M1Y1G64DS8HB1G / M1Y51264DS88B1G / M1Y25664DSH4B1G
M1U1G64DS8HB1G / M1U51264DS88B1G / M1U25664DSH4B1G
1GB, 512MB, 256MB
PC3200 and PC2700 Unbuffered DDR DI MM
REV 1.0 4
Sep 15, 2005
© NANYA TECHNOLOGY CORPORATION
NANYA reserves the right to change products and specifications without notice.
Input/Output Functional Description
Symbol Type Polarity Function
CK0, CK1, CK2,
CK0, CK1, CK2 (SSTL) Cross
point
The system clock inputs. All address and command lines are sampled on the cross point of
the rising edge of CK and falling edge of CK. A Delay Locked Loop (DLL) circuit is driven
from the clock inputs and output timing for read operations is synchronized to the input
clock.
CKE0, CKE1 (SSTL) Active
High
Activates the DDR SDRAM CK signal when high and deactivates the CK signal when low.
By deactivating the clocks, CKE low initiates the Power Down mode or the Self Refresh
mode.
S0, S1 (SSTL) Active
Low
Enables the associated DDR SDRAM command decoder when low and disables the
command decoder when high. When the command decoder is disabled, new commands are
ignored but previous operations continue. Physical Bank 0 is selected by S0; Bank 1 is
selected by S1.
RAS, CAS, WE (SSTL) Active
Low When sampled at the positive rising edge of the clock, RAS, CAS, WE define the operation to
be executed by the SDRAM.
VREF Supply
Reference voltage for SSTL-2 inputs
VDDQ Supply Isolated power supply for the DDR SDRAM output buffers to provide improved noise
immunity
BA0, BA1 (SSTL) -
Selects which SDRAM bank is to be active.
A0 - A9
A10/AP
A11, A12 (SSTL) -
During a Bank Activate command cycle, A0-A12 defines the row address (RA0-RA12) when
sampled at the rising clock edge.
During a Read or Write command cycle, A0-A9 defines the column address (CA0-CA9)
when sampled at the rising clock edge. In addition to the column address, AP is used to
invoke auto-precharge operation at the end of the Burst Read or Write cycle. If AP is high,
auto-precharge is selected and BA0/BA1 defines the bank to be precharged. If AP is low,
auto-precharge is disabled.
During a Precharge command cycle, AP is used in conjunction with BA0/BA1 to control
which bank(s) to precharge. If AP is high all 4 banks will be precharged regardless of the
state of BA0/BA1. If AP is low, then BA0/BA1 are used to define which bank to pre-charge.
DQ0 - DQ63 (SSTL) -
Data and Check Bit input/output pins operate in the same manner as on conventional
DRAMs.
DQS0 - DQS7,
DQS9 – DQS16 (SSTL) Active
High Data strobes: Output with read data, input with write data. Edge aligned with read data,
centered on write data. Used to capture write data.
CB0 – CB7 (SSTL) - Data Check Bit Input/Output pins. Used on ECC modules and is not used on x64 modules.
DM0 – DM8 Input Active
High
The data write masks, associated with one data byte. In Write mode, DM operates as a byte
mask by allowing input data to be written if it is low but blocks the write operation if it is high.
In Read mode, DM lines have no effect. DM8 is associated with check bits CB0-CB7, and is
not used on x64 modules.
VDD, VSS Supply
Power and ground for the DDR SDRAM input buffers and core logic
SA0 – SA2 -
Address inputs. Connected to either VDD or VSS on the system board to configure the Serial
Presence Detect EEPROM address.
SDA -
This bi-directional pin is used to transfer data into or out of the SPD EEPROM. A resistor
must be connected from the SDA bus line to V DD to act as a pull-up.
SCL -
This signal is used to clock data into and out of the SPD EEPROM. A resistor may be
connected from the SCL bus time to V DD to act as a pull-up.
VDDSPD Supply
Serial EEPROM positive power supply.