ACS772LCB-100U-PFF-T - ALLEGRO MICROSYSTEMS

Application 1: the ACS772 outputs an analog

signal, VOUT

, that varies linearly with the

bidirectional AC or DC primary sensed cur-

rent, IP

, within the range specified. RF and

CF are for optimal noise management, with

values that depend on the application.

ACS772

The Allegro™ ACS772 family of current sensor ICs provide

economical and precise solutions for AC or DC current sensing,

ideal for motor control, load detection and management, power

supply and DC-to-DC converter control, and inverter control.

The 2.5 µs response time enables overcurrent fault detection

in safety-critical applications.

The device consists of a precision, low-offset linear Hall

circuit with a copper conduction path located near the die.

Applied current flowing through this copper conduction path

generates a magnetic field which the Hall IC converts into a

proportional voltage. Device accuracy is optimized through the

close proximity of the magnetic signal to the Hall transducer.

A precise, proportional output voltage is provided by the

low-offset, chopper-stabilized BiCMOS Hall IC, which is

programmed for accuracy at the factory. Proprietary digital

temperature compensation technology greatly improves the

IC accuracy and temperature stability.

High-level immunity to current conductor dV/dt and stray

electric fields is offered by Allegro proprietary integrated shield

technology for low output voltage ripple and low offset drift

in high-side, high-voltage applications.

ACS772-DS, Rev. 14

MCO-0000363

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

Continued on the next page…

Typical Application

5 V

VOUT RF

CBYP

0.1 µF

IP–

IP+

2GND

ACS772

VIOUT

VCC

• AEC-Q100 Grade 1 qualified

• Typical of 2.5 μs output response time

• 5 V supply operation

• Ultra-low power loss: 100 μΩ internal conductor resistance

• Reinforced galvanic isolation allows use in economical,

high-side current sensing in high-voltage systems

• 4800 Vrms dielectric strength certified under UL60950-1

• Industry-leading noise performance with greatly

improved bandwidth through proprietary amplifier and

filter design techniques

• Integrated shield greatly reduces capacitive coupling

from current conductor to die due to high dV/dt signals,

and prevents offset drift in high-side, high-voltage

applications

• Greatly improved total output error through digitally

programmed and compensated gain and offset over the

full operating temperature range

• Small package size, with easy mounting capability

• Monolithic Hall IC for high reliability

• Output voltage proportional to AC or DC currents

• Factory-trimmed for accuracy

• Extremely stable output offset voltage

Not to scale

DESCRIPTION

FEATURES AND BENEFITS

December 20, 2019

PFF

Leadform

PSF

Leadform

PACKAGE: 5-pin package (suffix CB)

PSS

Leadform

CB Certicate Number:

US-29755-UL

SMT

Leadform

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

The output of the device increases when an increasing current flows

through the primary copper conduction path (from terminal 4 to terminal

5), which is the path used for current sampling. The internal resistance

of this conductive path is 100 μΩ typical, providing low power loss.

The thickness of the copper conductor allows survival of the device

at high overcurrent conditions. The terminals of the conductive path

are electrically isolated from the signal leads (pins 1 through 3). This

allows the ACS772 family of sensor ICs to be used in applications

requiring electrical isolation without the use of opto-isolators or

other costly isolation techniques.

The device is fully calibrated prior to shipment from the factory.

The ACS772 family is lead (Pb) free. All leads are plated with 100%

matte tin, and there is no Pb inside the package. The heavy gauge

leadframe is made of oxygen-free copper.

DESCRIPTION (continued)

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

SELECTION GUIDE

Part Number [1]

Package Primary Sampled

Current , IP

(A)

Sensitivity

Sens (Typ.)

(mV/A) [2]

Nominal TA [3]

(°C) Packing [4]

Terminals Signal Pins

ACS772LCB-050U-PFF-T Formed Formed 50 80

–40 to 150

34 pieces

per tube

ACS772LCB-050B-PFF-T Formed Formed

±50 40ACS772LCB-050B-PSS-T Straight Straight

ACS772LCB-050B-SMT-T Formed Formed

ACS772LCB-100U-PFF-T Formed Formed 100 40

ACS772LCB-100B-PFF-T Formed Formed ±100 20

ACS772LCB-100B-SMT-T Formed Formed

ACS772KCB-150U-PFF-T Formed Formed 150 26.66

–40 to 125ACS772KCB-150B-PFF-T Formed Formed ±150 13.33

ACS772KCB-150B-SMT-T Formed Formed

ACS772ECB-200U-PFF-T Formed Formed 200 20

–40 to 85

ACS772ECB-200B-PFF-T Formed Formed ±200 10

ACS772ECB-250U-PFF-T Formed Formed 250 16

ACS772ECB-250U-PSF-T Straight Formed

ACS772ECB-250B-PFF-T Formed Formed ±250 8

ACS772ECB-250B-PSF-T Straight Formed

ACS772ECB-300B-PFF-T Formed Formed ±300 6.66

ACS772ECB-400B-PFF-T Formed Formed ±400 5

[1] Additional leadform and Sensitivity options available for qualied volumes.

[2] Measured at VCC = 5 V.

[3] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See

Absolute Maximum Ratings and Thermal Application section of this datasheet for more information.

[4] Contact Allegro for additional packing options.

ACS 772 L CB - 050 B T

Lead (Pb) Free

Output Directionality:

B – Bidirectional (positive and negative current)

U – Unidirectional (only positive current)

Current Sensing Range (A)

Package Designator

Operating Temperature Range

3 Digit Part Number

Allegro Current Sensor

- -

Lead Form

PFF

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

ISOLATION CHARACTERISTICS

Characteristic Symbol Notes Rating Unit

Dielectric Surge Strength Test Voltage VSURGE

Tested ±5 pulses at 2/minute in compliance to IEC 61000-4-5 1.2 µs

(rise) / 50 µs (width) 8000 V

Dielectric Strength Test Voltage [2] VISO Agency type-tested for 60 seconds per UL standard 60950-1, 2nd

Edition. Tested at 3000 VRMS for 1 second in production. 4800 VRMS

Working Voltage for Basic Isolation VWVBI For basic (single) isolation per UL standard 60950-1, 2nd Edition 1358 VPK or VDC

960 VRMS

Working Voltage for Reinforced Isolation VWFRI For reinforced (double) isolation per UL standard 60950-1, 2nd Edition 672 VPK or VDC

475 VRMS

[2] Allegro does not conduct 60-second testing. It is done only during the UL certication process.

ABSOLUTE MAXIMUM RATINGS

Characteristic Symbol Notes Rating Unit

Supply Voltage VCC 6.5 V

Reverse Supply Voltage VRCC –0.5 V

Output Voltage VIOUT 6.5 V

Reverse Output Voltage VRIOUT –0.5 V

Output Source Current IOUT(Source) VIOUT to GND 3 mA

Output Sink Current IOUT(Sink) Minimum pull-up resistor of 500 Ω from VCC to VIOUT 10 mA

Maximum Continuous Current ICMAX TA = 25°C 250 A

Operating Ambient Temperature [1] TARange E, K, and L –40 to 150 °C

Maximum Junction Temperature TJ(max) 165 °C

Storage Temperature Tstg –65 to 165 °C

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Thermal

Application section of this datasheet for more information.

ESD RATINGS

Characteristic Symbol Test Conditions Value Unit

Human Body Model VHBM Per AEC-Q100 ±6 kV

Charged Device Model VCDM Per AEC-Q100 ±1 kV

TYPICAL OVERCURRENT CAPABILITIES [4][5]

Characteristic Symbol Notes Rating Unit

Overcurrent IPOC

TA = 25°C; current is on for 1 second and off for 99 seconds, 100 pulses applied 1200 A

TA = 85°C; current is on for 1 second and off for 99 seconds, 100 pulses applied 900 A

TA = 150°C; current is on for 1 second and off for 99 seconds, 100 pulses applied 600 A

[4] Test was done with Allegro evaluation board. The maximum allowed current is limited by TJ(max) only.

[5] For more overcurrent proles, please see FAQ on the Allegro website, www.allegromicro.com.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

IP–

IP+

VCC

GND

VIOUT

Terminal List Table

Number Name Description

1VCC Device power supply terminal

2GND Signal ground terminal

3VIOUT Analog output signal

4IP+ Terminal for current being sampled

5IP– Terminal for current being sampled

Functional Block Diagram

Pinout Diagram

EEPROM and

Control Logic

Active Temperature

Compensation

Signal Recovery

Charge Pump Pulse

Generator

Offset ControlSensitivity Control

Temperature

Sensor

Output Clamps

Undervoltage

Detection

Programming

Control

Dynamic Offset

Cancellation

To all subcircuits

IP–

IP+

GND

BYPASS

VCC

IOUT

THERMAL CHARACTERISTICS: May require derating at maximum conditions

Characteristic Symbol Test Conditions [3] Value Unit

Package Thermal Resistance RθJA

Mounted on the Allegro evaluation board with 2800 mm2

(1400 mm2 on component side and 1400 mm2 on opposite

side) of 4 oz. copper connected to the primary leadframe

and with thermal vias connecting the copper layers.

Performance is based on current flowing through the

primary leadframe and includes the power consumed by

the PCB.

7°C/W

[3] Additional thermal information available on the Allegro website.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Characteristic Symbol Test Conditions Min. Typ. Max. Unit

ELECTRICAL CHARACTERISTICS

Supply Voltage VCC 4.5 5 5.5 V

Supply Current ICC VCC = 5 V, no load on output – 10 15 mA

Power-On Delay tPOD TA = 25°C – 64 – µs

Undervoltage Lockout (UVLO)

Threshold

[1]

VUVLOH VCC rising at 1 V/ms and device functions enabled –4– V

VUVLOL VCC falling at 1 V/ms and device functions enabled – 3.5 – V

UVLO Hysteresis VHYS(UVLO) 250 – – mV

UVLO Enable/Disable Delay

Time [1]

tUVLOE Time measured from falling VCC < VUVLOH to UVLO

enabled – 64 – µs

tUVLOD Time measured from rising VCC > VUVLOH to UVLO

disabled –7–µs

Power-On Reset Voltage VPORH VCC rising at 1 V/ms – 2.9 – V

VPORL VCC falling at 1 V/ms – 2.5 – V

POR Hysteresis VHYS(POR) 250 – – mV

Rise Time trTA = 25°C, CL = 0.47 nF – 2.4 – µs

Propagation Delay Time tPROP TA = 25°C, CL = 0.47 nF – 1.2 – µs

Response Time tRESPONSE TA = 25°C, CL = 0.47 nF – 2.5 – µs

Output Slew Rate SR TA = 25°C, CL = 0.47 nF – 0.67 – V/µs

Internal Bandwidth BWiSmall signal –3 dB, CL = 0.47 nF – 200 – kHz

DC Output Impedance ROUT TA = 25°C – 3.3 – Ω

Output Load Resistance RLOAD(MIN) VIOUT to GND, VIOUT to VCC 4.7 – – kΩ

Output Load Capacitance CLOAD(MAX) VIOUT to GND – 1 10 nF

Primary Conductor Resistance RPRIMARY TA = 25°C – 100 – µΩ

Output Saturation Voltage VSAT(HIGH) TA = 25°C, RL(PULLDWN) = 10 kΩ to GND VCC – 0.2 – – V

VSAT(LOW) TA = 25°C, RL(PULLUP) = 10 kΩ to VCC – – 200 mV

ERROR COMPONENTS

QVO Ratiometry Error [2] RatERRQVO VCC = 4.75 to 5.25 V – ±0.15 – %

Sens Ratiometry Error [2] RatERRSens VCC = 4.75 to 5.25 V – ±0.3 – %

Noise IN

Input referenced noise density; TA = 25°C, CL = 1 nF – 0.15 – mA / √¯(Hz)

Input referenced noise at 200 kHz; TA = 25°C, CL = 1 nF – 85 – mARMS

Nonlinearity [2] ELIN Up to full scale of IP–0.9 ±0.5 0.9 %

Symmetry [2] ESYM Over half-scale IP–0.8 ±0.4 0.8 %

[1] UVLO feature is only available on part numbers programmed to work at VCC = 5 V.

[2] See Characteristic Denitions section of this datasheet.

COMMON OPERATING CHARACTERISTICS: Valid at TA = –40°C to 150°C, CBYP = 0.1 µF, and VCC = 5 V, unless otherwise specied

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X050U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR 0 – 50 A

Sensitivity Sens IPR(min) < IP < IPR(max) –80 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 20.4 – mVp-p

TA = 25°C, CL = 1 nF – 3.4 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.7 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.8 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 120 250 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X050B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –50 – 50 A

Sensitivity Sens IPR(min) < IP < IPR(max) –40 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 20.4 – mVp-p

TA = 25°C, CL = 1 nF – 3.4 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.7 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.8 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 210 250 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X100U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR 0 – 100 A

Sensitivity Sens IPR(min) < IP < IPR(max) –40 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 20.4 – mVp-p

TA = 25°C, CL = 1 nF – 3.4 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.7 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.8 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 280 400 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X100B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –100 – 100 A

Sensitivity Sens IPR(min) < IP < IPR(max) –20 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 20.4 – mVp-p

TA = 25°C, CL = 1 nF – 3.4 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.7 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.8 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X150U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR 0 – 150 A

Sensitivity Sens IPR(min) < IP < IPR(max) –26.66 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 20.4 – mVp-p

TA = 25°C, CL = 1 nF – 3.4 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.7 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.8 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 280 400 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X150B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –150 – 150 A

Sensitivity Sens IPR(min) < IP < IPR(max) –13.33 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 7.2 – mVp-p

TA = 25°C, CL = 1 nF – 1.2 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.7 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.8 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 280 400 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X200U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR 0 – 200 A

Sensitivity Sens IPR(min) < IP < IPR(max) –20 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 7.2 – mVp-p

TA = 25°C, CL = 1 nF – 1.2 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.5 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.7 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.5 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –20 ±6 20 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 160 400 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X200B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –200 – 200 A

Sensitivity Sens IPR(min) < IP < IPR(max) –10 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 5.1 – mVp-p

TA = 25°C, CL = 1 nF – 0.85 – mVRMS

Sensitivity Error ESens

Full scale of IP

, TA = 25°C –1 ±0.5 1 %

Full scale of IP

, TA = 25°C to 150°C –1.25 ±0.7 1.25 %

Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.5 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 380 400 mA

Total Output Error ETOT(HT) Full scale of IP

, TA = 25°C to 150°C –1.5 ±0.7 1.5 %

ETOT(LT) Full scale of IP

, TA = –40°C to 25°C –3.5 ±1.5 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X250U PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR 0 – 250 A

Sensitivity Sens IPR(min) < IP < IPR(max) –16 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Unidirectional; IP = 0 A – VCC / 10 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 5.1 – mVp-p

TA = 25°C, CL = 1 nF – 0.85 – mVRMS

Sensitivity Error ESens

IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %

IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.25 ±0.8 1.25 %

IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 200 400 mA

Total Output Error

ETOT(HT) IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X250B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –250 – 250 A

Sensitivity Sens IPR(min) < IP < IPR(max) –8 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 5.1 – mVp-p

TA = 25°C, CL = 1 nF – 0.85 – mVRMS

Sensitivity Error ESens

IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %

IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.25 ±0.8 1.25 %

IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA

Total Output Error

ETOT(HT) IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X300B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –300 – 300 A

Sensitivity Sens IPR(min) < IP < IPR(max) –6.66 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 5.1 – mVp-p

TA = 25°C, CL = 1 nF – 0.85 – mVRMS

Sensitivity Error ESens

IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %

IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.25 ±0.8 1.25 %

IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA

Total Output Error

ETOT(HT) IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

X400B PERFORMANCE CHARACTERISTICS: TA = –40°C to 150°C [1], VCC

= 5 V, unless otherwise specied

Characteristic Symbol Test Conditions Min. Typ. [2] Max. Unit

NOMINAL PERFORMANCE

Current Sensing Range IPR –400 – 400 A

Sensitivity Sens IPR(min) < IP < IPR(max) –5 ×

VCC / 5 –mV/A

Zero Current Output Voltage VIOUT(Q) Bidirectional; IP = 0 A – VCC / 2 –V

ACCURACY PERFORMANCE

Noise VN

TA = 25°C, CL = 1 nF – 5.1 – mVp-p

TA = 25°C, CL = 1 nF – 0.85 – mVRMS

Sensitivity Error ESens

IP = 200 A, not tested at full scale IP; TA = 25°C –1 ±0.7 1 %

IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.25 ±0.8 1.25 %

IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

Electrical Offset Error

VOE(TA) IP = 0 A, TA = 25°C –8 ±4 8 mV

VOE(TA)HT IP = 0 A, TA = 25°C to 150°C –8 ±4 8 mV

VOE(TA)LT IP = 0 A, TA = –40°C to 25°C –20 ±6 20 mV

Magnetic Offset Error IERROM IP = 0 A, TA = 25°C, after excursion of IPR(max) – 175 400 mA

Total Output Error

ETOT(HT) IP = 200 A, not tested at full scale IP;

TA = 25°C to 150°C –1.5 ±0.9 1.5 %

ETOT(LT) IP = 200 A, not tested at full scale IP;

TA = –40°C to 25°C –3.5 ±1.7 3.5 %

LIFETIME ACCURACY CHARACTERISTICS [3]

Sensitivity Error Including Lifetime ESens(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.6 2.1 %

ESens(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.5 3.5 %

Total Output Error Including Lifetime ETOT(LIFE)(HT) TA = 25°C to 150°C –2.1 ±1.7 2.1 %

ETOT(LIFE)(LT) TA = –40°C to 25°C –3.5 ±2.6 3.5 %

Electric Offset Error Including Lifetime EOFF(LIFE)(HT) TA = 25°C to 150°C –10 ±7 10 mV

EOFF(LIFE)(LT) TA = –40°C to 25°C –20 ±8.9 20 mV

[1] All ACS772 devices are production tested and guaranteed to TA = 150°C, provided the Maximum Junction Temperature, TJ(MAX), is not exceeded. See Absolute Maximum

Ratings and Thermal Application section of this datasheet for more information.

[2] Typical values are ±3 sigma values.

[3] Min/max limits are derived from AEC-Q100 Grade 1 testing.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

-10

-8

-6

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

78.5

79.5

80.5

81.5

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

-0.2

-0.1

0.1

0.2

0.3

0.4

0.5

0.6

0.7

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-2

-1.5

-1

-0.5

0.5

1.5

2.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

100

120

140

160

180

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-050U-PFF-T

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-050B-PFF-T

-6

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

39.4

39.6

39.8

40.2

40.4

40.6

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-1.5

-1

-0.5

0.5

1.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

100

120

140

160

180

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-100U-PFF-T

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

39.4

39.6

39.8

40.2

40.4

40.6

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.1

0.2

0.3

0.4

0.5

0.6

0.7

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

-1.5

-1

-0.5

0.5

1.5

2.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

100

150

200

250

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772LCB-100B-PFF-T

-6

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

19.6

19.7

19.8

19.9

20.1

20.2

20.3

20.4

20.5

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-2

-1.5

-1

-0.5

0.5

1.5

2.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

100

150

200

250

300

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772KCB-150U-PFF-T

-4

-3

-2

-1

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

26.2

26.3

26.4

26.5

26.6

26.7

26.8

26.9

27.1

27.2

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.1

0.2

0.3

0.4

0.5

0.6

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-1.5

-1

-0.5

0.5

1.5

2.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

100

150

200

250

300

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772KCB-150B-PFF-T

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

13.1

13.2

13.3

13.4

13.5

13.6

13.7

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.1

0.2

0.3

0.4

0.5

0.6

0.7

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-2

-1.5

-1

-0.5

0.5

1.5

2.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

100

150

200

250

300

350

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-200U-PFF-T

-6

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

19.4

19.5

19.6

19.7

19.8

19.9

20.1

20.2

20.3

20.4

20.5

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-3

-2

-1

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

100

150

200

250

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-200B-PFF-T

9.8

9.85

9.9

9.95

10.05

10.1

10.15

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.1

0.2

0.3

0.4

0.5

0.6

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-2

-1.5

-1

-0.5

0.5

1.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

-6

-5

-4

-3

-2

-1

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

100

150

200

250

300

350

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-250U-PFF-T

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

15.7

15.75

15.8

15.85

15.9

15.95

16.05

16.1

16.15

16.2

16.25

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

0.45

0.5

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-2

-1.5

-1

-0.5

0.5

1.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

100

150

200

250

300

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-250B-PFF-T

-6

-4

-2

-50 -25 025 50 75 100 125 150

Voe(mV)

Ta(

℃

)

Electrical Offset Voltage versus Ambient Temperature

7.85

7.9

7.95

8.05

8.1

8.15

-50 -25 025 50 75 100 125 150

Sens(mV/A)

Ta(

℃

)

Sensitivity versus Ambient Temperature

0.1

0.2

0.3

0.4

0.5

0.6

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(

℃

)

Nonlinearity versus Ambient Temperature

-1.5

-1

-0.5

0.5

1.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(

℃

)

Total Output Error versus Ambient Temperature

100

150

200

250

300

350

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(

℃

)

Magnetic Offset Error versus Ambient Temperature

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

ACS772ECB-400B-PFF-T

-6

-4

-2

-50 -25 025 50 75 100 125 150

Vo e (m V)

Ta(℃)

Electrical Offset Voltage versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

4.9

4.92

4.94

4.96

4.98

5.02

5.04

5.06

5.08

5.1

5.12

-50 -25 025 50 75 100 125 150

S e n s( m V/A )

Ta(℃)

Sensitivity versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

-50 -25 025 50 75 100 125 150

Elin(%)

Ta(℃)

Nonlinearity versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

-2

-1.5

-1

-0.5

0.5

1.5

2.5

-50 -25 025 50 75 100 125 150

Error(%)

Ta(℃)

Total Output Error versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

100

150

200

250

300

350

-50 -25 025 50 75 100 125 150

Ierrom(mA)

Ta(℃)

Magnetic Offset Error versus Ambient Temperature

Avg-3σ

Avg

Avg+3σ

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

CHARACTERISTIC PERFORMANCE DATA

Response Time (tRESPONSE)

70 A excitation signal with 10%-90% rise time = 1 µs

Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF

Propagation Delay (tPROP)

70 A excitation signal with 10%-90% rise time = 1 µs

Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Rise Time (tR)

70 A excitation signal with 10%-90% rise time = 1 µs

Sensitivity = 13.33 mV/A, TA = 25°C, CBYPASS = 0.1 µF, CLOAD = 1 nF

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

UVLO Enable Time (tUVLOE)

VCC 5 V to 3 V fall time = 1.5 µs, CL = 1 nF

UVLO Disble Time (tUVLOD)

VCC 3 V to 5 V recovery time = 1.5 µs, CL = 1 nF

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Definitions of Accuracy Characteristics

CHARACTERISTIC DEFINITIONS

SENSITIVITY (Sens)

The change in sensor IC output in response to a 1 A change

through the primary conductor. The sensitivity is the product

of the magnetic circuit sensitivity (G / A; 1 G = 0.1 mT) and the

linear IC amplifier gain (mV/G). The linear IC amplifier gain is

programmed at the factory to optimize the sensitivity (mV/A) for

the full-scale current of the device.

SENSITIVITY ERROR (ESens)

The sensitivity error is the percent difference between the mea-

sured sensitivity and the ideal sensitivity. For example, in the case

of VCC = 5 V:

=× 100 (%)

ESens

SensMeas(5V) – SensIdeal(5V)

SensIDEAL(5V)

NOISE (VN)

The noise floor is derived from the thermal and shot noise

observed in Hall elements. Dividing the noise (mV) by the sensi-

tivity (mV/A) provides the smallest current that the device is able

to resolve.

NONLINEARITY (ELIN)

The ACS772 is designed to provide a linear output in response

to a ramping current. Consider two current levels: I1 and I2. Ide-

ally, the sensitivity of a device is the same for both currents, for

a given supply voltage and temperature. Nonlinearity is present

when there is a difference between the sensitivities measured at

I1 and I2. Nonlinearity is calculated separately for the positive

(ELINpos ) and negative (ELINneg ) applied currents as follows:

ELINpos = 100 (%) × {1 – (SensIPOS2 / SensIPOS1

) }

ELINneg = 100 (%) × {1 – (SensINEG2 / SensINEG1

)}

where:

SensIx = (VIOUT(Ix) – VIOUT(Q))/ Ix

and IPOSx and INEGx are positive and negative currents and IPOS2

= 2 × IPOS1 and INEG2 = 2 × INEG1.

Then:

ELIN = max( ELINpos , ELINneg )

SYMMETRY (ESYM)

The degree to which the absolute voltage output from the IC var-

ies in proportion to either a positive or negative half-scale primary

current. The following equation is used to derive symmetry:

100 ×

(

VIOUT_+half-scale amperes – VIOUT(Q)

VIOUT(Q) – VIOUT_–half-scale amperes

)

RATIOMETRY ERROR

The device features a ratiometric output. This means that the

quiescent voltage output, VIOUTQ, and the magnetic sensitivity,

Sens, are proportional to the supply voltage, VCC.The ratiometric

change (%) in the quiescent voltage output is defined as:

RatErrQVO = (VIOUTQ(VCC) / VIOUTQ(5V))

VCC / 5 V × 100%

[ ]

1 –

and the ratiometric change (%) in sensitivity is defined as:

RatErrSens = 1 – (Sens(VCC) / Sense(5V))

VCC / 5 V × 100%

[ ]

ZERO CURRENT OUTPUT VOLTAGE (VIOUT(Q))

The output of the sensor when the primary current is zero. It

nominally remains at 0.5 × VCC for a bidirectional device and 0.1

× VCC for a unidirectional device. For example, in the case of a

bidirectional output device, VCC = 5 V translates into VIOUT(Q) =

2.5 V. Variation in VIOUT(Q) can be attributed to the resolution of

the Allegro linear IC quiescent voltage trim and thermal drift.

ELECTRICAL OFFSET VOLTAGE (VOE)

The deviation of the device output from its ideal quiescent value

of 0.5 × VCC (bidirectional) or 0.1 × VCC (unidirectional) due to

nonmagnetic causes. To convert this voltage to amperes, divide by

the device sensitivity, Sens.

MAGNETIC OFFSET ERROR (IERROM)

The magnetic offset is due to the residual magnetism (remnant

field) of the core material. The magnetic offset error is highest

when the magnetic circuit has been saturated, usually when the

device has been subjected to a full-scale or high-current overload

condition. The magnetic offset is largely dependent on the mate-

rial used as a flux concentrator. The larger magnetic offsets are

observed at the lower operating temperatures.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

TOTAL OUTPUT ERROR (ETOT)

The difference between the current measurement from the sensor

IC and the actual current (IP), relative to the actual current. This

is equivalent to the difference between the ideal output voltage

and the actual output voltage, divided by the ideal sensitivity,

relative to the current flowing through the primary conduction

path:

ETOT(IP) = VIOUT(IP) – VIOUT(ideal)(IP)

Sens

ideal

× I

× 100(%)

where

VIOUT(ideal)(IP) = VIOUT(Q) + (SensIDEAL × IP )

The Total Output Error incorporates all sources of error and is a

function of IP

At relatively high currents, ETOT will be mostly due to sensitiv-

ity error, and at relatively low currents, ETOT will be mostly due

to Offset Voltage (VOE). In fact, as IP approaches zero, ETOT

approaches infinity due to the offset voltage. This is illustrated

in Figure 1 and Figure 2. Figure 1 shows a distribution of output

voltages versus IP at 25°C and across temperature. Figure 2

shows the corresponding ETOT versus IP.

0 A

Decreasing

VIOUT (V)

Accuracy Across

Temperature

Accuracy Across

Temperature

Accuracy Across

Temperature

Accuracy at

25°C Only

Accuracy at

25°C Only

Accuracy at

25°C Only

Increasing

VIOUT (V)

Ideal VIOUT

IPR(min)

IPR(max)

+IP (A)

–IP (A)

VIOUT(Q)

Full Scale IP

Figure 1: Output Voltage versus Sensed Current Figure 2: Total Output Error versus Sensed Current

+IP

–IP

+ETOT

–ETOT

Across Temperature

25°C Only

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Figure 3: Power-On Delay (tPOD)

Definitions of Dynamic Response Characteristics

POWER-ON DELAY (tPOD)

When the supply is ramped to its operating voltage, the device

requires a finite time to power its internal components before

responding to an input magnetic field. Power-On Delay, tPOD, is

defined as the time it takes for the output voltage to settle within

±10% of its steady-state value under an applied magnetic field,

after the power supply has reached its minimum specified operat-

ing voltage, VCC(min), as shown in the chart at right.

RISE TIME (tr)

The time interval between a) when the sensor reaches 10% of

its full-scale value, and b) when it reaches 90% of its full-scale

value.

PROPAGATION DELAY (tPROP)

The time interval between a) when the sensed current reaches

20% of its full-scale value, and b) when the sensor output reaches

20% of its full-scale value.

RESPONSE TIME (tRESPONSE)

The time interval between a) when the applied current reaches

90% of its final value, and b) when the sensor reaches 90% of its

output corresponding to the applied current.

Primary Current

VIOUT

(%)

Propagation Delay, tPROP

Rise Time, tr

VCC

VCC(min)

VIOUT

90% VIOUT

t1= time at which power supply reaches

minimum specified operating voltage

t2=

time at which output voltage settles

within ±10% of its steady-state value

under an applied magnetic field

t1t2

tPOD

(typ)

Figure 4: Rise Time (tr) and Propagation Delay (tPROP)

Primary Current

VIOUT

(%)

Response Time, tRESPONSE

Figure 5: Response Time (tRESPONSE)

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

FUNCTIONAL DESCRIPTION

The descriptions in this section assume: temperature = 25°C, no

output load (RL, CL), and no significant magnetic field is present.

Power-Up

At power-up, as VCC ramps up, the output is in a high-impedance

state. When VCC crosses VPORH (location [1] in Figure 6 and [ 1′ ]

in Figure 7), the POR Release counter starts counting for tPORR

At this point, if VCC exceeds VUVLOH [ 2′ ], the output will go to

VCC / 2 after tUVLOD [ 3′ ] .

If VCC does not exceed VUVLOH [2], the output will stay in the

high-impedance state until VCC reaches VUVLOH [3] and then will

go to VCC / 2 after tUVLOD [ 4 ].

VCC drops below VCC(min) = 4.5 V

If VCC drops below VUVLOL [ 4′, 5 ] , the UVLO Enable Counter

starts counting. If VCC is still below VUVLOL when the counter

reaches tUVLOE

, the UVLO function will be enabled and the

ouput will be pulled near GND [ 6 ] . If VCC exceeds VUVLOL

before the UVLO Enable Counter reaches tUVLOE [ 5′ ] , the output

will continue to be VCC / 2.

Coming Out of UVLO

While UVLO is enabled [ 6 ] , if VCC exceeds VUVLOH [ 7 ] ,

UVLO will be disabled after tUVLOD , and the output will be

VCC / 2 [ 8 ] .

Power-Down

As VCC ramps down below VUVLOL [ 6′, 9 ] , the UVLO Enable

Counter will start counting. If VCC is higher than VPORL when

the counter reaches tUVLOE , the UVLO function will be enabled

and the output will be pulled near GND [ 10 ] . The output will

enter a high-impedance state as VCC goes below VPORL [ 11 ] . If

VCC falls below VPORL before the UVLO Enable Counter reaches

tUVLOE , the output will transition directly into a high-impedance

state [ 7′ ].

Power-On Reset (POR) and Undervoltage

Lockout (UVLO) Operation

EEPROM Error Checking And Correction

Hamming code methodology is implemented for EEPROM

checking and correction. The device has ECC enabled after

power-up. If an uncorrectable error has occurred, the VOUT pin

will go to high impedance and the device will not respond to

applied magnetic field.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

tUVLOE

tPORR

tUVLOD

UVLOE

1’ 2’ 4’ 5’ 6’ 7’

3’

5.0

VUVLOH

VPORH

VPORL

VPORH

VPORL

VUVLOL

2.5

High Impedance High Impedance

Slope =

VCC /

Slope =

VCC /

GND Time

Time

GND

VCC

VOUT

5.0

2.5

GND

VOUT

356711

Slope =

VCC /

tUVLOE

Figure 6: POR and UVLO Operation: Slow Rise Time Case

Figure 7: POR and UVLO Operation: Fast Rise Time Case

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Chopper Stabilization Technique

Amp

Regulator

Clock/Logic

Hall Element

Tuned

Filter

Anti-Aliasing

LP Filter

Figure 8: Concept of Chopper Stabilization Technique

When using Hall-effect technology, a limiting factor for

switchpoint accuracy is the small signal voltage developed across

the Hall element. This voltage is disproportionally small relative to

the offset that can be produced at the output of the Hall sensor IC.

This makes it difficult to process the signal while maintaining an

accurate, reliable output over the specified operating temperature

and voltage ranges.

Chopper stabilization is a unique approach used to minimize

Hall offset on the chip. Allegro employs a technique to remove

key sources of the output drift induced by thermal and mechani-

cal stresses. This offset reduction technique is based on a signal

modulation-demodulation process. The undesired offset signal is

separated from the magnetic field-induced signal in the frequency

domain, through modulation. The subsequent demodulation acts

as a modulation process for the offset, causing the magnetic field-

induced signal to recover its original spectrum at baseband, while

the DC offset becomes a high-frequency signal. The magnetic-

sourced signal then can pass through a low-pass filter, while the

modulated DC offset is suppressed.

In addition to the removal of the thermal and stress related offset,

this novel technique also reduces the amount of thermal noise

in the Hall sensor IC while completely removing the modulated

residue resulting from the chopper operation. The chopper sta-

bilization technique uses a high-frequency sampling clock. For

demodulation process, a sample-and-hold technique is used. This

high-frequency operation allows a greater sampling rate, which

results in higher accuracy and faster signal-processing capability.

This approach desensitizes the chip to the effects of thermal and

mechanical stresses, and produces devices that have extremely

stable quiescent Hall output voltages and precise recoverabil-

ity after temperature cycling. This technique is made possible

through the use of a BiCMOS process, which allows the use of

low-offset, low-noise amplifiers in combination with high-density

logic integration and sample-and-hold circuits.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

APPLICATION INFORMATION

Thermal Rise vs. Primary Current

Self-heating due to the flow of current should be considered dur-

ing the design of any current sensing system. The sensor, printed

circuit board (PCB), and contacts to the PCB will generate heat

as current moves through the system.

The thermal response is highly dependent on PCB layout, copper

thickness, cooling techniques, and the profile of the injected current.

The current profile includes peak current, current “on-time”, and

duty cycle. While the data presented in this section was collected

with direct current (DC), these numbers may be used to approximate

thermal response for both AC signals and current pulses.

The plot in Figure 9 shows the measured rise in steady-state die

temperature of the ACS772 versus continuous current at an ambi-

ent temperature, TA, of 25°C. The thermal offset curves may be

directly applied to other values of TA. Conversely, Figure 10 shows

the maximum continuous current at a given TA. Surges beyond the

maximum current listed in Figure 10 are allowed given the maxi-

mum junction temperature, TJ(MAX) (165℃), is not exceeded.

Figure 9: Self-Heating in the CB Package

Due to Current Flow

Figure 10: Maximum Continuous Current at a Given TA

The thermal capacity of the ACS772 should be verified by the

end user in the application’s specific conditions. The maximum

junction temperature, TJ(MAX) (165℃), should not be exceeded.

Further information on this application testing is available in

the DC and Transient Current Capability application note on the

Allegro website.

ASEK772 Evaluation Board Layout

Thermal data shown in Figure 9 was collected using the

ASEK772 Evaluation Board (TED-85-0385-001). This board

includes 2664 mm2 of 4 oz. copper (0.1388 mm) connected to

pins 4 and 5 with thermal vias connecting the layers. Top and bot-

tom layers of the PCB are shown below in Figure 11.

Figure 11: Top and Bottom Layers

for ASEK772 Evaluation Board

Gerber files for the ASEK772 evaluation board are available for

download from the Allegro website. See the technical documents

section of the ACS772 device webpage.

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Figure 12: Package CB, 5-Pin, Leadform PFF

Creepage distance, current terminals to signal pins: 7.25 mm

Clearance distance, current terminals to signal pins: 7.25 mm

Package mass: 4.63 g typical

For Reference Only – Not for Tooling Use

(Reference DWG-9111 & DWG-9110)

Dimensions in millimeters –NOT TO SCALE

Dimensions exclusive of mold ﬂash, gate burs, and dambar protrusions

Exact case and lead conﬁguration at supplier discretion within limits shown

R1 = 1.0

1.91

21.4

0.5

R3 = 3.0

Ø0.8

Ø1.5

Ø0.5

R2 = 2.05

1° ±2°

5° ±5°

17.5 ±0.2

2.9 ±0.2

3.5 ±0.2

1.50 ±0.10

Branded

Face

0.381 +0.060

–0.030

XXXXXXX

XXX-XXX

XXXXXXX

XXXX

Dambar removal intrusion

Perimeter through-holes recommended

PCB Layout Reference View

Lines 1, 2, 3, 4 = 7 characters.

Line 1: Part Number

Line 2: Package Temperature - Amperes

Line 3: Lot Number

Line 4: Date Code, Logo A

Standard Branding Reference View

Branding scale and appearance at supplier discretion

14.0 ±0.2

4.0 ±0.2

3.0 ±0.2

10.00 ±0.10

0.51 ±0.10

7.00 ±0.10

1.9 ±0.2

13.00 ±0.10

4.40 ±0.10

PACKAGE OUTLINE DRAWING

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Figure 13: Package CB, 5-Pin, Leadform PSF

For Reference Only – Not for Tooling Use

(Reference DWG-9111, DWG-9110)

Dimensions in millimeters – NOT TO SCALE

Dimensions exclusive of mold ﬂash, gate burs, and dambar protrusions

Exact case and lead conﬁguration at supplier discretion within limits shown

A2.75 ±0.10

1.50 ±0.10

14.0 ±0.2

4.0 ±0.2

3.0 ±0.2

10.00 ±0.10

7.00 ±0.10

13.00 ±0.10

4.40 ±0.10

23.50 ±0.5

Branded

Face

ADambar removal intrusion

231

0.51 ±0.10

1.9 ±0.2

5º±5°

2.9 ±0.2

3.5 ±0.2

0.381 +0.060

–0.030

1.91

∅0.8

∅1.5

BPCB Layout Reference View

Perimeter through-holes recommended

Branding scale and appearance at supplier discretion

XXXXXXX

XXX-XXX

XXXXXXX

XXXX

Lines 1, 2, 3, 4 = 7 characters.

Line 1: Part Number

Line 2: Package Temperature - Amperes

Line 3: Lot Number

Line 4: Date Code, Logo A

Standard Branding Reference Vi

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Figure 14: Package CB, 5-Pin, Leadform PSS

For Reference Only–Not for Tooling Use

(Reference DWG-9111, DWG-9110)

Dimensions in millimeters – NOT TO SCALE

Dimensions exclusive of mold ﬂash, gate burs, and dambar protrusions

Exact case and lead conﬁguration at supplier discretion within limits shown

2 31

A2.75 ±0.10

3.18 ±0.10

1.50 ±0.10

14.0 ±0.2

4.0 ±0.2

3.0 ±0.2

10.00 ±0.10

0.51 ±0.10

7.00 ±0.10

1.9 ±0.2

13.00 ±0.10

4.40 ±0.10

11.0 ±0.05

23.50 ±0.5

0.381+0.060

–0.030

Branded

Face

ADambar removal intrusion

1.91

∅0.8

∅1.5

BPCB Layout Reference View

Perimeter through-holes recommended

Branding scale and appearance at supplier discretion

XXXXXXX

XXX-XXX

XXXXXXX

XXXX

Lines 1, 2, 3, 4 = 7 characters.

Line 1: Part Number

Line 2: Package Temperature - Amperes

Line 3: Lot Number

Line 4: Date Code, Logo A

Standard Branding Reference View

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

Figure 15: Package CB, 5-Pin, Leadform SMT

Note: The SMT leadform package variant is considered

Advance Information, and is subject to change without notice.

For Reference Only–Not for Tooling Use

(Reference DWG-9111, DWG-9110)

Dimensions in millimeters – NOT TO SCALE

Dimensions exclusive of mold ﬂash, gate burs, and dambar protrusions

Exact case and lead conﬁguration at supplier discretion within limits shown

2 31

A3.3 ±0.5

3.7 ±0.5

1.50 ±0.10

14.0 ±0.2

4.0 ±0.2

3.0 ±0.2

10.00 ±0.10

0.51 ±0.10

7.00 ±0.10

1.9 ±0.2

13.00 ±0.10

4.40 ±0.10

9.5 ±0.5

0.381+0.060

–0.030

Branded

Face

ADambar removal intrusion

BBranding scale and appearance at supplier discretion

XXXXXXX

XXX-XXX

XXXXXXX

XXXX

Lines 1, 2, 3, 4 = 7 characters.

Line 1: Part Number

Line 2: Package Temperature - Amperes

Line 3: Lot Number

Line 4: Date Code, Logo A

Standard Branding Reference View

2.6 MIN

2.4 ±0.5

9.6 ±0.5

45°

3.8 ±0.5

60°

0.50 REF

to pin tip

0°-8°

137.0°

0.56 REF

to pin tip

0°-8°

PCB Layout Reference View

16.0

6.01

4.40

33.27

1.27

5.03

High Accuracy, Hall-Effect-Based, 200 kHz Bandwidth,

Galvanically Isolated Current Sensor IC with 100 µΩ Current Conductor

ACS772

Allegro MicroSystems

955 Perimeter Road

Manchester, NH 03103-3353 U.S.A.

www.allegromicro.com

For the latest version of this document, visit our website:

www.allegromicro.com

Allegro MicroSystems reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit

improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the

information being relied upon is current.

Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of

Allegro’s product can reasonably be expected to cause bodily harm.

The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems assumes no responsibility for its use; nor

for any infringement of patents or other rights of third parties which may result from its use.

Copies of this document are considered uncontrolled documents.

Revision History

Number Date Description

– December 12, 2017 Initial release

1January 30, 2018 Added Dielectric Surge Strength Test Voltage characteristic (page 3) and EEPROM Error Checking

and Correction section (page 16)

2May 14, 2018 Added -050U, -100B, -150U, -200U, -250U, and -250B part options

3 September 24, 2018 Added -PSF leadform option; updated Magnetic Offset Error value (page 13) and Characteristic

Performance Data charts (pages 26 to 28)

4November 12, 2018

Added -300B part option (page 2 and 16); added -PSS leadform option (pages 1, 2, and 39) and

Applications Information section (page 36); updated Typical Application (page 1), pinout diagram

(page 4), and TOP to TA (pages 2 and 5-15).

5 December 13, 2018 Added UL certificate; updated package outline drawing PCB layouts and branding (pages 37-39)

6January 7, 2019 Corrected Sensitivity Error values for -200U part option (page 12)

7January 24, 2019 Added -400B part option (page 2 and 17)

8March 14, 2019 Updated package branding (pages 38-40) and Temperature ratings (pages 2-3, 6-17)

9June 27, 2019 Corrected EVB copper thickness (page 37)

10 August 1, 2019 Added -400B Characteristic Performance Data charts (page 28)

11 August 28, 2019 Added Maximum Continuous Current to Absolute Maximum Ratings table (page 3),

ESD ratings table (page 3), and updated thermal data section (page 38)

12 November 6, 2019 Added SMT leadform package variant (pages 1, 3, 43) and Isolation Characteristics Pending

Certification (page 4).

13 December 10, 2019 Added PCB Layout Reference View to SMT leadform package drawings (page 43)

14 December 20, 2019

Removed Advance Information status from SMT leadform package variant (pages 1, 3); updated

Working Voltage for Basic Isolation and Working Voltage for Reinforced Isolation (page 4), Rise Time,

Response Time, Propagation Delay, and Output Slew Rate test conditions, and Output Slew Rate value

(page 6).