7
Notes:
1. Maximum operating frequency is dened when output waveform
(Pin 6) attains only 90% of VCC with RL = 1.8 kΩ, CL = 15 pF using a 5
V square wave input signal.
2. Measured at a point 1.6 mm below seating plane.
3. Current into/out of any single lead.
4. Surge input current duration is 3 ms at 120 Hz pulse repetition rate.
Transient input current duration is 10 µs at 120 Hz pulse repetition
rate. Note that maximum input power, PIN, must be observed.
5. Derate linearly above 100° C free-air temperature at a rate of 4.26
mW/°C. Maximum input power dissipation of 195 mW allows an
input IC junction temperature of 150°C at an ambient temperature
of TA = 125° C with a typical thermal resistance from junction to
ambient of θJAi = 235°C/W. The typical thermal resistance from
junction to case is equal to 170°C/W. Excessive PIN and TJ may result
in device degradation.
6. The 1.8 kΩ load represents 1 TTL unit load of 1.6 mA and the 4.7 kΩ
pull-up resistor.
7. Logic low output level at Pin 6 occurs under the conditions of VIN
≥ VTH+ as well as the range of VIN > VTH – once VIN has exceeded VTH+.
Logic high output level at Pin 6 occurs under the conditions of VIN
≤ VTH- as well as the range of VIN < VTH+ once VIN has decreased
below VTH-.
8. The AC voltage is instantaneous voltage.
9. Device considered a two terminal device: Pins 1, 2, 3, 4 connected
together, Pins 5, 6, 7 8 connected together.
10. This is a momentary withstand test, not an operating condition.
11. The tPHL propagation delay is measured from the 2.5 V level of the
leading edge of a 5.0 V input pulse (1 µs rise time) to the 1.5 V level
on the leading edge of the output pulse (see Figure 7).
12. The tPLH propagation delay is measured from the 2.5 V level of the
trailing edge of a 5.0 V input pulse (1 µs fall time) to the 1.5 V level on
the trailing edge of the output pulse (see Figure 7).
13. Common mode transient immunity in Logic High level is the
maximum tolerable dVCM/dt of the common mode voltage, VCM,
to ensure that the output will remain in a Logic High state (i.e., VO
> 2.0 V). Common mode transient immunity in Logic Low level is
the maximum tolerable dVCM/dt of the common mode voltage, VCM,
to ensure that the output will remain in a Logic Low state (i.e., VO
< 0.8 V). See Figure 8.
14. In applications where dVCM/dt may exceed 50,000 V/µs (such
as static discharge), a series resistor, RCC, should be included to
protect the detector IC from destructively high surge currents. The
recommended value for RCC is 240 Ω per volt of allowable drop in
VCC (between Pin 8 and VCC) with a minimum value of 240 Ω.
15. D1 and D2 are Schottky diodes; D3 and D4 are zener diodes.
16. Standard parts receive 100% testing at 25° C (Subgroups 1 and 9). SMD,
Class H and Class K parts receive 100% testing at 25, 125, and -55° C
(Subgroups 1 and 9, 2 and 10, 3 and 11, respectively.)
17. Parameters shall be tested as part of device initial characterization
and after process changes. Parameters shall be guaranteed to the
limits specied for all lots not specically tested.
Typical Characteristics All typical values are at TA = 25° C, VCC = 5 V, unless otherwise specied.
Parameter Symbol Typ. Units Test Conditions Fig. Note
Hysteresis IHYS 1.2 mA IHYS = ITH+ – ITH- 1
VHYS 1.1 V VHYS = VTH+ – VTH-
Input Clamp Voltage VILC -0.76 V VILC = V2 - V3; V3 = GND;
IIN = -10 mA
Bridge Diode Forward Voltage VD1,2 0.62 IIN = 3 mA (see schematic)
VD3,4 0.73
Input-Output Resistance RI-O 1012 ΩVI-O = 500 Vdc 9
Input-Output Capacitance CI-O 2.0 pF f = 1 MHz, VI-O = 0 Vdc
Input Capacitance CIN 50 pF f = 1 MHz; VIN = 0 V,
Pins 2 & 3, Pins 1 & 4 Open
Output Rise Time (10-90%) tr10 µs 7
Output Fall Time (90-10%) tf0.5 µs 7