, VIN = 2.7 V 11, 12 - 40 µA
03, 04 - 100 High-level input current
at clear IIH14 V
CC = 5.5 V, VIN = 5.5 V 11, 12 - 200 µA
High-level input current
at EnG IIH15 V
CC = 5.5 V, VIN = 2.7 V 09, 13 - 60 µA
High-level input current
at EnG IIH16 V
CC = 5.5 V, VIN = 5.5 V 09, 13 - 300 µA
High-level input current at
data, load, clear, count
up, count down, clock,
down/up
IIH17 V
CC = 5.5 V, VIN = 2.7 V 05, 06
07, 08
09, 13
- 20
µA
High-level input current at
data, load, clear, count
up, count down, clock,
down/up
IIH18 V
CC = 5.5 V, VIN = 5.5 V 05, 06
07, 08
09, 13
- 100
µA
High-level input current
at ET IIH19 V
CC = 5.5 V, VIN = 2.7 V 05, 06 - 40 µA
See footnotes at end of table.
MIL-M-38510/315D
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TABLE I. Electrical performance characteristics - Cont inued.
Limits
Test Symbol Conditions
-55°C < TC < +125°C
unless otherw ise sp eci f ied
Device
types Min Max Unit
High-level input current
at ET IIH20 VCC = 5.5 V, VIN = 5.5 V 05, 06 - 200 µA
Short circuit output
current IOS V
CC = 5.5 V 2/ All -15 -130 mA
01,02,10 15
05,06,07,08 34
Supply current
ICC V
CC = 5.5 V
09, 13
35
mA
High-level supply current ICCH V
CC = 5.5 V, 3/ 03, 04,
11, 12
- 31 mA
High-level supply current ICCH V
CC = 5.5 V, 3/
03, 04
11, 12 - 31 mA
Low-level supply current ICCL
VCC = 5.5 V, 4/ 03, 04
11, 12 - 32 mA
05, 06
01, 02, 10 25
29 -
03, 04,
07, 08,
11, 12
22
Maximum input A, clock, or
count up frequency
FMAX
09, 13 18 -
MHz
Propagation delay time,
high to low, A to QC tPHL1 01,02,10 3 81 ns
01, 10 3 74
Propagation delay time,
low to high, A to QC tPLH1
02 3 74
ns
01, 10 3 56
Propagation delay time,
high to low, B to QD tPHL2
02 3 78
ns
01, 10 3 52
Propagation delay time,
low to high, B to QD tPLH2
02 3 78
ns
Propagation delay time,
low to high, clock to carry
tPLH4 03, 04,
11, 12 3 56 ns
Propagation delay time,
high to low, clock to carry
tPHL4
VCC = 5.0 V, CL = 50 pF, ±10%
RL = 2 k
03, 04,
11, 12 3 56 ns
See footnotes at end of table.
MIL-M-38510/315D
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TABLE I. Electrical performance characteristics - Cont inued.
Limits Test Symbol Conditions
-55°C < TC < +125°C
unless otherw ise sp eci f ied
Device
types Min Max Unit
Propagation delay time,
low to high, clock to Q tPLH5 03, 04,
11, 12 3 41 ns
Propagation delay time,
high to high, clock to Q tPHL5 03, 04,
11, 12 3 45 ns
Propagation delay time,
low to high, clock to Q tPLH5 05, 06 3 26 ns
05 3 26
Propagation delay time,
high to low, clock to Q tPHL5
06 3 36
ns
Propagation delay time,
low to high, clock (data) to
Q
tPLH6 03, 04,
11, 12 3 42 ns
Propagation delay time,
high to low, clock (data)
to Q
tPHL6 03, 04,
11, 12 3 48 ns
Propagation delay time,
low to high, EnT to carry tPLH7 03, 04,
11, 12 3 28 ns
Propagation delay time,
high to low, EnT to carry tPHL7 03, 04,
11, 12 3 28 ns
05 3 18
Propagation delay time,
low to high, ET to RC tPLH7
06 3 28
ns
05 3 28
Propagation delay time,
high to low, ET to RC
tPHL7
06 3 32
ns
Propagation delay time,
high to low, clear to Q
tPHL8 03, 04,
11, 12 3 46 ns
Propagation delay time,
low to high, load to Q
tPLH8 07, 08 3 63 ns
Propagation delay time,
high to low, load to Q
tPHL10 07, 08 3 63 ns
07, 08 3 60
05 3 26
Propagation delay time,
low to high, counts up
and down to Q, U/D to RC
tPLH9
VCC = 5.0 V, CL = 50 pF, ±10%
RL = 2 k
06 3 32
ns
MIL-M-38510/315D
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TABLE I. Electrical performance characteristics - Cont inued.
Limits Test Symbol Conditions
-55°C < TC < +125°C
unless otherw ise sp eci f ied
Device
types Min Max Unit
07, 08 3 73
05 3 33
Propagation delay time,
high to low, counts up
and down to Q, U/D to RC
tPHL11
06 3 37
ns
Propagation delay time,
high to low, clear to Q tPHL12 07, 08 3 56 ns
Propagation delay time,
low to high, load to Q tPLH10 09, 13 3 53 ns
Propagation delay time,
high to low, load to Q tPHL13 09, 13 3 77 ns
Propagation delay time,
low to high, clock to Q tPLH11 09, 13 3 41 ns
Propagation delay time,
high to low, clock to Q tPHL14 09, 13 3 57 ns
Propagation delay time,
low to high, clock to
Max
Min
tPLH12 09, 13 3 66 ns
05 3 35
Propagation delay time,
low to high, clock to
ripple carry
tPLH12
06 3 38
ns
Propagation delay time,
high to low, clock to
Max
Min
tPHL15 09, 13 3 80 ns
05 3 37
Propagation delay time,
high to low, clock to
ripple carry
tPHL15
VCC = 5.0 V, CL = 50 pF, ±10%
RL = 2 k
06 3 40
ns
1
/ Use IOL + IIL3(Max) for VOL test on QA.
2
/ Not more than one output should be shorted at a time.
3/ ICCH is measured : (a) With the load input high; and (b) Then again with the load input low with
all other inputs high and all outputs open.
4
/ ICCL is measured: (a) With the clock input high; and (b) Then again with the clock input low with
all other inputs low and all outputs open.
MIL-M-38510/315D
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TABLE II. Electrical test requirements.
Subgroups (see table III)
MIL-PRF-38535 test requirements Class S
devices Class B
devices
Interim electrical parameters
1 1
Final electrical test parameters
1*, 2, 3, 7,
9, 10, 11 1*, 2, 3,
7, 9
Group A test requirements
1, 2, 3, 7, 8,
9, 10, 11 1, 2, 3, 7, 8,
9, 10, 11
Group B test when using the method 5005
QCI option 1, 2, 3, 7
8, 9, 10, 11 N/A
Group C end-point electrical
parameters
1, 2, 3, 7, 8
9, 10, 11
1, 2, 3
Group D end-point electrical parameters
1, 2, 3 1, 2, 3
*PDA applies to subgroup 1.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535 .
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-
PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specif ied in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are
conventional and positive when flowing into the referenced terminal.
MIL-M-38510/315D
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Device type 01 Device type 02 Device type 03 Device type 04 CASES
Pin
number A, B, C,
and D 2 A, B, C,
and D 2 E,F 2 E,F 2
1 BD INPUT N/C INPUT B N/C CLEAR N/C CLEAR N/C
2 RO(1) BD INPUT RO(1) INPUT B CLOCK CLEAR CLOCK CLEAR
3 RO(2) R
O(1) R
O(2) RO(1) INPUT A CLOCK INPUT A CLOCK
4 NC RO(2) NC RO(2) INPUT B INPUT A INPUT B INPUT A
5 VCC N/C VCC N/C INPUT C INPUT B INPUT C INPUT B
6 R9(1) N/C NC N/C INPUT D N/C INPUT D N/C
7 R9(2) N/C NC N/C ENABLE P INPUT C ENABLE P INPUT C
8 OUTPUT C VCC OUTPUT C VCC GND INPUT D GND INPUT D
9 OUTPUT B R9(1) OUTPUT B N/C LOAD ENABLE P LOAD ENABLE P
10 GND R9(2) GND N/C ENABLE T GND ENABLE T GND
11 OUTPUT D N/C OUTPUT D N/C QD N/C QD N/C
12 OUTPUT A OUTPUT C OUTPUT A OUTPUT C QC LOAD QC LOAD
13 NC OUTPUT B NC OUTPUT B QB T QB T
14 INPUT A GND INPUT A GND QA Q
D Q
A Q
D
15 N/C N/C CARRY
OUTPUT QC CARRY
OUTPUT QC
16 OUTPUT D OUTPUT D VCC N/C VCC N/C
17 N/C N/C QB Q
B
18 OUTPUT A OUTPUT A QA Q
A
19 N/C N/C CARRY
OUTPUT CARRY
OUTPUT
20 INPUT A INPUT A VCC V
CC
FIGURE 1. Terminal connections.
MIL-M-38510/315D
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Device type 05 Device type 06 Device type 07 Device type 08
CASES
Pin
number E, F 2 E, F 2 E, F 2 E, F 2
1 U/D N/C U/D N/C DATA
B INPUT N/C DATA
B INPUT N/C
2 CK
U/D CK U/D QB DATA B
INPUT QB DATA B
INPUT
3 INPUT A CK INPUT A CK QA QB Q
A QB
4 INPUT B INPUT A INPUT B INPUT A COUNT
DO WN QA COUNT
DO WN QA
5 INPUT C INPUT B INPUT C INPUT B COUNT
UP COUNT
DO WN COUNT
UP COUNT
DO WN
6 INPUT D N/C INPUT D N/C QC N/C QC N/C
7 ENABLE
P INPUT C ENABLE
P INPUT C QD COUNT
UP QD COUNT
UP
8 GND INPUT D GND INPUT D GND QC GND QC
9 LOAD ENABLE
P LOAD ENABLE
P DATA
D QD DATA
D QD
10 ENABLE
T GND ENABLE
T GND DATA
C GND DATA
C GND
11 QD N/C QD N/C LOAD N/C LOAD N/C
12 QC LOAD QC LOAD CARRY DATA
D CARRY DATA
D
13 QB ENABLE
T QB ENABLE
T BORROW DATA
C BORROW DATA
C
14 QA QD QA QD CLEAR LOAD CLEAR LOAD
15 RIPPLE
CARRY
OUTPUT
QC RIPPLE
CARRY
OUTPUT
QC DATA A CARRY DATA A CARRY
16 VCC N/C VCC N/C VCC N/C VCC N/C
17 QB Q
B BORROW BORROW
18 QA Q
A CLEAR CLEAR
19 RC
OUTPUT RC
OUTPUT DATA
A DATA
A
20 VCC V
CC V
CC V
CC
FIGURE 1. Terminal connections - Continued.
MIL-M-38510/315D
14
Device type 09 Device type 10 Device type 11 Device type 12
CASES
Pin
number E, F 2 A,B C, and
D 2 E, F 2 E, F 2
1 DATA B N/C INPUT
BC N/C CLEAR
N/C CLEAR
N/C
2 QB DATA B NC INPUT
BC CLOCK CLEAR CLOCK CLEAR
3 QA Q
B NC N/C INPUT A CLOCK INPUT A CLOCK
4 ENABLE
G QA NC N/C INPUT B INPUT A INPUT B INPUT A
5 DOWN
UP ENABLE
G VCC N/C INPUT C INPUT B INPUT C INPUT B
6 QC N/C RO(1) N/C INPUT D N/C INPUT D N/C
7 QD DOWN
UP RO(2) N/C ENABLE P INPUT C ENABLE
P INPUT C
8 GND QC OUTPUT D VCC GND INPUT D GND INPUT D
9 DATA D QD OUTPUT C RO(1) LOAD ENABLE
P LOAD ENABLE
P
10 DATA C GND GND RO(2) ENABLE T GND ENABLE T GND
11 LOAD N/C OUTPUT B N/C QD N/C QD N/C
12 MAX/
MIN DATA D OUTPUT A OUTPUT D QC LOAD QC LOAD
13 RIPPLE
CLOCK DATA C NC OUTPUT C QB T QB T
14 CLOCK LOAD INPUT A GND QA Q
D Q
A Q
D
15 DATA A MAX/
MIN N/C CARRY
OUTPUT QC CARRY
OUTPUT QC
16 VCC N/C OUTPUT B VCC N/C VCC N/C
17 RC N/C QB Q
B
18 CLOCK OUTPUT A QA Q
A
19 DATA A N/C CARRY
OUTPUT CARRY
OUTPUT
20 VCC INPUT A VCC V
CC
FIGURE 1. Terminal connections - Continued.
MIL-M-38510/315D
15
Device type 13
CASES
Pin number E, F 2
1 DATA B N/C
2 QB DATA B
3 QA Q
B
4 ENABLE
G QA
5 DOWN
UP ENABLE
G
6 QC N/C
7 QD DOWN
UP
8 GND QC
9 DATA D QD
10 DATA C GND
11 LOAD N/C
12 MAX/
MIN DATA D
13 RIPPLE
CLOCK DATA C
14 CLOCK LOAD
15 DATA A MAX/
MIN
16 VCC N/C
17 RC
18 CLOCK
19 DATA A
20 VCC
FIGURE 1. Terminal connections - Continued
MIL-M-38510/315D
16
FIGURE 2. Logic diagrams
MIL-M-38510/315D
17
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
18
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
19
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
20
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
21
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
22
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
23
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
24
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
25
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
26
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
27
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
28
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
29
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
30
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
31
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
32
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
33
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
34
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
35
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
36
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
37
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
38
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
39
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
40
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
41
FIGURE 2. Logic diagrams – Continued.
MIL-M-38510/315D
42
DEVICE TYPE 01
BCD COUNT SEQUENCE BI-QUINARY (5-2)
(See Note A) (See Note B)
OUTPUT OUTPUT
COUNT QD Q
C Q
B Q
A COUNT QA Q
D Q
C Q
B
0 L L L L 0 L L L L
1 L L L H 1 L L L H
2 L L H L 2 L L H L
3 L L H H 3 L L H H
4 L H L L 4 L H L L
5 L H L H 5 H L L L
6 L H H L 6 H L L H
7 L H H H 7 H L H L
8 H L L L 8 H L H H
9 H L L H
9 H H L L
RESET/COUNT FUNCTION TABLE
RESET INPUTS OUTPUT
R0(1) R0(2) R
9(1) R
9(2) Q
D QC Q
B Q
A
H H L X L L L L
H H X L L L L L
X X H H H L L H
X L X L COUNT
L X L X COUNT
L X X L COUNT
X L L X COUNT
NOTES: A. Output QA is connected to input B for BCD count.
B. Output QD is connected to input A for bi-quinary count.
FIGURE 3. Truth tables.
MIL-M-38510/315D
43
DEVICE TYE 02 DEVICE TYPE 10
COUNT SEQUENCE COUNT SEQUENCE
(See Note) (See Note)
OUTPUT OUTPUT
COUNT QD Q
C Q
B Q
A COUNT QD Q
C Q
B Q
A
0 L L L L 0 L L L L
1 L L L H 1 L L L H
2 L L H L 2 L L H L
3 L L H H 3 L L H H
4 L H L L 4 L H L L
5 L H L H 5 L H L H
6 L H H L 6 H L L L
7 L H H H 7 H L L H
8 H L L L 8 H L H L
9 H L L H 9 H L H H
10 H L H L 10 H H L L
11 H L H H 11 H H L H
12 H H L L
13 H H L H
14 H H H L
15 H H H H
RESET/COUNT FUNCTION TABLE RESET/COUNT FUNCTION TABLE
RESET INPUTS OUTPUT RESET INPUTS OUTPUT
R0(1) R0(2) Q
D Q
C Q
B Q
A R
0(1) R0(2) Q
D Q
C Q
B Q
A
H H L L L L H H L L L L
L X COUNT L X COUNT
X L COUNT
X L COUNT
NOTE: Output QA is connected to input B. NOTE: Output QA is connected to input B.
FIGURE 3. Truth tables.
MIL-M-38510/315D
44
SYNCHRONOUS TRUTH TABLE, DEVICE TYPES 3 AND 11
Input at time tn Outputs at time tn+1
Clock Enable
P Enable
T Load A B C D Clear QA Q
B Q
C Q
D Carry
output
CP L X H X X X X H NC NC NC NC NC
CP X L H X X X X H NC NC NC NC L
CP H H H X X X X H Previous count plus 1
(note 1) H if count = 9
L if count < 9
CP X H L X X X X H A B C D H if count = 9
L if count < 9
CP X L L X X X X H A B C D L
CP X X X X X X X L L L L L L
ASYNCHRONOUS TRUTH TABLE, DEVICE TYPE 3
Inputs at time tn Outputs at time tn+1
Clock Enable
P Enable
T Load A B C D Clear QA Q
B Q
C Q
D Carry
output
X X X X X X X X L L L L L L
NOTES:
1. See up count sequence table.
2. L = VIL for inputs, V0L for outp uts.
3. H = VIH for inputs, V0H for outputs.
4. X = VIH or VIL.
5. CP = Clock pulse.
6. NC = No change. UP COUNT SEQUENCE TABLE
QA
(LSB) QB Q
C Q
D
(MSB)
L L L L
H L L L
L H L L
H H L L
L L H L
H L H L
L H H L
H H H L
L L L H
H L L H
FIGURE 3. Truth tables – Continued.
MIL-M-38510/315D
45
SYNCHRONOUS TRUTH TABLE, DEVICE TYPES 4 AND 12
Input at time tn Outputs at time tn+1
Clock Enable
P Enable
T Load A B C D Clear QA Q
B Q
C Q
D Carry
output
CP L X H X X X X H NC NC NC NC NC
CP X L H X X X X H NC NC NC NC L
CP H H H X X X X H Previous count plus 1
(note 1) H if count = 15
L if count < 15
CP X H L X X X X H A B C D H if count = 15
L if count < 15
CP X L L X X X X H A B C D L
CP X X X X X X X L L L L L L
ASYNCHRONOUS TRUTH TABLE, DEVICE TYPE 4
Inputs at time tn Outputs at time tn+1
Clock Enable
P Enable
T Load A B C D Clear QA Q
B Q
C Q
D Carry
output
X X X X X X X X L L L L L L
NOTES:
1. See up count sequence table.
2. L = VIL for inputs, V0L for outp uts.
3. H = VIH for inputs, V0H for outputs.
4. X = VIH or VIL.
5. CP = Clock pulse.
6. NC = No change.
UP COUNT SEQUENCE TABLE
QA
(LSB) QB Q
C Q
D
(MSB)
L L L L
H L L L
L H L L
H H L L
L L H L
H L H L
L H H L
H H H L
L L L H
H L L H
L H L H
H H L H
L L H H
H L H H
L H H H
H H H H
FIGURE 3. Truth tables – Continued.
MIL-M-38510/315D
46
Device type 05 Device type 06
UP COUNT SEQUENCE TABLE UP COUNT SEQUENCE TABLE
QA
(LSB) QB Q
C Q
D
(MSB) QA
(LSB) QB Q
C Q
D
(MSB)
L L L L L L L L
H L L L H L L L
L H L L L H L L
H H L L H H L L
L L H L L L H L
H L H L H L H L
L H H L L H H L
H H H L H H H L
L L L H L L L H
H L L H H L L H
L H L H
H H L H
L L H H
H L H H
L H H H
H H H H
Device types 05 and 06
MODE SELECT TABLE
L EP ET
U/D Action on Rising Clock Edge
L X X X Load (Dn
Qn)
H L L H Count Up (increment)
H L L L Count Down (decrement)
H H X X No Change (Hold)
H X H X No Change (Hold)
H = High voltage level
L = Low voltage
X = Don’t care
FIGURE 3. Truth tables – Continued.
MIL-M-38510/315D
47
DEVICE TYPE 7 TRUTH TABLE
Inputs at time tn Outputs at time tn=1
Count
Up Count
Down
Load
A
B
C
D
Clear
QA
QB
QC
QD
Carry
Borrow
H H H X X X X L NC NC NC NC H H
H H H X
X
X
X
H L L L L H H
H H L X
X
X
X
L A B C D H H
P H H X
X
X
X
L Previous count plus 1
(note 1) H H
H P H X
X
X
X
L Previous count minu s 1
(note 2) H H
N H H X
X
X
X
L NC NC NC NC N if count = 9
H if count
9 H
H N H X
X
X
X
L NC NC NC NC H N if count = 0
H if count
0
NOTES:
1. See up count sequence table.
2. See down count sequence table.
3. L= VIL for inputs, VOL for outputs.
4. H = VIH for inputs, VOH for outputs.
5. X = VIH or VIL.
6. NC = No change.
7. NA = Not applicable.
8. P = Positive going pulse.
9. N= Negative going pulse.
FIGURE 3. Truth tables – Continued.
MIL-M-38510/315D
48
DEVICE TYPE 07
UP COUNT SEQUENCE TABLE DOWN COUNT SEQUENCE TABLE
QA
(LSB) QB Q
C Q
D
(MSB) Carry QA
(LSB) QB Q
C Q
D
(MSB) Borrow
L L L L H H L L H H
H L L L H L L L H H
L H L L H H H H L H
H H L L H L H H L H
L L H L H H L H L H
H L H L H L L H L H
L H H L H H H L L H
H H H L H L H L L H
L L L H H H L L L H
H L L H L
L L L L L
DEVICE TYPE 8 TRUTH TABLE
Input at time tn Outputs at time tn=1
Count
up Count
down
Load
A
B
C
D
Clear
QA
QB
QC
QD
Carry
Borrow
H H H X X X X L NC NC NC NC H H
H H H X X X X H L L L L H H
H H L X X X X L A B C D H H
P H H X X X X L Previous count plus 1
(note) H H
H P H X X X X L Previous cou n t minu s 1
(note 2) H H
N H H X X X X L NC NC NC NC N if count = 15
H if count
15 H
H N H X X X X L NC NC NC NC H N if count = 0
H if count
0
NOTES:
1. See up count sequence table.
2. See down count sequence table.
3. L = VIL for inputs, VOL for outp uts.
4. H = VIH for inputs, VOH for outputs.
5. X = VIH or VIL.
6. NC = No change.
7. NA = Not applicable.
8. P = Positive going pulse.
9. N = Negative going pulse.
FIGURE 3. Truth tables – Continued.
MIL-M-38510/315D
49
DEVICE TYPE 08
UP COUNT SEQUENCE TABLE DOWN COUNT SEQUENCE TABLE
QA
(LSB) QB Q
C Q
D
(MSB) Carry QA
(LSB) QB Q
C Q
D
(MSB) Borrow
L L L L H H H H H H
H L L L H L H H H H
L H L L H H L H H H
H H L L H L L H H H
L L H L H H H L H H
H L H L H L H L H H
L H H L H H L L H H
H H H L H L L L H H
L L L H H H H H L H
H L L H H L H H L H
L H L H H H L H L H
H H L H H L L H L H
L L H H H H H L L H
H L H H H L H L L H
L H H H H H L L L H
H H H H L
L L L L L
DEVICE TYPES 09 AND 13
Mode select table Ripple carry truth table
Inputs Inputs Outputs
Load Enable
G
U/D
CLK
Mode Enable
G
CLK
Max/Min RC
output
H L L
Count up L H
H L H Count down H X X H
L X X X Preset (Asyn) X X L H
H H X X
No change
(Hold)
L = Low voltage level
H = High voltage level
X = Don’t care
= Low-to-high clock transition
= Negative going clock pulse
NOTE: The up count and down count sequence for device type 09 is identical
as that for device type 08.
The up count and down count sequence for device type 13 is identical
as that for device type 07.
FIGURE 3. Truth tables – Continued.
MIL-M-38510/315D
50
FIGURE 4. Switching time test circuit and waveforms for device type 01.
MIL-M-38510/315D
51
SWITCH POSITION
TEST SW1 SW2
F MAX 1 CLOSED
A TO QC 1 CLOSED
B TO QD 2 OPEN
TEST CIRCUIT
NOTES:
1. The pulse generator has the following characteristics: Vgen = 3 V, tr 15 ns,
tf 6 ns, tp = .5 µs, PRR 1 MHz, Zout
50.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
FIGURE 4. Switching time test circuit and waveforms for device type 01Continued.
MIL-M-38510/315D
52
VOLTAGE WAVEFORMS
FIGURE 5. Switching time test circuit and waveforms for device type 02.
MIL-M-38510/315D
53
SWITCH POSITION TEST SW1 SW2
F MAX 1 CLOSED
A TO QC 1 CLOSED
B TO QD 2 OPEN TEST CIRCUIT
NOTES:
1. The pulse generator has the following characteristics: Vgen = 3 V, tr 15 ns,
tf 6 ns, tp = .5 µs, PRR 1 MHz, Zout
50.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
FIGURE 5. Switching time test circuit and waveforms for device type 02Continued.
MIL-M-38510/315D
54
VOLTAGE WAVEFORMS
FIGURE 6. Switching time test circuit and waveforms for device types 03, 04, 11, and 12.
MIL-M-38510/315D
55
VOLTAGE WAVEFORMS
FIGURE 6. Switching time test circuit and waveforms for device types 03, 04, 11, and 12 – Continued.
MIL-M-38510/315D
56
NOTE: The clear pulse generator has the following characteristics:
V
gen = 3.0 V, tr 15 ns, tf 6 ns, 20 ns tw(clear) 25 ns for types 11 and
12, 20 ns tsetup 25 ns, thold = 0 ns.
FIGURE 6. Switching time test circuit and waveforms for device types 03, 04, 11, and 12 – Continued.
MIL-M-38510/315D
57
NOTE: The data pulse generator has the following characteristics: Vgern = 3.0 V,
tr 15 ns, tf 6 ns, tDATA = 30 ns, tsetup = 20 ns, tHOLD = 10 ns.
FIGURE 6. Switching time test circuit and waveforms for device types 03, 04, 11, and 12 – Continued.
MIL-M-38510/315D
58
NOTES:
1. The pulse generator has the following characteristics: Vgen = 3 V, tr 15 ns,
tf 6 ns, tp = .5 µs, PRR 1 MHz, Zout
50.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
FIGURE 6. Switching time test circuit and waveforms for device type 03, 04, 11, and 12 – Continued.
MIL-M-38510/315D
59
FIGURE 7. Switching time test circuit and waveforms for device types 05 and 06.
MIL-M-38510/315D
60
FIGURE 7. Switching time test circuit and waveforms for device types 05 and 06 – Continued.
MIL-M-38510/315D
61
NOTES:
1. The pulse generator has the following characteristics: Vgen = 3 V, tr 15 ns,
tf 6 ns, tp = .5 µs, PRR 1 MHz, Zout
50.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
6. The clear pulse generator has the follow ing characterist ics: Vgen = 3.0 V,
tr 15 ns, tf 6 ns, tw(CLEAR) = 20 ns.
FIGURE 7. Switching time test circuit and waveforms for device types 05 and 06 – Continued.
MIL-M-38510/315D
62
FIGURE 8. Switching time test circuit and waveforms for device types 07.
MIL-M-38510/315D
63
NOTES:
1. The pulse generator has the following characteristics: Vgen = 3 V,
tp = .5 µs, PRR 1 MHz, Zout
50, tr 15 ns, tf 6 ns between 0.7 V and 2.7 V.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
6. The clear pulse generator has the follow ing characterist ics: Vgen = 3.0 V,
tr 15 ns, tf 6 ns, between 0.7 V and 2.7 V, tw(CLEAR) = 20 ns.
FIGURE 8. Switching time test circuit and waveforms for device types 07 and Continued.
MIL-M-38510/315D
64
FIGURE 9. Switching time test circuit and waveforms for device type 08.
MIL-M-38510/315D
65
NOTES:
1. The load and count pulse generators have the following characteristics: Vgen = 3 V,
tp = .5 µs, PRR 1 MHz, Zout
50, tr 15 ns, tf 6 ns between 0.7 V and 2.7 V.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
6. The clear pulse generator has the follow ing characterist ics: Vgen = 3.0 V,
tr 15 ns, tf 6 ns, between 0.7 V and 2.7 V, tw(CLEAR) = 20 ns.
FIGURE 9. Switching time test circuit and waveforms for device type 08Continued.
MIL-M-38510/315D
66
FIGURE 10. Switching time test circuit and waveforms for device type 09.
MIL-M-38510/315D
67
TEST CIRCUIT
NOTES:
1. The pulse generator has the following characteristics: Vgen = 3 V,
tp = .5 µs, PRR 1 MHz, Zout
50, tr 15 ns, tf 6 ns between 0.7 V and 2.7 V.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
FIGURE 10. Switching time test circuit and waveforms for device type 09 – Continued.
MIL-M-38510/315D
68
VOLTAGE WAVEFORMS
FIGURE 11. Switching time test circuit and waveforms for device type 10.
MIL-M-38510/315D
69
SWITCH POSITION
TEST SW1 SW2
F MAX 1 CLOSED
A TO QC 1 CLOSED
B TO QD 2 OPEN TEST CIRCUIT
NOTES:
1. The pulse generator has the following characteristics: Vgen = 3 V, tr 15 ns,
tf 6 ns, tp = .5 µs, PRR 1 MHz, Zout
50.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
FIGURE 11. Switching time test circuit and waveforms for device type 10 – Continued.
MIL-M-38510/315D
70
FIGURE 12. Switching time test circuit and waveforms for device type 13.
MIL-M-38510/315D
71
NOTES:
1. The pulse generator have the following characteristics: Vgen = 3 V,
tp = .5 µs, PRR 1 MHz, Zout
50Ω, tr 15 ns, tf 6 ns, between 0.7 V and 2.7 V.
2. All diodes are 1N3064 or equivalent.
3. CL includes probe and jig capacitance.
4. Voltage values are with respect to ground terminal.
5. FMAX: tr = tf 6 ns.
Figure 12. Switching time test circuit and waveforms for device type 13 - Continued.
TABLE III. Group A inspection for device type 01.
Terminal conditi ons (pi ns not designated may be H 2.0 V; or L 0.7 V; or open).
Cases
A,B,C,D
1 2 3 4 5 6 7 8 9 10 11 12 13 14 Limits
Subgroup
Symbol
Cases1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20 Measured
Unit
MIL-STD-
883
method
Test no. B RO(1) RO(2) NC VCC R9(1) R9(2) QC QB GND QD QA NC A terminal Min Max
1 VOL 3007 1 2.0 V 2.0 V 2.0 V 4.5 V GND GND 4mA GND GND QC 0.4 V
Tc = 25
°C
" 2 " " " " GND GND 4 mA " " QB " "
" 3 " " " " 2.0 V 0.7 V " 4 mA " QD " "
" 4 GND " " " 0.7 V 2.0 V " 2/ 2.0 V QA " "
" 5 2.0 V " 0.7 V " 2.0 V " 4 mA " GND QC " "
" 6 2.0 V 0.7 V 2.0 V " " " 4 mA
" " QB " "
V
OH 3006 7 2.0 V 2.0 V 0.7 V " " " " -0.4 mA
" QD 2.5 "
" 8 GND 0.7 V 2.0 V " " " " -0.4 mA
2.0 V
QA " "
" 9 2.0 V " 0.7 V " " " " -0.4 mA
GND
QD " "
" 10 GND " 0.7 V " " " " -0.4 mA
2.0 V
QA " "
" 11 3/ 4/ 3/ 3/ " 0.7 V 0.7 V -0.4 mA " GND
QC " "
" 12 3/ 5/ 3/ 3/ " 0.7 V 0.7 V -0.4 mA
" GND
QB " "
I
IL1 3009 13 0.4 V 5.5 V 5.5 V " R
O(1) 6/ 6/ mA
" 14 5.5 V 0.4 V " " R
O(2) " " "
" 15 " 0.4 V 5.5 V " R9(1) " " "
" 16 " 5.5 V 0.4 V " R9(2) " " "
IIL2 17 GND GND " 3/ 3/
" 0.4 V
A " " "
IIL3 18 0.4 V GND GND "
3/ 3/
" B " " "
V
IC 19 4.5 V -18 mA
" R9(1) -1.5 V
20 " -18 mA
" R9(2) " "
21 " " -18 mA
A " "
22 -18 mA
" " B " "
23 -18 mA
" " R
O(1) " "
24 -18 mA
" " R
O(2) " "
I
IH1 3010 25 5.5 V 2.7 V " R9(1) 20
µA
26 " 2.7 V
" R9(2) " "
27 2.7 V " " R
O(1) " "
28 2.7 V " " R
O(2) " "
I
IH2 29 " 5.5 V " R9(1) 100 "
30 " 5.5 V " R9(2) " "
31 5.5 V " " RO(1) " "
32 5.5 V " " RO(2) " "
I
IH3 33 " " 2.7 V A 80 "
I
IH4 34 " " 5.5 V A 400 "
I
IH5 35 2.7 V " " B 160 "
I
IH6 36 5.5 V " " B 800
See footnotes at end of device types 01.
MIL-M-38510/306E
72
TABLE III. Group A inspection for device type 01 - Continued
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases
A,B,C,D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20
Measured
terminal
Limits Unit
method Test no. B RO(1) RO(2) NC VCC R9(1) R9(2) QC Q
B GND QD Q
A NC A Min Max
1 IOS 3011 37 GND GND 5.5 V 5.5 V 5.5 V GND GND QD -15 -100
mA
Tc = 25°C " 38 GND GND " 5.5 V 5.5 V " GND QA " " "
" 39 3/ 5/ 3/ 3/ " GND GND GND " GND QB " " "
" 40 3/ 4/ “ " " " GND " " QC " " "
I
CC 41 GND " " " " " " " VCC 15 "
2 Same tests, terminal conditions, and limits as for subgroup 1, except TC = 125°C and VIC tests are omitted.
3 Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
7 Func- 3014 42 A 8/ A 8/ A 8/ 4.5 V A A L L GND H H B 8/
TC = +25°C tional " 43 B " " " A A " " " H H "
tests " 44 B " " " B B " " " L L "
7/ " 45 A B B " A A " " " H H "
" 46 B B B " A A " " " H H "
" 47 B A A " B B " " " L L "
" 48 A A " " " B " " " " " "
" 49 B A " " " A " " " " " "
" 50 A A " " " " " " " " " "
" 51 B A " " " " " " " " " "
" 52 A B " " " " " " " " " "
" 53 B B " " " " " H " " " "
" 54 A " " " " " " H " " " "
" 55 B " " " " " H L " " " "
" 56 A " " " " " " L " " " " See 9/
" 57 B " " " " " " H " " " "
" 58 A " " " " " " H " " " "
" 59 B " " " " " L L " H " "
" 60 A " " " " " " " " H " "
" 61 B " " " " “ " " " L " "
" 62 B " B " " B " " " " " "
" 63 A " " " A " " " " " " "
" 64 B A " " " " " H " " " "
" 65 A " " " " " " H " " " "
" 66 B " " " " " H L " " " "
" 67 A " " " " " " L " " " "
" 68 B " " " " " " H " " " "
" 69 A " " " " " " H " " " "
" 70 B " " " " " L L " H " "
" 71 A " " " " " " " " H " "
" 72 B " " " " " " " " L " "
" 73 B B " " B " " " " " " "
" 74 A B " " " " " " " " " "
" 75 B A " " " A " H " " " "
" 76 A " " " " " " H " " " "
" 77 B " " " " " H L " " " "
" 78 A " " " " " " L " " " "
" 79 B " " " " " " H " " " "
" 80 B " A " " B L L " " " "
" 81 B B " " A " " " " " " "
" 82 A " " " " " " " " " " "
" 83 B " " " " " " H " " " "
" 84 A " " " " " " H " " " "
" 85 B " " " " " H L " " " "
See footnotes at end of device type 01.
73
MIL-M-38510/315D
TABLE III. Group A inspection for device type 01 - Continued
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases
A,B,C,D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20
Measured
terminal
Limits Unit
method Test no. B RO(1) RO(2) NC VCC R9(1) R9(2) QC Q
B GND QD Q
A NC A Min Max
7 Func- 3014 86 A 8/ B 8/ A 4.5 V A B H L GND L L B
TC = +25°C tional " 87 B " A " " B H H " L L "
tests " 88 A " B " " A L L " H H "
7/ " 89 " " B " " B " " " H H "
" 90 " A A " B " " " " L L "
" 91 B A A " " " " " " " " "
" 92 A B B " " " " " " " " "
" 93 B " " " " " " H " " " "
" 94 A " " " " " " H " " " "
" 95 B " " " " " H L " " " "
" 96 A " " " " " " L " " " "
" 97 B " " " " " " H " " " "
" 98 A " " " " " " H " " " "
" 99 B A A " " " L L " " " "
" 100 B B B " " " " " " " " " See 9/
" 101 A " " " " " " " " " " "
" 102 B " " " " " " H " " " "
" 103 A " " " " " " H " " " "
" 104 B " " " " " H L " " " "
" 105 A " " " " " " L " " " "
" 106 B " “ " " " " H " " " "
" 107 A " " " " " " H " " " "
" 108 A " " " A A L L " H H "
" 109 B " " " A A " " " " " "
" 110 B " " " B B " " " " " "
" 111 A " " " " " " " " " " "
" 112 A A A " " " " " " L L "
" 113 B A A " " " " " " " " "
" 114 " B B " " " " " " " " A
" 115 " " " " " " " " " " H B
" 116 " " " " " " " " " " H A
" 117 " " " " " " " " " " L B
" 118 " " A " " " " " " " " A
" 119 " A A " " " " " " " " B
" 120 " A B " " " " " " " " A
" 121 " B " " " A " " " " H B
" 122 " " " " " " " " " " " A
" 123 " " " " A " " " " H " B
" 124 " A " " B " " " " " A
" 125 " A A " " A " " " " " B
8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = 125°C and -55°C.
9
TC = +25°C FMAX 3003
(Fig. 4) 126 GND 5.0 V GND GND OUT
IN 10/
A to QA 29 MHz
t
PLH1 " 127 11/ A 8/ " " OUT " IN A to QC 3 53 ns
t
PHL1 " 128 GND " " OUT " IN A to QC " 58 "
t
PLH2 " 129 IN 11/ A " " " OUT B to QD " 37 "
t
PHL2 " 130 IN GND " " " OUT B to QD " 40 "
10
TC = +125°C FMAX " 131 GND " " " OUT IN 10/ A to QA 29 MHz
t
PLH1 " 132 11/ A " " OUT " IN A to QC 3 74 ns
t
PHL1 " 133 GND " " OUT " IN A to QC " 81 "
t
PLH2 " 134 IN 11/ A " " " OUT B to QD " 52 "
t
PHL2 " 135 IN GND " " " OUT B to QD " 56 "
11 Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C.
See footnote
s at end of device type 01.
74
MIL-M-38510/315D
1/ Case 2 pins not referenced are N/C.
2/ Test 4, Pin 12; 4 mA + IIL3(MAX).
3/ Apply 4.5 V pulse then ground prior to taking measurements to set device in the desired state.
4/ Apply two pulses after RO (reset) pulse.
5/ A pply one pulse aft er RO (reset) pulse.
6/ IIL limits (mA) min/max values for circuits shown:
Circuits
Parameter Terminals
A B C D E F G
IIL1 R
O(1) -12/-.36 -.03/-.40 -.03/-.40 -12/-.36 -12/-.36
R
O(2) " " " " "
R9(1) " " " " "
R9(2) " " " " "
IIL2 A -0.5/-2.0 -1.0/-2.4 -1.0/-2.4 -1.0/-2.4 -0.5/-2.0
IIL3 B -0.4/-1.6 -1.3/-3.2 -1.3/-3.2 -1.3/-3.2 -1.0/-2.4
7/ Only a summary of attributes data is required.
8/ A = 3.0 V minimum, B = 0.0 V or GND.
9/ H > 1.5 V; L < 1.5 V.
10/ FMAX minimum limit specified is the frequency of the input pulse. The output pulse shall be
one-half of the input frequency.
11/ Momentary 3.0 V (min), then ground. Maintain ground for measurement.
MIL-M-38510/315D
75
TABLE III. Group A inspection for device type 02.
Terminal conditi ons (pi ns not designated may be H 2.0 V; or L 0.7 V; or open).
Cases
A,B,C,D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Limits
Subgroup
Symbol
Cases1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20 Measured
terminal Unit
MIL-STD-
883
method Test no. B RO(1) RO(2) NC VCC NC NC QC Q
B GND QD Q
A NC A Min Max
1 VOL 3007 1 GND 2.0 V 2.0 V 4.5 V GND 2/ 2.0 V QA 0.4 V
Tc = 25
°C
" 2 2.0 V
" " " 4 mA " GND QB " "
" 3 " " " " 4mA " " QC " "
" 4 " " " " " 4 mA " QD " "
V
OH 3006 5 GND 3/ 3/ " " -0.4 mA
3/ 4/ QA 2.5 "
" 6 3/ 4/ 3/ " " -0.4 mA
" GND QB " "
" 7 3/ 5/ " " " -0.4 mA " " QC " "
" 8 3/ 6/ " " " " -0.4 mA
" QD " "
V
IC 9 " " -18 mA
A -1.5 mA
"
10 -18 mA
" " B " "
11 -18 mA
" " R
O(1) " "
12 -18 mA
" " R
O(2) " "
I
IL1 3009 13 0.4 V 5.5 V 5.5 V " R
O(1) 7/ 7/ mA
" 14 5.5 V 0.4 V " " R
O(2) " " "
I
IL2 " 15
3/ 3/ " " 0.4 V A " " "
I
IL3 " 16 0.4 V
3/ 3/ " " B " " "
I
IH1 3010 17 2.7 V GND " " R
O(1) 20
µA
I
IH1 " 18 GND 2.7 V " " R
O(2) 20 "
I
IH2 " 19 5.5 V GND " " R
0(1) 100 "
I
IH2 " 20 GND 5.5 V " " R
0(2) 100 "
I
IH3 " 21 5.5 V " " " 2.7 V A 80 "
IIH4 " 22 " " " " 5.5 V A 400 "
IIH5 " 23 2.7 V
" " " " B 80 "
IIH6 " 24 5.5 V
" " " " B 400 "
I
OS 3011 25 GND 3/ 3/ " " GND 3/ 4/ QA -15 -100 mA
" 26 3/ 4/ " " " GND " GND QB " " "
" 27 3/ 5/ " " " GND " QC " " "
" 28 3/ 6/ " " " " GND QD " " "
I
CC 3005 29 GND " " VCC 15 "
2 Same tests, terminal conditions, and limits as for subgroup 1, except TC = 125°C and VIC tests are omitted.
3 Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
See footnotes at end of device types 02.
MIL-M-38510/315D
76
TABLE III. Group A inspection for device type 02 - Continued
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases
A,B,C,D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20
Measured
terminal
Limits Unit
method Test no. B RO(1) RO(2) NC VCC NC NC QC Q
B GND QD Q
A NC A Min Max
7 Func- 3014 30 B 9/ A 9/ A 4.5 V L L GND L L B 9/
Tc = 25°C tional " 31 A " " "
" " " " " "
tests " 32 B " " " " " " " " "
8/ " 33 B " B " " " " " " "
" 34 A " " " " " " " " "
" 35 B " " " " H " " " "
" 36 " " A " " L " " " "
" 37 " B " " " " " " " "
" 38 A " " " " " " " " "
" 39 A " B " " " " " " "
" 40 B " " " " H " " " "
" 41 A " " " " H " " " "
" 42 B " " " H L " " " "
" 43 A " " " " L " " " "
" 44 B " " " " H " " " "
" 45 A " " " " H " " " "
" 46 B " " " L L " H " "
" 47 A " " " " L " " " "
" 48 B " " " " H " " " " See 10/
" 49 A " " " " H " " " "
" 50 B " " " H L " " " "
" 51 A " " " " L " " " "
" 52 B " " " " H " " " "
" 53 A " " " " H " " " "
" 54 B " " " L L " L " "
" 55 A " " " " L " " " "
" 56 B " " " " H " " " "
" 57 A " " " " H " " " "
" 58 B " " " H L " " " "
" 59 A " " " " L " " " "
" 60 B " " " " H " " " "
" 61 A " " " " H " " " "
" 62 B " " " L L " H " "
" 63 A " " " " L " " " "
" 64 B " " " " H " " " "
" 65 B A " " " " " " " "
" 66 A " " " " " " " "
" 67 B " " " H L " " " "
" 68 A " " " " L " " " "
" 69 B " " " " H " " " "
" 70 A " " " " H " " " "
" 71 A " A " L L " L " "
" 72 B " A " " " " " " "
" 73 " B B " " " " " " A
" 74 " " " " " " " " H B
" 75 " " " " " " " " H A
" 76 " " " " " " " " L B
8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125°C and -55°C.
9
TC = +25°C FMAX 3003
(Fig. 5) 77 GND 5.0 V GND OUT IN 11/ A to QA 29 MHz
t
PLH1 “ 78 12/ A 9/ " OUT " IN A to QC 3 53 ns
t
PHL1 “ 79 GND " OUT " IN A to QC " 58 "
t
PLH2 “ 80 IN 12/ A " " OUT B to QD " 56 "
t
PHL1 “ 81 IN GND " " OUT B to QD " 56 "
See footnotes at end of device type 02.
77
MIL-M-38510/315D
TABLE III. Group A inspection for device type 02 - Continued
Ter minal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases
A,B,C,D 1 2 3 4 5 6 7 8 9 10 11 12 13 14
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20
Measured
terminal
Limits Unit
method Test no. B RO(1) RO(2) NC VCC NC NC QC Q
B GND QD Q
A NC A Min Max
10
TC = +125°C
FMAX 3003
(Fig. 5) 82 GND 5.0 V GND OUT IN 11/
A to QA 29 MHz
t
PLH1 " 83 12/ A " OUT " IN A to QC 3 74 ns
t
PHL1 " 84 GND " OUT " IN A to QC " 81 "
t
PLH2 " 85 IN 12/ A " " OUT B to QD " 78 "
t
PHL2 " 86 IN GND " " OUT B to QD " 78 "
11 Same tests, terminal conditions, and limits as for subgroup 10 except, TC = 55°C
1/ Case 2 pins not referenced are N/C.
2/ For test 1, 4 mA +IIL3 (max).
3/ Apply 4.5 V pulse, then ground prior to taking measurements to set device in the desired state.
Maintain ground for measurement.
4/ Input pulse must be applied one time after RO pulse.
5/ Input pulse must be applied twice after RO pulse.
6/ Input pulse must be ap plied four times afte r RO pulse.
7/ IIL limits (mA) min/max values for circuits shown:
8/ Only a summary of attributes data is required.
9/ A = 3.0 V minimum; B = 0.0 V or GND.
10/ H > 1.5 V; L < 1.5 V.
11/ FMAX min limit specified is the frequency of the input pulse. The output frequency shall be
one-half the input frequency.
12/ Momentary 3.0 V (min), then ground. Maintain ground for measurement.
Circuits Parameter Terminals
A B C D E F G
IIL1 R
O(1) -12/-.36 -.03/-.40 -12/-.36 -.03/-.40 -12/-.36 -12/-.36
R
O(2) " " " " " "
IIL2 A -0.5/-2.0 -1.0/-2.4 -0.5/-2.0 -1.0/-2.4 -1.0/-2.4 -0.5/-2.0
IIL3 B -0.4/-1.6 -0.4/-1.6 -0.4/-1.6 -0.4/-1.6 -.65/-1.6 -0.4/-1.6
MIL-M-38510/315D
78
TABLE III. Group A inspection for device types 03, 04, 11, and 12.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
terminal Unit
MIL-STD-
883
method Test no. Clear Clock A B C D EnP GND Load EnT QD Q
C QB Q
A Ripple
carry VCC Min Max
1 VOL 3007 1 4.5 V 2/ 0.7 V GND GND 4 mA 4.5 V QD 0.4 V
Tc = +25
°C
" 2 " " 0.7 V " " 4 mA " QC " "
" 3 " " 0.7 V " " 4 mA " QB " "
" 4 " " 0.7 V " " 4 mA " QA " "
5 " " " 0.7 V 4 mA " Ripple
carry "
V
OH 3006 6 " 2/ 2.0 V " GND -.4 mA " QD 2.5 "
" 7 " " 2.0 V " " -.4 mA " QC " "
" 8 " " 2.0 V " " -.4 mA " QB " "
9 " " 2.0 V " " -.4 mA " QA "
10 " " 2.0 V 3/ 3/ 2.0 V " " 2.0 V -.4 mA " Ripple
carry "
V
IC 11 -18 mA
" " Clear -1.5 "
12 -18 mA
" " Clock " "
13 -18 mA " " A
14 -18 mA
" " B " "
15 -18 mA
" " C " "
16 -18 mA
" " D " "
17 -18 mA
" " EnP " "
18 " -18 mA " Load " "
19 " -18 mA " EnT " "
I
IL4 3009 20 0.4 V 5.5 V Clear 4/ 4/ µA
I
IL6 " 21 0.4 V
Clock "
I
IL4 " 22 0.4 V
GND
A “
" 23
0.4 V B “
" 24 0.4 V C “
“ 25
0.4 V “ “ D “
" 26 0.4 V 4.5 V 4.5 V EnP
I
IL5 " 27
4.5 V 0.4 V 4.5 V Load “
I
IL5 " 28 5/ 4.5 V 4.5 V 0.4 V EnT “
I
IH13 3010 29 13/ 2.7 V Clear 20 "
I
IH930 2.7 V
Clock 40
I
IH11 31 2.7 V A 20
32 2.7 V B
33 2.7 V C
34 2.7 V D
35 2.7 V GND GND EnP
I
IH9 36 GND 2.7 V GND Load 40
I
IH9 37 GND GND 2.7 V EnT 40
See footnotes at end of device types 03, 04, 11, and 12.
MIL-M-38510/315D
79
TABLE III. Group A inspection for device types 03, 04, 11, and 12 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
terminal Unit
MIL-STD-
883
method Test no. Clear Clock A B C D EnP GND Load EnT QD Q
C QB Q
A Ripple
carry VCC Min Max
1 IIH14 3010 38 13/ 5.5 V GND 5.5 V Clear 100
µA
Tc = +25
°C
IIH10 " 39 5.5 V " " Clock 200 "
I
IH12 " 40
5.5 V " " A 100 "
" 41
5.5 V " " B " "
42 5.5 V " " C "
43 5.5 V " " D "
" 44
5.5 V " GND GND " EnP "
I
IH10 " 45
GND " 5.5 V GND " Load 200 "
I
IH1046
GND " GND 5.5 V " EnT 200 "
I
OS 3011 47 4.5 V 2/ 4.5 V " GND GND " QD -15 -100 mA
48 " " 4.5 V " " GND " QC “ "
49 " " 4.5 V " " GND " QB " "
50 " " 4.5 V " " GND " QA “ “
51 " " 4.5 V 6/ 6/ 4.5 V " " 4.5 V GND " Ripple
carry " "
I
CCH 3005 52 5.5 V 5.5 V 5.5 V 5.5 V
5.5 V
5.5 V
5.5 V
" 5.5 V 5.5 V " VCC 31 "
I
CCH 53 5.5 V 5.5 V 5.5 V 5.5 V
5.5 V
5.5 V
5.5 V
" GND 5.5 V " " 31 "
I
CCL54 GND GND GND GND GND
GND GND
" GND GND " " 32 "
I
CCL55 GND GND GND GND GND
GND GND
" GND GND " " 32 "
2 Same tests, terminal conditions, and limits as for subgroup 1, except TC = 125°C and VIC tests are omitted.
3 Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
See footnotes at end of device types 03, 04, 11, and 12.
MIL-M-38510/315D
80
TABLE III. Group A inspection for device type 03 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 56 B 8/
A 8/ A 8/ A 8/ A A A GND A A L L L L L 4.5 V
Tc = +25°C tional " 57 A A B B B B " " B " " " " " "
tests " 58 B A A A A “ " " A " " “ “ “ "
7/ " 59 A A A A A “ " " A " " “ H “ "
" 60 A B B B B " " B " " " " " "
" 61 B A A A A " " " A " " " " " "
" 62 " A A A A A “ " A " " H L "
" 63 " A B B B B " " " B " " " " " "
" 64 " B A A A A " " " A " " " " " "
" 65 " A A A A A " " " A " " " H " "
" 66 “ A B B B B " " " B " " " " " "
" 67 " B A A A A " " " A " " " " " "
" 68 " A A A A A " " " A " H L L " "
" 69 " A B B B B " " " B " " " " " "
" 70 " B A A A A " " " A " " " " " "
" 71 " A A A A A " " " A " " " H " "
" 72 " A B B B B " " " B " " " " " "
" 73 " B A A A A " " " A " " " " " "
" 74 " A A A A A " " " A " " H L " " See 9/
" 75 " A B B B B " " " B " " " " " "
" 76 " B A A A A " " " A " " " " " "
" 77 " A A A A A " " " A " " " H " "
" 78 " A B B B B " " " B " " " " " "
" 79 " B A A A A " " " A " " " " " "
" 80 " A A A A A " " " A H L L L " "
" 81 " A B B B B " " " B " " " " " "
" 82 " B A A A A " " " A " " " " " "
" 83 " A A A A A " " " A " " " H H "
" 84 " A B B B B " " " B " " " " L "
" 85 " B A A A A " " " A " " " " H "
" 86 " A " " " " " " " " L " " L L "
" 87 B A " " " " " " " " " " " " " "
" 88 A A " " " " B " " " " " " " " "
" 89 " B " " " " " " " " " " " " " "
" 90 " A " " " " " " " " " " " " " "
" 91 " A B B B B A " " B " " " " " "
" 92 " A A A A A " " " " " " " " " "
" 93 " B " A A A " " " " " " " " " "
" 94 " A " A A A " " " " " " " " " "
" 95 " A " B B B " " B " " " " " " "
" 96 " B " B B " " " " " " " " " " "
" 97 " A B B " " " " " " " " H " "
" 98 " A " A A " " " " " " " " " " "
" 99 " B " " " " " " " " " " " " " "
" 100 " A " " " " " " " " " H H " " "
" 101 " A " “ " “ “ " A " " “ “ “
" 102 " B " " " " " " " " " " " " "
" 103 “ A " " " " " " " " " " " " " "
" 104 " A " B B A " " B " " " " " " "
" 105 " B " " " " " " " " " " " " " "
" 106 " A " " " " " " " " H L L " " "
" 107 " A " " " " " " A " " " " " " "
" 108 " B " " " " " " " " " " " " " "
" 109 " A " " " " " " " " " " " " " "
" 110 B A " A A " " " B A L " " L " "
" 111 A A " " " " " " " " " " " " " "
" 112 A B " " " " " " " " " " " " " "
" 113 A A " " " " " " " " H H H H X “
" 114 B A " " " " " " A " L L L L L
MIL-M-38510/315D
81
See footnotes at end of device types 03, 04, 11, and 12.
TABLE III. Group A inspection for device type 03 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 115 A 8/
A 8/ A 8/ B 8/ B B B GND B B L L L L L 4.5 V
Tc = +25°C tional " 116 B L " "
tests " 117 A H “ "
7/ " 118 A B A A " " A " " “ “ “ "
" 119 B
" 120 A " " " " H " " L " "
" 121 " A A B B " " " “ "
" 122 " B
" 123 " A " " " L " H " " "
" 124 " A B A A “
" 125 “ B
" 126 " A H H L " " "
" 127 " A A “ " " " B " " "
" 128 " B " " " “ " " " " " "
" 129 " A " " " " " H " " "
" 130 " A A B B “ A " " A " " " “ " "
" 131 " B
" 132 " A L L H H "
" 133 " A A A B B " " B " " L " See 9/
" 134 " B " " " “ " " " " " "
" 135 " A " " " “ L H H " " "
" 136 " A B “ B A A " " " " " “ " "
" 137 " B " " " " " " " " "
" 138 " A " " " H L " L " "
" 139 " A A “ B " " " A " " " " "
" 140 " B " " " " " " " " " " " " " "
" 141 " A " " " " " " " " L " " H " "
" 142 " A B B A " " " " " " " " " " "
" 143 " B " " " " " " " " " " " " " "
" 144 " A " " " " " " " " " H L L " "
" 145 " A A " " " " " " " " " " " " "
" 146 " B " " " " " " " " " " " " " "
" 147 " A " " " " " " " " " " " H " "
" 148 " A B A " " " " " " " " " " " "
" 149 " B " " " " " " " " " " " " " "
" 150 " A " " " " " " " " " " H L " "
8 Repeat subgroup 7 at TC = +125°C and TC = -55°C.
See footnotes at end of device types 03, 04, 11, and 12.
82
MIL
-
M
-
38510/315D
TABLE III. Group A inspection for device type 04 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 56 B 8/
A 8/ A 8/ A A A A 8/ GND A A L L L L L 4.5 V
Tc = +25°C tional " 57 A A B B B B " " B " " " " " "
tests " 58 B A A A A “ " " A " " “ “ “ "
7/ " 59 A A A A A “ " " A " " “ H “ "
" 60 A B B B B " " B " " " " " "
" 61 B A A A A " " " A " " " " " "
" 62 " A A A A A “ " A " " H L "
" 63 " A B B B B " " " B " " " " " "
" 64 " B A A A A " " " A " " " " " "
" 65 " A A A A A " " " A " " " H " "
" 66 “ A B B B B " " " B " " " " " "
" 67 " B A A A A " " " A " " " " " "
" 68 " A A A A A " " " A " H L L " "
" 69 " A B B B B " " " B " " " " " "
" 70 " B A A A A " " " A " " " " " "
" 71 " A A A A A " " " A " " " H " "
" 72 " A B B B B " " " B " " " " " "
" 73 " B A A A A " " " A " " " " " "
" 74 " A A A A A " " " A " " H L " " See 9/
" 75 " A B B B B " " " B " " " " " "
" 76 " B A A A A " " " A " " " " " "
" 77 " A A A A A " " " A " " " H " "
" 78 " A B B B B " " " B " " " " " "
" 79 " B A A A A " " " A " " " " " "
" 80 " A A A A A " " " A H L L L " "
" 81 " A B B B B " " " B " " " " " "
" 82 " B A A A A " " " A " " " " " "
" 83 " A A A A A " " " A " " " H “ "
" 84 " A B B B B " " " B " " " " “ "
" 85 " B A A A A " " " A " " " " “ "
" 86 " A A A A A " " " A " H L "
" 87 “ A B B B B " " " B " " " " " "
" 88 “ B A A A A “ " " A " " " " " "
" 89 " A A A A A " " " A " " " H " "
" 90 " A B B B B " " " B " " " " " "
" 91 " B A A A A “ " " A " " " " " "
" 92 " A A A A A " " " A " H L L " "
" 93 " A B B B B " " " B " " " " " "
" 94 " B A A A A " " " A " " " " " "
" 95 " A A A A A " " A " " " H " "
" 96 " A B B B B " " " B " " " " " "
" 97 " B A A A A " " " A " " " " " "
" 98 " A A A A A " " " A " " H L " "
" 99 " A B B B B " " " B " " " " " "
" 100 " B A A A A " " " A " “ " " "
" 101 " A A A A A “ " A " “ H H
" 102 " A B B B B " " " B " " " " L
" 103 “ B A A A A " " " A " " " " H "
" 104 " A A A A A " " A L L L L L "
" 105 B A A A A A " " " A " " " " " "
" 106 A A A A A A B " " A “ “ " " "
" 107 " B " " " " B " “ B " " " " " "
" 108 " A " " " " A " " " " " " " " "
" 109 " B " B B B " " " " " " " " " "
" 110 “ A " “ " " " " " “ " "
" 111 “ B " " " " " " B " " " " " " "
" 112 “ A " " " " " " " " " " " H " "
" 113 “ A " A A " " " " " “ “ “
" 114 “ B " A A " " " “ " “ “ “
83
MIL-M-38510/315D
See footnotes at end of device types 03, 04, 11, and 12.
TABLE III. Group A inspection for device type 04 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 115 A 8/
A 8/
A A A B A GND B B L H H H L 4.5 V
Tc = +25°C tional " 116 " A " " " " " " A " " " " " " "
tests " 117 B " " " " “ " " " " " “ “ “ "
7/ " 118 A " " " " “ " " " " " " " " "
" 119 B " B B A “ " B " " " " " " "
" 120 A " B B " " " " " H L L " " "
" 121 B A " A A " “ " A L " " L “ "
" 122 A A " " " " " " " " " " " " " "
" 123 " B " " " " " " " " " " " " " "
" 124 " A " " " " " " " " H H H H H "
" 125 “ B " " " " " " " " " " " " " "
" 126 B A " " " " " " A " L L L L L "
" 127 A A B " " " " " B " " " " " " "
" 128 " B " " " " " " " " " " " " " "
" 129 " A " " " " " " " " H H H " " "
" 130 " A " " B B " " " " " " " " " "
" 131 " B " " " " " " " " " " " " " "
" 132 " A " " " " " " " " L L " " " "
" 133 " A A " " " " " " " " " " " " " See 9/
" 134 " B " " " " " " " " " " " " " "
" 135 " A " " " " " " " " " " " H " "
" 136 " A B B A " " " " " " " " " " "
" 137 " B " " " " " " " " " " " " " "
" 138 " A " " " " " " " " " H L L " "
" 139 " A A " " " " " " " " " " " " "
" 140 " B " " " " " " " " " " " " " "
" 141 " A " " " " " " " " " " " H " "
" 142 " A B A " " " " " " " " " " “ "
" 143 " B " " " " " " " " " " " " "
" 144 " A " " " " " " " " " " H L "
" 145 " A " B B A " " " " " " " " "
" 146 “ B " " " " " " " " " " " " " "
" 147 “ A " " " " “ " " " H L L " " "
" 148 " A A A " " " " " " " " " " " "
" 149 " B " " " " " " " " " " " " " "
" 150 " A " " " " “ " " " " " H H " "
" 151 " A B B A " " " " " " " " " " "
" 152 " B " " " " " " " " " " " " " "
" 153 " A " " " " " " " " " H L L " "
" 154 " A A " " " " " “ " " " " " " "
" 155 " B " " " " " " " " " " " " " "
" 156 " A " " " " " " " " " " H " "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 03, 04, 11, and 12.
84
MIL-M-38510/315D
TABLE III. Group A inspection for device type 11 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
MIL-STD- Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol 883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 56 B 8/
B 8/
B 8/ B B B 8/ A 8/ GND B A X X X X X 4.5 V
Tc = +25°C tional " 57 B A " " " " “ " " " L L L L L "
tests " 58 A B " " " " “ " " " " " “ “ “ "
7/ " 59 A A " " " " “ " " " " " “ " “ "
" 60 B A A A A A " A " " " " " " "
" 61 B B A A A A " " " " " " " " " "
" 62 B A A A A A “ " " " " " " “ "
" 63 A A B B B B " " " B " " " " " "
" 64 " B A A A A " " " A " " " " " "
" 65 " A A A A A " " " A " " " H " "
" 66 “ A B B B B " " " B " " " " " "
" 67 " B A A A A " " " A " " " " " "
" 68 " A A A A A " " " A " " H L " "
" 69 " A B B B B " " " B " " " " " "
" 70 " B A A A A " " " A " " " " " "
" 71 " A A A A A " " " A " " " H " "
" 72 " A B B B B " " " B " " " " " "
" 73 " B A A A A " " " A " " " " " "
" 74 " A A A A A " " " A " H L L " " See 9/
" 75 " A B B B B " " " B " " " " " "
" 76 " B A A A A " " " A " " " " " "
" 77 " A A A A A " " " A " " " H " "
" 78 " A B B B B " " " B " " " " " "
" 79 " B A A A A " " " A " " " " " "
" 80 " A A A A A " " " A " " H L " "
" 81 " A B B B B " " " B " " " " " "
" 82 " B A A A A " " " A " " " " " "
" 83 " A A A A A " " " A " " " H “ "
" 84 " A B B B B " " " B " " " " “ "
" 85 " B A A A A " " " A " " " " “ "
" 86 " A A A A A " " " A H L L L " "
" 87 “ A B B B B " " " B " " " " " "
" 88 “ B B B B B “ " " B " " " " " "
" 89 " B A A A A " " " A " " " " " "
" 90 " A A A A A " " " A " " " H H "
" 91 " A B B B B “ " " B " " " " L "
" 92 " B A A A A " " " A " " " " H "
" 93 " A " " " " " " " A L " " L L "
" 94 " A " " " " B " " " " " " " " "
" 95 " B " " " " " " " " " " " " "
" 96 " A " " " " " " " " " " " " " "
" 97 " B " " " " A " " B " " " " " "
" 98 " A " B B B " " " " " " " " " "
" 99 " B " " " " " " B " " " " " " "
" 100 " A " " " " " " " " " “ H " "
" 101 " A " A A " “ " " " “ " "
" 102 " B " " " " " " " " " " " " "
" 103 “ A " " " " " " " " " H H " " "
" 104 " A " " " " " " A " " " " " " "
" 105 " B " " " " " " " " " " " " " "
" 106 A A " " " " A " " " “ “ " " "
" 107 " B " B B A " " B " " " " " " "
" 108 " A " " " " " " B " H L L " " "
" 109 " A " " " " " " A " " " " " " "
" 110 “ B " “ " " " " " “ " "
" 111 “ A " " " " " " " " " " " " " "
" 112 B B " A A " " " " A " " " " H "
" 113 B A " " " " " " " " L “ L L
" 114 A A " " " " B " L “ L L
See footnotes at end of device types 03, 04, 11, and 12.
85
MIL-M-38510/315D
TABLE III. Group A inspection for device type 11 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 115 A 8/
B 8/
A B B A A GND B A L L L L L 4.5 V
Tc = +25°C tional " 116 " A " " " " " " “ " H " " H H "
tests " 117 B " " " " “ " " " " " “ “ “ "
7/ " 118 A " " " " “ " " " " " " " " "
" 119 B B " " " " “ " " " " " " " " "
" 120 B A " " " " " " " " L " " L L "
" 121 A A B " " B “ " B " " " " “ "
" 122 " B " A " " " " " " " " " " " "
" 123 " A " A " " " " " " " " H " " "
" 124 " A " B " A " " " " " " " " " "
" 125 “ B " " " " " " " " " " " " " "
" 126 " A " " " " " " " " H " L " " "
" 127 " A " " " B " " " A " " " " " "
" 128 " B " " " " " " " " " " " " " "
" 129 " A " " " " " " " " L " " " " "
" 130 " A " A A A " " " " " " " " " "
" 131 " B " " " " " " " " " " " " " "
" 132 " A " " " " " " " " H H H " " "
" 133 " A A " B B " " " " " " " " " " See 9/
" 134 " B " " " " " " " " " " " " " "
" 135 " A " " " " " " " " L L " H " "
" 136 " A B B A " " " " " " " " " " "
" 137 " B " " " " " " " " " " " " " "
" 138 " A " " " " " " " " " H L L " "
" 139 " A A " " " " " " " " " " " " "
" 140 " B " " " " " " " " " " " " " "
" 141 " A " " " " " " " " " " " H " "
" 142 " A B A " " " " " " " " " " “ "
" 143 " B " " " " " " " " " " " " "
" 144 " A " " " " " " " " " " H L "
" 145 " A " B B A " " " " " " " " "
" 146 “ B " " " " " " " " " " " " " "
" 147 “ A " " " " “ " " " H L L " " "
" 148 " A A " " " " " " " " " " " " "
" 149 " B " " " " " " " " " " " " " "
" 150 " A " " " " “ " " " " " " H H "
" 151 " A " A A " " " A " " " " " " "
" 152 " B " " " " " " " " " " " " " "
" 153 " A " " " " " " " " L " " L L "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 03, 04, 11, and 12.
86
MIL-M-38510/315D
TABLE III. Group A inspection for device type 12 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 56 B 8/
B 8/
B 8/ B B B A 8/ GND B A X X X X X 4.5 V
Tc = +25°C tional " 57 B A " " " " “ " " " L L L L L "
tests " 58 A B " " " " “ " " " " " “ “ “ "
7/ " 59 A A " " " " “ " " " " " “ " “ "
" 60 B A A A A A " A " " " " " " "
" 61 B B " " " " " " " " " " " " " "
" 62 B A " " " " “ " " " " " " “ "
" 63 A A B B B B " " " B " " " " " "
" 64 " B A A A A " " " A " " " " " "
" 65 " A A A A A " " " A " " " H " "
" 66 “ A B B B B " " " B " " " " " "
" 67 " B A A A A " " " A " " " " " "
" 68 " A A A A A " " " A " " H L " "
" 69 " A B B B B " " " B " " " " " "
" 70 " B A A A A " " " A " " " " " "
" 71 " A A A A A " " " A " " " H " "
" 72 " A B B B B " " " B " " " " " "
" 73 " B A A A A " " " A " " " " " "
" 74 " A A A A A " " " A " H L L " " See 9/
" 75 " A B B B B " " " B " " " " " "
" 76 " B A A A A " " " A " " " " " "
" 77 " A A A A A " " " A " " " H " "
" 78 " A B B B B " " " B " " " " " "
" 79 " B A A A A " " " A " " " " " "
" 80 " A A A A A " " " A " " H L " "
" 81 " A B B B B " " " B " " " " " "
" 82 " B A A A A " " " A " " " " " "
" 83 " A A A A A " " " A " " " H “ "
" 84 " A B B B B " " " B " " " " “ "
" 85 " B A A A A " " " A " " " " “ "
" 86 " A A A A A " " " A H L L L " "
" 87 “ A B B B B " " " B " " " " " "
" 88 “ B A A A A “ " " A " " " " " "
" 89 " A A A A A " " " A " " " H " "
" 90 " A B B B B " " " B " " " " " "
" 91 " B A A A A “ " " A " " " " " "
" 92 " A A A A A " " " A " " H L " "
" 93 " A B B B B " " " B " " " " " "
" 94 " B A A A A " " " A " " " " " "
" 95 " A A A A A " " A " " " H " "
" 96 " A B B B B " " " B " " " " " "
" 97 " B A A A A " " " A " " " " " "
" 98 " A A A A A " " " A " H L L " "
" 99 " A B B B B " " " B " " " " " "
" 100 " B A A A A " " " A " “ " " "
" 101 " A A A A A “ " A " “ H "
" 102 " A B B B B " " " B " " " " "
" 103 “ B A A A A " " " A " " " " " "
" 104 " A A A A A " " " A " " H L " "
" 105 " A B B B B " " " B " " " " " "
" 106 " B A A A A " " " A “ “ " " "
" 107 " A A A A A " " " A " " " H H "
" 108 " A B B B B " " " B " " " " L "
" 109 " B A A A A " " " A " " " " H "
" 110 “ A " “ " " " A L L L L L "
" 111 “ B " " " " B " " B " " " " " "
" 112 " A " " " " " " " " " " " " " "
" 113 " B " " " " A " " " " “ " "
" 114 " A " B B B A " " " " “ " "
See footnotes at end of device types 03, 04, 11, and 12.
87
MIL-M-38510/315D
TABLE III. Group A inspection for device type 12 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no. Clear Clock A B C D EnP GND Load
EnT QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 115 A 8/
B A B 8/ B 8/ B A GND B B L L L L L 4.5 V
Tc = +25°C tional " 116 " A " B B " " " “ " " " H "
tests " 117 A " A A " “ " " " " " “ “ “ "
7/ " 118 B " " " " “ " " " " " " " " "
" 119 A " " " " “ " " " " H H " " "
" 120 A " " " " " " A " " " "
" 121 “ B “ " " “ “ " " " " " "
" 122 " A " B B A " " " " " " " " " "
" 123 " B " " " " " B " " " " " "
" 124 " A " " " " " " H L L " " "
" 125 “ A " A A " " " " A " " " " " "
" 126 " B " " " " " " " " " " " "
" 127 " A " " " " " " " H H " H "
" 128 " A B " " " " " " " " " " " " "
" 129 " B A " " " " " " " " " " " "
" 130 " B A B B B " " " " " " " " " "
" 131 " A A " " " " " " " L L L " L "
" 132 " B " " " " " " " " " "
" 133 " A A A " " " " " " " " " " See 9/
" 134 " B " " A " " " " " " " " " "
" 135 " A " " B " " " " " " "
" 136 " B “ “ " " " " " " " " " " "
" 137 " B A B " " " " " " " " " " "
" 138 " A " " " " " " " " " " " " "
" 139 " B " " " " " " " " " " " " " "
" 140 " A " " " " " " " " " " H " " "
" 141 " A B B A " " " " " " " " " " "
" 142 " B " " " " " " " " " " " " “ "
" 143 " A " " " " " " " " " H L L "
" 144 " A A " " " " " " " " " " " “ "
" 145 " B " " " " " " " " " " " " "
" 146 “ A " " " " " " " " " " " H " "
" 147 “ A B A " " “ " " " " " " " " "
" 148 " B " " " " " " " " " " " " " "
" 149 " A " " " " " " " " " " H L " "
" 150 " A " B B A “ " " " " " " " " "
" 151 " B " " " " " " " " " " " " " "
" 152 " A " " " " " " " " H L L " " "
" 153 " A " A " " " " " " " " " " " "
" 154 " B " " " " " " " " " " " " " "
" 155 " A " " " " " " " " " " H " " "
" 156 " A A " " " " " " " " " " " " "
" 157 " B " " " " " " " " " " " " " "
" 158 " A " " " " " " " " " " " H " "
" 159 " A B B A " " " " " " " " " " "
" 160 " B " " " " " " " " " " " " " "
" 161 " A " " " " " " " " " H L L " "
" 162 " A A " " " " " " " " " " " " "
" 163 " B " " " " " " " " " " " " " "
" 164 " A " " " " " " " " " " " H " "
" 165 " A " " " " " " A " " " " " " "
" 166 " B " " " " " " " " " " " " " "
" 167 " A " " " " " " " " " " H L " "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 03, 04, 11, and 12.
88
MIL-M-38510/315D
TABLE III. Group A inspection for device types 03, 04, 11, and 12.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases
E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Case 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no.
(Device types) Clear Clock A B C D EnP GND Load EnT QD Q
C QB Q
A Ripple
carry VCC terminal Min Max
9
Tc = +125°C
FMAX
10/ 3003
(Fig 6) 151 157
154
168
4.5 V IN 4.5 V GND 4.5 V 4.5 V OUT 5.0 V QA 22 MHz
tPLH4 " 152 158
155
169
OUT
Clk to
carry 3 40 ns
tPHL4 " 153 159
156
170
“ “ OUT
Clk to
carry " 40 "
tPLH5 " 154 160
157
171
“ “
OUT Clk to
QA " 29 "
155 161
158
172
OUT Clk to
QB “ “ "
156 162
159
173
OUT Clk to
QC " " "
" 157 163
160
174
OUT Clk to
QD " " "
tPHL5 " 158 164
161
175
OUT Clk to
QA " 32 "
159 165
162
176
OUT Clk to
QB “ “ "
160 166
163
177
OUT Clk to
QC “ “ "
161 167
164
178
OUT Clk to
QD “ “
tPLH6162 168
165
179
IN GND
OUT Clk to
QA " 29 "
tPHL6163 169
166
180
IN OUT Clk to
QA " 32 "
tPLH6164 170
167
181
IN OUT Clk to
QB " 29 “
tPHL6165 171
168
182
“ “ IN OUT Clk to
QB
" 32 "
tPLH6166 172
169
183
IN OUT Clk to
QC
" 29 "
tPHL6167 173
170
184
IN OUT Clk to
QC " 32 "
tPLH6168 174
171
185
IN OUT Clk to
QD " 29 "
tPHL6169 175
172
186
IN OUT Clk to
QD " 32 "
t
PLH7170 176
173
187
4.5 V 4.5 V IN OUT EnT to
Cy “ 19 "
t
PHL7 " 171 177
174
188
4.5 V 4.5 V IN OUT EnT to
Cy
“ 19
11/ "
tPHL8 " 172 178
175
189
IN 12/ 4.5 V GND OUT
Clr to
QA
33
tPHL8 " 173 179
176
190
4.5 V OUT
Clr to
QB
tPHL8 " 174 180
177
191
4.5 V OUT
Clr to
QC
tPHL8 “ 175 181
178
192
4.5 V OUT Clr to
QD
See footnotes at end of device types 03, 04, 11, and 12.
MIL
-
M
-
385
10/315D
89
TABLE III. Group A inspection for device types 03, 04, 11, and 12.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases
E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Case 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
Test no.
(Device types)
MIL-STD-
883
method 03 04 11 12
Clear Clock A B C D EnP GND Load EnT QD Q
C QB Q
A Ripple
carry VCC terminal Min Max
10
Tc = +125°C
FMAX
10/ 3003
(Fig 6) 176
182 179 193
Clk to
QA 22 MHz
t
PLH4 " 177
183 180 194
Clk to
Carry 3 56 ns
t
PHL4 " 178
184 181 195
Clk to
carry " 56 "
t
PLH5 " 179
185 182 196
Clk to
QA " 41 "
180
186 183 197
Clk to
QB “ “ "
181
187 184 198
Clk to
QC " " "
" 182
188 185 199
Clk to
QD " " "
t
PHL5 " 183
189 186 200
Clk to
QA " 45 "
184
190 187 201
Clk to
QB “ “ "
185
191 188 202
Clk to
QC “ “ "
186
192 189 203
Clk to
QD “ “
t
PLH6187
193 190 204
Clk to
QA " 42 "
t
PHL6188
194 191 205
Clk to
QA " 48 "
t
PLH6189
195 192 206
Clk to
QB " 42 “
t
PHL6190
196 193 207
Clk to
QB
" 48 "
t
PLH6191
197 194 208
Clk to
QC
" 42 "
t
PHL6192
198 195 209
Clk to
QC " 48 "
t
PLH6193
199 196 210
Clk to
QD " 42 "
t
PHL6194
200 197 211
Clk to
QD " 48 "
tPLH7 “ 195
201 198 212
EnT to
carry “ 28 "
tPHL7 " 196
202 199 213
EnT to
carry “ 28 "
t
PHL8 " 197
203 200 214
Clr to
QA
46
t
PHL8 " 198
204 201 215
Clr to
QB 46
t
PHL8 " 199
205 202 216
Clr to
QC 46
t
PHL8 “ 200
206 203 217
Same terminal conditions as for subgroup 9.
Clr to
QD 46
11 Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C.
See footnotes at end of device types 03, 04, 11, and 12.
MIL-M-38510/315D
90
1/ For case 2, pins not referenced are NC.
2/ Apply one pulse prior to measurement as follows:
2.5 V min/5.0 V max 2.5 V min/5.0 V max
or
0 V ± .2 V 0 V ± .2 V
3/ A pply 0.7 V for types 03 and 11; appl y 2.0 V for types 04 an d 12.
4/ IIL limits (µA) min/max values for circuits shown:
Circuits
Parameter
Terminals A B C D E F G
Clear 03 -160/-400 -30/-300 -120/-360 -160/-400 -120/-360 -0/-100 -16/-400
Clear 04
Clear 11
Clear 12 -290/-630 “ -150/-450
EnP -120/-360 “ -120/-360 -150/-380 “
A, B, C, D -160/-400 “ -150/-380 -0/-100
Load -290/-630 -120/-360 -160/-400
IIL5 EnT -320/-800 -30/-300 -340/-860 -320/-800 -240/-720 -300/-760 -320/-800
IIL6 Clock -160/-400 -0/-100 -290/-630 -160/-400 -180/-420 -0/-100 -160/-400
5/ For types 03 and 11, set outputs to 9th count (QA = 1, QD = 1, QB and QC = 0) prior to measurement.
For types 04 and 12, set outputs to 15th count (QA, QB, QC and QD = 1) prior to measu rem en t.
6/ Apply GND for types 03 and 11; apply 4.5 V for types 04 and 12.
7/ Only a summary of attributes data is required.
8/ A = 3.0 V minimum; B = 0.0 V or GND.
9/ H > 1.5 V; L < 1.5 V; X = don’t care.
10/ The FMAX minimum limit specified is the frequency of the input pulse. The output frequency shall
be one-half of the input frequency. For type 04, circuit C, 20 MHz minimum.
11/ The limit for circuit B shall be 23 ns.
12/ For types 03 and 04, apply one clock pulse prior to test. For types 11 and 12 apply one clock
pulse prior to test and another pulse during test.
13/ IIH13 limit for types 11 and 12; 40 µA maximum.
I
IH14 limit for types 11 and 12; 200 µA maximum.
MIL-M-38510/315D
91
TABLE III. Group A inspection for device types 05 and 06.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Case 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. U/ D CK A B C D EP GND L ET QD’ Q
C’ QB’ Q
A’ Ripple
carry VCC terminal Min Max
1 VOL 3007 1 4.5 V 2/ 0.7 V 0.7 V
0.7 V
0.7 V
4.5 V
GND 0.7 V 4.5 V 4 mA 4.5 V QD 0.4 V
Tc = +25
°C
" 2 " " " " " " " " " 4 mA " QC " "
" 3 " " " " " " " " " 4 mA " QB " "
" 4 " " " " " " " " " 4 mA " QA " "
5 0.7 V " " " " " 0.7 V " " 0.7 V 4 mA " Ripple
carry "
V
OH 3006 6 4.05 V " 2.0 V 2.0 V 2.0 V 2.0 V " " " " -.4 mA " QD 2.5 "
" 7 " " " " " " " " " -.4 mA " QC "
" 8 " " " " " " " " " -.4 mA " QB "
9 " " " " " " " " " -.4 mA " QA "
10 0.7 V " " " " " " " " " -.4 mA " Ripple
carry "
V
IC 11 -18 mA " " U/ D -1.5 "
12 -18 mA " " CK " "
13 -18 mA " " A
14 -18 mA
" " B " "
15 -18 mA
" " C
16 -18 mA
D
17 -18 mA
EP
18 -18 mA L
19 -18 mA ET
I
IL12 3009 20 0.4 V GND
5.5 V A 3/ 3/ µA
21 0.4 V
B
22 0.4 V
C
23 0.4 V
D
I
IL13 24 0.4 V U/ D 3/ 3/ “
25 0.4 V CK
26 0.4 V L
I
IL14 “ 27 0.4 V
EP 3/ 3/
I
IL15 “ 28
0.4 V ET 3/ 3/
I
IL17 3010 29 2.7 V U/ D 20
30 2.7 V CK
31 2.7 V A
32 2.7 V B
33 2.7 V C
34 2.7 V D
35 2.7 V EP
36 2.7 V L
IIH19 37 2.7 V ET 40
See footnotes at end of device types 05 and 06.
MIL-M-38510/315D
92
TABLE III. Group A inspection for device types 05 and 06.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method
Test no. U/ D CK A B C D EP GND L ET QD Q
C QB Q
A Ripple
carry VCC terminal Min Max
1 IIH18 3010 38 5.5 V GND 5.5 V
U/ D 100
µA
Tc = +25
°C
" 39 5.5 V " " CK " "
" 40
5.5 V " " A " "
" 41
5.5 V
" " B " "
42 5.5 V
" " C "
43 5.5 V " " D "
" 44
5.5 V
" " EP "
" 45
" 5.5 V " L “ "
I
IL2046
" 5.5 V " ET 200 "
I
0S 3011 47 5.5 V 2/ 5.5 V 5.5 V
5.5 V
5.5 V
5.5 V
" GND 5.5 V GND " QD -15 -100 "
" 48 " " " " " " " " " " GND " QC “ “ "
" 49 " " " " " " " " " " GND " QB" "
" 50 " " " " " " " " " " GND " QA
" 51 " " " " " " " " " " GND " Ripple
carry “ " "
I
CC 3005 52 GND GND GND GND
GND GND
" 5.5 V GND " VCC 34 "
2 Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.
3 Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
See footnotes at end of device types 05 and 06.
MIL-M-38510/315D
93
TABLE III. Group A inspection for device type 05 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no.
U/ D CK A B C D EP GND L
ET QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 53 A 5/
B 5/
B B B B B GND B B X X X X X 4.5 V
Tc = +25°C tional " 54 " A " " B " L 5/
L L L H 5/
"
tests " 55 B " " “ " A " " " “ L “ "
4/ " 56 A " " " " “ " " " " " " H " "
" 57 B " " " " “ " " " " H " "
" 58 A " " " " " " " " H L "
" 59 B “ " " “ “ " " " " L “ "
" 60 " A " “ “ “ " " " " " " " H " "
" 61 " B " " " " " " " " H " "
" 62 " A " " " " " " H L L " "
" 63 “ B " " " " " " " " L " "
" 64 " A " " " " " " " " " H " "
" 65 " B " " " " " " " H “ "
" 66 " A " " " " " " " " " H L " "
" 67 " B " " " " " " " " " L " "
" 68 " A “ " " " " " " " H " "
" 69 " B " " " " " " " H "
" 70 " A " " " " " " " H L L L " "
" 71 " B " " " " " " " L " " See 6/
" 72 " A " " " " " " " " " H L "
" 73 " B " " A " " " " L "
" 74 " A “ “ " A " " " " " " " " "
" 75 " B " B " " " " " " " " "
" 76 " A " " " " " " A " " " " H "
" 77 " A " " " " " " " A " " " " H "
" 78 " B " " " " " " " B " " " L "
" 79 " A “ " " " " " L " " L H "
" 80 " B A " A " “ B “ L " “ L “ "
" 81 " A " " " " " " B " H “ H L "
" 82 B B " " " " " A " " " " H H "
" 83 " A " " " " " " " " " " L " "
" 84 “ B " " " " " " " " " " " L " "
" 85 “ A " " “ " " " L H H H " "
" 86 " B " " " " " " " " " " " H " "
" 87 " A " " " " " " " " " " L " "
" 88 " B " “ " " " " " H L " "
" 89 " A " " " " " " " " " " L H " "
" 90 " B " " " " " " " " " "
" 91 " A " " " " " " " " " " L " "
" 92 " B " " " " " " " " " " " L " "
" 93 " A " " " " " " " " " L H H " "
" 94 " B " " " " " " " " " " H " "
" 95 " A " " " " " " " " " " " L " "
" 96 " B " " " " " " " " " " " L " "
" 97 " A " " " " " " " L H " "
" 98 " B " " " " " " " " " " " H " "
" 99 " A " " " " " " " " " “ “ L L "
" 100 " B “ " " " A " " " " " " " " "
" 101 " A " " " " A " " " " " " " " "
" 102 " B " " " " B " " " " " " “ " "
" 103 " B " " " " " " “ A " " " " H "
" 104 " A " " " " " " " A " " " " H "
" 105 " B " " " " " " " B " " “ “ L "
106 “ B B A A B “ L
107 “ A B A A B H H H
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 05 a
nd 06.
94
MIL-M-38510/315D
TABLE III. Group A inspection for device type 06 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no.
U/ D CK A B C D EP GND L
ET QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 53 A 5/
B 5/
B B B B B GND B B X X X X X 4.5 V
Tc = +25°C tional " 54 " A " " B " L 5/ L L L H 5/
"
tests " 55 B " " “ " A " " " “ L “ "
4/ " 56 A " " " " “ " " " " " " H " "
" 57 B " " " " “ " " " " H " "
" 58 A " " " " " " " " H L "
" 59 B “ " " “ “ " " " " L “ "
" 60 " A " “ “ “ " " " " " " " H " "
" 61 " B " " " " " " " " H " "
" 62 " A " " " " " " H L L " "
" 63 “ B " " " " " " " " L " "
" 64 " A " " " " " " " " " H " "
" 65 " B " " " " " " " H “ "
" 66 " A " " " " " " " " " H L " "
" 67 " B " " " " " " " " " L " "
" 68 " A “ " " " " " " " H " "
" 69 " B " " " " " " " H "
" 70 " A " " " " " " " H L L L " "
" 71 " B " " " " " " " L " " See 6/
" 72 " A " " " " " " " " " H "
" 73 " B " " " " " " " H " "
" 74 " A “ “ " " " " " " " H L " "
" 75 " B " " " " " " " " L " "
" 76 " A " " " " " " " " " " H " "
" 77 " B " " " " " " " " " " " H " "
" 78 " A " " " " " " " " " H L L " "
" 79 " B “ " " " " " " " " L " "
" 80 " A " " " " “ " “ " " “ H “ "
" 81 " B " " " " " " " " " “ H " "
" 82 “ A " " " " " " " " " H L " "
" 83 " B " " " " " " " " " " L " "
" 84 “ A " " " " " " " " " " " H L "
" 85 “ B " " " " A " " " " " " " " "
" 86 " A " " " " A " " " " " " " " "
" 87 " B " " " " B " " " " " " " "
" 88 " B " “ " " A " " " " H "
" 89 " A " " " " " " " A " " " " H "
" 90 " B " " " " " " " B L "
" 91 " A " " " " " " " L L L L H "
" 92 " B A A A A " " B " L L L L H "
" 93 " A " " " " " " B " H H H H L "
" 94 B B " " " " " A " " " " H H "
" 95 " A " " " " " " " " " " " L " "
" 96 " B " " " " " " " " " " " L " "
" 97 " A " " " " " " " L H " "
" 98 " B " " " " " " " " " " " H " "
" 99 " A " " " " " " " " " “ L " "
" 100 " B “ " " " " " " " " " " L " "
" 101 " A " " " " " " " " " L H H " "
" 102 " B " " " " " " " " " " " H " "
" 103 " A " " " " " " “ " " " " L " "
" 104 " B " " " " " " " " " " " L " "
" 105 " A " " " " " " " " " " L H " "
106 B " " " " “ H "
107 “ A " " " " " L "
108 B " " " " " " " " " " " L " "
See footnotes at end of device types 05 and 06.
95
MIL-M-38510/315D
TABLE III. Group A inspection for device type 06 – Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no.
U/ D CK A B C D EP GND L
ET QD Q
C Q
B Q
A Ripple
carry VCC Min Max
7 Func- 3014 109 B 5/
A 5/ A A A A B GND A B L H H H H 4.5 V
Tc = +25°C tional " 110 " B " " “ " H "
tests " 111 A " " “ " “ " " " “ L “ "
4/ " 112 B " " " " “ " " " " " " L " "
" 113 A " " " " “ " " " " L H " "
" 114 B " " " " " " " " H "
" 115 “ A " " “ “ " " " " L “ "
" 116 " B " “ “ “ " " " " " " " L " "
" 117 " A " " " " " " " L H H " "
" 118 " B " " " " " " “ H " " See 6/
" 119 “ A " " " " " " " " L " "
" 120 " B " " " " " " " " " L " "
" 121 " A " " " " " " " L H “ "
" 122 " B " " " " " " " " " " H " "
" 123 " A " " " " " " " " " L L "
" 124 " B “ A " " " " " " " " "
" 125 " A " " " A " " " " "
" 126 " B " " " B " " A " " " " H "
" 127 " A " " " A " " " " H "
" 128 " B " " " " " B " " " " L "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 05 and 06.
96
MIL-M-38510/315D
TABLE III. Group A inspection for device type 05– Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no.
U/ D CK A B C D EP GND L
ET QD Q
C Q
B Q
A Ripple
carry VCC Min Max
9 tPLH5 See 108 5.0 V IN 7/ GND GND GND GND GND GND IN 7/ GND OUT 5.0 V CK TO QA 3 22 ns
Tc = +25°C fig. 7 109 IN 5.0 V OUT
CK TO QB “ “
110 IN 2/ “ “ OUT CK TO Q
C
111 IN 8/ “ “ OUT CK TO QD
t
PHL5 112 IN 7/ 5.0 V “ “ IN OUT CK TO QA
113 5.0 V “ “ OUT CK TO QB
114 “ “ “ 5.0 V “ “ OUT CK TO QC
115 “ “ “ 5.0 V OUT CK TO QD
tPHL15 116 “ “ “ OUT
CK TO RC 32
tPLH12 117 “ IN “ “ 5.0 V OUT
CK TO RC 30
t
PLH5 118 GND IN 9/ IN GND GND GND “ “ GND OUT
CK TO QA 22 “
t
PHL5 119 “ IN GND GND “ “ OUT
CK TO QA
t
PLH5 120 “ 5.0 V “ “ OUT
CK TO QB
t
PHL5 121 “ GND “ “ OUT
CK TO QB
t
PLH5 122 “ 5.0 V OUT
CK TO QC
t
PHL5 123 “ GND “ “ OUT
CK TO QC
t
PLH5 124 “ 5.0 V OUT CK TO QD
t
PHL5 125 “ GND OUT CK TO QD
t
PHL7 126 5.0 V IN 7/ 5.0 V 5.0 V “ “ IN IN
OUT ET to RC 24 “
t
PLH7 127 5.0 V GND
“ “ 5.0 V IN
OUT “ ET to RC 15 “
t
PHL11 128 IN IN 7/ “ IN GND
OUT “
U/ D to RC “ 28
t
PLH9 129 IN GND “ “ “ “ “ 5.0 V GND
U/ D to RC “ 22
t
PHL7 130 GND IN 7/ GND “ “ GND “ “ IN IN
ET to RC 24
t
PLH7 131 GND GND “ “ “ “ “ 5.0 V IN
ET to RC 15
t
PHL11 132 IN IN 7/ “ “ “ “ “ IN GND
U/ D to RC “ 28
t
PLH9 133 IN GND “ “ “ “ “ 5.0 V
U/ D to RC “ 22
F
MAX
10/ 134 5.0 V IN 5.0 V OUT OUT
OUT
OUT
CK to Qn 25 MHz
F
MAX
10/ “ 135 GND IN 5.0 V OUT OUT
OUT
OUT
CK to Qn 25 MHz
See footnotes at e
nd of device types 05 and 06.
97
MIL-M-38510/315D
TABLE III. Group A inspection for device type 05– Continued.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no.
U/ D CK A B C D EP GND L
ET QD Q
C Q
B Q
A Ripple
carry VCC Min Max
10 tPLH5 See 136 CK TO QA 3 26 ns
Tc = +125°C fig. 7 137 CK TO QB “ “
" 138 CK TO QC " " "
" 139 CK TO QD " " "
t
PHL5 " 140 CK TO QA
" 141 CK TO QB
" 142 CK TO QC
" 143 CK TO QD
tPHL15 " 144 CK TO RC 37
tPLH12 " 145 CK TO RC 35
t
PLH5 " 146 CK TO QA 26 “
t
PHL5 " 147 CK TO QA
t
PLH5 " 148 CK TO QB
t
PHL5 " 149 CK TO QB
t
PLH5 " 150 CK TO QC
t
PHL5 " 151 CK TO QC
t
PLH5 " 152 CK TO QD
t
PHL5 " 153 CK TO QD
t
PHL7 " 154 ET to RC 28 “
t
PLH7 " 155 ET to RC 18 “
t
PHL11 " 156 U/ D to RC “ 33
t
PLH9 " 157 U/ D to RC “ 26
t
PHL7 " 158 ET to RC 28
t
PLH7 " 159 ET to RC 18
t
PHL11 " 160 U/ D to RC “ 33
t
PLH9 161 U/ D to RC “ 26
F
MAX162 CK to Qn 25 MHz
F
MAX163
Same conditions as for subgroup 9.
CK to Qn 25 MHz
11 Same tests, conditions and limits as for subgroup 10 except TC = -55°C and VCC = 4.5 for FMAX.
See footnotes at end of device types 05 and 06.
98
MIL-M-38510/315D
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
MIL-STD- Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol 883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no.
U/ D CK A B C D EP GND L
ET QD Q
C Q
B Q
A Ripple
carry VCC Min Max
9 tPLH5 See 129 5.0 V IN 7/ GND GND GND GND GND GND IN GND OUT 5.0 V CK TO QA 3 22 ns
Tc = +25°C fig. 7 130 5.0 V “ “ OUT
CK TO QB “ “
131 5.0 V “ “ “ “ OUT CK TO Q
C
132 5.0 V “ “ OUT CK TO QD
t
PHL5133 7/ 5.0 V GND GND GND “ GND IN GND OUT CK TO QA 32
134 5.0 V “ “ OUT CK TO QB
135 “ “ “ 5.0 V “ “ OUT CK TO QC
136 “ “ “ 5.0 V OUT CK TO QD
t
PHL15 137 “ GND “ “ OUT CK TO RC 35 “
t
PLH12 138 “ GND “ “ 5.0 V OUT CK TO RC 33 “
t
PLH5 139 GND 5.0 V GND GND GND “ “ 5.0 V OUT
CK TO QA 22 “
t
PHL5 140 “ GND GND “ “ “ “ OUT
CK TO QA 32
t
PLH5 141 “ 5.0 V “ “ “ “ OUT
CK TO QB 22
t
PHL5 142 “ GND “ “ “ “ OUT
CK TO QB 32
t
PLH5 143 “ 5.0 V “ “ OUT
CK TO QC 22
t
PHL5 144 “ GND “ “ “ “ OUT
CK TO QC 32
t
PLH5 145 “ 5.0 V “ “ OUT CK TO QD 22
t
PHL5 146 “ GND “ “ OUT CK TO QD 32
t
PHL7 147 5.0 V “ 7/ 5.0 V 5.0 V 5.0 V 5.0 V “ “ 5.0 V IN
OUT ET to RC 28 “
t
PLH7 148 5.0 V “ “ 5.0 V IN
OUT “ ET to RC 24 “
t
PHL11 149 IN IN 7/ “ 5.0 V GND
OUT “
U/ D to RC “ 32
t
PLH9 150 IN IN “ “ “ “ “ 5.0 V GND
“ “
U/ D to RC “ 28
t
PHL7 151 GND IN 7/ GND GND GND GND 5.0 V IN
ET to RC 28
t
PLH7 152 GND IN “ “ “ “ “ 5.0 V IN
ET to RC 24
t
PHL11 153 IN IN 7/ “ “ “ “ “ 5.0 V GND
“ “
U/ D to RC “ 32
t
PLH9 154 IN IN “ “ “ “ “ 5.0 V
“ “
U/ D to RC “ 22
F
MAX155 5.0 V IN “ “ 5.0 V OUT OUT
OUT
OUT
CK to Qn 25 MHz
F
MAX 156 GND IN 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V OUT OUT
OUT
OUT
CK to Qn 25 MHz
See footnotes at end of device types 05 and 06.
99
MIL-M-38510/315D
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be H 2.0 V or L 0.7 V or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Subgroup Symbol MIL-STD-
883 Cases 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20
Measured
terminal Limits Unit
method Test no.
U/ D CK A B C D EP GND L
ET QD Q
C Q
B Q
A Ripple
carry VCC Min Max
10 tPLH5 See 157 CK TO QA 3 26 ns
Tc = +125°C fig. 7 158 CK TO QB “ “
" 159 CK TO QC " " "
" 160 CK TO QD " " "
t
PHL5 " 161 CK TO QA 36
" 162 CK TO QB
" 163 CK TO QC
" 164 CK TO QD
tPHL15 " 165 CK TO RC 40
tPLH12 " 166 CK TO RC 38
t
PLH5 " 167 CK TO QA 26 “
t
PHL5 " 168 CK TO QA 36
t
PLH5 " 169 CK TO QB 26
t
PHL5 " 170 CK TO QB 36
t
PLH5 " 171 CK TO QC 26
t
PHL5 " 172 CK TO QC 36
t
PLH5 " 173 CK TO QD 26
t
PHL5 " 174 CK TO QD 36
t
PHL7 " 175 ET to RC 32 “
t
PLH7 " 176 ET to RC 28 “
t
PHL11 " 177 U/ D to RC “ 37
t
PLH9 " 178 U/ D to RC “ 32
t
PHL7 " 179 ET to RC 32
t
PLH7 " 180 ET to RC 28
t
PHL11 " 181 U/ D to RC “ 37
t
PLH9 182 U/ D to RC “ 32
F
MAX183 CK to Qn 25 MHz
F
MAX184
Same conditions as for subgroup 9.
CK to Qn 25 MHz
11 Same tests, conditions and limits as for subgroup 10 except TC = -55°C and VCC = 4.5 for FMAX.
See footnotes at end of device types 05 and 06.
100
MIL-M-38510/315D
1/ C ase 2, pins no t refe re nce d are N/C .
2/ A ppl y one clock pulse prior to test as foll ows:
3 V ±.2 V
0 V ± .2 V
3/ IIL limits (µA) min/max values for circuits shown:
Circuits
Parameter
Terminals A B C D E F G
IIL12 A, B, C, D -160/-400 -0.5/-400
IIL13 U/ D , CK, L -160/-400 -135/-370
IIL14 EP 160/-400 -150/-385
IIL15 ET -140/-720 -280/-760
4/ Only a summary of attributes data is required.
5/ A = 3.0 V minimum; B = 0.0 V or GND.
6/ H > 1.5 V; L < 1.5 V; X = don’t care.
7/ Apply one clock pulse with “L” low prior to test.
8/ Apply three clock pulses prior to test.
9/ Apply one clock pulse with “A” low prior to test.
10/ On (QA, QB, QC, and QD) shall respond as specified in the truth table with the minimum
F
MAX frequency input to “CK”.
MIL-M-38510/315D
101
TABLE III. Group A inspection for device types 07 and 08.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Count
down Count
Up QC QD GND D C Load
Ripple
Carry Borrow Clear A VCC terminal Min Max
1 VOL 3007 1 4 mA GND 0.7 V 0.7 V 0.7 V 4.5 V QA 0.4 V
Tc = +25
°C
" 2 0.7 V 4 mA
"
QB " "
" 3
4 mA " 0.7 V " QC " "
" 4 4 mA " 0.7 V " " QD " "
5 2/ 0.7 V " 2.0 V 2/ 4 mA 2.0 V 4.5 V Ripple
carry "
6 0.7 V " 4 mA 2.0 V 4.5 V Borrow "
V
OH 3006 7 -0.4 mA
" 0.7 V 0.7 V 2.0 V " QA 2.5 "
" 8 2.0 V -0.4 mA
" " QB "
9 -0.4 mA
" 2.0 V " QC "
10 -0.4 mA
" 2.0 V " QD "
11 2.0 V " -0.4 mA " Ripple
Carry "
12 2.0 V " -0.4 mA
" Borrow “ "
V
IC 13 " -18 mA " A -1.5
14 -18 mA " " B " "
15 " -18 mA
" C
16 -18 mA D
17 -18 mA Load
18 -18 mA Clear
19 -18 mA
Count up
20 -18 mA
Count
down "
I
IL9 3009 21
GND GND 0.4 V 5.5 V A 3/ 3/ µA
22 0.4 V B “
23 0.4 V “ “ C “
24 0.4 V D “
IIL10 25 0.4 V Load “
I
IL11 26 0.4 V Clear “
“ 27 0.4 V Count up
“ 28 0.4 V Count
down
I
IH17 3010 29 5.5 V 5.5 V 2.7 V A 20
30 2.7 V B
31 2.7 V C
32 2.7 V D
33 2.7 V Load
34 2.7 V Clear
35 2.7 V Count up
36 2.7 V Count
down
I
IH1837 5.5 V 5.5 V 5.5 V A 100
38 5.5 V B
39 5.5 V C
40 5.5 V D
41 Load
42 5.5 V Clear
43 5.5 V Count up
44 5.5 V Count
down
See footnotes at end of device types 07 and 08.
MIL-M-38510/315D
102
TABLE III. Group A inspection for device types 07 and 08 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Count
down Count
Up QC QD GND D C Load
Ripple
Carry Borrow Clear A VCC terminal Min Max
1 IOS 3011 45 GND GND GND GND 5.5 V 5.5 V QA 4/ 4/ mA
Tc = +25
°C
" 46 5.5 V GND
" " " " QB " " "
" 47
GND " 5.5 V " " " QC " " "
" 48 GND " 5.5 V " " " QD " " "
49 5.5 V " GND " " Ripple
carry " “ "
50 5.5 V " GND " Borrow " “ "
I
CC 3005 51 " GND GND " VCC 34 "
2 Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.
3 Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
See footnot es at end of devi ce t ypes 07 and 08.
MIL-M-38510/315D
103
TABLE III. Group A inspection for device types 07 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method
Test no. B QB Q
A Count
down Count
Up QC QD GND D C Load
Ripple
Carry Borrow Clear A VCC terminal Min Max
7 Func- 3014 52 A 6/ L L A A L L GND A A A H H A A 4.5 V
Tc = +25
°C
tional " 53 " " L " A " " " " " " " " B 6/ " "
tests " 54 " " L " B " " " " " " " " " " "
5/ " 55 " " H " A " " " " " " " " " " "
56 " " H " B " " " " " " " " " " "
57 " H L " A " " " " " " " " " " "
58 " " L " B " " " " " " " " " " "
" 59 " " H " A " " " " " " " " " " "
60 " " H " B " " " " " " " " " " "
61 " L L " A H " " " " " " " " " "
62 " " L " B " " " " " " " " " " "
63 " " H " A " " " " " " " " " " "
" 64 " H " B " " " " " " " " " " "
" 65 " H L " A " " " " " " " " " " "
" 66 " " L " B " " " " " " " " " " "
" 67 " " H " A " " " " " " " " " " "
" 68 " " H " B " " " " " " " " " " "
" 69 " L L " A L H " " " " " " " " "
" 70 " " L " B " " " " " " " " " " "
" 71 " " H " A " " " " " " " " " " "
" 72 " " H " B " " " " " " L " " " "
73 " " L “ A " L " " " " H " " " "
74 " " L B " " L " " " " " L " " "
75 “ " H A " " H " " " " " H " " "
76 " " H B " " " " " " " " H " " "
“ 77 " " L A " " " " " " " " " " " " See 7/
“ 78 " " L B " " " " " " " " " " " "
79 " H H A " H L " " " " " " " " "
80 " " H B " " " " " " " " " " " "
81 " " L A " " " " " " " " " " " "
82 " " L B " " " " " " " " " " " "
83 " L H A " " " " " " " " " " " "
84 " " H B " " " " " " " " " " " "
85 " " L A " " " " " " " " " " " "
86 " " L B " " " " " " " " " " " "
87 " H H A " L " " " " " " " " " "
88 " " H B " " " " " " " " " " " "
89 " " L A " " " " " " " " " " " "
90 " " L B " " " " " " " " " " " "
91 " L H A " " " " " " " " " " " "
92 " " H B " " " " " " " " " " " "
93 “ " L A " " " " " " " " " " " "
94 " " L B " " " " " " " " L " " "
" 95 " " H A " " H " " " " " H " " "
" 96 " H H " " H H " " " B " " " " "
" 97 " L L " " L L " " " " " " A " "
" 98 " H H " " H H " " " " " " B " "
" 99 " H H " " H H " " " A " " B " "
100 " L L " " L L " " " " " " A " "
" 101 " L L L L " " " " " " B " "
See footnotes at end of device types 07 and 08.
104
MIL-M-38510/315D
TABLE III. Group A inspection for device types 07 – Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method
Test no. B QB Q
A Count
down Count
Up QC QD GND D C Load
Ripple
Carry Borrow Clear A VCC terminal Min Max
7 Func- 3014 102 A 6/ H H A A H H GND A A B 6/ H H B A 4.5 V
Tc = +25
°C
tional " 103 A " " " " " " " A A A " " " A "
tests " 104 B " " " " " " " B B A " " " B "
5/ " 105 " L L " " L L " " " B " " " " "
106 " " " B " " " " " " " " L " " "
107 " " " A " " " " " " " " H " " "
108 " " " " B " " " " " " " " " " " See 7/
" 109 " " " " A " " " " " " " " " " "
110 " " " " " " " " " " A " " " " "
111 " " " " " " " " " " " " " A " "
112 " " " B " " " " " " " " L " " "
113 " " " A " " " " " " " " H " " "
" 114 " " A B " " " " " " " " " " "
" 115 " " " A A " " " " " " " " " " "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 07 and 08.
105
MIL-M-38510/315D
TABLE III. Group A inspection for device types 08 – Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Count
down Count
Up QC QD GND D C Load
Ripple
Carry Borrow Clear A VCC terminal Min Max
7 Func- 3014 52 B 6/ L L A 6/ A L L GND B B B H H B B 4.5 V
Tc = +25
°C
tional " 53 " " L " “ " " " " " A " " “ B "
tests " 54 " " H " " " " " " " B " " " A "
5/ " 55 " " H " " " " " " " A " " " A "
56 A H L " " " " " " " B " " " B "
57 " " L " " " " " " " A " " " B "
58 " " H " " " " " " " B " " " A "
" 59 " " H " " " " " " " A " " " A "
60 B L L " " H " " " A B " " " B "
61 " " L " " " " " " " A " " " B "
62 " " H " " " " " " " B " " " A "
63 " " H " " " " " " " A " " " A "
" 64 A H L " " " " " " " B " " " B "
" 65 " " L " " " " " " " A " " " B "
" 66 " " H " " " " " " " B " " " A "
" 67 " " H " " " " " " " A " " " A "
" 68 B L L " " L H " A B B " " " B "
" 69 " " L " " " " " " " A " " " B "
" 70 " " H " " " " " " " B " " " A "
" 71 " " H " " " " " " " A " " " A "
" 72 A H L " " " " " " " B " " " B "
73 " " L " " " " " " " A " " " B "
74 " " H " " " " " " " B " " " A "
75 " H " " " " " " " A " " " A "
76 B L L " " H " " " A B " " " B "
“ 77 " " L " " " " " " " A " " " B " See 7/
“ 78 " " H " " " " " " " B " " " A "
79 " " H " " " " " " " A " " " A "
80 A H L " " " " " " " B " " " B "
81 " " L " " " " " " " A " " " B "
82 " " H " " " " " " " B " " " A "
83 " L L " " L L " " " B " " A " "
84 " " " " " " " " " " A " " A " "
85 " " " " " " " " " " " " " B " "
86 " " " B " " " " " " " " L " " "
87 " H H A " H H " " " " " H " " "
88 " " H B " " " " " " " " " " " "
89 " " L A " " " " " " " " " " " "
90 " " L B " " " " " " " " " " " "
91 " L H A " " " " " " " " " " " "
92 " " H B " " " " " " " " " " " "
93 “ " L A " " " " " " " " " " " "
94 " " L B " " " " " " " " " " " "
" 95 " H H A " L " " " " " " " " " "
" 96 " " H B " " " " " " " " " " " "
" 97 " " L A " " " " " " " " " " " "
" 98 " " L B " " " " " " " " " " " "
" 99 " L H A " " " " " " " " " " " "
100 " " H B " " " " " " " " " " " "
" 101 " " L A " " " " " " " " " " "
" 102 " " L B " " " " " " " " " " " "
" 103 " H H A " H L " " " " " " " " "
" 104 " " H B " " " " " " " " " " " "
" 105 " " L A " " " " " " " " " " " "
" 106 " " L B " " " " " " " " " " " "
" 107 " L H A " " " " " " " " " " " "
See footnotes at end of device types 07 and 08.
106
MIL-M-38510/315D
TABLE III. Group A inspection for device types 08 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Count
down Count
Up QC QD GND D C Load
Ripple
Carry Borrow Clear A VCC terminal Min Max
7 Func- 3014 108 A 6/ L H B 6/ A H L GND A A A H H B 8/ A 4.5 V
Tc = +25
°C
tional " 109 " " L A " " " " " " " " “ " "
tests " 110 " " L B " " " " " " " " " " " "
5/ " 111 " H H A " L " " " " " " " " " "
112 " " H B " " " " " " " " " " " "
113 " " L A " " " " " " " " " " " "
114 " " L B " " " " " " " " " " " "
" 115 " L H A " " " " " " " " " " " "
116 " " H B " " " " " " " " " " " "
117 " " L A " " " " " " " " " " " "
118 " " L " B " " " " " " " " " " "
119 " " H " A " " " " " " " " " " "
" 120 " " H " B " " " " " " " " " " "
" 121 " H L " A " " " " " " " " " " "
" 122 " " L " B " " " " " " " " " " "
" 123 " " H " A " " " " " " " " " " "
" 124 " " H " B " " " " " " " " " " "
" 125 " L L " A H " " " " " " " " " "
" 126 " " L " B " " " " " " " " " " "
" 127 " " H " A " " " " " " " " " " "
" 128 " " H " B " " " " " " " " " " "
129 " H L " A " " " " " " " " " " "
130 " " L " B " " " " " " " " " " "
131 “ " H " A " " " " " " " " " " "
132 " " H " B " " " " " " " " " " "
“ 133 " L L " A L H " " " " " " " " " See 7/
“ 134 " " L " B " " " " " " " " " " "
135 " " H " A " " " " " " " " " " "
136 " " H " B " " " " " " " " " " "
137 " H L " A " " " " " " " " " " "
138 " " L " B " " " " " " " " " " "
139 " " H " A " " " " " " " " " " "
140 " " H " B " " " " " " " " " " "
141 " L L " A H " " " " " " " " " "
142 " " L " B " " " " " " " " " " "
143 " " H " A " " " " " " " " " " "
144 " " H " B " " " " " " " " " " "
145 " H L " A " " " " " " " " " " "
146 " " L " B " " " " " " " " " " "
147 " " H " A " " " " " " " " " " "
148 " " H " B " " " " " " L " " " "
149 “ L L " A L L " " " " H " " " "
150 " " " " A " " " " " " " " A " "
" 151 " " " " B " " " " " " " " " " "
" 152 " " " " A " " " " " " " " " " "
" 153 " " " B " " " " " " " " L " " "
" 154 " " " A " " " " " " " " H " " "
" 155 " " " " " " " " " " " " " B " "
156 " H H " " H H " " " B " " " " "
" 157 " " " " B " " " " " " L " " " "
" 158 " " " " A " " " " " " H " " " "
" 159 " " " B A " " " " " " " " " " "
" 160 " " " A A " " " " " " " " " " "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 07 and 08.
107
MIL-M-38510/315D
TABLE III. Group A inspection for device types 07 and 08 – Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.7 V; or open).
Cases
E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Case 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured Unit
(Device
type)
MIL-STD-
883
method
07 08
B QB Q
A Count
down Count
up QC QD GND D C Load Ripple
carry
Borrow
Clear A VCC terminal Min Max
9
Tc = +25°C
FMAX
8/ 3003
9/ 116 161
OUT 5.0 V IN GND 5.0 V GND 5.0 V Count up to QA 22 MHz
F
MAX
8/ " 117 162
OUT IN 5.0 V " 5.0 V GND " Count down to QA 22 MHz
t
PLH8 " 118 163
OUT " IN GND 5.0 V " Load to QA 3 45 ns
" 119 164
5.0 V OUT " " Load to QB " “ "
120 165
OUT " 5.0 V " Load to QC “ “ "
121 166
OUT " 5.0 V “ “ " Load to QD " " "
t
PHL10 " 122 167
OUT " GND GND " Load to QA " “ "
123 168
GND OUT " " Load to QB “ “ "
124 169
OUT " GND
" Load to QC"
125 170
OUT
" GND
Load to QD “ “
t
PLH9126 171
OUT 5.0 V IN " 5.0 V " Count up to QA " 43 "
127 172
OUT " " Count up to QB " “ "
128 173
OUT " " Count up to QC " “ “
129 174
OUT " " Count up to QD " “ "
130 175
IN 5.0 V OUT " " Count down to QD " “ "
131 176
“ “ OUT " " Count down to QC " “ "
132 177
OUT " " Count down to QB " "
133 178
OUT " " Count down to QA " "
t
PHL11134 179
OUT 5.0 V IN Count up to QA52 "
" 135 180
OUT Count up to QB"
" 136 181
OUT
Count up to QC
" 137 182
“ “ OUT Count up to QD
" 138 183
IN 5.0 V OUT
Count down to QD
139 184
“ “ OUT Count down to QC
140 185
OUT
“ “ Count down to QB
141 186
OUT
Count down to QA
t
PHL12142 187
OUT
10/ IN 5.0 V Clear to QA40
143 188
5.0 V OUT Clear to QB
144 189
OUT 5.0 V Clear to QC
145 190
OUT " 5.0 V
Clear to QD
See footnotes at end of device types 07 and 08.
MIL-M-38510/315D
108
TABLE III. Group A inspection for device types 07 and 08 – Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.7 V; or open).
Cases
E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Case 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured Unit
(Device
type)
MIL-STD-
883
method
07 08
B QB Q
A Count
down Count
up QC QD GND D C Load Ripple
carry
Borrow
Clear A VCC terminal Min Max
9
Tc = +25°C
FMAX
8/ 3003
9/ 146 191
Count up to QA 22 MHz
F
MAX
8/ " 147 192
Count down to QA 22 MHz
t
PLH8 " 148 193
Load to QA 3 63 ns
" 149 194
Load to QB " “ "
150 195
Load to QC “ “ "
151 196
Load to QD " " "
t
PHL10 " 152 197
Load to QA " “ "
153 198
Load to QB “ “ "
154 199
Load to QC"
155 200
Load to QD “ “
t
PLH9156 201
Count up to QA " 60 "
157 202
Count up to QB " “ "
158 203
Count up to QC " “ “
159 204
Count up to QD " “ "
160 205
Count down to QD " “ "
161 206
Count down to QC " “ "
162 207
Count down to QB " "
163 208
Count down to QA " "
t
PHL11164 209
Count up to QA73 "
" 165 210
Count up to QB"
" 166 211
Count up to QC
" 167 212
Count up to QD
" 168 213
Count down to QD
169 214
Count down to QC
170 215
Count down to QB
171 216
Count down to QA
t
PHL12172 217
Clear to QA56
173 218
Clear to QB
174 219
Clear to QC
175 220
Same terminal conditions as for subgroup 9.
Clear to QD
11 Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C.
See footnotes at end of device types 07 and 08.
MIL-M-38510/315D
109
1/ C ase 2, pins no t refe re nce d are N/C .
2/ Apply 0.7 V for device type 07; apply 2.0 V for device type 08.
3/ IIL limits (µA) min/max values for circuits shown:
Circuits
A B C D E F G
Parameter
Terminals
-160/-400 -160/-400 -160/-400 -100/-340 -100/-340 -120/-360 -135/-370
IIL9 A “
B
C
D
IIL10 Load -100/-340 “ -150/-380 -120/-360 -120/-360 “ -100/-340
Clear -160/-400 “ -150/-380 -135/-370
Count up
IIL11
Count down
4/ IOS limits (mA) min/max values for circuits shown: -15/-100 for circuits A, C, D, E, F, and G and –15/-110 for circuit B.
5/ Only a summary of attributes data is required.
6/ A = 3.0 V minimum; B = 0.0 V or GND.
7/ H > 1.5 V; L < 1.5 V; X = don’t care.
8/ FMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
9/ See figure 8 for device type 07 and figure 9 for device type 08.
10/ Apply momentary GND, then 4.5 V minimum prior to input pulses. Maintain 4.5 V minimum for measurement.
MIL-M-38510/315D
110
TABLE III. Group A inspection for device types 09 and 13 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured Unit
MIL-STD-
883
method Test no. B QB Q
A Enable
G Down/
up QC QD GND D C Load Max/
Min
Ripple
carry Clock A VCC terminal Min Max
1 VOL 3007 1 0.7 V 4 mA GND 0.7 V 4.5 V QB 0.4 V
Tc = +25
°C
" 2 4 mA
"
0.7 V QA " "
" 3
4 mA " 0.7 V " QC " "
" 4 4 mA " 0.7 V " QD " "
5 2.0 V 2.0 V " 4 mA Max/Min "
6 2/ 0.7 V 0.7 V " 2.0 V 2/ 4 mA 0.7 V 2.0 V Ripple carry
“ "
V
OH 3006 7 2.0 V -0.4 mA
" " QB 2.5 V "
" 8 -0.4 mA
" 2.0 V " QA "
9 -0.4 mA
" 2.0 V " QC "
10 -0.4 mA
" 2.0 V " QD "
11 0.7 V 2.0 V " 0.7 V 0.7 V -0.4 mA 0.7 V " Max/Min "
12 2.0 V " -0.4 mA
" Ripple carry
"
V
IC 13 -18 mA " " B -1.5 V
14 -18 mA
" " Enable G " "
15 -18 mA
" " Down/up
16 -18 mA D
17 -18 mA
C
18 -18 mA Load
19 -18 mA Clock
20
-18 mA A "
I
IL7 3009 21 0.4 V 5.5 V 5.5 V Enable G 3/ 3/ µA
I
IL8 22 0.4 V GND B “
23 0.4 V Down/up “
24 0.4 V D “
25 0.4 V C “
26 0.4 V Load “
“ 27 0.4 V Clock “
“ 28 GND 0.4 V A “
I
IH15 3010 29 2.7 V Enable G 60
I
IH1630 5.5 V Enable G 300
I
IH1731 2.7 V 5.5 V B 20
32 2.7 V Down/up
33 2.7 V 5.5 V D
34 2.7 V 5.5 V C
35 2.7 V Load
36 2.7 V Clock “
37 5.5 V 2.7 V A
See footnotes at end of device types 09 and 13.
MIL-M-38510/315D
111
TABLE III. Group A inspection for device types 09 and 13 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured Unit
MIL-STD-
883
method
Test no. B QB Q
A Enable
G Down/
Up QC QD GND D C Load Max/
Min
Ripple
Carry Clock A VCC terminal Min Max
1 IIH18 3010 38 5.5 V GND 5.5 V 5.5 V B 100 µA
Tc = +25
°C
" 39
5.5 V " " Down/up "
" 40
" 5.5 V 5.5 V " D " "
" 41 " 5.5 V " " C " "
42 " " Load "
43 " 5.5 V " Clock "
44 5.5 V 5.5 V A
I
OS 3011 45 5.5 V GND GND QB 4/ 4/ mA
46 GND 5.5 V QA
47 GND 5.5 V QC
48 GND 5.5 V QD
49 GND 5.5 V GND GND GND GND Max/Min
50 5.5 V GND Ripple carry
“ “
I
CC 3005 51 GND GND GND " GND GND GND GND GND " VCC 35 "
2 Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.
3 Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
See footnotes at end of device types 09 and 13.
MIL-M-38510/315D
112
TABLE III. Group A inspection for device types 09 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Enable
G Down/
up QC QD GND D C Load Max/Min Ripple
Carry Clock A VCC terminal Min Max
7 Func- 3014 52 A 6/ H H B 6/ B H H GND A A B H H A A 4.5 V
Tc = +25°C tional " 53 " " “ A “ " " " " " B " " “ “ "
tests " 54 " " “ " " " " " " " A " " " "
5/ " 55 B " “ " " " " " B B " " B B "
56 B " " " " " " " " " " " " A " "
57 B " " B " " " " " " " " " A " "
58 A " " " " " " " A A " " L B A "
" 59 " L L " " L L " " " " L H A " "
60 " " L " " " " " " " " " " B " "
61 " " H " " " " " " " " " " A B "
62 " " H " " " " " " " " " " B " "
63 B H L " " " " " B B " " " A " "
" 64 A " L " " " " " A A " " " B A "
" 65 " " H " " " " " " A " " " A A "
" 66 " " H " " " " " " B " " " B B "
" 67 " L L " " H " " " " " " " A B "
" 68 " " L " " " " " B " " " " B A "
" 69 " " H " " " " " A A " " " A B "
" 70 " " H " " " " " " B " " " B B "
" 71 " H L " " " " " " A " " " A A "
" 72 " " L " " " " " B " " " " B B "
73 " " H " " " " " B " " " " A A "
74 B " H " " " " " A B " " " B B "
75 B L L " " L H " A B " " " A B "
76 A " L " " " " " B A " " " B A "
“ 77 " " H " " " " " " " " " " A A " See 7/
“ 78 " " H " " " " " " " " " " B B "
79 B H L " " " " " A B " " " A A "
80 " " L " " " " " " B " " " B " "
81 " " H " " " " " " A " " " A " "
82 " " H " " " " " " A " " " B B "
83 " L L " " H " " " B " " " A " "
84 " " L " " " " " B B " " " B " "
85 A " H " " " " " A A " " " A A "
86 B " H " " " " " B B " " " B B "
87 A H L " " " " " A A " " " A A "
88 B " L " " " " " B B " " " B " "
89 A " H " " " " " A A " H " A " "
90 B " H " " " " " B B " H L B B "
91 A L L " " L L " A A " L H A A "
92 B " " " A " " " B B " H " " B "
93 A " " A " " " " A A " " " " A "
94 B " " " " " " " B B " " " B B "
" 95 A " " " " " " " B A " " " A " "
" 96 B " " B " " " " A B " " " A " "
" 97 A " " " " " " " " B " " L B " "
" 98 A H H " " H H " " A " L H A A "
" 99 B " H " " " " " B B " " " B B "
100 B " L " " " " " B B " " " A B "
" 101 A " L " “ " " " A A " " " B A "
See footnotes at end of device types 09 and 13.
MIL-M-38510/315D
113
TABLE III. Group A inspection for device types 09 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Enable
G Down/
up QC QD GND D C Load Max/Min Ripple
Carry Clock A VCC terminal Min Max
7 Func- 3014 102 A 6/ L H B 6/ A H H GND B A A L H A B 4.5 V
Tc = +25°C tional " 103 B " H " “ " " " A A " " " B B "
tests " 104 A " L " " " " " B B " " " A A "
5/ " 105 A " L " " " " " B B " " " B A "
106 A H H " " L " " A A " " " A B "
107 B " H " " " " " A B " " " B A "
108 B " L " " " " " B A " " " A A "
" 109 A L " " " " " A B " " " B A "
110 A L H " " " " " B A " " " A B "
111 A " H " " " " " B A " " " B B "
112 B " L " " " " " A B " " " A A "
113 B " L " " " " " B B " " " B A "
" 114 B H H " " H L " B B " " " A B "
" 115 A " H " " " " " A A " " " B A "
" 116 B " L " " " " " B B " " " A B "
" 117 A " L " " " " " A A " " " B B "
" 118 B L H " " " " " B B " " " A A "
" 119 A " H " " " " " A A " " " B B "
" 120 A " L " " " " " B B " " " A A "
" 121 A " L " " " " " B B " " " B " "
" 122 B H H " " L " " B A " " " A " "
123 B " H " " " " " A A " " " B " "
124 B " L " " " " " B B " " " A " "
125 A " L " " " " " B B " " " B B "
126 A L H " " " " " A B " " " A A "
“ 127 A " H " " " " " A A " " " B A " See 7/
“ 128 B " L " " " " " B B " H " A B "
129 A " L " " " " " A A " H L B A "
130 B H H " " H H " B B " L H A B "
131 A " " " " " " " A A B L H A A "
132 " " " B " " " " " " H L B " "
133 " " " " " " " " " " " " H A " "
134 " " " A " " " " " " " " " B " "
135 B L L " " L L " B B " L " " B "
136 B L H " " H L " B A " " " " A "
137 A H L " " L H " A B " " " " B "
138 B L H " A H L " B A " " " " A "
139 A H L B " L H " A B " " " " B "
140 B L H " " H L " B A " " " " A "
141 A H L " " L H " A B " " " A B "
142 A " " " " " " " A B A " " " B "
143 B " " " " " " " B A " " " " A "
144 " " " " B " " " " " " " " " " "
" 145 " " " A " " " " " " " " " " " "
" 146 " " " B " " " " " " " " " " " "
" 147 " " " " A " " " " " " " " " " "
" 148 " " " " " " " " " " " " " " B "
" 149 A " " " " " " " " " " " " " A "
150 " " " " " H L " " " B " " B B "
" 151 " " " " " H L " " " A " " B B "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 09 and 13.
MIL-M-38510/315D
114
TABLE III. Group A inspection for device types 13 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Enable
G Down/
up QC QD GND D C Load Max/Min Ripple
carry Clock A VCC terminal Min Max
7 Func- 3014 52 B 6/ L H A 6/ B L H GND A B B 6/ H H B A 4.5 V
Tc = +25°C tional " 53 " " “ “ " " " " " A " " B “ "
tests " 54 " " " " " " " " " " " A "
5/ " 55 “ " “ B " " " " " " A "
56 " " " " " " " " " " " L B " "
57 " L " " L " " " " L H A " "
58 A " L " " " " " A " " B "
" 59 A H " " “ " " " " A " "
60 B " H " " " " " " " " " " B B "
61 B H L " " " " " B B " " " A B "
62 A " L " " " " " A A " " " B A "
63 B H " " " " " B " " " A " "
" 64 " H " " " " " B " " " B "
" 65 " L L " " H " " " A " " " A B "
" 66 A " L " " " " " " A " " " B "
" 67 B H " " “ " " B B " " " A "
" 68 A " H " " " " " A " " " B "
" 69 " H L " " " " " B " " " A "
" 70 " " L " " " " " " B " " " B "
" 71 " H " " " " " A A " " " A A "
" 72 B " H " " " " " B B " " " B B "
73 A L L " " L H " A A " " " A A "
74 A " L " " " " " A A " " B A "
75 B H " " “ “ " B B " H " A B "
76 B " H " " " " " " H L B "
“ 77 B " L " " " L " " " " L H A " See 7/
“ 78 A " L " " " " " A A " " " B A "
79 B H " " " " " A B " " " A A "
80 A " A A " " " B A " " " B B "
81 A " " " " " " B A " " " A B "
82 B " " " " " " A B " " " B A "
83 " " " " " " B " " " A A "
84 " " B " " " " A " " " B B "
85 " L " " " " " A " H " A "
86 " L " " " " " B B " H L B "
87 A H " " " H " " L H A A "
88 “ " H " " " " " " L H B "
89 “ " L " " " " " " A " "
90 “ " L " " " " " A A " B "
91 “ H H " " H L " " A "
92 “ " H " " " " " " " " " " B B "
93 " " L " " " " " " " " " " A " "
94 " " L " " " " " B B " " " B " "
" 95 " L H " " " " " " B " " " A " "
" 96 B " H " " " " " " A " " " B A "
" 97 B " L " " " " " " " " " " A B "
" 98 A " L " " " " " A " " " " B B "
" 99 " H H " " L " " " " " " " A A "
100 " " H " " " " " " " " " " B " "
" 101 " " L " " " " " " " " " A " "
See footnotes at end of device types 09 and 13.
MIL-M-38510/315D
115
TABLE III. Group A inspection for device types 13 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Cases1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
Unit
MIL-STD-
883
method Test no. B QB Q
A Enable
G Down/
up QC QD GND D C Load Max/Min Ripple
Carry Clock A VCC terminal Min Max
7 Func- 3014 102 B 6/ H L B 6/ A 6/ L L GND B B 6/ A L H B B 4.5 V
Tc = +25°C tional " 103 " L H " “ " " " " " " " " A B "
tests " 104 " " H " " " " " " " " " " B A "
5/ " 105 " " L " " " " " " " " H " A A "
106 A " L A " " " " A A " " " A B "
107 A " " " " " " " A A " " " B " "
108 B " " " " " " " B B " " " A " "
" 109 " " B " " " " " " " " " A " "
110 " " " " " " " " " " " " L B " "
111 A " H " " " H " A A " L H A A "
112 " " H " " " " " " " " " " B B "
113 " " L " " " " " " " " " " A A "
" 114 B " H " " " " " " B B " " " " "
" 115 " " " " " " " " " " A " " " " "
" 116 " " " " " " " " B " " " " " B "
" 117 " " " A " " " " " " " " " " " "
" 118 " " " " " " " " " " " " " B " "
" 119 " " " " " " " " " " " " " A " "
" 120 " " " " B " " " " " " H " A " "
" 121 " " " " " " " " " " " " " B " "
" 122 " " " " " " " " " " " " " A " "
123 A " " B " " " " A A " " " A A "
124 " " " " " " " " " " " " L B " "
125 " " L " " L L " " " " L H A " "
126 B " H " " H " " B " B " " A " "
“ 127 " " " " " " " " " " " " " B " " See 7/
“ 128 " " " " " " " " " " " " " A " "
129 " " " " " " " " " " A " " " " "
130 A " " " " " " " A B " " " " B "
131 A " " " " " " " " " " " " B " "
132 B " L " " L H " " " B " " B " "
133 " " " " " " " " " " B " " A " "
134 " " " A A " " " " " A " " A " "
135 " " " " " " " " B A " " " B A "
136 " " " " " " " " B A " " " A " "
137 " " H " " " " " A B B " " " " "
138 A H L " " H L " B A " " " " B "
139 A H H " " H " " " A " " " " A "
140 B L L " B L " " " B " " " " B "
141 B " " B " " " " " B A " " " B "
142 A " " " " " " " A A " " " " A "
143 " " " " A " " " " " " H " " " "
144 " " " " " " " " " " " H L B " "
" 145 " " H " " " H " B " " L H A B "
" 146 " " " " B " " " B " " H H A B "
" 147 " " " " " " " " A " " H L B A "
" 148 " " L " " " L " " " " L H A " "
" 149 " H H " " H H " " " B H H A " "
8 Repeat subgroup 7 at TC = +125 and TC = -55°C.
See footnotes at end of device types 09 and 13.
116
MIL-M-38510/315D
TABLE III. Group A inspection for device types 09 and 13 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases
E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Case 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
terminal Unit
(Device
type)
MIL-STD-
883
method
09 13
B QB Q
A Enable
G Down/
up QC QD GND D C Load Max/Min
Ripple
carry Clock A VCC Min Max
9
Tc = +25°C
FMAX
8/ 3003
9/ 152 150
OUT GND GND GND 5.0 V IN 5 . 0 V Ck to QA 18 MHz
t
PLH10 " 153 151
OUT " IN GND 5.0 V " Load to QA 3 38 ns
" 154 152
5.0 V OUT " " Load to QB " “ "
155 153
OUT " 5.0 V " Load to QC “ “ "
156 154
OUT " 5.0 V " Load to QD " " "
t
PHL13 " 157 155
OUT " GND " Load to QA " 55 "
158 156
GND OUT " " Load to QB “ “ "
159 157
OUT " GND
" Load to QC"
160 158
OUT
" GND
Load to QD “ “
t
PLH11161 159
OUT GND GND " 5.0 V IN " Ck to QA " 29 "
162 160
OUT " " Ck to QB " “ "
163 161
OUT " " Ck to QC " “ “
164 162
OUT " " Ck to QD " “ "
t
PHL14165 163
OUT “ " " Ck to QA " 41 "
166 164
OUT " " Ck to QB " “ "
167 165
OUT " " Ck to QC " "
168 166
OUT " " Ck to QD " "
t
PLH12169 167
OUT Ck to Max/Min 47 "
t
PHL15 " 170 168
OUT Ck to Max/Min 57 "
See footnotes at end of device types 09 and 13.
MIL-M-38510/315D
117
TABLE III. Group A inspection for device types 09 and 13 – Continued.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases
E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Limits
Subgroup Symbol
Case 1/
2 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Measured
terminal Unit
(Device
type)
MIL-STD-
883
method
09 13
B QB Q
A Enable
G Down/
up QC QD GND D C Load Max/Min Ripple
carry Clock A VCC Min Max
10
Tc = +125°C
FMAX
8/ 3003
9/ 171 169
Ck to QA 18 MHz
t
PLH10 " 172 170
Load to QA 3 53 ns
" 173 171
Load to QB “ “
" 174 172
Load to QC " “ "
175 173
Load to QD “ “ "
t
PHL13 " 176 174
Load to QA " 77 "
177 175
Load to QB “ “ "
178 176
Load to QC"
179 177
Load to QD “ “
t
PLH11180 178
Ck to QA " 41 "
181 179
Ck to QB " “ "
182 180
Ck to QC " “ “
183 181
Ck to QD " “ "
t
PHL14184 182
Ck to QA " 57 "
185 183
Ck to QB " “ "
186 184
Ck to QC " "
187 185
Ck to QD " "
t
PLH12188 186
Ck to Max/Min 66 "
t
PHL15 " 189 187
Same terminal conditions as for subgroup 9.
Count up to QB80 "
11 Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C.
See footnot es at end of devi ce t ypes 09 and 13.
MIL-M-38510/315D
118
1/ C ase 2, pins no t refe re nce d are N/C .
2/ Apply 2.0 for device type 09; apply 0.7 V for device type 13.
3/ IIL limits (µA) min/max values for circuits shown:
Circuits
Parameter
Terminals A B C D E F G
IIL7 Enable G -360/-1080 -160/-400 -360/-1080
-360/-1080
-360/-1080
-360/-1080
-360/-1080
IIL8 A, B, C, D -130/-400 -160/-400 -160/-400 -160/-400 -120/-360 -120/-360 -120/-360
Down/up -150/-380
Clock
Load -100/-340 “ “ -100/-340 “ “ “
4/ IOS limits (mA) min/max values for circuits shown: -15/-100 for circuits A, C, D, E, F, and G and –15/-110 for circuit B.
5/ Only a summary of attributes data is required.
6/ A = 3.0 V minimum; B = 0.0 V or GND.
7/ H > 1.5 V; L < 1.5 V; X = don’t care.
8/ FMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
9/ See figure 10 for device type 09 and figure 12 for device type 13.
MIL-M-38510/315D
119
TABLE III. Group A inspection for device types 10.
Terminal conditions (pins not designated may be H 2.0 V; or L 0.7 V; or open).
Cases
A, B, C, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Limits
Subgroup Symbol
Cases1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20 Measured
terminal Unit
MIL-STD-
883
method
Test no. B NC NC NC VCC RO(1) RO(2) QD Q
C GND QB Q
A NC A Min Max
1 VOL 3007 1 GND 4.5 V 2.0 V 2.0 V GND 4 mA 2.0 V QA 0.4 V
Tc = +25°C " 2 2.0 V
“ “ “ 4 mA +IIL3
(max) GND QB " "
" 3 “ “ “ “ QC " "
" 4 “ “ “ 4 mA QD " "
V
OH 3006 5 GND 2/ 2/ -0.4 mA 2/ 3/ QA 2.5 "
" 6 2/ 3/
-0.4 mA
GND QB "
7 2/ 4/ -0.4 mA “ QC "
8 2/ 5/ -0.4 mA
“ QD "
V
IC 9 -18 mA A -1.5
10 -18 mA B " "
11 -18 mA
RO(1)
12 -18 mA
RO(2)
I
IL1 3009 13 5.5 V 0.4 V 5.5 V RO(1) 6/ 6/ mA
14 5.5 V 0.4 V RO(2) “
I
IL215 2/ 2/ 0.4 V A
I
IL3 16 0.4 V “ “ “ B "
I
IH1 3010 17 2.7 V GND RO(1) 20
µA
I
IH1 18 GND 2.7 V RO(2) 20
I
IH2 19 5.5 V GND RO(1) 100
I
IH2 20 GND 5.5 V RO(2) 100
I
IH3 21 5.5 V 5.5 V 2.7 V A 80
I
IH4 22 “ “ “ 5.5 V A 400
I
IH5 23 2.7 V “ “ “ B 13/ 80
I
IH6 24 5.5 V “ “ “ B 400
I
OS 3011 25 GND 2/ 2/ GND 2/ 3/ QA 7/ 7/ mA
26 2/ 3/
“ “ “ GND GND QB
27 2/ 4/ GND “ QC
28 2/ 5/ GND “ QD
I
CC 3005 29 GND VCC 15
2 Same tests, terminal conditions, and limits as for subgroup 1, except TC = +125°C and VIC tests are omitted.
3 Same tests, terminal conditions, and limits as for subgroup 1, except TC = -55°C and VIC tests are omitted.
See footnotes at end of device type 10.
MIL-M-38510/315D
120
TABLE III. Group A inspection for device type 10– Continued.
Terminal conditions (pins not designated may be high 2.0 V; or low 0.7 V; or open).
Cases E
A, B, C, D 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Limits
Subgroup Symbol
Cases1/
2 2 3 4 6 8 9 10 12 13 14 16 18 19 20 Measured
Unit
MIL-STD-
883
method
Test no. B NC NC NC VCC RO(1) RO(2) QD Q
C GND QB Q
A NC A
terminal Min Max
7 Func- 3014 30 B 9/ 4.5 V A 9/ A 9/ L L GND L L B 9/
Tc = +25°C Tional " 31 A " " " " " " " "
tests " 32 B " " " " " " " " "
8/ " 33 B " B " " " " " "
34 A " " " " " " "
35 B " " " " H " "
36 B " A " " L " "
" 37 B " " X " " " " " "
38 A " " B " " " " " "
39 B " " " H "
40 A " " " " " " H " "
41 B " " " " H " L " "
" 42 A " " " " H " "
" 43 B " " " H L " " "
" 44 A " " " " " " " "
" 45 B " " " " " " H " "
" 46 A " " " " " " H " "
" 47 B " " " " H " L " "
" 48 B " A L L " " "
" 49 B " B " " " " " " "
" 50 A " " " " " " " " "
51 B " " " " H " "
52 A " " " " " " H " "
53 B " " H " L "
54 A " " " H " " "
“ 55 B " " " H L " " " " See 10/
“ 56 A " " " " " " " " "
57 B " " " " " " H " "
58 A " " " " H " "
59 B " " " " H " L " "
60 A " " H " " "
61 B " " " L L " " "
62 " " " " " " " A
63 " " " " " H B
64 " " " " " H A
65 " " " " " L B
8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125°C and -55°C.
9
Tc = +25°C FMAX 3003 66 5.0 V GND
GND OUT IN 12/
A to QA 29 MHz
tPLH1 (Fig 11)
67 11/ A 9/ OUT IN A to QC 3 53 ns
t
PHL1 68
" GND OUT IN A to QC 58
t
PLH2 69 IN " 11/ A 9/ OUT B to QD 37
t
PHL2 70 IN GND OUT " B to QD 50
10
Tc = +125°C
FMAX 71 " GND " OUT IN 12/
A to QA 29 MHz
t
PLH1 " 72 " 11/ A 9/ OUT " IN A to QC 3 74 ns
t
PHL1 " 73 GND OUT " IN A to QC 81
t
PLH2 " 74 IN " 11/ A 9/ OUT " B to QD “ 52
t
PHL2 " 75 IN " GND OUT " B to QD 56
11 Same tests, terminal conditions, and limits as for subgroup 10, except TC = -55°C.
See footnotes at end of device type 10.
MIL-M-38510/315D
121
1
/ Case 2, pins no t refe re nce d are N/C .
2
/ Apply 4.5 volts pulse, then ground prior to taking measurements to set device in the desired
state. Maintain ground for measurement.
3
/ Input pulse must be applied one time after RO pulse.
4
/ Input pulse must be applied twice after RO pulse.
5
/ Inp ut pulse must be ap plied four tim es afte r RO pulse.
6
/ IIL limits (mA) min/max values for circuits shown:
Circuits
Parameter
Terminals A B C D E F G
IIL1 RO(1)
RO(2) -.12/-.36
-.03/-.40
-.03/-.40
-.03/-.40
-.12/-.36
IIL2 A -0.5/-2.0 -1.0/-2.4 -1.0/-2.4 -1.0/-2.4 -0.5/-2.0
IIL3 B -0.7/-3.2 -0.7/-3.2 -0.7/-3.2 -0.4/-1.6 -0.7/-3.2
7
/ IOS limits (mA) min/max values for circuits shown:
Circuits
Parameter
Measured
terminals
A B C D E F G
IOS QA, QB,
QC, QD -15/-100
-15/-100 -30/-130
-15/-100
-15/-100
8
/ Only a summary of attributes data is required.
9
/ A = 3.0 V minimum; B = 0.0 V or GND.
10/ H > 1.5 V; L < 1.5 V; X = don’t care.
11/ Momentary 3.0 V (min), then ground. Maintain ground for measurement.
12/ FMAX min limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
13/ The minimum limit for circuit F shall be –150 µA.
MIL-M-38510/315D
122
MIL-M-38510/315D
123
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD or in-house contractor
personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements.
Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service
or Defense Agency, or within the military service's system command. Packaging data retrieval is available from the
managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting
the responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature which may be helpful, but is not
mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a. Title, number, and date of the specification.
b. PIN and compliance identifier, if applicable (see 1.2).
c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d. Requirements for certificate of compliance, if applicable.
e. Requirements for notification of change of product or process to contracting activity in addition to
notification to the qualifying activity, if applicable.
f. Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883),
corrective action, and reporting of results, if applicable.
g. Requirements for product assurance options.
h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements shall
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
I Requirements for "JAN" marking.
j. Packaging Requirements (see 5.1)
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-
38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government test ed for quali fic ation in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qualification of products may be obtained from
DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
MIL-M-38510/315D
124
6.5 Abbreviations, symbols, and definitions. The abbrev iatio ns, sy mbo ls, and defi nitions used herein are defined
in MIL-PRF-38535, MIL-HDBK-1331, and as follows:
GND ........................................... Ground zero voltage potential
I
IN ................................................ Current flowing into an input terminal
V
IC ............................................... Input clamp voltage
V
IN ............................................... Voltage level at an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.4). Longer length leads and lead forming should not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational perfor man ce chara cter istics across mil itary tempera ture
ranges or reliability factors equivalent to MIL-M-38510 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as permitting substitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
Military device Generic-industry
type____ type_____
01 54LS90
02 54LS93
03 54LS160
04 54LS161
05 54LS168
06 54LS169
07 54LS192
08 54LS193
09 54LS191
10 54LS92
11 54LS162
12 54LS163
13 54LS190
MIL-M-38510/315D
125
6.8 Manufacturers’ designation. Manufacturers’ circuits which form a part of this specification are designated
with an “X” as shown in table IV herein.
TABLE IV. Manufacturers’ designation.
Circuit
A B G C E F D
Manufacturer
Device
type
Commercial
Type
Texas
Instruments,
Incorporated
Signetics
Corp. National
Semi-
Conductor
Corp.
Raytheon
Company Fairchild
Semi-
conductor
Motorola,
Inc. Advanced
Micro
Devices
Inc.
01
54LS90 X X X X X
02
54LS93 X X X X X X
03
54LS160A X X X X X X X
04
54LS161A X X X X X X X
05
54LS168
X X
06
54LS169A X X
07
54LS192 X X X X X X X
08
54LS193 X X X X X X X
09
54LS191 X X X X X X X
10
54LS92 X X X X
11
54LS162A X X X X X X X
12
54LS163A X X X X X X X
13
54LS190 X X X X X X X
6.9 Change from previous issue. Asterisks are not used in this revision to identify changes with respect to the
previous issue, due to the extensiveness of the changes.
MIL-M-38510/315D
126
Custodians: Preparing activity:
Army - CR DLA - CC
Navy - EC
Air Force - 11
DLA - CC
Review activities: (Project 5962-1996)
Army – SM, MI
Navy - AS, CG, MC, SH TD
Air Force – 03, 19, 99