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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
CC2630
SWRS177B FEBRUARY 2015REVISED JULY 2016
CC2630 SimpleLink™ 6LoWPAN, ZigBee
®
Wireless MCU
1 Device Overview
1
1.1 Features
1
Microcontroller
Powerful ARM®Cortex®-M3
EEMBC CoreMark®Score: 142
Up to 48-MHz Clock Speed
128KB of In-System Programmable Flash
8KB of SRAM for Cache
20KB of Ultralow-Leakage SRAM
2-Pin cJTAG and JTAG Debugging
Supports Over-The-Air Upgrade (OTA)
Ultralow-Power Sensor Controller
Can Run Autonomous From the Rest of the
System
16-Bit Architecture
2KB of Ultralow-Leakage SRAM for Code and
Data
Efficient Code Size Architecture, Placing Drivers,
IEEE 802.15.4 MAC, and Bootloader in ROM
RoHS-Compliant Packages
4-mm × 4-mm RSM VQFN32 (10 GPIOs)
5-mm × 5-mm RHB VQFN32 (15 GPIOs)
7-mm × 7-mm RGZ VQFN48 (31 GPIOs)
Peripherals
All Digital Peripheral Pins Can Be Routed to
Any GPIO
Four General-Purpose Timer Modules
(Eight 16-Bit or Four 32-Bit Timers, PWM Each)
12-Bit ADC, 200-ksamples/s, 8-Channel Analog
MUX
Continuous Time Comparator
Ultralow-Power Analog Comparator
Programmable Current Source
UART
SSI (SPI, MICROWIRE, TI)
I2C
I2S
Real-Time Clock (RTC)
AES-128 Security Module
True Random Number Generator (TRNG)
10, 15, or 31 GPIOs, Depending on Package
Option
Support for Eight Capacitive-Sensing Buttons
Integrated Temperature Sensor
External System
On-Chip internal DC-DC Converter
Very Few External Components
Seamless Integration With the SimpleLink™
CC2590 and CC2592 Range Extenders
Pin Compatible With the SimpleLink CC13xx in
4-mm × 4-mm and 5-mm × 5-mm VQFN
Packages
Low Power
Wide Supply Voltage Range
Normal Operation: 1.8 to 3.8 V
External Regulator Mode: 1.7 to 1.95 V
Active-Mode RX: 5.9 mA
Active-Mode TX at 0 dBm: 6.1 mA
Active-Mode TX at +5 dBm: 9.1 mA
Active-Mode MCU: 61 µA/MHz
Active-Mode MCU: 48.5 CoreMark/mA
Active-Mode Sensor Controller: 8.2 µA/MHz
Standby: 1 µA (RTC Running and RAM/CPU
Retention)
Shutdown: 100 nA (Wake Up on External
Events)
RF Section
2.4-GHz RF Transceiver Compatible With IEEE
802.15.4 PHY and MAC
Excellent Receiver Sensitivity (–100 dBm),
Selectivity, and Blocking Performance
Link budget of 105 dB
Programmable Output Power up to +5 dBm
Single-Ended or Differential RF Interface
Suitable for Systems Targeting Compliance With
Worldwide Radio Frequency Regulations
ETSI EN 300 328 (Europe)
EN 300 440 Class 2 (Europe)
FCC CFR47 Part 15 (US)
ARIB STD-T66 (Japan)
Tools and Development Environment
Full-Feature and Low-Cost Development Kits
Multiple Reference Designs for Different RF
Configurations
Packet Sniffer PC Software
Sensor Controller Studio
SmartRF™ Studio
SmartRF Flash Programmer 2
IAR Embedded Workbench®for ARM
Code Composer Studio™
2
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SWRS177B FEBRUARY 2015REVISED JULY 2016
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Device Overview Copyright © 2015–2016, Texas Instruments Incorporated
1.2 Applications
Home and Building Automation
Lighting Control
Alarm and Security
Electronic Shelf Labeling
Proximity Tags
Wireless Sensor Networks
Energy Harvesting, Batteryless Sensors, and
Actuators
Smart Grid
(1) For more information, see Section 9,Mechanical Packaging and Orderable Information.
1.3 Description
The CC2630 device is a wireless MCU targeting ZigBee®and 6LoWPAN applications.
The device is a member of the CC26xx family of cost-effective, ultralow power, 2.4-GHz RF devices. Very
low active RF and MCU current and low-power mode current consumption provide excellent battery
lifetime and allow for operation on small coin cell batteries and in energy-harvesting applications.
The CC2630 device contains a 32-bit ARM Cortex-M3 processor that runs at 48 MHz as the main
processor and a rich peripheral feature set that includes a unique ultralow power sensor controller. This
sensor controller is ideal for interfacing external sensors and for collecting analog and digital data
autonomously while the rest of the system is in sleep mode. Thus, the CC2630 device is ideal for battery-
powered and energy harvesting end nodes in ZigBee and 6LoWPAN networks.
The IEEE 802.15.4 MAC is embedded into ROM and runs partly on an ARM Cortex-M0 processor. This
architecture improves overall system performance and power consumption and frees up flash memory for
the application.
The ZigBee stack is available free of charge from www.ti.com.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
CC2630F128RGZ VQFN (48) 7.00 mm × 7.00 mm
CC2630F128RHB VQFN (32) 5.00 mm × 5.00 mm
CC2630F128RSM VQFN (32) 4.00 mm × 4.00 mm
SimpleLinkTM CC26xx wireless MCU
Main CPU
128KB
Flash
Sensor controller
cJTAG
20KB
SRAM
ROM
ARM®
Cortex®-M3
DC-DC converter
RF core
ARM®
Cortex®-M0
DSP modem
4KB
SRAM
ROM
Sensor controller
engine
2x comparator
12-bit ADC, 200 ks/s
Constant current source
SPI-I2C digital sensor IF
2KB SRAM
Time-to-digital converter
General peripherals / modules
4× 32-bit Timers
2× SSI (SPI, µW, TI)
Watchdog timer
Temp. / batt. monitor
RTC
I2C
UART
I2S
10 / 15 / 31 GPIOs
AES
32 ch. µDMA
ADC
Digital PLL
TRNG
ADC
8KB
cache
Copyright © 2016, Texas Instruments Incorporated
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Device OverviewCopyright © 2015–2016, Texas Instruments Incorporated
1.4 Functional Block Diagram
Figure 1-1 shows a block diagram for the CC2630.
Figure 1-1. Block Diagram
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Table of Contents Copyright © 2015–2016, Texas Instruments Incorporated
Table of Contents
1 Device Overview ......................................... 1
1.1 Features .............................................. 1
1.2 Applications........................................... 2
1.3 Description............................................ 2
1.4 Functional Block Diagram ............................ 3
2 Revision History ......................................... 5
3 Device Comparison ..................................... 6
3.1 Related Products ..................................... 6
4 Terminal Configuration and Functions.............. 7
4.1 Pin Diagram RGZ Package ........................ 7
4.2 Signal Descriptions RGZ Package ................. 7
4.3 Pin Diagram RHB Package ........................ 9
4.4 Signal Descriptions RHB Package ................. 9
4.5 Pin Diagram RSM Package....................... 11
4.6 Signal Descriptions RSM Package ............... 11
5 Specifications........................................... 13
5.1 Absolute Maximum Ratings......................... 13
5.2 ESD Ratings ........................................ 13
5.3 Recommended Operating Conditions............... 13
5.4 Power Consumption Summary...................... 14
5.5 General Characteristics ............................. 14
5.6 IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps)
RX ................................................... 15
5.7 IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps)
TX ................................................... 15
5.8 24-MHz Crystal Oscillator (XOSC_HF) ............. 16
5.9 32.768-kHz Crystal Oscillator (XOSC_LF).......... 16
5.10 48-MHz RC Oscillator (RCOSC_HF) ............... 17
5.11 32-kHz RC Oscillator (RCOSC_LF)................. 17
5.12 ADC Characteristics................................. 17
5.13 Temperature Sensor ................................ 19
5.14 Battery Monitor...................................... 19
5.15 Continuous Time Comparator....................... 19
5.16 Low-Power Clocked Comparator ................... 20
5.17 Programmable Current Source ..................... 20
5.18 Synchronous Serial Interface (SSI) ................ 20
5.19 DC Characteristics .................................. 22
5.20 Thermal Resistance Characteristics ................ 23
5.21 Timing Requirements ............................... 24
5.22 Switching Characteristics ........................... 24
5.23 Typical Characteristics.............................. 25
6 Detailed Description ................................... 29
6.1 Overview ............................................ 29
6.2 Functional Block Diagram........................... 29
6.3 Main CPU ........................................... 30
6.4 RF Core ............................................. 30
6.5 Sensor Controller ................................... 31
6.6 Memory.............................................. 32
6.7 Debug ............................................... 32
6.8 Power Management................................. 33
6.9 Clock Systems ...................................... 34
6.10 General Peripherals and Modules .................. 34
6.11 Voltage Supply Domains............................ 35
6.12 System Architecture................................. 35
7 Application, Implementation, and Layout......... 36
7.1 Application Information.............................. 36
7.2 5 × 5 External Differential (5XD) Application Circuit
...................................................... 38
7.3 4 × 4 External Single-ended (4XS) Application
Circuit ............................................... 40
8 Device and Documentation Support ............... 42
8.1 Device Nomenclature ............................... 42
8.2 Tools and Software ................................. 43
8.3 Documentation Support............................. 44
8.4 Texas Instruments Low-Power RF Website ........ 44
8.5 Low-Power RF eNewsletter......................... 44
8.6 Community Resources.............................. 44
8.7 Additional Information............................... 45
8.8 Trademarks.......................................... 45
8.9 Electrostatic Discharge Caution..................... 45
8.10 Export Control Notice ............................... 45
8.11 Glossary............................................. 45
9 Mechanical Packaging and Orderable
Information .............................................. 45
9.1 Packaging Information .............................. 45
5
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Revision HistoryCopyright © 2015–2016, Texas Instruments Incorporated
2 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from October 15, 2015 to July 5, 2016 Page
Added split VDDS supply rail feature .............................................................................................. 1
Added 2-Mbps Bluetooth low energy............................................................................................... 1
Added option for up to 80-ΩESR when CLis 6 pF or lower .................................................................. 16
Added motional inductance recommendation to the 24-MHz XOSC table ................................................. 16
Added tolerance for RCOSC_LF and RTC accuracy content ................................................................ 17
Updated the Soc ADC internal voltage reference specification in Section 5.12 ........................................... 17
Moved all SSI parameters to Section 5.18 ...................................................................................... 20
Added SPI timing parameters ..................................................................................................... 20
Added VOH and VOL min and max values for 4-mA and 8-mA load ....................................................... 22
Added min and max values for VIH and VIL .................................................................................... 23
Added 0-dBm setting to the TX Current Consumption vs Supply Voltage (VDDS) graph ................................ 25
Changed Figure 5-11,Receive Mode Current vs Supply Voltage (VDDS) ................................................. 25
Added Figure 5-21,Supply Current vs Temperature .......................................................................... 26
Added application circuit schematics and layout for 5XD and 4XS .......................................................... 36
Changes from February 21, 2015 to October 15, 2015 Page
Removed RHB package option from CC2620 .................................................................................... 6
Added motional inductance recommendation to the 24-MHz XOSC table ................................................. 16
Added SPI timing parameters ..................................................................................................... 20
Added VOH and VOL min and max values for 4-mA and 8-mA load ....................................................... 22
Added min and max values for VIH and VIL .................................................................................... 23
Added IEEE 802.15.4 Sensitivity vs Channel Frequency...................................................................... 25
Added RF Output Power vs Channel Frequency ............................................................................... 25
Added Figure 5-11,Receive Mode Current vs Supply Voltage (VDDS)..................................................... 25
Changed Figure 5-20,SoC ADC ENOB vs Sampling Frequency (Input Frequency = FS / 10) .......................... 26
Clarified Brown Out Detector status and functionality in the Power Modes table. ......................................... 33
Added application circuit schematics and layout for 5XD and 4XS .......................................................... 36
6
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Device Comparison Copyright © 2015–2016, Texas Instruments Incorporated
(1) Package designator replaces the xxx in device name to form a complete device name, RGZ is 7-mm × 7-mm VQFN48, RHB is
5-mm × 5-mm VQFN32, and RSM is 4-mm × 4-mm VQFN32.
(2) The CC2650 device supports all PHYs and can be reflashed to run all the supported standards.
3 Device Comparison
Table 3-1. Device Family Overview
DEVICE PHY SUPPORT FLASH
(KB) RAM (KB) GPIO PACKAGE(1)
CC2650F128xxx Multi-Protocol(2) 128 20 31, 15, 10 RGZ, RHB, RSM
CC2640F128xxx Bluetooth low energy (Normal) 128 20 31, 15, 10 RGZ, RHB, RSM
CC2630F128xxx IEEE 802.15.4 Zigbee(/6LoWPAN) 128 20 31, 15, 10 RGZ, RHB, RSM
CC2620F128xxx IEEE 802.15.4 (RF4CE) 128 20 31, 10 RGZ, RSM
3.1 Related Products
Wireless Connectivity The wireless connectivity portfolio offers a wide selection of low power RF
solutions suitable for a broad range of application. The offerings range from fully customized
solutions to turn key offerings with pre-certified hardware and software (protocol).
Sub-1 GHz Long-range, low power wireless connectivity solutions are offered in a wide range of Sub-1
GHz ISM bands.
Companion Products Review products that are frequently purchased or used in conjunction with this
product.
SimpleLink™ CC2650 Wireless MCU LaunchPad™ Kit The CC2650 LaunchPad kit brings easy
Bluetooth® Smart connectivity to the LaunchPad kit ecosystem with the SimpleLink ultra-low
power CC26xx family of devices. This LaunchPad kit also supports development for multi-
protocol support for the SimpleLink multi-standard CC2650 wireless MCU and the rest of
CC26xx family of products: CC2630 wireless MCU for ZigBee®/6LoWPAN and CC2640
wireless MCU for Bluetooth®Smart.
Reference Designs for CC2630 TI Designs Reference Design Library is a robust reference design library
spanning analog, embedded processor and connectivity. Created by TI experts to help you
jump-start your system design, all TI Designs include schematic or block diagrams, BOMs
and design files to speed your time to market. Search and download designs at
ti.com/tidesigns.
40
39
DIO_25 38
DIO_24 37
21
22
23
24
DCDC_SW33
DIO_18
34 RESET_N35 DIO_2336
X32K_Q2 4
X32K_Q1 3
RF_N 2
RF_P 1
DIO_2232 DIO_2131 DIO_2030 DIO_1929
DIO_0 5
DIO_1 6
DIO_2 7
828
27
26 JTAG_TCKC25
9
10
11
12
41
42
43
44
20 DIO_15
19 DIO_14
18
17
VDDR 45
46
47
VDDR_RF 48
16
15
14
13
DIO_17
DIO_16
VDDS_DCDC
DIO_26
DIO_12
DIO_13
VDDS2
DIO_11
DIO_10
DIO_5
DIO_6
DIO_7
DIO_3
DIO_4
X24M_P
X24M_N DIO_8
DIO_9
DIO_28
VDDS3
DCOUPL
JTAG_TMSC
DIO_29
DIO_30
DIO_27
VDDS
7
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Terminal Configuration and FunctionsCopyright © 2015–2016, Texas Instruments Incorporated
(1) See technical reference manual (listed in Section 8.3) for more details.
(2) Do not supply external circuitry from this pin.
4 Terminal Configuration and Functions
4.1 Pin Diagram RGZ Package
Note: I/O pins marked in bold have high drive capabilities. I/O pins marked in italics have analog capabilities.
Figure 4-1. RGZ Package
48-Pin VQFN
(7-mm × 7-mm) Pinout, 0.5-mm Pitch
4.2 Signal Descriptions RGZ Package
Table 4-1. Signal Descriptions RGZ Package
NAME NO. TYPE DESCRIPTION
DCDC_SW 33 Power Output from internal DC-DC(1)
DCOUPL 23 Power 1.27-V regulated digital-supply decoupling capacitor(2)
DIO_0 5 Digital I/O GPIO, Sensor Controller
DIO_1 6 Digital I/O GPIO, Sensor Controller
DIO_2 7 Digital I/O GPIO, Sensor Controller
DIO_3 8 Digital I/O GPIO, Sensor Controller
DIO_4 9 Digital I/O GPIO, Sensor Controller
DIO_5 10 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_6 11 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_7 12 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_8 14 Digital I/O GPIO
DIO_9 15 Digital I/O GPIO
DIO_10 16 Digital I/O GPIO
8
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Terminal Configuration and Functions Copyright © 2015–2016, Texas Instruments Incorporated
Table 4-1. Signal Descriptions RGZ Package (continued)
NAME NO. TYPE DESCRIPTION
(3) If internal DC-DC is not used, this pin is supplied internally from the main LDO.
(4) If internal DC-DC is not used, this pin must be connected to VDDR for supply from the main LDO.
DIO_11 17 Digital I/O GPIO
DIO_12 18 Digital I/O GPIO
DIO_13 19 Digital I/O GPIO
DIO_14 20 Digital I/O GPIO
DIO_15 21 Digital I/O GPIO
DIO_16 26 Digital I/O GPIO, JTAG_TDO, high-drive capability
DIO_17 27 Digital I/O GPIO, JTAG_TDI, high-drive capability
DIO_18 28 Digital I/O GPIO
DIO_19 29 Digital I/O GPIO
DIO_20 30 Digital I/O GPIO
DIO_21 31 Digital I/O GPIO
DIO_22 32 Digital I/O GPIO
DIO_23 36 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_24 37 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_25 38 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_26 39 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_27 40 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_28 41 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_29 42 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_30 43 Digital/Analog I/O GPIO, Sensor Controller, Analog
JTAG_TMSC 24 Digital I/O JTAG TMSC, high-drive capability
JTAG_TCKC 25 Digital I/O JTAG TCKC
RESET_N 35 Digital input Reset, active-low. No internal pullup.
RF_P 1 RF I/O Positive RF input signal to LNA during RX
Positive RF output signal to PA during TX
RF_N 2 RF I/O Negative RF input signal to LNA during RX
Negative RF output signal to PA during TX
VDDR 45 Power 1.7-V to 1.95-V supply, typically connect to output of internal DC-DC(2)(3)
VDDR_RF 48 Power 1.7-V to 1.95-V supply, typically connect to output of internal DC-DC(2)(4)
VDDS 44 Power 1.8-V to 3.8-V main chip supply(1)
VDDS2 13 Power 1.8-V to 3.8-V DIO supply(1)
VDDS3 22 Power 1.8-V to 3.8-V DIO supply(1)
VDDS_DCDC 34 Power 1.8-V to 3.8-V DC-DC supply
X32K_Q1 3 Analog I/O 32-kHz crystal oscillator pin 1
X32K_Q2 4 Analog I/O 32-kHz crystal oscillator pin 2
X24M_N 46 Analog I/O 24-MHz crystal oscillator pin 1
X24M_P 47 Analog I/O 24-MHz crystal oscillator pin 2
EGP Power Ground Exposed Ground Pad
28
29
27
30
21
20
22
19
18
13
12
14
11
4
5
3
6
7
26 15
25 16
31 10
32 9
232 241
178
DIO_10
DIO_7
DIO_9
DIO_8
DCDC_SW
RESET_N
VDDS_DCDC
DIO_11
VDDR_RF
X24M_N
X24M_P
VDDR
VDDS
DIO_13
DIO_14
DIO_12
DIO_3
JTAG_TMSC
DIO_4
DCOUPL
VDDS2
JTAG_TCKC
DIO_5
DIO_6
RF_P
RF_N
RX_TX
DIO_0
DIO_1
DIO_2
X32K_Q1
X32K_Q2
9
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Terminal Configuration and FunctionsCopyright © 2015–2016, Texas Instruments Incorporated
(1) See technical reference manual (listed in Section 8.3) for more details.
(2) Do not supply external circuitry from this pin.
4.3 Pin Diagram RHB Package
Note: I/O pins marked in bold have high drive capabilities. I/O pins marked in italics have analog capabilities.
Figure 4-2. RHB Package
32-Pin VQFN
(5-mm × 5-mm) Pinout, 0.5-mm Pitch
4.4 Signal Descriptions RHB Package
Table 4-2. Signal Descriptions RHB Package
NAME NO. TYPE DESCRIPTION
DCDC_SW 17 Power Output from internal DC-DC(1)
DCOUPL 12 Power 1.27-V regulated digital-supply decoupling(2)
DIO_0 6 Digital I/O GPIO, Sensor Controller
DIO_1 7 Digital I/O GPIO, Sensor Controller
DIO_2 8 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_3 9 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_4 10 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_5 15 Digital I/O GPIO, High drive capability, JTAG_TDO
DIO_6 16 Digital I/O GPIO, High drive capability, JTAG_TDI
DIO_7 20 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_8 21 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_9 22 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_10 23 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_11 24 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_12 25 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_13 26 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_14 27 Digital/Analog I/O GPIO, Sensor Controller, Analog
JTAG_TMSC 13 Digital I/O JTAG TMSC, high-drive capability
JTAG_TCKC 14 Digital I/O JTAG TCKC
10
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Table 4-2. Signal Descriptions RHB Package (continued)
NAME NO. TYPE DESCRIPTION
(3) If internal DC-DC is not used, this pin is supplied internally from the main LDO.
(4) If internal DC-DC is not used, this pin must be connected to VDDR for supply from the main LDO.
RESET_N 19 Digital input Reset, active-low. No internal pullup.
RF_N 2 RF I/O Negative RF input signal to LNA during RX
Negative RF output signal to PA during TX
RF_P 1 RF I/O Positive RF input signal to LNA during RX
Positive RF output signal to PA during TX
RX_TX 3 RF I/O Optional bias pin for the RF LNA
VDDR 29 Power 1.7-V to 1.95-V supply, typically connect to output of internal DC-DC(3)(2)
VDDR_RF 32 Power 1.7-V to 1.95-V supply, typically connect to output of internal DC-DC(2)(4)
VDDS 28 Power 1.8-V to 3.8-V main chip supply(1)
VDDS2 11 Power 1.8-V to 3.8-V GPIO supply(1)
VDDS_DCDC 18 Power 1.8-V to 3.8-V DC-DC supply
X32K_Q1 4 Analog I/O 32-kHz crystal oscillator pin 1
X32K_Q2 5 Analog I/O 32-kHz crystal oscillator pin 2
X24M_N 30 Analog I/O 24-MHz crystal oscillator pin 1
X24M_P 31 Analog I/O 24-MHz crystal oscillator pin 2
EGP Power Ground Exposed Ground Pad
28
29
27
30
21
20
22
19
18
13
12
14
11
4
5
3
6
7
26 15
25 16
31 10
32 9
232 241
178
DIO_6
VSS
DIO_5
RESET_N
VSS
VDDS_DCDC
DCDC_SW
DIO_7
VDDR_RF
X24M_N
X24M_P
VSS
VDDR
DIO_9
VDDS
DIO_8
DIO_1
JTAG_TMSC
DIO_2
DCOUPL
VDDS2
JTAG_TCKC
DIO_3
DIO_4
RF_P
RF_N
VSS
X32K_Q2
VSS
DIO_0
RX_TX
X32K_Q1
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Terminal Configuration and FunctionsCopyright © 2015–2016, Texas Instruments Incorporated
(1) See technical reference manual (listed in Section 8.3) for more details.
(2) Do not supply external circuitry from this pin.
4.5 Pin Diagram RSM Package
Note: I/O pins marked in bold have high drive capabilities. I/O pins marked in italics have analog capabilities.
Figure 4-3. RSM Package
32-Pin VQFN
(4-mm × 4-mm) Pinout, 0.4-mm Pitch
4.6 Signal Descriptions RSM Package
Table 4-3. Signal Descriptions RSM Package
NAME NO. TYPE DESCRIPTION
DCDC_SW 18 Power Output from internal DC-DC. (1). Tie to ground for external regulator mode
(1.7-V to 1.95-V operation)
DCOUPL 12 Power 1.27-V regulated digital-supply decoupling capacitor(2)
DIO_0 8 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_1 9 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_2 10 Digital I/O GPIO, Sensor Controller, high-drive capability
DIO_3 15 Digital I/O GPIO, High drive capability, JTAG_TDO
DIO_4 16 Digital I/O GPIO, High drive capability, JTAG_TDI
DIO_5 22 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_6 23 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_7 24 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_8 25 Digital/Analog I/O GPIO, Sensor Controller, Analog
DIO_9 26 Digital/Analog I/O GPIO, Sensor Controller, Analog
JTAG_TMSC 13 Digital I/O JTAG TMSC
JTAG_TCKC 14 Digital I/O JTAG TCKC
RESET_N 21 Digital Input Reset, active-low. No internal pullup.
RF_N 2 RF I/O Negative RF input signal to LNA during RX
Negative RF output signal to PA during TX
RF_P 1 RF I/O Positive RF input signal to LNA during RX
Positive RF output signal to PA during TX
12
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Terminal Configuration and Functions Copyright © 2015–2016, Texas Instruments Incorporated
Table 4-3. Signal Descriptions RSM Package (continued)
NAME NO. TYPE DESCRIPTION
(3) If internal DC-DC is not used, this pin is supplied internally from the main LDO.
(4) If internal DC-DC is not used, this pin must be connected to VDDR for supply from the main LDO.
RX_TX 4 RF I/O Optional bias pin for the RF LNA
VDDR 28 Power 1.7-V to 1.95-V supply, typically connect to output of internal DC-DC. (2)(3)
VDDR_RF 32 Power 1.7-V to 1.95-V supply, typically connect to output of internal DC-DC(2)(4)
VDDS 27 Power 1.8-V to 3.8-V main chip supply(1)
VDDS2 11 Power 1.8-V to 3.8-V GPIO supply(1)
VDDS_DCDC 19 Power 1.8-V to 3.8-V DC-DC supply. Tie to ground for external regulator mode
(1.7-V to 1.95-V operation).
VSS 3, 7, 17, 20,
29 Power Ground
X32K_Q1 5 Analog I/O 32-kHz crystal oscillator pin 1
X32K_Q2 6 Analog I/O 32-kHz crystal oscillator pin 2
X24M_N 30 Analog I/O 24-MHz crystal oscillator pin 1
X24M_P 31 Analog I/O 24-MHz crystal oscillator pin 2
EGP Power Ground Exposed Ground Pad
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(1) All voltage values are with respect to ground, unless otherwise noted.
(2) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(3) In external regulator mode, VDDS2 and VDDS3 must be at the same potential as VDDS.
(4) Including analog-capable DIO.
(5) Each pin is referenced to a specific VDDSx (VDDS, VDDS2 or VDDS3). For a pin-to-VDDS mapping table, see Table 6-3.
5 Specifications
5.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN MAX UNIT
Supply voltage (VDDS, VDDS2,
and VDDS3) VDDR supplied by internal DC-DC regulator or
internal GLDO. VDDS_DCDC connected to VDDS on
PCB. –0.3 4.1 V
Supply voltage (VDDS(3) and
VDDR) External regulator mode (VDDS and VDDR pins
connected on PCB) –0.3 2.25 V
Voltage on any digital pin(4)(5) –0.3 VDDSx + 0.3, max 4.1 V
Voltage on crystal oscillator pins, X32K_Q1, X32K_Q2, X24M_N and X24M_P –0.3 VDDR + 0.3, max 2.25 V
Voltage on ADC input (Vin)Voltage scaling enabled –0.3 VDDS VVoltage scaling disabled, internal reference –0.3 1.49
Voltage scaling disabled, VDDS as reference –0.3 VDDS / 2.9
Input RF level 5 dBm
Tstg Storage temperature –40 150 °C
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
5.2 ESD Ratings
VALUE UNIT
VESD Electrostatic discharge
(ESD) performance
Human body model (HBM), per ANSI/ESDA/JEDEC
JS001(1) All pins ±2500 V
Charged device model (CDM), per JESD22-C101(2) RF pins ±750
Non-RF pins ±750
5.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT
Ambient temperature range –40 85 °C
Operating supply voltage
(VDDS and VDDR), external
regulator mode
For operation in 1.8-V systems
(VDDS and VDDR pins connected on PCB, internal DC-
DC cannot be used) 1.7 1.95 V
Operating supply voltage VDDS For operation in battery-powered and 3.3-V systems
(internal DC-DC can be used to minimize power
consumption)
1.8 3.8 V
Operating supply voltages
VDDS2 and VDDS3 0.7 × VDDS, min 1.8 3.8 V
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(1) Single-ended RF mode is optimized for size and power consumption. Measured on CC2650EM-4XS.
(2) Differential RF mode is optimized for RF performance. Measured on CC2650EM-5XD.
(3) Iperi is not supported in Standby or Shutdown.
5.4 Power Consumption Summary
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V with internal DC-DC converter, unless
otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Icore Core current consumption
Reset. RESET_N pin asserted or VDDS below
Power-on-Reset threshold 100 nA
Shutdown. No clocks running, no retention 150
Standby. With RTC, CPU, RAM and (partial)
register retention. RCOSC_LF 1
µA
Standby. With RTC, CPU, RAM and (partial)
register retention. XOSC_LF 1.2
Standby. With Cache, RTC, CPU, RAM and
(partial) register retention. RCOSC_LF 2.5
Standby. With Cache, RTC, CPU, RAM and
(partial) register retention. XOSC_LF 2.7
Idle. Supply Systems and RAM powered. 550
Active. Core running CoreMark 1.45 mA +
31 µA/MHz
Radio RX (1) 5.9
mA
Radio RX(2) 6.1
Radio TX, 0-dBm output power(1) 6.1
Radio TX, 5-dBm output power(2) 9.1
Peripheral Current Consumption (Adds to core current Icore for each peripheral unit activated)(3)
Iperi
Peripheral power domain Delta current with domain enabled 20 µA
Serial power domain Delta current with domain enabled 13 µA
RF Core Delta current with power domain enabled, clock
enabled, RF core idle 237 µA
µDMA Delta current with clock enabled, module idle 130 µA
Timers Delta current with clock enabled, module idle 113 µA
I2C Delta current with clock enabled, module idle 12 µA
I2S Delta current with clock enabled, module idle 36 µA
SSI Delta current with clock enabled, module idle 93 µA
UART Delta current with clock enabled, module idle 164 µA
(1) This number is dependent on Flash aging and will increase over time and erase cycles.
5.5 General Characteristics
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
FLASH MEMORY
Supported flash erase cycles before
failure 100 k Cycles
Flash page/sector erase current Average delta current 12.6 mA
Flash page/sector size 4 KB
Flash write current Average delta current, 4 bytes at a time 8.15 mA
Flash page/sector erase time(1) 8 ms
Flash write time(1) 4 bytes at a time 8 µs
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5.6 IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps) RX
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Receiver sensitivity Differential mode. Measured at the CC2650EM-5XD
SMA connector, PER = 1% –100 dBm
Receiver sensitivity Single-ended mode. Measured on CC2650EM-4XS,
at the SMA connector, PER = 1% –97 dBm
Receiver saturation Measured at the CC2650EM-5XD SMA connector,
PER = 1% +4 dBm
Adjacent channel rejection Wanted signal at –82 dBm, modulated interferer at
±5 MHz, PER = 1% 39 dB
Alternate channel rejection Wanted signal at –82 dBm, modulated interferer at
±10 MHz, PER = 1% 52 dB
Channel rejection, ±15 MHz or
more Wanted signal at –82 dBm, undesired signal is IEEE
802.15.4 modulated channel, stepped through all
channels 2405 to 2480 MHz, PER = 1% 57 dB
Blocking and desensitization,
5 MHz from upper band edge Wanted signal at –97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 64 dB
Blocking and desensitization,
10 MHz from upper band edge Wanted signal at –97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 64 dB
Blocking and desensitization,
20 MHz from upper band edge Wanted signal at –97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 65 dB
Blocking and desensitization,
50 MHz from upper band edge Wanted signal at –97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 68 dB
Blocking and desensitization,
–5 MHz from lower band edge Wanted signal at –97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 63 dB
Blocking and desensitization,
–10 MHz from lower band edge Wanted signal at 97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 63 dB
Blocking and desensitization,
–20 MHz from lower band edge Wanted signal at 97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 65 dB
Blocking and desensitization,
–50 MHz from lower band edge Wanted signal at 97 dBm (3 dB above the
sensitivity level), CW jammer, PER = 1% 67 dB
Spurious emissions, 30 MHz to
1000 MHz
Conducted measurement in a 50-Ωsingle-ended
load. Suitable for systems targeting compliance with
EN 300 328, EN 300 440 class 2, FCC CFR47, Part
15 and ARIB STD-T-66 –71 dBm
Spurious emissions, 1 GHz to
12.75 GHz
Conducted measurement in a 50 single-ended
load. Suitable for systems targeting compliance with
EN 300 328, EN 300 440 class 2, FCC CFR47, Part
15 and ARIB STD-T-66 –62 dBm
Frequency error tolerance Difference between the incoming carrier frequency
and the internally generated carrier frequency >200 ppm
Symbol rate error tolerance Difference between incoming symbol rate and the
internally generated symbol rate >1000 ppm
RSSI dynamic range 100 dB
RSSI accuracy ±4 dB
5.7 IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps) TX
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Output power, highest setting Delivered to a single-ended 50-Ωload through a balun 5 dBm
Output power, highest setting Measured on CC2650EM-4XS, delivered to a single-
ended 50-Ωload 2 dBm
Output power, lowest setting Delivered to a single-ended 50-Ωload through a balun –21 dBm
Error vector magnitude At maximum output power 2%
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IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps) TX (continued)
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Spurious emission conducted
measurement
f < 1 GHz, outside restricted bands –43
dBm
f < 1 GHz, restricted bands ETSI –65
f < 1 GHz, restricted bands FCC –76
f > 1 GHz, including harmonics –46
Suitable for systems targeting compliance with worldwide radio-frequency regulations ETSI EN 300 328
and EN 300 440 Class 2 (Europe), FCC CFR47 Part 15 (US), and ARIB STD-T66 (Japan)
(1) Probing or otherwise stopping the XTAL while the DC-DC converter is enabled may cause permanent damage to the device.
(2) The crystal manufacturer's specification must satisfy this requirement
(3) Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V
(4) Includes initial tolerance of the crystal, drift over temperature, ageing and frequency pulling due to incorrect load capacitance. As per
IEEE 802.15.4 specification.
(5) Kick-started based on a temperature and aging compensated RCOSC_HF using precharge injection.
5.8 24-MHz Crystal Oscillator (XOSC_HF)
Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.(1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ESR Equivalent series resistance(2) 6 pF < CL9 pF 20 60 Ω
ESR Equivalent series resistance(2) 5 pF < CL6 pF 80 Ω
LMMotional inductance(2) Relates to load capacitance
(CLin Farads) < 1.6 × 10–24 / CL2H
CLCrystal load capacitance(2) 5 9 pF
Crystal frequency(2)(3) 24 MHz
Crystal frequency tolerance(2)(4) –40 40 ppm
Start-up time(3)(5) 150 µs
(1) The crystal manufacturer's specification must satisfy this requirement
5.9 32.768-kHz Crystal Oscillator (XOSC_LF)
Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Crystal frequency(1) 32.768 kHz
ESR Equivalent series resistance(1) 30 100 kΩ
CLCrystal load capacitance(1) 6 12 pF
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(1) Accuracy relative to the calibration source (XOSC_HF).
5.10 48-MHz RC Oscillator (RCOSC_HF)
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Frequency 48 MHz
Uncalibrated frequency accuracy ±1%
Calibrated frequency accuracy(1) ±0.25%
Start-up time 5 µs
(1) The frequency accuracy of the Real Time Clock (RTC) is not directly dependent on the frequency accuracy of the 32-kHz RC Oscillator.
The RTC can be calibrated to an accuracy within ±500 ppm of 32.768 kHz by measuring the frequency error of RCOSC_LF relative to
XOSC_HF and compensating the RTC tick speed. The procedure is explained in Running Bluetooth®Low Energy on CC2640 Without
32 kHz Crystal.
5.11 32-kHz RC Oscillator (RCOSC_LF)
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Calibrated frequency(1) 32.8 kHz
Temperature coefficient 50 ppm/°C
(1) Using IEEE Std 1241™-2010 for terminology and test methods.
(2) Input signal scaled down internally before conversion, as if voltage range was 0 to 4.3 V.
(3) No missing codes. Positive DNL typically varies from +0.3 to +3.5, depending on device (see Figure 5-22).
(4) For a typical example, see Figure 5-23.
5.12 ADC Characteristics
Tc= 25°C, VDDS = 3.0 V and voltage scaling enabled, unless otherwise noted.(1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range 0 VDDS V
Resolution 12 Bits
Sample rate 200 ksps
Offset Internal 4.3-V equivalent reference(2) 2 LSB
Gain error Internal 4.3-V equivalent reference(2) 2.4 LSB
DNL(3) Differential nonlinearity >–1 LSB
INL(4) Integral nonlinearity ±3 LSB
ENOB Effective number of bits
Internal 4.3-V equivalent reference(2), 200 ksps,
9.6-kHz input tone 9.8
BitsVDDS as reference, 200 ksps, 9.6-kHz input tone 10
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksps, 300-Hz input tone 11.1
THD Total harmonic distortion
Internal 4.3-V equivalent reference(2), 200 ksps,
9.6-kHz input tone –65
dBVDDS as reference, 200 ksps, 9.6-kHz input tone –69
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksps, 300-Hz input tone –71
SINAD,
SNDR Signal-to-noise
and
Distortion ratio
Internal 4.3-V equivalent reference(2), 200 ksps,
9.6-kHz input tone 60
dBVDDS as reference, 200 ksps, 9.6-kHz input tone 63
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksps, 300-Hz input tone 69
SFDR Spurious-free dynamic
range
Internal 4.3-V equivalent reference(2), 200 ksps,
9.6-kHz input tone 67
dBVDDS as reference, 200 ksps, 9.6-kHz input tone 72
Internal 1.44-V reference, voltage scaling disabled,
32 samples average, 200 ksps, 300-Hz input tone 73
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ADC Characteristics (continued)
Tc= 25°C, VDDS = 3.0 V and voltage scaling enabled, unless otherwise noted.(1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
(5) Applied voltage must be within absolute maximum ratings (Section 5.1) at all times.
Conversion time Serial conversion, time-to-output, 24-MHz clock 50 clock-
cycles
Current consumption Internal 4.3-V equivalent reference(2) 0.66 mA
Current consumption VDDS as reference 0.75 mA
Reference voltage Equivalent fixed internal reference (input voltage scaling
enabled). For best accuracy, the ADC conversion should
be initiated through the TIRTOS API in order to include the
gain/offset compensation factors stored in FCFG1. 4.3(2)(5) V
Reference voltage
Fixed internal reference (input voltage scaling disabled).
For best accuracy, the ADC conversion should be initiated
through the TIRTOS API in order to include the gain/offset
compensation factors stored in FCFG1. This value is
derived from the scaled value (4.3V) as follows:
Vref=4.3V*1408/4095
1.48 V
Reference voltage VDDS as reference (Also known as RELATIVE) (input
voltage scaling enabled) VDDS V
Reference voltage VDDS as reference (Also known as RELATIVE) (input
voltage scaling disabled) VDDS /
2.82(5) V
Input Impedance 200 ksps, voltage scaling enabled. Capacitive input, Input
impedance depends on sampling frequency and sampling
time >1 MΩ
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(1) Automatically compensated when using supplied driver libraries.
5.13 Temperature Sensor
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 4 °C
Range –40 85 °C
Accuracy ±5 °C
Supply voltage coefficient(1) 3.2 °C/V
5.14 Battery Monitor
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 50 mV
Range 1.8 3.8 V
Accuracy 13 mV
(1) Additionally, the bias module must be enabled when running in standby mode.
5.15 Continuous Time Comparator
Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range 0 VDDS V
External reference voltage 0 VDDS V
Internal reference voltage DCOUPL as reference 1.27 V
Offset 3 mV
Hysteresis <2 mV
Decision time Step from –10 mV to 10 mV 0.72 µs
Current consumption when enabled(1) 8.6 µA
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5.16 Low-Power Clocked Comparator
Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Input voltage range 0 VDDS V
Clock frequency 32 kHz
Internal reference voltage, VDDS / 2 1.49 1.51 V
Internal reference voltage, VDDS / 3 1.01 1.03 V
Internal reference voltage, VDDS / 4 0.78 0.79 V
Internal reference voltage, DCOUPL / 1 1.25 1.28 V
Internal reference voltage, DCOUPL / 2 0.63 0.65 V
Internal reference voltage, DCOUPL / 3 0.42 0.44 V
Internal reference voltage, DCOUPL / 4 0.33 0.34 V
Offset <2 mV
Hysteresis <5 mV
Decision time Step from –50 mV to 50 mV <1 clock-cycle
Current consumption when enabled 362 nA
(1) Additionally, the bias module must be enabled when running in standby mode.
5.17 Programmable Current Source
Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Current source programmable output range 0.25 20 µA
Resolution 0.25 µA
Current consumption(1) Including current source at maximum
programmable output 23 µA
(1) Refer to SSI timing diagrams Figure 5-1,Figure 5-2, and Figure 5-3.
5.18 Synchronous Serial Interface (SSI)
Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
S1(1) tclk_per (SSIClk period) Device operating as SLAVE 12 65024 system
clocks
S2 (1) tclk_high (SSIClk high time) Device operating as SLAVE 0.5 tclk_per
S3(1) tclk_low (SSIClk low time) Device operating as SLAVE 0.5 tclk_per
S1 (TX only)(1) tclk_per (SSIClk period) One-way communication to SLAVE -
Device operating as MASTER 4 65024 system
clocks
S1 (TX and RX)(1) tclk_per (SSIClk period) Normal duplex operation - Device
operating as MASTER 8 65024 system
clocks
S2 (1) tclk_high (SSIClk high time) Device operating as MASTER 0.5 tclk_per
S3 (1) tclk_low(SSIClk low time) Device operating as MASTER 0.5 tclk_per
0
SSIClk
SSIFss
SSITx
SSIRx
MSB LSB
MSB LSB
S2
S3
S1
8-bit control
4 to 16 bits output data
SSIClk
SSIFss
SSITx
SSIRx MSB LSB
S2
S3
S1
4 to 16 bits
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Figure 5-1. SSI Timing for TI Frame Format (FRF = 01), Single Transfer Timing Measurement
Figure 5-2. SSI Timing for MICROWIRE Frame Format (FRF = 10), Single Transfer
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Figure 5-3. SSI Timing for SPI Frame Format (FRF = 00), With SPH = 1
5.19 DC Characteristics
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TA= 25°C, VDDS = 1.8 V
GPIO VOH at 8-mA load IOCURR = 2, high-drive GPIOs only 1.32 1.54 V
GPIO VOL at 8-mA load IOCURR = 2, high-drive GPIOs only 0.26 0.32 V
GPIO VOH at 4-mA load IOCURR = 1 1.32 1.58 V
GPIO VOL at 4-mA load IOCURR = 1 0.21 0.32 V
GPIO pullup current Input mode, pullup enabled, Vpad = 0 V 71.7 µA
GPIO pulldown current Input mode, pulldown enabled, Vpad = VDDS 21.1 µA
GPIO high/low input transition,
no hysteresis IH = 0, transition between reading 0 and reading 1 0.88 V
GPIO low-to-high input transition,
with hysteresis IH = 1, transition voltage for input read as 0 1 1.07 V
GPIO high-to-low input transition,
with hysteresis IH = 1, transition voltage for input read as 1 0 0.74 V
GPIO input hysteresis IH = 1, difference between 0 1 and 1 0 points 0.33 V
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DC Characteristics (continued)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
(1) Each GPIO is referenced to a specific VDDS pin. See the technical reference manual listed in Section 8.3 for more details.
TA= 25°C, VDDS = 3.0 V
GPIO VOH at 8-mA load IOCURR = 2, high-drive GPIOs only 2.68 V
GPIO VOL at 8-mA load IOCURR = 2, high-drive GPIOs only 0.33 V
GPIO VOH at 4-mA load IOCURR = 1 2.72 V
GPIO VOL at 4-mA load IOCURR = 1 0.28 V
TA= 25°C, VDDS = 3.8 V
GPIO pullup current Input mode, pullup enabled, Vpad = 0 V 277 µA
GPIO pulldown current Input mode, pulldown enabled, Vpad = VDDS 113 µA
GPIO high/low input transition,
no hysteresis IH = 0, transition between reading 0 and reading 1 1.67 V
GPIO low-to-high input transition,
with hysteresis IH = 1, transition voltage for input read as 0 1 1.94 V
GPIO high-to-low input transition,
with hysteresis IH = 1, transition voltage for input read as 1 0 1.54 V
GPIO input hysteresis IH = 1, difference between 0 1 and 1 0 points 0.4 V
TA= 25°C
VIH Lowest GPIO input voltage reliably interpreted as a
«High» 0.8 VDDS(1)
VIL Highest GPIO input voltage reliably interpreted as a
«Low» 0.2 VDDS(1)
(1) °C/W = degrees Celsius per watt.
(2) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RθJC] value, which is based on a
JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air).
JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages.
JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages.
JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements.
Power dissipation of 2 W and an ambient temperature of 70ºC is assumed.
5.20 Thermal Resistance Characteristics
NAME DESCRIPTION RSM (°C/W)(1) (2) RHB (°C/W)(1) (2) RGZ (°C/W)(1) (2)
RθJA Junction-to-ambient thermal resistance 36.9 32.8 29.6
RθJC(top) Junction-to-case (top) thermal resistance 30.3 24.0 15.7
RθJB Junction-to-board thermal resistance 7.6 6.8 6.2
PsiJT Junction-to-top characterization parameter 0.4 0.3 0.3
PsiJB Junction-to-board characterization parameter 7.4 6.8 6.2
RθJC(bot) Junction-to-case (bottom) thermal resistance 2.1 1.9 1.9
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(1) For smaller coin cell batteries, with high worst-case end-of-life equivalent source resistance, a 22-µF VDDS input capacitor (see
Figure 7-1) must be used to ensure compliance with this slew rate.
(2) Applications using RCOSC_LF as sleep timer must also consider the drift in frequency caused by a change in temperature (see
Section 5.11).
(3) TA= –40°C to 85°C, VDDS = 1.7 V to 3.8 V, unless otherwise noted.
5.21 Timing Requirements
MIN NOM MAX UNIT
Rising supply-voltage slew rate 0 100 mV/µs
Falling supply-voltage slew rate 0 20 mV/µs
Falling supply-voltage slew rate, with low-power flash settings(1) 3 mV/µs
Positive temperature gradient in standby(2) No limitation for negative
temperature gradient, or
outside standby mode 5 °C/s
CONTROL INPUT AC CHARACTERISTICS(3)
RESET_N low duration 1 µs
5.22 Switching Characteristics
Measured on the TI CC2650EM-5XD reference design with Tc= 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
WAKEUP AND TIMING
Idle Active 14 µs
Standby Active 151 µs
Shutdown Active 1015 µs
VDDS (V)
Output power (dBm)
1.8 2.3 2.8 3.3 3.8
0
1
2
3
4
5
6
D003
5XD 5dBm Setting
4XS 2dBm Setting
Frequency (MHz)
Output Power (dBm)
2400 2410 2420 2430 2440 2450 2460 2470 2480
-1
0
1
2
3
4
5
6
7
8
D021
5-dBm setting (5XD)
0-dBm setting (4XS)
Frequency (MHz)
Sensitivity Level (dBm)
2400 2410 2420 2430 2440 2450 2460 2470 2480
-101
-100
-99
-98
-97
-96
-95
D019
Sensitivity 4XS
Sensitivity 5XD
Temperature (qC)
Output Power (dBm)
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80
0
1
2
3
4
5
6
4XS 2-dBm Setting
5XD 5-dBm Setting
VDDS (V)
Sensitivity (dBm)
1.8 2.3 2.8 3.3 3.8
-101
-100
-99
-98
-97
-96
-95
D005
IEEE 802.15.4 5XD Sensitivity
IEEE 802.15.4 4XS Sensitivity
Temperature (qC)
Sensitivity (dBm)
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80
-103
-102
-101
-100
-99
-98
-97
-96
-95
Sensitivity 4XS
Sensitivity 5XD
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5.23 Typical Characteristics
Figure 5-4. IEEE 802.15.4 Sensitivity vs Temperature Figure 5-5. IEEE 802.15.4 Sensitivity vs Supply Voltage (VDDS)
Figure 5-6. IEEE 802.15.4 Sensitivity vs Channel Frequency Figure 5-7. TX Output Power vs Temperature
Figure 5-8. TX Output Power vs Supply Voltage (VDDS) Figure 5-9. TX Output Power
vs Channel Frequency
Temperature (qC)
Active Mode Current Consumpstion (mA)
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80
2.85
2.9
2.95
3
3.05
3.1
D006
Active Mode Current
VDDS (V)
Current Consumption (mA)
1.8 2.3 2.8 3.3 3.8
2
2.5
3
3.5
4
4.5
5
D007
Active Mode Current
Temperature (qC)
TX Current (mA)
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80
0
2
4
6
8
10
12
D002
5XD 5dBm Setting
4XS 2dBm Setting
Temperature (qC)
RX Current (mA)
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80
5.6
5.8
6
6.2
6.4
6.6
6.8
7
D001
5XD RX Current
4XS RX Current
VDDS (V)
TX Current (mA)
1.8 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8
4
5
6
7
8
9
10
11
12
13
14
15
16
D015
4XS 0-dBm Setting
4XS 2-dBm Setting
5XD 5-dBm Setting
Voltage (V)
Current Consumption (mA)
1.8 2.05 2.3 2.55 2.8 3.05 3.3 3.55 3.8
4
4.5
5
5.5
6
6.5
7
7.5
8
8.5
9
9.5
10
10.5
D016
4XS
5XD
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Typical Characteristics (continued)
Figure 5-10. TX Current Consumption
vs Supply Voltage (VDDS) Figure 5-11. RX Mode Current vs Supply Voltage (VDDS)
Figure 5-12. RX Mode Current Consumption vs Temperature Figure 5-13. TX Mode Current Consumption vs Temperature
Figure 5-14. Active Mode (MCU Running, No Peripherals)
Current Consumption vs Temperature Figure 5-15. Active Mode (MCU Running, No Peripherals) Current
Consumption vs Supply Voltage (VDDS)
Sampling Frequency (Hz)
ENOB
9.6
9.7
9.8
9.9
10
10.1
10.2
10.3
10.4
10.5
1k 10k 100k 200k
D009A
ENOB Internal Reference (No Averaging)
ENOB Internal Reference (32 Samples Averaging)
Temperature (qC)
Standby Current (PA)
-40 -20 0 20 40 60 80 100
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
D021
VDDS (V)
ADC Code
1.8 2.3 2.8 3.3 3.8
1004.8
1005
1005.2
1005.4
1005.6
1005.8
1006
1006.2
1006.4
D012
Temperature (qC)
ADC Code
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80
1004.5
1005
1005.5
1006
1006.5
1007
1007.5
D013
Temperature (qC)
Current (uA)
-20 -10 0 10 20 30 40 50 60 70 80
0
0.5
1
1.5
2
2.5
3
3.5
4
D008
Standby Mode Current
Input Frequency (Hz)
Effective Number of Bits
200300 500 1000 2000 5000 10000 20000 100000
9.4
9.6
9.8
10
10.2
10.4
10.6
10.8
11
11.2
11.4
D009
Fs= 200 kHz, No Averaging
Fs= 200 kHz, 32 samples averaging
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Typical Characteristics (continued)
Figure 5-16. Standby Mode Current Consumption With RCOSC
RTC vs Temperature Figure 5-17. SoC ADC Effective Number of Bits vs Input
Frequency (Internal Reference, No Scaling)
Figure 5-18. SoC ADC Output vs Supply Voltage (Fixed Input,
Internal Reference, No Scaling) Figure 5-19. SoC ADC Output vs Temperature (Fixed Input,
Internal Reference, No Scaling)
Figure 5-20. SoC ADC ENOB vs Sampling Frequency
(Input Frequency = FS / 10) Figure 5-21. Standby Mode Supply Current vs Temperature
ADC Code
INL
0 200 400 600 800 1000 1200 1400 1600 1800 2000 2200 2400 2600 2800 3000 3200 3400 3600 3800 4000 4200
-4
-3
-2
-1
0
1
2
3
D011
ADC Code
DNL
0
200
400
600
800
1000
1200
1400
1600
1800
2000
2200
2400
2600
2800
3000
3200
3400
3600
3800
4000
4200
-1.5
-1
-0.5
0
0.5
1
1.5
2
2.5
3
3.5
D010
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Typical Characteristics (continued)
Figure 5-22. SoC ADC DNL vs ADC Code (Internal Reference, No Scaling)
Figure 5-23. SoC ADC INL vs ADC Code (Internal Reference, No Scaling)
SimpleLinkTM CC26xx wireless MCU
Main CPU
128KB
Flash
Sensor controller
cJTAG
20KB
SRAM
ROM
ARM®
Cortex®-M3
DC-DC converter
RF core
ARM®
Cortex®-M0
DSP modem
4KB
SRAM
ROM
Sensor controller
engine
2x comparator
12-bit ADC, 200 ks/s
Constant current source
SPI-I2C digital sensor IF
2KB SRAM
Time-to-digital converter
General peripherals / modules
4× 32-bit Timers
2× SSI (SPI, µW, TI)
Watchdog timer
Temp. / batt. monitor
RTC
I2C
UART
I2S
10 / 15 / 31 GPIOs
AES
32 ch. µDMA
ADC
Digital PLL
TRNG
ADC
8KB
cache
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6 Detailed Description
6.1 Overview
The core modules of the CC26xx product family are shown in the Section 6.2.
6.2 Functional Block Diagram
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6.3 Main CPU
The SimpleLink CC2630 Wireless MCU contains an ARM Cortex-M3 (CM3) 32-bit CPU, which runs the
application and the higher layers of the protocol stack.
The CM3 processor provides a high-performance, low-cost platform that meets the system requirements
of minimal memory implementation, and low-power consumption, while delivering outstanding
computational performance and exceptional system response to interrupts.
CM3 features include the following:
32-bit ARM Cortex-M3 architecture optimized for small-footprint embedded applications
Outstanding processing performance combined with fast interrupt handling
ARM Thumb®-2 mixed 16- and 32-bit instruction set delivers the high performance expected of a 32-bit
ARM core in a compact memory size usually associated with 8- and 16-bit devices, typically in the
range of a few kilobytes of memory for microcontroller-class applications:
Single-cycle multiply instruction and hardware divide
Atomic bit manipulation (bit-banding), delivering maximum memory use and streamlined peripheral
control
Unaligned data access, enabling data to be efficiently packed into memory
Fast code execution permits slower processor clock or increases sleep mode time
Harvard architecture characterized by separate buses for instruction and data
Efficient processor core, system, and memories
Hardware division and fast digital-signal-processing oriented multiply accumulate
Saturating arithmetic for signal processing
Deterministic, high-performance interrupt handling for time-critical applications
Enhanced system debug with extensive breakpoint and trace capabilities
Serial wire trace reduces the number of pins required for debugging and tracing
Migration from the ARM7™ processor family for better performance and power efficiency
Optimized for single-cycle flash memory use
Ultralow-power consumption with integrated sleep modes
1.25 DMIPS per MHz
6.4 RF Core
The RF Core contains an ARM Cortex-M0 processor that interfaces the analog RF and base-band
circuitries, handles data to and from the system side, and assembles the information bits in a given packet
structure. The RF core offers a high level, command-based API to the main CPU.
The RF core is capable of autonomously handling the time-critical aspects of the radio protocols (802.15.4
ZigBee) thus offloading the main CPU and leaving more resources for the user application.
The RF core has a dedicated 4-KB SRAM block and runs initially from separate ROM memory. The ARM
Cortex-M0 processor is not programmable by customers.
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6.5 Sensor Controller
The Sensor Controller contains circuitry that can be selectively enabled in standby mode. The peripherals
in this domain may be controlled by the Sensor Controller Engine which is a proprietary power-optimized
CPU. This CPU can read and monitor sensors or perform other tasks autonomously, thereby significantly
reducing power consumption and offloading the main CM3 CPU.
The Sensor Controller is set up using a PC-based configuration tool, called Sensor Controller Studio, and
potential use cases may be (but are not limited to):
Analog sensors using integrated ADC
Digital sensors using GPIOs, bit-banged I2C, and SPI
UART communication for sensor reading or debugging
Capacitive sensing
Waveform generation
Pulse counting
Keyboard scan
Quadrature decoder for polling rotation sensors
Oscillator calibration
NOTE
Texas Instruments provides application examples for some of these use cases, but not for all
of them.
The peripherals in the Sensor Controller include the following:
The low-power clocked comparator can be used to wake the device from any state in which the
comparator is active. A configurable internal reference can be used in conjunction with the comparator.
The output of the comparator can also be used to trigger an interrupt or the ADC.
Capacitive sensing functionality is implemented through the use of a constant current source, a time-
to-digital converter, and a comparator. The continuous time comparator in this block can also be used
as a higher-accuracy alternative to the low-power clocked comparator. The Sensor Controller will take
care of baseline tracking, hysteresis, filtering and other related functions.
The ADC is a 12-bit, 200-ksamples/s ADC with eight inputs and a built-in voltage reference. The ADC
can be triggered by many different sources, including timers, I/O pins, software, the analog
comparator, and the RTC.
The Sensor Controller also includes a SPI–I2C digital interface.
The analog modules can be connected to up to eight different GPIOs.
The peripherals in the Sensor Controller can also be controlled from the main application processor.
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(1) Depending on the package size, up to 16 pins can be connected to the Sensor Controller. Up to 8 of
these pins can be connected to analog modules.
Table 6-1. GPIOs Connected to the Sensor Controller(1)
ANALOG CAPABLE 7 × 7 RGZ
DIO NUMBER 5 × 5 RHB
DIO NUMBER 4 × 4 RSM
DIO NUMBER
Y 30 14
Y 29 13
Y 28 12
Y 27 11 9
Y 26 9 8
Y 25 10 7
Y 24 8 6
Y 23 7 5
N 7 4 2
N 6 3 1
N 5 2 0
N 4 1
N 3 0
N 2
N 1
N 0
6.6 Memory
The flash memory provides nonvolatile storage for code and data. The flash memory is in-system
programmable.
The SRAM (static RAM) can be used for both storage of data and execution of code and is split into two
4-KB blocks and two 6-KB blocks. Retention of the RAM contents in standby mode can be enabled or
disabled individually for each block to minimize power consumption. In addition, if flash cache is disabled,
the 8-KB cache can be used as a general-purpose RAM.
The ROM provides preprogrammed embedded TI RTOS kernel, Driverlib and lower layer protocol stack
software (802.15.4 MAC). It also contains a bootloader that can be used to reprogram the device using
SPI or UART.
6.7 Debug
The on-chip debug support is done through a dedicated cJTAG (IEEE 1149.7) or JTAG (IEEE 1149.1)
interface.
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(1) Not including RTOS overhead
(2) The Brown Out Detector is disabled between recharge periods in STANDBY. Lowering the supply voltage below the BOD threshold
between two recharge periods while in STANDBY may cause the BOD to lock the device upon wake-up until a Reset/POR releases it.
To avoid this, it is recommended that STANDBY mode is avoided if there is a risk that the supply voltage (VDDS) may drop below the
specified operating voltage range. For the same reason, it is also good practice to ensure that a power cycling operation, such as a
battery replacement, triggers a Power-on-reset by ensuring that the VDDS decoupling network is fully depleted before applying supply
voltage again (for example, inserting new batteries).
6.8 Power Management
To minimize power consumption, the CC2630 device supports a number of power modes and power
management features (see Table 6-2).
Table 6-2. Power Modes
MODE SOFTWARE CONFIGURABLE POWER MODES RESET PIN
HELD
ACTIVE IDLE STANDBY SHUTDOWN
CPU Active Off Off Off Off
Flash On Available Off Off Off
SRAM On On On Off Off
Radio Available Available Off Off Off
Supply System On On Duty Cycled Off Off
Current 1.45 mA + 31 µA/MHz 550 µA 1 µA 0.15 µA 0.1 µA
Wake-up Time to CPU Active(1) 14 µs 151 µs 1015 µs 1015 µs
Register Retention Full Full Partial No No
SRAM Retention Full Full Full No No
High-Speed Clock XOSC_HF or
RCOSC_HF XOSC_HF or
RCOSC_HF Off Off Off
Low-Speed Clock XOSC_LF or
RCOSC_LF XOSC_LF or
RCOSC_LF XOSC_LF or
RCOSC_LF Off Off
Peripherals Available Available Off Off Off
Sensor Controller Available Available Available Off Off
Wake up on RTC Available Available Available Off Off
Wake up on Pin Edge Available Available Available Available Off
Wake up on Reset Pin Available Available Available Available Available
Brown Out Detector (BOD) Active Active Duty Cycled(2) Off N/A
Power On Reset (POR) Active Active Active Active N/A
In active mode, the application CM3 CPU is actively executing code. Active mode provides normal
operation of the processor and all of the peripherals that are currently enabled. The system clock can be
any available clock source (see Table 6-2).
In idle mode, all active peripherals can be clocked, but the Application CPU core and memory are not
clocked and no code is executed. Any interrupt event will bring the processor back into active mode.
In standby mode, only the always-on domain (AON) is active. An external wake event, RTC event, or
sensor-controller event is required to bring the device back to active mode. MCU peripherals with retention
do not need to be reconfigured when waking up again, and the CPU continues execution from where it
went into standby mode. All GPIOs are latched in standby mode.
In shutdown mode, the device is turned off entirely, including the AON domain and the Sensor Controller.
The I/Os are latched with the value they had before entering shutdown mode. A change of state on any
I/O pin defined as a wake from Shutdown pin wakes up the device and functions as a reset trigger. The
CPU can differentiate between a reset in this way, a reset-by-reset pin, or a power-on-reset by reading the
reset status register. The only state retained in this mode is the latched I/O state and the Flash memory
contents.
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The Sensor Controller is an autonomous processor that can control the peripherals in the Sensor
Controller independently of the main CPU, which means that the main CPU does not have to wake up, for
example, to execute an ADC sample or poll a digital sensor over SPI. The main CPU saves both current
and wake-up time that would otherwise be wasted. The Sensor Controller Studio enables the user to
configure the sensor controller and choose which peripherals are controlled and which conditions wake up
the main CPU.
6.9 Clock Systems
The CC2630 supports two external and two internal clock sources.
A 24-MHz crystal is required as the frequency reference for the radio. This signal is doubled internally to
create a 48-MHz clock.
The 32-kHz crystal is optional. The low-speed crystal oscillator is designed for use with a 32-kHz watch-
type crystal.
The internal high-speed oscillator (48-MHz) can be used as a clock source for the CPU subsystem.
The internal low-speed oscillator (32.768-kHz) can be used as a reference if the low-power crystal
oscillator is not used.
The 32-kHz clock source can be used as external clocking reference through GPIO.
6.10 General Peripherals and Modules
The I/O controller controls the digital I/O pins and contains multiplexer circuitry to allow a set of peripherals
to be assigned to I/O pins in a flexible manner. All digital I/Os are interrupt and wake-up capable, have a
programmable pullup and pulldown function and can generate an interrupt on a negative or positive edge
(configurable). When configured as an output, pins can function as either push-pull or open-drain. Five
GPIOs have high drive capabilities (marked in bold in Section 4).
The SSIs are synchronous serial interfaces that are compatible with SPI, MICROWIRE, and Texas
Instruments synchronous serial interfaces. The SSIs support both SPI master and slave up to 4 MHz.
The UART implements a universal asynchronous receiver/transmitter function. It supports flexible baud-
rate generation up to a maximum of 3 Mbps .
Timer 0 is a general-purpose timer module (GPTM), which provides two 16-bit timers. The GPTM can be
configured to operate as a single 32-bit timer, dual 16-bit timers or as a PWM module.
Timer 1, Timer 2, and Timer 3 are also GPTMs. Each of these timers is functionally equivalent to Timer 0.
In addition to these four timers, the RF core has its own timer to handle timing for RF protocols; the RF
timer can be synchronized to the RTC.
The I2C interface is used to communicate with devices compatible with the I2C standard. The I2C interface
is capable of 100-kHz and 400-kHz operation, and can serve as both I2C master and I2C slave.
The TRNG module provides a true, nondeterministic noise source for the purpose of generating keys,
initialization vectors (IVs), and other random number requirements. The TRNG is built on 24 ring
oscillators that create unpredictable output to feed a complex nonlinear combinatorial circuit.
The watchdog timer is used to regain control if the system fails due to a software error after an external
device fails to respond as expected. The watchdog timer can generate an interrupt or a reset when a
predefined time-out value is reached.
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(1) VDDS_DCDC must be connected to VDDS on the PCB
The device includes a direct memory access (µDMA) controller. The µDMA controller provides a way to
offload data transfer tasks from the CM3 CPU, allowing for more efficient use of the processor and the
available bus bandwidth. The µDMA controller can perform transfer between memory and peripherals. The
µDMA controller has dedicated channels for each supported on-chip module and can be programmed to
automatically perform transfers between peripherals and memory as the peripheral is ready to transfer
more data. Some features of the µDMA controller include the following (this is not an exhaustive list):
Highly flexible and configurable channel operation of up to 32 channels
Transfer modes:
Memory-to-memory
Memory-to-peripheral
Peripheral-to-memory
Peripheral-to-peripheral
Data sizes of 8, 16, and 32 bits
The AON domain contains circuitry that is always enabled, except for in Shutdown (where the digital
supply is off). This circuitry includes the following:
The RTC can be used to wake the device from any state where it is active. The RTC contains three
compare and one capture registers. With software support, the RTC can be used for clock and
calendar operation. The RTC is clocked from the 32-kHz RC oscillator or crystal. The RTC can also be
compensated to tick at the correct frequency even when the internal 32-kHz RC oscillator is used
instead of a crystal.
The battery monitor and temperature sensor are accessible by software and give a battery status
indication as well as a coarse temperature measure.
6.11 Voltage Supply Domains
The CC2630 device can interface to two or three different voltage domains depending on the package
type. On-chip level converters ensure correct operation as long as the signal voltage on each input/output
pin is set with respect to the corresponding supply pin (VDDS, VDDS2 or VDDS3). lists the pin-to-VDDS
mapping.
Table 6-3. Pin function to VDDS mapping table
Package
VQFN 7 × 7 (RGZ) VQFN 5 × 5 (RHB) VQFN 4 × 4 (RSM)
VDDS(1) DIO 23–30
Reset_N DIO 7–14
Reset_N DIO 5–9
Reset_N
VDDS2 DIO 0–11 DIO 0–6
JTAG DIO 0–4
JTAG
VDDS3 DIO 12–22
JTAG N/A N/A
6.12 System Architecture
Depending on the product configuration, CC26xx can function either as a Wireless Network Processor
(WNP—an IC running the wireless protocol stack, with the application running on a separate MCU), or as
a System-on-Chip (SoC), with the application and protocol stack running on the ARM CM3 core inside the
device.
In the first case, the external host MCU communicates with the device using SPI or UART. In the second
case, the application must be written according to the application framework supplied with the wireless
protocol stack.
Antenna
(50 Ohm)
1 pF
1 pF
2.4 nH
2.4±2.7 nH
6.8 pF
6.2±6.8 nH
Antenna
(50 Ohm)
1.2 pF
15 nH 2 nH
1.2 pF
Antenna
(50 Ohm)
1.2 pF
2 nH
1.2 pF
Antenna
(50 Ohm)
1.2 pF
2 nH
1.2 pF
Pin 1 (RF P)
Pin 2 (RF N)
Pin 3 (RXTX)
Pin 1 (RF P)
Pin 2 (RF N)
Pin 1 (RF P)
Pin 2 (RF N)
Red = Not necessary if internal bias is used
Red = Not necessary if internal bias is used
Differential
operation
Single ended
operation
Single ended
operation with 2
antennas
Pin 3 (RXTX)
15 nH
15 nH
CC26xx
(GND exposed die
attached pad
)
Pin 3/4 (RXTX)
Pin 1 (RF P)
Pin 2 (RF N)
24MHz
XTAL
(Load caps
on chip)
10µF
10µH
Optional
inductor.
Only
needed for
DCDC
operation
12 pF
12 pF
12 pF
12 pF
2 nH 2 nH
1 pF
input
decoupling
10µF±22µF
To VDDR
pins
VDDS_DCDC
DCDC_SW
Red = Not necessary if internal bias is used
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7 Application, Implementation, and Layout
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI's customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
7.1 Application Information
Very few external components are required for the operation of the CC2630 device. This section provides
some general information about the various configuration options when using the CC2630 in an
application, and then shows two examples of application circuits with schematics and layout. This is only a
small selection of the many application circuit examples available as complete reference designs from the
product folder on www.ti.com.
Figure 7-1 shows the various RF front-end configuration options. The RF front end can be used in
differential- or single-ended configurations with the options of having internal or external biasing. These
options allow for various trade-offs between cost, board space, and RF performance. Differential operation
with external bias gives the best performance while single-ended operation with internal bias gives the
least amount of external components and the lowest power consumption. Reference designs exist for
each of these options.
Figure 7-1. CC2630 Application Circuit
Internal DC-DC Regulator External RegulatorInternal LDO Regulator
(GND Exposed Die
Attached Pad)
Pin 3/4 (RXTX)
Pin 1 (RF P)
Pin 2 (RF N)
24-MHz XTAL
(Load Caps on Chip)
10 F
10 H
VDDS_DCDC
Input Decoupling
10 F±22 F
To All VDDR Pins
VDDS_DCDC Pin
DCDC_SW Pin
1.8 V±3.8 V
to All VDDS Pins
VDDR
VDDR
VDDS VDDS
CC26xx
(GND Exposed Die
Attached Pad)
Pin 3/4 (RXTX)
Pin 1 (RF P)
Pin 2 (RF N)
24-MHz XTAL
(Load Caps on Chip)
VDDS_DCDC
Input Decoupling
10 F±22 F
To All VDDR Pins
VDDS_DCDC Pin
NC
1.8 V±3.8 V
Supply Voltage
VDDR
VDDR
VDDS VDDS
CC26xx
10 F
To All VDDS Pins
(GND Exposed Die
Attached Pad)
Pin 3/4 (RXTX)
Pin 1 (RF P)
Pin 2 (RF N)
24-MHz XTAL
(Load Caps
on Chip)
VDDS_DCDC Pin
CC26xx
2.2 F
DCDC_SW Pin
1.7 V±1.95 V to All VDDR- and VDDS Pins Except VDDS_DCDC
Ext.
Regulator
Copyright © 2016, Texas Instruments Incorporated
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Application, Implementation, and LayoutCopyright © 2015–2016, Texas Instruments Incorporated
Figure 7-2 shows the various supply voltage configuration options. Not all power supply decoupling
capacitors or digital I/Os are shown. Exact pin positions will vary between the different package options.
For a detailed overview of power supply decoupling and wiring, see the TI reference designs and the
CC26xx technical reference manual (Section 8.3).
Figure 7-2. Supply Voltage Configurations
C12
DNM
C13
1 pF
L12
2 nH
12L13
2 nH
1 2
VDDR Decoupling Capacitors
Pin 32
Pin 29
50-Ω
Antenna
VDDS
L1
10 uH
1
2
Y1
32.768 kHz
C18
12 pF
C17
12 pF
Place L1 and
C8 close to pin 17
C23
DNM
C22
DNM
C8
10 µF
C10
DNM
C16
100 nF
C6
10 µF
CC2650F128RHB
U1
VSS
33
DIO_0
6
DIO_1
7
DIO_2
8
DIO_3
9
DIO_4
10
DIO_5
15
DIO_6
16
DIO_7
20
DIO_8
21
DIO_9
22
DIO_10
23
DIO_11
24
DIO_12
25
DIO_13
26
DIO_14
27
VDDR 29
VDDR 32
VDDS 28
VDDS2 11
VDDS_DCDC 18
DCOUPL
12
RESET_N
19
JTAG_TMSC
13 JTAG_TCKC
14
X32K_Q1
4
X32K_Q2
5
X24M_N
30
X24M_P
31
RF_P
1
RF_N
2
RX_TX
3
DCDC_SW
17
Y2
24 MHz
1
24
3
C2
DNM
C11
1 pF
C21
1 pF
C20
100 nF
X24M_N
X24M_P
VDDS VDDR
DCDC_SW
DCDC_SW
C31
6.8 pF
VDDS
nRESET
C19
1 µF
JTAG_TCK
JTAG_TMS
DIO_1
DIO_0
DIO_3
DIO_2
DIO_5/JTAG_TDO
DIO_4
DIO_7
DIO_6/JTAG_TDI
DIO_10
DIO_9
DIO_8
DIO_12
DIO_11
DIO_14
DIO_13
RX_TX
RFP
RFN
L11
2.7 nH
1 2
L21
2.4 nH
1
2
VDD_EB
FL1
BLM18HE152SN1
12
C9
100 nF
C3
100 nF
C4
100 nF
VDDS Decoupling Capacitors
Pin 18
Pin 28
Pin 11
C7
100 nF
L10
6.2 nH
1
2
R1
100 k
VDDR
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7.2 5 × 5 External Differential (5XD) Application Circuit
Figure 7-3. 5 × 5 External Differential (5XD) Application Circuit
39
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Application, Implementation, and LayoutCopyright © 2015–2016, Texas Instruments Incorporated
7.2.1 Layout
Figure 7-4. 5 × 5 External Differential (5XD) Layout
RF_P
C14
12 pF
C8
10 Fµ
C10
DNM
C16
100 nF
C5
10 Fµ
VDDS Decoupling Capacitors
VDDS
Pin 11 Pin 27 Pin 19
Y1
32.768 kHz
C18
12 pF
C17
12 pF
C3
100 nF
C4
100 nF
C6
100 nF
C12
1.2 pF
VDDS
R1
100 k
VDDR
Place L1 and
C8 close to pin 18
C20
100 nF
nRESET
DIO_8
DIO_0
DIO_7
DIO_9
Pin 28 Pin 32
C9
100 nF
VDDR Decoupling Capacitors
VDDR
Y2
24 MHz
1
24
3
C2
DNM
VDDS
L21
15 nH
1 2
L1
10 Hµ
12
DCDC_SW
C19
1 µF
50-Ω
Antenna
FL1
BLM18HE152SN1
1
2
RF_N used for RX biasing.
L21 may be removed at the
cost of 1 dB degraded
sensitivity
VDD_EB
C13
1.2 pF
L12
2 nH
1 2
CC26XX_4X4
U1
DIO_0
8
DIO_1
9
DIO_2
10
DIO_3
15
DIO_4
16
DIO_5
22
DIO_6
23
DIO_7
24
DIO_8
25
DIO_9
26
RESET_N
21
JTAG_TCKC
14
JTAG_TMSC
13
X24M_P 31
X24M_N 30
DCOUPL
12
VSS
29
VSS
3
EGP
33
VDDS 27
VDDS2 11
VDDS_DCDC 19
VDDR 28
VDDR 32
DCDC_SW 18
RX/TX
4
RF_N
RF_P 1
X32K_Q2 6
X32K_Q1 5
VSS
7
VSS
17
VSS
20
DIO_1
DIO_3/JTAG_TDO
DIO_2
DIO_6
DIO_5
DIO_4/JTAG_TDI
DCDC_SW
JTAG_TCK
nRESET
JTAG_TMS
C23
DNM
C22
DNM
X24M_N
X24M_P
2
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7.3 4 × 4 External Single-ended (4XS) Application Circuit
Figure 7-5. 4 × 4 External Single-ended (4XS) Application Circuit
41
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Application, Implementation, and LayoutCopyright © 2015–2016, Texas Instruments Incorporated
7.3.1 Layout
Figure 7-6. 4 × 4 External Single-ended (4XS) Layout
SimpleLink™ Multistandard
Wireless MCU
DEVICE FAMILY
PREFIX
CC26 xx
X = Experimental device
Blank = Qualified device
yyy
PACKAGE DESIGNATOR
RGZ = 48-pin VQFN (Very Thin Quad Flatpack No-Lead)
RHB = 32-pin VQFN (Very Thin Quad Flatpack No-Lead)
RSM = 32-pin VQFN (Very Thin Quad Flatpack No-Lead)
(R/T)
R = Large Reel
T = Small Reel
F128
ROM version 1
Flash = 128KB
DEVICE
20 = RF4CE
30 = Zigbee
40 =
50 = Multi-Protocol
Bluetooth
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Device and Documentation Support Copyright © 2015–2016, Texas Instruments Incorporated
8 Device and Documentation Support
8.1 Device Nomenclature
To designate the stages in the product development cycle, TI assigns prefixes to all part numbers and
date-code. Each device has one of three prefixes/identifications: X, P, or null (no prefix) (for example,
CC2630 is in production; therefore, no prefix/identification is assigned).
Device development evolutionary flow:
XExperimental device that is not necessarily representative of the final device's electrical
specifications and may not use production assembly flow.
PPrototype device that is not necessarily the final silicon die and may not necessarily meet
final electrical specifications.
null Production version of the silicon die that is fully qualified.
Production devices have been characterized fully, and the quality and reliability of the device have been
demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system
because their expected end-use failure rate still is undefined. Only qualified production devices are to be
used.
TI device nomenclature also includes a suffix with the device family name. This suffix indicates the
package type (for example, RSM).
For orderable part numbers of the CC2630 device in the RSM, RHB or RGZ package types, see the
Package Option Addendum of this document, the TI website (www.ti.com), or contact your TI sales
representative.
Figure 8-1. Device Nomenclature
43
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Device and Documentation SupportCopyright © 2015–2016, Texas Instruments Incorporated
8.2 Tools and Software
TI offers an extensive line of development tools, including tools to evaluate the performance of the
processors, generate code, develop algorithm implementations, and fully integrate and debug software
and hardware modules.
The following products support development of the CC2630 device applications:
Software Tools:
SmartRF Studio 7:
SmartRF Studio is a PC application that helps designers of radio systems to easily evaluate the RF-IC at
an early stage in the design process.
Test functions for sending and receiving radio packets, continuous wave transmit and receive
Evaluate RF performance on custom boards by wiring it to a supported evaluation board or debugger
Can also be used without any hardware, but then only to generate, edit and export radio configuration
settings
Can be used in combination with several development kits for Texas Instruments’ CCxxxx RF-ICs
Sensor Controller Studio:
Sensor Controller Studio provides a development environment for the CC26xx Sensor Controller. The
Sensor Controller is a proprietary, power-optimized CPU in the CC26xx, which can perform simple
background tasks autonomously and independent of the System CPU state.
Allows for Sensor Controller task algorithms to be implemented using a C-like programming language
Outputs a Sensor Controller Interface driver, which incorporates the generated Sensor Controller
machine code and associated definitions
Allows for rapid development by using the integrated Sensor Controller task testing and debugging
functionality. This allows for live visualization of sensor data and algorithm verification.
IDEs and Compilers:
Code Composer Studio:
Integrated development environment with project management tools and editor
Code Composer Studio (CCS) 6.1 and later has built-in support for the CC26xx device family
Best support for XDS debuggers; XDS100v3, XDS110 and XDS200
High integration with TI-RTOS with support for TI-RTOS Object View
IAR Embedded Workbench for ARM
Integrated development environment with project management tools and editor
IAR EWARM 7.30.3 and later has built-in support for the CC26xx device family
Broad debugger support, supporting XDS100v3, XDS200, IAR I-Jet and Segger J-Link
Integrated development environment with project management tools and editor
RTOS plugin available for TI-RTOS
For a complete listing of development-support tools for the CC2630 platform, visit the Texas Instruments
website at www.ti.com. For information on pricing and availability, contact the nearest TI field sales office
or authorized distributor.
44
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Device and Documentation Support Copyright © 2015–2016, Texas Instruments Incorporated
8.3 Documentation Support
To receive notification of documentation updates, navigate to the device product folder on ti.com
(CC2630). In the upper right corner, click on Alert me to register and receive a weekly digest of any
product information that has changed. For change details, review the revision history included in any
revised document.
The current documentation that describes the CC2630 devices, related peripherals, and other technical
collateral is listed in the following.
Technical Reference Manual
CC13xx, CC26xx SimpleLink™ Wireless MCU Technical Reference Manual
CC26xx SimpleLink™ Wireless MCU Errata SPACER
Errata
CC2630 and CC2650 SimpleLink™ Wireless MCU Errata
8.4 Texas Instruments Low-Power RF Website
Texas Instruments' Low-Power RF website has all the latest products, application and design notes, FAQ
section, news and events updates. Go to www.ti.com/lprf.
8.5 Low-Power RF eNewsletter
The Low-Power RF eNewsletter is up-to-date on new products, news releases, developers’ news, and
other news and events associated with low-power RF products from TI. The Low-Power RF eNewsletter
articles include links to get more online information.
Sign up at: www.ti.com/lprfnewsletter
8.6 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the
respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views;
see TI's Terms of Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster
collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge,
explore ideas and help solve problems with fellow engineers.
TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help
developers get started with Embedded Processors from Texas Instruments and to foster
innovation and growth of general knowledge about the hardware and software surrounding
these devices.
Low-Power RF Online Community Wireless Connectivity Section of the TI E2E Support Community
Forums, videos, and blogs
RF design help
E2E interaction
Join here.
Low-Power RF Developer Network Texas Instruments has launched an extensive network of low-power
RF development partners to help customers speed up their application development. The
network consists of recommended companies, RF consultants, and independent design
houses that provide a series of hardware module products and design services, including:
RF circuit, low-power RF, and ZigBee design services
Low-power RF and ZigBee module solutions and development tools
RF certification services and RF circuit manufacturing
For help with modules, engineering services or development tools:
Search the Low-Power RF Developer Network to find a suitable partner.
www.ti.com/lprfnetwork
45
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Mechanical Packaging and Orderable InformationCopyright © 2015–2016, Texas Instruments Incorporated
8.7 Additional Information
Texas Instruments offers a wide selection of cost-effective, low-power RF solutions for proprietary and
standard-based wireless applications for use in industrial and consumer applications. The selection
includes RF transceivers, RF transmitters, RF front ends, and Systems-on-Chips as well as various
software solutions for the sub-1-GHz and 2.4-GHz frequency bands.
In addition, Texas Instruments provides a large selection of support collateral such as development tools,
technical documentation, reference designs, application expertise, customer support, third-party and
university programs.
The Low-Power RF E2E Online Community provides technical support forums, videos and blogs, and the
chance to interact with engineers from all over the world.
With a broad selection of product solutions, end-application possibilities, and a range of technical support,
Texas Instruments offers the broadest low-power RF portfolio.
8.8 Trademarks
SimpleLink, SmartRF, Code Composer Studio, E2E are trademarks of Texas Instruments.
ARM7 is a trademark of ARM Limited (or its subsidiaries).
ARM, Cortex, ARM Thumb are registered trademarks of ARM Limited (or its subsidiaries).
CoreMark is a registered trademark of Embedded Microprocessor Benchmark Consortium.
IAR Embedded Workbench is a registered trademark of IAR Systems AB.
IEEE Std 1241 is a trademark of Institute of Electrical and Electronics Engineers, Incorporated.
ZigBee is a registered trademark of ZigBee Alliance, Inc.
All other trademarks are the property of their respective owners.
8.9 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
8.10 Export Control Notice
Recipient agrees to not knowingly export or re-export, directly or indirectly, any product or technical data
(as defined by the U.S., EU, and other Export Administration Regulations) including software, or any
controlled product restricted by other applicable national regulations, received from Disclosing party under
this Agreement, or any direct product of such technology, to any destination to which such export or re-
export is restricted or prohibited by U.S. or other applicable laws, without obtaining prior authorization from
U.S. Department of Commerce and other competent Government authorities to the extent required by
those laws.
8.11 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms and definitions.
9 Mechanical Packaging and Orderable Information
9.1 Packaging Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and
revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
PACKAGE OPTION ADDENDUM
www.ti.com 26-Aug-2017
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
CC2630F128RGZR ACTIVE VQFN RGZ 48 2500 Green (RoHS
& no Sb/Br) CU NIPDAU |
CU NIPDAUAG Level-3-260C-168 HR -40 to 85 CC2630
F128
CC2630F128RGZT ACTIVE VQFN RGZ 48 250 Green (RoHS
& no Sb/Br) CU NIPDAU |
CU NIPDAUAG Level-3-260C-168 HR -40 to 85 CC2630
F128
CC2630F128RHBR ACTIVE VQFN RHB 32 3000 Green (RoHS
& no Sb/Br) CU NIPDAU |
CU NIPDAUAG Level-3-260C-168 HR -40 to 85 CC2630
F128
CC2630F128RHBT ACTIVE VQFN RHB 32 250 Green (RoHS
& no Sb/Br) CU NIPDAU |
CU NIPDAUAG Level-3-260C-168 HR -40 to 85 CC2630
F128
CC2630F128RSMR ACTIVE VQFN RSM 32 3000 Green (RoHS
& no Sb/Br) CU NIPDAU |
CU NIPDAUAG Level-3-260C-168 HR -40 to 85 CC2630
F128
CC2630F128RSMT ACTIVE VQFN RSM 32 250 Green (RoHS
& no Sb/Br) CU NIPDAU |
CU NIPDAUAG Level-3-260C-168 HR -40 to 85 CC2630
F128
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
PACKAGE OPTION ADDENDUM
www.ti.com 26-Aug-2017
Addendum-Page 2
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
CC2630F128RGZR VQFN RGZ 48 2500 330.0 16.4 7.3 7.3 1.1 12.0 16.0 Q2
CC2630F128RGZR VQFN RGZ 48 2500 330.0 16.4 7.3 7.3 1.1 12.0 16.0 Q2
CC2630F128RGZT VQFN RGZ 48 250 180.0 16.4 7.3 7.3 1.1 12.0 16.0 Q2
CC2630F128RGZT VQFN RGZ 48 250 180.0 16.4 7.3 7.3 1.1 12.0 16.0 Q2
CC2630F128RHBR VQFN RHB 32 3000 330.0 12.4 5.3 5.3 1.1 8.0 12.0 Q2
CC2630F128RHBR VQFN RHB 32 3000 330.0 12.4 5.3 5.3 1.1 8.0 12.0 Q2
CC2630F128RHBT VQFN RHB 32 250 180.0 12.4 5.3 5.3 1.1 8.0 12.0 Q2
CC2630F128RHBT VQFN RHB 32 250 180.0 12.4 5.3 5.3 1.1 8.0 12.0 Q2
CC2630F128RSMR VQFN RSM 32 3000 330.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2
CC2630F128RSMR VQFN RSM 32 3000 330.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2
CC2630F128RSMT VQFN RSM 32 250 180.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2
CC2630F128RSMT VQFN RSM 32 250 180.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2
PACKAGE MATERIALS INFORMATION
www.ti.com 19-Sep-2017
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
CC2630F128RGZR VQFN RGZ 48 2500 367.0 367.0 38.0
CC2630F128RGZR VQFN RGZ 48 2500 336.6 336.6 31.8
CC2630F128RGZT VQFN RGZ 48 250 210.0 185.0 35.0
CC2630F128RGZT VQFN RGZ 48 250 210.0 185.0 35.0
CC2630F128RHBR VQFN RHB 32 3000 367.0 367.0 35.0
CC2630F128RHBR VQFN RHB 32 3000 336.6 336.6 31.8
CC2630F128RHBT VQFN RHB 32 250 210.0 185.0 35.0
CC2630F128RHBT VQFN RHB 32 250 210.0 185.0 35.0
CC2630F128RSMR VQFN RSM 32 3000 336.6 336.6 31.8
CC2630F128RSMR VQFN RSM 32 3000 367.0 367.0 35.0
CC2630F128RSMT VQFN RSM 32 250 210.0 185.0 35.0
CC2630F128RSMT VQFN RSM 32 250 210.0 185.0 35.0
PACKAGE MATERIALS INFORMATION
www.ti.com 19-Sep-2017
Pack Materials-Page 2
IMPORTANT NOTICE
Texas Instruments Incorporated (TI) reserves the right to make corrections, enhancements, improvements and other changes to its
semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers
should obtain the latest relevant information before placing orders and should verify that such information is current and complete.
TI’s published terms of sale for semiconductor products (http://www.ti.com/sc/docs/stdterms.htm) apply to the sale of packaged integrated
circuit products that TI has qualified and released to market. Additional terms may apply to the use or sale of other types of TI products and
services.
Reproduction of significant portions of TI information in TI data sheets is permissible only if reproduction is without alteration and is
accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such reproduced
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different from or beyond the parameters stated by TI for that product or service voids all express and any implied warranties for the
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Buyers and others who are developing systems that incorporate TI products (collectively, “Designers”) understand and agree that Designers
remain responsible for using their independent analysis, evaluation and judgment in designing their applications and that Designers have
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respect to their applications, Designer has all the necessary expertise to create and implement safeguards that (1) anticipate dangerous
consequences of failures, (2) monitor failures and their consequences, and (3) lessen the likelihood of failures that might cause harm and
take appropriate actions. Designer agrees that prior to using or distributing any applications that include TI products, Designer will
thoroughly test such applications and the functionality of such TI products as used in such applications.
TI’s provision of technical, application or other design advice, quality characterization, reliability data or other services or information,
including, but not limited to, reference designs and materials relating to evaluation modules, (collectively, “TI Resources”) are intended to
assist designers who are developing applications that incorporate TI products; by downloading, accessing or using TI Resources in any
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solely for this purpose and subject to the terms of this Notice.
TI’s provision of TI Resources does not expand or otherwise alter TI’s applicable published warranties or warranty disclaimers for TI
products, and no additional obligations or liabilities arise from TI providing such TI Resources. TI reserves the right to make corrections,
enhancements, improvements and other changes to its TI Resources. TI has not conducted any testing other than that specifically
described in the published documentation for a particular TI Resource.
Designer is authorized to use, copy and modify any individual TI Resource only in connection with the development of applications that
include the TI product(s) identified in such TI Resource. NO OTHER LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE
TO ANY OTHER TI INTELLECTUAL PROPERTY RIGHT, AND NO LICENSE TO ANY TECHNOLOGY OR INTELLECTUAL PROPERTY
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third party, or a license from TI under the patents or other intellectual property of TI.
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and ISO 26262), TI is not responsible for any failure to meet such industry standard requirements.
Where TI specifically promotes products as facilitating functional safety or as compliant with industry functional safety standards, such
products are intended to help enable customers to design and create their own applications that meet applicable functional safety standards
and requirements. Using products in an application does not by itself establish any safety features in the application. Designers must
ensure compliance with safety-related requirements and standards applicable to their applications. Designer may not use any TI products in
life-critical medical equipment unless authorized officers of the parties have executed a special contract specifically governing such use.
Life-critical medical equipment is medical equipment where failure of such equipment would cause serious bodily injury or death (e.g., life
support, pacemakers, defibrillators, heart pumps, neurostimulators, and implantables). Such equipment includes, without limitation, all
medical devices identified by the U.S. Food and Drug Administration as Class III devices and equivalent classifications outside the U.S.
TI may expressly designate certain products as completing a particular qualification (e.g., Q100, Military Grade, or Enhanced Product).
Designers agree that it has the necessary expertise to select the product with the appropriate qualification designation for their applications
and that proper product selection is at Designers’ own risk. Designers are solely responsible for compliance with all legal and regulatory
requirements in connection with such selection.
Designer will fully indemnify TI and its representatives against any damages, costs, losses, and/or liabilities arising out of Designer’s non-
compliance with the terms and provisions of this Notice.
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