
STANDARD
SIZE
A
5962-87514
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
F SHEET 5
DSCC FORM 2234
APR 97
3.10.1 Erasure of EEPROMS. When specified, devices shall be erased in acc ordance with the procedures and
characteristics specified in 4.4.1. Devices shall be shipped in the erased (logic "1's) and verified state unless otherwis e
specified.
3.10.2 Programmability of EEPROMS. W hen specified, devices shall be programmed to the specified pattern using the
procedures and characteristics specified in 4.4.
3.10.3 Verification of erasure or programmability of EEPROMS. When specified, devices shall be verified as either
programmed to the specified pattern or erased. As a minimum, verification shall consist of reading the device in accordance
with the procedures and characteristics specified in 4.4.2. Any bit that does not verify to be in the proper state shall constitute
a device failure, and shall be removed from the lot.
3.12 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This
reprogrammability test shall be done for initial characterization and after any design or process changes which may affect the
reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of
program/erase endurance cycles listed in section 1.3 herein over the full military temperature range. The vendor's procedure
shall be kept under document control and shall be made available upon request of the acquiring or preparing activity, along
with test data.
3.13 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test
shall be done for initial characterization and after any design or process change, which may affect data retention. The
methods and procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the
full military temperature range. The vendor's procedure shall be kept under document control and shall be made available
upon request of the acquiring or preparing activity, along with test data.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspec tion procedures shall be in accordance with MIL-PRF-38535, appendix
A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
(3) Devices shall be burned-in containing a checkerboard pattern or equivalent.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Quality conformance inspection. Quality c onformance i ns pec tion s hal l be i n ac cordance with method 5005 of
MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (CI and CO measurements) shall be measured only for the initial test and after process or design changes
which may affect capacitance. Sample size is fifteen devices with no failures, and all input and output terminals tested.
d. Subgroups 7 and 8 shall include verification of the truth table.