O O AMP technical report QUALIFICATION TEST OF AMP UNIVERSAL MATE-N-LOK PRINTED CIRCUIT BOARD HEADERS AMP Product Specification 108-1053 ELR 472-2 Unrestricted S - 247 7/21/80 Environmental OOO Testing Department 110-247 Rev c Technical Services Division AMP Incorporated - Harrisburg, PennsylvaniaAMP 1138.1 14/71) UBLICATION RESTRICTION RELEASE NO ED ELR 472-2 SN GENERAL OFFICES: HARRISBURG, PENNSYLVANIA 17105 - PHONE: 717-564-0101 TWX 510-657-411 Unrestricted $-247 ENVIRONMENTAL TESTING DEPARTMENT July 21, 1980 Qualification Test of AMP MATE-N-LOK Universal Headers; AMP Product Speci- fication 108-1053, Revision 0, dated 6/19/78 INTRODUCTION: AMP Universal MATE-N-LOK Headers were tested in the Environ- mental Laboratory to determine if they comply with the per- formance requirements of AMP Product Specification 108-1053, Revision Q. SCOPE : The headers were subjected to the sequence outlined in Figure 6 of the specification. All testing was conducted during the period of May 15, 1980 thru June 6, 1980. CONCLUSION: All samples tested successfully met the requirements of Figure 1, Test Requirements and Procedures Summary, af AMP Product Specification 108-1053, Revision 0, dated 6/19/78. PRODUCT DESCRIPTION: AMP Universal MATE-N-LOK printed circuit board headers are designed for interconnections between wiring harnesses and printed circuit boards. These headers include sizes ranging from two circuits to 15 circuits and a wire range from 30 AWG to 14 AWG.ELR 472-2 Page 2. Wire Characteristics: All wires used in the test program were stranded, tin plated, capper which conform to the requirements of UL 1007 and UL 1015. Items Tested: Group Na. AMP Part No. Product Quantity 2 350536-1 MATE-N-LOK Socket Connector 12 2 350732~-1 MATE-N-LOK Header 2 3 3505 36-1 MATE-N-LOK Socket Connector 30 3 3507321 MATE-N-LOK Header 4 350732-1 MATE-N-LOK Header 5 Test Sequence: Samples were subjected to the test sequence listed below, in accor- dance with paragraph 3.6, Connector Tests and Sequences. Test Groups Test Nomenclature l ya 3 4 Examination of Product 1 Dielectric Withstanding Voltage Insulation Resistance Termination Resistance 2 Temperature Rise vs. Current 1 Thermal Shock 6 Solderability 1 Mating Force 1 Unmating Force 5 Durability 3 Termination Resistance, Dry Circuit 2,4,7 Summary of Test Results: Examination of Product - Group 1 thru 4 Samples were visually inspected per quality inspection plan. The headers showed no evidence of physical or functional defects.y ELR 472-2 Page 3. Summary of Test Results: (cont'd) Dielectric Withstanding Voltage - Group 3 A potential of 2.9 kilovolts AC was applied between adjacent contacts of mated connector assemblies. Leakage current was set to 1.0 milliampere, rate of rise was 500 volts per second, and the potential was applied for one minute. Summary of results There was no breakdown, All connector assemblies were found to comply with the requirements of the specification. Insulation Resistance - Group 3 A potential of 500 volts DC was applied between adjacent con- tacts of mated connector assemblies. Electrification time was two minutes. Summary of results Results in Ohms Requirement in Ohms Minimum Maximum Average 1.6 X 10 6.0 X 10? 16.0 X io! 8.6 X 10? Termination Resistance, Rated Current - Group 2 Termination resistance was measured at 4.5 amperes DC test current. summary of results Results in Millichms Requirement in Milliohms Minimum Maximum Average 2.25 maximum 1.47 1.60 1.53 Temperature Rise vs. Current - Group 2 Samples were energized with a test current of 7.0 amperes DC. Housing and contact temperatures were recorded. summary of results Results in C Requirement _in C Minimum Maximum Average 30 maximum temperature rise 17.2 21.6 19.4 f or contacts Housing A Housing 8 44,3 43.7 105 maximum housing temperatureELR 472-2 Page 4. Summary of Test Results: (cont'd) Thermal Shock ~ Group 3 Mated connectors were exposed to 25 cycles between -55C and a5C in accordance with AMP Specification 109-22, Each cycle consisted af: 0.5 hour exposure at ~55C 15 seconds transfer time between -55C and g5C 0.5 hour exposure at a5c 15 second transfer time between 85C and -55C Summary of results Connectors remained mated and showed no evidence of cracking or chipping. Solderability - Group 4 Samples were sub jected to salderability in accordance with AMP Specification 109~11-3. Summary of results All samples were found to be in compliance with the specification. Mating Ferce - Group 3 Connector assemblies were mated at a rate of 0.5 inch/minute. Mating forces were recorded. Summary of results Results in Pounds Requirement in Pounds ~ Minimum Maximum Average 3.0 maximum per contact 2.43 2.97 2.78ELR 472-2 Page 5. Summary of Test Results: Ceont'd) Unmating Force - Group 3 Connector assemblies were unmated at a rate of 0.5 inch/minute. Unmating forces were recorded. Summary of results Resuits in Pounds Requirement in Pounds Minimum Maximum Average 0.5 per contact minimum 1.23 1.88 1.49 Durability - Group 3 With the connector and header mounted on a printed circuit board, the assembly was subjected to 50 manual mating and unmating cycles. summary of results At the conclusion of 50 cycles, the samples were visually inspected and they appeared to be free of physical damage. Termination Resistance, Dry Circuit - Group 3 100 milliamperes DC with an open circuit potential of 50 millivolts was applied to mated connector assemblies. Summary of results Results in Milliohms Requirement in Milliohms Minimum Maximum Average 2.5 milliohms initial / 1.24 1.65 1.48 maximumELR 472-2 Page 6. Summary of Test Results: (cont'd) After Durability Results in Milliohms Requirement in Milliohms Minimum Maximum Average 2.6 milliohms maximum 1.39 1.77 1.57 After Thermal Shock Results in Milliohms Requirement in Milliohms Minimum Maximum Average 12.0 milliohms maximum 1.35 1.75 1.53 VALIDATION: Report MI A. C. Williams Test Technician _- Environmental Laboratory Reviewed by: UN . (2. Koerieilh J J. R. Kohout Supervisor Environmental Laboratory ACW: dm Ref: ATL 80-117