REVISIONS
LTR DESCRIPTION DATE (YR-MO-DA) APPROVED
A
Add vendor 07263. Change PD ma x from 275 mW to 303 mW. Change ICC from
50 mA to 55 mA. Change footnote 2, page 5.
87-05-26
N. A. Hauck
B
Changes IAW NOR 5962-R153-93. Table I, add footnote 3/ in maximum clock
frequency, symbol column. Table I, add footnote at the end of table, "3/ fMAX, if
no t tested, shall be guarante ed to the specified limits." Editorial changes
throughout. - tvn
93-05-05
Monica L. Poelking
C
Update to reflect latest changes in format and requirements. Editorial change s
throughout. - les
02-02-27
Raymond Mo nnin
D
Update draw ing to current require ments. Edito rial changes throughout. - gap
09-04-02
Joseph D. Rode nbeck
CURRENT CAGE CODE IS 67268
The original first sheet of this drawing has been replaced.
REV
SHEET
REV
SHEET
REV STATUS REV D D D D D D D D D
OF SHEETS SHEET 1 2 3 4 5 6 7 8 9
PMIC N/A PREPARED BY
David W. Queenan
CHECKED BY
D. A. DiCenzo
DEF ENS E SUP PLY CE NTE R COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
APPROVED BY
Charles Reusing
STA NDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
87-02-04
MICROCIRCUIT , DIG ITA L , BIP O L A R, A DV A NCE D
SCHOTTKY, T T L, SHIFT REGISTER,
MONOL ITHIC S IL ICO N
AMSC N/A
REVISION LEVEL
D SIZE
A CAGE CODE
14933
5962-86071
SHEET 1 OF 9
DSCC FORM 2233
APR 97 5962-E054-09
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OH IO 43218-3990 REVISION LEVEL
D SHEET 2
DSCC FORM 2234
APR 97
1. SCOPE
1.1 Scope. This dr awing describes de vice requirements for M IL-STD-883 com pli ant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Par t or Ident ifying Number (PIN). The complete PIN is a s shown in the following example:
5962-86071 01 C X
Drawing number Device type
(see 1.2. 1) Case outli ne
(see 1.2. 2) Lead finish
(see 1.2. 3)
1.2.1 De vice type( s) . The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function
01 54F164 8-bit seria l-in par allel-out shift re gist er
1.2.2 Ca se outli ne(s ). The case outline( s) are as de signated in MI L-STD- 1835 and as follows:
Outline letter Descriptive desi gnator Terminals Package style
C GDIP1-T14 or GDIP2-T14 14 Dual-in-line packa ge
D GDFP1- F14 or GDFP2-F14 14 Flat package
2 CQCC1-N20 20 Squar e chip carrier
1.2.3 Le ad finish. The lea d finish is as spe cified in MIL-PRF- 38535, a ppendix A.
1.3 Absolute maxi m um ratings.
Supply voltage range .......................................................................... -0.5 V dc to +7.0 V dc
Input voltage range ............................................................................ -1.2 V dc at -18 mA to +7.0 V dc
Storage temperature range.................................................................. -65C to +150C
Maximum power dissipation (PD) per device 1/ ................................ 303 mW
Lead temperature (solder ing, 10 s econds) ........................................ +300C
Thermal resistance, junction-to-case (JC) ........................................ See MIL-STD-1835
Junction temperature (TJ) .................................................................. +175C
1.4 Recommended operating condi tions.
Supply voltage range (VCC) ................................................................ +4.5 V dc minimum to +5.5 V dc maximum
Minimum high level input volta ge (VIH) ............................................... 2.0 V dc
M axi m um low l evel input voltage ( VIL) ............................................... 0.8 V dc
Case opera ting te m pera ture range ( TC) ............................................ -55C to +125C
Setup time, high or low, A or B to CP ............................................... 7 ns minimum
Hold time, high or low, A or B to CP .................................................. 1 ns minimum
Clock puls e wi dth high ....................................................................... 4 ns minimum
Clock puls e wi dth low ........................................................................ 7 ns minimum
MR pulse wi dth low .......................................................................... 7 ns mini mum
Recovery time,
MR to CP ................................................................. 9 ns minimum
__________
1/ Mus t withst and t he added PD due to short circuit test (e.g. IOS).
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMB US , O H IO 43218-3990 REVISION LEVEL
D SHEET 3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specif ication, sta ndards, and handbooks . The following spe cifica tion, st andar ds, and handbooks for m a part of
this drawing to the extent specifi e d herei n. Unless otherwise s pecified, the iss ues of these documents are those cited i n the
soli citation or contr act .
DEPARTMENT OF DEFENSE SPECIFICATION
MIL- PR F-38535 - Inte gra te d C ircui ts , Manuf acturing, G ener al Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD- 883 - Test M et hod Sta ndard Microcircuit s.
MIL- STD -1835 - Int er fa ce St andar d Electronic Component Case Out lines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL- H DBK-103 - List of Standard Microcir cuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are avai l able online at http://assist.daps.dla.mil/quicksearch/ or from t he Standar diza t ion Document
Order D esk, 700 Robbins Avenue , Buil ding 4D, Philade lphi a, PA 19111-5094.)
2.2 Order of pr ecede nce. In the ev e nt of a conflict between the tex t of this drawing and the references cited herein, the text of
this drawing takes prece dence. Nothing in this docum ent , however, s upersedes applicable la w s and r egulations unles s a s p ecifi c
exem ption has been obtained.
3. REQUIREMENTS
3.1 Item re quire m ent s. The indivi dual it em requir ements sha ll be in accordance with MIL- PR F- 38535, appe ndix A for non-JAN
cla ss level B devices and as specif ied herein. Product built t o t his dr awing that is produced by a Qualifi ed Manufact ure r Listing
(QM L) ce rt ifie d and qualif ied manuf act ure r or a manuf act ure r who has been grant ed t ra nsiti onal certifi cat ion to MIL- PR F-38535
ma y be proces sed a s QM L product in accordance wit h the m anuf acture rs approved progra m plan and qua li fying act iv ity appr oval
in a ccordance w ith MIL-PRF-38535. This QML flow as document ed in the Q ualit y Ma nagement (QM) plan ma y ma ke
modifi cations to the require ments herein. These modificati ons shall not affect form, fit, or function of the dev ice. These
modif icat ions s hall not af fe ct t he PIN as described herein. A " Q " or "Q M L" certif ication mark in accor dance with MIL- PRF-38535 is
required t o ident ify when t he QM L flow option is used.
3.2 Design, const ruct ion, and physical dimensions. The design, const ruction, a nd physical dimensions s hall be as specifi ed in
MIL- PR F-38535, appendix A and herein.
3.2. 1 C ase outlines . The case outl ines shall be in accordance with 1.2. 2 herein.
3.2. 2 Terminal connections. The ter m inal connections s hall be as specif ied on f igure 1.
3.2. 3 Truth ta ble. The t ruth ta ble sha ll be as specif ied on figure 2.
3.2. 4 Logic diagram . The logic diagr am shall be as specif ied on f igure 3.
3.3 Electr ical per form ance charact er ist ics. Unless otherwise specified herein, the electrical performance characteristics are as
specifi ed in t able I and s hall apply ov er the full cas e oper at ing te m per at ure range.
3.4 Electr ical t est re quire ments. The electrical test requir ements s hall be the subgroups spe cifie d in ta ble II. The electrical t est s
for each s ubgroup are described in t able I.
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMB US , O H IO 43218-3990 REVISION LEVEL
D SHEET 4
DSCC FORM 2234
APR 97
3.5 Marking. Marki ng shall be in a ccordance with MIL-PRF-38535, appendix A. The par t s hall be mar ked with the PIN list ed in
1.2 her ein. I n additi on, the manufact ure r's PIN may also be m ar ked. For pa ckages where marking of the e ntir e SMD PIN number
is not feasible due to s pace limi t ati ons, the m anuf act ure r has the option of not mar king the "5962-" on the device.
3.5. 1 C er tif icat ion/compliance m ark. A compli ance indicator “ C ” s hall be mar ked on all non-JAN devices built i n com pli ance t o
MIL-PRF-38535, appendix A. The com pli ance indicator “ C” s hall be r eplace d w ith a "Q" or "QML" ce rtification mark in accor dance
wit h M IL-PRF-38535 to identify when t he QM L flow opt ion i s us ed.
3.6 Cer tifi cat e of com pli ance. A certif icate of compliance s hall be r equired from a manufact ure r in order to be list ed as an
approved s ource of s upply in MIL-H DBK-103 ( see 6.6 he rein) . The cer tifi cat e of com pliance s ubm itted t o DSC C-VA pr ior to listing
as an approved sour ce of supply shall affir m tha t the manufact ure r's pr oduct meets t he r equirem ent s of M IL-PRF- 38535, appendix
A and the requir ement s her ein.
3.7 Cer tifi cat e of confor m ance. A cer tif icate of conform ance as re quired in MIL-PR F-38535, appendix A shall be provi ded with
each lot of microcircuits deliver ed to this drawing.
3.8 Notif icat ion of cha nge. Notifi cation of change to DSCC-VA shall be required for any change that affe cts this drawi ng.
3.9 Ver ifica tion and r eview. DSCC, DSCC's agent, and the acquiri ng activi ty retain the option to revi e w the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
revi ewer.
4. VERIFICATION
4.1 Sampling and inspect ion. Sa mpli ng and inspection pr ocedures s hall be in accordance with MIL- PRF-38535,
appendix A.
4.2 Scr eening. Scre ening sha ll be in accordance with me thod 5004 of M IL-STD- 883, and shall be conduct ed on all devices
prior to qualit y confor mance ins pection. The following addit ional cri te ria shall apply:
a. Burn- in te st, met hod 1015 of M IL-STD- 883.
(1) Test condition A, B, C, or D. The t est circuit shall be maintained by the manuf actur er unde r document r evision level
contr ol and sha ll be made available to the prepa ring or a cquiring a ctivi ty upon request. The test circuit shall spe cify t he
inputs, outputs, biase s, and power diss ipation, a s applicable, in accor dance with the int ent specif ied in method 1015 of
MIL-STD-883.
(2) TA = +125C, mi nimum.
b. Interi m and final e lectrical test paramete rs s hall be as specified i n table II herei n, except interi m electri cal paramete r tests
prior to bur n-in ar e opt ional at t he discret ion of the manuf act ur er.
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMB US , O H IO 43218-3990 REVISION LEVEL
D SHEET 5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Condit ions
-55C TC +125C
Group A
subgroups
Limits
Unit
unle ss otherwis e spe cifie d Min Max
High level output volta ge VOH VCC = 4.5 V, IOH = -1 mA,
VIN = 0.8 V or 2.0 V 1, 2, 3 2.4 V
Low level out put volt age VOL VCC = 4.5 V, IOL = 20 mA,
VIN = 0.8 V or 2.0 V 1, 2, 3 0.5 V
Input clamp vol ta ge VI C
VCC = 4.5 V, IIH = -18 mA,
TC = +25C 1, 2, 3 -1. 2 V
High level input curr ent
II H1 VCC = 5.5 V, VIN = 7.0 V 1, 2, 3 100 A
II H2 VCC = 5.5 V, VIN = 2.7 V 1, 2, 3 20 A
Low level input curr ent
IIL V
CC = 5.5 V, VIN = 0.5 V 1, 2, 3 -0. 6 mA
Short circuit out put cur re nt IOS VCC = 5.5 V,
VOUTS = 0.0 V 1/ 1, 2, 3 -60 - 150 mA
Supply current ICC
VCC = 5.5 V, All outputs open 2/ 1, 2, 3 55 mA
Functional t ests
See 4.3.1c 7
fMAX
3/ 9
80 MHz
Maximum clock fre quency
10, 11
60 MHz
tPLH1
VCC = 5.0 V,
RL = 500 5%,
CL = 50 pF 10%
9
8 ns
Propagation delay time,
CP to Qn
10, 11
11 ns
t
PHL1 9
11 ns
10, 11
13 ns
tPHL2 9
13 ns Propagation delay time,
MR to Qn
10, 11
17 ns
1/ Not m or e than one out put should be s horted at a t ime, and t he durat ion of the short circuit condition s hould not e xceed
one second.
2/ ICC is meas ured with i nputs conditione d so t hat output s s hould re m ain low.
3/ fMAX i f not tested, shall be guaranteed to the specified l imi ts in table I.
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMB US , O H IO 43218-3990 REVISION LEVEL
D SHEET 6
DSCC FORM 2234
APR 97
De vi ce type 01
Case
outlines C and D 2
Terminal
number Terminal symbols
1 Dsa NC
2 Dsb Dsa
3 Q0 D
sb
4 Q1 Q
0
5 Q2 NC
6 Q3 Q
1
7 GND NC
8 CP
Q2
9 MR Q3
10 Q4 GND
11 Q5 NC
12 Q6 CP
13 Q7 MR
14 VCC Q4
15 NC
16 Q5
17 NC
18 Q6
19 Q7
20 VCC
FIGUR E 1. Te rminal connect ions.
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMB US , O H IO 43218-3990 REVISION LEVEL
D SHEET 7
DSCC FORM 2234
APR 97
Inputs Outputs
Ope ra ting Mode MR CP Dsa Dsb Q0 Q
1 - Q7
Re se t (C lea r ) L X X X L L - L
H
l l L q0 - q6
Shift H
l h L q0 - q6
H
h l L q0 - q6
H
h h H q0 - q6
H = HIGH voltage level.
h = HIGH v olta ge level one setup time prior to the LOW to HIGH clock transi tion.
L = LOW voltage level.
l = LOW vol ta ge leve l one setup time prior to the LOW to HIGH clock transi tion.
q = Lower case let t ers indicat e t he st at e of the refere nced input (or output) one
setup time prior to the LOW to HIGH clock transition.
X = Don't care.
= LOW to HIGH clock transition.
FIGURE 2. Trut h t able.
FIGUR E 3. Logic diagram .
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMB US , O H IO 43218-3990 REVISION LEVEL
D SHEET 8
DSCC FORM 2234
APR 97
TABLE II. Electri cal te s t re quirements.
MIL- STD -883 test requir ements Subgroups
(in accor dance with
MIL- STD -883, m et hod 5005,
table I)
Interim el e ctrical parameters
(method 5004) - - -
Final e lectri cal te s t paramete rs
(method 5004) 1*, 2, 3, 7, 9
Group A te st re quire ment s
(method 5005) 1, 2, 3, 7, 9, 10, 11
Groups C and D end- point
el e ctrical parameters
(method 5005)
1, 2, 3
* PDA applies to s ubgroup 1.
4.3 Quality conformance inspe ct ion. Qua li t y confor m ance inspection shall be in accor dance with me t hod 5005 of MIL-STD-
883 including groups A, B, C, and D inspect ions. The f ollow ing addit ional cr ite ria s hall apply.
4.3. 1 G roup A inspe ct ion.
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, 6, and 8 in t able I, m et hod 5005 of MIL-STD-883 sha ll be omitted.
c. Subgroup 7 shall include verification of the t rut h t able.
4.3. 2 G roups C and D inspections.
a. End-poi nt electrical par amet ers sha ll be as s pecifi ed in table II herein.
b. Steady- st at e life te st conditions , method 1005 of MIL-STD-883.
(1) Test condition A, B, C , or D. The t est circui t s hall be maintained by the manufact ure r unde r document re vi sion level
contr ol and sha ll be made available to the prepa ring or a cquiring a ctivi ty upon request. The test circuit shall spe cify
the inputs, outputs, bias es, and power diss ipation, a s applicable, in accor dance with the int ent specif ied in met hod
1005 of MIL-STD- 883.
(2) TA = +125C, mi nimum.
(3) Test duration: 1,000 hour s, except as perm itted by met hod 1005 of MIL-STD-883.
STA NDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-86071
DEFENSE SUPPLY CENTER COLUMBUS
COLUMB US , O H IO 43218-3990 REVISION LEVEL
D SHEET 9
DSCC FORM 2234
APR 97
5. PACKAGING
5.1 Packaging r equirem ent s. The r equirem ent s f or packa ging sha ll be in accordance with MIL- PRF-38535, appendix A.
6. NOTES
6.1 Intended use . Microcir cuits confor m ing to this drawing ar e intended f or use for Government m icrocir cuit a pplicat ions
(or igi nal equipment ), design applications, and logistics purposes .
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared
specifi cat ion or drawing.
6.3 Configur at ion control of SMD's. All pr oposed change s t o exist ing SMD's will be coordinated with the users of record for the
individual documents. This coordination will be accomplished using DD Form 1692, Engi neering Change Pr oposa l.
6.4 Recor d of us ers. Military and industr ial users shall inform Defense Supply C ent er C olumbus ( DSC C) when a system
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used
for coordination and distributi on of cha nges t o t he drawings. User s of dra w ings covering mi croelectronics device s ( FSC 5962)
should contact DSCC-VA, t elephone (614) 692- 0544.
6.5 Com m ent s. Com m ent s on t his drawing should be directed t o D SCC -VA, C olumbus, O hio 43218-3990, or te lephone (614)
692-0547.
6.6 Appr oved sour ces of supply. Approved sour ces of supply are listed in MIL-HDBK- 103. The vendor s listed in MI L-HDBK-
103 have agreed t o this dr awing and a certifica te of com pliance (see 3.6 he rein) ha s been s ubm itted t o and acce pted by DSCC-
VA.
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 09-04-02
Approved sources of supply for SM D 5962-86071 a re li sted below f or imm ediate acquisit ion i nf ormat ion only and shall
be added to MIL-HDBK- 103 and QM L-38535 during the next revi sion. MIL-H DBK-103 and QML-38535 will be revised
to include t he additi on or de let ion of sources . The vendors list ed below have a gree d to t his drawing and a ce rt ifica te of
compliance has be en submit te d to a nd accepted by DSCC-VA. This inf ormat ion bul letin i s s upers eded by the next
dated revi sion of MIL- HD BK- 103 and QML-38535. D SC C m aintains a n online dat abas e of all current sour ces of supply
at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcir cuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
0C7V7 54F164ADMQB
3/ 54F164BCA
5962-8607101CA
3/ 54F164DMQB
0C7V7 54F164AFMQB
3/ 54F164/BDA
5962-8607101DA
3/ 54F164FMQB
0C7V7 54F164ALMQB
3/ 54F164/B2X
5962-86071012A
3/ 54F164L1MQB
1/ The lead finish shown for ea ch PIN re pre senting
a hermetic package is the most readily avai l able
from the manufacturer l iste d for that part. If the
desired lead finish is not list ed cont act t he vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisit ion. It ems acquir ed to this number m ay not
sat isf y the per for m ance requir em ent s of t his dr awing.
3/ Not a vailable from an appr oved sour ce of supply .
Vendor CAGE Vendor na m e
numbe r and address
0C7V7 QP Se m iconductor
2945 O akmead Village Court
Sant a Clara, C A 95051
The inform at ion conta ined he rein is dis seminat ed f or convenience only a nd the
Government assumes no liability whatsoever for any inaccuracies in the
informat ion bullet in.
