Note 1: Electrical characteristics determined at 25ºC unless otherwise specified.
Note 2: This device is intended for limited fault protection. Repeated trip events or extended trip endurance can degrade the device and
may affect performance to specifications. Performance impact will depend on multiple factors including, but not limited to,
voltage, trip current, trip duration, trip cycles, load condition and circuit design. For details or ratings specific to your application
contact Littelfuse Connectivity Circuit Protection Division directly.
Note 3: Specifications developed using 1.0 ounce 0.045” wide copper traces on dedicated FR4 test boards. Performance in your
application may vary.
Note 4: Izt is the current at which Vz is measured (VZ = VOUT). Additional VZ values are available on request.
Note 5: IHOLD: Maximum steady state current (current entering or exiting the VIN pin of the device) that will not generate a trip event at
the specified temperature. Specification assumes IFLT (current flowing through the Zener diode) is sufficiently low so as to
prevent the diode from acting as a heat source. Testing is conducted with an “open” Zener.
Note 6: RTYP: Resistance between VIN and VOUT pins during normal operation at room temperature.
Note 7: R1Max: The maximum resistance between VIN and VOUT pins at room temperature, one hour after first tripped event or after
reflow soldering.
Note 8: VINT Max: VINT Max is defined as the maximum voltage at which devices can be survived according to typical qualification
process at the specified voltage and current. VINT Max testing is conducted using a "shorted" load (VOUT = 0 V). VINT Max is a
survivability rating, not a performance rating. For performance ratings, see Note 2.
Note 9: VIN Max: For practical application, Polyzen devices are polymer enhanced diode, it use the Polymer PTC technology to offer the
diode resettable protection against continuous overvoltage fault events. VIN Max is defined as the maximum voltage rating of the
whole device at which devices can be survived according to typical qualification process at specified voltage and current.
Testing conducted with no load connected to VOUT. VIN Max is a survivability rating, not a performance rating. For performance
ratings, see Note 2.
Note 10: IFLT Max: Maximum RMS fault current the device can withstand and remain resettable. Specification is dependent on the
direction of current flow through the device. RMS fault currents above IFLT Max may permanently damage the PolyZen device.
Specification assumes IOUT = 0. Testing conducted with no load connected to VOUT.
Note 11: The power dissipated by the device when in the “tripped” state, as measured on Littelfuse test boards (see note 3).
Note 12: Specifications based on limited qualification data and subject to change.