FDH3595
FDH3595
DO-35
High Conductance Low Leakage Diode
Sourced from Process 1M. See MMBD1501-1505 for characteristics.
Absolute Maximum Ratings* TA = 25°C unless otherwise noted
*These ratings are limiting values above which the serviceability of any semiconductor device may be impaired.
NOTES:
1) These ratings are based on a maximum junction temperature of 200 degrees C.
2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
Thermal Characteristics TA = 25°C unless otherwise noted
Symbol Parameter Value Units
WIV Workin g Inverse Voltage 125 V
IOAverage Rectified Current 200 mA
IFDC Forwa rd Current 500 mA
ifRecurrent Peak Forward Current 600 mA
if(surge) Peak Forward Surge Curren t
Pulse width = 1.0 second
Pulse width = 1.0 microsecond 1.0
4.0 A
A
Tstg Storage Temperature Range -65 to +175 °C
TJOperating Junction Temperature 175 °C
Symbol Characteristic Max Units
MMBD7000*
PDTotal D evice Dissipation
Derate above 25°C500
3.33 mW
mW/°C
RθJA Thermal Resistance, Junction to Ambient 300 °C/W
Discrete POWER & Signal
Technologies
ã1997 Fairchild Semiconductor Corporation
FDH3595
Electrical Characteristics TA = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Max Units
BVBreakdown Voltage IR = 100
µ
A150 V
IRReverse Voltage Leakage Current VR = 125 V
VR = 30 V, TA = 125°C
VR = 125 V, TA = 125°C
VR = 125 V, TA = 150°C
1.0
300
500
3.0
nA
nA
nA
µ
A
VFForward Vol tage IF = 1.0 mA
IF = 5.0 mA
IF = 10 mA
IF = 50 mA
IF = 100 mA
IF = 200 mA
520
600
650
750
790
0.83
680
760
800
890
920
1.0
mV
mV
mV
mV
mV
V
CTDiode Capacitance VR = 0, f = 1.0 MHz 8.0 pF
High Conductance Low Leakage Diode
(continued)
TRADEMARKS
ACEx™
CoolFET™
CROSSVOLT™
E2CMOSTM
FACT™
FACT Quiet Series™
FAST®
FASTr™
GTO™
HiSeC™
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
ISOPLANAR™
MICROWIRE™
POP™
PowerTrench™
QS™
Quiet Series™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
TinyLogic™
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failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
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support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
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Definition of Terms
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Advance Information
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Obsolete
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
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changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
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