2SC2290 TOSHIBA TRANSISTOR SILICON NPN EPITAXIAL PLANAR TYPE 2SC2290 2~30MHz SSB LINEAR POWER AMPLIFIER APPLICATIONS (LOW SUPPLY VOLTAGE USE) Unit in mm Specified 12.5V, 28MHz Characteristics Output Power : Po = 60WPEP (Min.) Power Gain : Gp = 11.8dB (Min.) Collector Efficiency : C = 35% (Min.) Intermodulation Distortion : IMD = -30dB (Max.) MAXIMUM RATINGS (Tc = 25C) CHARACTERISTIC SYMBOL RATING UNIT Collector-Base Voltage VCBO 45 V Collector-Emitter Voltage VCES 45 V Collector-Emitter Voltage VCEO 18 V Emitter-Base Voltage VEBO 4 V Collector Current IC 20 A Collector Power Dissipation PC 175 W Junction Temperature Tj 175 C Tstg -65~175 C Storage Temperature Range JEDEC EIAJ TOSHIBA Weight: 5.2g -- -- 2-13B1A 000707EAA1 * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 2001-01-31 1/3 2SC2290 ELECTRICAL CHARACTERISTICS (Tc = 25C) CHARACTERISTIC SYMBOL TEST CONDITION MIN. TYP. MAX. UNIT Collector-Emitter Breakdown Voltage V (BR) CEO IC = 100mA, IB = 0 18 -- -- V Collector-Emitter Breakdown Voltage V (BR) CES IC = 100mA, VEB = 0 45 -- -- V Emitter-Base Breakdown Voltage V (BR) EBO IE = 1mA, IC = 0 4 -- -- V hFE VCE = 5V, IC = 10A * 10 -- 150 -- Collector Output Capacitance Cob VCB = 12.5V, IE = 0 f = 1MHz -- -- 500 pF Power Gain Gp 11.8 13.8 -- dB -- 2.5 4 WPEP DC Current Gain Input Power Pi Collector Efficiency C Intermodulation Distortion IMD Series Equivalent Input Impedance Zin Series Equivalent Output Impedance Zout * Pulse Test: VCC = 12.5V, f1 = 28.000MHz, f2 = 28.001MHz Iidle = 50mA Po = 60WPEP (Fig.) VCC = 12.5V, f1 = 28.000MHz, f2 = 28.001MHz Po = 60WPEP 35 -- -- % -- -- -30 dB -- 1.02 -j0.17 -- -- 0.86 -j0.21 -- Pulse Width 100s, Duty Cycle 3% CAUTION Beryllia Ceramics is used in this product. The dust or vapor can be dangerous to humans. Do not break, cut, crush or dissolve chemically. Dispose of this product properly according to law. Do not intermingle with normal industrial or domestic waste. 2001-01-31 2/3 2SC2290 Fig. Pi TEST CIRCUIT CAUTION These are only typical curves and devices are not necessarily guaranteed at these curves. 2001-01-31 3/3