5962-8876402LA - Maxim Integrated Products, Inc.

SCOPE: CMOS HIGHSPEED 8-BIT A/D CONVERTER WI TH TRACK AND HOLD

Device Type Generic Number

01 MX7824T(x)/883B

02 MX7824U(x)/883B

Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:

Outline Letter Mil-Std-1835 Case Outline Package Code

MAXIM SMD

Q L GDIP1-T24 or CDIP2-T24 24 LEAD CERDIP J24

A bsolu te Maximum Ratings

Supply Voltage to GND ................................................................................….. 0V, +7V

Digital Input Voltage ...............................................................................…... -0.3V, VDD

Digital Output Voltage ................................................................................... -0.3V, VDD

Positive Reference Voltage ...................................................................... VREF- to VDD

Negative Reference Voltage ..................................................................... 0V to VREF+

Input Voltage (VIN) ..................................................................................... -0.3V to VDD

Lead Temperature (soldering, 10 seconds) ............................................................... +300°C

Storage Temperature .................................................................................. -65°C to +150 °C

Continuous Power Dissipation ............................................................................ TA=+70°C

24 pin CERDIP(derate 12.5mW/°C above +70°C) ................................................ 1000mW

Junct ion Temper atur e TJ ........................................................................................ +150°C

Thermal Resista nce, J unction to Case, ΘJC

24 pin CERDIP.................................................................................................... 40°C/W

Thermal Resistance, Junction to Ambient, ΘJA:

24 pin CERDIP................................................................................................... 80°C/W

Recommended Operating Co ndit ions

Ambient Operating Range (TA) ......................................................….... -55°C to +125°C

Supply Voltage Range (VDD) ............................................................…... +4.75V to 5.25V

Positive Reference Voltage (VREF+) ................................................................…... +5.0V

Negative Reference Voltage (VREF-) ....................................................................….... 0V

Ground Potential (GND) .......................................................................................……. 0V

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.

These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those indicated in the operational section s of the sp ecifica tions is not implied. Exposure to absolute maximum

rating conditions for extended periods may affect device reliability.

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TABLE 1. ELECTRICAL TE STS:

TEST Symbol

CONDITIONS

-55 °C ≤TA≤ +125°C 1/ 2/

Unless otherwise specified Group A

Subgroup Device

type Limits

Min Limits

Max Units

Resolution RES Guaranteed but not tested 1,2,3 All 8LSB

Total Unadjusted Error

NOTE 3 TUE 1,2,3 01

±1.0

±0.5 LSB

Analog Input Voltage

Range VIN 1All

VREF- VREF+ V

Analog Input Leakage

Current IIN 1,2,3 All -3.0 +3.0 µA

Analog Input Capacitance CIN1 0V, 5V, NOTE 4 4 All 45 pF

Reference Input Resistance RIN NOTE 4 1,2,3 All 1.0 4.0 kΩ

Digital Input High Level

Voltage VIH ___ __

A0, A1, RD, CS 1,2,3 All 2.4 V

Digital Input Low Level

Voltage VIL ___ __

A0, A1, RD, CS 1,2,3 All 0.8 V

Digital Input High Current IIH ___ __

A0, A1, RD, CS 1,2,3 All 1.0 µA

Digital Input Low Current IIL ___ __

A0, A1, RD, CS 1,2,3 All -1.0 µA

Digital Input Capacitance CIN2 ___ __ NOTE 4

A0, A1, RD, CS 4All 8.0 pF

Digital O utput High Level

Voltage VOH ___

DB0-DB7, INT, ISOURCE=360µA1,2,3 All 4.0 V

Digital Output Low Level

Voltage VOL ___

DB0-DB7, INT, ISINK=1.6mA

RDY, ISINK=2.6mA, NOTE 5 1,2,3 All

0.4

0.4 V

Floating State Leakage

Current IOUT DB0-DB7 only 1,2,3 All ±3.0 µA

Slew Rate, Tracking

Capacitance NOTE 4 4All 0.157 V/µs

Digital Output Capacitance COUT NOTE 4 4 All 8.0 pF

Supply Current IDD __ ___

CS=RD=2.4V 1,2,3 All 20.0 mA

Power Supply Sensitivity PSS VDD=5.0V±5% 1,2,3 All ±0.25 LSB

__ __

CS to RD Setup Time tCSS Figure 3 9,10,11 All 0ns

__ __

CS to RD Hold Time tCSH Figure 3 9,10,11 All 0ns

CS to RDY delay tRDY Pull-up resistor=5kΩ, CL=50pF,

Figure 3 9

10,11 All 40

60 ns

Conversion Time, Mode 0 tCRD See Figure 3. NOTE 7 9

10,11 All 2.0

2.8 µs

Data Access Time __

After RD,

Mode 1

tACC1 NOTE 6 and 7

Figure 3 and 5 9

10,11 All 85

120 ns

---------------------------- Electrical Characteristics of MX7824/883B 19-1036 Rev. C

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TEST Symbol

CONDITIONS

-55 °C ≤TA≤ +125°C 1/ 2/

Unless otherwise specified Group A

Subgroup Device

type Limits

Min Limits

Max Units

__ ___

RD to INT Delay, NOTE 5 tINTH CL=50pF 9

10,11 All 75

100 ns

Data Hold Time tDH NOTE 8, Figure 3,4 9

10,11 All 60

70 ns

Delay Time Between

Conversion tPFigure 3 9

10,11 All 500

600 ns

Read Pulse Width, Mode 1 tRD Figure 3 9

10,11 All 60

80 600

400 ns

Data Access Time After

___

INT, Mode 0

tACC2 NOTE 6, 7, Figure 3,5 9

10,11 All 50

70 ns

Multiplexer Address Setup

Time tAS Figure 3 9,10,11 All 0ns

Multiplexer Address Hold

Time tAH Figure 3 9

10,11 All 30

40 ns

NOTE 1: VDD=+5V, VREF(+)=+5V; VREF(-)=GND=0V, unless otherwise specified.

Specifications apply for mode 0. All input control signals are specified with tr=tf=20ns

(10 percent to 90 percent of +5.0V) and timed from a voltage level of 1.6V.

NOTE 2: Subgroups 10 and 1 1, if not tested, shall be guara nteed to the li mits specified in Table 1 .

NOTE 3: Total unadjusted error includes offset, full-scale, and linearity errors.

NOTE 4: The (CIN1, C IN2, RIN, COUT, and SR measurements) are measured initially and after any process

or design changes which may affect these tests.

NOTE 5: RDY is an open-drain output.

NOTE 6: Measured with load circuits of Figure 5 and defined as the time

required for an output to cross 0.8V or 2.4V.

NOTE 7: If not tested, it shall be guaranteed to the limits specified in Table 1.

NOTE 8: Defined as the time required for the data lines to change 0.5V when loaded with the circuits of

Figure 4 and is measured only for the initial test and after process or design change which may affect tDH.

TERMINAL CONNECTIONS

J24 J24

1AIN4 13VREF-

2AIN3 14VREF+

3AIN2 15RDY

4AIN1 16__

5NC 17DB4

6DB0 18DB5

7DB1 19DB6

8DB2 20DB7

9DB3 21A1

10 __

RD 22 A0

11 ___

INT 23 NC

12 GND 24 VDD

---------------------------- Electrical Characteristics of MX7824/883B 19-1036 Rev. C

for /883B and SMD 5962-8876401 and 02 Page 4 of 9

Package ORDERING INFORMATION: SMD NUMBER

01 24 pin CERDIP MX7824TQ/883B 5962-8876401LA

02 24 pin CERDIP MX7824UQ/883B 5962-8876402LA

MODE SELEC TION TAB LE

CHANNEL A1 A0

AIN1 0 0

AIN2 0 1

AIN3 1 0

AIN4 1 1

---------------------------- Electrical Characteristics of MX7824/883B 19-1036 Rev. C

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QUALITY ASSURAN CE

Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-

Std-883.

Screening shall be in accordance wit h Method 5004 of Mil-Std-883. Burn-in test Method 1015:

1. Test Condition, A, B, C, or D.

2. TA = +125°C minimum.

3. Interim and final electrical test requirements shall be specified in Table 2.

Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,

C, and D inspection.

Group A inspection:

1. Tests as specified in Table 2.

2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.

Group C and D inspections:

a. End-point electrical parameters shall be specified in Table 1.

b. Steady-state life te st, Method 1005 of Mil-Std -883:

1. Test condition A, B, C, D.

2. TA = +125°C, minimum.

3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.

TABLE 2. ELECTRICAL TEST REQUIR EMENTS

Mil-Std-883 Test Requirements Subgroups

per Method 5005, Table 1

Interim Electric Parameters

Method 5004 1

Final Electrical Parameters

Method 5005 1*, 2, 3, 4**, 9, 10, 11***

Group A Test Requirements

Method 5005 1, 2, 3, 4**, 9, 10, 11***

Group C and D End-Point Electrical Parameters

Method 5005 1

* PDA applies to Subgroup 1 only.

** Subgroup 4, Capacitance tests are performed at initial qual and upon redesign.

Sample size will be 116 units.

*** Subgroups 10 and 11 if not tested, are guaranteed to the limits specified in Table 1.

---------------------------- Electrical Characteristics of MX7824/883B 19-1036 Rev. C

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