Dec 2011. Version 1.0 MagnaChip Semiconductor Ltd.
2
MDP5N50B / MDF5N50B N-channel MOSFET 500V
Ordering Information
Part Number Temp. Range Package Packing RoHS Status
MDP5N50BTH -55~150oC TO-220 Tube Halogen Free
MDF5N50BTH -55~150oC TO-220F Tube Halogen Free
Electrical Characteristics (Ta = 25oC)
Characteristics Symbol
Test Condition Min Typ Max Unit
Static Characteristics
Drain-Source Breakdown Voltage BVDSS ID = 250µA, VGS = 0V 500 - - V
Gate Threshold Voltage VGS(th) VDS = VGS, ID = 250µA 2.0 - 4.0
Drain Cut-Off Current IDSS VDS = 500V, VGS = 0V - - 1 µA
Gate Leakage Current IGSS VGS = ±30V, VDS = 0V - - 100 nA
Drain-Source ON Resistance RDS(ON) VGS = 10V, ID = 2.5A - 1.15 1.4 Ω
Forward Transconductance gfs VDS = 30V, ID = 2.5A - 5 - S
Dynamic Characteristics
Total Gate Charge Qg
VDS = 400V, ID = 5.0A, VGS = 10V(3)
- 11.5 -
nC
Gate-Source Charge Qgs - 2.3 -
Gate-Drain Charge Qgd - 4.1 -
Input Capacitance Ciss
VDS = 25V, VGS = 0V, f = 1.0MHz
- 513 -
pF
Reverse Transfer Capacitance Crss - 3.6 -
Output Capacitance Coss - 69 -
Turn-On Delay Time td(on)
VGS = 10V, VDS = 250V, ID = 5.0A,
RG = 25Ω(3)
- 11 -
ns
Rise Time tr - 16 -
Turn-Off Delay Time td(off) - 46 -
Fall Time tf - 24 -
Drain-Source Body Diode Characteristics
Maximum Continuous Drain to Source
Diode Forward Current IS - 5.0 - A
Source-Drain Diode Forward Voltage VSD IS = 5.0A, VGS = 0V - - 1.4 V
Body Diode Reverse Recovery Time trr IF = 5.0A, dl/dt = 100A/µs(3) - 232 - ns
Body Diode Reverse Recovery Charge
Qrr - 1.3 - µC
Note :
1. Pulse width is based on RθJC & RθJA and the maximum allowed junction temperature of 150°C.
2. Pulse test: pulse width ≤300us, duty cycle≤2%, pulse width limited by junction temperature TJ(MAX)=150°C.
3. ISD ≤5.0A, di/dt≤200A/us, VDD≤BVDSS, Rg =25Ω, Starting TJ=25°C
4. L=16.5mH, IAS=5.0A, VDD=50V, , Rg =25Ω, Starting TJ=25°C