CY7C277
2
Functional Description
The CY7C277 is a hig h-performance 32K word by 8-bit CMOS
PROMs. It is packaged in the slim 28-pin 300-mil package . The
ceramic package may be equipped with an erasure window;
when exposed to UV light, the PROM is erased and can then
be reprogrammed. The memory cells utilize proven EPROM
floating-gate technology and byte-wide algorithms.
The CY7C277 offers the advantages of low power, superior
performance, and high programming yield. The EPROM cell
requires only 12.5V for the supervoltage and low current re-
quirements allow for gang programming. The EPROM cells
allow for each memory location to be 100% tested, as each
loca tion is written into, erased, and repeatedly exercised prior
to encapsulation. Each PROM is also tested for AC perfor-
mance to guarantee that the product will meet DC and AC
specification limits after customer programming.
On the 7C277, the outputs are pipelined through a mas-
ter-slav e register. On the ris ing edge of CP, data is loaded into
the 8-bit edge triggered output register. The E/ES input pro-
vides a programmable bit to select between async hronous an d
synchronous operation. The default condition is asynchro-
nous. When the asynchronous mode is sele cted, the E/ES pin
operates as an asynchronous output enable. If the synchro-
nous mode is selected, the E/ES pin is sampled on t he rising
ed ge of C P to enab le and disa ble the outputs. The 7C27 7 a ls o
provides a programmable bit to enable the Addre ss Lat ch in-
put. If this bit is n ot programmed , the device will ignore the ALE
pin and the address will enter the de vice async hronously. If the
ALE function is selected, the address enters the PROM while
the ALE pin is active, and is captured when ALE is d easserted.
The user may define the polarity of the ALE signal, with the
default being active HIGH.
Maximum Ratings
(Abo ve which the useful life may be impaired. For user guide-
lines, not tested.)
Stora ge Temperature ....................................−65°C to +150°C
Ambient Temperature with
Power Applied.................................................−55°C t o +125°C
Supply Voltage to Ground Potential.................−0.5V to +7.0V
(Pin 24 to Pin 12)
DC Volt ag e A pplied to Outputs
in High Z State.....................................................−0.5V to +7.0V
DC Input Voltag e.................................................−3.0V to +7.0V
DC Program Volta ge (Pins 7, 18, 20)...........................13.0V
UV Erasure...... ..... ..... ..... ....... ..... ..... ....... ..... .7258 W sec/cm2
Static Discharge Voltage...........................................>2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current.. .......... ....... .......... ............ ..... .......>200 mA
Operating Range
Range Ambient Temperatur e VCC
Commercial 0°C to +70°C 5V ±10%
Industrial[1] −40°C to +85°C 5V ±10%
Military[2] −55°C to +125°C 5V ±10%
Electrical Characteristics Over the Operating Range[3 , 4]
Parameter
7C277-30 7C277-40, 50
Description Test Condition s Min. Max. Min. Max. Unit
VOH Output HIGH Voltage VCC = Min. , IOH = − 2.0 mA 2.4 2.4 V
VOL Output LOW Voltage VCC = Min. , IOL = 8. 0 mA 0.4 0.4 V
VIH Input HIGH Level Guaranteed Input Logical HI GH
Voltage for All Inputs 2.0 VCC 2.0 VCC V
VIL Input LOW Level Guaranteed Input Logical LOW
Voltage for All Inputs 0.8 0.8 V
IIX Input Leakage Current GND < VIN < VCC −10 +10 −10 +10 µA
VCD Input Clamp Diode Volta ge Note 4
IOZ Output Leakage Current 0 < VOUT < VCC, Output Disabled[5] −40 +40 −40 +40 µA
IOS Output Short Circuit Current VCC = Max., VOUT = 0. 0V[6] −20 −90 −20 −90 mA
ICC Power Supply Cur rent VCC = Max., CS > VIH
IOUT = 0 mA Commercial 120 120 mA
Military 130
VPP Programming Supply Voltage 12 13 12 13 V
IPP Programming Supply Current 50 50 mA
VIHP I nput HIGH Programming Voltage 3.0 3.0 V
VILP I nput LOW Programming Volta ge 0.4 0.4 V
Notes:
1. Contact a Cypress representative for industrial temperature range specifications.
2. TA i s the “i nstant o n” case temper ature.
3. See the last page of this specification for Group A s u bgroup testing information.
4. See “Introduction to CMOS PROMs” in this Book for general information on testing.
5. For devices using the synchronous enable, the device must be clocked after applying thes e voltages to perform this meas urement.
6. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seco nds.