Table of Contents
Features…………………………………………………………………………1
AMI6Gx Gate Array Family……………………………………………………2
AMI6S Standard Cell Family…………………………………………………3
Digital Megacell Family………………………………………………………3
Architectural Overview…………………………………………………4 - 5
Product Applications…………………………………………………………6
ASIC Design Tools and Methodology…………………………………6 - 7
The Design Library………………………………………………………8 - 9
DC Specifications………………………………………………………10 - 11
Library Cell Selection Guide…………………………………………12 - 20
Packaging……………………………………………………………………21
“The new 0.6µm gate array and standard cell families from AMI
provide outstanding quality and selection . . . setting performance
standards in 0.6µm ASIC products . . .
130 ps gate delays (fanout = 2, interconnect length = 0mm)
Double and Triple Metal Interconnect; up to 900,000 gate
designs using megacells, ROM, RAM, and logic
An innovative pad cell design method that allows the user
to design pad cell configurations using predefined pieces
Complete package lineup
QFP, PLCC, BGA, PGA . . .
Expanded selection of megacells
Families of single and multi-port RAMs, ROMs,
microprocessors, controllers, datapath functions . . .
“Made in America engineering, manufacturing, and support
1
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Extensive library for quick design:
– Complete primary cell and I/O library.
– Asynchronous and synchronous, single and dual-port
RAM compilers with over 2000 compiled RAM sizes
from 32x1 to 2Kx32 bits.
– Synchronous ROM compiler from 64x1 to 16Kx32
bits.
– Megacells include processors, peripherals, and
datapath synthesizers.
– 100% compatible with AMI’s proven ASIC Standard
Library.
1 to 24 mA drive per single I/O cell:
Slew rate limiting available for 4, 8, 12, 16, and 24 mA
drive. Custom configurations for I/O drive up to 96 mA
can be supported.
Wide range of packaging:
Full QFP and PLCC line, BGAs and PGAs, individual
die. Burn-in capability as required.
Automatic Test Program Generation:
Includes scan macros (NETSCAN) for high fault
coverage.
JTAG Boundary Scan macro support
Full operating voltage range from 2.7V to 5.5V
ESD protection > 2kV; latchup > 100 mA
Power dissipation:
2.7µW/MHz/gate (FO=1; VDD=5V) for gate array and
2.5µW/MHz/gate for standard cell.
Description
AMI’s “AMI6Gx” series of 0.6µm gate arrays exploits a
proprietary power grid and track routing architecture on a
compact, channelless, sea-of-gates design to provide
one of the highest performance, cost effective array
products available today.
The “AMI6S” standard cell family continues the AMI
leadership tradition of combining true compact building
block standard cells and megacells with high speed
memory and datapath functions. Using a 0.6µm high
performance CMOS process, the AMI6S product can
offer a lower cost alternative to gate array for high volume
applications.
Features
Excellent performance:
– 395 MHz maximum toggle rate on clocked flip-flops
(TJ = 135°C).
– 215 ps delay (FO=2; L=2mm) for a 2-input NAND
gate.
– 130 ps delay (FO=2; L=0mm) for a 2-input NAND
gate.
Operating Temperatures range from -55 to 125oC:
Few competing products allow this range.
Clock grid generation:
300ps clock skew (fan out = 3500 at 80 MHz).
User-designed pad cells:
AMI allows the user to design pad cells by piecing
together predefined components.
Cost driven architecture:
– Offers both 2 and 3 level metal interconnect to
provide the lowest user cost for the number of gates
and pads required.
– Compiled memory blocks on standard cells are
compacted precisely to parameters. No leaf cell
overhead.
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Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
AMI6Gx Gate Array Family Overview
Note 1: Exact usable gate count will vary depending on design interconnect and macro selection.
Note 2: The AMI6GS series has AMI’s proprietary enhanced I/O for tighter pad pitches.
PART NUMBER2RAW GATES USABLE GATES1BOND PADS I/O CELLS
2LM 3LM
AMI6G4 4.01 2.01 2.67 44 52
AMI6G16S 15.71 7.85 10.46 100 100
AMI6G33S 32.87 16.44 21.89 144 144
AMI6G41S 40.49 20.25 26.97 160 160
AMI6G70S 69.28 34.64 46.14 208 208
AMI6G106S 105.74 52.87 70.42 256 256
AMI6G150S 149.88 74.94 99.82 304 304
AMI6G202S 201.71 100.86 134.34 352 352
AMI6G333 333.51 166.76 222.12 384 452
AMI6G471 470.53 235.27 313.37 456 536
AMI6G603 602.77 301.39 401.44 520 608
AMI6G713 712.94 356.47 474.82 564 660
AMI6G876 875.63 437.82 583.17 624 732
AMI6G1046 1045.91 522.96 696.58 684 800
AMI6G1210 1210.35 605.18 806.09 736 860
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Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
AMI6S Standard Cell Family Overview
Digital Megacell Family Overview
Note 1: Compact memory arrays greatly increase gate count on an equivalent gate basis.
Feature Description Comment
Complexity Up to 900,000 gates1
Up to 500,000 gates 50% memory, 50% megacell and user defined logic
100% user defined logic
I/O Count Up to 512 pins
Up to 836 pins Test equipment limit; signal pins only
Die size limit; includes power supply pins
Delay
Time
Internal Gate 102 ps (Fanout=1, L=0mm)
215 ps (Fanout=2, L=2mm) 2 input NAND gate, T=25°C, VDD=5V
Input Buffer 675 ps (Fanout=2, L=2mm) CMOS Input buffer, T=25°C, VDD=5V
Output Buffer 860 ps (CL=15pf) CMOS Output buffer,T=25°C, VDD=5V
Feature Description Comment
Core Processors MG29C01,MG29C10,MG65C02,
M8042, M8048, MG80C85, MGMC51,
MGMC51I, MGMC51FB, MGMC51SD
Functionally compatible with popular standard
designs.
Peripherals
MG1468C18, M16C450, M6402,
M6845, M765A, M8251A, M8253,
M82530, MG82C37A, MG82C50A,
MG82C54, MG82C55A, MG82C59A,
M8490, M85C30, M8868A, M91C36,
M91C360, MFDC, MGI2CSL, MI2C
Functionally compatible with popular standard
designs.
FIFOs Fall-through and RAM-based FIFO’s See page 9 for complete list and details
Datapath Synthesizers multipliers, adders, subtracters, barrel
shifters, comparators,... See page 9 for complete list and details
Memory Compilers
synchronous single-port self-timed
SRAM (over 4000 sizes)
synchronous dual-port SRAM
(over 4000 sizes)
synchronous ROM (over 8000 sizes)
asynchronous single-port SRAM
See page 8 for complete list and details
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Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Architectural Overview
Some important elements of the AMI6Gx gate array family
are:
[Note 1] 2 or 3 level metal interconnect selectable.
[Note 2] Two p-channel and two n-channel transistors
per site (or cell). Sites are arrayed in a sea-of-gates
structure that can allow interconnect routing over active
sites. Also, p-channel transistors are sized larger than
the stronger n-channel transistors in each cell to provide
better matched rise times and fall times.
[Note 3] Four separate power busses for I/O cells to
allow separate supplies for output buffers, input buffers,
and mixed VDD levels all on an individual I/O cell basis.
Two separate power busses for core logic (not shown).
Each I/O cell can be configured as 5V VDD, 3V VDD, VSS,
or signal I/O.
[Note 4] Each I/O cell has selectable drive from 1mA to
24mA. All I/O cell logic can be built in the I/O cell
prebuffer. Level shifting (3V to 5V or 5V to 3V) may
require the use of a few core gates.
Core cell sites with 4 transistors [note 2]
2 P-channel
2 N-channel
Separately configured power busses for I/O and core [note 3]
Large I/O driver with prebuffer [note 4]
Selectable 2 or 3 metal interconnect [note 1]
FIGURE 1: GATE ARRAY ARCHITECTURE
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Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Architectural Overview
Some important elements of the AMI6S standard cell
family are:
2 or 3 level metal interconnect selectable.
[Note 1] Each cell function is tightly compacted to a
fixed bus height. Cells are then placed in rows allowing
VDD and VSS supplies to feed through the cells. Since
some functions require more gates than others, their
widths and heights may increase to allow for the added
gates. Transistor sizes and routing are optimized for
their function, giving a much tighter cell design than
with gate arrays or fixed pad ring embedded array
products.
[Note 2] Rows of cells can be placed adjacently if little
routing is required between them, or largely separated
to allow a large data bus to route through. Tracks of
ROM
BLOCK
RAM
BLOCK
MG29C01
Soft Megacell
DF101
Individually compacted cells [note 1]
Fixed bus height, variable height
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Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Product Applications
The Gate Array’s extended temperature and voltage
operation range make it well suited for telecom, industrial,
and military applications. The low cost structure also
makes it ideal in computer and office automation ASIC
requirements.
The AMI6S standard cells are targeted at higher volume
digital ASIC products. The lower cost also fits designs
requiring significant on-board memory, datapath logic, or
megacells.
FPGA OR PAL CONVERSION: Using NETRANS AMI
can convert netlists from most gate array, FPGA, and PAL
devices to a more cost and performance effective AMI6X
design for volume production.
2ND SOURCE EXISTING PRODUCTS: Netlist
conversion capabilities from AMI allow a competitive
alternate supply with AMI6X components for current high
volume designs.
NEW DESIGN CAPTURE: AMI6X design is supported by
many popular 3rd party software platforms, as well as
AMI’s Enhanced Design Utilities (EDU) environment.
PROCESS UPGRADE: Designs done in AMI’s 1.25µm,
1.0µm, and 0.8µm ASIC products can easily be upgraded
to the AMI6X family. The AMI ASIC Standard Library
provides a common netlist design base.
ADDING CUSTOM BLOCKS: AMI specializes in adding
custom logic to ASIC designs. Simple analog functions
are also possible.
ASIC Design Tools and Methodology
AMI6X and other AMI ASIC families are supported on
many front-end design environments:
Cadence
Mentor Graphics
Synopsys
Viewlogic
Intergraph
Compass
Verilog simulation
IKOS simulation accelerator
(AMI’s sign-off simulator)
AMI has maintained critical proprietary software tools to
ensure a tight, well coupled design to our silicon process.
This methodology includes our expert-system design
analysis tools, AMI’s Enhanced Design Utilities (EDU), a
software support methodology that covers the complete
set of wafer processing possibilities, and a dedicated,
experienced engineering staff that can assist at any level
of the design process.
AMI Design Flow
AMI will supply an AMI6X design kit which includes a cell
library containing symbols, simulation models and
software for design verification, timing calculations, and
netlist generation. For pre-layout timing simulations,
capacitance and resistance values derived from statistical
FIGURE 3: ASIC DESIGN FLOW
Specification
Design
Std. Library
AMI ASIC
Synthesis Tool
AMI supported
Schematic
Capture
Logic / Timing
Simulation
Simulation
Fault
Test VectorsNetlist transfer
to AMI
Simulation
Verification
Place and Route
Extraction
Layout Parameter
Back Annotation
to Customer Post Layout
Simulation
Physical Design
Verification
Final Review
Customer
Approval
Mask Creation
Fabricate and Test
Prototypes
Test
Development
Prototype Approval
to AMI
Customer
Design
Activity
AMI megacell
or memory block
7
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
averages of known layouts are used. Once actual layout is
completed by AMI, a post-layout interconnect capacitance
and resistance table will be supplied for final validation of
device timing.
Figure 3 shows a typical design flow for a new design.
Working with an AMI design center, the customer is
responsible for capturing and verifying the design using the
AMI ASIC Standard Library. He is also responsible for
creating the test vectors that will eventually serve as the
logical part of the manufacturing test. Software aids such
as logic synthesis, megacells, automatic test program
generation, netlist rule checkers, etc. can greatly speed up
this process. (A fault coverage check of the test vector set
is optional and can be done as an additional service.)
When the design is received by the factory, the “Design
Start Package” is reviewed by AMI engineers. This start
package, which is completed by the customer, contains the
device specification, netlist, pinlist file, critical timing paths,
and test vectors. The design is pre-screened on the
Enhanced Design Utilities (EDU) and then resimulated on
IKOS, AMI’s sign-off simulator. The results are compared
to the customer’s simulation from the third-party CAE
tool.
Once the design has passed the initial screening it is then
ready for placement and routing. The layout proceeds by
first placing memory and megacells, assigning priority to
critical paths, and designing the distribution and buffering
of clocks. Next, the layout is completed with automatic
place-and-route on the balance of the circuit.
After layout has been completed the interconnect data is
extracted from the physical layout to be fed back to the
sign-off simulator for final circuit verification. This post
layout interconnect data can be sent to the customer for
final validation on his simulator. When the post-layout
simulation has been completed and approved by the
customer the design is then released for mask and wafer
fabrication.
The test program is developed in parallel using internal
automatic test program generation software. Prototypes
can then be tested before they are shipped.
AMI Environment
Memory
Compiler
Models &
Symbols
Physical Data
Design
Verification
Place and Route
Post Route
Verification
ATPG
AMI ASIC
Std. Library
Synthesis Tool
Logic Synthesis
Schematic
Translation
HDL
VHDL
Schematic
Entry
Design
Database
Timing
Simulation
Estimated
Delays
Vector
Generation
Enhanced
Design Utilities
Netlist
Translation
AMI ASIC
Stnd. Library
Optional
Third Party
Environment
FIGURE 4: DESIGN ENVIRONMENT WITH THIRD PARTY SOFTWARE
in AMI Design Kit
*
*
*
Elements supplied
*
*
AMI Design Flow (cont.)
*
8
Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Figure 4 outlines a typical software environment when
using third party tools. AMI uses EDIF to speed ports
between various software products.
AMI’s Enhanced Design Utilities Tools are intended to be
used interactively at each stage of the design. EDU
software is a set of design analysis tools that check both
the design and test vectors for correctness and
compatibility with in-house ASIC testers, and analyze the
design for inefficiencies and possible flaws that could
cause problems in manufacturing the device.
The Design Library
AMI provides a robust collection of building blocks for the
AMI6X family. A broad range of primary cells is
complemented with memory cell compilers and useful
megafunctions. With such broad, US-based design talent,
AMI can quickly design specific cells that customers need
to add an edge in customization.
The AMI ASIC Standard Library
The AMI ASIC Standard Library contains a rich set of core
and configurable pad cells which allow great flexibility in
building competitive devices for customer applications.
The library is portable across all AMI’s gate array and
standard cell families. The ASIC Standard Library is listed
in detail on pages 12 to 20.
Memory Compilers
The AMI6X family includes the line of memory compilers
shown above. Each of the thousands of possible memory
blocks is optimized precisely to the customers’
parameters rather than built from a presized leaf cell that
covers a range of sizes. This yields a better size and
performance match for each application.
Upon supplying the cell specification to AMI, the customer
can receive an accurate simulation timing specification
overnight by facsimile and a full simulation model for any
AMI supported software environment within five working
days.
Digital Soft Megacells
The AMI6X gate array and standard cell families support
soft megacells that are compatible with many popular
functions. These megacells are functionally and logically
compatible with the stand-alone products.
A soft megacell is defined only at the functional schematic
level. Each instance of the megacell will have exactly the
same functional definition; however, the physical mask
layout will be different depending on other functions being
used, the place-and-route tools, and process technology.
The megacell becomes part of the design netlist, requiring
back annotation of interconnect capacitance after place-
and-route for final verification.
Because AMI’s soft megacells are defined at the gate
level, simulation models are more accurate than that of
behavioral models. Since our soft megacells use AMI’s
ASIC Standard Library they have the advantages of
design flexibility, portability, and a path for future cost
reduction by process migration.
AMI’s selection of soft megacells include Core Processors
and Peripherals which duplicate the function of industry
standard parts. In addition AMI offers FIFOs and Datapath
megacells which are developed using synthesizers. These
products are listed in the following tables.
Core Processors and Peripherals
The Core Processor and Peripheral megacells are
designed to duplicate the function of industry standard,
stand-alone parts. Detailed functional information can be
found in any standard device datasheet.
Memory Compiler Library
Memory Compiler Process Size Increment
min. max.
SRAM (single-port, synchronous, self-timed) gate array 16 x 1 1K x 32 16 words, 1 bit
SRAM (single-port, synchronous, self-timed) standard cell 32 x 1 2K x 32 16 words, 1 bit
ROM (synchronous) standard cell 64 x 1 16K x 32 64 words, 1 bit
SRAM (single-port, asynchronous) standard cell 32 x 1 2K x 32 16 words, 1 bit
SRAM (dual-port, synchronous) standard cell 32 x 1 1K x 32 16 words, 1 bit
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Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Core Processors
Peripherals
Name Function
MG29C01 4-bit microprocessor slice
MG29C10 Microprogram controller/sequencer
MG65C02 8-bit microprocessor
M8042 8-bit slave microcontroller
M8048 8-bit microcontroller
MG80C85 8-bit microprocessor
MGMC51 Core processor, 8051 compatible
MGMC51I MGMC51 with ICE port
MGMC51FB Core processor, 8051FB compatible
MGMC51SD Reduced function MGMC51
Name Function
MG1468C18 Real-time clock
M16C450 UART
M6402 UART
M6845 CRT controller
M765A Floppy disk controller
M8251A Communication interface USART
M8253 Programmable interval timer
M82530 Serial communications controller
MG82C37A Programmable DMA controller
MG82C50A Asynchronous comm. element
MG82C54 Programmable interval timer
MG82C55A Programmable peripheral interface
MG82C59A Programmable interrupt controller
M8490 SCSI controller
M85C30 Serial communications controller
M8868A UART
M91C36 Digital data separator
M91C360 Digital data separator
MFDC Floppy disk controller
MGI2CSL I2C Serial bus slave transceiver
MI2C I2C Bus Interface
FIFOs
The AMI6X library supports both latched-based and dual-
port ram based FIFOs. The latch-based FIFO has a fall-
through architecture and is applicable when the FIFO
size is limited. For large sizes the RAM based FIFO is
appropriate.
FIFOs
Datapath
AMI also supports the complex datapath logic functions
listed here. These functions are synthesized from an
input set of design parameters. They can be optimized for
either minimum delay, minimum gate count or can be
designed to meet a specified delay. Contact AMI for the
size range and parameter set for any desired functions.
These logic synthesizers produce soft megacell
schematics in the ASIC Standard Library, and a
schematic symbol for incorporation and simulation with
the design netlist.
Datapath
Ordering information
With each megacell, AMI supplies schematics and test
vectors on the requested EDA tool. To order a megacell,
use the Digital Soft Megacell order form. Contact the
factory for information on the delivery of soft megacells
on various EDA tools or for information on specific
speeds and sizes of particular Datapath megacells.
Name Function
MGFxxyyC1 Fall-through FIFO
MGFxxxxyyD Synchronous FIFO
MGFxxxxyyE Asynchronous FIFO
Name Function
MGAxxyyDv Adder
MGAxxyyEv Adder-subtractor
MGBxxyyAv Barrel/arithmetic shifter
MGBxxBv Barrel shifter
MGBxxyyCv Arithmetic shifter
MGCxxAv 2-function binary comparator
MGCxxBv 6-function binary comparator
MGDxxAv Decrementer
MGIxxAv Incrementer
MGIxxBv Incrementer/decrementer
MGMxxyyDv Signed/unsigned multiplier
MGMxxyyEv Multiplier-accumulator
MGSxxyyAv Signed/unsigned subtractor
10
Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
DC Specifications
Operating Specifications
Parameter Minimum Maximum Units
VDD, Supply Voltage 2.7 5.5 Volts
Ambient Temperature - Military -55 125 °C
- Commercial 0 70 °C
CMOS Input Specifications (4.5V<VDD<5.5V; 0°C<T<70°C)
Vil Low Level Input Voltage 0.3*VDD Volts
Vih High Level Input Voltage 0.7*VDD Volts
Iil Low Level Input Current -1.0 µA
Iih High Level Input Current 1.0 µA
Iil Input Pull-Up Current -25 -120 µA
Iih Input Pull-Down Current 25 145 µA
Vt- Schmitt Negative Threshold 0.2*VDD Volts
Vt+ Schmitt Positive Threshold 0.8*VDD Volts
Vh Schmitt Hysteresis 1.0 Volts
TTL Input Specifications (4.5V<VDD<5.5V; 0oC<T<70oC)
Vil Low Level Input Voltage 0.8 Volts
Vih High Level Input Voltage 2.0 Volts
Iil Low Level Input Current -1.0 µA
Iih High Level Input Current 1.0 µA
Iil Input Pull-Up Current -25 -120 µA
Iih Input Pull-Down Current 25 145 µA
Vt- Schmitt Negative Threshold 0.7 Volts
Vt+ Schmitt Positive Threshold 2.1 Volts
Vh Schmitt Hysteresis 0.4 Volts
11
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Output Operating Specifications (4.5V<VDD<5.5V;0°C<T<70°C)
Vol = Low Level Output Voltage given in Volts lol = Low Level Output Current given in mA
Voh = High Level Output Voltage given in Volts Ioh = High Level Output Current given in mA
Absolute Maximum Ratings
Note that these specifications are to indicate levels where permanent damage to the device may occur. Functional operation is not guaranteed under these conditions.
Further, operation at absolute maximum conditions for extended periods may adversely affect the long term reliability of the device.
Driver Vol
Maximum Voh
Minimum Iol
Maximum Ioh
Maximum
1 mA Driver 0.4 2.4 1.0 -1.0
2 mA Driver 0.4 2.4 2.0 -2.0
4 mA Driver 0.4 2.4 4.0 -4.0
8 mA Driver 0.4 2.4 8.0 -8.0
12 mA Driver 0.4 2.4 12.0 -12.0
16 mA Driver 0.4 2.4 16.0 -16.0
24 mA Driver 0.4 2.4 24.0 -24.0
Parameter Minimum Maximum Units
VDD, Supply Voltage -0.3 6.0 Volts
Input Pin Voltage -0.3 VDD+0.3 Volts
Input Pin Current -10.0 10.0 mA
Storage Temperature - Plastic Packages -55 125 °C
- Ceramic Packages -65 150 °C
Lead Temperature 300 °C for 10 sec.
12
Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Core Cells
Simple Gates
Name Description Name Description
AA21 2-input AND gate NA61 6-input NAND gate
AA22 2-input AND gate NA81 8-input NAND gate
AA31 3-input AND gate NO21 2-input NOR gate
AA32 3-input AND gate NO22 2-input NOR gate
AA41 4-input AND gate NO31 3-input NOR gate
AA42 4-input AND gate NO32 3-input NOR gate
EN21 2-input Exclusive NOR gate NO41 4-input NOR gate
EO21 2-input Exclusive OR gate NO42 4-input NOR gate
EO31 3-input Exclusive OR gate NO51 5-input NOR gate
NA21 2-input NAND gate NO52 5-input NOR gate
NA22 2-input NAND gate OR21 2-input OR gate
NA31 3-input NAND gate OR22 2-input OR gate
NA32 3-input NAND gate OR31 3-input OR gate
NA41 4-input NAND gate OR32 3-input OR gate
NA42 4-input NAND gate OR41 4-input OR gate
NA51 5-input NAND gate OR42 4-input OR gate
NA52 5-input NAND gate
13
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Complex Gates
Name Description Name Description
AN11 Two 2-input ANDs into 2-input NOR ON11 Two 2-input ORs into 2-input NAND
AN21 2-input AND into 2-input NOR ON21 2-input OR into 2-input NAND
AN31 2-input AND into 3-input NOR ON31 2-input OR into 3-input NAND
AN41 3-input AND into 2-input NOR ON41 3-input OR into 2-input NAND
AN51 2-input AND and 3-input AND into
2-input NOR ON51 2-input OR and 3-input OR into
2-input NAND
AN61 Two 3-input ANDs into 2-input NOR ON61 Two 3-input ORs into 2-input NAND
AN71 3-input AND into 3-input NOR ON71 3-input OR into 3-input NAND
AN81 Two 2-input ANDs into 3-input NOR ON81 Two 2-input ORs into 3-input NAND
AN91 2-input AND and 3-input AND into
3-input NOR ON91 2-input OR and 3-input OR into
3-input NAND
ANA1 Two 3-input ANDs into 3-input NOR ONA1 Two 3-input ORs into 3-input NAND
ANB1 Three 2-input ANDs into 3-input NOR ONB1 Three 2-input ORs into 3-input NAND
ANC1 Two 2-input ANDs and 3-input AND
into 3-input NOR ONC1 Two 2-input ORs and 3-input OR into
3-input NAND
AND1 2-input AND and two 3-input ANDs
into 3-input NOR OND1 2-input OR and two 3-input ORs into
3-input NAND
ANE1 Three 3-input ANDs into 3-input NOR ONE1 Three 3-input ORs into 3-input NAND
AU11 One-bit full adder
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Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Inverting Drivers
Internal 3-State Drivers
Clock Drivers
Muxes and Decoders
Name Description Name Description
INV1 Inverter INV4 Inverter
INV2 Inverter INV5 Inverter
INV3 Inverter INV6 Inverter
Name Description Name Description
ITA1 Internal non-inverting tri-state buffer ITD1 Internal inverting tri-state buffer
ITA2 Internal non-inverting tri-state buffer ITD2 Internal inverting tri-state buffer
ITB1 Internal inverting tri-state buffer ITE1 Internal inverting tri-state buffer
ITB2 Internal inverting tri-state buffer ITE2 Internal inverting tri-state buffer
Name Description Name Description
IID1 Non-inverting clock driver IID4 Non-inverting clock driver
IID2 Non-inverting clock driver IID6 Non-inverting clock driver
Name Description Name Description
DC24 2:4 line decoder MX41 4:1 digital multiplexer
DC38 3:8 line decoder MX81 8:1 digital multiplexer
MX21 2:1 digital multiplexer MXI21 Inverting 2:1 digital multiplexer
MX212 2:1 digital multiplexer MXI212 Inverting 2:1 digital multiplexer
15
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Sequential Logic
Name Description Name Description
DF081 D-type F/F without set or reset DFAB1 D-type F/F with active low set and
reset (only available in gate array)
DF091 D-type F/F with active low set DFB01 D-type buffered F/F with active low
set (only available in gate array)
DF0A1 D-type F/F with active low reset DFB11 D-type buffered F/F with active low
reset (only available in gate array)
DF0B1 D-type F/F with active low set and
reset DFB21 D-type buffered F/F with active low
set and reset (only in gate array)
DF101 D-type buffered F/F with active low
set DL531 D-type latch without set or reset
DF111 D-type buffered F/F with active low
reset DL541 D-type latch with active low reset
DF121 D-type buffered F/F with active low
set and reset DL551 D-type latch with active low set
DF281 D-type unbuffered mux scan F/F with-
out set or reset DL561 D-type latch with active low set and
reset
DF291 D-type unbuffered mux scan F/F with
active low set DL641 D-type buffered latch with active low
reset
DF2A1 D-type unbuffered mux scan F/F with
active low reset DL651 D-type buffered latch with active low
set
DF2B1 D-type unbuffered mux scan F/F with
active low set and reset DL661 D-type buffered latch with active low
set and reset
DF401 D-type buffered mux scan F/F with
active low set DLZ01 D-type latch without set or reset and
a dual-enable tri-state output
DF411 D-type buffered mux scan F/F with
active low reset DLZ11 D-type latch with active low reset and
a dual-enable tri-state output
DF421 D-type buffered mux scan F/F with
active low set and reset JK091 JK-type unbuffered F/F with active
low set
DFA81 D-type F/F without set or reset (only
available in gate array) JK0A1 JK-type unbuffered F/F with active
low reset
DFA91 D-type F/F with active low set (only
available in gate array) JK0B1 JK-type unbuffered F/F with active
low set and reset
DFAA1 D-type F/F with active low reset (only
available in gate array) JKBB1 JK-type buffered F/F with active low
set and reset
16
Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Power Core Cells
Special Core Cells
Name Description Name Description
CVDD Core cell input resistive tie-up to core
VDD bus CVSS Core cell input resistive tie-down to
core VSS bus
Name Description Name Description
BL02 Tri-state bus latch TD02 Time delay cell, non-inverting
BR02 Tri-state bus receivers TD03 Time delay cell, non-inverting
BR04 Tri-state bus receivers TD08 Time delay cell, non-inverting
BR06 Tri-state bus receivers
17
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Pad Cells
AMI provides an innovative method for designing pad
cells. This method allows the ASIC designer to define pad
cells by choosing from a vast array of pad pieces. These
pieces can be assembled to perform the desired
functions. The AMI6x libraries include categories of input
drive, output drive, and pullup/pulldown pieces. One or
zero pieces from each category is chosen and connected
at a common node to form a unique pad cell. The AMI6x
libraries also offer several conventional pad cells as well
(i.e. not made from pieces).
Input Drive Pieces
Pullup/pulldown Pieces
Name Description Name Description
IDCI3 Inverting CMOS input IDQC0 Oscillator input (no drive)
IDCR0 CMOS protected (no drive) IDQC3 Oscillator CMOS input
IDCS3 CMOS schmitt input IDQS3 Oscillator schmitt input
IDCX3 CMOS input IDTS3 TTL schmitt input
IDPX3 PCI input IDTX3 TTL input
Name Description Name Description
PLB4 Tri-state biasing (PosSupply/2) PLP3 Programmable Pull-up/down
PLD3 Active pull-down PLU3 Active pull-up
PLH4 Tri-state holding (latch)
18
Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Output Drive Pieces
From the piece listings it is noted that this method provides in excess of 1,500 unique pad cell possibilities, some of
which may not be feasible or practical. The AMI6x data books and design manuals have more detailed information
regarding design implementations using pad pieces.
Name ## Output Drive (mA) Description
ODCSIP## 04, 08, 12 CMOS inverting P-channel open drain w/ slew rate control output
ODCSXE## 04, 08, 12, 16, 24 CMOS tri-statable non-inverting w/ slew rate control output
ODCSXX## 04, 08, 12, 16, 24 CMOS non-inverting w/ slew rate control output
ODCXIP## 01, 02, 04, 08 CMOS inverting P-channel open drain output
ODCXXE## 01, 02, 04, 08, 12, 16, 24 CMOS tri-statable non-inverting output
ODCXXX## 01, 02, 04, 08, 12, 16, 24 CMOS non-inverting output
ODPSXE## 24 PCI tri-statable non-inverting w/ slew rate control output
ODQFE20M (2 mA) Crystal oscillator drive, fundamental mode to 20 MHz w/ enable
ODQFE99K (1 mA) Crystal oscillator drive, fundamental mode to 99 KHz w/ enable
ODQTE60M (4 mA) Crystal oscillator drive, third overtone to 60 MHz w/ enable
ODTSXN## 04, 08, 12, 16, 24 TTL non-inverting N-channel open drain w/ slew rate control output
ODTSXE## 04, 08, 12, 16, 24 TTL tri-statable non-inverting w/ slew rate control output
ODTSXX## 04, 08, 12, 16, 24 TTL non-inverting w/ slew rate control output
ODTXXN## 01, 02, 04, 08, 12, 16, 24 TTL non-inverting N-channel open drain output
ODTXXE## 01, 02, 04, 08, 12, 16, 24 TTL tri-statable non-inverting output
ODTXXX## 01, 02, 04, 08, 12, 16, 24 TTL non-inverting output
19
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Clock Driver Pad Cells
Power Pad Cells
In the interest of maintaining backward compatibility with previous AMI pad cell libraries, all pad cells from the AMI ASIC
Standard set are supported through soft cell implementations included with each AMI supported EDA design kit.
As an additional feature of the AMI6x pad libraries, AMI physical pad designs are voltage supply independent. With this
feature, ASIC designers have the capability of doing mixed supply designs. AMI supports mixed supply designs with a
single core supply and one or two supplies in the pad ring (one of which must be the same as the core supply). AMI also
supports single pad ring supply designs with an adjustable core supply voltage. Mixed supply designs are advanced
features of the AMI6x libraries with more detailed information available in the AMI6x design manual. All ASIC designers
should consult the AMI6x data book and design manual to become familiar with ASIC pad cell design using the
enhanced AMI pad libraries.
Special Pad Cells
Name Description Name Description
IBF1X5 CMOS-level input clock driver IIF1X5 CMOS-level pad clock driver
IBF7X5 TTL-level input clock driver
Name Description Name Description
PP6GXBG VSS power pad for core and pad PP6GXCG VSS power pad for core and input
buffer cells only
PP6GXBP VDD power pad for core and pad PP6GXPG VSS power pad for output buffers only
PP6GXCW Power pad pin for additional bus PP6GXCE ESD protected power pad for use
with core signals. No series res.
Name Description Name Description
IBCNX3 N-channel differential comparator IBCNH3 N-channel differential comparator
with hysteresis
IBEXX3 ECL differential comparator IBCPX3 P-channel differential comparator
IBCPH3 P-channel differential comparator
with hysteresis
20
Digital ASICs
Products and Services November 1995
0.6 micron CMOS
Gate Array & Standard Cell
Simple Analog Embedded Cells
NOTE 1: The official names, details, and rules of instantiation for these cells will be released upon characterization and model generation.
The analog functions are embedded in the corners of each gate array and are available as corner cells in standard cells.
Analog functions like the PLL, voltage reference and op-amp are metal or netlist programmable to allow the user more
flexibility in their simple analog needs.
Name Description
POR Power-on-reset
OP-AMP1Operational amplifier
SB-OSC1Self biased crystal oscillator
VRef1Bandgap voltage reference
DAC1Digital to analog converter (8-bit)
ADC1Analog to digital converter (8-bit)
PLL1Phase lock loop
COMP1Comparator with rail to rail input range
OD-OSC1Low power 32 KHz crystal oscillator
21
Digital ASICs
November 1995 Products and Services
0.6 micron CMOS
Gate Array & Standard Cell
Packaging
The AMI6X family can be packaged in a variety of popular packages.
New packages are in development which will extend the package offering. Some special packages or packaging
requirements can be supplied if requested. More details on special packages are available from an AMI sales
representative.
Available Packages ( ) = Lead time required
Note 1: The 304 pin PowerQuad2 package has an added heat slug to improve power dissipation.
Package Type Pin Count
Plastic Quad Flatpack (PQFP) 44, 52, 64, 80, 100, 120, 128, 144, 160, 208, 240, 256, (3041)
Thin Quad Flatpack (TQFP) 44, 48, 64, 80, 100, 128, 144, 176
Metal Quad Flatpack (MQUAD®) 128, 144, 208
Power Quad 2 (PQ2) 128, 144, 160, 208
Ceramic Quad Flatpack (CQFP) 40, 44, 52, 64, 84, 100, 132, 144, 172, 196
Plastic Leaded Chip Carrier (PLCC) 20, 28, 44, 52, 68, 84
Ceramic Leaded Chip Carrier (JLDCC) 28, 44, 68, 84
Ceramic Leadless Chip Carrier (CLCC) 20, 24, 28, 40, 44, 48, 52, 68, 84
Plastic Pin Grid Array (PPGA) 69, 85, 101, 109, 121, 132, 145, 180
Ceramic Pin Grid Array (CPGA) 65, 68, 69, 84, 85, 101, 109, 121, 132, 145, 155, 177, 181, 208, 225, 257,
299, 476
Ball Grid Array (BGA) (121), (169), (225), (256), (313), (352)