HY62256A-(I) Series 32Kx8bit CMOS SRAM DESCRIPTION FEATURES The HY62256A/ HY62256A-I is a high-speed, low power and 32,786 x 8-bits CMOS Static Random Access Memory fabricated using Hyundai's high performance CMOS process technology. The HY62256A/ HY62256A-I has a data retention mode that guarantees data to remain valid at the minimum power supply voltage of 2.0 volt. Using the CMOS technology, supply voltages from 2.0 to 5.5volt has little effect on supply current in the data retention mode. The HY62256A/HY62256A-I is suitable for use in low voltage operation and battery back-up application. * * * * Fully static operation and Tri-state output TTL compatible inputs and outputs Low power consumption Battery backup(L/LL-part) - 2.0V(min.) data retention * Standard pin configuration - 28 pin 600 mil PDIP - 28 pin 330mil SOP - 28 pin 8x13.4 mm TSOP-I (Standard and Reversed) Product Voltage Speed Operation Standby Current(uA) No. (V) (ns) Current(mA) L LL HY62256A 5.0 55/70/85 50 1mA 100 25 HY62256A-I 5.0 55/70/85 50 1mA 100 Note 1. E.T. : Extended Temperature, Normal : Normal Temperature 2. Current value is max. Temperature (E) 0~70(Normal) -40~85(E.T.) PIN CONNECTION 28 27 26 25 24 23 22 21 20 19 18 17 16 15 1 2 3 4 5 6 7 8 9 10 11 12 13 14 SOP Vcc /WE A13 A8 A9 A11 /OE A10 /CS I/O8 I/O7 I/O6 I/O5 I/O4 /OE A11 A9 A8 A13 /WE Vcc A14 A12 A7 A6 A5 A4 A3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 15 16 17 18 19 20 21 22 23 24 25 26 27 28 A2 A1 A0 I/O1 I/O2 I/O3 Vss I/O4 I/O5 I/O6 I/O7 I/O8 /CS A10 TSOP-I(Reversed) BLOCK DIAGRAM ROW DECODER A0 ADD INPUT BUFFER Pin Function Chip Select Write Enable Output Enable Address Inputs Data Input/Output Power(+5.0V) Ground A3 A4 A5 A6 A7 A12 A14 Vcc /WE A13 A8 A9 A11 /OE TSOP-I(Standard) PIN DESCRIPTION Pin Name /CS /WE /OE A0 ~ A14 I/O1 ~ I/O8 Vcc Vss A10 /CS I/O8 I/O7 I/O6 I/O5 I/O4 Vss I/O3 I/O2 I/O1 A0 A1 A2 A14 /CS /OE /WE MEMORY ARRAY 512x512 I/O1 OUTPUT BUFFER PDIP A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O1 I/O2 I/O3 Vss SENSE AMP Vcc /WE A13 A8 A9 A11 /OE A10 /CS I/O8 I/O7 I/O6 I/O5 I/O4 WRITE DRIVER 28 27 26 25 24 23 22 21 20 19 18 17 16 15 COLUMN DECODER 1 2 3 4 5 6 7 8 9 10 11 12 13 14 I/O8 CONTROL LOGIC A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 I/O1 I/O2 I/O3 Vss This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev.01 /Jul.96 Hyundai Semiconductor HY62256A-(I) Series ORDERING INFORMATION Part No. HY62256AP HY62256ALP HY62256ALLP HY62256AJ HY62256ALJ HY62256ALLJ HY62256AT1 HY62256ALT1 HY62256ALLT1 HY62256AR1 HY62256ALR1 HY62256ALLR1 HY62256AP-I HY62256ALP-I HY62256AJ-I HY62256ALJ-I HY62256AT1-I HY62256ALT1-I HY62256AR2-I HY62256ALR2-I Speed 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 55/70/85 Power Temp. L-part LL-part L-part LL-part L-part LL-part L-part LL-part L-part L-part L-part L-part E.T. E.T. E.T. E.T. E.T. E.T. E.T. E.T. Package PDIP PDIP PDIP SOP SOP SOP TSOP-I Standard TSOP-I Standard TSOP-I Standard TSOP-I Reversed TSOP-I Reversed TSOP-I Reversed PDIP PDIP SOP SOP TSOP-I TSOP-I TSOP-I Reversed TSOP-I Reversed ABSOLUTE MAXIMUM RATING (1) Symbol Vcc, VIN, VOUT TA Parameter Power Supply, Input/Output Voltage Operating Temperature TSTG PD IOUT TSOLDER Storage Temperature Power Dissipation Data Output Current Lead Soldering Temperature & Time Rating -0.5 to 7.0 0 to 70 -40 to 85 -65 to 150 1.0 50 260 10 Unit V E E E W mA E sec Remark HY62256A HY62256A-I Note 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is stress rating only and the functional operation of the device under these or any other conditions above those indicated in the operation of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect reliability. RECOMMENDED DC OPERATING CONDITIONS TA=0C to 70C / TA= -40C to 85C(E.T.) Symbol Parameter Min. Vcc Power Supply Voltage 4.5 VIH Input High Voltage 2.2 VIL Input Low Voltage -0.5(1) Typ. 5.0 - Max. 5.5 Vcc+0.5 0.8 Unit V V V Note 1. VIL = -3.0V for pulse width less than 30ns Rev.01 /Jul.96 2 HY62256A-(I) Series TRUTH TABLE /CS H L L L /WE X H H L /OE X H L X MODE Standby Output Disabled Read Write I/O OPERATION High-Z High-Z Data Out Data In Note : 1. H=VIH, L=VIL, X=Don't Care DC CHARACTERISTICS Vcc = 5V3/410%, TA = 0E to 70E(Normal)/ -40E to 85E(E.T.) unless otherwise specified Symbol Parameter Test Condition Min. Typ. ILI Input Leakage Current Vss A VIN A Vcc -1 ILO Output Leakage Current Vss A VOUT A Vcc, /CS = VIH or -1 /OE = VIH or /WE = VIL Icc Operating Power Supply /CS = VIL, 30 Current VIN = VIH or VIL, II/O = 0mA ICC1 Average Operating Current /CS = VIL, 40 Min. Duty Cycle = 100%, II/O = 0mA ISB TTL Standby Current /CS= VIH VIN = VIH or VIL 0.4 (TTL Inputs) ISB1 CMOS HY62256A Standby Current /CS A Vcc - 0.2V L 2 (CMOS VIN 0.2V or LL 1 Inputs) HY62256A-I VINA Vcc - 0.2V L 2 VOL Output Low Voltage IOL = 2.1mA VOH Output High Voltage IOH = -1mA 2.4 Note : Typical values are at Vcc =5.0V, TA = 25E Rev.01 /Jul.96 Max. 1 1 Unit uA uA 50 mA 70 mA 2 mA 1 mA 100 25 1 100 0.4 - uA uA mA uA V V 3 HY62256A-(I) Series AC CHARACTERISTICS Vcc = 5V3/410%, TA = 0E to 70E(Normal)/ -40E to 85E(E.T.) unless otherwise specified. -55 -70 -85 # Symbol Parameter Min. Max. Min. Max. Min Max. READ CYCLE 1 tRC Read Cycle Time 55 70 85 2 tAA Address Access Time 55 70 85 3 tACS Chip Select Access Time 55 70 85 4 tOE Output Enable to Output Valid 30 35 45 5 tCLZ Chip Select to Output in Low Z 5 5 5 6 tOLZ Output Enable to Output in Low Z 5 5 5 7 tCHZ Chip Deselection to Output in High Z 0 20 0 30 0 30 8 tOHZ Out Disable to Output in High Z 0 20 0 30 0 30 9 tOH Output Hold from Address Change 5 5 5 WRITE CYCLE 10 tWC Write Cycle Time 55 70 85 11 tCW Chip Selection to End of Write 50 65 75 12 tAW Address Valid to End of Write 50 65 75 13 tAS Address Set-up Time 0 0 0 14 tWP Write Pulse Width 40 50 55 15 tWR Write Recovery Time 0 0 0 16 tWHZ Write to Output in High Z 0 20 0 30 0 30 17 tDW Data to Write Time Overlap 25 35 40 18 tDH Data Hold from Write Time 0 0 0 19 tOW Output Active from End of Write 5 5 5 - Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns AC TEST CONDITIONS TA = 0E to 70E(Normal) / -40E to 85E(E.T.) unless otherwise specified. PARAMETER VALUE Input Pulse Level 0.8V to 2.4V Input Rise and Fall Time 5ns Input and Output Timing Reference Levels 1.5V Output Load 70/85/100ns CL = 100pF + 1TTL Load 55ns CL = 50pF + 1TTL Load AC TEST LOADS TTL CL(1) Note : Including jig and scope capacitance Rev.01 /Jul.96 4 HY62256A-(I) Series CAPACITANCE TA = 25E, f = 1.0MHz Symbol Parameter CIN Input Capacitance CI/O Input /Output Capacitance Condition VIN = 0V VI/O = 0V Max. 6 8 Unit pF pF Note : These parameters are sampled and not 100% tested TIMING DIAGRAM READ CYCLE 1 tRC ADDR tAA OE tOE tOH tOLZ CS tACS tOHZ tCHZ tCLZ Data Out High-Z Data Valid Note(READ CYCLE): 1. tCHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels. 2. At any given temperature and voltage condition, tCHZ max. is less than tCLZ min. both for a given device and from device to device. 3. /WE is high for the read cycle. READ CYCLE 2 tRC ADDR tAA tOH tOH Data Out Previous Data Data Valid Note(READ CYCLE): 1. /WE is high for the read cycle. 2. Device is continuously selected /CS= VIL. 3. /OE =VIL. Rev.01 /Jul.96 5 HY62256A-(I) Series WRITE CYCLE 1(/OE Clocked) tWC ADDR OE tAW tCW CS tAS tWR tWP WE tDW Data In tDH Data Valid tOHZ Data Out WRITE CYCLE 2 (/OE Low Fixed) tWC ADDR tAW tCW tWR CS tAS tWP WE tDW Data In tDH Data Valid tWHZ tOW (7) (8) Data Out Notes(WRITE CYCLE): 1. A write occurs during the overlap of a low /CS and a low /WE. A write begins at the latest transition among /CS going low and /WE going low: A write ends at the earliest transition among /CS going high and /WE going high. tWP is measured from the beginning of write to the end of write. 2. tCW is measured from the later of /CS going low to the end of write . 3. tAS is measured from the address valid to the beginning of write. 4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends as /CS, or /WE going high. 5. If /OE and /WE are in the read mode during this period, and the I/O pins are in the output low-Z state, input of opposite phase of the output must not be applied because bus contention can occur. 6. If /CS goes low simultaneously with /WE going low, or after /WE going low, the outputs remain in high impedance state. 7. DOUT is the same phase of latest written data in this write cycle. 8. DOUT is the read data of the new address. Rev.01 /Jul.96 6 HY62256A-(I) Series DATA RETENTION CHARACTERISTIC TA=0C to 70C (normal)/-40C to 85C(E.T.) Symbol Parameter Test Condition VDR Vcc for Data Retention /CSAVcc-0.2V,VssAVINAVcc ICCDR Data Retention HY62256A Vcc = 3.0V, L Current /CS AVcc -0.2V LL HY62256A-I VssAVINAVcc L tCDR Chip Disable to Data Retention See Data Retention Timing Time Diagram tR Operating Recovery Time Min 2 0 Typ 1 1 1 - Max 50 15(2) 50 - Unit V uA uA uA ns tRC(3) - - ns Notes 1. Typical values are under the condition of TA = 25E. 2. 3uA max. at TA=0E to 40 E. 3. tRC is read cycle time. Data Retention Timing Diagram DATA RETENTION MODE VCC 4.5V tCDR tR 2.2V VDR CS>VCC-0.2V CS VSS RELIABILITY SPEC. TEST MODE ESD HBM MM LATCH - UP Rev.01 /Jul.96 TEST SPEC. A 2000V A 250V A -100mA A100mA 7 HY62256A-(I) Series PACKAGE INFORMATION 28pin 600mil Dual In-Line Package(P) * UNIT : INCH(mm) MAX. MIN. 1.467(37.262) 1.447(36.754) 0.600(15.240)BSC 0.090(2.286) 0.065(1.650) 0.070(1.778) 0.050(1.270) 0.550(13.970) 0.155(3.937) 0.530(13.462) 0.145(3.683) 0.035(0.889) 0.020(0.508) 0.140(3.556) 0.021(0.553) 0.100(2.54)BSC 3 deg 11 deg 0.120(3.048) 0.014(0.356) 0.008(0.200) 0.015(0.381) 28pin 330mil Small Outline Package(J) 0.346(8.788) UNIT : INCH(mm) MAX .MIN. 0.338(8.585) 0.480(12.192) 0.460(11.684) 0.096(2.438) 0.728(18.491) 0.720(18.288) 0.092(2.335) 0.012(0.305) 0.014(0.356) 0.002(0.051) 0.050(1.270)BSC Rev.01 /Jul.96 0.020(0.508) 0.014(0.356) 0.008(0.203) 0.050(1.270) 0.030(0.762) 8 HY62256A-(I) Series 28pin 8x13.4mm Thin Small Outline Package Standard(T1) UNIT : INCH(mm) MAX. MIN. 0.468(11.9) 0.460(11.7) 0.536(13.6) 0.520(13.2) 0.319(8.1) 0.311(7.9) 0.008(0.2) 0.004(0.1) 0.027(0.7) 0.012(0.3) 0.040(1.02) 0.036(0.91) 0.008(0.20) 0.002(0.05) 0.022(0.55 BSC) 28pin 8x13.4mm Thin Small Outline Package Reversed(R1) 0.040(1.016) 0.291(7.391) 0.145(3.683) UNIT : INCH(mm) MAX. MIN. 0.468(11.9) 0.460(11.7) 0.536(13.6) 0.520(13.2) 0.319(8.1) 0.311(7.9) 0.027(0.7) 0.012(0.3) Rev.01 /Jul.96 0.008(0.2) 0.004(0.1) 0.040(1.02) 0.036(0.91) 0.008(0.20) 0.002(0.05) 0.022(0.55 BSC) 9