
Electrical Characteristics@Tj=25oC(unless otherwise specified)
Symbol Parameter Test Conditions Min. Typ. Max. Units
BVDSS Drain-Source Breakdown Voltage VGS=0V, ID=250uA 20 - - V
ΔBVDSS/ΔTjBreakdown Voltage Temperature Coefficient Reference to 25℃, ID=1mA - 0.01 - V/℃
RDS(ON) Static Drain-Source On-Resistance2VGS=4.5V, ID=8A - - 18.5 mΩ
VGS=2.5V, ID=4A - - 25 mΩ
VGS(th) Gate Threshold Voltage VDS=VGS, ID=250uA 0.3 - 1 V
gfs Forward Transconductance VDS=5V, ID=4A - 9 - S
IDSS Drain-Source Leakage Current (Tj=25oC) VDS=20V, VGS=0V - - 1 uA
Drain-Source Leakage Current (Tj=70oC) VDS=16V ,VGS=0V - - 25 uA
IGSS Gate-Source Leakage VGS=±12V - - ±100 nA
QgTotal Gate Charge2ID=8A - 17 27 nC
Qgs Gate-Source Charge VDS=16V - 1.7 - nC
Qgd Gate-Drain ("Miller") Charge VGS=5V - 5.8 - nC
td(on) Turn-on Delay Time2VDS=10V - 9 - ns
trRise Time ID=1A - 10 - ns
td(off) Turn-off Delay Time RG=3.3Ω,VGS=5V - 26 - ns
tfFall Time RD=10Ω- 7.5 - ns
Ciss Input Capacitance VGS=0V - 940 1500 pF
Coss Output Capacitance VDS=20V - 175 - pF
Crss Reverse Transfer Capacitance f=1.0MHz - 140 - pF
RgGate Resistance f=1.0MHz - 1.2 1.8 Ω
Source-Drain Diode
Symbol Parameter Test Conditions Min. Typ. Max. Units
VSD Forward On Voltage2IS=2.1A, VGS=0V - - 1.2 V
trr Reverse Recovery Time2IS=8A, VGS=0V, - 23 - ns
Qrr Reverse Recovery Charge dI/dt=100A/µs - 12 - nC
Notes:
1.Pulse width limited by Max. junction temperature.
2.Pulse test
THIS PRODUCT IS AN ELECTROSTATIC SENSITIVE, PLEASE HANDLE WITH CAUTION.
DEVICE OR SYSTEM ARE NOT AUTHORIZED.
AP4434GM
2/4
3.Surface mounted on 1 in2 copper pad of FR4 board, t <10sec ; 135 ℃/W when mounted on Min. copper pad.
THIS PRODUCT HAS BEEN QUALIFIED FOR CONSUMER MARKET. APPLICATIONS OR USES AS CRITERIAL COMPONENT IN LIFE SUPPORT