1/18February 2000
M48T35
M48T35Y
256 Kbit (32Kb x8) TIMEKEEPER® SRAM
INTEGRATED ULTRA LOW POWER SRAM,
REAL TIME CLOCK, POWER-FAIL CONTROL
CIRCUIT and BAT TERY
BYTEWIDE™ RAM-LIKE CLOCK ACCESS
BCD CODED YEAR, MONTH, DAY, DATE,
HOURS, MINUTES and SECONDS
FREQUENCY TEST OUTPUT for REAL TIME
CLOCK
AUTOMATIC POWER-FAIL CHIP DESELECT
and WRITE P ROTEC T ION
WRITE PROTECT VOLTAGES
(VPFD = Power-fail Deselect Voltage):
M48T35: 4.5V VPFD 4.75V
M48T 35Y : 4.2V VPFD 4.5V
SELF - CONTAI N ED BATT ERY and CRY STAL
in the CAPHAT DIP PACKAGE
SOIC PAC KAG E PR OV IDES D IR ECT
CONNECTION for a S NAPHA T HOUSING
CONTAINING the BAT TERY and CRYSTAL
SNAPHAT® HOUSING (BATTERY and
CRYST AL ) is REPL AC EABLE
PIN and FUNCTION COM PAT IBLE with
JEDEC STANDARD 32Kb x8 SRAMs
Figure 1. Logic Diagram
AI01620B
15
A0-A14
W
DQ0-DQ7
VCC
M48T35
M48T35Y
G
VSS
8
E
Table 1. Signal Names
A0-A14 Address Inputs
DQ0-DQ7 Data Inputs / Outputs
EChip Enable
GOutput Enable
WWrite Enable
VCC Supply Voltage
VSS Ground
28
1
28
1
SOH28 (MH)
SNAPHAT (SH)
Battery
PCDIP28 (PC)
Battery CAPHAT
M48T35, M48T35Y
2/18
Figure 2A. DIP Connect ions
A1
A0
DQ0
A7
A4
A3
A2
A6
A5
A13
A10
A8
A9
DQ7
W
A11
G
E
DQ5DQ1
DQ2 DQ3VSS DQ4
DQ6
A12
A14 VCC
AI01621B
8
1
2
3
4
5
6
7
9
10
11
12
13
14 16
15
28
27
26
25
24
23
22
21
20
19
18
17
M48T35
M48T35Y
Table 2. Absolute Maximum Ratings (1)
Note: 1. Stres ses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This i s a stress
rating only and functi onal operation of the device at these or any other con di tions above th ose indic at ed in th e operational section
of this spec ification is not implie d. Exposure to t he absolute maximum rating conditio ns fo r extende d period s of time may affe ct
reliability.
2. Soldering temperature not to exceed 260°C for 10 seconds (total thermal budget not t o exceed 150°C f or longer than 30 seconds).
CAUTION: Negative undershoots bel ow –0.3V are not all owed on any pin while i n the Battery Back-up mode.
CAUTION: Do NOT wave solder SOIC to avoid damaging SNAPHAT sockets.
Symbol Parameter Value Unit
TAAmbient Operating Temperature Grade 1 0 to 70 °C
Grade 6 –40 to 85 °C
TSTG Storage Temperature (VCC Off, Oscillator Off) –40 to 85 °C
TSLD (2) Lead Solder Temperature for 10 seconds 260 °C
VIO Input or Output Voltages –0.3 to 7 V
VCC Supply Voltage –0.3 to 7 V
IOOutput Current 20 mA
PDPower Dissipation 1 W
Figure 2B. SOIC Connections
AI01622B
8
2
3
4
5
6
7
9
10
11
12
13
14
22
21
20
19
18
17
16
15
28
27
26
25
24
23
1
A1
A0
DQ0
A7
A4
A3
A2
A6
A5
A13
A10
A8
A9
DQ7
W
A11
G
E
DQ5DQ1
DQ2 DQ3VSS DQ4
DQ6
A12
A14 VCC
M48T35Y
DESCRIPTION
The M48T35/35Y TIMEKEEPER® RAM is a 32Kb
x8 non-volatile static RAM and real time clock. The
monolithic chip is availa ble in two spec ial packag-
es to provide a highly integrated battery backed-up
memory and real time clock solution.
The M48T35/ 35Y is a non-volatile pin and funct ion
equivalent to any JEDEC standard 32Kb x8
SRAM. It also easily fits into many ROM, EPROM,
and EEPROM sockets, providing the non-volatility
of PROMs without any requirement for special
write timing or limitations o n the number o f writes
that can be performed.
The 28 pin 600mil DIP CAPHAT houses the
M48T35/35Y silicon with a quartz crystal and a
long life lithium button cell in a single package .
The 28 pin 330mil SOIC provides sockets with
gold plated contacts at both ends for direct con-
3/18
M48T35, M 48T35Y
nection to a separate SN APHAT hous ing contain-
ing the battery and crystal. The unique design
allows the SNAPHAT battery package to be
mounted on top of the SOIC package after the
completion of the surface mount process. Inser-
tion of the SNAPHAT housing after reflow pre-
vents pote ntial b attery and crystal dam age d ue t o
the high temperatures required for device s urface-
mounting. The SNA PHAT housing is k eyed t o pre-
vent reverse i nsertion. The SOIC and battery/crys-
tal packages are shipped separ ately in plastic anti-
static tubes or in Tape & Reel form.
For the 28 lead SOI C, the battery/crystal package
(i.e. SNAPHAT) part number is "M4T28-
BR12SH1".
As Figure 3 shows, the static memory array and
the quartz controlled clock oscillator of the
M48T35/35Y are integrated on one silicon chip.
The two circuits are interconnected at the upper
eight memory locations to provide user accessible
BYTEWIDE clock information in the bytes with ad-
dresses 7FF8h-7F FFh.
Table 3. Operating Modes (1)
No te: 1. X = V IH or VIL; V SO = Battery Back -u p Swit ch ov er Volta g e.
2. See Table 7 for details .
Mode VCC E G W DQ0-DQ7 Power
Deselect
4.75V to 5.5V
or
4.5V to 5.5V
VIH X X High Z Standby
Write VIL XVIL DIN Active
Read VIL VIL VIH DOUT Active
Read VIL VIH VIH High Z Active
Deselect VSO to VPFD (min) (2) X X X High Z CMOS Standby
Deselect VSO X X X High Z Battery Back-up Mode
Figu re 3. Blo ck D ia gra m
AI01623
LITHIUM
CELL
OSCILLATOR AND
CLOCK CHAIN
VPFD
VCC VSS
32,768 Hz
CRYSTAL
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
8 x 8 BiPORT
SRAM ARRAY
32,760 x 8
SRAM ARRAY
A0-A14
DQ0-DQ7
E
W
G
POWER
M48T35, M48T35Y
4/18
The cl ock locations contain the year, month, date,
day, hour, minute, and second in 24 hour BCD for-
mat. Corrections for 28, 29 (leap year), 30, and 31
day months are made automatically. Byte 7FF8h
is the clock control register. This byte controls user
access to t he clock information and also stores the
clock calibrat ion setting.
The eight clock bytes are not the actual clock
counters themselves; they are memory locations
consisting of BiPORT read/write memory cells.
The M48T35/35Y includes a clock control circuit
which updates the clock bytes with current infor-
mation once per second. The information can be
accessed by t he us er i n t he sa me m anner a s any
other location in the static memory array.
The M48T35/ 35Y also has its ow n Power-fail De-
tect circuit. The control circuitry constantly moni-
tors the single 5V supply for an out of tolerance
condition. When VCC is out of tolerance, the circuit
write protects the SRAM, providing a hig h degree
of data sec urity in t he midst of unpredictable sys-
tem operation brought on by l ow VCC. As VCC falls
below approxim ately 3V, the c ontrol circuitry con-
nects the battery which maintains data and clock
operation until valid power returns.
READ MODE
The M48T35/35Y is in the Read Mode whenever
W (Write Enable) is high and E (Chip Enable) is
low. The unique address specified by the 15 Ad-
dress Inputs defines which one of the 32,768 by tes
of dat a is to be acce sse d. Vali d data w ill be av ail-
able at the Data I/O pins within Address Access
time (tAVQV) after the last address input signal is
stable, providing that the E and G access times
are also satisfied.
If the E and G access times are not met, valid data
will be av ailable a f te r the la t ter of the Ch i p Enable
Access time (tELQV) or Output Enable Access time
(tGLQV).
The state of the eight three-state Data I/O signals
is controlled by E and G. If the outputs are activat-
ed before tAVQV, the data lines will be driven t o an
indeterminate state until tAVQV.
If the Address Inputs are changed while E and G
remain active, output data will remain valid for Out-
put Data Hold time (tAXQX) but will go indetermi-
nate unt i l the next Address Access.
WRITE MODE
The M48T35/35Y is in the Write Mode whenever
W and E are low. The st art of a write is referenced
from the lat ter occurring f alling edge of W or E. A
write is terminated by the ea rlier rising edge of W
or E. The addresses must be held valid throughout
the cycle. E or W must return high for a minimum
of tEHAX from Chip Enable or tWHAX from Write En-
able prior to the initiation of another read or write
cycle. Data-in must be valid tDVWH prior to the end
of write and remain valid for tWHDX afterward. G
should be kept high during write cycles to avoid
bus contention; although, if the output bus has
been activated by a low on E a nd G, a low on W
will dis able the o ut p ut s tWLQZ after W falls.
Table 4. AC Measu remen t Conditions
Not e that Output Hi-Z is defined as the point where data is no longer
driven.
Input Rise and Fall Times 5ns
Input Pulse Voltages 0 to 3V
Input and Output Timing Ref. Voltages 1.5V
Figure 4 . AC Testing Load Circuit
AI01030
5V
OUT
CL = 100pF or 5pF
CL includes JIG capacitance
1.9k
DEVICE
UNDER
TEST
1k
5/18
M48T35, M 48T35Y
Table 5. Capaci tance (1, 2)
(TA = 25 °C)
No te : 1. Effective capacit ance measure d wi t h powe r suppl y at 5V.
2. Sampled only, not 100% tested.
3. Outputs desel ected .
Table 6. DC Characteristics
(TA = 0 to 70 °C or 40 to 85 °C; VCC = 4.75V to 5.5V or 4.5V to 5.5V)
No te : 1. Outputs des el ected.
2. N e gativ e s p i k e s of –1V a l l owed for up to 10 ns o nce per cy cl e.
Table 7. Pow er Down/Up Trip Points DC Characteristics (1)
(TA = 0 to 70 °C or 40 to 85 °C)
Note: 1. All v oltages referenced to VSS.
2. CAPHAT and M4T32-BR12SH1 SNAPHAT only, M4T28-BR12SH1 SNAPHAT top tDR = 7 years (typ).
3. Usi ng l arger M 4T 32-BR12SH 6 SNAPHA T top (rec om m ende d for Indu st ri al Tem perature Range - grade 6 de vice).
Symbol Parameter Test Condition Min Max Unit
CIN Input Capacitance VIN = 0V 10 pF
CIO (3) Input / Output Capacitance VOUT = 0V 10 pF
Symbol Parameter Test Condition Min Max Unit
ILI (1) Input Leakage Current 0V VIN VCC ±1 µA
ILO (1) Output Leakage Current 0V VOUT VCC ±5 µA
ICC Supply Current Outputs open 50 mA
ICC1 Supply Current (Standby) TTL E = VIH 3mA
I
CC2 Supply Current (Standby) CMOS E = VCC – 0.2V 3mA
V
IL (2) Input Low Voltage –0.3 0.8 V
VIH Input High Voltage 2.2 VCC + 0.3 V
VOL Output Low Voltage IOL = 2.1mA 0.4 V
VOH Output High Voltage IOH = –1mA 2.4 V
Symbol Parameter Min Typ Max Unit
VPFD Power-fail Deselect Voltage M48T35 4.5 4.6 4.75 V
M48T35Y 4.2 4.35 4.5 V
VSO Battery Back-up Switchover Voltage 3.0 V
tDR Expected Data Reten tion Time
(at 25°C) Grade 1 10 (2) YEARS
Grade 6 10 (3) YEARS
M48T35, M48T35Y
6/18
Table 8. Power Down/Up AC Chara cteri stics
(TA = 0 to 70 °C or 40 to 85 °C)
Note: 1. VPFD (max) to VPFD (min) fall time of less than tF may result in deselection/wri te protection not occurring until 200µs after VCC pass-
es VPFD (min) .
2. VPFD (min) to VSS fall time of less than tFB may cause corruption of RAM data.
3. tREC (min) = 20m s for in dustrial temperatu re grad e (6) device.
Symbol Parameter Min Max Unit
tPD E or W at VIH before Power Down 0µs
tF (1) VPFD (max) to VPFD (min) VCC Fall Time 300 µs
tFB (2) VPFD (min) to VSS VCC Fall Time 10 µs
tRVPFD (min) to VPFD (max) VCC Rise Time 10 µs
tRB VSS to VPFD (min) VCC Rise Time s
t
REC (3) VPFD (max) to Inputs Recognized 40 200 ms
Figure 5. Power Down/Up Mode AC Waveforms
AI01168C
VCC
INPUTS
(PER CONTROL INPUT)
OUTPUTS
DON'T CARE
HIGH-Z
tF tFB tR
tPD tRB
tDR
VALID VALID
(PER CONTROL INPUT)
RECOGNIZEDRECOGNIZED
VPFD (max)
VPFD (min)
VSO
tREC
7/18
M48T35, M 48T35Y
Figure 6. Read Mode AC Waveforms.
Note: Write Enab le (W) = High.
AI00925
tAVAV
tAVQV tAXQX
tELQV
tELQX
tEHQZ
tGLQV
tGLQX
tGHQZ
VALID
A0-A14
E
G
DQ0-DQ7
VALID
Table 9. Read Mode AC Characteri stics
(TA = 0 to 70 °C or 40 to 85 °C; VCC = 4.75V to 5.5V or 4.5V to 5.5V)
Note: 1. CL = 100pF.
2. CL = 5pF .
Symbol Parameter
M48T35 / M48T35Y
Unit-70
Min Max
tAVAV Read Cycle Time 70 ns
tAVQV (1) Address Valid to Output Valid 70 ns
tELQV (1) Chip Enable Low to Output Valid 70 ns
tGLQV (1) Output Enable Low to Output Valid 35 ns
tELQX (2) Chip Enable Low to Output Transition 5 ns
tGLQX (2) Output Enable Low to Output Transition 5 ns
tEHQZ (2) Chip Enable High to Output Hi-Z 25 ns
tGHQZ (2) Output Enable High to Output Hi-Z 25 ns
tAXQX (1) Address Transition to Output Transition 10 ns
M48T35, M48T35Y
8/18
Table 10. Write Mo de AC Characteristics
(TA = 0 to 70 °C or 40 to 85 °C; VCC = 4.75V to 5.5V or 4.5V to 5.5V)
Note: 1. CL = 5pF.
2. If E goes low simultaneously with W going low , t he output s remai n in the hi gh i m pedance state.
Symbol Parameter
M48T35 / M48T35Y
Unit-70
Min Max
tAVAV Write Cycle Time 70 ns
tAVWL Address Valid to Write Enable Low 0 ns
tAVEL Address Valid to Chip Enable Low 0 ns
tWLWH Write Enable Pulse Width 50 ns
tELEH Chip Enable Low to Chip Enable High 55 ns
tWHAX Write Enable High to Address Transition 0 ns
tEHAX Chip Enable High to Address Transition 0 ns
tDVWH Input Valid to Write Enable High 30 ns
tDVEH Input Valid to Chip Enable High 30 ns
tWHDX Write Enable High to Input Transition 5 ns
tEHDX Chip Enable High to Input Transition 5 ns
tWLQZ (1, 2 ) Write Enable Low to Output Hi-Z 25 ns
tAVWH Address Valid to Write Enable High 60 ns
tAVEH Address Valid to Chip Enable High 60 ns
tWHQX (1, 2) Write Enable High to Output Transition 5 ns
DATA RETENTION MODE
With valid VCC applied, the M48T35/35Y operates
as a conventi onal BYTEWIDE stat i c RAM. Shoul d
the supply voltage de cay, the RAM will automati-
cally power-fail deselect, write protecting itself
when V CC fall s w ithin t he V PFD (max), VPFD (min)
window. All outputs become hig h impedance, and
all inputs are treated as "don't care."
Note: A power failure during a write cyc le may cor-
rupt data at the currently addressed location, but
does not jeopardize the rest of the RAM's content.
At voltages below VPFD (min), the user can be as-
sured the memory will be in a write protected state,
provided the VCC f all time is not less than tF. The
M48T35/35Y may respond to transient noise
spikes on VCC that reach into t he deselect window
during the time the device is sampli ng VCC. There-
fore, decoupling of the power supply lines is rec-
ommended.
When VCC drops below VSO, the control circuit
switches power to the internal battery which pre-
serves data and powers the clock. The internal
button cell will maintain data in the M48T35/35Y
for an accumulated period of at least 7 years when
VCC is less than VSO. As system power returns
and VCC rises above VSO, the battery is discon-
nected, and the power supply is swit ched to exter-
nal VCC. Write protection continues until VCC
reaches VPFD (min) plus tREC (min). E should be
kept high as V CC rises past VPFD (min) to prevent
inadvertent write cycles prior to processor stabili-
zation. Normal RAM operation can resume tREC
after VCC exceeds VPFD (max).
For more information on Battery Storage Life refer
to the Application Not e AN1012.
9/18
M48T35, M 48T35Y
Figure 7. Write Enable Controlled, Write AC Wavefo rm
Figure 8. Chip Enable Controlled, Write AC Waveforms
AI00926
tAVAV
tWHAX
tDVWH
DATA INPUT
A0-A14
E
W
DQ0-DQ7
VALID
tAVWH
tAVEL
tWLWH
tAVWL
tWLQZ
tWHDX
tWHQX
AI00927
tAVAV
tEHAX
tDVEH
A0-A14
E
W
DQ0-DQ7
VALID
tAVEH
tAVEL
tAVWL
tELEH
tEHDX
DATA INPUT
M48T35, M48T35Y
10/18
CLOCK OPERATIONS
Reading the Clock Updates to the TIMEKEEPER
registers should be halted before clock data is
read to prevent reading data in transition. Because
th e BiPORT T IM EKEEPER cell s i n th e R AM ar ra y
are only data registers, and not the actual clock
counters, updating the registers can be halted
without disturbing the clock itself.
Updating is halted when a1’ is written to the
READ bit, D6 in the Control Register 7FF8h. As
long as a ’1’ remains in that position, updating is
halted. After a halt is issued, the registers reflect
the coun t; that is, t he day, dat e, and t he t im e that
were current at the moment the halt command was
issued.
All of the TIMEKEEPER registers are updated si-
multaneously. A halt will not interrupt an update in
progress. Updating is within a second af ter the bit
is reset to a ’0’.
Setting the Clock
Bit D7 of the Control Register 7FF8h is the WRITE
bit. Setting the WRITE bit to a ’1’, like the READ
bit, halts updates to the TIMEKEEPER registers.
The user can then load them with the correct day,
date, and time data in 24 hour BCD format (see
Table 11). Resetting the WRITE bit to a ’0’ then
transfers the values of all time registers 7FF9h-
7FFFh to the actual TIMEKEEPER counters and
allows normal operati on to resume.The FT bit and
the bits marked as ’0’ in Table 11 mus t be written
to ’0’ to allow fo r normal T IMEKEEPER and RAM
operation. After the WRITE bit is reset, the next
clock update will occur within one second.
See the Application Note AN923 "TIMEKEEPER
rolling into the 21st century" on the for information
on Century Rollover.
Stopping and Starting the Oscillator
The oscillator may be stopped at any time. If the
device is going to spend a significant amount of
time on the shelf, the oscillat or can be turned off to
minimize current drain on the battery. The STOP
bit is the MSB of t he seconds regi ster. Setting it to
a ’1’ stops the oscillator. The M48T35/35Y is
shipped from STMicroelectronics with the STOP
bit set to a 1’. When reset to a ’0’ , the M48T35/35Y
oscillator starts within 1 second.
Ca librat ing t he C lock
The M48T35/35Y is driven by a quartz controlled
oscillator with a nominal frequency of 32,768 Hz.
The devices are tested not to exceed 35 ppm
(parts per million) oscillator frequency error at
25 °C, which equates to about ±1.53 minutes per
month. With the calibration bits properly set, the
accuracy of each M48T35 /35Y im proves to better
than ±4 ppm at 25 °C. The oscillation rate of any
crystal changes with temperature (see Figure 10).
Table 11. Register Ma p
Address Data Function/Range
BCD Format
D7 D6 D5 D4 D3 D2 D1 D0
7FFFh 10 Years Year Year 00-99
7FFEh 0 0 0 10 M Month Month 01-12
7FFDh 0 0 10 Date Date: Day of Month Date 01-31
7FFCh 0 FT CEB CB 0 Day of Week Century/Day 00-01/01-07
7FFBh 0 0 10 Hours Hours (24 Hour Format) Hour 00-23
7FFA h 0 10 Minutes Minutes Minutes 00-59
7FF9h ST 10 Seconds Seconds Seconds 00-59
7FF8h W R S Calibration Control
Key s: S = Sign Bit
FT = Frequency Test Bit (M ust be se t t o ‘ 0’ upon power for normal operation)
R = Re ad Bit
W = Wri te Bit
ST = Stop Bit
0 = Must be set to ze ro
CEB = Century Enable Bit
CB = Century Bit
Note: When CEB is set to ‘1’, CB will toggle from ‘0’ to ‘1’ or fr om ‘1’ to ‘0’ at the turn of the century (depend ent upon the initial value set).
When CEB is set to ‘0’, CB will not toggle.
Th e WRITE Bi t does not need to be set to write to CEB and CB.
11/18
M48T35, M 48T35Y
Two methods are available for ascertaining how
much calibration a given M48T35/35Y may re-
quire. The first involves simply setting the clock,
letting it run for a month and comparing it to a
known accurate reference (like WWV broadcasts).
While that may seem crude, it al lows the designer
to give the end user the ability to calibrate his clock
as his environm ent may require, even after the fi-
nal product is packaged in a non-user serviceable
enclosure.
All the designer has to do is provide a simple utility
that accesses the Calibration byte.
The second approach is better suited to a manu-
facturing environment, and involves the use of
some test equipment. When the Frequency Test
(FT) bit, the sevent h-most s ignificant bit in the Day
Register is set to a ’1’ , and D7 of the Seconds Reg-
ister is a ’0’ (Os cillator Running), DQ0 will toggle at
512Hz during a read of t he Sec onds Register. Any
deviation from 512 Hz indicates the degree and di-
rection of oscillator frequency shift at the test tem-
perature. For example, a reading of 512.01024 Hz
would indicate a +20 pp m oscillator frequen cy er-
ror, requiring a –10 (WR001010) to be l oaded into
the Calibration Byte for correction. Note that set-
ting or chang ing the Calibration Byte does not af-
fect the Frequency test output frequency.
The FT bit MUST be reset to '0' for normal clock
operations to resume. T he FT bit is automatically
Reset on power-up.
For more i nformation on cali bration, see the A ppli-
cation Note AN934 "TIMEKEEPER Calibration".
Most clock chips compensate for crystal frequency
and temperat ure shift error with cumb erso me trim
capacitors. The M48T35/35Y design, however,
employs pe riodic counter correction. The calibra-
tion circuit adds or subtrac ts counts from the oscil -
lator divider circuit at the divide by 256 stage, as
shown in Figure 9. The number of t imes pulses are
blanked (subtracted, negative calibration) or split
(added, positive calibration) depends upon the
value loaded into the five Calibration bits found in
the Control Register. Adding counts speeds the
clock up, subtracting counts slows the clock down.
The Calibration byte occupies the five lower order
bits (D4-D0) in the Control Register 7FF8h. These
bits can be set to represent any value between 0
and 31 in binary f orm . Bit D5 is a Sign bit; '1' indi-
cates positive calibration, '0' indicates negative
calibration. Calibration occurs within a 64 minute
cycle. The first 62 minutes i n t he cycle may , onc e
per minute, h ave one second either shortened by
128 or lengthened by 256 oscillator cycles. If a bi-
nary '1' is loaded into the register, only the first 2
minute s in the 64 minute cycle will be modified; if
a binary 6 is loaded, the first 12 will be affected,
and so on.
Therefore, e ach calibration step ha s the effect of
adding 512 or subtracting 256 osc illator cycles for
every 125,829,120 actual oscillator cycles, that is
+4.068 or –2.034 ppm of adjustment per calibra-
tion step i n t he cal ibrat ion registe r. Ass um ing that
the oscillator is in fact running at exactly 32,768
Hz, each of the 31 increments in the Calibration
byte would represent +10.7 or –5.35 seconds per
month which corres ponds to a total range of +5. 5
or –2.75 minutes per month.
Figure 9. Clock Calibration
AI00594B
NORMAL
POSITIVE
CALIBRATION
NEGATIVE
CALIBRATION
M48T35, M48T35Y
12/18
POWER SUPPLY DECOUPLING an d
UNDERSHOOT PROT ECTION
ICC transients, i ncluding those produced by output
switching, can produce voltage fluctuations, re-
sulting in spi kes on the VCC bus. These transien ts
can be reduced if capacitors are used to store en-
ergy, which stabilizes the VCC bus. The energy
stored in the bypass c apaci tors will be released as
low going spikes are generated or energy will be
absorbed when overshoots occur. A bypass ca-
pacitor value of 0.1µF (as shown in Figure 11) is
recommended in order to provide the needed fil-
tering.
In addition to transients that are caused by normal
SRAM operation, power cy cling can generate neg-
ative voltage spikes on V CC that drive it to v alues
below VSS by as much as one V olt. These nega-
tive spikes can cause data corruption in the SRAM
while in battery backup mode. To protect from
these voltage spikes, it is recommended to con-
nect a schottky diode from VCC to VSS (cathode
connected to VCC, ano de to VSS). Schot tky diode
1N5817 is recommended for through hole and
MBRS120T3 is recommended for surface mount.
Figure 10. Crysta l Accuracy Acro ss Temp eratur e
AI00999
–160
0 10203040506070
Frequency (ppm)
Temperature °C
80–10–20–30–40
–100
–120
–140
–40
–60
–80
20
0
–20
F= -0.038 (T - T0)2 ± 10%
Fppm
C2
T0 = 25 °C
Figure 11. Supply Voltage Protection
AI02169
VCC
0.1µF DEVICE
VCC
VSS
13/18
M48T35, M 48T35Y
Table 12. Ordering Information Scheme
No te : 1. The M48T35 p art is offered with t he PCDI P28 (i.e. CAPHAT) pac kage onl y.
2. The SOIC pack age (SOH 28) req ui res the battery package (SNAPHAT) whi ch is ordered separat el y under the part num ber
"M4TXX-BR12SH 1" in plast i c t ube or "M4TXX- BR 12SH1TR" in Tape & Reel f orm.
3. Avail able in S OIC package only .
Caution: Do not place the SNAPHAT battery package "M4TXX-BR12SH1" in conductive foam since will drain the lithium button-cell bat-
tery.
For a list of availabl e options (S peed, P ack age, et c...) or for further information on any aspect of this de-
vice, pleas e contact the ST Sales Office nearest to you.
Example: M48T35Y -70 MH 1 TR
Device Type
M48T
Supply Voltage and Write Protect Voltage
35 (1) = VCC = 4.75V to 5.5V; VPFD = 4.5V to 5.5V
35Y = VCC = 4.5V to 5.5V; VPFD = 4.2V to 4.5V
Speed
-70 = 70ns
Package
PC = PCDIP28
MH (2) = SOH28
Temperature Range
1 = 0 to 70 °C
6 (3) = –40 to 85 °C
Shipping Method for SOIC
blank = Tubes
TR = Tape & Reel
Table 13. Revision History
Date Revision Details
November 1999 First Issue
02/07/00 tDR Description changed (Table 7)
M48T35, M48T35Y
14/18
Table 14. PCDIP28 - 28 pin Plastic DIP, battery CAPHAT, Package Mechanical Data
Symb mm inches
Typ Min Max Typ Min Max
A 8.89 9.65 0.350 0.380
A1 0.38 0.76 0.015 0.030
A2 8.38 8.89 0.330 0.350
B 0.38 0.53 0.015 0.021
B1 1.14 1.78 0.045 0.070
C 0.20 0.31 0.008 0.012
D 39.37 39.88 1.550 1.570
E 17.83 18.34 0.702 0.722
e1 2.29 2.79 0.090 0.110
e3 29.72 36.32 1.170 1.430
eA 15.24 16.00 0.600 0.630
L 3.05 3.81 0.120 0.150
N 28 28
Figure 12. PCDIP28 - 28 pi n Plastic DIP, battery CAPHAT, Package Outline
Drawing is not to scale.
PCDIP
A2
A1
A
L
B1 B e1
D
E
N
1
C
eA
e3
15/18
M48T35, M 48T35Y
Table 15. SOH28 - 28 lead Plastic Small Outline, 4-socket battery SNAPHAT,
Package Mechanical Dat a
Symb mm inches
Typ Min Max Typ Min Max
A 3.05 0.120
A1 0.05 0.36 0.002 0.014
A2 2.34 2.69 0.092 0.106
B 0.36 0.51 0.014 0.020
C 0.15 0.32 0.006 0.012
D 17.71 18.49 0.697 0.728
E 8.23 8.89 0.324 0.350
e 1.27 0.050
eB 3.20 3.61 0.126 0.142
H 11.51 12.70 0.453 0.500
L 0.41 1.27 0.016 0.050
α
N 28 28
CP 0.10 0.004
Figure 13. SOH28 - 28 lead Plastic Small Outline, 4-socket battery SNAPHAT, Package Outline
Drawing is not to scale.
SOH-A
E
N
D
C
LA1 α
1
H
A
CP
Be
A2
eB
M48T35, M48T35Y
16/18
Table 16. M4T28-BR12SH SNAPHAT Housing for 48 mAh Battery & Crystal, Package Mechanical Data
Symb mm inches
Typ Min Max Typ Min Max
A 9.78 0.385
A1 6.73 7.24 0.265 0.285
A2 6.48 6.99 0.255 0.275
A3 0.38 0.015
B 0.46 0.56 0.018 0.022
D 21.21 21.84 0.835 0.860
E 14.22 14.99 0.560 0.590
eB 3.20 3.61 0.126 0.142
L 2.03 2.29 0.080 0.090
Figure 14. M 4T 28-BR12SH SN AP HAT H o u si n g for 48 mAh Battery & Crystal, Package Outline
Drawing is not to scale.
SHTK
A1 A
D
E
eA
eB
A2
BL
A3
17/18
M48T35, M 48T35Y
Table 17. M4T28-BR12SH SNAPHAT Housing for 120 mAh Battery & Crystal, Package Mechanical Data
Symb mm inches
Typ Min Max Typ Min Max
A 10.54 0.415
A1 8.00 8.51 0.315 0.335
A2 7.24 8.00 0.285 0.315
A3 0.38 0.015
B 0.46 0.56 0.018 0.022
D 21.21 21.84 0.835 0.860
E 17.27 18.03 0.680 0.710
eB 3.20 3.61 0.126 0.142
L 2.03 2.29 0.080 0.090
Figure 15. M4T28-BR12SH SNAPHA T Housing for 120 m Ah Battery & Crystal, Package Outline
Drawing is not to scale.
SHTK
A1 A
D
E
eA
eB
A2
BL
A3
M48T35, M48T35Y
18/18
Info rm atio n fur ni shed is bel i eved to be ac curate an d rel i able. However, STMicroelect ronics assumes no responsibility for t he cons equen ces
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is grant ed
by i m pl i cation or oth erwise unde r any pat ent or paten t rights of STMi croel ectron i cs . Speci fications mentioned i n thi s public at ion are s ubject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as c ri t i cal comp onents in l i f e support devices or syst em s without exp ress written approval of STMi croelectronics.
The ST logo is re gi stered trade m a rk of STMicroel ectronics
2000 STM i croel ectronic s - All Ri ghts Reserv ed
All other na mes are the property of thei r respective owners.
STMic ro electronics GRO UP OF COMPANI ES
Australia - Brazil - China - Finland - F rance - Germany - Hong Kong - In dia - Ital y - Japan - Ma la ysia - Malta - Morocco -
Sin gapore - S pai n - Sweden - Swit zerla nd - United King dom - U.S.A .
http://www.st.com