Compact, Precision
Ten Degrees of Freedom Inertial Sensor
Data Sheet
ADIS16448
FEATURES
Triaxial digital gyroscope with digital range scaling
±250°/sec, ±500°/sec, ±1000°/sec settings
Axis-to-axis alignment, <0.05°
Triaxial digital accelerometer, ±18 g minimum
Triaxial digital magnetometer, ±1.9 gauss minimum
Digital barometer, 10 mbar to 1200 mbar
Calibrated pressure range: 300 mbar to 1100 mbar
Autonomous operation and data collection
No external configuration commands required
205 ms start-up time
Factory calibrated sensitivity, bias, and axial alignment
Calibration temperature range: −40°C to +85°C
SPI-compatible serial interface
Burst mode read sequence with optional CRC-16
Embedded temperature sensor
Programmable operation and control
Automatic and manual bias correction controls
Bartlett window FIR length, number of taps
Digital I/O: data ready, alarm indicator, general-purpose
Alarms for condition monitoring
Enable external sample clock input up to 1.1 kHz
Single command self test
Single-supply operation: 3.15 V to 3.45 V
2000 g shock survivability
Operating temperature range: −40°C to +105°C
APPLICATIONS
Platform stabilization and control
Navigation
Robotics
GENERAL DESCRIPTION
The ADIS16448 iSensor® device is a complete inertial system
that includes a triaxial gyroscope, a triaxial accelerometer, a
triaxial magnetometer, and pressure sensors. Each sensor in
the ADIS16448 combines industry-leading iMEMS® technology
with signal conditioning that optimizes dynamic performance.
The factory calibration characterizes each sensor for sensitivity,
bias, and alignment. As a result, each sensor has its own dynamic
compensation formulas that provide accurate sensor
measurements.
The ADIS16448 provides a simple, cost-effective method for
integrating accurate, multiaxis inertial sensing into industrial
systems, especially when compared with the complexity and
investment associated with discrete designs. All necessary motion
testing and calibration are part of the production process at the
factory, greatly reducing system integration time. Tight orthogonal
alignment simplifies inertial frame alignment in navigation systems.
The SPI and register structures provide a simple interface for
data collection and configuration control.
The ADIS16448 has a compatible pinout for systems that currently
use other Analog Devices, Inc., IMU products, such as
ADIS16334 or ADIS16485. The ADIS16448 is packaged in a
module that is approximately 24.1 mm × 37.7 mm × 10.8 mm
and has a standard connector interface.
FUNCTIONAL BLOCK DIAGRAM
CONTROLLLER
CLOCK
TRIAXIAL
GYRO
TRIAXIAL
ACCEL
POWER
MANAGEMENT
CS
SCLK
DIN
DOUT
GND
VDD
TEMP
VDD
DIO1 DIO2 DIO3 DIO4/CLKIN RST
SPI
TRIAXIAL
MAGN
PRESSURE
SELF T EST I/O ALARMS
OUTPUT
DATA
REGISTERS
USER
CONTROL
REGISTERS
CALIBRATION
AND
FILTERS
ADIS16448
09946-001
Figure 1.
Rev. E Document Feedback
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ADIS16448 Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 4
Timing Specifications .................................................................. 7
Absolute Maximum Ratings ............................................................ 9
ESD Caution .................................................................................. 9
Pin Configuration and Function Descriptions ........................... 10
Typical Performance Characteristics ........................................... 11
User Registers .................................................................................. 12
User Interface .................................................................................. 13
Reading Sensor Data .................................................................. 13
Device Configuration ................................................................ 14
Output Data Registers .................................................................... 15
Gyroscopes .................................................................................. 15
Accelerometers ............................................................................ 15
Magnetometers ........................................................................... 16
Barometric Pressure ................................................................... 16
Remote Pressure Sensing ........................................................... 16
Internal Temperature ................................................................. 17
System Functions ............................................................................ 18
Global Commands ..................................................................... 18
Product Identification ................................................................ 18
Self-Test Function ....................................................................... 18
Status/Error Flags ....................................................................... 19
Memory Management ............................................................... 19
Input/Output Configuration ......................................................... 20
Data Ready Indicator ................................................................. 20
General-Purpose Input/Output................................................ 20
Digital Processing Configuration ................................................. 21
Gyroscopes/Accelerometers ..................................................... 21
Input Clock Configuration ....................................................... 21
Magnetometer/Barometer ......................................................... 22
Calibration ....................................................................................... 23
Gyroscopes .................................................................................. 23
Accelerometers ........................................................................... 23
Magnetometer Calibration ........................................................ 24
Flash Updates .............................................................................. 24
Restoring Factory Calibration .................................................. 25
Alarms .............................................................................................. 26
Static Alarm Use ......................................................................... 26
Dynamic Alarm Use ................................................................... 26
Alarm Reporting ........................................................................ 26
Applications Information .............................................................. 27
Mounting Tips ............................................................................ 27
Power Supply Considerations ................................................... 27
ADIS16448/PCBZ ...................................................................... 27
PC-Based Evaluation Tools ....................................................... 27
Outline Dimensions ....................................................................... 28
Ordering Guide .......................................................................... 28
REVISION HISTORY
8/15—Rev. D to Rev. E
Change to Features Section ............................................................. 1
Changes to Input Sync Positive Pulse Width and Input Sync to
Data Ready Valid Transition Parameters, Table 2 ........................ 7
Changes to Figure 13 Caption....................................................... 14
Added Burst Read Function with CRC Section ......................... 14
Changes to Figure 14 ...................................................................... 14
Changes to Table 30 ........................................................................ 18
5/15—Rev. C to Rev. D
Changed ADIS16448AMLZ to ADIS16448BMLZ .... Throughout
Change to Features Section and General Description Section ... 1
Changes to Table 1 ............................................................................ 3
Changes to Table 3 ............................................................................ 6
Change to Figure 9 ......................................................................... 10
Changes to Ordering Guide .......................................................... 23
9/14—Rev. B to Rev. C
Changes to General Description Section ............................................ 1
Changes Status/Error Flags Section ............................................. 15
Changes to Table 54 ........................................................................ 21
Added Mounting Tips Section ...................................................... 22
7/13—Rev. A to Rev. B
Changes to Linear Acceleration Effect on Bias Test Conditions .... 3
Changes to Burst Read Function Section ..................................... 11
Rev. E | Page 2 of 28
Data Sheet ADIS16448
3/13—Rev. 0 to Rev. A
Changed Start-Up Time from 192 ms to 205 ms .......................... 1
Changes to Table 1............................................................................. 3
Changed VDD from 5 V to 3.3 V, Changed tSTALL from 1/fSCLK to
N/A, and Added Endnote 2; Table 2 ............................................... 5
Changes to Burst Read Function Section..................................... 11
Changes to Table 23 ........................................................................ 13
Changes to Single Command Bias Correction Section ............. 19
Changes to ADIS16448/PCBZ Section ........................................ 22
Deleted Mounting, Approaches Section ...................................... 22
Updated Outline Dimensions........................................................ 23
Changes to Ordering Guide ........................................................... 23
8/12—Revision 0: Initial Version
Rev. E | Page 3 of 28
ADIS16448 Data Sheet
SPECIFICATIONS
TA = 25°C, VDD = 3.3 V, angular rate = 0°/sec, dynamic range = ±1000°/sec ± 1 g, unless otherwise noted.
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
GYROSCOPES
Dynamic Range ±1000 ±1200 °/sec
Initial Sensitivity ±1000°/sec, see Table 12 0.04 °/sec/LSB
±500°/sec, see Table 12 0.02 °/sec/LSB
±250°/sec, see Table 12 0.01 °/sec/LSB
Repeatability1 −40°C ≤ TA ≤ +85°C 1 %
Sensitivity Temperature Coefficient
−40°C ≤ T
A
≤ +85°C
±40
ppm/°C
Misalignment Axis to axis ±0.05 Degrees
Axis to frame (package) ±0.5 Degrees
Nonlinearity Best fit straight line ±0.1 % of FS
Bias Repeatability1, 2 −40°C ≤ TA ≤ +85°C, 1 σ 0.5 °/sec
In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 14.5 °/hr
Angular Random Walk
1 σ, SMPL_PRD = 0x0001
0.66
°/√hr
Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C 0.005 °/sec/°C
Linear Acceleration Effect on Bias Any axis, 1 σ 0.015 °/sec/g
Bias Supply Sensitivity −40°C ≤ TA ≤ +85°C 0.2 °/sec/V
Output Noise ±1000°/sec range, no filtering 0.27 °/sec rms
Rate Noise Density
f = 25 Hz, ±1000°/sec range, no filtering
0.0135
°/sec/√Hz rms
−3 dB Bandwidth 330 Hz
Sensor Resonant Frequency 17.5 kHz
ACCELEROMETERS
Each axis
Dynamic Range ±18 g
Sensitivity See Table 16 for data format 0.833 mg/LSB
Repeatability1 −40°C ≤ TA ≤ +85°C 1 %
Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±40 ppm/°C
Misalignment Axis to axis 0.2 Degrees
Axis to frame (package)
±0.5
Degrees
Nonlinearity Best fit straight line 0.2 % of FS
Bias Repeatability1, 2 −40°C ≤ TA ≤ +85°C, 1 σ 20 mg
In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 0.25 mg
Velocity Random Walk 1 σ, SMPL_PRD = 0x0001 0.11 m/sec/√hr
Bias Temperature Coefficient
−40°C ≤ T
A
≤ +85°C
±0.15
mg/°C
Bias Supply Sensitivity −40°C ≤ TA ≤ +85°C 5 mg/V
Output Noise No filtering 5.1 mg rms
Noise Density No filtering 0.23 mg/√Hz rms
−3 dB Bandwidth 330 Hz
Sensor Resonant Frequency 5.5 kHz
MAGNETOMETERS
Dynamic Range ±1.9 gauss
Initial Sensitivity 25°C, see Table 20 for data format 140.04 142.9 145.76 µgauss/LSB
Sensitivity Temperature Coefficient
Relative to 25°C, 1 σ
800
ppm/°C
Misalignment Axis to axis 0.25 Degrees
Axis to frame (package) 0.5 Degrees
Nonlinearity Best fit straight line 0.1 % of FS
Initial Bias Error 25°C, 0 gauss stimulus ±4 mgauss
Bias Temperature Coefficient
−40°C ≤ T
A
≤ +85°C
0.11
mgauss/°C
Rev. E | Page 4 of 28
Data Sheet ADIS16448
Parameter
Test Conditions/Comments
Min
Typ
Max
Unit
Output Noise 25°C, no filtering, rms 2.4 mgauss
Noise Density 25°C, no filtering, rms 0.4 mgauss/√Hz
Bandwidth −3 dB 25 Hz
TEMPERATURE
Sensitivity See Table 23 0.07386 °C/LSB
BAROMETERS
Pressure Range, Operating 300 1100 mbar
Pressure Range Extended3 10 1200 mbar
Sensitivity 0.02 mbar/LSB
Voltage Dependence 0.18 %/V
Bias Supply Voltage Sensitivity 3.24 mbar/V
Total Error 25°C, 300 mbar to 1100 mbar 1.5 mbar
Relative Error4 −40°C to +85°C, 300 mbar to 1100 mbar 2.5 mbar
Linearity5 25°C, 300 mbar to 1100 mbar 0.1 % of FS
−40°C to +85°C, 300 mbar to 1100 mbar
0.2
% of FS
Noise 0.08 mbar rms
LOGIC INPUTS6
Input High Voltage, V
IH
2.0
V
Input Low Voltage, VIL 0.8 V
Logic 1 Input Current, IIH VIH = 3.3 V ±0.2 ±10 µA
Logic 0 Input Current, IIL VIL = 0 V
All Pins Except RST 40 60 µA
RST Pin 1 mA
Input Capacitance, CIN 10 pF
DIGITAL OUTPUTS6
Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V
Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V
FLASH MEMORY Endurance7 10,000 Cycles
Data Retention8 TJ = 85°C 20 Years
FUNCTIONAL TIMES9 Time until new data is available
Power-On Start-Up Time 205 ms
Reset Recovery Time10 90 ms
Flash Memory Back-Up Time 75 ms
Flash Memory Test Time 20 ms
Automatic Self-Test Time
SMPL_PRD = 0x0001
45
ms
CONVERSION RATE
xGYRO_OUT, xACCL_OUT SMPL_PRD = 0x0001 819.2 SPS
xMAGN_OUT, BARO_OUT11 SMPL_PRD = 0x0001 51.2 SPS
Clock Accuracy ±3 %
Sync Input Clock12 0.8 1.1 kHz
POWER SUPPLY Operating voltage range, VDD 3.15 3.3 3.45 V
Power Supply Current 76 104 mA
1 The repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C
to +85°C), electronics drift (high-temperature operating life test: 85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles,
−40°C to +85°C), rate random walk (10 year projection), and broadband noise.
2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density
specifications.
3 The extended pressure range is guaranteed by design.
4 The relative error assumes that the initial error, at 25°C, is corrected in the end application.
5 Linearity errors assume a full scale (FS) of 1000 mbar.
6 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
Rev. E | Page 5 of 28
ADIS16448 Data Sheet
7 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
8 The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction
temperature.
9 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.
10 The RST line must be held low for at least 10 μs to assure a proper reset and recovery sequence.
11 The xMAGN_OUT and BARO_OUT registers update at a rate that is 1/16th that of the other output registers.
12 The sync input clock functions below the specified minimum value but at reduced performance levels.
Rev. E | Page 6 of 28
Data Sheet ADIS16448
TIMING SPECIFICATIONS
TA = 25°C, VDD = 3.3 V, unless otherwise noted.
Table 2.
Parameter Description
Normal Mode Burst Read
Unit Min1 Typ Max Min1 Typ Max
fSCLK Serial clock 0.01 2.0 0.01 1.0 MHz
tSTALL Stall period between data 9 N/A2 µs
t
READRATE
Read rate
40
µs
tCS Chip select to SCLK edge 48.8 48.8 ns
tDAV DOUT valid after SCLK edge 100 100 ns
tDSU DIN setup time before SCLK rising edge 24.4 24.4 ns
tDHD DIN hold time after SCLK rising edge 48.8 48.8 ns
tSCLKR, tSCLKF SCLK rise/fall times, not shown in the Timing
Diagrams section
5 12.5 5 12.5 ns
t
DR
, t
DF
DOUT rise/fall times, not shown in the Timing
Diagrams section
5
12.5
5
12.5
ns
tSFS CS high after SCLK edge 5 5 ns
t1 Input sync positive pulse width 25 25 µs
tSTDR Input sync to data ready valid transition 600 600 µs
tNV Data invalid time 210 210 µs
t3 Input sync period 910 910 µs
1 Guaranteed by design and characterization, but not tested in production.
2 When using the burst read mode, the stall period is not applicable.
Timing Diagrams
CS
SCLK
DOUT
DIN
1 2 3 4 5 6 15 16
R/W A5A6 A4 A3 A2 D2
MSB DB14
D1 LSB
DB13 DB12 DB10DB11 DB2 LSBDB1
tCS tSFS
tDAV
tDHD
tDSU
09946-002
Figure 2. SPI Timing and Sequence
CS
SCLK
t
READRATE
t
STALL
09946-003
Figure 3. Stall Time and Data Rate
Rev. E | Page 7 of 28
ADIS16448 Data Sheet
CLOCK
DATA
READY
t
1
t
3
t
NV
t
STDR
09946-004
Figure 4. Input Clock Timing Diagram
Rev. E | Page 8 of 28
Data Sheet ADIS16448
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
Acceleration
Any Axis, Unpowered
2000 g
Any Axis, Powered 2000 g
VDD to GND −0.3 V to +3.45 V
Digital Input Voltage to GND −0.3 V to +VDD + 0.3 V
Digital Output Voltage to GND −0.3 V to +VDD + 0.3 V
Temperature
Operating Range −40°C to +105°C
Storage Range −65°C to +125°C1, 2
Pressure 2 bar
1 Extended exposure to temperatures outside the specified temperature
range of −40°C to +105°C can adversely affect the accuracy of the factory
calibration. For best accuracy, store the parts within the specified operating
range of −40°C to +105°C.
2 Although the device is capable of withstanding short-term exposure to
150°C, long-term exposure threatens internal mechanical integrity.
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
Table 4. Package Characteristics
Package Type
θJA
(°C/W)
θJC
(°C/W)
Mass
(grams)
20-Lead Module (ML-20-2) 36.5 16.9 15
ESD CAUTION
Rev. E | Page 9 of 28
ADIS16448 Data Sheet
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
19
DIO4/CLKIN
DOUT
CS
RST
VDD DIO2
GND
DNC
DNC
DNC
DIO3
SCLK
DIN
DIO1
VDD VDD
GND
GND
DNC
DNC
20
17
18
15
16
13
14
11
12
9
10
7
8
5
6
3
4
1
2
ADIS16448
TOP VIEW
(No t t o Scal e)
NOTES
1. THIS REPRESENTATION DISPLAYS THE TOP VI EW W HEN THE
CONNECTO R IS V ISI BLE AND FACI NG UP.
2. M ATING CO NNE CTOR: S AM TEC CLM- 110- 02 OR EQ UIVALENT.
3. DNC = DO NO T CO NNE CT.
09946-005
Figure 5. Pin Configuration
PIN 1
PIN 20
USE THIS OPENING FOR
REMOTE PRESSURE SENSING.
HOLE IS TAPPED
FO R 10-32 SCREW T HRE ADS .
09946-106
Figure 6. Pin Locations
Table 5. Pin Function Descriptions
Pin No. Mnemonic Type 1 Description
1 DIO3 I/O Configurable Digital Input/Output.
2 DIO4/CLKIN I/O Configurable Digital Input/Output or Sync Clock Input.
3 SCLK I SPI Serial Clock.
4 DOUT O SPI Data Output. Clocks the output on the SCLK falling edge.
5 DIN I SPI Data Input. Clocks the input on the SCLK rising edge.
6 CS
I SPI Chip Select.
7 DIO1 I/O Configurable Digital Input/Output.
8 RST I Reset.
9 DIO2 I/O Configurable Digital Input/Output.
10, 11, 12 VDD S Power Supply.
13, 14, 15 GND S Power Ground.
16, 17, 18, 19, 20 DNC N/A Do Not Connect. Do not connect to these pins.
1 S is supply, O is output, I is input, N/A is not applicable.
Rev. E | Page 10 of 28
Data Sheet ADIS16448
TYPICAL PERFORMANCE CHARACTERISTICS
1
10
100
1000
0.01 0.1 110 100 1000
ROOT ALLAN VARIANCE ( °/ Hou r)
T
AU
(Seconds)
–δ
+δ
AVERAGE
09946-127
Figure 7. Gyroscope Root Allan Variance
0.01
0.1
1
10
0.01 0.1 110 100 1000
ROOT ALLAN VARIANCE ( mg)
T
AU
(Seconds)
AVERAGE
–δ
+δ
09946-128
Figure 8. Accelerometer Root Allan Variance
Rev. E | Page 11 of 28
ADIS16448 Data Sheet
USER REGISTERS
Table 6. User Register Memory Map1
Name R/W Flash Backup Address2 Default Function Bit Assignments
FLASH_CNT R Yes 0x00 N/A Flash memory write count See Table 32
Reserved
N/A
N/A
0x02
N/A
N/A
XGYRO_OUT R No 0x04 N/A X-axis gyroscope output See Table 9
YGYRO_OUT R No 0x06 N/A Y-axis gyroscope output See Table 10
ZGYRO_OUT R No 0x08 N/A Z-axis gyroscope output See Table 11
XACCL_OUT R No 0x0A N/A X-axis accelerometer output See Table 13
YACCL_OUT R No 0x0C N/A Y-axis accelerometer output See Table 14
ZACCL_OUT
R
No
0x0E
N/A
Z-axis accelerometer output
See Table 15
XMAGN_OUT R No 0x10 N/A X-axis magnetometer measurement See Table 17
YMAGN_OUT R No 0x12 N/A Y-axis magnetometer measurement See Table 18
ZMAGN_OUT R No 0x14 N/A Z-axis magnetometer measurement See Table 19
BARO_OUT R No 0x16 N/A Barometer pressure measurement, high word See Table 21
TEMP_OUT
R
No
0x18
N/A
Temperature output
See Table 23
XGYRO_OFF R/W Yes 0x1A 0x0000 X-axis gyroscope bias offset factor See Table 37
YGYRO_OFF R/W Yes 0x1C 0x0000 Y-axis gyroscope bias offset factor See Table 38
ZGYRO_OFF R/W Yes 0x1E 0x0000 Z-axis gyroscope bias offset factor See Table 39
XACCL_OFF R/W Yes 0x20 0x0000 X-axis acceleration bias offset factor See Table 40
YACCL_OFF R/W Yes 0x22 0x0000 Y-axis acceleration bias offset factor See Table 41
ZACCL_OFF R/W Yes 0x24 0x0000 Z-axis acceleration bias offset factor See Table 42
XMAGN_HIC R/W Yes 0x26 0x0000 X-axis magnetometer, hard iron factor See Table 43
YMAGN_HIC R/W Yes 0x28 0x0000 Y-axis magnetometer, hard iron factor See Table 44
ZMAGN_HIC R/W Yes 0x2A 0x0000 Z-axis magnetometer, hard iron factor See Table 45
XMAGN_SIC R/W Yes 0x2C 0x0000 X-axis magnetometer, soft iron factor See Table 46
YMAGN_SIC
R/W
Yes
0x2E
0x0000
Y-axis magnetometer, soft iron factor
See Table 47
ZMAGN_SIC R/W Yes 0x30 0x0000 Z-axis magnetometer, soft iron factor See Table 48
GPIO_CTRL R/W No 0x32 0x0000 Auxiliary digital input/output control See Table 33
MSC_CTRL R/W Yes 0x34 0x0006 Miscellaneous control See Table 30
SMPL_PRD R/W Yes 0x36 0x0001 Internal sample period (rate) control See Table 34
SENS_AVG R/W Yes 0x38 0x0402 Dynamic range and digital filter control See Table 35
SEQ_CNT R N/A 0x3A N/A xMAGN_OUT and BARO_OUT counter See Table 36
DIAG_STAT R No 0x3C 0x0000 System status See Table 31
GLOB_CMD W N/A 0x3E 0x0000 System command See Table 25
ALM_MAG1 R/W Yes 0x40 0x0000 Alarm 1 amplitude threshold See Table 49
ALM_MAG2 R/W Yes 0x42 0x0000 Alarm 2 amplitude threshold See Table 50
ALM_SMPL1
R/W
Yes
0x44
0x0000
Alarm 1 sample size
See Table 51
ALM_SMPL2 R/W Yes 0x46 0x0000 Alarm 2 sample size See Table 52
ALM_CTRL R/W Yes 0x48 0x0000 Alarm control See Table 53
Reserved N/A N/A 0x4A to 0x51 N/A Reserved
LOT_ID1 R Yes 0x52 N/A Lot identification number See Table 26
LOT_ID2 R Yes 0x54 N/A Lot identification number See Table 27
PROD_ID R Yes 0x56 0x4040 Product identifier See Table 28
SERIAL_NUM R Yes 0x58 N/A Lot-specific serial number See Table 29
1 N/A means not applicable.
2 Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte plus 1.
Rev. E | Page 12 of 28
Data Sheet ADIS16448
USER INTERFACE
The ADIS16448 is an autonomous system that requires no user
initialization. When it has a valid power supply, it initializes itself
and starts sampling, processing, and loading sensor data into
the output registers at a sample rate of 819.2 SPS. DIO1 pulses
high after each sample cycle concludes. The SPI interface enables
simple integration with many embedded processor platforms,
as shown in Figure 9 (electrical connection) and Table 7 (pin
functions).
SYSTEM
PROCESSOR
SPI MASTER ADIS16448
SCLK
CS
DIN
DOUT
SCLK
SS
MOSI
MISO
+3.3V
IRQ DIO1
VDD I/O LINES ARE COMPATIBLE WITH
3.3V LOGIC LINES
10
6
3
5
4
7
11 12
13 14 15
09946-009
10µF
Figure 9. Electrical Connection Diagram
Table 7. Generic Master Processor Pin Names and Functions
Pin Name Function
SS
Slave select
SCLK Serial clock
MOSI Master output, slave input
MISO Master input, slave output
IRQ Interrupt request
The ADIS16448 SPI interface supports full duplex serial commu-
nication (simultaneous transmit and receive) and uses the bit
sequence shown in Figure 12. Table 8 provides a list of the most
common settings that require attention to initialize the serial
port of a processor for the ADIS16448 SPI interface.
Table 8. Generic Master Processor SPI Settings
Processor Setting Description
Master The ADIS16448 operates as a slave
SCLK Rate ≤ 2 MHz
1
Maximum serial clock rate
SPI Mode 3 CPOL = 1 (polarity), CPHA = 1 (phase)
MSB-First Mode Bit sequence
16-Bit Mode Shift register/data length
1 For burst read, SCLK rate ≤ 1 MHz.
READING SENSOR DATA
The ADIS16448 provides two different options for acquiring
sensor data: single register and burst register. A single register
read requires two 16-bit SPI cycles. The first cycle requests the
contents of a register using the bit assignments in Figure 12.
Bit DC7 to Bit DC0 are don’t cares for a read, and then the output
register contents follow on DOUT during the second sequence.
Figure 10 includes three single register reads in succession. In
this example, the process starts with DIN = 0x0400 to request
the contents of XGYRO_OUT, then follows with 0x0600 to
request YGYRO_OUT and 0x0800 to request ZGYRO_OUT.
Full duplex operation enables processors to use the same 16-bit
SPI cycle to read data from DOUT while requesting the next set
of data on DIN. Figure 11 provides an example of the four SPI
signals when reading XGYRO_OUT in a repeating pattern.
XGYRO_OUT
DIN
DOUT
YGYRO_OUT ZGYRO_OUT
0x0400 0x0600 0x0800
09946-010
Figure 10. SPI Read Example
SCLK
CS
DIN
DOUT
09946-111
DOUT = 1111 10011101 1010 = 0xF9DA = –1574 LSBs ≥ –62.96°/sec
DIN = 0000 0100 0000 0000 = 0x0400
Figure 11. Example SPI Read, Second 16-Bit Sequence
R/W R/W
A6 A5 A4 A3 A2 A1 A0 DC7 DC6 DC5 DC4 DC3 DC2 DC1 DC0
D0D1D2D3
D4D5D6D7D8
D9D10D11D12
D13D14D15
CS
SCLK
DIN
DOUT
A6 A5
D13
D14D15
NOTES
1. T HE DOUT BIT PATTERN REFLECTS THE ENTIRE CONTENTS OF THE REGISTER IDENTIFIED B
Y [A6:A0]
IN T HE P RE V IO US 16- BIT DIN SEQUENCE WHEN R/ W = 0.
2. I F R/ W = 1 DURING THE P RE V IO US S E QUENCE , DO UT IS NOT DE FINE D.
09946-013
Figure 12. SPI Communication Bit Sequence
Rev. E | Page 13 of 28
ADIS16448 Data Sheet
Burst Read Function
The burst read function provides a way to read all of the data
in one continuous stream of bits (no stall time). As shown in
Figure 13, start this mode by setting DIN = 0x3E00, while
keeping CS low for 12 additional, 16-bit read cycles. These
12 cycles produce the following sequence of output registers
on DOUT: DIAG_STAT, XGYRO_OUT, YGYRO_OUT,
ZGYRO_OUT, XACCL_OUT, YACCL_OUT, ZACCL_OUT,
XMAGN_OUT, YMAGN_OUT, ZMAGN_OUT, BARO_OUT,
and TEMP_OUT.
GLOB_CMD
CS
SCLK
DIN
DOUT XGYRO_OUT
DIAG_STATTEMP_OUT
12313
09946-113
Figure 13. Burst Read Sequence, MSC_CTRL[4] = 0
Burst Read Function with CRC
When MSC_CTRL[4] = 1, the ADIS16448 adds a CRC-16 code
at the end of the burst mode response (after TEMP_OUT), on
the DOUT line. This increases the total number of 16-bit
segments in the burst read operation to 14. The CRC-16 code
derives from the CCIT CRC-16 method and provides a simple
mechanism for verifying the correct communication of data
during a burst mode sequence. This method strings together
the data from the burst read output into a continuous binary
number (176 bits), divides it by 0x1021, and uses the remainder
of this operation as the CRC-16 code. The 176-bit binary
number contains the contents of the following registers, which
are in their order of significance in the 176-bit number:
XGYRO_OUT (most significant 16-bits), YGYRO_OUT,
ZGYRO_OUT, XACCL_OUT, YACCL_OUT, ZACCL_OUT,
XMAGN_OUT, YMAGN_OUT, ZMAGN_OUT, BARO_OUT,
and TEMP_OUT (least significant 16-bits).
GLOB_CMD
CS
SCLK
DIN
DOUT XGYRO_OUTDIAG_STAT CRC-16
1 2 314
09946-113
Figure 14. Burst Ready Sequence, MSC_CTRL[4] = 1
SPI Read Test Sequence
Figure 15 provides a test pattern for testing the SPI communica-
tion. In this pattern, write 0x5600 to the DIN line in a repeating
pattern and raise chip select for at least 9 µs between each 16-bit
sequence. Starting with the second 16-bit sequence, DOUT
produces the contents of the PROD_ID (see Table 28) register,
0x4040.
DOUT = 0100 0000 0100 0000 = 0x4040 = 16,448
DIN = 0101 0110 0000 0000 = 0x5600
SCLK
CS
DIN
DOUT
09946-011
Figure 15. SPI Test Read Pattern DIN = 0x5600, DOUT = 0x4040
DEVICE CONFIGURATION
The control registers in Table 6 provide users with a variety of
configuration options. The SPI provides access to these registers,
one byte at a time, using the bit assignments in Figure 12. Each
register has 16 bits, where Bits[7:0] represent the lower address,
and Bits[15:8] represent the upper address. Figure 16 provides
an example of writing 0x04 to Address 0x36 (SMPL_PRD[15:8],
using DIN = 0xB704. This example reduces the sample rate by a
factor of eight (see Table 34).
SCLK
CS
DIN
DIN = 10 11 0111 0000 0100 = 0xB704, WRITES 0x04 TO ADDRESS 0x37.
09 946-016
Figure 16. Example SPI Write Sequence
Dual Memory Structure
Writing configuration data to a control register updates its
SRAM contents, which are volatile. After optimizing each
relevant control register setting in a system, set GLOB_CMD[3]
= 1 (DIN = 0xBE08) to backup these settings in nonvolatile
flash memory. The flash backup process requires a valid power
supply level for the entire process time, 75 ms. Table 6 provides
a user register memory map that includes a flash backup
column. A yes in this column indicates that a register has a
mirror location in flash and, when backed up properly, it
automatically restores itself during startup or after a reset.
Figure 17 provides a diagram of the dual memory structure
used to manage operation and store critical user settings.
NONVOLATILE
FLASH MEMORY
(NO SPI ACCESS)
MANUAL
FLASH
BACKUP
START-UP
RESET
VOLATILE
SRAM
SPI ACCESS
09946-017
Figure 17. SRAM and Flash Memory Diagram
Rev. E | Page 14 of 28
Data Sheet ADIS16448
OUTPUT DATA REGISTERS
Each sensor in the ADIS16448 has a dedicated output register in
the user register map (see Table 6). Figure 18 provides arrows,
which describe the direction or rotation (gX, gY, gZ), acceleration
(aX, aY, aZ), and magnetic field (mX, mY, mZ) that produce a
positive response in its output data.
GYROSCOPES
XGYRO_OUT (see Table 9) contains x-axis gyroscope data (gX
in Figure 18), YGYRO_OUT (see Table 10) contains y-axis gyro-
scope data (gY in Figure 18), and ZGYRO_OUT (see Table 11)
contains z-axis gyroscope data (gZ in Figure 18). Table 12
illustrates the gyroscope data format with numerical examples.
Table 9. XGYRO_OUT (Base Address = 0x04), Read Only
Bits Description
[15:0] X-axis gyroscope data, twos complement format,
25 LSB/°/sec (SENS_AVG[15:8] = 0x04), 0°/sec = 0x0000
Table 10. YGYRO_OUT (Base Address = 0x06), Read Only
Bits Description
[15:0] Y-axis gyroscope data, twos complement format,
25 LSB/°/sec (SENS_AVG[15:8] = 0x04), 0°/sec = 0x0000
Table 11. ZGYRO_OUT (Base Address = 0x08), Read Only
Bits Description
[15:0] Z-axis gyroscope data, twos complement format,
25 LSB/°/sec (SENS_AVG[15:8] = 0x04), 0°/sec = 0x0000
Table 12. Rotation Rate, Twos Complement Format1
Rotation
Rate (°/sec) Decimal Hex Binary
+1000 +25,000 0x61A8 0110 0001 1010 1000
+2 ÷ 25 +2 0x0002 0000 0000 0000 0010
+1 ÷ 25 +1 0x0001 0000 0000 0000 0001
0 0 0x0000 0000 0000 0000 0000
−1 ÷ 25 −1 0xFFFF 1111 1111 1111 1111
−2 ÷ 25 −2 0xFFFE 1111 1111 1111 1110
−1000 −25,000 0x9E58 1001 1110 0101 1000
1 SENS_AVG[15:8] = 0x04, see Table 35.
ACCELEROMETERS
XACCL_OUT (see Table 13) contains x-axis accelerometer data
(aX in Figure 18), YACCL_OUT (see Table 14) contains y-axis
accelerometer data (aY in Figure 18), and ZACCL_OUT (see
Table 15) contains z-axis accelerometer data (aZ in Figure 18).
Table 16 illustrates the accelerometer data format with numerical
examples.
Table 13. XACCL_OUT (Base Address = 0x0A), Read Only
Bits Description
[15:0] X-axis acceleration data, twos complement format,
1200 LSB/g, 0 g = 0x0000
Table 14. YACCL_OUT (Base Address = 0x0C), Read Only
Bits Description
[15:0] Y-axis acceleration data, twos complement format,
1200 LSB/g, 0 g = 0x0000
Table 15. ZACCL_OUT (Base Address = 0x0E), Read Only
Bits Description
[15:0] Z-axis acceleration data, twos complement format,
1200 LSB/g, 0 g = 0x0000
Table 16. Acceleration, Twos Complement Format
Acceleration (g) Decimal Hex Binary
+18 +21,600 0x5460 0101 0100 0101 0000
+2 ÷ 1200 +2 0x0002 0000 0000 0000 0010
+1 ÷ 1200 +1 0x0001 0000 0000 0000 0001
0 0 0x0000 0000 0000 0000 0000
−1 ÷ 1200 −1 0xFFFF 1111 1111 1111 1111
−2 ÷ 1200 −2 0xFFFE 1111 1111 1111 1110
−18 −21,600 0xABA0 1010 1011 1010 0000
Rev. E | Page 15 of 28
ADIS16448 Data Sheet
Y-AXIS X-AXIS
Z-AXIS
09946-206
aZmZ
aY
mY
gY
aX
mX
gX
gZ
Figure 18. Inertial Sensor Direction Reference
MAGNETOMETERS
XMAGN_OUT (see Table 17) contains x-axis magnetometer
data (mX in Figure 18), YMAGN_OUT (see Table 18) contains
y-axis magnetometer data (mY in Figure 18), and ZMAGN_OUT
(see Table 19) contains z-axis magnetometer data (mZ in
Figure 18).
Table 20 illustrates the magnetometer data format with numerical
examples. The lower four bits of each magnetometer output
data register (xMAGN_OUT[3:0]) are not active at the maximum
update rate of 51.2 SPS. They become active when using
SMPL_PRD[12:8] to average and decimate the data. The
number of bits that become active is equal to the decimation
setting number in SMPL_PRD[12:8]. For example, if
SMPL_PRD[15:8] = 0x02, xMAGN_OUT[15:2] are active
and xMAGN_OUT[1:0] are inactive.
Table 17. XMAGN_OUT (Base Address = 0x10), Read Only
Bits Description
[15:0]
X-axis magnetic field intensity data, ±1.9 gauss
twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss
Table 18. YMAGN_OUT (Base Address = 0x12), Read Only
Bits Description
[15:0] Y-axis magnetic field intensity data, ±1.9 gauss
twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss
Table 19. ZMAGN_OUT (Base Address = 0x14), Read Only
Bits Description
[15:0]
Z-axis magnetic field intensity data, ±1.9 gauss
twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss
Table 20. Magnetometer, Twos Complement Format
Magnetic Field
(mgauss)
Decimal Hex Binary
+1900 +13,300 0x33F4 0011 0011 1111 0100
+2 ÷ 7
+2
0x0002
0000 0000 0000 0010
+1 ÷ 7 +1 0x0001 0000 0000 0000 0001
0 0 0x0000 0000 0000 0000 0000
+1 ÷ 7
−1
0xFFFF
1111 1111 1111 1111
+2 ÷ 7 −2 0xFFFE 1111 1111 1111 1110
−1900
−13,300
0xCC0C
1100 1100 0000 1100
BAROMETRIC PRESSURE
BARO_OUT (see Table 21) contains the barometric pressure
data. Table 22 provides several numerical format examples for
BARO_OUT.
Table 21. BARO_OUT (Base Address = 0x16), Read Only
Bits
Description
[15:0] Barometric pressure data, binary data format,
20 µbar per LSB, 0x0000 = 0 mbar
Table 22. Pressure, Binary, BARO_OUT
Pressure Decimal Hex Binary
1200 mbar 60,000 0xEA60 1110 1010 0110 0000
1100 mbar 55,000 0xD6D8 1101 0110 1101 1000
1000 mbar 50,000 0xC350 1100 0011 0101 0000
0.04 mbar 2 0x0002 0000 0000 0000 0010
0.02 mbar 1 0x0001 0000 0000 0000 0001
0 mbar 0 0x0000 0000 0000 0000 0000
REMOTE PRESSURE SENSING
The ADIS16448 package offers a threaded hole (10-32) to
support remote pressure sensing. Figure 19 provides an example
of a fitting, which mates this hole to a barbed interface that
enables a tight connection with rubber tubing (1/8˝).
Rev. E | Page 16 of 28
Data Sheet ADIS16448
09946-219
Figure 19. Barb Fitting for Remote Pressure Sensing
INTERNAL TEMPERATURE
The internal temperature measurement data loads into the
TEMP_OUT (see Table 23) register. Table 24 illustrates the
temperature data format. Note that this temperature repre-
sents an internal temperature reading, which does not precisely
represent external conditions. The intended use of TEMP_OUT
is to monitor relative changes in temperature.
Table 23. TEMP_OUT (Base Address = 0x18), Read Only
Bits Description
[15:12] Not used
[11:0] Twos complement, 0.07386°C/LSB, 31°C = 0x000
Table 24. Temperature, Twos Complement Format
Temperature (°C) Decimal Hex Binary
+105 +1002 3EA 0011 1110 1010
+85
+731
2DB
0010 1101 1011
+31.14772 +2 2 0000 0000 0010
+31.07386 +1 0 0000 0000 0001
+31 0 0 0000 0000 0000
+30.92614 −1 FFF 1111 1111 1111
+30.85228 −2 FFE 1111 1111 1110
−40
−962
C3E
1100 0011 1110
Rev. E | Page 17 of 28
ADIS16448 Data Sheet
SYSTEM FUNCTIONS
GLOBAL COMMANDS
The GLOB_CMD register in Table 25 provides trigger bits
for software reset, flash memory management, and calibration
control. Start each of these functions by writing a 1 to the assigned
bit in GLOB_CMD. After completing the task, the bit automati-
cally returns to 0. For example, set GLOB_CMD[7] = 1 (DIN =
0xBE80) to initiate a software reset. Set GLOB_CMD[3] = 1 (DIN
= 0xBE08) to back up the user register contents in nonvolatile
flash. This sequence includes loading the control registers with
the data in their respective flash memory locations prior to
producing new data.
Table 25. GLOB_CMD (Base Address = 0x3E), Write Only
Bits Description (Default = 0x0000)
[15:8] Not used
7 Software reset
[6:4] Not used
3 Flash update
2 Not used
1
Factory calibration restore
0 Gyroscope bias correction
PRODUCT IDENTIFICATION
The PROD_ID register in Table 28 contains the binary equivalent
of 16,448. It provides a product specific variable for systems that
need to track this in their system software. The LOT_ID1 and
LOT_ID2 registers in Table 26 and Table 27 combine to provide
a unique, 32-bit lot identification code. The SERIAL_NUM
register in Table 29 contains a binary number that represents
the serial number on the device label. The assigned serial
numbers in SERIAL_NUM are lot specific.
Table 26. LOT_ID1 (Base Address = 0x52), Read Only
Bits
Description
[15:0] Lot identification, binary code
Table 27. LOT_ID2 (Base Address = 0x54), Read Only
Bits Description
[15:0] Lot identification, binary code
Table 28. PROD_ID (Base Address = 0x56), Read Only
Bits Description (Default = 0x4040)
[15:0] Product identification = 0x4040
Table 29. SERIAL_NUM (Base Address = 0x58), Read Only
Bits Description
[15:12] Reserved
[11:0] Serial number, 1 to 4094 (0xFFE)
SELF-TEST FUNCTION
The MSC_CTRL register in Table 30 provides a self-test function
for the gyroscopes, accelerometers, magnetometers, and
barometers. Note that the magnetometer results assume that
the non-earth magnetic fields are low, in comparison to the
earth’s magnetic field. This function allows the user to verify
the mechanical integrity of each MEMS sensor. When enabled,
the self test applies an electrostatic force to each internal sensor
element, which causes them to move. The movement in each
element simulates its response to actual rotation/acceleration
and generates a predictable electrical response in the sensor outputs.
Set MSC_CTRL[10] = 1 (DIN = 0xB504) to activate the internal self
test routine, which compares the response to an expected range of
responses and reports a pass/fail response to DIAG_STAT[5]. If this
is high, review DIAG_STAT[15:10] to identify the failing sensor.
Table 30. MSC_CTRL (Base Address = 0x34), Read/Write
Bits Description (Default = 0x0006)
[15:12] Not used
11 Checksum memory test (cleared upon completion)1
1 = enabled, 0 = disabled
10 Internal self test (cleared upon completion)1
1 = enabled, 0 = disabled
[9:8] Do not use, always set to 00
7 Not used
6 Point of percussion, see Figure 23
1 = enabled, 0 = disabled
5 Not used
4 CRC-16 code for burst mode
1 = include the CRC-16 code in burst read output
sequence
0 = do not include the CRC-16 code in burst read
output sequence
3 Not used
2 Data ready enable
1 = enabled, 0 = disabled
1
Data ready polarity
1 = active high when data is valid
0 = active low when data is valid
0 Data ready line select
1 = DIO2, 0 = DIO1
1 The bit is automatically reset to 0 after finishing the test.
Rev. E | Page 18 of 28
Data Sheet ADIS16448
STATUS/ERROR FLAGS
The DIAG_STAT register in Table 31 provides error flags for
a number of functions. Each flag uses 1 to indicate an error
condition and 0 to indicate a normal condition. Reading this
register provides access to the status of each flag and resets all of
the bits to 0 for monitoring future operation. If the error condition
remains, the error flag returns to 1 at the conclusion of the next
sample cycle. The SPI communication error flag in
DIAG_STAT[3] indicates that the number of SCLKs in a SPI
sequence did not equal a multiple of 16 SCLKs.
Table 31. DIAG_STAT (Base Address = 0x3C), Read Only
Bits Description (Default = 0x0000)
15 Z-axis accelerometer self-test failure
1 = fail, 0 = pass
14 Y-axis accelerometer self-test failure
1 = fail, 0 = pass
13
X-axis accelerometer self-test failure
1 = fail, 0 = pass
12 Z-axis gyroscope self-test failure
0 = pass
11 Y-axis gyroscope self-test failure
1 = fail, 0 = pass
10 X-axis gyroscope self-test failure
1 = fail, 0 = pass
9 Alarm 2 status
1 = active, 0 = inactive
8 Alarm 1 status
1 = active, 0 = inactive
7 New data, xMAGN_OUT/BARO_OUT
6 Flash test, checksum flag
1 = fail, 0 = pass
5 Self-test diagnostic error flag
1 = fail, 0 = pass
4 Sensor overrange
1 = overrange, 0 = normal
3 SPI communication failure
1 = fail, 0 = pass
2 Flash update failure
1 = fail, 0 = pass
1 Barometer functional test
1 = fail, 0 = pass
0
Magnetometer functional test
1 = fail, 0 = pass
Magnetometer/Barometer New Data Indicator
DIAG_STAT[7] indicates that all four registers have new,
unread data in them. This bit rises to 1 after the xMAGN_OUT
and BARO_OUT registers have new data updates. It lowers to
zero after one of the registers are accessed using a SPI-driven
read command. This bit does not return to zero after reading
DIAG_STAT.
MEMORY MANAGEMENT
The FLASH_CNT register in Table 32 provides a 16-bit counter
that helps track the number of write cycles to the nonvolatile flash
memory. The flash updates every time a manual flash update
occurs. A manual flash update is initiated by the GLOB_CMD[3]
bit and is performed at the completion of the GLOB_CMD[1:0]
functions (see Table 25).
Table 32. FLASH_CNT (Base Address = 0x00), Read Only
Bits Description
[15:0] Binary counter
Checksum Test
Set MSC_CTRL[11] = 1 (DIN = 0xB508) to perform a check-
sum test of the internal program memory. This function takes
a summation of the internal program memory and compares it
with the original summation value for the same locations (from
factory configuration). If the sum matches the correct value,
DIAG_STAT[6] is equal to 0. If it does not match,
DIAG_STAT[6] is equal to 1. Make sure that the power supply
is within specification for the entire 20 ms that this function
takes to complete.
Rev. E | Page 19 of 28
ADIS16448 Data Sheet
INPUT/OUTPUT CONFIGURATION
DATA READY INDICATOR
The data ready indicator provides a signal that indicates
when the registers are updating, so that system processors can
avoid data collision, a condition when internal register updates
happen at the same time that an external processor requests it.
The data ready signal has valid and invalid states. Using the
transition from invalid to valid to trigger an interrupt service
routine provides the most time for data acquisition (before the
next register update). See Figure 4 and Table 2 for specific
timing information. MSC_CTRL[2:0] (see Table 30) provide
control bits for enabling this function, selecting the polarity
of the valid state and I/O line assignment (DIO1, DIO2). The
factory default setting of MSC_CTRL[2:0] = 110 (DIN =
0xB406) establishes DIO1 as a data ready output line and assigns
the valid state with a logic high (1). Set MSC_CTRL[2:0] = 100
(DIN = 0xB404) to change the polarity of the data ready signal on
DIO1 for interrupt inputs that require negative logic inputs for
activation.
GENERAL-PURPOSE INPUT/OUTPUT
DIO1, DIO2, DIO3, and DIO4 are configurable, general-purpose
input/output lines that serve multiple purposes. The data
ready controls in MSC_CTRL[2:0] have the highest priority
for configuring DIO1 and DIO2. The alarm indicator controls in
ALM_CTRL[2:0] have the second highest priority for configuring
DIO1 and DIO2. The external clock control associated with
SMPL_PRD[0] has the highest priority for DIO4 configuration
(see Table 34). GPIO_CTRL in Table 33 has the lowest priority
for configuring DIO1, DIO2, and DIO4, and has absolute
control over DIO3.
Table 33. GPIO_CTRL (Base Address = 0x32), Read/Write
Bits Description (Default = 0x0000)
[15:12] Not used
11 General-Purpose I/O Line 4 (DIO4) data level
10 General-Purpose I/O Line 3 (DIO3) data level
9 General-Purpose I/O Line 2 (DIO2) data level
8 General-Purpose I/O Line 1 (DIO1) data level
[7:4] Not used
3
General-Purpose I/O Line 4 (DIO4) direction control
1 = output, 0 = input
2 General-Purpose I/O Line 3 (DIO3) direction control
1 = output, 0 = input
1 General-Purpose I/O Line 2 (DIO2) direction control
1 = output, 0 = input
0 General-Purpose I/O Line 1 (DIO1) direction control
1 = output, 0 = input
Example Input/Output Configuration
For example, set GPIO_CTRL[3:0] = 0100 (DIN = 0xB204)
to set DIO3 as an output signal pin and DIO1, DIO2, and
DIO4 as input signal pins. Set the output on DIO3 to 1 by
setting GPIO_CTRL[10] = 1 (DIN = 0xB304). Then, read
GPIO_CTRL[7:0] (DIN = 0x3200) and mask off GPIO_CTRL[9:8]
and GPIO_CTRL[11] to monitor the digital signal levels on
DIO4, DIO2, and DIO1.
Rev. E | Page 20 of 28
Data Sheet ADIS16448
DIGITAL PROCESSING CONFIGURATION
GYROSCOPES/ACCELEROMETERS
Figure 21 provides a diagram that describes all signal-processing
components for the gyroscopes and accelerometers. The internal
sampling system produces new data in the xGYRO_OUT and
xACCL_OUT output data registers at a rate of 819.2 SPS. The
SMPL_PRD register in Table 34 provides two functional controls
that affect sampling and register update rates. SMPL_PRD[12:8]
provides a control for reducing the update rate, using an averaging
filter with a decimated output. These bits provide a binomial
control that divides the data rate by a factor of 2 every time this
number increases by 1. For example, set SMPL_PRD[15:8] =
0x04 (DIN = 0xB704) to set the decimation factor to 16. This
reduces the update rate to 51.2 SPS and the bandwidth to
~25 Hz. The SMPL_PRD[12:8] setting affects the update rate
for the TEMP_OUT register (see Table 23) as well.
Table 34. SMPL_PRD (Base Address = 0x36), Read/Write
Bits Description (Default = 0x0001)
[15:13] Not used
[12:8] D, decimation rate setting, binomial, see Figure 21
[7:1] Not used
0 Clock
1 = internal sampling clock, 819.2 SPS
0 = external sampling clock
INPUT CLOCK CONFIGURATION
SMPL_PRD[0] (see Table 34) provides a control for synchro-
nizing the internal sampling to an external clock source. Set
SMPL_PRD[0] = 0 (DIN = 0xB600) and GPIO_CTRL[3] = 0
(DIN = 0xB200) to enable the external clock. See Table 2 and
Figure 4 for timing information.
Digital Filtering
The SENS_AVG register in Table 35 provides user controls for
the low-pass filter. This filter contains two cascaded averaging
filters that provide a Bartlett window, FIR filter response (see
Figure 21). For example, set SENS_AVG[2:0] = 100 (DIN = 0xB804)
to set each stage to 16 taps. When used with the default sample
rate of 819.2 SPS and zero decimation (SMPL_PRD[15:8] = 0x00),
this value reduces the sensor bandwidth to approximately 16 Hz.
0
–20
–40
–60
–80
–100
–120
–140
0.001 0.01 0.1 1
MAG NI TUDE ( dB)
FREQUENCY (
f
/
f
S
)
N = 2
N = 4
N = 16
N = 64
09946-018
Figure 20. Bartlett Window, FIR Filter Frequency Response
(Phase Delay = N Samples)
Dynamic Range
The SENS_AVG[10:8] bits provide three dynamic range
settings for the gyroscopes. The lower dynamic range settings
(±250°/sec and ±500°/sec) limit the minimum filter tap sizes
to maintain resolution. For example, set SENS_AVG[10:8] =
010 (DIN = 0xB902) for a measurement range of ±500°/sec.
Because this setting can influence the filter settings, program
SENS_AVG[10:8] before programming SENS_AVG[2:0] if more
filtering is required.
Table 35. SENS_AVG (Base Address = 0x38), Read/Write
Bits Description (Default = 0x0402)
[15:11] Not used
[10:8] Measurement range (sensitivity) selection
100 = ±1000°/sec (default condition)
010 = ±500°/sec, filter taps ≥ 4 (Bits[2:0] ≥ 0x02)
001 = ±250°/sec, filter taps ≥ 16 (Bits[2:0] ≥ 0x04)
[7:3] Not used
[2:0] Filter Size Variable B
Number of taps in each stage; NB = 2B
See Figure 20 for filter response
Rev. E | Page 21 of 28
ADIS16448 Data Sheet
MEMS
SENSOR
LOW-PASS
FILTER
330Hz
CLOCK
819.2SPS
ADC
BARTLETT WINDOW
FIR FILTER
AVERAGE/
DECIMATION
FILTER
EXTERNAL CLOCK E NABLED
BY SMPL_PRD[0] = 0
GYROSCOPES
LOW-PASS, T WO - P OLE ( 404Hz , 757Hz)
ACCELEROMETERS
LOW-PASS, SINGLE-PO L E (330Hz)
B = SENS_AVG[2:0]
N
B
= 2
B
N
B
= NUMBER OF TAPS
(PER STAGE)
D = SMP L_PRD[ 12: 8]
N
D
= 2
D
N
D
= NUMBER OF TAPS
÷N
D
x(n)
n = 1
1N
B
N
B
x(n)
n = 1
1N
B
N
B
x(n)
n = 1
1N
D
N
D
09946-019
Figure 21. Sampling and Frequency Response Block Diagram
MAGNETOMETER/BAROMETER
The magnetometer (xMAGN_OUT) and barometer output
registers (BARO_OUT) update at a rate of 51.2 SPS. When
using the external clock, these registers update at a rate of 1/16th
of the input clock frequency. The update rates for the magne-
tometer and barometers do not change with the SMPL_PRD
[15:8] register settings, unless SMPL_PRD[15:8] > 0x04.
New Data Indicators
DIAG_STAT[7] (see Table 31) offers a new data bit for the
magnetometer (xMAGN_OUT) and barometer output registers
(BARO_OUT) registers. This bit rises to a 1, right after the
xMAGN_OUT and BARO_OUT registers receive fresh data.
It returns to 0 after one of the four registers experiences a
read request.
The SEQ_CNT register (see Table 36) provides a counter
function to help determine when there is new data in the
magnetometer and barometer registers. When using the full
sample rate (SMPL_PRD[15:8] = 0x00), SEQ_CNT starts
at a value of 16 and decrements every time the gyroscope data
updates. When it reaches a value of 1, it returns to a value
16 after the next gyroscope update cycle. When SEQ_CNT
equals 16, the magnetometer (xMAGN_OUT) and barometer
(BARO_OUT) registers contain new data. The SEQ_CNT
register can be useful during initialization to help synchronize
read loops for new data in both magnetometer and barometer
outputs. When beginning a continuous read loop, read SEQ_CNT
to determine the number of sample cycles that must pass, before
the magnetometer and barometer registers update.
Table 36. SEQ_CNT (Base Address = 0x3A), Read Only
Bits Description
[15:11] Don’t care
[6:0] Binary counter: 16 to 1, when D = 0
Counter range = 16/2D – 1, when 1 ≤ D ≤ 4
See Table 34 for more information on D
Rev. E | Page 22 of 28
Data Sheet ADIS16448
CALIBRATION
The mechanical structure and assembly process of the ADIS16448
provide excellent position and alignment stability for each sensor,
even after subjected to temperature cycles, shock, vibration, and
other environmental conditions. The factory calibration includes a
dynamic characterization of each gyroscope and accelerometer over
temperature and generates sensor specific correction formulas.
GYROSCOPES
The XGYRO_OFF (see Table 37), YGYRO_OFF (see Table 38),
and ZGYRO_OFF (see Table 39) registers provide user-
programmable bias adjustment function for the X-, Y-, and
Z-axis gyroscopes, respectively. Figure 22 illustrates that they
contain bias correction factors that adjust to the sensor data
immediately before it loads into the output register.
xGYRO_OFF
xACCL_OFF
MEMS
SENSOR ADC FACTORY
CALIBRATION
AND
FILTERING
xGYRO_OUT
xACCL_OUT
09946-020
Figure 22. User Calibration, Gyroscopes, and Accelerometers
Gyroscope Bias Error Estimation
Any system level calibration function must start with an estimate
of the bias errors, which typically comes from a sample of gyro-
scope output data, when the device is not in motion. The sample
size of data depends on the accuracy goals. Figure 7 provides a
trade-off relationship between averaging time and the expected
accuracy of a bias measurement. Vibration, thermal gradients,
and power supply instability can influence the accuracy of this
process.
Table 37. XGYRO_OFF (Base Address = 0x1A), Read/Write
Bits Description (Default = 0x0000)
[15:0] X-axis, gyroscope offset correction factor,
twos complement, 0.01°/sec/LSB, 0°/sec = 0x0000
Table 38. YGYRO_OFF (Base Address = 0x1C), Read/Write
Bits
Description (Default = 0x0000)
[15:0] Y-axis, gyroscope offset correction factor,
twos complement, 0.01°/sec/LSB, 0°/sec = 0x0000
Table 39. ZGYRO_OFF (Base Address = 0x1E), Read/Write
Bits Description (Default = 0x0000)
[15:0]
Z-axis, gyroscope offset correction factor,
twos complement, 0.01°/sec/LSB, 0°/sec = 0x0000
Gyroscope Bias Correction Factors
When the bias estimate is complete, multiply the estimate by −1
to change its polarity, convert it into digital format for the offset
correction registers (see Table 37, Table 38, and Table 39), and
write the correction factors to the correction registers. For
example, lower the X-axis bias by 10 LSB (0.1°/sec) by setting
XGYRO_OFF = 0xFFF6 (DIN = 0x9BFF, 0 x9AF6).
Single Command Bias Correction
GLOB_CMD[0] (see Table 25) loads the xGYRO_OFF registers
with the values that are the opposite of the values that are in
xGYRO_OUT, at the time of initiation. Use this command,
together with the decimation filter (SMPL_PRD[12:8], see
Table 34), to automatically average the gyroscope data and
improve the accuracy of this function, as follows:
1. Set SENS_AVG[10:8] = 001 (DIN = 0xB901) to optimize
the xGYRO_OUT sensitivity to 0.01°/sec/LSB.
2. Set SMPL_PRD[12:8] = 0x10 (DIN = 0xB710) to set the
decimation rate to 65,536 (216), which provides an averaging
time of 80 seconds (65,536 ÷ 819.2 SPS).
3. Wait for 80 seconds while keeping the device motionless.
4. Set GLOB_CMD[0] = 1 (DIN = 0xBE01) and wait for the
time it takes to perform the flash memory backup.
ACCELEROMETERS
The XACCL_OFF (see Table 40), YAC CL _OFF (see Table 41),
and ZACCL_OFF (see Table 42) registers provide user
programmable bias adjustment function for the X-, Y-, and
Z-axis accelerometers, respectively. These registers adjust the
accelerometer data in the same manner as XGYRO_OFF in
Figure 22.
Table 40. XACCL_OFF (Base Address = 0x20), Read/Write
Bits Description (Default = 0x0000)
[15:0] X-axis, accelerometer offset correction factor,
twos complement, 1/1200 g/LSB, 0 g = 0x0000
Table 41. YACCL_OFF (Base Address = 0x22), Read/Write
Bits Description (Default = 0x0000)
[15:14] Not used
[13:0] Y-axis, accelerometer offset correction factor,
twos complement, 1/1200 g/LSB, 0 g = 0x0000
Table 42. ZACCL_OFF (Base Address = 0x24), Read/Write
Bits Description (Default = 0x0000)
[15:14] Not used
[13:0] Z-axis, accelerometer offset correction factor,
twos complement, 1/1200 g/LSB, 0 g = 0x0000
Accelerometer Bias Error Estimation
Under static conditions, orient each accelerometer in positions
where the response to gravity is predictable. A common approach
to this is to measure the response of each accelerometer when
they are oriented in peak response positions, that is, where ±1 g
is the ideal measurement position. Next, average the +1 g and
−1 g accelerometer measurements together to estimate the
Rev. E | Page 23 of 28
ADIS16448 Data Sheet
residual bias error. Using more points in the rotation can
improve the accuracy of the response.
Accelerometer Bias Correction Factors
When the bias estimate is complete, multiply the estimate by
−1 to change its polarity, convert it to the digital format for the
offset correction registers (see Table 40, Table 41 or Table 42)
and write the correction factors to the correction registers. For
example, lower the x-axis bias by 12 LSB (10 mg) by setting
XACCL_OFF = 0xFFF4 (DIN = 0xA1FF, 0xA0F4).
Point of Percussion Alignment
Set MSC_CTRL[6] = 1 (DIN = 0xB446) to enable this feature
and maintain the factory default settings for DIO1. This feature
performs a point of percussion translation to the point identified
in Figure 23. See Table 30 for more information on MSC_CTRL.
09946-119
ORIGINALIGNMENT
REF ERE NCE P OI NT
SEE MSC_CTRL[6].
Figure 23. Point of Percussion Physical Reference
MAGNETOMETER CALIBRATION
The ADIS16448 provides registers that contribute to both hard
iron and soft iron correction factors, as shown in Figure 24.
ADC xMAGN_OUT
MAGNETIC
SENSOR
FACTORY
CALIBRATION
AND FI LTERING
1 + xMAG N_S IC
xMAGN_HIC
09946-022
Figure 24. Hard Iron and Soft Iron Factor Correction
Hard Iron Correction
The XMAGN_HIC (see Table 43), YMAGN_HIC (see
Table 44), and ZMAGN_HIC (see Table 45) registers provide
the user programmable bias adjustment function for the X-, Y-,
and Z-axis magnetometers, respectively. Hard iron effects
result in an offset of the magnetometer response.
Table 43. XMAGN_HIC (Base Address = 0x26), Read/Write
Bits Description (Default = 0x0000)
[15:0] X-axis hard iron correction factor,
twos complement, 7 LSB/mgauss, 0x0000 = 0
Table 44. YMAGN_HIC (Base Address = 0x28), Read/Write
Bits Description (Default = 0x0000)
[15:0] Y-axis hard iron correction factor,
twos complement, 7 LSB/mgauss, 0x0000 = 0
Table 45. ZMAGN_HIC (Base Address = 0x2A), Read/Write
Bits Description (Default = 0x0000)
[15:0] Z-axis hard iron correction factor,
twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss
Hard Iron Factors
When the hard iron error estimation is complete, take the
following steps:
1. Multiply the estimate by −1 to change its polarity.
2. Convert it into digital format for the hard iron correction
registers (see Table 43).
3. Write the correction factors to the registers. For example,
lower the x-axis bias by 10 LSB (~1.429 mgauss) by setting
XMAGN_HIC = 0xFFF6 (DIN = 0xA7FF, 0xA6F6)
Soft Iron Effects
The XMAGN_SIC (see Table 46), YMAGN_SIC (see Table 47),
and ZMAGN_SIC (see Table 48) registers provide an adjust-
ment variable for the magnetometer sensitivity adjustment
in each magnetometer response to simplify the process of
performing a system level soft iron correction.
Table 46. XMAGN_SIC (Base Address = 0x2C), Read/Write
Bits Description (Default = 0x8000)
[15:0] X-axis soft iron correction factor,
twos complement format, 1 LSB = 100%/32,767
0x7FFF = 100% increase (2×)
0x8000 = 100% decrease (0×)
Table 47. YMAGN_SIC (Base Address = 0x2E), Read/Write
Bits Description (Default = 0x8000)
[15:0]
Y-axis soft iron correction factor,
twos complement format, 1 LSB = 100%/32,767
0x7FFF = 100% increase (2×)
0x8000 = 100% decrease (0×)
Table 48. ZMAGN_SIC (Base Address = 0x30), Read/Write
Bits Description (Default = 0x8000)
[15:0] Z-axis soft iron correction factor,
twos complement format, 1 LSB = 100%/32,767
0x7FFF = 100% increase (2×)
0x8000 = 100% decrease (0×)
FLASH UPDATES
When using the user calibration registers to optimize system
level accuracy, set GLOB_CMD[3] = 1 (DIN = 0xBE04) to save
these settings in nonvolatile flash memory. Be sure to consider
the endurance rating of the flash memory when determining how
often to update the user correction factors in the flash memory.
Rev. E | Page 24 of 28
Data Sheet ADIS16448
RESTORING FACTORY CALIBRATION
Set GLOB_CMD[1] = 1 (DIN = 0xBE02) to execute the factory
calibration restore function, which resets the gyroscope and
accelerometer offset registers to 0x0000 and all sensor data to 0.
Then, it automatically updates the flash memory and restarts
sampling and processing data. See Table 25 for information on
GLOB_CMD.
Rev. E | Page 25 of 28
ADIS16448 Data Sheet
ALARMS
Alarm 1 and Alarm 2 provide two independent alarms with
programmable levels, polarity, and data sources.
STATIC ALARM USE
The static alarms setting compares the data source selection
(ALM_CTRL[15:8]) with the values in the ALM_MAGx registers
listed in Table 49 and Table 50, using ALM_MAGx[15] to deter-
mine the trigger polarity. The data format in these registers
matches the format of the data selection in ALM_CTRL[15:8].
See Table 54, Alarm 1, for a static alarm configuration example.
Table 49. ALM_MAG1 (Base Address = 0x40), Read/Write
Bits Description (Default = 0x0000)
[15:0] Threshold setting; matches for format of
ALM_CTRL[11:8] output register selection
Table 50. ALM_MAG2 (Base Address = 0x42), Read/Write
Bits Description (Default = 0x0000)
[15:0] Threshold setting; matches for format of
ALM_CTRL[15:12] output register selection
DYNAMIC ALARM USE
The dynamic alarm setting monitors the data selection for a
rate-of-change comparison. The rate-of-change comparison is
represented by the magnitude in the ALM_MAGx registers over
the time represented by the number-of-samples setting in the
ALM_SMPLx registers, located in Table 51. See Table 54, Alarm 2,
for a dynamic alarm configuration example.
Table 51. ALM_SMPL1 (Base Address = 0x44), Read/Write
Bits Description (Default = 0x0000)
[15:8] Not used
[7:0]
Binary, number of samples (both 0x00 and 0x01 = 1)
Table 52. ALM_SMPL2 (Base Address = 0x46), Read/Write
Bits Description (Default = 0x0000)
[15:8] Not used
[7:0] Binary, number of samples (both 0x00 and 0x01 = 1)
ALARM REPORTING
The DIAG_STAT[9:8] bits provide error flags that indicate an
alarm condition. The ALM_CTRL[2:0] bits provide controls
for a hardware indicator using DIO1 or DIO2.
Table 53. ALM_CTRL (Base Address = 0x48), Read/Write
Bits Description (Default = 0x0000)
[15:12] Alarm 2 data source selection
0000 = disable
0001 = XGYRO_OUT
0010 = YGYRO_OUT
0011 = ZGYRO_OUT
0100 = XACCL_OUT
0101 = YACCL_OUT
0110 = ZACCL_OUT
0111 = XMAGN_OUT
1001 = YMAGN_OUT
1010 = ZMAGN_OUT
1011 = BARO_OUT
1100 = TEMP_OUT
[11:8] Alarm 1 data source selection (same as Alarm 2)
7 Alarm 2, dynamic/static (1 = dynamic, 0 = static)
6
Alarm 1, dynamic/static (1 = dynamic, 0 = static)
5 Alarm 2, polarity (1 = greater than ALM_MAG2)
4 Alarm 1, polarity (1 = greater than ALM_MAG1)
3 Data source filtering (1 = filtered, 0 = unfiltered)
2 Alarm indicator (1 = enabled, 0 = disabled)
1 Alarm indicator active polarity (1 = high, 0 = low)
0 Alarm output line select (1 = DIO2, 0 = DIO1)
Alarm Example
Table 54 offers an example that configures Alarm 1 to trigger when
filtered ZACCL_OUT data drops below 0.7 g and Alarm 2 to
trigger when filtered ZGYRO_OUT data changes by more than
50°/sec over a 100 ms period, or 500°/sec2. The filter setting
helps reduce false triggers from noise and refines the accuracy
of the trigger points. The ALM_SMPL2 setting of 82 samples
provides a comparison period that is approximately equal to
100 ms for an internal sample rate of 819.2 SPS.
Table 54. Alarm Configuration Example
DIN
Description
0xC936, ALM_CTRL = 0x36AF
0xC8AF Alarm 2: dynamic, Δ-ZGYRO_OUT
(Δ-time, ALM_SMPL2) > ALM_MAG2
Alarm 1: static, ZACCL_OUT < ALM_MAG1, filtered data
DIO2 output indicator, positive polarity
0xC313,
0xC288
ALM_MAG2 = 0x04E2 = 1,250 LSB = 50°/sec
0xC10A,
0xC0F0
ALM_MAG1 = 0x0348 = 840 LSB = +0.7 g
0xC652 ALM_SMPL2[7:0] = 0x52 = 82 samples
82 samples ÷ 819.2 SPS = ~100 ms
Rev. E | Page 26 of 28
Data Sheet ADIS16448
APPLICATIONS INFORMATION
MOUNTING TIPS
The mounting and installation process can influence gyroscope
bias repeatability and other key parametric behaviors. To
preserve the best performance, use the following guidelines
when developing an attachment approach for the ADIS16448:
• Focus mounting force at the machine screw locations.
• Avoid direct force application on the substrate.
• Avoid placing mounting pressure on the package lid,
except for the edges that border the exposed side of the
substrate.
• Use a consistent mounting torque of 28 inch-ounces on
mounting hardware.
• Avoid placing translational forces on the electrical
connector.
For more ideas on mounting ideas and tips, refer to the
AN-1305 Application Note.
POWER SUPPLY CONSIDERATIONS
The power supply must be within 3.15 V and 3.45 V for normal
operation and optimal performance. During start up, the
internal power conversion system starts drawing current when
VDD reaches 1.6 V. The internal processor begins initializing
when VDD is equal to 2.35 V. After the processor starts, VDD
must reach 2.7 V within 128 ms. Also, make sure that the power
supply drops below 1.6 V to shut the device down. Figure 9
shows a 10 µF capacitor on the power supply. Using this
capacitor supports optimal noise performance in the sensors.
ADIS16448/PCBZ
The ADIS16448/PCBZ includes one ADIS16448BMLZ, one
interface PCB, and one flexible connector/cable. This particular
flexible connector mates the ADIS16448 20-pin connector to
systems that presently support the 24-pin interface from other
products in this family, such as the ADIS16365, ADIS16375, and
ADIS16488A.This combination of components enables quicker
installation for prototype evaluation and algorithm development.
Figure 25 provides a mechanical design example for using these
three components in a system.
ADIS16448BMLZ
INTERFACE PCB
33.40mm 23.75mm
20.15mm
30.10mm
10.07mm
15.05mm
J1 1
11
1
11
12
2
12
2J2
NOTES
1. USE FO UR M 2 M ACHINE SCRE WS TO ATTACH T HE ADIS16448.
2. USE FO UR M 3 M ACHINE SCRE WS TO ATTACH T HE INTE R FACE PCB.
FLEXIBLE CONNECTOR/CABLE
15mm TO
45mm
09946-021
Figure 25. Physical Diagram for Mounting the ADIS16448/PCBZ
Figure 26 provides the pin assignments for the interface board.
1 2
34
5 6
78
910
1112
DNC
DNC
DNC
DNC
DIO2
DNC
DNC
DIO1
DIO4
DIO3
GND
J2
GND
2
4
6
8
10
1
3
5
7
9
11 12
RST
CS
GND
GND
VDD
GND
VDD
VDD
DIN
DOUT
SCLK
J1
DNC
09946-122
Figure 26. J1/J2 Pin Assignments for Interface PCB
Installation
The following steps provide an example installation process for
using these three components:
• Drill and tap M2 and M3 holes in the system frame, according
to the locations in Figure 25.
• Install the ADIS16448 using M2 machine screws. Use a
mounting torque of 25 inch-ounces.
• Install the interface PCB using M3 machine screws.
• Connect J1 on the interface flex to the ADIS16448BMLZ
connector.
• Connect J2 on the interface flex to J3 on the interface PCB.
Note that J2 (interface flex) has 20 pins and J3 (interface PCB)
has 24 pins. Make sure that Pin 1 on J2 (interface flex)
connects to Pin 20 on J3 (interface PCB). J3 has a Pin 1
indicator to help guide this connection.
• Use J1 and J2 on the interface PCB to make the electrical
connection with the system supply and embedded pro-
cessor, using 12-pin, 1 mm ribbon cables. The following
parts may be useful in building this type of cable: 3M
Part Number 152212-0100-GB (ribbon crimp connector)
and 3M Part Number 3625/12 (ribbon cable).
The C1/C2 pads on the interface PCB do not have capacitors on
them, but these pads can support the suggested power supply
capacitor of 10 µF (see Figure 9).
PC-BASED EVALUATION TOOLS
The E VA L -ADIS supports PC-based evaluation of the
ADIS16448. Go to www.analog.com/EVAL-ADIS, to down-
load the user guide (UG-287) and software (IMU evaluation).
Rev. E | Page 27 of 28
ADIS16448 Data Sheet
OUTLINE DIMENSIONS
Figure 27. 20-Lead Module with Connector Interface
(ML-20-2)
Dimensions shown in millimeters
ORDERING GUIDE
Model1 Temperature Range Package Description Package Option
ADIS16448BMLZ −40°C to +105°C 20-Lead Module with Connector Interface ML-20-2
ADIS16448/PCBZ Interface PCB
1 Z = RoHS Compliant Part.
©2012–2015 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D09946-0-8/15(E)
Rev. E | Page 28 of 28
