ACS732KLATR-40AB-T - ALLEGRO MICROSYSTEMS

The ACS732 and ACS733 are a new generation of high

bandwidth current sensor ICs from Allegro™. These devices

provide a compact, fast, and accurate solution for measuring

high-frequency currents in DC/DC converters and other

switching power applications. The ACS732 and ACS733

offer high isolation, high bandwidth Hall-effect-based current

sensing with user-configurable overcurrent fault detection.

These features make them ideally suited for high-frequency

transformer and current transformer replacement in applications

running at high voltages.

The ACS732 and ACS733 are suitable for all markets, including

automotive, industrial, commercial, and communications

systems. They may be used in motor control, load detection

and management, switch-mode power supplies, and overcurrent

fault protection applications.

The wide body SOIC-16 package allows for easy

implementation. Applied current flowing through the copper

conduction path generates a magnetic field that is sensed by the

IC and converted to a proportional voltage. Current is sensed

differentially in order to reject external common-mode fields.

Device accuracy is optimized through the close proximity of the

magnetic field to the Hall transducers. A precise, proportional

voltage is provided by the Hall IC, which is factory-programmed

after packaging for high accuracy. The fully integrated package

has an internal copper conductive path with a typical resistance

of 1 mΩ, providing low power loss.

The current-carrying pins (pins 1 through 8) are electrically

isolated from the sensor leads (pins 9 through 16). This allows

the devices to be used in high-side current sensing applications

without the use of high-side differential amplifiers or other

costly isolation techniques.

ACS732-33-DS, Rev. 18

MCO-0000316

• AEC-Q100 automotive qualified

• High bandwidth, 1 MHz analog output

• Differential Hall sensing rejects common-mode fields

• High-isolation SOIC16 wide body package provides

galvanic isolation for high-voltage applications

• Integrated shield virtually eliminates capacitive coupling

from current conductor to die, greatly suppressing output

noise due to high dv/dt transients

• Industry-leading noise performance with greatly

improved bandwidth through proprietary amplifier and

filter design

• UL60950-1 (ed. 2) certified

□Dielectric Strength Voltage = 3.6 kVRMS

□Basic Isolation Working Voltage = 616 VRMS

• Fast and externally configurable overcurrent fault

detection

• 1 mΩ primary conductor resistance for low power loss

and high inrush current withstand capability

• Options for 3.3 V and 5 V single supply operation

• Output voltage proportional to AC and DC current

• Factory-trimmed sensitivity and quiescent output voltage

for improved accuracy

• Nearly zero magnetic hysteresis

• Ratiometric output from supply voltage

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

Figure 1: Typical Application Circuit

ACS732/ACS733 outputs

an analog signal, VIOUT, that

changes proportionally with

the bidirectional AC or DC

primary sensed current, IP

within the specied mea-

surement range.

The overcurrent threshold

may be set with a resistor

divider tied to the VOC pin.

FEATURES AND BENEFITS DESCRIPTION

PACKAGE: 16-Pin SOICW (suffix LA)

Not to scale

ACS732 and ACS733

ACS732/

ACS733

IP+

IP–

VCC

VOC

FAULT

VIOUT

PROGRAM

GND

CBYPASSRF(PULLUP

)

Continued on next page...

June 29, 2020

CB Certicate Number:

US-23711-A2-UL

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

SELECTION GUIDE

Part Number

Optimized

Range, IP

(A)

Sensitivity [1],

Sens(Typ)

(mV/A)

Nominal Supply

Voltage, VCC, (V)

(°C) Packing [2]

ACS732KLATR-20AB-T ±20 100

5.0

–40 to 125 Tape and reel, 1000 pieces per reel

ACS732KLATR-40AB-T ±40 50

ACS732KLATR-65AB-T ±65 30

ACS732KLATR-65AU-T 65 60

ACS732KLATR-75AB-T ±75 26.6

ACS733KLATR-20AB-T ±20 66

3.3

ACS733KLATR-20AB-T-H [3] ±20 66

ACS733KLATR-40AB-T ±40 33

ACS733KLATR-40AU-T 40 66

ACS733KLATR-65AB-T ±65 20

[1] Measured at Nominal Supply Voltage, VCC.

[2] Contact Allegro for additional packing options.

[3] -H denotes 100% cold calibration at the Allegro factory for improved accuracy.

DESCRIPTION (continued)

The ACS732 and ACS733 are provided in a small, low profile,

surface-mount SOIC-16 wide-body package. The leadframe is plated

with 100% matte tin, which is compatible with standard lead (Pb)

free printed circuit board assembly processes. Internally, the device

is lead-free. These devices are fully calibrated prior to shipment

from the Allegro factory.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ABSOLUTE MAXIMUM RATINGS

Characteristic Symbol Notes Rating Units

Supply Voltage VCC 6 V

Reverse Supply Voltage VRCC –0.1 V

Output Voltage VIOUT 6 V

Reverse Output Voltage VRIOUT –0.1 V

Fault Output Voltage VFAULT 6 V

Reverse Fault Output Voltage VRFAULT –0.1 V

Forward VOC Voltage VVOC 6 V

Reverse VOC Voltage VVOC –0.1 V

Output Current IOUT Maximum survivable sink or source current on the output 15 mA

Maximum Continuous Current ICMAX TA = 25°C 55 A

Nominal Operating Ambient Temperature TARange K –40 to 125 °C

Maximum Junction Temperature TJ(max) 165 °C

Storage Temperature Tstg –65 to 170 °C

ISOLATION CHARACTERISTICS

Characteristic Symbol Notes Value Units

Dielectric Surge Strength Test Voltage VSURGE

Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5

1.2 µs (rise) / 50 µs (width). 10000 V

Dielectric Strength Test Voltage VISO

Agency type-tested for 60 seconds per UL 60950-1 (edition 2).

Production Tested at 2250 VRMS per UL 60950-1. 3600 VRMS

Working Voltage for Basic Isolation VWVBI

Maximum approved working voltage for basic (single) isolation

according to UL 60950-1 (edition 2).

870 VPK or VDC

616 VRMS

Clearance DCL Minimum distance through air from IP leads to signal leads. 7.5 mm

Creepage DCR Minimum distance along package body from IP leads to signal leads. 7.5 mm

Distance Through Insulation DTI Minimum internal distance through insulation 38 μm

Comparative Tracking Index CTI Material Group II 400 to 599 V

THERMAL CHARACTERISTICS

[1]

Characteristic Symbol Test Conditions Value Unit

Junction-to-Ambient Thermal Resistance RθJA

Mounted on the Allegro ASEK732/3 evaluation board. Performance

values include the power consumed by the PCB. [2] 17 °C/W

Junction-to-Lead Thermal Resistance RθJL Mounted on the Allegro ASEK732/3 evaluation board. [2] 5 °C/W

[1] Refer to the die temperature curves versus DC current plot (p. 29). Additional thermal information is available on the Allegro website.

[2] The Allegro evaluation board has 1500 mm2 of 2 oz. copper on each side, connected to pins 1 through 4 and pins 5 through 8, with thermal vias

connecting the layers. Performance values include the power consumed by the PCB. Further details on the board are available from the Frequently

Asked Questions document on our website. Further information about board design and thermal performance also can be found in the Applications

Information section of this datasheet.

ESD RATINGS

Characteristic Symbol Test Conditions Value Unit

Human Body Model VHBM Per AEC-Q100 ±12 kV

Charged Device Model VCDM Per AEC-Q100 ±1 kV

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Terminal List Table

Number Name Description

1,2,3,4 IP+ Positive terminals for current being sensed; fused internally.

5,6,7,8 IP– Negative terminals for current being sensed; fused internally.

9,10 GND Device ground terminal.

11 PROGRAM Programming input pin for factory calibration. Connect to

ground for best ESD performance.

12 VIOUT Analog output signal.

13 FAULT Overcurrent Fault output. Open drain.

14 VOC Set the overcurrent fault threshold via external resistor divider

on this pin.

15,16 VCC Device power supply terminal.

Package LA, 16-Pin

SOICW Pinout Diagram

PINOUT DIAGRAM AND TERMINAL LIST TABLE

IP+

IP–

VCC

VOC

FAULT

VIOUT

PROGRAM

GND

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

VCC VCC

IP+

IP–

GND GND

VIOUT

VOC

FAULT

PROGRAM

DIGITAL SYSTEM

Dynamic Trim

Compensation

Logic

EEPROM and

Control Logic

Programming

Control

Fault Filtering

Logic

Fault Trim

Offset

Trim

Analog

Filters

Sensitivity

Trim

Temperature

Sensor

Hall

Driver

POR

To All

Subcircuits

Hall Sensor Array

FUNCTIONAL BLOCK DIAGRAM

Figure 2: Functional Block Diagram

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

Supply Voltage VCC

ACS732 4.75 5.0 5.25 V

ACS733 3.14 3.3 3.46 V

Supply Current ICC

ACS732; VCC = 5.0 V – 24 35 mA

ACS733; VCC = 3.3 V – 20 35 mA

Bypass Capacitor

[2] CBYPASS VCC to GND 0.1 – – µF

Output Capacitance Load CLVIOUT to GND – – 220 pF

Output Resistive Load RLVIOUT to GND 50 – – kΩ

Output Saturation Voltage

VSAT(HIGH)

VCC = 5.0 V, TA = 25°C,

RL(PULLDOWN) = 50 kΩ to GND VCC – 0.3 – – V

VCC = 3.3 V, TA = 25°C,

RL(PULLDOWN) = 50 kΩ to GND VCC – 0.3 – – V

VSAT(LOW)

VCC = 5.0 V, TA = 25°C,

RL(PULLDOWN) = 50 kΩ to VCC – – 0.5 V

VCC = 3.3 V, TA = 25°C,

RL(PULLDOWN) = 50 kΩ to VCC – – 0.3 V

Primary Conductor Resistance RIP TA = 25°C – 1 – mΩ

Primary Hall Coupling Factor CF(P) TA = 25°C – 10.8 – G/A

Secondary Hall Coupling Factor CF(s) TA = 25°C – 2.4 – G/A

Hall Plate Sensitivity Matching Sensmatch TA = 25°C – 1 – %

Power On Delay Time tPOD TA = 25°C – 180 – µs

Internal Bandwidth BW Small signal –3 dB; CL = 220 pF – 1 – MHz

Rise Time [3] trTA = 25°C, CL = 0.22 nF – 0.7 – μs

Response Time [3] tRESPONSE TA = 25°C, CL = 0.22 nF – 0.2 – μs

Propagation Delay Time [3] tpd TA = 25°C, CL = 0.22 nF – 0.14 – µs

Output Slew Rate SR TA = 25°C, CL = 0.22 nF – 3.2 – V/µs

Zero Current Output Ratiometry Error ERAT(Q)

TA = 25°C, VCC = ±5 % variation of nominal

supply voltage –12 ±10 12 mV

Sensitivity Ratiometry Error ERAT(SENS)

TA = 25°C, VCC = ±5 % variation of nominal

supply voltage –2 ±1.72 2 %

Ratiometry Bandwidth BWRAT ±100 mV on VCC – 10 – kHz

Noise Density IND

VCC = 5.0 V, TA = 25°C, CL = 220 pF;

input referred – 55 – µA/√Hz

VCC = 3.3 V, TA = 25°C, CL = 220 pF;

input referred – 80 – µA/√Hz

COMMON ELECTRICAL CHARACTERISTICS: Over full range of TA, over supply voltage range VCC(MIN) through VCC(MAX) of a

sensor variant, CBYPASS = 0.1 µF, unless otherwise specied

Continued on next page...

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

OVERCURRENT FAULT CHARACTERISTICS

FAULT Response Time [4] tRESPONSE(F)

Time from IP > IFAULT to when FAULT pin is

pulled below VFAULT; input current step from 0

to 1.2 × IFAULT

0.2 0.5 0.75 μs

FAULT Release Time [4] tC(F)

Time from IP falling below IFAULT – IHYS to

when VFAULT is pulled above VFAULTL;

100 pF from FAULT to ground

0.1 – 0.45 µs

FAULT Range IFAULT

Relative to the full scale of IPR; set via the

VOC pin 0.5 × IPR – 2 × IPR A

FAULT Output Low Voltage VFAULT In fault condition; RF(PULLUP) = 10 kΩ – – 0.4 V

FAULT Pull-Up Resistance RF(PULLUP) 10 – 500 kΩ

FAULT Leakage Current IFAULT(LEAKAGE) – ±2 – nA

FAULT Hysteresis

[5] IHYST – 0.05 × IPR – A

FAULT Error [6] EFAULT

Tested at VVOC = 0.2 × VCC (IFAULT threshold

= 100% × IPR)– ±5 – %

VOC Input Range VVOC 0.1 × VCC –0.4 × VCC V

VOC Input Current IVOC – 10 100 nA

[1] Typical values are mean ± 3 sigma values.

[2] Use of a bypass capacitor is required to increase output stability.

[3] See denitions of Dynamic Response Characteristics section of this datasheet.

[4] Guaranteed by design.

[5] After IP goes above IFAULT, tripping the internal comparator, IP must fall below IFAULT – IHYST, before the internal comparator will reset.

[6] Fault error is dened as the value at which a fault is reported relative to the desired threshold for IFAULT.

COMMON ELECTRICAL CHARACTERISTICS (continued): Over full range of TA, over supply voltage range VCC(MIN) through

VCC(MAX) of a sensor variant, CBYPASS = 0.1 µF, unless otherwise specied

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS732KLATR-20AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 5 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –20 – 20 A

Sensitivity Sens – 100 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –2.5 ±1.6 2.5 %

IP = IPR(max), TA = 125°C –3 ±2 3 %

IP = IPR(max), TA = 25°C to 125°C – ±2.6 – %

IP = IPR(max), TA = –40°C –7.5 ±4.5 7.5 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –1.5 ±0.75 1.5 %

IP = IPR(max) / 2, TA = 125°C –1.5 ±1.25 1.5 %

IP = IPR(max) / 2, TA = –40°C –3 ±2 3 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –55 ±30 55 mV

IP = 0 A, TA = 125°C –25 ±18 25 mV

IP = 0 A, TA = 25°C to 125°C – ±50 – mV

IP = 0 A, TA = –40°C –120 ±100 120 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–1 ±0.2 1 %

TA = 125°C, up to full-scale IP– ±0.3 – %

TA = –40°C, up to full-scale IP– ±0.5 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±11.5 – %

IP = IPR(max), TA = –40°C, 25°C – ±11.5 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±220 – mV

TA = –40°C, 25°C – ±220 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS732KLATR-40AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 5 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –40 – 40 A

Sensitivity Sens – 50 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –2.5 ±1.6 2.5 %

IP = IPR(max), TA = 125°C –2.5 ±1 2.5 %

IP = IPR(max), TA = 25°C to 125°C – ±2.6 – %

IP = IPR(max), TA = –40°C –6.5 ±3.4 6.5 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –2 ±1.5 2 %

IP = IPR(max) / 2, TA = 125°C –2 ±0.9 2 %

IP = IPR(max) / 2, TA = –40°C –4 ±2.7 4 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –40 ±27 40 mV

IP = 0 A, TA = 125°C –20 ±8 20 mV

IP = 0 A, TA = 25°C to 125°C – ±45 – mV

IP = 0 A, TA = –40°C –90 ±58 90 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–1.2 ±0.8 1.2 %

TA = 125°C, up to full-scale IP– ±0.33 – %

TA = –40°C, up to full-scale IP– ±2.5 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±6.3 – %

IP = IPR(max), TA = –40°C, 25°C – ±6.3 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±110 – mV

TA = –40°C, 25°C – ±110 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS732KLATR-65AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 5 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –65 – 65 A

Sensitivity Sens – 30 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –2.5 ±1.6 2.5 %

IP = IPR(max), TA = 125°C –2.5 ±1 2.5 %

IP = IPR(max), TA = 25°C to 125°C – ±2.6 – %

IP = IPR(max), TA = –40°C –6.5 ±3.4 6.5 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –2 ±1.5 2 %

IP = IPR(max) / 2, TA = 125°C –2 ±0.9 2 %

IP = IPR(max) / 2, TA = –40°C –4 ±2.7 4 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –45 ±27 45 mV

IP = 0 A, TA = 125°C –25 ±8 25 mV

IP = 0A, TA = 25°C to 125°C – ±45 – mV

IP = 0 A, TA = –40°C –95 ±58 95 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–2.4 ±1.7 2.4 %

TA = 125°C, up to full-scale IP– ±0.6 – %

TA = –40°C, up to full-scale IP– ±5.8 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±4.7 – %

IP = IPR(max), TA = –40°C, 25°C – ±4.7 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±66 – mV

TA = –40°C, 25°C – ±66 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS732KLATR-65AU PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 5 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR 0 – 65 A

Sensitivity Sens – 60 – mV/A

Zero Current Output Voltage VIOUT(Q) Unidirectional, IP = 0 A – 0.1 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –2.5 ±1.8 2.5 %

IP = IPR(max), TA = 125°C –3 ±2 3 %

IP = IPR(max), TA = 25°C to 125°C – ±2.9 – %

IP = IPR(max), TA = –40°C –8 ±4.5 8 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –1.5 ±0.75 1.5 %

IP = IPR(max) / 2, TA = 125°C –1.5 ±1.25 1.5 %

IP = IPR(max) / 2, TA = –40°C –4 ±2 4 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –55 ±30 55 mV

IP = 0 A, TA = 125°C –25 ±18 25 mV

IP = 0A, TA = 25°C to 125°C – ±50 – mV

IP = 0 A, TA = –40°C –120 ±100 120 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–2.5 ±1.8 2.5 %

TA = 125°C, up to full-scale IP– ±0.7 – %

TA = –40°C, up to full-scale IP– ±4.2 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±7.4 – %

IP = IPR(max), TA = –40°C, 25°C – ±7.4 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±132 – mV

TA = –40°C, 25°C – ±132 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS732KLATR-75AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 5 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range [2] IPR –75 – 75 A

Sensitivity Sens – 26.6 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [3] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [4] ETOT

IP = IPR(max), TA = 25°C –2.5 ±1.6 2.5 %

IP = IPR(max), TA = 125°C –2.5 ±1 2.5 %

IP = IPR(max), TA = 25°C to 125°C – ±2.6 – %

IP = IPR(max), TA = –40°C –6.5 ±3.4 6.5 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –2 ±1.5 2 %

IP = IPR(max) / 2, TA = 125°C –2 ±0.9 2 %

IP = IPR(max) / 2, TA = –40°C –4 ±2.7 4 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –45 ±27 45 mV

IP = 0 A, TA = 125°C –25 ±8 25 mV

IP = 0 A, TA = 25°C to 125°C – ±45 – mV

IP = 0 A, TA = –40°C –95 ±58 95 mV

Linearity Error [5] ELIN

TA = 25°C, up to full-scale IP–2.9 ±2.3 2.9 %

TA = 125°C, up to full-scale IP– ±1 – %

TA = –40°C, up to full-scale IP– ±8.1 – %

LIFETIME DRIFT CHARACTERISTICS [6]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±4.4 – %

IP = IPR(max), TA = –40°C, 25°C – ±4.4 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±59 – mV

TA = –40°C, 25°C – ±59 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] Devices trimmed at half-scale IP

. Operating above this limit may result in decreased accuracy.

[3] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[4] Percentage of IP

, with IP = IPR(MAX) / 2.

[5] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[6] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS733KLATR-20AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 3.3 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –20 – 20 A

Sensitivity Sens – 66 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –4.5 ±1.7 4.5 %

IP = IPR(max), TA = 125°C –3 ±1.25 3 %

IP = IPR(max), TA = 25°C to 125°C – ±2.8 – %

IP = IPR(max), TA = –40°C –10 ±5 10 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –1.5 ±1 1.5 %

IP = IPR(max) / 2, TA = 125°C –1.5 ±0.8 1.5 %

IP = IPR(max) / 2, TA = –40°C –3 ±2 3 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –55 ±21 55 mV

IP = 0 A, TA = 125°C –25 ±10 25 mV

IP = 0 A, TA = 25°C to 125°C – ±35 – mV

IP = 0 A, TA = –40°C –120 ±80 120 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–1 ±0.3 1 %

TA = 125°C, up to full-scale IP– ±0.4 – %

TA = –40°C, up to full-scale IP– ±0.4 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±14 – %

IP = IPR(max), TA = –40°C, 25°C – ±14 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±145 – mV

TA = –40°C, 25°C – ±145 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS733KLATR-20AB-H PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 3.3 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –20 – 20 A

Sensitivity Sens – 66 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –4.5 ±1.7 4.5 %

IP = IPR(max), TA = 125°C –3 ±1.25 3 %

IP = IPR(max), TA = 25°C to 125°C – ±2.8 – %

IP = IPR(max), TA = –40°C –4.5 ±1.7 4.5 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –1.5 ±1 1.5 %

IP = IPR(max) / 2, TA = 125°C –1.5 ±0.8 1.5 %

IP = IPR(max) / 2, TA = –40°C –1.5 ±1 1.5 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –55 ±21 55 mV

IP = 0 A, TA = 125°C –25 ±10 25 mV

IP = 0 A, TA = 25°C to 125°C – ±35 – mV

IP = 0 A, TA = –40°C –55 ±21 55 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–1 ±0.3 1 %

TA = 125°C, up to full-scale IP– ±0.4 – %

TA = –40°C, up to full-scale IP– ±0.4 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±14 – %

IP = IPR(max), TA = –40°C, 25°C – ±14 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±145 – mV

TA = –40°C, 25°C – ±145 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS733KLATR-40AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 3.3 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –40 – 40 A

Sensitivity Sens – 33 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –3 ±1.4 3 %

IP = IPR(max), TA = 125°C –2 ±1.25 2 %

IP = IPR(max), TA = 25°C to 125°C – ±2.3 – %

IP = IPR(max), TA = –40°C –6.5 ±3 6.5 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –1.5 ±1.3 1.5 %

IP = IPR(max) / 2, TA = 125°C –2 ±1 2 %

IP = IPR(max) / 2, TA = –40°C –4.5 ±2.2 4.5 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –40 ±9 40 mV

IP = 0 A, TA = 125°C –40 ±7 40 mV

IP = 0 A, TA = 25°C to 125°C – ±15 – mV

IP = 0 A, TA = –40°C –75 ±35 75 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–1 ±0.5 1 %

TA = 125°C, up to full-scale IP– ±0.3 – %

TA = –40°C, up to full-scale IP– ±1.3 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±4.9 – %

IP = IPR(max), TA = –40°C, 25°C – ±4.9 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±73 – mV

TA = –40°C, 25°C – ±73 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS733KLATR-40AU PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 3.3 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR 0 – 40 A

Sensitivity Sens – 66 – mV/A

Zero Current Output Voltage VIOUT(Q) Unidirectional, IP = 0 A – 0.1 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –2.5 ±1 2.5 %

IP = IPR(max), TA = 125°C – 2.5 ±1 2.5 %

IP = IPR(max), TA = 25°C to 125°C – ±1.6 – %

IP = IPR(max), TA = –40°C –6.5 ±3.3 6.5 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –1.5 ±0.9 1.5 %

IP = IPR(max) / 2, TA = 125°C –1.5 ±0.9 1.5 %

IP = IPR(max) / 2, TA = –40°C –4 ±2.7 4 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –30 ±17 30 mV

IP = 0 A, TA = 125°C –25 ±12 25 mV

IP = 0 A, TA = 25°C to 125°C – ±28 – mV

IP = 0 A, TA = –40°C –110 ±70 110 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–1 ±0.4 1 %

TA = 125°C, up to full-scale IP– ±0.3 – %

TA = –40°C, up to full-scale IP– ±1.3 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±8 – %

IP = IPR(max), TA = –40°C, 25°C – ±8 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±145 – mV

TA = –40°C, 25°C – ±145 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ACS733KLATR-65AB PERFORMANCE CHARACTERISTICS: Valid at TA = –40°C to 125°C, VCC

= 3.3 V, CBYPASS = 0.1 µF,

unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [1] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –65 – 65 A

Sensitivity Sens – 20 – mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional, IP = 0 A – 0.5 × VCC – V

TOTAL OUTPUT ERROR COMPONENTS [2] ETOT = ESENS + 100 × VOE / (Sens × IP)

Total Output Error [3] ETOT

IP = IPR(max), TA = 25°C –3.5 ±1.8 3.5 %

IP = IPR(max), TA = 125°C –3 ±1.4 3 %

IP = IPR(max), TA = 25°C to 125°C – ±2.9 – %

IP = IPR(max), TA = –40°C –6 ±4 6 %

Sensitivity Error ESENS

IP = IPR(max) / 2, TA = 25°C –2.5 ±1.6 2.5 %

IP = IPR(max) / 2, TA = 125°C –2.5 ±1.6 2.5 %

IP = IPR(max) / 2, TA = –40°C –4.5 ±3.1 4.5 %

Voltage Offset Error VOE

IP = 0 A, TA = 25°C –30 ±17 30 mV

IP = 0 A, TA = 125°C –25 ±7 25 mV

IP = 0 A, TA = 25°C to 125°C – ±28 – mV

IP = 0 A, TA = –40°C –70 ±31 70 mV

Linearity Error [4] ELIN

TA = 25°C, up to full-scale IP–1.7 ±1.1 1.7 %

TA = 125°C, up to full-scale IP– ±0.5 – %

TA = –40°C, up to full-scale IP– ±2.8 – %

LIFETIME DRIFT CHARACTERISTICS [5]

Total Output Error Including Lifetime Drift ETOT(DRIFT)

IP = IPR(max), TA = 25°C, 125°C – ±4 – %

IP = IPR(max), TA = –40°C, 25°C – ±4 – %

Sensitivity Error Including Lifetime Drift ESENS(DRIFT)

IP = IPR(max) / 2, TA = 25°C, 125°C – ±2.2 – %

IP = IPR(max) / 2, TA = –40°C, 25°C – ±3.3 – %

Offset Voltage Error Including Lifetime Drift VOE(DRIFT)

TA = 25°C, 125°C – ±44 – mV

TA = –40°C, 25°C – ±44 – mV

[1] Typical values with ± are mean ±3 sigma values, except for lifetime drift which are the average value including drift after AEC-Q100 qualication.

[2] A single part will not have both the maximum sensitivity error and the maximum o󰀨set voltage, as that would violate the maximum/minimum total output error

specication. For total error, 3 sigma distribution values for o󰀨set and sensitivity may be combined by taking the square root of the sum of the squares. See characteristic

performance data plots for temperature drift performance.

[3] Percentage of IP

, with IP = IPR(MAX).

[4] The sensor will continue to respond to current beyond the range of IPR until the high or low output saturation voltage. However, the nonlinearity in this region may be

worse than the nominal operating range.

[5] Lifetime drift characteristics are based on AEC-Q100 qualication results. Typical values are mean ±3 sigma of worst case stress testing. Drift is a function of customer

application conditions. Contact Allegro MicroSystems for further information.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE

ACS732KLATR-40AB-T (5V)

for ~150 parts

-100

-80

-60

-40

-20

100

-40 -20 020 40 60 80 100 120 140

Vol tage Offset Error (mV)

Temperature (°C)

2.4

2.42

2.44

2.46

2.48

2.5

2.52

2.54

2.56

2.58

2.6

-40 -20 020 40 60 80 100 120 140

Zero Current Output Voltage (V)

Temperature (°C)

-2.5%

-2.0%

-1.5%

-1.0%

-0.5%

0.0%

0.5%

1.0%

1.5%

2.0%

2.5%

-40 -20 020 40 60 80 100 120 140

Sensiti vi ty Error (%)

Tempera ture (°C)

48.8

49.2

49.6

50.4

50.8

51.2

-40 -20 020 40 60 80 100 120 140

Sensitivity (mV/A)

Tempera ture (°C )

-5.0%

-4.0%

-3.0%

-2.0%

-1.0%

0.0%

1.0%

2.0%

3.0%

4.0%

5.0%

-40 -20 020 40 60 80 100 120 140

Tota l Output Err or (%)

Temperature (°C)

-3.0%

-2.0%

-1.0%

0.0%

1.0%

2.0%

3.0%

-40 -20 020 40 60 80 100 120 140

Linearity Error (%)

Temperature (°C)

48.4

48.8

49.2

49.6

50.4

50.8

51.2

51.6

-40 -20 020 40 60 80 100 120 140

Sensi tvity (mV/A)

Tempera ture [°C ]

µ ±3σ

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE

ACS732 AND ACS733 TYPICAL FREQUENCY RESPONSE

For information regarding bandwidth characterization methods used for the ACS732 and ACS733, see the “Characterizing System

Bandwidth” application note (https://allegromicro.com/en/insights-and-innovations/technical-documents/hall-effect-sensor-ic-publica-

tions/an296169-acs720-bandwidth-testing) on the Allegro website.

Frequency [Hz]

-10

-5

Magnitude [dB]

ACS732 and ACS733 Frequency Response

Frequency [Hz]

-150

-100

-50

Phase [°]

-3dB ≈ 1.8 MHz

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

RESPONSE CHARACTERISTICS DEFINITIONS AND PERFORMANCE DATA

Response Time (tRESPONSE)

The time interval between a) when the sensed input current

reaches 90% of its final value, and b) when the sensor output

reaches 90% of its full-scale value.

Propagation Delay (tpd)

The time interval between a) when the sensed input current

reaches 20% of its full-scale value, and b) when the sensor output

reaches 20% of its full-scale value.

Rise Time (tr)

The time interval between a) when the sensor reaches 10% of

its full-scale value, and b) when it reaches 90% of its full-scale

value.

Output Slew Rate (SR)

The rate of change [V/µs] in the output voltage from a) when the

sensor reaches 10% of its full-scale value, and b) when it reaches

90% of its full-scale value.

Response Time, Propagation Delay, Rise Time, and Output Slew Rate (ACS732-5V)

Applied current step with 10%-90% rise time = 1 μs

Test Conditions: TA = 25°C, CBYPASS = 0.1 µF, CL = 0 F

tRESPONSE

tpd

SR [V/μs]

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

OVERCURRENT FAULT

Overcurrent Fault

The ACS732 and ACS733 have fast and accurate overcurrent

fault detection circuitry. The overcurrent fault threshold (IFAULT)

is user-configurable via an external resistor divider and supports a

range of 50% to 200% of the full-scale primary input (IPR(MAX)).

Fault response and the overcurrent fault thresholds are described

in the following sections.

Fault Response

The high bandwidth of the ACS732 and ACS733 devices allow

for extremely fast and accurate overcurrent fault detection. An

overcurrent event occurs when the magnitude of the input current

(IP) exceeds the user-set threshold (IFAULT). Fault response time

(tRESPONSE(F)) is defined from the time IP goes above IFAULT to

the time the FAULT pin goes below VFAULT. Overcurrent fault

response is illustrated in Figure 3. When IP goes below IFAULT –

IHYST, the FAULT pin will be released. The rise time of VFAULT

will depend on the value of the resistor RF(PULLUP) and the

capacitance on the pin.

Setting the Overcurrent Fault Threshold

The overcurrent fault threshold (IFAULT) is set via a resistor

divider from VCC to ground on the VOC pin. The voltage on the

VOC pin, VVOC, may range from 0.1 × VCC to 0.4 × VCC. IFAULT

may be set anywhere from 50% to 200% IPR(MAX).

Overcurrent fault threshold versus VVOC is shown in Figure 4.

The equation for calculating the trip current is shown below.

For bidirectional devices, the fault will trip for both positive and

negative currents.

IFAULT = IPR(MAX)

VVOC

VCC

{}

5 ×

This may be rearranged to solve for the appropriate VVOC value

based on a desired over current fault threshold, shown by the

equation:

VOC

FAULT

PR(MAX)

By setting VVOC with a resistor divider from VCC, the ratio of

VVOC / VCC will remain constant with changes to VCC. In this

regard, the fault trip point will remain constant even as the supply

voltage varies.

VVOC

0.1 × V

±2 × IPR(max)

IFAULT

0.4 × V

±0.5 × I

PR(max)

Figure 3: Overcurrent Fault Response

Figure 4: Fault Threshold vs. VVOC

FAULT Pin Output

Primary Current (IP)

IFAULT

tRESPONSE(F)

VFAULT

t1 =

t2 =

Time at which input current

surpasses IFAULT threshold

Time at which output of

FAULT pin is < VFAULT

It is best practice to use resistor values < 10 kΩ for setting VVOC.

With larger resistor values, the leakage current on VOC may

result in errors in the trip point.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Sensitivity (Sens). The change in sensor IC output in response to

a 1 A change through the primary conductor. The sensitivity is the

product of the magnetic circuit sensitivity (G / A) (1 G = 0.1 mT)

and the linear IC amplifier gain (mV/G). The linear IC ampli-

fier gain is programmed at the factory to optimize the sensitivity

(mV/A) for the full-scale current of the device.

Nonlinearity (ELIN). The nonlinearity is a measure of how linear

the output of the sensor IC is over the full current measurement

range. The nonlinearity is calculated as:

LIN

VIOUT (IPR(max)) – VIOUT(Q)

2 × VIOUT (IPR(max)/2) – VIOUT(Q)

{]}

1 –

[

where VIOUT(IPR(max)) is the output of the sensor IC with the

maximum measurement current flowing through it and

VIOUT(IPR(max)/2) is the output of the sensor IC with half of the

maximum measurement current flowing through it.

Zero Current Output Voltage (VIOUT(Q)). The output of the

sensor when the primary current is zero. For a unipolar supply

voltage, it nominally remains at 0.5 × VCC for a bidirectional

device and 0.1 × VCC for a unidirectional device. For example, in

the case of a bidirectional output device, VCC = 3.3 V translates

into VIOUT(Q) = 1.65 V. Variation in VIOUT(Q) can be attributed to

the resolution of the Allegro linear IC quiescent voltage trim and

thermal drift.

Voltage Offset Error (VOE). The deviation of the device output

from its ideal quiescent value of 0.5 × VCC (bidirectional) or 0.1

× VCC (unidirectional) due to nonmagnetic causes. To convert

this voltage to amperes, divide by the device sensitivity, Sens.

Total Output Error (ETOT). The difference between the cur-

rent measurement from the sensor IC and the actual current (IP),

relative to the actual current. This is equivalent to the difference

between the ideal output voltage and the actual output voltage,

divided by the ideal sensitivity, relative to the current flowing

through the primary conduction path:

TOT

) = VIOUTideal(IP) – VIOUT(IP)

Sensideal(IP)× IP

× 100 (%)

The Total Output Error incorporates all sources of error and is a

function of IP. At relatively high currents, ETOT will be mostly

due to sensitivity error, and at relatively low currents, ETOT will

be mostly due to Voltage Offset Error (VOE). As IP approaches

zero, ETOT approaches infinity due to the offset voltage. This is

illustrated in Figure 5 and Figure 6. Figure 5 shows a distribu-

tion of output voltages versus IP at 25°C and across temperature.

Figure 6 shows the corresponding ETOT versus IP.

DEFINITIONS OF ACCURACY CHARACTERISTICS

Figure 5: Output Voltage versus Sensed Current

Figure 6: Total Output Error versus Sensed Current

0 A

Decreasing

IOUT

(V)

Accuracy Across

Temperature

Accuracy Across

Temperature

Accuracy Across

Temperature

Accuracy at

25°C Only

Accuracy at

25°C Only

Accuracy at

25°C Only

Increasing

IOUT

(V)

Ideal V

IOUT

(min)

(max)

(A)

–I

(A)

IOUT(Q)

Full Scale I

+IP

–IP

+ETOT

–ETOT

Across Temperature

25°C Only

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

APPLICATION INFORMATION

Ratiometry

The ACS732 and ACS733 are both ratiometric sensors. This

means that for a given change in supply voltage, the device’s zero

current output voltage and sensitivity will scale proportionally.

Sensitivity Ratiometry

Ideally, a 5% increase in VCC will result in a 5% increase in

sensitivity. However, the ratiometric response of any sensor is not

ideal. Ratiometric Sensitivity Error ERAT(SENS) is specified by the

equation:

100% 1E×–

Sensitivity

RAT(SENS)

VCC(N)

VCC

CC(N)

where VCC(N) is equal to the nominal VCC (3.3 V, or 5.0 V) and

SensitivityVCC(N) is the measured sensitivity at nominal VCC for a

particular device. The symbol VCC is the measured VCC value in

application and SensitivityVCC is the measured sensitivity at that

VCC level for a particular device.

Zero Current Offset Ratiometry

Ratiometric error for Zero Current Offset may be calculated using

the following equation:

EV –V ×

RAT(Q) IOUT(Q)VCC IOUT(Q)VCC(N)

CC(N)

Where VCC(N) is equal to the nominal VCC (3.3 V, or 5.0 V) and

VIOUT(Q)VCC(N) is the measured Zero Current Offset voltage at

nominal VCC for a particular device. The symbol VCC is the mea-

sured VCC value in application and VIOUT(Q)VCC is the measured

zero current offset voltage for a particular device.

Estimating Total Error vs. Sensed Current

The performance characteristics tables give distribution

(±3 sigma) values for Total Error at IPR(MAX); however, one may

be interested in the expected error at a particular current. This

error may be estimated using the distribution data for the com-

ponents of Total Error, Sensitivity Error, and Offset Voltage. The

±3 sigma value for Total Error (ETOT) as a function if the sensed

current is estimated as:

E(I) =

TOTP

E+

SENS

100 × V

Sens × I

()

where ESENS and VOE are the ±3 sigma values for those error

terms.

If there is an average sensitivity error or average offset voltage,

then the average Total Error is estimated as:

E(I) = E+

TOTP SENS

100 × V

Sens × I

AVGAVG

AVG

Layout Guidelines

There are a few considerations during PCB layout that will

help to maintain high accuracy when using Allegro’s integrated

current sensors. Below is a list of common layout mistakes that

should be avoided:

• Extending current carrying traces too far beneath the IC, or

injecting current from the side of the IC

• Placing secondary current phase traces too close to or below

the IC

Extending the Current Traces

The length of copper trace beneath the IC may impact the path of

current flowing through the IP bus. This may cause variation in

the coupling factor from the primary current loop of the pack-

age to the IC, and may reduce the overall creepage distance in

application.

It is best practice for the current to approach the IC parallel to the

current-carrying pins, and for the current-carrying trace to not

creep towards the center of the package. Refer to Figure 7.

DO DO NOT

Figure 7: Best Practice Layout Techniques

for Current Traces

If current must approach the package from the side, it is rec-

ommended to reduce the angle as much as possible. For more

information on best current sensor layout practices refer to the

application note “Techniques to Minimize Common-Mode Field

Interference When Using Allegro Current Sensor ICs” on the

Allegro website.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Thermal Rise vs. Primary Current

Self-heating due to the flow-off current should be considered dur-

ing the design of any current sensing system. The sensor, printed

circuit board (PCB), and contacts to the PCB will generate heat

as current moves through the system.

The thermal response is highly dependent on PCB layout, copper

thickness, cooling techniques, and the profile of the injected current.

The current profile includes peak current, current “on-time”, and

duty cycle. While the data presented in this section was collected

with direct current (DC), these numbers may be used to approximate

thermal response for both AC signals and current pulses.

The plot in Figure 8 shows the measured rise in steady-state die

temperature of the ACS732/3 versus continuous current at an ambi-

ent temperature, TA, of 25 °C. The thermal offset curves may be

directly applied to other values of TA. Conversely, Figure 9 shows

the maximum continuous current at a given TA. Surges beyond the

maximum current listed in Figure 9 are allowed given the maxi-

mum junction temperature, TJ(MAX) (165℃), is not exceeded.

Figure 8: Self Heating in the LA Package

Due to Current Flow

Figure 9: Maximum Continuous Current

at a Given TA

The thermal capacity of the ACS732/3 should be verified by the

end user in the application’s specific conditions. The maximum

junction temperature, TJ(MAX) (165°C), should not be exceeded.

Further information on this application testing is available in

the DC and Transient Current Capability application note on the

Allegro website.

ASEK73x Evaluation Board Layout

Thermal data shown in Figure 8 was collected using the

ASEK73x Evaluation Board (TED-0001795). This board

includes 1500 mm2 of 2 oz. (0.0694 mm) copper connected to

pins 1 through 4 and pins 5 through 8, with thermal vias con-

necting the layers. Top and bottom layers of the PCB are shown

below in Figure 10.

Figure 10: Top and Bottom Layers

for ASEK73x Evaluation Board

Gerber files for the ASEK73x evaluation board are available for

download from the Allegro website. See the technical documents

section of the ACS732 and ACS733 device webpage.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Figure 11: High-Isolation PCB Layout

7.25

2.25

1.27

0.65

9.54

17.27

21.51

Package Outline

Current

Out

Perimeter holes for stitching to the other,

matching current trace design, layers of

the PCB for enhanced thermal capability.

NOT TO SCALE

All dimensions in millimeters.

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Figure 12: Package LA, 16-Pin SOICW

PACKAGE OUTLINE DRAWING

SEATING

PLANE

1.27 BSC

GAUGE PLANE

SEATING PLANE

ATerminal #1 mark area

Reference land pattern layout (reference IPC7351

SOIC127P600X175-8M); all pads a minimum of 0.20 mm from all

adjacent pads; adjust as necessary to meet application process

requirements and PCB layout tolerances

PCB Layout Reference View

Branding scale and appearance at supplier discretion

SEATING

PLANE

C0.10

16×

0.25 BSC

1.40 REF

2.65 MAX

For Reference Only; not for tooling use (reference MS-013AA)

Dimensions in millimeters

Dimensions exclusive of mold flash, gate burrs, and dambar protrusions

Exact case and lead configuration at supplier discretion within limits shown

10.30 ±0.20

7.50 ±0.10 10.30 ±0.33

0.51

0.31 0.30

0.10

0.33

0.20

1.27

0.40

8°

0°

Line 1: Part Number

Line 2: First 9 characters of Assembly Lot Number

Standard Branding Reference View

16 0.65 1.27

9.50

2.25

ACS732

Lot Number

ACS733

Lot Number

ACS732 (5 V) ACS733 (3.3 V)

16 0.65 1.27

9.75

1.65

High-Isolation PCB Layout Reference View

DHall elements (D1, D2); not to scale

DD2

1.040

1.728

Branded Face

1 MHz Bandwidth, Galvanically Isolated

Current Sensor IC in SOIC-16 Package

ACS732 and

ACS733

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

For the latest version of this document, visit our website:

www.allegromicro.com

Revision History

Number Date Description

– September 20, 2017 Initial release

1 January 8, 2018 Updated Rise Time, Response Time, and Propagation Delay Time (page 5)

2 March 8, 2018 Added ACS732KLATR-20AB-T part option

3 June 20, 2018 Updated Working Voltage for Basic Isolation units (page 4); added Fault Response Time and Fault

Release Time characteristics (page 6)

4 July 2, 2018 Added “Thermal Rise vs. Primary Current” and “ASEK73x Evaluation Board Layout” to the Applications

Information section (page 28)

5 October 1, 2018 Added ACS732KLATR-75AB-T variant (pages 2 and 9)

Updated Secondary Hall Coupling Factor value (page 5)

6 November 13, 2018 Added ACS732KLATR-65AU-T part option (page 2 and 10)

Added ACS732KLATR-75AB-T characteristic performance plots (page 18)

7 November 16, 2018 Added ACS732KLATR-65AB-T part option (page 2, 10, and 19)

8 December 10, 2018 Updated UL certificate number

9 February 26, 2019 Added Dielectric Surge Strength Test Voltage to Isolation Characteristics table (page 3)

10 May 23, 2019 Updated Sensitivity Error (pages 10-11) and Total Output Error (page 11)

11 August 22, 2019 Added Maximum Continuous Current to Absolute Maximum Ratings table (page 3),

ESD ratings table (page 3), and updated thermal data section (page 34)

12 September 10, 2019 Added Hall plate dimensions (page 36)

13 September 26, 2019 Added Hall element positions to package outline drawings (page 36)

14 January 17, 2020

Corrected Reverse VOC Voltage value (page 3); added Distance Through Insulation and Comparative

Tracking Index to Isolation Characteristics table (page 3); updated Rise Time, Response Time, Propagation

Delay, and Output Slew Rate test conditions, and added Output Slew Rate (page 6); removed Characteristic

Performance plots (pages 17-24); updated Typical Frequency Response plots (page 17)

15 May 8, 2020

Removed Linearity Error from Common Electrical Characteristics table and added Linearity Error to

Performance Characteristics Tables (pages 8-16); corrected Sensitivity Error test conditions (pages 8-16);

corrected Lifetime Drift Characteristics numbers (pages 8-16); added ACS732KLATR-40AB-T multi-

temperature characteristic performance plots (page 17); updated Typical Frequency Response plots (page

18); added Response Characteristics Definitions and Performance Data application page (page 19)

16 May 28, 2020 Updated Hall placement (p. 25)

17 June 9, 2020 Added ACS733KLATR-20AB-H part option (page 2, 14); updated Features and Benefits

18 June 29, 2020 Added minimum and maximum values to Linearity Error at TA = 25°C (pages 8-17)

Allegro MicroSystems reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit

improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the

information being relied upon is current.

Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of

Allegro’s product can reasonably be expected to cause bodily harm.

The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems assumes no responsibility for its use; nor

for any infringement of patents or other rights of third parties which may result from its use.

Copies of this document are considered uncontrolled documents.