Never stop thinking.
HYS72D32500GR–[7F/7/8]–B
HYS72D64500GR–[7F/7/8]–B
HYS72D1285[20/21]GR–[7F/7]–B
HYS72D128521GR–8–B
Registered DDR SDRAM-Modules
DDR SDRAM
Data Sheet, Rev. 1.03, Jan. 2004
Memory Products
Edition 2004-01
Published by Infineon Technologies AG,
St.-Martin-Strasse 53,
81669 München, Germany
© Infineon Technologies AG 2004.
All Rights Reserved.
Attentio n please!
The information herein is given to describe certain components and shall not be considered as a guarantee of
characteristics.
Terms of delivery and rights to technical change reserved.
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding
circuits, descriptions and charts stated herein.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in
question please contact your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express written
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure
of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support
devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain
and/or protect human life . If they fail, it is reasonable to assume that the health of the user or other persons may
be endangered.
Edition 2 004- 01
Published by Infineon Technologies AG,
St.-Ma rtin -St ra sse 53,
81669 München, Germany
© Infineon Technologies AG 2004.
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as a guarantee of
characteristics.
Terms of delivery and rights to technical change reserved.
W e hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding
circuits, descriptions and charts stated herein.
Infineon Technologies is an approved CECC manufacturer.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies Office in Germany or our Infineon Technologies Representatives worldwide
(www.infineon.com).
Warnings
Due to technical requirements components ma y contain dangerous substances. F or inf ormation on the types in
question please contact your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express written
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the
failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life
support devices or systems are intended to be implanted in the human body, or to support and/or maintain and
sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other
persons may be endangered.
HYS72D32500GR–[7F/7/8]–B
HYS72D64500GR–[7F/7/8]–B
HYS72D1285[20/21]GR–[7F/7]–B
HYS72D128521GR–8–B
Registered DDR SDRAM-Modules
DDR SDRAM
Data Sheet, Rev. 1.03, Jan. 2004
Memory Products
Never stop thinking.
Data Sheet, Rev. 1.03, Jan. 2004
Memory Products
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Data Sheet 4 Rev. 1.03 2004-01
HYS72D32500GR–[7F/7/8]–B, HYS72D64500GR–[7F/7/8]–B, HYS72D1285[20/21]GR–[7F/7]–B
Revision History: Rev. 1.03 2004-01
Previous Version: V.092
Page Subjects (major changes since last revision)
all Editorial changes
We Listen to Your Comments
Any information within this document that you feel is wrong, unclear or missing at all?
Your feedback will help us to continuously improve the quality of this document.
Please send your proposal (including a reference to this document) to:
techdoc.mp@infineon.com
Data Sheet 5 Rev. 1.03, 2004-01
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
1Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1.1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
1.2 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2 Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.1 Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.2 Current Specification and Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
3.3 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
4 SPD Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
5 Package Outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
6 Application Note . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Table of Contents
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Overview
Data Sheet 6 Rev. 1.03 2004-01
1 Overview
1.1 Features
184-Pin Registered 8-Byte Dual-In-Line
DDR SDRAM Module for “1U” PC, Workstation and Server main memory applications
One rank 32M ×72, 64M × 72 and two ranks 128M ×72 organization
JEDEC standard Double Data Rate Synchronous DRAMs (DDR SDRAM) with a single + 2.5 V (±0.2 V) power
supply
Built with DDR SDRAMs in 66-Lead TSOPII package
Programm abl e CAS Latency, Burst Length, and Wrap Sequence (Sequential & Interleave)
Auto Refresh (CBR) and Self Refresh
All inputs and outputs SSTL_2 compatible
Re-drive for all input signals using register and PLL devices.
Seria l Presence Detect with E2PROM
Low Profile Modules form factor:
133.35 mm × 30,48 mm (1.2”) × 4.00 mm
(6,80 mm with stacked components)
Based on JEDEC standard reference card layouts Raw Card L,M,N
Gold plated contacts
1.2 Description
The HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B are low profile versions of the standard Registered DIMM
modules with 1.2” inch (30,48 mm) height for 1U Server Applications. The Low Profile DIMM versions are available
as 32M × 72 (256MB), 64M × 72 (512MB) and 128M × 72 (1 GB).
The memory array is designed with Double Data Rate Synchronous DRAMs for ECC applications. All control and
address signals are re-driven on the DIMM using register devices and a PLL for the clock distribution. This reduces
capacitive loading to the system bus, but adds one cycle to the SDRAM timing. A variety of decoupling capacitors
are mounted on the PC board. The DIMMs feature serial presence detect based on a serial E2PROM device using
the 2-pin I2C protocol. The first 128 bytes are programmed with configuration data and the second 128 bytes are
available to the customer.
Table 1 Performance
Part Number Speed Code –7F –7 –8 Unit
Module Speed Grade DDR266F DDR266A DDR200A
Component Module PC2 100 PC2100 PC1600
max. Clo ck
Frequency @ CL = 2.5 fCK 143 143 125 MHz
@ CL = 2 fCK 133 133 100 MHz
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Overview
Data Sheet 7 Rev. 1.03 2004-01
Note:All “product type” end with a place code designating the silicon-die revision. Reference information available
on request. Example: HYS72D32500GR-7-B, indicating rev. C dies are used for SDRAM components. The
“compliance code” is printed on the module labe ls describing the speed so rt (for example “PC2100”), the
latencies and SPD code definition (for example “20330” means CAS latency of 2.0 clocks, RCD1) latency of
3 clocks, Row Precharge latency of 3 clocks, and JEDEC SPD code definiton version 0), and the Raw Card
used for this module.
Table 2 Ordering Information
Product Type Compliance Code Description SDRAM
Technology
PC2100 (CL = 2):
HYS72D32500GR-7F-B PC2100R-20220-L one rank 256 MB Registered DIMM 256 Mbit (x8)
HYS72D32500GR-7-B PC2100R-20330-L one rank 256 MB Registered DIMM 256 Mbit (x8)
HYS72D64500GR-7F-B PC2100R-20220-M one rank 512 MB Registered DIMM 256 Mbit (x4)
HYS72D64500GR-7-B PC2100R-20330-M one rank 512 MB Registered DIMM 256 Mbit (x4)
HYS72D128520GR-7F-B PC2100R-20220-N two ranks 1 GByte Registered DIMM 256 MBit (x4)
(stacked with
soldering process)
HYS72D128520GR-7-B PC2100R-20330-N two ranks 1 GByte Registered DIMM 256 MBit (x4)
(stacked with
soldering process)
HYS72D128521GR-7F-B PC2100R-20220-N two ranks 1 GByte Registered DIMM 256 MBit (x4)
(stacked with laser
welding process)
HYS72D128521GR-7-B PC2100R-20330-N two ranks 1 GByte Registered DIMM 256 MBit (x4)
(stacked with laser
welding process)
PC1600 (CL = 2):
HYS72D32500GR-8-B PC1600R-20220-L one rank 256 MB Registered DIMM 256 Mbit (x8)
HYS72D64500GR-8-B PC1600R-20220-M one rank 512 MB Registered DIMM 256 Mbit (x4)
HYS72D128521GR-8-B PC1600R-20220-M two ranks 1GByte Registered DIMM 256Mbit (x4)
(stacked with laser
welding process)
1) RCD: Row-Column-Delay
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Pin Configuration
Data Sheet 8 Rev. 1.03 2004-01
2 Pin Configuration
*) for detailed description of the Power Up and Power Management on DDR Registered DIMMs see the Application Note at the
end of this datasheet
Table 3 Pin Definitions and Functions
Symbol Type Function
A0 A11, A12 Input Address Inputs (A12 for 256 MB & 512 MB based modules)
BA0, BA1 Input Bank Selects
DQ0 DQ63 Input/Output Data Input/Output
CB0 CB7 Input/Output Check Bits (×72 organizati on only )
RAS Input Row Address Strobe
CAS Input Column Address Strobe
WE Input Read/Write Input
CKE0, CKE1 Input Clock Enable
DQS0 DQS8 Input/Output SDRAM low data strobes
CK0, CK0 Input Differential Clock Input
DM0 DM8 Input SDRAM low data mask
DQS9 DQS17 Input/Output high data strobes
CS0, CS1 Input Chip Selects
VDD Supply Power (+2.5 V)
VSS Supply Ground
VDDQ Supply I/O Driver power supply
VDDID Output VDD Indentification flag
VDDSPD Supply EEPROM power supply
VREF Supply I/O reference supply
SCL Input Serial bus clock
SDA Output Serial bus data line
SA0 SA2 Input slave add re ss sele ct
NC Input no connect
DU Input don’t use
RESET Input Reset pin (forces register inputs low) *)
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Pin Configuration
Data Sheet 9 Rev. 1.03 2004-01
Table 4 Address Format
Density Organization Memory
Ranks SDRAMs # of
SDRAMs # of
row/rank/
columns
bits
Refresh Period Interval
256 MB 32M x 72 1 256Mbit
32M ×89 13 / 2 / 10 8K 64 ms 7.8 µs
512 MB 64M ×72 1 256Mbit
64M ×418 13 / 2 / 11 8K 64 ms 7.8 µs
1GB 128M×72 2 256Mbit
64M ×436 (stacked) 13 / 2 / 11 8K 64 ms 7.8 µs
Table 5 Pin Configuration
PIN# Symbol PIN# Symbol PIN# Symbol PIN# Symbol
1VREF 48 A0 94 DQ4 141 A10
2 DQ0 49 CB2 95 DQ5 142 CB6
3VSS 50 VSS 96 VDDQ 143 VDDQ
4 DQ1 51 CB3 97 DM0/DQS9 144 CB7
5 DQ0 52 BA1 98 DQ6 KEY
6DQ2 KEY 99 DQ7 145 VSS
7VDD 53 DQ32 100 VSS 146 DQ36
8DQ3 54
VDDQ 101 NC 147 DQ37
9 NC 55 DQ33 102 NC 148 VDD
10 RESET 56 DQS4 103 NC 149 DM4/DQS13
11 VSS 57 DQ34 104 VDDQ 150 DQ38
12 DQ8 58 VSS 105 DQ12 151 DQ39
13 DQ9 59 BA0 106 DQ13 152 VSS
14 DQS1 60 DQ35 107 DM1/DQS10 153 DQ44
15 VDDQ 61 DQ40 108 VDD 154 RAS
16 DU 62 VDDQ 109 DQ14 155 DQ45
17 DU 63 WE 110 DQ15 156 VDDQ
18 VSS 64 DQ41 111 CKE1 157 CS0
19 DQ10 65 CAS 112 VDDQ 158 CS1
20 DQ11 66 VSS 113 NC 159 DM5/DQS14
21 CKE0 67 DQS5 114 DQ20 160 VSS
22 VDDQ 68 DQ42 115 NC / A12 161 DQ46
23 DQ16 69 DQ43 116 VSS 162 DQ47
24 DQ17 70 VDD 117 DQ21 163 NC
25 DQS2 71 NC 118 A11 164 VDDQ
26 VSS 72 DQ48 119 DM2/DQS11 165 DQ52
27 A9 73 DQ49 120 VDD 166 DQ53
28 DQ18 74 VSS 121 DQ22 167 NC
29 A7 75 DU 122 A8 168 VDD
30 VDDQ 76 DU 123 DQ23 169 DM6/DQS15
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Pin Configuration
Data Sheet 10 Rev. 1.03 2004-01
Note:A12 is used for 256Mbit and 512Mbit based modules only
31 DQ19 77 VDDQ 124 VSS 170 DQ54
32 A5 78 DQS6 125 A6 171 DQ55
33 DQ24 79 DQ50 126 DQ28 172 VDDQ
34 VSS 80 DQ51 127 DQ29 173 NC
35 DQ25 81 VSS 128 VDDQ 174 DQ60
36 DQS3 82 VDDID 129 DM3/DQS12 175 DQ61
37 A4 83 DQ56 130 A3 176 VSS
38 VDD 84 DQ57 131 DQ30 177 DM7/DQS16
39 DQ26 85 VDD 132 VSS 178 DQ62
40 DQ27 86 DQS7 133 DQ31 179 DQ63
41 A2 87 DQ58 134 CB4 180 VDDQ
42 VSS 88 DQ59 135 CB5 181 SA0
43 A1 89 VSS 136 VDDQ 182 SA1
44 CB0 90 NC 137 CK0 183 SA2
45 CB1 91 SDA 138 CK0 184 VDDSPD
46 VDD 92 SCL 139 VSS ––
47 DQS8 93 VSS 140 DM8/DQS17
Table 5 Pin Configuration (cont’d)
PIN# Symbol PIN# Symbol PIN# Symbol PIN# Symbol
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Pin Configuration
Data Sheet 11 Rev. 1.03 2004-01
Figure 1 Block Diagram: One Rank 32M ×72 DDR SDRAM DIMM Module (×8 components)
HYS72D32500GR on Raw Card L
PCK
PCK
DQ4
DQ5
DQ6
DQ7
DQ0
DQ1
DQ2
DQ3
DM
I/O 0
I/O 1
I/O 2
I/O 3
D0
I/O 4
I/O 5
I/O 6
I/O 7
DQ12
DQ13
DQ14
DQ8
DQ9
DQ10
DQ11
DM
D1
DQ20
DQ21
DQ22
DQ23
DQ16
DQ17
DQ18
DQ19
DM
D2
DQ28
DQ29
DQ30
DQ31
DQ24
DQ25
DQ26
DQ27
DM
D3
DQ36
DQ37
DQ38
DQ39
DQ32
DQ33
DQ34
DQ35
DM
D4
DQ44
DQ45
DQ46
DQ47
DQ40
DQ41
DQ42
DQ43
DM
D5
DQ52
DQ53
DQ54
DQ55
DQ48
DQ49
DQ50
DQ51
DM
D6
DQ60
DQ61
DQ62
DQ63
DQ56
DQ57
DQ58
DQ59
DM
D7
RS0
SS
SS
S
S
S
S
DQS0
DQS
DQS4
DQS1 DQS5
DQS
DQS2
DQS
DQS3
DQS
DQS6
DQS7
DQ15
CB4
CB5
CB6
CB7
CB0
CB1
CB2
CB3
DM
D8
S
DQS8
DQS
DQS
DQS
DQS
DQS
VDD
VSS
D0-D8
D0-D8
VDDQ D0- D8
D0-D8
VREF
Notes:
1. DQ-to-I/O wiring may be changed within a byte.
2. DQ/DQS/DM/CKE/S relationships must be main-
tained as shown.
3. DQ/DQS resistors should be 22 Ohms.
4. VDDID strap connections (for memory device VDD,
V
DDQ
):
STRAP OUT (OPEN): VDD = VDDQ
STRAP IN (VSS): VDD VDDQ.
5. SDRAM placement alternates between the back
and front sides of the DIMM.
6. Address and control resistors should be 22 Ohms.
7. A13 is not wired for raw card A.
VDDID Strap: see Note 4
CK0, CK0 --------- PLL*
* Wire per Clock Loading Table/Wiring Diagrams
S0 RS0 -> CS: SDRAMs D0-D8
BA0-BA1 RBA0-RBA1 -> BA0-BA1: SDRAMs D0-D8
A0-An7RA0-RAn7 -> A0-An7: SDRAMs D0-D8
RAS RRAS -> RAS: SDRAMs D0-D8
CAS RCAS -> CAS: SDRAMs D0-D8
CKE0 RCKE0 -> CKE: SDRAMs D0- D8
WE RWE -> WE: SDRAMs D0-D8
R
E
G
I
S
T
E
R
RESET
DM4/DQS13
DM0/DQS9
DM5/DQS14
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
DM1/DQS10
DM2/DQS11 DM6/DQS15
DM3/DQS12 DM7/DQS16
DM8/DQS17
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
VDDSPD Serial PD
A0
Serial PD
A1 A2
SA0 SA1 SA2
SDA
SCL
WP
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Pin Configuration
Data Sheet 12 Rev. 1.03 2004-01
Figure 2 Block Diagram: One Rank 64M ×72 DDR SDRAM DIMM Module (×4 components)
HYS72D64500GR on Raw Card M
RS0
DQS4
DQS6
DQS2
DQ0
DQ1
DQ2
DQ3
DQ8
DQ9
DQ10
DQ11
DQ16
DQ17
DQ18
DQ19
DQ24
DQ25
DQ26
DQ27
DQ32
DQ33
DQ34
DQ35
DQ40
DQ41
DQ42
DQ43
DQ56
DQ57
DQ58
DQ59
DQS
D0
DQS
DQS
DQS
DQS
DQS
DQS
DQS0
D1
D2
D3
D4
D5
D7
DQ48
DQ49
DQ50
DQ51
DQS
D6
DQ4
DQ5
DQ6
DQ7
DQ12
DQ13
DQ14
DQ15
DQ20
DQ21
DQ22
DQ23
DQ28
DQ29
DQ30
DQ31
DQ36
DQ37
DQ38
DQ39
DQ44
DQ45
DQ46
DQ47
DQ60
DQ61
DQ62
DQ63
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D9
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS9
D10
D11
D12
D13
D14
D16
DQ52
DQ53
DQ54
DQ55
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D15
CB0
CB1
CB2
CB3
DQS
D8
CB4
CB5
CB6
CB7
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D17
SS
SS
SS
SS
SS
SS
SS
SS
SS
VSS
DQS1
DQS3
DQS8
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DQS5
DQS7
DQS15
DQS14
DQS13
DQS10
DQS11
DQS12
DQS16
DQS17
Notes:
1. DQ-to-I/O wiring may be changed
within a byte.
2. DQ/DQS/CKE/S relationships
must be maintained as shown.
3. DQ/DQS resistors should be 22
Ohms.
4. VDDID strap connections
(for memory device VDD, VDDQ):
STRAP OUT (OPEN): VDD = VDDQ
STRAP IN (VSS): VDD VDDQ.
5. Address and control resistors
should be 22 Ohms.
6. A13 is not wired for raw card B.
VDD
VSS
D0-D17
D0-D17
VDDQ D0-D17
D0-D17
VREF
VDDID Strap: see Note 4
CK0, CK0 --------- PLL*
* Wire per Clock Loading Table/Wiring Diagrams
BA0-BA1 RBA0-RBA1 -> BA0-BA1: SDRAMs D0-D17
A0-An6RA0-RAn6 -> A0-An6: SDRAMs D0-D17
RAS RRAS -> RAS: SDRAMs D0-D17
S0 RS0 -> CS : SDRAMs D0-D17
CAS RCAS -> CAS: SDRAMs D0-D17
CKE0 RCKE0A -> CKE: SDRAMs D0-D17
WE RWE -> WE: SDRAMs D0-D17
R
E
G
I
S
T
E
R
PCK
PCK RESET
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
V
DDSPD
Serial PD
A0
Serial PD
A1 A2
SA0 SA1 SA2
SDA
SCL
WP
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Pin Configuration
Data Sheet 13 Rev. 1.03 2004-01
Figure 3 Block Diagram: Two Ranks 128M ×72 DDR SDRAM DIMM Modules (×4 components)
HYS72D128520GR on Raw Card N
PCK
PCK
RS0
DQS4
DQS6
DQS2
DQ0
DQ1
DQ2
DQ3
DQ8
DQ9
DQ10
DQ11
DQ16
DQ17
DQ18
DQ19
DQ24
DQ25
DQ26
DQ27
DQ32
DQ33
DQ34
DQ35
DQ40
DQ41
DQ42
DQ43
DQ56
DQ57
DQ58
DQ59
DQS
D0
DQS
DQS
DQS
DQS
DQS
DQS
DQS0
D1
D2
D3
D4
D5
D7
DQ48
DQ49
DQ50
DQ51
DQS
D6
DQ4
DQ5
DQ6
DQ7
DQ12
DQ13
DQ14
DQ15
DQ20
DQ21
DQ22
DQ23
DQ28
DQ29
DQ30
DQ31
DQ36
DQ37
DQ38
DQ39
DQ44
DQ45
DQ46
DQ47
DQ60
DQ61
DQ62
DQ63
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D9
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DM0/DQS9
D10
D11
D12
D13
D14
D16
DQ52
DQ53
DQ54
DQ55
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D15
CK0, CK0 --------- PLL*
SS
SS
SS
SS
SS
S S
SS
SS
S1 RS1 -> S : SDRAMs D18-D35
BA0-BA1 RBA0-RBA1 -> BA0-BA1: SDRAMs D0-D35
A0-A13 RA0-RA13 -> A0-A13: SDRAMs D0- D35
RAS RRAS -> RAS: SDRAMs D0-D35
S0 RSO -> S : SDRAMs D0-D17
VSS
DQS1
DQS3
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DM
DQS5
DQS7
DM6/DQS15
DM5/DQS14
DM4/DQS13
DM1/DQS10
DM2/DQS11
DM3/DQS12
DM7/DQS16
* Wire per Clock Loading Table/Wiring Diagrams
VDD
VSS
D0-D35
D0-D35
VDDQ D0-D35
D0-D35
VREF
RS1
Notes:
1. DQ-to-I/O wiring may be changed within a byte.
2. DQ/DQS/DM/CKE/S relationships must be maintained as shown.
3. DQ/DQS resistors should be 22 Ohms.
4. VDDID strap connections (for memory device VDD, VDDQ):
STRAP OUT (OPEN): VDD = VDDQ
STRAP IN (VSS): VDD VDDQ.
5. Address and control resistors should be 22 Ohms.
6. Each Chip Select and CKE pair alternate between decks for ther-
mal enhancement.
VDDID Strap: see Note 4
CAS RCAS -> CAS: SDRAMs D0-D35
CKE0 RCKE0 -> CKE: SDRAMs D0-D17
WE RWE -> WE: SDRAMs D0-D35
R
E
G
I
S
T
E
R
DQS
I/O 3
I/O 2
I/O 1
I/O 0
D18
DQS
DQS
DQS
DQS
DQS
DQS
D19
D20
D21
D22
D23
D25
S
S
S
S
S
S
S
DM
DM
DM
DM
DM
DM
DM
DM
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D27
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D28
D29
D30
D31
D32
D34
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D33
S
S
S
S
S
S
S
S
DM
DM
DM
DM
DM
DM
DM
DM
CB0
CB1
CB2
CB3
DQS
D8
SDM
DQS8
DQS
D26
SDM
CB4
CB5
CB6
CB7
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D17
SDM
DM8/DQS17
DQS
I/O 0
I/O 1
I/O 2
I/O 3
D35
SDM
RESET
CKE1 RCKE1 -> CKE: SDRAMs D18-D35
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
I/O 0
I/O 1
I/O 2
I/O 3
V
DDSPD
Serial PD
A0
Serial PD
A1 A2
SA0 SA1 SA2
SDA
SCL
WP
S
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Electrical Characteristics
Data Sheet 14 Rev. 1.03 2004-01
3 Electrical Characteristics
3.1 Operating Conditions
Attention: Permanent device damage may occur if “Absolute Maximum Ratings” are exceeded. Functional
operation should be restri cted to recommended opera tion conditions. Exposure to high er than
recommended voltage for extended periods of time affect device reliability
Note:
1. Under all conditions, VDDQ must be less than or equal to VDD
2. Peak to peak AC noise on VREF may not exceed ± 2% VREF (DC).
VREF is also expected to track no i se variations in VDDQ.
3. VTT of the transmitting device must track VREF of the receiving device
.
Note:
1. The relationship between the VDDQ of the driving device and the VREF of the receiving device is what determines
noise mar gins. Howe ver, in the cas e of VIH (max.) (input overdrive), it is the VDDQ of the recei v ing dev ice tha t is
referenced. In the case where a device is implemented such that it supports SSTL_2 inputs but has no SSTL_2
outputs (such as a translator), and therefore no VDDQ supply voltage connection, inputs must tolerate input
overdrive to 3.0 V (High corner VDDQ + 300 mV).
2. For any pin under test input of 0 V
VIN
VDDQ + 0.3 V. Values are shown per DDR-SDRAM component
Table 6 Absolute Maximum Ratings
Parameter Symbol Values Unit
min. max.
Input/Output voltage relative to VSS VIN, VOUT –0.5 3.6 V
Power supply voltage on VDD/VDDQ to VSS VDD, VDDQ –0.5 3.6 V
Storage temperature range TSTG –55 +150 oC
Power dissipation (per SDRAM component) PD–1W
Data out current (short circuit) IOS –50mA
Table 7 Supply Voltage Levels
Parameter Symbol Values Unit/
Notes
min. nom. max.
Device Supply Voltage VDD 2.3 2.5 2.7 V
Output Supply Voltage VDDQ 2.3 2.5 2.7 V 1)
Input Reference Voltage VREF 0.49 ×VDDQ 0.5 ×VDDQ 0.51 ×VDDQ V 2)
Termination Voltage VTT VREF –0.04 VREF VREF + 0.04 V 3)
EEPROM supply voltage VDDSPD 2.3 2.5 3.6 V
Table 8 DC Operating Conditions (SSTL_2 Inputs)
(VDDQ =2.5V, TA=70°C, Voltage Referenced to VSS)
Parameter Symbol Values Unit/
Notes
min. max.
DC Input Logic High VIH, (DC) VREF +0.15 VDDQ +0.3 V 1)
DC Input Logic Low VIL, (DC) –0.30 VREF 0.15 V
Input Leakage Current IIL –5 5 µA 1)
Output Leakage Current IOL –5 5 µA 2)
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Electrical Characteristics
Data Sheet 15 Rev. 1.03 2004-01
3.2 Current Specification and Conditions
Table 9 IDD Conditions
Parameter Symbol
Operating Current 0
one bank; active/ precharge; DQ, DM, and DQS inputs changing once per clock cycle;
address and control inputs changing once every two clock cycles.
IDD0
Operating Current 1
one bank; active/read/precharge; Burst Length = 4; see component data sheet. IDD1
Precharge Power-Down Standby Current
all banks idle; power-down mode; CKE VIL,MAX
IDD2P
Precharge Floating Standby Current
CS VIH,,MIN, all banks idle; CKE VIH,MIN;
address and other control inputs changing once per clock cycle; VIN = VREF for DQ, DQS and DM.
IDD2F
Precharge Quiet Standby Current
CS VIHMIN, all banks idle; CKE VIH,MIN; VIN = VREF for DQ, DQS and DM;
address and other control inputs stable at VIH,MIN or VIL,MAX.
IDD2Q
Active Power-Down Standby Current
one bank active; power-down mode; CKE VILMAX; VIN = VREF for DQ, DQS and DM. IDD3P
Act ive Standby Current
one bank active; CS VIH,MIN; CKE VIH,MIN; tRC =tRAS,MAX;
DQ, DM and DQS inputs changing twice per clock cycle;
address and control inputs changing once per clock cycle.
IDD3N
Operati ng Curre n t Read
one bank active; Burst Length = 2; reads; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B; IOUT =0mA
IDD4R
Operating Current Write
one bank active; Burst Length = 2; writes; continuous burst;
address and control inputs changing once per clock cycle;
50% of data outputs changing on every clock edge;
CL = 2 for DDR266(A), CL = 3 for DDR333 and DDR400B
IDD4W
Auto-Re fres h Curre n t
tRC = tRFCMIN, burst refresh IDD5
Self-Refresh Current
CKE 0.2 V; external clock on IDD6
Operating Current 7
four bank interleaving with Burst Length = 4; see component data sheet. IDD7
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Electrical Characteristics
Data Sheet 16 Rev. 1.03 2004-01
Table 10 IDD Specifications –7F/–7
Product Type & Orga nisation
HYS72D32500GR–7F–B
HYS72D64500GR–7F–B
HYS72D128521GR–7F–B
HYS72D128520GR–7F–B
HYS72D32500GR–7–B
HYS72D64500GR–7–B
HYS72D128520GR–7–B
HYS72D128521GR–7–B
Unit Note/ Test
Conditions5)
256 MB 512 MB 1 GByte 1 GByte 256 MB 512 MB 1 GByte 1 GByte
×72 ×72 ×72 ×72 ×72 ×72 ×72 ×72
1 Rank 1 Rank 2 Ranks 2 Ranks 1 Rank 1 Rank 2 Ranks 2 Ranks
7F 7F 7F 7F 7777
max. max. max. max. max. max. max. max.
IDD0 990 1980 2970 2970 900 1800 2790 2790 mA 1)4)
1) The module IDD values are calculated from the component IDD datasheet values are:
n*IDD×[component] for single bank modules (n: number of components per module bank)
n*IDD×[component] + n*IDD3N[component] for two bank modules (n: number of components per module bank)
IDD1 1080 2160 3150 3150 990 1980 2970 2970 mA 1)3)4)
IDD2P 72 144 288 288 72 144 288 288 mA 2)4)
2) The module IDD values are calculated from the component IDD datasheet values are:
n*IDD×[component] for single bank modules (n: number of components per module bank)
2*n*IDD×[component] for single two bank modules (n: number of components per module bank)
IDD2F 360 720 1440 1440 360 720 1440 1440 mA 2)4)
IDD2Q 225 450 900 900 225 450 900 900 mA 2)4)
IDD3P 162 324 648 648 162 324 648 648 mA 2)4)
IDD3N 495 990 1980 1980 495 990 1980 1980 mA 2)4)
IDD4R 1035 2070 3060 3060 1035 2070 3060 3060 mA 1)3)4)
3) DQ I/O (IDDQ) currents are not in cluded into c alculations : module IDD values will be mea sured differen tly depending on load
conditions
IDD4W 1125 2250 3240 3240 1125 2250 3240 3240 mA 1)4)
IDD5 1620 3240 4230 4230 1620 3240 4230 4230 mA 1)4)
4) DRAM component currents only: module IDD will be measured differently depending upon register and PLL operation
currents
IDD6 23 45 90 90 23 45 90 90 mA 2)4)
IDD7 2025 4050 5040 5040 2025 4050 5040 5040 mA 1)3)4)5)
5) Test condition for maximum values: VDD =2.7V, TA=1C
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Electrical Characteristics
Data Sheet 17 Rev. 1.03 2004-01
Table 11 IDD Specifications –8
Product Type & Orga nisation
HYS72D32500GR–8–B
HYS72D64500GR–8–B
HYS72D128521GR–8–B
Unit Not e/ Test
Conditions5)
256 MB 512 MB 1 GByte
×72 ×72 ×72
1 Rank 1 Rank 2 Ranks
888
max. max. max.
IDD0 810 1620 2430 mA 1)4)
1) The module IDD values are calculated from the component IDD datasheet values are:
n*IDD×[component] for single bank modules (n: number of components per module bank)
n*IDD×[component] + n*IDD3N[component] for two bank modules (n: number of components per module bank)
IDD1 900 1800 2610 mA 1)3)4)
IDD2P 63 126 252 mA 2)4)
2) The module IDD values are calculated from the component IDD datasheet values are:
n*IDD×[component] for single bank modules (n: number of components per module bank)
2*n*IDD×[component] for single two bank modules (n: number of components per module bank)
IDD2F 315 630 1260 mA 2)4)
IDD2Q 198 396 792 mA 2)4)
IDD3P 144 288 576 mA 2)4)
IDD3N 405 810 1620 mA 2)4)
IDD4R 855 1710 2520 mA 1)3)4)
3) DQ I/O (IDDQ) currents ar e not includ ed into calculatio ns: module IDD va lues will be measu red different ly depending on load
conditions
IDD4W 945 1890 2700 mA 1)4)
IDD5 1530 3060 3870 mA 1)4)
4) DRAM component currents only: module IDD will be measured differently depending upon register and PLL operation
currents
IDD6 22,5 45 90 mA 2)4)
IDD7 1890 3780 4590 mA 1)3)4)5)
5) Test condition for maximum values: VDD =2.7V, TA=1C
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Electrical Characteristics
Data Sheet 18 Rev. 1.03 2004-01
3.3 AC Characteristics
Table 12 AC Timing - Absolute Specifications –8/–7/-7F
Parameter Symbol –8 –7 –7F Unit Note/
Test
Condition 1)
DDR200 DDR266A DDR266F
Min. Max. Min. Max. Min. Max.
DQ output access time from
CK/CK tAC –0.8 +0.8 –0.75 +0.75
0.75 +0.75 ns 2)3)4)5)
DQS output access time from
CK/CK tDQSCK –0.8 +0.8 –0.75 +0.75
0.75 +0.75 ns 2)3)4)5)
CK high-level width tCH 0.45 0.55 0.45 0.55 0.45 0.55 tCK 2)3)4)5)
CK low-level width tCL 0.45 0.55 0.45 0.55 0.45 0.55 tCK 2)3)4)5)
Clock Half Period tHP min. (tCL, tCH)min. (tCL, tCH)min. (tCL, tCH)ns 2)3)4)5)
Clock cycle t ime tCK2.5 8 12 7 12 7 12 ns CL = 2.5 2)3)4)5)
tCK2 10 12 7.5 12 7.5 12 ns CL = 2.0 2)3)4)5)
DQ and DM input hold time tDH 0.6 0.5 0.5 ns 2)3)4)5)
DQ and DM input setup time tDS 0.6 0.5 0.5 ns 2)3)4)5)
Control and Ad dr . input pul se
width (each input ) tIPW 2.5 2.2 2.2 ns 2)3)4)5)6)
DQ and DM input pulse width
(each input) tDIPW 2.0 1.75 1.75 ns 2)3)4)5)6)
Data-out hig h- impeda nc e time
from CK/CK tHZ –0.8 +0.8 –0.75 +0.75
0.75 +0.75 ns 2)3)4)5)7)
Data-out low- impe dance time
from CK/CK tLZ –0.8 +0.8 –0.75 +0.75
0.75 +0.75 ns 2)3)4)5)7)
Write command to 1st DQS
latching transition tDQSS 0.75 1.25 0.75 1.25 0.75 1.25 tCK 2)3)4)5)
DQS-DQ skew (DQS and
associated DQ signals) tDQSQ —+0.6 +0.5 +0.5 ns2)3)4)5)
ns
Data hold skew factor tQHS 1.0 0.75 0.75 ns 2)3)4)5)
ns
DQ/DQS output hold time tQH tHP
tQHS
tHP
tQHS
tHP
tQHS
—ns
2)3)4)5)
DQS input low (high) pulse
width (write cycle) tDQSL,H 0.35 0.35 0.35 tCK 2)3)4)5)
DQS falling edge to CK setup
time (write cycle) tDSS 0.2 0.2 0.2 tCK 2)3)4)5)
DQS falling edge hold time from
CK (write cycle) tDSH 0.2 0.2 0.2 tCK 2)3)4)5)
Mode register set command
cycl e time tMRD 2— 2 2 tCK 2)3)4)5)
Write preamble setup time tWPRES 0— 0 0 ns
2)3)4)5)8)
Write postamble tWPST 0.40 0.60 0.40 0.60 0.40 0.60 tCK 2)3)4)5)9)
Write pr eamble tWPRE 0.25 0.25 0.25 tCK 2)3)4)5)
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Electrical Characteristics
Data Sheet 19 Rev. 1.03 2004-01
Address and control input setup
time tIS 1.1 0.9 0.9 ns fast slew rate
3)4)5)6)10)
1.1 1.0 1.0 ns slow slew rate
3)4)5)6)10)
Address and control input hold
time tIH 1.1 0.9 0.9 ns fast slew rate
3)4)5)6)10)
1.1 1.0 1.0 ns slow slew rate
3)4)5)6)10)
Read preamble tRPRE 0.9 1.1 0.9 1.1 0.9 1.1 tCK CL > 1.5 2)3)4)5)
Read preamble setup time tRPRES 1.5 NA NA tCK 2)3)4)5)11)
Read postamble tRPST 0.40 0.60 0.40 0.60 0.40 0.60 ns 2)3)4)5)
Active to Precharge command tRAS 50 120E+3 45 120E+3 45 120E+3 tCK 2)3)4)5)
Active to Active/Auto-refresh
command period tRC 70 65 65 ns 2)3)4)5)
Auto-refresh to Active/Auto-
refresh command period tRFC 80 75 75 ns 2)3)4)5)
Active to Read or Write delay tRCD 20 20 20 ns 2)3)4)5)
Precharge command period tRP 20 20 20 ns 2)3)4)5)
Active to Autoprecharge delay tRAP 20 20 20 ns 2)3)4)5)
Active bank A to Active bank B
command tRRD 15 15 15 ns 2)3)4)5)
Write recovery time tWR 15 15 15 ns 2)3)4)5)
Auto precharge write recovery +
precharge time tDAL (twr/tCK) + (trp/tCK)tCK 2)3)4)5)12)
Internal write to read command
delay tWTR 1— 1 1 tCK CL > 1.5 2)3)4)5)
Exit self-refresh to non-read
command tXSNR 80 75 75 ns 2)3)4)5)
Exit self-refresh to read
command tXSRD 200 200 200 tCK 2)3)4)5)
Average Periodic Refresh
Interval tREFI 7.8 7.8 7.8 µs2)3)4)5)13)
1) 0 °C TA 70 °C; VDDQ = 2.5 V ± 0.2 V, VDD = +2.5 V ± 0.2 V
2) Input slew rate 1 V/ns for DDR266a, DDR266F and = 1 V/ns for DDR200
3) The CK/CK input re ferenc e level (for t iming refere nce t o CK/ CK) is the po int a t whic h CK and CK c ross: the i nput r eferenc e
level for signals other than CK/CK, is VREF. CK/CK slew rate are 1.0 V/ns.
4) Inputs are not recognized as valid until VREF stabilizes.
5) The Output tim ing reference le vel, as measured at the timing referenc e point indica ted in AC Characteris tics (note 3) is VTT.
6) These parameters guarantee device timing, but they are not necessarily tested on each device.
7) tHZ and tLZ transitions occ ur i n the sa me ac ces s tim e win dow s as valid dat a tran sitions . The se para me ters are n ot re ferre d
to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
Table 12 AC Timing - Absolute Specifications –8/–7/-7F
Parameter Symbol –8 –7 –7F Unit Note/
Test
Condition 1)
DDR200 DDR266A DDR266F
Min. Max. Min. Max. Min. Max.
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Electrical Characteristics
Data Sheet 20 Rev. 1.03 2004-01
8) The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before this CK edge.
A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no writes
were previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in
progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS.
9) The maximu m limit for th is paramet er is not a device limit. The de vice operates with a greater va lue for this param eter, but
system performance (bus turnaround) degrades accordingly.
10) Fast slew rate 1.0 V/ ns , slow slew rate 0.5 V/ns and < 1 V/ns for c ommand/ad dress and C K & CK s lew rate > 1.0 V/ns,
measured between VOH(ac) and VOL(ac).
11) tRPRES is defined for CL = 1.5 operation only
12) For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock
cycle time.
13) A maximum of eight Autorefresh commands can be posted to any given DDR SDRAM device.
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 21 Rev. 1.03 2004-01
4 SPD Contents
Table 13 SPD Codes for HYS72D32500GR–[7F/7/8]-B
Product Type & Organization
HYS72D32500GR–8–B
HYS72D32500GR–7–B
HYS72D32500GR–7F–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC1600R –
20220 PC2100R –
20330 PC2100R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
0 Programmed SPD Bytes in E2PROM 80 80 80
1 Total number of Bytes in E2PROM 08 08 08
2 Memory Type (DDR = 07h) 07 07 07
3 Number of Row Addresses 0D 0D 0D
4 Number of Column Addresses 0A 0A 0A
5 Number of DIMM Ranks 01 01 01
6 Data Width (LSB ) 48 48 48
7 Data Width (MSB ) 00 00 00
8 Interface Voltage Levels 04 04 04
9 tCK @ CLmax (Byte 18) [ns] 80 70 70
10 tAC SDRAM @ CLmax (Byte 18) [ns] 80 75 75
11 Error Correction Support 02 02 02
12 Refresh Rate 82 82 82
13 Primary SDRAM Width 08 08 08
14 Error Checking SDRA M Width 08 08 08
15 tCCD [cycles] 01 01 01
16 Burst Length Supported 0E 0E 0E
17 Number of Banks on SDRAM Device 04 04 04
18 CAS Latency 0C 0C 0C
19 CS Latency 01 01 01
20 Write Latency 02 02 02
21 DIMM Attributes 26 26 26
22 Component Attributes C0 C0 C0
23 tCK @ CLmax -0.5 (Byte 18) [ns] A0 75 75
24 tAC SDRAM @ CLmax -0.5 [ns] 80 75 75
25 tCK @ CLmax -1 (Byte 18) [ns] 00 00 00
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 22 Rev. 1.03 2004-01
26 tAC SDRAM @ CLmax -1 [ns] 00 00 00
27 tRPmin [ns] 50 50 3C
28 tRRDmin [ns] 3C 3C 3C
29 tRCDmin [ns] 50 50 3C
30 tRASmin [ns] 32 2D 2D
31 Module Density per Rank 40 40 40
32 tAS, tCS [ns] B0 90 90
33 tAH, TCH [ns] B0 90 90
34 tDS [ns] 60 50 50
35 tDH [ns] 60 50 50
36-40 not used 00 00 00
41 tRCmin [ns] 46 41 3C
42 tRFCmin [ns] 50 4B 4B
43 tCKmax [ns] 30 30 30
44 tDQSQmax [ns] 3C 32 32
45 tQHSmax [ns] A0 75 75
46 not used 00 00 00
47 DIMM PCB Height 00 00 00
48-61 not used 00 00 00
62 SPD Revision 00 00 00
63 Checksum of Byte 0-62 BF CA 9D
64 JEDEC ID Code of Infineon (1) C1 C1 C1
65 JEDEC ID Code of Infineon (2) 49 49 49
66 JEDEC ID Code of Infineon (3) 4E 4E 4E
67 JEDEC ID Code of Infineon (4) 46 46 46
68 JEDEC ID Code of Infineon (5) 49 49 49
69 JEDEC ID Code of Infineon (6) 4E 4E 4E
Table 13 SPD Codes for HYS72D32500GR–[7F/7/8]-B
Product Type & Organization
HYS72D32500GR–8–B
HYS72D32500GR–7–B
HYS72D32500GR–7F–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC1600R –
20220 PC2100R –
20330 PC2100R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 23 Rev. 1.03 2004-01
70 JEDEC ID Code of Infineon (7) 45 45 45
71 JEDEC ID Code of Infineon (8) 4F 4F 4F
72 Module Manufacturer Location xx xx xx
73 Part Number, Char 1 37 37 37
74 Part Number, Char 2 32 32 32
75 Part Number, Char 3 44 44 44
76 Part Number, Char 4 33 33 33
77 Part Number, Char 5 32 32 32
78 Part Number, Char 6 35 35 35
79 Part Number, Char 7 30 30 30
80 Part Number, Char 8 30 30 30
81 Part Number, Char 9 47 47 47
82 Part Number, Char 10 52 52 52
83 Part Number, Char 11 38 37 37
84 Part Number, Char 12 42 42 46
85 Part Number, Char 13 20 20 42
86 Part Number, Char 14 20 20 20
87 Part Number, Char 15 20 20 20
88 Part Number, Char 16 20 20 20
89 Part Number, Char 17 20 20 20
90 Part Number, Char 18 20 20 20
91 Module Revision Cod e xx xx xx
92 Test Program Revision Code xx xx xx
93 Module Manufacturing Date Y ear xx xx xx
94 Module Manufacturing Date W eek xx xx xx
95 Module Serial Number (1) xx xx xx
96 Module Serial Number (2) xx xx xx
Table 13 SPD Codes for HYS72D32500GR–[7F/7/8]-B
Product Type & Organization
HYS72D32500GR–8–B
HYS72D32500GR–7–B
HYS72D32500GR–7F–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC1600R –
20220 PC2100R –
20330 PC2100R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 24 Rev. 1.03 2004-01
97 Module Serial Number (3) xx xx xx
98 Module Serial Number (4) xx xx xx
99-127 not used 00 00 00
Table 14 SPD Codes for HYS72D64500GR–[7F/7/8]–B
Product Type & Organiza tion
HYS72D64500GR–7F–B
HYS72D64500GR–7–B
HYS72D64500GR–8–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC2100R –
20220 PC2100R –
20330 PC1600R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
0 Programmed SPD Bytes in E2PROM 80 80 80
1 Total number of Bytes in E2PROM 08 08 08
2 Memory Type (DDR = 07h) 07 07 07
3 Number of Row Addresses 0D 0D 0D
4 Number of Column Add ress es 0B 0B 0B
5 Number of DIMM Ranks 01 01 01
Table 13 SPD Codes for HYS72D32500GR–[7F/7/8]-B
Product Type & Organization
HYS72D32500GR–8–B
HYS72D32500GR–7–B
HYS72D32500GR–7F–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC1600R –
20220 PC2100R –
20330 PC2100R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 25 Rev. 1.03 2004-01
6 Data Width (LSB) 48 48 48
7 Data Width (MSB) 00 00 00
8 Interface Voltage Levels 04 04 04
9 tCK @ CLmax (Byte 18) [ns] 70 70 80
10 tAC SDRAM @ CLmax (Byte 18) [ns] 75 75 80
11 Error Correction Support 02 02 02
12 Refresh Rate 82 82 82
13 Primary SDRAM Width 04 04 04
14 Error Checking SDRAM Width 04 04 04
15 tCCD [cycles] 01 01 01
16 Burst Length Supported 0E 0E 0E
17 Number of Banks on SDRAM Device 04 04 04
18 CAS Latency 0C 0C 0C
19 CS Latency 01 01 01
20 Write Latency 02 02 02
21 DIMM Attributes 26 26 26
22 Component Attributes C0 C0 C0
23 tCK @ CLmax -0.5 (Byte 18) [ns] 75 75 A0
24 tAC SDRAM @ CLmax -0.5 [ns] 75 75 80
25 tCK @ CLmax -1 (Byte 18) [ns] 00 00 00
26 tAC SDRAM @ CLmax -1 [ns] 00 00 00
27 tRPmin [ns] 3C 50 50
28 tRRDmin [ns] 3C 3C 3C
29 tRCDmin [ns] 3C 50 50
30 tRASmin [ns] 2D 2D 32
31 Module Density per Rank 80 80 80
32 tAS, tCS [ns] 90 90 B0
Table 14 SPD Codes for HYS72D64500GR–[7F/7/8]–B
Product Type & Organization
HYS72D64500GR–7F–B
HYS72D64500GR–7–B
HYS72D64500GR–8–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC2100R –
20220 PC2100R –
20330 PC1600R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 26 Rev. 1.03 2004-01
33 tAH, TCH [ns] 90 90 B0
34 tDS [ns] 50 50 60
35 tDH [ns] 50 50 60
36-40 not used 00 00 00
41 tRCmin [ns] 3C 41 46
42 tRFCmin [ns] 4B 4B 50
43 tCKmax [ns] 30 30 30
44 tDQSQmax [ns] 32 32 3C
45 tQHSmax [ns] 75 75 A0
46 not used 00 00 00
47 DIMM PCB Height 00 00 00
48-61 not used 00 00 00
62 SPD Revision 00 00 00
63 Checksum of Byte 0-62 D6 03 F8
64 JEDEC ID Code of Infineon (1) C1 C1 C1
65 JEDEC ID Code of Infineon (2) 49 49 49
66 JEDEC ID Code of Infineon (3) 4E 4E 4E
67 JEDEC ID Code of Infineon (4) 46 46 46
68 JEDEC ID Code of Infineon (5) 49 49 49
69 JEDEC ID Code of Infineon (6) 4E 4E 4E
70 JEDEC ID Code of Infineon (7) 45 45 45
71 JEDEC ID Code of Infineon (8) 4F 4F 4F
72 Module Manufacturer Location xx xx xx
73 Part Number, Char 1 37 37 37
74 Part Number, Char 2 32 32 32
75 Part Number, Char 3 44 44 44
76 Part Number, Char 4 36 36 36
Table 14 SPD Codes for HYS72D64500GR–[7F/7/8]–B
Product Type & Organization
HYS72D64500GR–7F–B
HYS72D64500GR–7–B
HYS72D64500GR–8–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC2100R –
20220 PC2100R –
20330 PC1600R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 27 Rev. 1.03 2004-01
77 Part Number, Char 5 34 34 34
78 Part Number, Char 6 35 35 35
79 Part Number, Char 7 30 30 30
80 Part Number, Char 8 30 30 30
81 Part Number, Char 9 47 47 47
82 Part Number, Char 10 52 52 52
83 Part Number, Char 11 37 37 38
84 Part Number, Char 12 46 42 42
85 Part Number, Char 13 42 20 20
86 Part Number, Char 14 20 20 20
87 Part Number, Char 15 20 20 20
88 Part Number, Char 16 20 20 20
89 Part Number, Char 17 20 20 20
90 Part Number, Char 18 20 20 20
91 Module Revision Code xx xx xx
92 Test Program Revision Code xx xx xx
93 Module Manufacturing Date Year xx xx xx
94 Module Manufacturing Date Week xx xx xx
95 Module Serial Number (1) xx xx xx
96 Module Serial Number (2) xx xx xx
97 Module Serial Number (3) xx xx xx
98 Module Serial Number (4) xx xx xx
99-127 not used 00 00 00
Table 14 SPD Codes for HYS72D64500GR–[7F/7/8]–B
Product Type & Organization
HYS72D64500GR–7F–B
HYS72D64500GR–7–B
HYS72D64500GR–8–B
×72 ×72 ×72
1 rank 1 rank 1 rank
reg reg reg
Label Code PC2100R –
20220 PC2100R –
20330 PC1600R –
20220
Jedec SPD Revision Rev. 0.0 Rev. 0.0 Rev. 0.0
Byte# Description HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 28 Rev. 1.03 2004-01
Table 15 SPD Codes for HYS72D1285[20/21]GR[–7F/7]–B, HYS72D128521GR–8
Part Number & Organization
HYS72D128520GR–7–B
HYS72D128520GR–7F–B
HYS72D128521GR–8–B
HYS72D128521GR–7–B
HYS72D128521GR–7F–B
×72 ×72 ×72 ×72 ×72
2 Ranks 2 Ranks 2 Ranks 2 Ranks 2 Ranks
reg reg reg reg reg
Label Code PC2100R-
20330-N PC2100R-
20220-N PC1600R-
20220-N PC2100R-
20330-N PC2100R-
20220-N
Jedec SP D Revision
Byte# Description HEX HEX HEX HEX HEX
0 Programmed SPD Bytes in E2PROM 80 80 80 80 80
1 Total number of Bytes in E2PROM 08 08 08 08 08
2 Memory Type (DDR = 07h) 07 07 07 07 07
3 Number of Row Addresses 0D 0D 0D 0D 0D
4 Number of Column Addresses 0B 0B 0B 0B 0B
5 Number of DIMM Ranks 02 02 02 02 02
6 Data Width (LSB) 48 48 48 48 48
7 Data Width (MSB) 00 00 00 00 00
8 Interface Voltage Levels 04 04 04 04 04
9 tCK @ CLmax (Byte 18) [ns] 70 70 80 70 70
10 tAC SDRAM @ CLmax (Byte 18) [ns] 75 75 80 75 75
11 Error Correction Support 02 02 02 02 02
12 Refresh Rate 82 82 82 82 82
13 Primary SDRAM Width 0404040404
14 Error Checking SDRAM Width 04 04 04 04 04
15 tCCD [cycles] 01 01 01 01 01
16 Burst Length Supported 0E 0E 0E 0E 0E
17 Number of Banks on SDRAM Device 04 04 04 04 04
18 CAS Latency 0C 0C 0C 0C 0C
19 CS Latency 01 01 01 01 01
20 Write Latency 02 02 02 02 02
21 DIMM Attributes 26 26 26 26 26
22 Component Attributes C0 C0 C0 C0 C0
23 tCK @ CLmax -0.5 (Byte 18) [ns] 75 75 A0 75 75
24 tAC SDRAM @ CLmax -0.5 [ns] 75 75 80 75 75
25 tCK @ CLmax -1 (Byte 18) [ns] 00 00 00 00 00
26 tAC SDRAM @ CLmax -1 [ns] 00 00 00 00 00
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 29 Rev. 1.03 2004-01
27 tRPmin [ns] 50 3C 50 50 3C
28 tRRDmin [ns] 3C 3C 3C 3C 3C
29 tRCDmin [ns] 50 3C 50 50 3C
30 tRASmin [ns] 2D 2D 32 2D 2D
31 Module Density per Rank 80 80 80 80 80
32 tAS, tCS [ns] 90 90 B0 90 90
33 tAH, TCH [ns] 90 90 B0 90 90
34 tDS [ns] 50 50 60 50 50
35 tDH [ns] 50 50 60 50 50
36 not used 00 00 00 00 00
37 not used 00 00 00 00 00
38 not used 00 00 00 00 00
39 not used 00 00 00 00 00
40 not used 00 00 00 00 00
41 tRCmin [ns] 41 3C 46 41 3C
42 tRFCmin [ns] 4B 4B 50 4B 4B
43 tCKmax [ns] 30 30 30 30 30
44 tDQSQmax [ns] 32 32 3C 32 32
45 tQHSmax [ns] 75 75 A0 75 75
46 not used 00 00 00 00 00
47 DIMM PCB Height 00 00 00 00 00
48-61 not used 00 00 00 00 00
62 SPD Revision 00 00 00 00 00
63 Checksum of Byte 0-62 04 D7 F9 04 D7
64 JEDEC ID Code of Infineon (1) C1 C1 C1 C1 C1
65 JEDEC ID Code of Infineon (2) 49 49 49 49 49
66 JEDEC ID Code of Infineon (3) 4E 4E 4E 4E 4E
Table 15 SPD Codes for HYS72D1285[20/21]GR[–7F/7]–B, HYS72D128521GR–8
Part Number & Organization
HYS72D128520GR–7–B
HYS72D128520GR–7F–B
HYS72D128521GR–8–B
HYS72D128521GR–7–B
HYS72D128521GR–7F–B
×72 ×72 ×72 ×72 ×72
2 Ranks 2 Ranks 2 Ranks 2 Ranks 2 Ranks
reg reg reg reg reg
Label Code PC2100R-
20330-N PC2100R-
20220-N PC1600R-
20220-N PC2100R-
20330-N PC2100R-
20220-N
Jedec SP D Revision
Byte# Description HEX HEX HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 30 Rev. 1.03 2004-01
67 JEDEC ID Code of Infineon (4) 46 46 46 46 46
68 JEDEC ID Code of Infineon (5) 49 49 49 49 49
69 JEDEC ID Code of Infineon (6) 4E 4E 4E 4E 4E
70 JEDEC ID Code of Infineon (7) 45 45 45 45 45
71 JEDEC ID Code of Infineon (8) 4F 4F 4F 4F 4F
72 Module Manufacturer Location xx xx xx xx xx
73 Part Number, Char 1 3737373737
74 Part Number, Char 2 3232323232
75 Part Number, Char 3 4444444444
76 Part Number, Char 4 3131313131
77 Part Number, Char 5 3232323232
78 Part Number, Char 6 3838383838
79 Part Number, Char 7 3535353535
80 Part Number, Char 8 3232323232
81 Part Number, Char 9 3031313131
82 Part Number, Char 10 47 47 47 47 47
83 Part Number, Char 11 52 52 52 52 52
84 Part Number, Char 12 37 37 38 37 37
85 Part Number, Char 13 42 46 42 42 46
86 Part Number, Char 14 20 42 20 20 42
87 Part Number, Char 15 20 20 20 20 20
88 Part Number, Char 16 20 20 20 20 20
89 Part Number, Char 17 20 20 20 20 20
90 Part Number, Char 18 20 20 20 20 20
91 Module Revision Code xx xx xx xx xx
92 Test Program Revision Code xx xx xx xx xx
93 Module Manufacturing Date Year xx xx xx xx xx
Table 15 SPD Codes for HYS72D1285[20/21]GR[–7F/7]–B, HYS72D128521GR–8
Part Number & Organization
HYS72D128520GR–7–B
HYS72D128520GR–7F–B
HYS72D128521GR–8–B
HYS72D128521GR–7–B
HYS72D128521GR–7F–B
×72 ×72 ×72 ×72 ×72
2 Ranks 2 Ranks 2 Ranks 2 Ranks 2 Ranks
reg reg reg reg reg
Label Code PC2100R-
20330-N PC2100R-
20220-N PC1600R-
20220-N PC2100R-
20330-N PC2100R-
20220-N
Jedec SP D Revision
Byte# Description HEX HEX HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
SPD Contents
Data Sheet 31 Rev. 1.03 2004-01
94 Module Manufacturing Date Week xx xx xx xx xx
95 Module Serial Number (1) xx xx xx xx xx
96 Module Serial Number (2) xx xx xx xx xx
97 Module Serial Number (3) xx xx xx xx xx
98 Module Serial Number (4) xx xx xx xx xx
99-
127 not used 00 00 00 00 00
Table 15 SPD Codes for HYS72D1285[20/21]GR[–7F/7]–B, HYS72D128521GR–8
Part Number & Organization
HYS72D128520GR–7–B
HYS72D128520GR–7F–B
HYS72D128521GR–8–B
HYS72D128521GR–7–B
HYS72D128521GR–7F–B
×72 ×72 ×72 ×72 ×72
2 Ranks 2 Ranks 2 Ranks 2 Ranks 2 Ranks
reg reg reg reg reg
Label Code PC2100R-
20330-N PC2100R-
20220-N PC1600R-
20220-N PC2100R-
20330-N PC2100R-
20220-N
Jedec SP D Revision
Byte# Description HEX HEX HEX HEX HEX
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Package Outlines
Data Sheet 32 Rev. 1.03 2004-01
5 Package Outlines
Figure 4 Package Outlines Raw Card L (L-DIM-184-13)
92
1
18493
A
0.1
±0.1
4CB
128.95
AA
133.35
4 MAX.
0.15 BA C
1.27
0.4
BC
±0.13
30.48
±0.1
ø0.1
2.5 ±0.1
x
64.77
95
ABC
120.65
1.27 =
2.175
6.62
6.35 49.53
17.8
10
3 MIN.
3.8 ±0.13
±0.05
1
1.27 B
0.1 A C
0.2
Detail of contacts
±0.2
2.5
1.8 ±0.1 0.1 CBA
1)
Burr max. 0.4 allowed
1) On ECC modules only
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Package Outlines
Data Sheet 33 Rev. 1.03 2004-01
Figure 5 Package Outlines Raw Card M (L-DIM-184-12)
192
A
93 184
128.95
A
0.1
A
BC
133.35
4 MAX.
0.15 BA C
1.27
0.4
BC
±0.13
30.48
±0.1
6.35
±0.1
2.5
64.77
ø0.1ABC 2.175
6.62
49.53
±0.1
4
0.1
±0.1
1.8 A CB
3.8
±0.13
3 MIN.
17.8
10
1.27 1±0.05 A
0.1 CB
Detail of contacts
0.2
2.5
±0.2
120.65x95 1.27 =
1)
1)
Burr max. 0.4 allowed
1) On ECC modules only
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Package Outlines
Data Sheet 34 Rev. 1.03 2004-01
Figure 6 Package Outlines Raw Card N (L-DIM-184-14)
192
93 184
128.95
A
0.1
AA
CB
133.35
6.81 MAX.
0.15 BA C
±0.1
4
ø0.1
2.5
±0.1
x
64.77
95
ABC
120.65
1.27 =
2.175
6.62
6.35 49.53
B
±0.13
30.48
1.27
0.4
C
±0.1
3.8
±0.13
3 MIN.
0.1
1.8 ±0.1 BA C
17.8
10
1.27 1
±0.05
B
0.1 A C
Detail of contacts
0.2
2.5
±0.2
1)
1)
Burr max. 0.4 allowed
1) On ECC modules only
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Application Note
Data Sheet 35 Rev. 1.03 2004-01
6 Application Note
Power Up and Power Management on DDR Registered DIMMs (according to JEDEC ballot JC-42.5 Item
1173)
184-pin Double Data Rate (DDR) Registered DIMMs include two new features to facilitate controlled power-up and
to minimize power consumption during low power mode. One feature is externally controlled via a system-
generated RESET signal; the second is based on module detection of the input clocks. These enhancements
permit the modules to power up with SDRAM outputs in a High-Z state (eliminating risk of high current dissipations
and/or dotted I/Os), and result in the powering-down of module support devices (registers and Phase-Locked
Loop) when the memory is in Self-Refresh mode.
The new RESET pin controls power dissipation on the module’s registers and ensures that CKE and other SDRAM
inputs are maintained at a valid ‘low’ level during power-up and self refresh. When RESET is at a low level, all the
regist er outpu ts are forc ed to a low leve l, and all diffe renti al regist er inpu t receive rs are powe red down, res ultin g
in very low r egis ter power consump tio n. T he RE SET pin, located on DIMM tab #1 0, is driv en fr om th e sys tem as
an asynchronous signal according to the attached details. Using this function also permits the system and DIMM
clocks to be stopped during memory Self Refresh operation, while ensuring that the SDRAMs stay in Self Refresh
mode.
As described in the table above, a low on the RESET input ensures that the Clock Enable (CKE) signal(s) are
maintained low at the SDRAM pins (CKE being one of the 'Q' signals at the register output). Holding CKE low
maintains a high impedance state on the SDRAM DQ, DQS and DM outputs — where they will remain until
activated by a valid ‘read’ cycle. CKE low also maintains SDRAMs in Self Refresh mode when applicable.
The DDR PLL devices automatically detect clock activity above 20MHz. When an input clock frequency of 20MHz
or greater is detected, the PLL begins operation and initiates clock frequency lock (the minimum operating
frequency at which all specifications will be met is 95MHz). If the clock input frequency drops below 20MHz (actual
detect fr equ enc y wil l v ary by ve ndo r), th e P LL V CO (Vol tag e Con tr olled Oscil lat or) is sto ppe d, ou tputs are mad e
High-Z, an d th e differe ntial inputs are powered do wn — r esulting in a to tal PL L c ur rent co ns ump tion of les s tha n
1mA. Use of thi s low power PL L func ti on makes the us e of the PLL RESE T (or G pi n) unne ce ss ar y , and it is tie d
inactive on the DIMM.
This application note describes the required and optional system sequences associated with the DDR Registered
DIMM 'RESET' function . It is impo rtant to n ote that al l references to CKE ref er to both CKE0 and CKE1 for a 2-
bank DIMM. Be cau se RE SE T applie s to all DIMM r egi ste r de vices, it is ther ef ore n ot possi bl e to uni quel y control
CKE to one physical DIMM bank through the use of the RESET pin.
Table 16 RESET Truth Table
Register Inputs Register
Outputs
RESET CK CK Data in (D) Data out (Q)
H Rising Falling H H
H Rising Falling L L
H L or H L or H X Qo
H High Z High Z X Illegal input
conditions
L X or Hi-Z X or Hi-Z X or Hi-Z L
X: Don’t care, Hi-Z: High Impedance, Qo: Data latched at the previous of CK rising and CK falling
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Application Note
Data Sheet 36 Rev. 1.03 2004-01
Power-Up Sequence with RESET — Required
1. The syst em set s R ES ET at a valid low level.
This is the preferred default state during power-up. This input condition forces all register outputs to a low state
independent of the condition on the register inputs (data and clock), ensuring that CKE is at a stable low-level
at the DDR SDRAMs.
2. The power supplies should be initialized according to the JEDEC-approved initialization sequence for DDR
SDRAMs.
3. Stabilization of Clocks to the SDRAM
The syste m must dr ive clo cks to the a pplic ation freq uency (PLL oper ation is not assu red unt il the in put clo ck
reache s 20 MHz). Stability of clocks at the SDRAMs wi ll be affected by all a pplicable system clock devices,
and time must be allotted to permit all clock devices to settle. Once a stable clock is received at the DIMM PLL,
the required PLL stabilization time (assuming power to the DIMM is stable) is 100 microseconds. When a
stable clock is present at the SDRAM input (driven from the PLL), the DDR SDRAM requires 200 µsec prior t o
SDRAM operation.
4. The system applies valid logic levels to the data inputs of the register (address and controls at the DIMM
connector).
CKE must be maintained low and all other inputs should be driven to a known state. In general these
commands can be determined by the system designer. One o ption is to apply an SDRAM ‘NOP’ com mand
(with CK E l ow), as this is th e fir st com mand defined by the JE DEC in itial ization sequ ence (ideall y this woul d
be a ‘NOP Deselect’ command). A second option is to apply low levels on all of the register inputs to be
consistent with the state of the register outputs.
5. The system switches RESET to a logic ‘high’ level.
The SDRAM is now functional and prepared to receive commands. Since the RESET signal is asynchronous,
setting the RESET timing in relation to a specific clock edge is not required (during this period, register inputs
must remai n stab le).
6. The system must maintain stable register inputs until normal register operation is attained.
The registers have an activation time that allows their clock receivers, data input receivers, and output drivers
suffici ent time to be turned on an d become stabl e. During this time the s ystem must mainta in the valid lo gic
levels described in step 5. It is also a functional requirement that the registers maintain a low state at the CKE
outputs to guarantee that the DDR SDRAMs continue to receive a low level on CKE. Register activation time
(t (ACT) ), from asynchronous switching of RESET from low to high until the registers are stable and ready to
accept an input signal, is specified in the register and DIMM do-umentation.
7. The system can begin the JEDEC-defined DDR SDRAM power-up sequence (according to the JEDEC-
pproved initialization sequence).
Self Refresh Entry (RESET low, clocks powered off) — Optional
Self Re fresh can be u sed to retain d ata in DDR SDRA M DIM Ms even if the rest o f the system is po wered do wn
and the clocks are off. This mode allows the DDR SDRAMs on the DIMM to retain data without external clocking.
Self Refresh mode is an ideal time to utilize the RESET pin, as this can reduce register power consumption
(RESET low deactivates register CK and CK, data input receivers, and data output drivers).
1. 1. The system applies Self Refresh entry command.
(CKELow, CSLow, RASLow, CAS Low, WE High)
Note:Note: The com mands re ach the DDR S DRAM o ne clock l ater due to the add itional regis ter pipelin ing on a
Registered DIMM. After this command is issued to the SDRAM, all of the address and control and clock input
conditions to the SDRAM are Don’t Cares— with the exception of CKE.
2. The syst em set s R ES ET at a valid low level.
This input condition forces all register outputs to a low state, independent of the condition on the registerm
inputs (data and clock), and ensures that CKE, and all other control and address signals, are a stable low-level
at the DDR SDRAMs. Since the RESET signal is asynchronous, setting the RESET timing in relation to a
specific clock edge is not required.
3. The system turns off clock inputs to the DIMM. (Optional)
a. In order to reduce DIMM PLL current, the clock inputs to the DIMM are turned off, resulting in High-Z clock
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Application Note
Data Sheet 37 Rev. 1.03 2004-01
inputs to both the SDRAMs and the registers. This must be done after the RESET deactivate time of the
register (t (INACT). The deactivate time defines the time in which the clocks and the control and address
signals must maintain valid levels after RESET low has been applied and is specified in the register and DIMM
documentation.
b.The system may release DIMM address and control inputs to High-Z.
This can be done after the RESET deactivate time of the register. The deactivate time defines the time in which
the clocks and the control and the address signals must maintain valid levels after RESET low has been
applied. It is highly recommended that CKE continue to remain low during this operation.
4. The DIMM is in lowest power Self Refresh mode.
Self Refresh Exit (RESET low, clocks powered off) — Optional
1. Stabilization of Clocks to the SDRAM.
The syste m must dr ive clo cks to the a pplic ation freq uency (PLL oper ation is not assu red unt il the in put clo ck
reache s ~20MHz). S tability of clocks at the SDRAMs will be affect ed by all a pplicabl e system cl ock devic es,
and time must be allotted to permit all clock devices to settle. Once a stable clock is received at the DIMM PLL,
the required PLL stabilization time (assuming power to the DIMM is stable) is 100 microseconds.
2. The system applies valid logic levels to the data inputs of the register (address and controls at the DIMM
connector).
CKE must be maintained low and all other inputs should be driven to a known state. In general these
commands can be determined by the system designer. One o ption is to apply an SDRAM ‘NOP’ com mand
(with CKE low), as this is the first command defined by the JEDEC Self Refresh Exit sequence (ideally t his
would be a ‘ NOP Deselec t’ comman d). A secon d option is to apply l ow levels on all of the register inpu ts, to
be consistent with the state of the register outputs.
3. The system switches RESET to a logic ‘high’ level.
The SDRAM is now functional and prepared to receive commands. Since the RESET signal is asynchronous,
RESET timing relationship to a specific clock edge is not required (during this period, register inputs must
remain stable) .
4. The system must maintain stable register inputs until normal register operation is attained.
The registers have an activation time that allows the clock receivers, input receivers, and output drivers
suffici ent time to be turned on an d become stabl e. During this time the s ystem must mainta in the valid lo gic
levels described in Step 2. It is also a functional requirement that the registers maintain a low state at the CKE
outputs to guar an tee that t he DDR SDRA Ms c onti nue to rec ei ve a lo w lev el on C KE . Reg ister activ at ion tim e
(t (ACT) ), from asynchronous switching of RESET from low to high until the registers are stable and ready to
accept an input signal, is specified in the register and DIMM do-umentation.
5. System can begin the JEDEC-defined DDR SDRAM Self Refresh Exit Procedure.
Self Refresh Entry (RESET low, clocks running) — Optional
Although keeping the clocks running increases power consumption from the on-DIMM PLL during self refresh, this
is an alternate operating mode for these DIMMs.
1. 1. System enters Self Refresh entry command.
(CKE Low, CS Low, RAS Low, CAS Low, WE High)
Note:Note: The com mands re ach the DDR S DRAM o ne clock l ater due to the add itional regis ter pipelin ing on a
Registered DIMM. After this command is issued to the SDRAM, all of the address and control and clock input
conditions to the SDRAM are Don’t Cares — with the exception of CKE.
2. The syst em set s R ES ET at a valid low level.
This input condition forces all register outputs to a low state, independent of the condition on the data and clock
register inputs, and ensures that CKE is a stable low-level at the DDR SDRAMs.
3. The system may release DIMM address and control inputs to High-Z.
This can b e don e af ter the RE S ET deac tiv ate tim e of th e regi ste r (t (INA CT) ). Th e dea cti vate ti me des cri bes
the tim e in which the c locks and the cont rol and the ad dress s ignals m ust mainta in vali d levels after RES ET
low has been applied. It is highly recommended that CKE continue to remain low during the operation.
4. The DIMM is in a low power, Self Refresh mode.
HYS72D[128/64/32]5[00/20/21]GR–[7F/7/8]-B
Registered DDR SDRAM-Modules
Application Note
Data Sheet 38 Rev. 1.03 2004-01
Self Refresh Exit (RESET low, clocks running) — Optional
1. The system applies valid logic levels to the data inputs of the register (address and controls at the DIMM
connector). CKE must be maintain ed low and all other inputs should be driven to a known state. In general
these commands can be determined by the system designer. One option is to apply an SDRAM ‘NOP’
command (with CKE low), as this is the first command defined by the Self Refresh Exit sequence (ideally this
would be a ‘NOP Deselect’ command). A second option is to apply low levels on all of the register inputs to be
consistent with the state of the register outputs.
2. The system switches RESET to a logic 'high' level.
The SDRAM is now functional and prepared to receive commands. Since the RESET signal is asynchronous,
it does not need to be tied to a particular clock edge (during this period, register inputs must continue to remain
stable).
3. The system must maintain stable register inputs until normal register operation is attained.
The registers have an activation time that allows the clock receivers, input receivers, and output drivers
suffici ent time to be turned on an d become stabl e. During this time the s ystem must mainta in the valid lo gic
levels described in Step 1. It is also a functional requirement that the registers maintain a low state at the CKE
outputs in order to guara ntee that the DDR SDRAMs continue to re ceive a low level on CKE. This activation
time, from asynchronous switching of RESET from low to high, until the registers are stable and ready to accept
an input signal, is t (ACT ) as specified in the register and DIMM documentation.
4. The system can begin JEDEC defined DDR SDRAM Self Refresh Exit Procedure.
Self Refresh Entry/Exit (RESET high, clocks running) — Optional
As this sequence does not involve the use of the RESET function, the JEDEC standard SDRAM specification
explains in detail the method for entering and exiting Self Refresh for this case.
Self Refresh Entry (RESET high, clocks powered off) — Not Permissible
In order to maintain a valid low level on the register output, it is required that either the clocks be running and the
system drive a low level on CKE, or the clocks are powered off and RESET is asserted low according to the
sequence defined in this application note. In the case where RESET remains high and the clocks are powered off,
the PLL drives a High-Z clock input into the register clock input. Without the low level on RESET an unknown DIMM
state will result.
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