REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED
A
Change boilerplate t o add device class V. Add case outline H for vendor
CAGE 24355. Editorial changes throughout.
97-05-30
R. MONNIN
B
Made change to footnote 1/ in table IIA. Update boilerplate. -rrp
01-12-20
R. MONNIN
C
Change test symbol “I
OS”
to “I
IO”
in table IIB. -rrp
03-05-20
R. MONNIN
D
Update drawing to reflect current requirements. -rrp
11-02-09
C. SAFFLE
REV
SHEET
REV
SHEET
REV STATUS REV D D D D D D D D D D D
OF SHE ETS SHEET 1 2 3 4 5 6 7 8 9 10 11
PMIC N/A PREPARED BY
Rajesh Pithadia
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AV AILABL E
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
Rajesh Pithadia
APPRO V ED BY
Raymond Monnin
MICROCIRCUI T, LINEAR, LOW-NOISE,
PRECISIO N, HIG H SPEED OPERATI ONAL
AMPLIFIER, MONOLITHIC SILICON
DRAWING APPROVAL DATE
88-10-17
AMSC N/A
REVISION LEVEL
D SIZE
A CAGE CODE
67268
5962-88537
SHEET 1 OF 11
DSCC FORM 2233
APR 97 5962-E213-11
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 2
DSCC FORM 2234
APR 97
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and
M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part
or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device classes M and Q:
5962
-
88537
01
G
A
Federal
stock class
designator
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\ /
\/
Drawing number
For device class V:
5962
-
88537
01
V
G
A
Federal
stock class
designator
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\ /
(see 1.2.3)
\/
Drawing number
1.2.1 RHA des ign ator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, append ix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Dev ice ty pe(s). The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function
01 OP-37A Low-noise, precis ion, high-speed operational amplifier
02 OP-37B Low-noise, precision, high-speed operational amplifier
03 OP-37C Low-noise, precision, high-speed operational amplifier
1.2.3 Dev ice cl as s designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designator s will not be included in the PIN and will not be marked on the device.
Devi ce class Device requireme nts doc umentation
M Vendor self-cer tification to the requirements for M IL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Q or V Certification and qualification to MIL-PRF-38535
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 3
DSCC FORM 2234
APR 97
1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style
G MACY1-X8 8 Can
H GDFP1-F10 or CDFP2-F10 10 Flat pack
P GDIP1-T8 or CDI P 2-T8 8 Dual-in-line
2 CQCC1-N20 20 Square lead le ss chi p carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absol ute maximum rating s. 1/
Supply voltage (VS) ....................................................................... ±22 V
Internal power dissipation .............................................................. 500 mW 2/
Input voltage .................................................................................. ±22 V 3/
Output short-circuit duration .......................................................... Indefinite
Differential input voltage ............................................................... ±0.7 V 4/
Differential input current ............................................................... ±25 mA 4/
Storage temperature range ............................................................ -65°C to +150°C
Operating temperature range ........................................................ -55°C t o +125°C
Lead temperature (soldering, 60 seconds) .................................... +300°C
Junction temperature range (TJ) .................................................... -65°C to +150°C
Thermal resista nce, junctio n-to-case (θJC) .................................... See MIL-STD-1835
Thermal resistance, junction-to-ambient (θJA):
Cases G and H ......................................................................... 150°C/W
Case P ...................................................................................... 119°C/W
Case 2 ...................................................................................... 110°C/W
1.4 Recom mended operating cond itio ns.
Supply voltage (VS) ....................................................................... ±15 V
Source resistor (RS) ...................................................................... 50 Ω
Ambient operating temperature range (TA) ................................... -55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, s tandards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitati on or contr ac t.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
________
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Must withstand the added PD due to short circuit test, e.g., IOS.
3/ For supply voltages less than ±22 V, the absolute maximum input voltage is equal to the supply voltages.
4/ The device inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low
noise. If differential input voltage exceeds ±0.7 V, the input current should be limited to 25 mA.
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 4
DSCC FORM 2234
APR 97
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardizati on
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of prece den ce. In the event of a conflict between the text of this drawi ng and the references cited herein, the te xt
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exem ption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requi r em ent s for device cla sses Q and V shall b e in accorda nce with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein .
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN l isted in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, append ix A.
3.5.1 Certificati on/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certif i cate of compli an ce. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The cert ifi cate o f compl ian ce sub mitt ed to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-
PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certif i cate of conform anc e . A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and M ar itime -VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microc ir c uit group assi gn ment for device class M. Device class M devices covered by this drawing shall be in
microcircu it gr oup number 49 (see MIL-PRF-38535, appendix A).
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test Symbol Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherw ise specified
Group A
subgroups
Device
type
Limits Unit
Min
Max
Input offset current
IIO
1
01
35
nA
2,3 50
1
02
50
2,3 85
1
03
75
2,3 135
Average input bia s
current
IB
1
01
±40
nA
2,3
±60
1
02
±55
2,3
±95
1 03 ±80
2,3
±150
Common mode rejection
ratio
CMRR VCM = IVR = ±11 V 2/ 1 01 114 dB
VCM = IVR = ±10 V 2/
2,3
108
VCM = IVR = ±11 V 2/ 1 02 106
VCM = IVR = ±10 V 2/
2,3
100
VCM = IVR = ±11 V 2/
1
03
100
VCM = IVR = ±10 V 2/
2,3
94
Power supply rejection
ratio
PSRR
VS = ±4.5 V to ±18 V
1
01
10
µV/V
2,3 16
1
02
10
2,3 20
1
03
20
2,3 51
See footnotes at end of table.
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Test Symbol Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherw ise speci fied
Group A
subgroups
Device
type
Limits Unit
Min
Max
Large signal voltag e
gain
AVO VO = ±10 V, RL ≥ 2 kΩ
1
01
1000
V/mV
2,3 600
1
02
1000
2,3 500
1
03
700
2,3 300
Output voltage swing
VO RL ≥ 2 kΩ
1
01
±12
V
2,3
±11.5
1
02
±12
2,3
±11
1 03 ±11.5
2,3
±10.5
Power dissipation
PD No load, TA = +25°C 1 01,02 140 mW
03
170
Offset voltage adj ust ment
range VOSADJ RP = 10 kΩ, 3/
TA = +25°C
1 All ±0.5 mV
Supply current
IS No load, TA = +25°C 1 01,02 4.67 mA
03
5.67
Output short-circuit
current
IOS+ TA = +25°C 1 All 80 mA
IOS- -80
Input offset volt age
VIO
4
01
25
µV
5,6 60
4
02
60
5,6 200
4
03
100
5,6 300
See footnotes at end of table.
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 7
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Test Symbol Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherw ise speci fied
Group A
subgroups
Device
type
Limits Unit
Min
Max
Slew rate
SR
VO = ±7.5 V, RL = 2 kΩ,
CL = 50 pF, TA = +25°C
7
All
11
V/µs
Average input offs et
voltage drift
TCVOS
Unnulled 4/
8
01
0.6
µV/°C
TA = -55°C, +125°C
02
1.3
03
1.8
1/ VS = ±15 V, RS = 50 Ω, unless otherwis e specified.
2/ IVR is defined as the VCM range used for the CMRR test.
3/ RP is a trim potentiometer used for adjustment of VOS.
4/ TCVOS is guaranteed, if not tested, to the limits specified.
4. VERIFICATION
4.1 Sampling an d inspection . For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance wi th MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance wi th method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) TA = +125°C, minimum.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 8
DSCC FORM 2234
APR 97
Device types
01, 02, 03
Case outlines
G, P
H
2
Terminal
number
Terminal symbo l
1
VOS Trm NC NC
2
-IN
NULL
VOSTrm
3
+IN
-IN
NC
4
VS-
+IN
NC
5
NC VS- -IN
6
OUT NC NC
7
VS+
OUT
+IN
8
VOSTrm VS+
NC
9
---
NULL
NC
10
--- NC VS-
11
--- --- NC
12
---
---
NC
13
---
---
NC
14
---
---
NC
15
--- --- OUT
16
--- --- NC
17
---
---
VS+
18
---
---
NC
19
---
---
NC
20
---
---
VOSTrm
NC = No connection
FIGURE 1. Terminal connections.
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 9
DSCC FORM 2234
APR 97
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revis ion lev el control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance wi th MIL-PRF-38535. Inspections to be performed shall be tho se specifi ed in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Gro up A inspe ctio n.
a. Tests shall be as specif ied in table IIA herein.
b. Subgroups 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.4.2 Gro up C inspec tion . The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-s tate life test condition s, met hod 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance wi th the intent specified in method 1005 of
MIL-STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance wi th
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance wi th the intent specified in method 1005 of
MIL-STD-883.
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 10
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Test requirements Subgroups
(in accordance with
MIL-STD-883,
method 5005, ta ble I)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class M Device
class Q Device
class V
Interim electrical
parameter s (see 4.2)
1 1 1
Final electrical
parameter s (see 4.2)
1,2,3,4,5,6 1/
1,2,3,4,5,6 1/
1,2,3, 1/ 2/
4,5,6
Group A test
requirements (see 4.4)
1,2,3,4,5,6,7,8
1,2,3,4,5,6,7,8
1,2,3,4,5,6,
7,8
Group C end-point electrical
parameter s (see 4.4)
1 1 1 2/
Group D end-point electrical
parameter s (see 4.4)
1
1
1
Group E end-point electri cal
parameter s (see 4.4)
---
---
---
1/ PDA applies to subgroup 1. Exclude deltas from PDA.
2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits
shall be computed with reference to the previous interim electrical parameters.
TABLE IIB. 240 hour burn-in and group C end-point electrical parameters.
Test
Limit
Delta
Unit
Min
Max
Min
Max
VOS
100
75
µV
I
B
40
8
nA
I
IO
35 7 nA
4.4.3 Gro up D inspec tion . The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Gro up E inspe ctio n. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a. End-point electric al para meters shall be as specified in table IIA herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hard nes s ass ured te sts as spe cif ied in MI L-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
TA = +25°C ±5°C, after exposure, to the subgroups specified in table IIA herein.
STANDARD
SIZE
A
5962-88537
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990 REVISION LEVEL
D SHEET 11
DSCC FORM 2234
APR 97
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for dev ice classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Inten ded use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equ ipm ent), des ign applicat ion s, and logi sti cs purpo ses.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of user s. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list wi ll be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) sho uld co ntact DLA Land and Maritime-VA, telephone (614) 692-0544.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviatio ns, sy mbo ls, and defi nit ion s us ed herein ar e defin ed in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sour ces of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and
have agreed to this drawing.
6.6.2 Approved sources of supply fo r device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in M IL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime-VA.
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 11-02-09
Approved sources of supply for SMD 5962-88537 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QM L-38535 will be
revised to include the add it io n or deletio n of sour ces. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and M aritim e
ma intains an online database of all current sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
Reference mil itary
specification PIN
5962-8853701VGA
24355 (4) OP37AJ/QMLV ---
5962-8853701GA
3/
3/
3/
OP-37AT/883B
OP-37AJ/883
OP-37AH/883
M38510/13505BGX
5962-8853701GC
3/ OP-37AT/883B M38510/13505BGX
5962-8853701VPA
24355 (4) OP37AZ/QMLV ---
5962-8853701PA
3/
3/
3/
OP-37AD/883B
OP-37AZ/883
OP-37AJ8/883
M38510/13505BPX
5962-8853701V2A
24355 (4) OP37ARC/QMLV ---
5962-8853701VHA
24355 (4) OP37AL/QMLV ---
5962-88537012A
3/ OP-37AL/883 M38510/13505B2X
5962-88537022A
3/ OP-37BRC/883 M38510/13505B2X
5962-8853702GA
3/
3/
OP-37BT/883B
OP-37BJ/883
M38510/13505BGX
5962-8853702GC
3/ OP-37BT/883B M38510/13505BGX
5962-8853702PA
3/
24355 (2)
OP-37BD/883B
OP-37BZ/883
M38510/13505BPX
See footnotes at end of table.
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STANDARD MICROCIRCUIT DRAWING BULLETIN - CONTINUED
DATE: 11-02-09
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
Reference mil itary
specification PIN
5962-8853703GA
3/
3/
3/
OP-37CT/883B
OP-37CJ/883
OP-37CH/883
M38510/13505BGX
5962-8853703GC
3/
OP-37CT/883B M38510/13505BGX
5962-8853703PA
3/
3/
OP-37CD/883B
OP-37CJ8/883
M38510/13505BPX
5962-88537032A
3/ OP-37CL/883 M38510/13505B2X
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufac turer lis ted f o r that part. If the
desired lead finish is not listed contact the vendor
to determine its availa bil it y .
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirem ents of this drawing.
3/ Not available from an approved source of supply.
Vendor CAGE Vendor name
number and address
24355 Analog Devices (2)
RT 1 Industrial Park
PO Box 9106
Norwood, MA 02062
Point of contact: 804 Woburn Street
Wilmington, MA 01887-3462
24355 Analog Devices (4)
RT 1 Industrial Park
PO Box 9106
Norwood, MA 02062
Point of contact: 7910 Triad Center Drive
Greensboro, NC 27409-9605
The information contained herein is disseminated for convenience only and the
Government as su mes no liability whatsoever for any inaccuracies in the
information bulletin.
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