MIL SPECS W4E D MM 0000125 0032564 9 MENILS |The documentation and process conversion |measures necessary to comply with this [reviston shall be conpleted 8Y 15 Jan 93, | | oo | INCH-POUND | {_ MIL-S-19500/124G 992 SUPERSEDING MIL-S-19500/124F 1 August 1980 MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR B AND RB TYPES 1N2970 THROUGH 1N2977, 1N2979, 1N2980, 1N2982, IN2984 THROUGH 1N2986, 1N2988 THROUGH 1N2993, 1N2995, IN2997, IN2999 THROUGH 1N3005, 17N3007, 1N3008, 1N3009, 1N3011, 1N3072, 1N3014, 1N3015, A AND RA TYPES 1N3993 THROUGH 1N3998, JAN, JANTX, JANTXV, ANO JANS This specification 1s approved for use by all Depart- ments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for 10 watt, silicon, voltage reguiator diodes: A o> B type (standard polarity); RA or RB type (reverse polarity). Four levels of product assurance are provided for each device type as specified in MIL-S-19500. 1.2 Physical dimensions. See figure 1 (D0-4). 1.3. Maximum ratings. (maximum ratings are as shown in columns 4, 8, and 10 of table V herein and as follows: ~65C = T, = +175C; P, = 10 W at T. = +55C; derate at .083 W/C above +55C. -65C s Totg * +200C. 1.4 Primary electrical characteristics. Primary electrical characteristics are as shown 1n columns 2, 9, 12, and 14 of table V herein, and as follows: Thermal resistance (Raye = 12C/W maximum. 2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those Listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2). Il \Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be lof use in improving this document should be addressed to U.S. Army Laboratory Command Electronics [Technology and Devices Laboratory ATTN: SLCET-RS Fort Monmouth, NJ 07703-5601 by using the |Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document lor _tetter ANSC N/A FSC 5961 OISTRIBUTION STATEMENT A. Approved for public release, J'stribution 1s unlimited.MIL SPECS GUE >) M@@ 0000125 0032585 O MBNMNILS MIL-S-19500/124G SPECIFICATIONS MILITARY MIL-S-19500 - Semiconductor Devices, General Specification for. STANDARDS MILITARY MIL-ST0-750 - Test Methods for Semiconductor Devices. (unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Standardization Documents Order Desk, Building 40, 700 Robbins Avenue, Philadelphia, PA 19111-5094.) 2.2 Order_of precedence. In the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Associated detail specification. The individual item requirements shall be in accordance with MIL-S-19500, and as specified herein. 3.2 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified in MIL-S-19500. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-S-19500 and on figure 1 herein. a. Device types 1N2970B through 1N3015B8 and 1N3993RA through AN3998RA shall have the anode connected to the stud. b. Device types 1N2970RB through 1N3015RB and 1N3993A through 1N3998A shall have the cathode connected to the stud. 3.3.1 Lead finish. Lead finish shall be gold, silver, or tin-lead plated. Where a choice of lead finish is desired, 1t shall be specified in the acquisition document (see 6.2). 3.4 Marking. Devices shall be marked in accordance with MIL-S-19500. At the option of the manufacturer, the marking of the country of origin may be omitted from the body of the diodes, but shall be retained on the initial container. 3.4.1 Reverse polarity types. Reverse polarity units (see 3.3a and b) shall be marked with an "R" preceding the "A" or "B" in the type designation, as applicable. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection shalt be in accordance with MIL-S-19500, and as specified herein. 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-S-19500 and as specified herein.MIL SPECS 44E D MM 0000125 0032586 2 MENILS MIL-S-19500/124G 4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shatl be in accordance with table II of MIL-S-19500, and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the Limits of table I herein shall not be acceptable. Measurement Screen (see table II of MIL-S-19500) JANS Level JANTX and JANTXV levels 7(b) MIL-STD-750, test method 1071,{ MIL-STD-750, test method 1071, condition C, step 2. condition C, step 2. 9 Ip and V, (for devices Not applicable with V 2 10 V de; see column2"3? table Vv). 11 I, and V,; AI, = 100% I, and V of initisl value or 1. of R 2 column 12 of table V, which- ever is greater; AV, = 2.5% of initial value (for devices with V 2 10 V de; see column=5"3P table Vv). 12 See 4.3.1 See 4.3.1 13 Subgroups 2, 3, and 4 of Subgroup 2 of table I herein; Al, table I herein; Alp = 100% = 100% of initial value or 1. of of initial value or 1 of column 12 of table V, whichever column 12 of table V, which- fis greater; AV, = 42.5% of ever is greater; AV, = #2.5% |initial value. of initial value. 4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: nF Column 18 of table V; V, = Column 2 of table V7; T, = 150 #5C. 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL-S-19500 and as specified herein. Group A inspection shall be performed on each sublot. 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-S-19500 and table I herein. End point electrical measurements shall be in accordance with the applicable steps of table IV herein. 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table IVa (JANS) and table IVb (JAN, JANTX, and JANTXV), of MIL-S-19500, and tables Ila and IIb herein. Electrical measurements (end points) and detta requirements shalt be in accordance with the applicable steps of table IV herein.MIL SPECS GUE D MM OO001eS 0032547 4 MMILS MIL-$-19500/124G TABLE I. Group A inspection. | MIL-STD-750 | Limits 2/ | Inspection 1/ Symbol | | unit | | Method Conditions | Min Max | 1 | Subgroup _1 |Visual and mechanical| 2071 inspection Subgroup 2 Forward voltage 4011 |I, = 2 A de Ve 1.5 V de Reverse current 4016 Ve = column 11 of table V, Ie4 Column | A de de method 12 Regulator voltage 4022 i, = column 5 of table V [Vy Column | Column { V de (see 4.5.3) | 3 4 Subgroup 3 | High temperature T, = 150C | | operation | | Reverse current 4016 |de method Ve = column 11 of Ip 500 pA de table V Subgroup 4 | Smalt-signal break- 4051 1, = column 5 of table V; q, | Column | ohms down impedance Ieig 7 10% I,rms | 6 g Zz | Knee impedance 4051 |T2, = 1 mA de, Ieig = 10% I,prms | lay coum ohms | Subgroup 5 | Not applicable Subgroup 6 JANS Level only Surge current 4066 Te = 25C; Lasm = column 10 of (see 4.5.1) table V | | End point electrical See table IV, steps 1, 3, and 4 measurements Subgroup 7 JANS level only [Voltage regulation Vv Column | V de | (see 4.5.2) 7(reg) 9 | Temperature 4071 I, = column 5 of table V; aV column | /C . z Zz coefficient of T, = 30C; T, = T, +100C 14 4 2 1 breakdown voltage (see 4.5.4) j 1/ for sampling plan, see MIL~S-19500. Column references are to table V herein.MIL SPECS WOE D Ml 0000125 0032548 & @BMILS MIL-S-19500/124G TABLE lla. Group 8 inspection for JANS devices. | | | MIL-STD-750 | Inspection 1/ | | Method Conditions | | | Subgroup 1 | |Physical dimensions 2066 See figure 1 | Subgroup 2 Solderability 2026 Dwell time = 10 #1 8; immersion to cover flat portion of terminal only |Resistance to solvents 1022 Subgroup 3 Thermal shock 1051 (temperature cycling) Hermetic seal 1071 a. Fine b. Gross Electrical measurements See table 1V, steps 1, 3, 4, 5, and 6 Die shear 2017 Subgroup 4 Intermittent operating 1037 I, = column 8 of table V, t., = toss life ="3 minutes minimum for 2,000 cycles. Te = 30 +3C jElectrical measurements See table IV, steps 1, 3, 4, 5, and 6 Subgroup 5 | Accelerated steady - | 1027 Ly = column 15 of table V for 96 hours, state operation life [T. = 125C or adjusted, as required, to [give an average lot {Ty = 225C | Electrical measurements |See table IV, steps 2, 3, 4, 5, and 6 | | Subgroup 6 | | Thermal resistance 4081 {R = 12C/W maximum, T, = 30 #3C. Jc : we |For purposes of this test "junction |to case" shall be used in Lieu of | | | | | | | | | | | | | | | | | | V "junction to lead" and "R c" shall be fused in Lieu of "R_,,". @ case shall |be the reference point for calculation lof junction to case thermal resistance [Ra y)- The mounting arrangement shall |be with heat sink to case. | For sampling plan, see MIL-S-19500. | | | |MIL SPECS WUE D MM OOO01leS 0032589 & MBNILS MIL-S-19500/124G TABLE Ilb. Group B inspection for JAN, JANTX, and JANTXV devices. MIL-STD-750 Inspection 1/ Method Conditions Subgroup 1 Solderability 2026 {Owell time = 10 +1 $s; immersion to cover flat portion of terminal only Resistance to solvents 1022 Subgroup 2 Thermal shock 1051 (temperature cycling) Surge current Lisy = column 10 of table V (see 4.5.1) Hermetic seal 1071 a. Fine leak b. Gross leak Electrical measurements See table lV, steps 1, 3, and 4 Subgroup 3 Steady-state operation 1027 1, * column 15 of table V life Te = 150 25C Electrical measurements See table IV, steps 2, 3, and 4 Subgroup 4 Decap internal visual 2075 (design verification) Subgroup 5 Thermal resistance 4081 R J = 12C/W maximum; T, = 30 33 f. For purposes of this test "junction to case" shall be used in lieu of "junction to lead and Re ic. shall be used in Lieu of "R The case shall be the vetertike point for calculation of Junct Yon to case thermal resistance (Ry The mounting arrangement ORgt i be with heatsink to case. Subgroup 6 High temperature (non- 1032 = 200C operating Life) Electrical measurements See table IV, steps 2, 3, and 4 1/ For sampling plan, see MIL-S-19500.Subgroup 2 MIL SPECS WUE D @ 00003e5 0032590 4 MBNILS MIL-S-19500/1246 TABLE III. Group C inspection for all quality levels. | | | | MIL-STD-750 | | Limits Inspection 1/ | | Symbol | Unit | | | | Method Conditions | | Min Max | | | Subgroup 1 | | Physical dimensions 2066 See figure 1 | | | Thermat shock (glass strain) Terminal strength Tension Torque (terminal) Torque (stud) Bending stress Hermetic seal a. Fine leak b. Gross leak | ee |Moisture resistance | [Electrical measurements | Subgroup 3 Shock Vibration, variable frequency Constant acceleration Electrical measurements Subgroup 4 Salt atmosphere (corrosion) 1056 2036 1071 1021 2016 2056 2006 Test condition A; 20 t=15 23 s pounds; Test condition D4; 10 ounce-inches; t = 15 #3 s Test condition 05; 15 pound-inches; t = 30 #3 s Test condition F; 3 pounds; t = 15 #3 s, method B. See table lV, steps 1, 3, 4, 5, an 6 CJANS) and steps 1, 3, and 4 (JAN, JANTX, and JANTXV) See table IV, steps 1, 3, 4, 5, and 6 (JANS) and steps 1, 3, and 4 (JAN, JANTX and JANTXV) See footnotes at end of table.MIL SPECS WUE D MM 0000125 0032591 & MENILS MIL-S-19500/124G TABLE III. Group C_inspection for all quality levels) - Continued. | | MIL-ST0-750 | Limits Inspection 1/ | Symbol | Unit Method Conditions Min Max Subgroup 5 2/ Barometric pressure 1001 & mm Hg reduced (altitude operation) Subgroup 6 Steady-state operation 1026 I= column 15 of table IV life Te = #150 5C Electrical measurements See table IV, steps 2, 3, 4, 5, and 6 (JANS) and steps 2, 3, and 4 (JAN, JANTX, and JANTXV) Subgroup 7 3/ JAN, JANTX, and JANTXV levels only Temperature coefficient 4071 i= column 5 of table v av, Column Cc of breakdown voltage Ty = 30 3C; To = Ty +100C 14 of (see 4.5.3) each sublot table Iv Voltage regulation Each sublot Va (req) Column V de (see 4.5.2) 9 9 of : table V i/ For sampling plan, see MIL-S-19500. 2/ LTPO = 15, small Lot = 6 devices, C = 0. 3/ LTPD = 10, small lot = 12 devices, C = 0.MIL SPECS WHE D MM O0001eS 003259e 6 MBNILS Page(s) 4 t10_ of this document was (were) missing upon receipt. The document has been reordered and will be refilmed when received. INFORMATION HANDLING SERVICES ee een NRE RIT Seam wer wines Ae cone frame timamcirmemm = mo ne RO ta cen ae Rhea BE REN Te (HS #A0236b (11/81)MIL SPECS Q4YE D MM O0001e5 0032593 T MEMILS MIL-S-19500/1246 baee ene o { OM ems =] TERM 1 SEATING PLANE o- Dimensions Symbol Inches Millimeters Notes Min Max Min Max A -300 -405 7.62 | 10.29 C -012 - 065 .30 1.65 D 2o-- .505 ---- | 12.83 oD, .255 424 6.48 | 10.77 E 423 .438 | 10.74 | 11.13 F .075 75 1.90 4,44 F, .060 175 1.52 4,44 2 J -600 .800 | 15.24 | 20.32 ou - 163 - 189 4.14 4.80 1 om, core core non ---7 5 sco- -250 ---- 6.35 3 N -422 -453 | 10.72 | 11.51 N. coee .078 ---- 1.98 4 -060 .095 1.52 2.41 W << --- << -<- NOTES: 1. Complete threads to extend to within 2-1/2 threads of seating plane. 2. Chamfer on undercut on one or both ends of hexagonal base is optional. 3. Angular orientation of this terminal is undefined. 4. Length of incomplete or undercut threads of 9M. 5. 10-32 UNF-2A maximum pitch diameter of plated threads shall be basic pitch diameter (.1697 inch (4.310 mm)) reference. (Screw thread standards for Federal Services 1957) Handbook H28 P1. 6. Metric equivalents are given for general information only. FIGURE 1. Physical dimensions. 11MIL SPECS 4Y4E D MM 0000125 0032554 1 MMMILS MIL-S-19500/ 1246 4.4.3 Group C_inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table V of MIL-S-19500 and tabte III herein. Electrical measurements (end points) and delta requirements shalt be in accordance with the applicable steps of table IV herein. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows: 4.5.1 Surge current _I,,,. The currents specified in column 10 of table V shall be applied in the reverse direction and shall be superimposed on the current (I, = column 5 of table V) a total of five surges at 1-minute intervals. Each individual surge shall be a 1/2 square wave pulse of 1/120-second duration or an equivalent 1/2 sine wave with the same effective (rms) current. 4.5.2 Voltage requlation V, (reg). A current at 10 percent of I5y (column 8) shall be maintained until thermal equilibrium is obtained, and the I shall then be increased to a Level of 50 percent of 1, (column &) and maintained at this level for a period of time until thermal equilibrium is obtained at whieh time the voltage change shalt not exceed column 9 of table V. During this test, the case temperature (Te) of the diode shall be equal to 30 #3C. 4.5.3 Requlator voltage. The I, test current (column 5 of table V) shall be applied until thermal equilibrium is obtained prior to reading the regulator voltage. Ouring this test, the case temperature (T.) of the diode shall be equal to 30 #3C. 4.5.4 Temperature coefficient of regulator voltage (aV,). The device shall be temperature stabilized with current applied prior ta reading regulator voltage at the specified case temperatures. 4.5.5 Inspection condition. Unless otherwise specified in MIL-S-19500 or herein, all inspections shall be made at case temperature (T,) of 30 23C. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-S-19500. 6. NOTES 6.1 Notes. The notes specified in MIL-$-19500 are applicable to this specification. 6.2 Ordering data. Procurement documents should specify the following: a. Lead material and finish (see 3.2.1). b. Type designation, polarity type, and product assurance level. 6.3 Part number information. Part numbers 1N3993A, RA through AN3998A, and RA from MIL-S-19500/272 have been incorporated into MIL-S-19500/124. 6.4 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. 12MIL SPECS Custodians: Army - ER Navy - EC Air Force - 17 NASA - NA Review activities: Army - AR, MI Navy - SH Air Force - 11, 19, 85 OLA - ES NASA - LRC, MSF User activities: Army SM Navy - AS, CG, MC, OS Air Force - 13 WUE D MM O0001eS 0032595 3 MENILS MIL-S-19500/1246 Preparing activity: Army - ER Agent: DLA - ES (Project 5961-1365) 13