User Guide for FEBFAN6602R_CH10U40A Evaluation Board Fairchild Computing Notebook Adapter Featured Fairchild Product: FAN6602R Direct questions or comments about this evaluation board to: "Worldwide Direct Support" Fairchild Semiconductor.com (c) 2014 Fairchild Semiconductor Corporation FEBFAN6602RM6X_CH10U40A * Rev. 1.1 Table of Contents 1. Introduction ............................................................................................................................... 3 2. Evaluation Board Specifications ............................................................................................... 4 3. Photographs............................................................................................................................... 5 4. Printed Circuit Board ................................................................................................................ 6 5. Schematic .................................................................................................................................. 7 6. Bill of Materials ........................................................................................................................ 8 7. Transformer and Winding Specifications ............................................................................... 10 8. Test Conditions & Test Equipment......................................................................................... 11 9. Performance of Evaluation Board ........................................................................................... 11 9.1. 9.2. 9.3. 9.4. 9.5. 9.6. 9.7. 9.8. 9.9. 9.10. 9.11. 9.12. 9.13. 9.14. 9.15. 9.16. 9.17. Input Wattage at No Load Condition ............................................................................. 11 Startup Time................................................................................................................... 12 Hold-up Time ................................................................................................................. 12 Input Current .................................................................................................................. 13 DC Output Rising Time ................................................................................................. 13 Dynamic Response......................................................................................................... 14 Output Ripple & Noise .................................................................................................. 14 VDD Voltage Level ....................................................................................................... 15 Short-Circuit Protection (SCP) ...................................................................................... 15 Overload Protection (OLP) ............................................................................................ 16 Voltage Stress on MOSFET & Rectifiers ...................................................................... 16 Line & Load Regulation ................................................................................................ 17 Efficiency ....................................................................................................................... 17 Over-Current Protection( OCP ) .................................................................................... 18 Conducted Electromagnetic Interference (EMI) ............................................................ 19 Surge Test ...................................................................................................................... 19 ESD Test ........................................................................................................................ 20 10. Revision History ..................................................................................................................... 21 (c) 2014 Fairchild Semiconductor Corporation 2 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 This user guide supports the evaluation kit for the FAN6602R. It should be used in conjunction with the FAN6602R datasheets as well as Fairchild's application notes and technical support team. Please visit Fairchild's website at https://www.fairchildsemi.com/ 1. Introduction This document is an engineering report describing a 40 W power supply using the FAN6602R, which is targeted for notebook adapters. It also describes the simple, low cost and high performance reference design evaluation board. The operating current in the FAN6602R is as small as 3 mA. The small operating current results in higher efficiency and reduces the VDD hold-up capacitance requirement. Once the FAN6602R enters deep-green mode, the operating current is reduce to 0.6 mA, thus assisting the power supply to easily meet the power conservation. By using the FAN6602R, an adapter can be implemented with fewest external components and minimized cost. (c) 2014 Fairchild Semiconductor Corporation 3 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 2. Evaluation Board Specifications All data in Table 1 was measured with 90 VAC~264 VAC line input at an ambient temperature of 25C. Table 1. Summary of Features and Performance Specification Min. Max. Unit Input Voltage 90 264 VAC Input Frequency 47 63 Hz Description Design Spec. Test Result Output Voltage 18.05~19.95 V 0.9% Comments CV<5% Regulation CC<5% Regulation Output Current Protection 2.5 ~3.5 A 2.93~3.02 A Input Power < 100 mW 85 mW 264 VAC 345 mVp-p (Max.) Measured at PCB End Ripple Startup Time <2S 1.8 S Full Load Dynamic >18.5 V 18.7 V Measure at PCB End 600 V 582 V 264 VAC 100 V 93 V 264 VAC Efficiency Avg. 85.29% 89.09% at 115 V 89.16% at 230 V Meets Energy Star v2.0. Conducted EMI Under 6 dB 3 dB Margin Meets CISPER22B/EN55022B/IE C950/UL1950 Class II Voltage Stress (c) 2014 Fairchild Semiconductor Corporation 4 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 3. Photographs Figure 1. Photograph (W x L: 34 x 84 mm2) Top View Figure 2. Photograph (W x L: 34 x 84 mm2) Bottom View Figure 3. Photograph (H:24 mm) Side View (c) 2014 Fairchild Semiconductor Corporation 5 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 4. Printed Circuit Board Figure 4. Top View Figure 5. Bottom View (c) 2014 Fairchild Semiconductor Corporation 6 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 Schematic 5. L N F1 Fuse 2A MOV C2 0.33F 275V R1 1.5M ohm R2 1.5M ohm R12 0 ohm U3 Photo-coupler TX2 C3 2.2nF 400V C7 1nF C4 82F 400V GATE U1 FAN6602R GND VDD SENSE FB RT R11 5.6k ohm BD1 Bridge Rectifier 2A/600V C13 1nF TR2 NTC 100k ohm R7 100k ohm C5 1nF 1kV D5 1N4148 D2 1N4007 R17 100 ohm R20 20 ohm R6 100 ohm C8 470pF Q1 MOSFET 7.5A/600V R8 0.33 ohm 1W D4 1N4148 C12 C14 4.7F 0.1F 50V L1 short D3 1N4007 R9 0 ohm C9 22F 50V C1 1nF C6 680F 25V C15 1F 100V R15 18k ohm R16 120k ohm C11 330F 25V R18 4.7k ohm R14 C10 1k ohm 6.8nF R13 620 ohm D1 20S100CT R3 20 ohm U3 Photo-coupler U2 TL431 Vo GND FEBFAN6602RM6X_CH10U40A * Rev. 1.1 7 (c) 2014 Fairchild Semiconductor Corporation Evaluation Board Schematic Figure 6. 6. Bill of Materials Part Specification Package Qty. No. JUMPER WIRE 0.8(mm) REEL 8 JP0~JP4, NTC1, L1, L2 Metal-Oxide Resister 1 W 0.33 10% REEL 1 R8 SMD Resister 0805 0 5% REEL 1 R9, R12 SMD Resister 0805 20 5% REEL 1 R20 SMD Resister 0805 100 5% REEL 2 R6 SMD Resister 0805 620 5% REEL 1 R13 SMD Resister 0805 1 k 5% REEL 1 R14 SMD Resister 0805 5.6 k 5% REEL 1 R11 SMD Resister 0805 18 k 5% REEL 1 R15 SMD Resister 0805 4k7 5% REEL 1 R18 SMD Resister 1206 20 5% REEL 1 R3 SMD Resister 1206 100 5% REEL 1 R17 SMD Resister 1206 100 k 5% REEL 1 R7 SMD Resister 1206 120 k 5% REEL 1 R16 SMD Resister 1206 1.5 M 5% REEL 2 R1, R2 0805 X7R 0% 1 nF 50 V REEL 2 C7, C13 0805 X7R 10% 470 pF 50 V REEL 1 C8 0805 X7R 10% 6.8 nF 50 V REEL 1 C10 0805 X7R 10% 0.1 F 50 V REEL 1 C14 1206 X7R 10% 1 nF 100 V REEL 1 C1 1206 X7R 10% 1 F 100 V REEL 1 C15 Ceramic Capacitor 1 nF 1 kV REEL 1 C5 Electrolytic Capacitor 82 F 400 V 105C REEL 1 C4 Electrolytic Capacitor 680 F 25 V 105C REEL 1 C6 Electrolytic Capacitor 22 F 50 V 105C REEL 1 C9 Electrolytic Capacitor 330 F 25 V 105C REEL 1 C11 Electrolytic Capacitor 4.7 F 50 V 105C REEL 1 C12 X2 Capacitor 0.33 F 275 V 10 % REEL 1 C2 Y1 Capacitor 2.2 nF 250 V 20 % REEL 1 C3 MOV Oxide Varistor 471 REEL 1 MOV Common Choke 25 mH 10 % SUMIDA (04291-T145) 1 TX2 Transformer RM-8 920 H SUMIDA (10344-T018) 1 TR1 FUSE GLASS 250 V/2 A 36SG Slow-Blow 3.6 x 10 mm 1 F1 NTC Resister 100 k REEL 1 TR2 SMD Diode 1 A/1000 V SOD-80 LL4148 REEL 2 D4, D5 Diode 1 A/700 V DO-41 1N4007 REEL 2 D2, D3 Continued on the following page... (c) 2014 Fairchild Semiconductor Corporation 8 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 Part Specification Package Qty. No. Bridge Rectifier 2 A/600 V 2KBP06M 1 BD1 Schottky Diode 20 A/100 V TO-220 YM20S100CT 1 D1 MOSFET 7.5 A/600 V TO-220 FQP8N60C 1 Q1 REGULATOR 1% TO-92 FAN431ACZ-AP 1 U2 Photo Coupler DIP FOD817A 1 U3 PWM Controller SOT23-6L FAN6602RM6X 1 U1 Heat Sink 55 x 20 x 1.5 mm MCH0636 1 HS1 Heat Sink 11.5 x 24.9(L) x 17(H) x 1.5(W) mm MCH0637 1 HS2 PCB PLM0068 REV0 For FAN6602R 40 W 1 (c) 2014 Fairchild Semiconductor Corporation 9 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 7. Transformer and Winding Specifications Core: RM-8 Bobbin: RM-8 Figure 7. Transformer Specifications & Construction Table 2. Winding Specifications Winding N4 Copper Shielding (E2) Terminal Winding Turns Isolation Layer Start Pin End Pin 2 3 0.25 mm*1 33 4 Open Copper Foil 0.025 mm 1.2 3 11 Turns N3 10 11 0.25 mm*1 9 1 N2 TP6 TP7 0.5 mm*1 12 3 Copper Shielding (E1) 11 Open Copper Foil 0.025 mm 1.2 3 N1 1 2 0.25 mm*1 33 2 (c) 2014 Fairchild Semiconductor Corporation 10 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 Table 3. Electrical Characteristics 8. Pin Specification Remark Inductance 3-1 920 H 10% 1 kHz, 1 V Effective Leakage 3-1 50 H Max. Short Other Pin Test Conditions & Test Equipment Table 4. Test Conditions & Test Equipment 9. Evaluation Board # FEBFAN6602RM6X_CH10U40A Test Date 2014-12-02 Test Temperature 25 Test Equipments AC Power Source: 6800 AC POWER SOURCE Electronic Load: Chroma 63030 and 63102 Power Meter : WT210 Oscilloscope : LeCory 24Xs-A Performance of Evaluation Board 9.1. Input Wattage at No Load Condition Test Condition: Measure the input wattage at no load condition. Table 5. Test Results Input Voltage Input Wattage Output Voltage 90 VAC / 60 Hz 38 mW 19.27 V 115 VAC / 60 Hz 42 mW 19.27 V 230 VAC / 50 Hz 76 mW 19.27 V 264 VAC / 50 Hz 85 mW 19.27 V Figure 8. (c) 2014 Fairchild Semiconductor Corporation Input Wattage Curve 11 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.2. Startup Time Test Condition: Measure the time from the AC plug-in to nominal output voltage build-up at full load condition. Table 6. Test Results Input Voltage Startup Time Specification 90 VAC / 60 Hz 1.8 s <2 sec 264 VAC / 50 Hz 0.537 s <2 sec Waveforms: Figure 9. 9.3. C1[VIN], C4[VO], 90 VAC / 60 Hz Figure 10. C1[VIN], C4[VO]. 264 VAC / 50 Hz Hold-up Time Test Condition Set output at maximum load. Measure the time interval between AC off and output voltage falling to lower limit of rated value. The AC waveform should be off at zero degree. Table 7. Test Results Input Voltage Hold-up Time 90 VAC / 60 Hz 7.9 ms 115 VAC / 60 Hz 15.1 ms 230 VAC / 50 Hz 83.9 ms 264 VAC / 50 Hz 119 ms Waveforms: Figure 11. Figure 12. C1[VIN], C4[Vo], 90 VAC / 60 Hz (c) 2014 Fairchild Semiconductor Corporation 12 C1[VIN], C4[Vo], 264 VAC / 50 Hz FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.4. Input Current Test Condition: Measure the AC input current at maximum output loading, where the maximum input power occurs. Table 8. Test Results 9.5. Input Voltage Input Current 90 VAC / 60 Hz 964 mA 264 VAC / 50 Hz 445 mA Specification DC Output Rising Time Test Condition: Measure the time interval between 10% to 90% of the output voltage during startup. Table 9. Test Results Input Voltage Minimum Load Full Load 90 VAC/60 Hz 4.32 ms 5.87 ms 264 VAC/50 Hz 3.7 ms 5.06 ms Specification <20 ms Waveforms: Figure 13. C4[VO], 90 VAC/60 Hz, Minimum Load Figure 14. C4[VO], 90 VAC/60 Hz, Full Load Figure 15. C4[VO], 264 VAC/50 Hz, Minimum Load Figure 16. C4[VO] 264 VAC/50 Hz, Full Load (c) 2014 Fairchild Semiconductor Corporation 13 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.6. Dynamic Response Test Condition Dynamic loading (20%~80%), 50% duty cycle (5 ms), 2.5 A/sec rise/fall time. Measured at PCB end. Table 10. Test Results Input Voltage Overshoot Undershoot 115 VAC/60 Hz 262 mV 102 mV 230 VAC/50 Hz 301 mV 128 mV Specification Waveforms: Figure 17. C4[VO], 115 VAC / 60 Hz 9.7. Figure 18. C4[VO], 230 VAC / 50 Hz Output Ripple & Noise Test Condition Measure the output voltage ripple at full load condition at EVB end with 10 F electrolytic capacitor in parallel with 0.1 F MLCC. Table 11. Test Results Input Voltage Full Load 90 VAC / 60 Hz 345 mVP-P 115 VAC / 60 Hz 312 mVP-P 230 VAC / 50 Hz 292 mVP-P 264 VAC / 50 Hz 299 mVP-P Specification Waveforms: Figure 19. C4[VO], 90 VAC / 60 Hz (c) 2014 Fairchild Semiconductor Corporation Figure 20. C4[VO], 264 VAC / 50 Hz 14 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.8. VDD Voltage Level Test Condition Measure VDD voltage at minimum, maximum loading and close over current protection point. Table 12. Test Result Input Voltage Minimum load Maximum load Near OCP 90 VAC / 60 Hz 12.45 V 14.8 V 16.4 V 264 VAC / 50 Hz 12.6 V 14 V 154 V Specification < 22.5 V Waveforms: Figure 21. 9.9. C2[VCS ], C3[VDD] 90 VAC / 60 Hz & Max. Load Figure 22. C2[VCS ], C3[VDD] 264 VAC / 50 Hz & Max. Load Short-Circuit Protection (SCP) Test Condition Short output terminal, then the controller should enter hiccup mode protection with less than 10 ms. Table 13. Test Results with Input Power Maximum Output Load Minimum Output Load 90 VAC / 60 Hz 7.18 ms 7.31 ms 264 VAC / 50 Hz 7.04 ms 7.14 ms Specification < 10 ms Waveforms: Figure 23. C1[FB], C2[GATE], C3[VO], C4[VDD], 90 VAC/60 Hz (c) 2014 Fairchild Semiconductor Corporation 15 Figure 24. C1[FB], C2[GATE], C3[VO], C4[VDD], 264 VAC/50 Hz FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.10. Overload Protection (OLP) Test Condition: Increase output loading gradually to trigger OLP and measure the debounce time. Table 14. Test Results Input Voltage Minimum Load Maximum Load 90 VAC / 60 Hz 63.8 ms 64.1 ms 264 VAC / 50 Hz 63.5 ms 60.1 ms Specification 54 ms < tD-OLP <66 ms Waveforms: Figure 25. C1[FB], C2[GATE], C3[VO], C4[VDD], 90 VAC/60 Hz Figure 26. C1[FB], C2[GATE], C3[VO], C4[VDD], 264 VAC/50 Hz 9.11. Voltage Stress on MOSFET & Rectifiers Test Condition Measure the voltage and current stress on MOSFET and secondary rectifier under below the conditions where the maximum voltage stress occurs. Table 15. Test Results Normal Short Circuit 90 VAC/ 60 Hz 264 VAC/ 50 Hz Full Load Full Load MOSFET 322 V 582 V Rectifier 55 V 86 V MOSFET 294 V 502 V Rectifier 28 V 93 V Specification VDS<600 V VD<100 V Waveform: Figure 27. (c) 2014 Fairchild Semiconductor Corporation C1[VAK], C4[VDS] 264 VAC/50 Hz, Full Load 16 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.12. Line & Load Regulation Test Condition Measure the line/load regulation according universal input and minimum to maximum loading. Table 16. Test Results Input Voltage Output Voltage at Maximum Loading Output Voltage at Minimum Loading Load Regulation 90 VAC / 60 Hz 19.11 V 19.276 V 0.8% 115 VAC / 60 Hz 19.09 V 19.276 V 0.9% 132 VAC / 60 Hz 19.09 V 19.274 V 0.9% 180 VAC / 50 Hz 19.10 V 19.274 V 0.8% 230 VAC / 50 Hz 19.08 V 19.272 V 0.9% 264 VAC / 50 Hz 19.09 V 19.27 V 0.9% Line Regulation 0.13% 0.031% Specification < 5% 9.13. Efficiency Test Condition Measure the efficiency at universal input voltage and maximum loading. Table 17. Test Results Input Voltage 90 VAC / 60 Hz 115 VAC / 60 Hz 230 VAC / 50 Hz 264 VAC / 50 Hz Output Voltage Output Current Input Wattage Efficiency 19.224 V 19.178 V 19.134 V 19.108 V 19.216 V 19.188 V 19.132 V 19.088 V 19.226 V 19.184 V 19.138 V 19.094 V 19.222 V 19.174 V 19.134 V 19.128 V 0.52 A 1.042 A 1.571 A 2.109 A 0.52 A 1.044 A 1.571 A 2.109 A 0.52 A 1.044 A 1.571 A 2.109 A 0.52 A 1.044 A 1.571 A 2.094 A 11.26 W 22.53 W 33.97 W 45.94 W 11.29 W 22.36 W 33.61 W 45.32 W 11.29 W 22.39 W 33.66 W 45.08 W 11.34 W 22.61 W 33.7 W 44.74 W 88.78% 88.70% 88.49% 87.72% 88.51% 89.59% 89.43% 88.83% 88.55% 89.45% 89.32% 89.33% 88.14% 88.53% 89.2% 89.53% Average Efficiency 88.42% 89.09% 89.16% 88.85% 115VAC 60Hz (89.09% avg) 230VAC 50Hz (89.16% avg) 85.29% (Energy star V2.0) Figure 28. (c) 2014 Fairchild Semiconductor Corporation 4 Points Efficiency Curve 17 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.14. Over-Current Protection( OCP ) Test Condition Increase output loading current gradually and measure the output maximum current. Table 18. Test Results Input Voltage Over Current Protection 90 VAC / 60 Hz 2.95 A 115 VAC / 60 Hz 3.02 A 230 VAC / 50 Hz 2.93 A 264 VAC / 50 Hz 2.96 A Specification Curve: Figure 29. (c) 2014 Fairchild Semiconductor Corporation Output Current Protection Curve 18 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.15. Conducted Electromagnetic Interference (EMI) Test Condition Frequency Range: 150 kHz - 30 MHz, Probe: 2-Line-LISN ENV216 Signal Path: Receiver-2-Line-LISN ENV216, Detectors: Average Output Load: 9.025 Test Results: Att dBV 10 1 100 dB RBW 9 kHz MT 1 s PREAMP OFF MHz Att 10 dBV MHz 90 1 100 10 dB RBW 9 kHz MT 1 s PREAMP OFF MHz 10 MHz 90 SGL SGL 1 PK MAXH 1 PK MAXH 80 2 AV MAXH 80 2 AV TDF 70 MAXH EN55022Q TDF 70 EN55022Q 60 60 PRN EN55022A PRN EN55022A 50 50 6DB 6DB 40 40 30 30 20 20 10 10 0 150 Date: 0 kHz 30 20.OCT.2009 150 17:27:47 Date: Figure 30. Att dBV MHz 10 1 100 dB 9 kHz MT 1 s PREAMP OFF MHz 30 20.OCT.2009 Line: 115 VAC / 60 Hz RBW kHz 17:31:36 Figure 31. Att 10 dBV MHz 90 MHz 1 100 Neutral: 115 VAC / 60 Hz 10 dB MHz RBW 9 kHz MT 1 s PREAMP OFF 10 MHz 90 SGL SGL 1 PK MAXH 1 PK MAXH 80 2 AV MAXH 80 2 AV TDF 70 MAXH EN55022Q TDF 70 EN55022Q 60 60 PRN EN55022A PRN EN55022A 50 50 6DB 6DB 40 40 30 30 20 20 10 10 0 150 Date: 0 kHz 30 20.OCT.2009 MHz 150 17:23:34 Figure 32. Date: Line: 230 VAC / 50 Hz kHz 30 20.OCT.2009 MHz 17:19:53 Figure 33. Neutral: 230 VAC / 50 Hz 9.16. Surge Test Test Condition 230 VAC / 50 Hz, maximum load. N-PE / L-PE: (Positive & Negative) 1 kV ~ 4 kV, Phase 0, 90, 180, 270. L-N: (Positive & Negative) 500 V ~ 1 kV, Phase 0, 90, 180, 270. Table 19. Test Results Result (c) 2014 Fairchild Semiconductor Corporation L-PE N-PE L-N 4.4 kV 4.4 kV 2 kV 19 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 9.17. ESD Test Test Condition: 230 VAC / 50 Hz, maximum load. Air discharge: (Positive & Negative) 8 kV ~ 16 kV, 20 times per level. Contact discharge: (Positive & Negative) 4 kV ~ 8 kV, 20 times per level. Table 20. Test Result Result (c) 2014 Fairchild Semiconductor Corporation Air Discharge Contact Discharge 16.5 kV 8.8 kV 20 FEBFAN6602RM6X_CH10U40A * Rev. 1.1 10. Revision History Rev. Date Description 1.0 January 2015 Initial Release 1.1 June 2015 BOM updated, Figure 7 replaced, Table 2, 3, WARNING AND DISCLAIMER Replace components on the Evaluation Board only with those parts shown on the parts list (or Bill of Materials) in the Users' Guide. Contact an authorized Fairchild representative with any questions. This board is intended to be used by certified professionals, in a lab environment, following proper safety procedures. Use at your own risk. The Evaluation board (or kit) is for demonstration purposes only and neither the Board nor this User's Guide constitute a sales contract or create any kind of warranty, whether express or implied, as to the applications or products involved. Fairchild warrantees that its products meet Fairchild's published specifications, but does not guarantee that its products work in any specific application. Fairchild reserves the right to make changes without notice to any products described herein to improve reliability, function, or design. Either the applicable sales contract signed by Fairchild and Buyer or, if no contract exists, Fairchild's standard Terms and Conditions on the back of Fairchild invoices, govern the terms of sale of the products described herein. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. 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