5
Settling Time
This is a challenging measurement, in which the result
depends on the method chosen, the precision and quality of
test equipment and the operating configuration of the DAC
(test conditions). As a result, the different techniques in use
by conv erter manu facturers c an lead to consisten tly diff erent
results. An engineer should understand the advantage and
limitat ions of a given test methods before using the spec ified
settling time as a basis for design.
The approach used for several years at Intersil calls for a
strobed comparator to sense final perturbations of the DAC
output waveform. This gives the LSB a reasonable
magnitude (814mV for the HS-565BRH, which provides the
comparator with enough overdrive to establish an accurate
±0.50 LSB window about the final settled value. Also, the
required test conditions simulate the DACs environment for
a common application - use in a successive approximation
A/D converter. Considerable experience has shown this to
be a reliable and repeatable way to measure settling time.
The usua l spec ifica tion is based on a 10V st ep, prod uced b y
simultaneously switching all bits from off-to-on (tON) or on-
to-off (tOFF). The slower of the two cases is specified, as
measured from 50% of the digital input transition to the final
entry within a window of ±0.50 LSB about the settled value.
Four measurements characterize a given type of DAC:
(Cases (b) and (c) may be eliminated unless the overshoot
exceed s 0.50 LSB) . For example, re fer to Figures 3A and 3B
for the measurement of case (d ).
Procedure
As shown in Figure 3B, settling time equals tX plus the
comparator delay (tD = 15ns). To measure tX,
• Adjust the del ay on gen erator nu mber 2 for a tX of se veral
microseconds. This assures that the DAC output has
settled to its fin al wave .
• Switch on the LSB (+5V)
• Adjust the VLSB supply for 50% triggering at
COMPARATOR OUT. This is indicated by traces of equal
brightness on the oscilloscope display as shown in Figure
3B. Note DVM reading.
• Switch to LSB to Pulse (P)
• Readjust the VLSB supply for 50% triggering as before,
and note DVM reading. One LSB equals one tenth the
difference in the DVM readings noted above.
• Adjust the VLSB supply to reduce the DVM reading by 5
LSBs (DVM reads 10X, so this sets the comparator to
sense th e final settled va lue minus 0.50 LSB). Com parator
output disappears.
• Reduc e generator num ber 2 delay unt il compara tor output
reappears, and adjust for “equal brightness”.
• Measure tX from scope as shown in Figure 3B. Settling
time equals tX + tD, i.e. tX + 15ns.
(a) tON, to final value +0.50 LSB
(b) tON, to final value -0.50 LSB
(c) tOFF, to final value +0.50 LSB
(d) OFF, to final value -0.50 LSB
TABLE 1. OPERATING MODES AND CALIBRATION
MODE
CIRCUIT CONNECTIONS CALIBRATION
OUTPUT
RANGE PIN 10
TO PIN 11
TO RESISTOR
(R) APPLY
INPUT CODE ADJUST TO SET VO
Unipolar (See Figure 1) 0 to +10V VO Pin 10 1.43K All 0’s
All 1’s R1
R2 0V
+9.99756V
0 to +5V VO Pin 9 1.1K All 0’s
All 1’s R1
R2 0V
+4.99878V
Bipolar (See Figure 2) ±10V NC VO 1.69K All 0’s
All 1’s R3
R4 -10V
+9.99512V
±5V VO Pin 10 1.43K All 0’s
All 1’s R3
R4 -5V
+4.99756V
±2.5V VO Pin 9 1.1K All 0’s
All 1’s R3
R4 -2.5V
+2.49878V
HS-565BRH