100363 100363 Low Power Dual 8-Input Multiplexer Literature Number: SNOS125 100363 Low Power Dual 8-Input Multiplexer General Description The 100363 is a dual 8-input multiplexer. The Data Select (Sn) inputs determine which bit (An and Bn) will be presented at the outputs (Za and Zb respectively). The same bit (0-7) will be selected for both the Za and Z b output. All inputs have 50 k pulldown resistors. n n n n 2000V ESD protection Pin/function compatible with 100163 Voltage compensated operating range = -4.2V to -5.7V Standard Microcircuit Drawing (SMD) 5962-9165501 Features n 50% power reduction of the 100163 Logic Symbol Pin Names Description S0-S2 Data Select Inputs A0-A7 A Data Inputs B0-B7 B Data Inputs Za, Zb Data Outputs DS100310-1 Connection Diagrams 24-Pin Quad Cerpak 24-Pin DIP DS100310-3 DS100310-2 (c) 1998 National Semiconductor Corporation DS100310 www.national.com 100363 Low Power Dual 8-Input Multiplexer August 1998 Logic Diagram DS100310-5 www.national.com 2 Truth Table Inputs Outputs Select S2 S1 Data S0 A7 A6 A5 A4 A3 A2 A1 A0 Za B7 B6 B5 B4 B3 B2 B1 B0 Zb L L L L L L L L H H L L H L L L L H H H L H L L L L H L H H L H H L L L H H H H H L L L L H L L H H H L H L L H L H H H H H L L L H H L H H H H H L L H H H H H H = HIGH Voltage Level L = LOW Voltage Level Blank = X = Don't Care 3 www.national.com Absolute Maximum Ratings (Note 1) 2000V ESD (Note 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Recommended Operating Conditions Above which the useful life may be impared Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic VEE Pin Potential to Ground Pin Input Voltage (DC) Output Current (DC Output HIGH) Case Temperature (TC) Military Supply Voltage (VEE) -65C to +150C +175C -7.0V to +0.5V VEE to + 0.5V -50 mA -55C to +125C -5.7V to -4.2V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics VEE = -4.2V to -5.7V, VCC = VCCA = GND, T Symbol VOH Parameter Min C = -55C to +125C Conditions Max Units TC Output HIGH Voltage -1025 -870 mV 0C to -1085 -870 mV -55C VIN = VIH (Max) Loading with -1830 -1620 mV 0C to or VIL (Min) 50 to -2.0V -1830 -1555 mV -55C Output HIGH Voltage -1035 mV 0C to -1085 mV -55C VIN = VIH (Min) Loading with -1610 mV 0C to or VIL (Max) 50 to -2.0V -1555 mV Note +125C VOL Output LOW Voltage (Notes 3, 4, 5) +125C VOHC +125C VOLC Output LOW Voltage (Notes 3, 4, 5) +125C VIH Input HIGH Voltage VIL Input LOW Voltage -1165 -870 mV -1830 -1475 mV -55C -55C to Guaranteed HIGH Signal for All Inputs (Notes 3, 4, 5, 6) Guaranteed LOW Signal for All Inputs (Notes 3, 4, 5, 6) VEE = -4.2V VIN = VIL (Min) (Notes 3, 4, 5) VEE = -5.7V VIN = VIH (Max) (Notes 3, 4, 5) +125C -55C to +125C IIL Input LOW Current 0.50 A -55C to +125C IIH IEE Input HIGH Current Power Supply Current Sn 265 An, Bn 340 Sn 385 An, Bn 490 -87 -30 A 0C to +125C A mA -55C -55C to Inputs Open (Notes 3, 4, 5) +125C Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at -55C, +25C, and +125C, Subgroups 1, 2, 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at -55C, +25C, and +125C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL. www.national.com 4 AC Electrical Characteristics VEE = -4.2V to -5.7V, VCC = VCCA = GND Symbol Parameter tPLH Propagation Delay tPHL A0-A7, B0-B7 to Output tPLH Propagation Delay tPHL S0-S2 to Output tTLH Transition Time tTHL 20% to 80%, 80% to 20% TC = -55C TC = +25C TC = +125C Units Min Max Min Max Min Max 0.50 2.40 0.60 2.30 0.70 3.00 ns 0.80 3.00 0.90 2.80 0.80 3.40 ns 0.30 1.90 0.30 1.80 0.30 2.10 ns Conditions Notes (Notes 7, 8, 9) Figure 1 and Figure 2 (Note 10) Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals -55C), then testing immediately after power-up. This provides "cold start" specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25C, Subgroup A9, and at +125C and -55C, temperatures, Subgroups A10 and A11. Note 10: Not tested at +25C, +125C, and -55C temperature (design characterization data). Test Circuitry DS100310-6 Notes: VCC, VCCA = +2V, VEE = -2.5V L1 and L2 = equal length 50 impedance lines RT = 50 terminator internal to scope Decoupling 0.1 F from GND to VCC and V EE All unused outputs are loaded with 50 to GND CL = Fixture and stray capacitance 3 pF Pin numbers shown are for flatpak; for DIP see logic symbol FIGURE 1. AC Test Circuit 5 www.national.com Switching Waveforms DS100310-7 FIGURE 2. Propagation Delay and Transition Times www.national.com 6 Physical Dimensions inches (millimeters) unless otherwise noted 24-Pin Ceramic Dual-In-Line Package (D) NS Package Number J24E 24-Pin Quad Cerpak (F) NS Package Number W24B 7 www.national.com 100363 Low Power Dual 8-Input Multiplexer LIFE SUPPORT POLICY NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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