IPP50R350CP CoolMOSTM Power Transistor Product Summary Features * Lowest figure-of-merit RON x Qg * Ultra low gate charge VDS @Tjmax 550 V RDS(on),max 0.350 W 19 nC Qg,typ * Extreme dv/dt rated * High peak current capability * Pb-free lead plating; RoHS compliant; Halogen free for mold compound * Qualified for industrial grade applications according to JEDEC1) PG-TO220 CoolMOS CP is designed for: * Hard- & soft switching SMPS topologies * CCM PFC for Lamp Ballast, LCD & PDP TV * PWM for Lamp Ballast, LCD & PDP TV Type Package Marking IPP50R350CP PG-TO220 5R350P Maximum ratings, at T j=25 C, unless otherwise specified Parameter Symbol Conditions Continuous drain current ID Value T C=25 C 10 T C=100 C 6 Pulsed drain current2) I D,pulse T C=25 C 22 Avalanche energy, single pulse E AS I D=3.7 A, V DD=50 V 246 Avalanche energy, repetitive t AR2),3) E AR I D=3.7 A, V DD=50 V 0.37 Avalanche current, repetitive t AR2),3) I AR MOSFET dv /dt ruggedness dv /dt Gate source voltage V GS Power dissipation P tot Operating and storage temperature T j, T stg Mounting torque Rev. 2.1 Unit A mJ 3.7 A V DS=0...400 V 50 V/ns static 20 V AC (f>1 Hz) 30 T C=25 C 89 W -55 ... 150 C M3 and M3.5 screws page 1 60 Ncm 2012-05-08 IPP50R350CP Maximum ratings, at T j=25 C, unless otherwise specified Parameter Symbol Conditions Continuous diode forward current IS Value Unit 5.6 A T C=25 C Diode pulse current2) I S,pulse 22 Reverse diode dv /dt 4) dv /dt 15 V/ns Parameter Symbol Conditions Values Unit min. typ. max. - - 1.4 Thermal characteristics Thermal resistance, junction - case R thJC Thermal resistance, junction ambient R thJA leaded - - 62 Soldering temperature, wavesoldering only allowed at leads T sold 1.6 mm (0.063 in.) from case for 10 s - - 260 C V K/W Electrical characteristics, at T j=25 C, unless otherwise specified Static characteristics Drain-source breakdown voltage V (BR)DSS V GS=0 V, I D=250 A 500 - - Gate threshold voltage V GS(th) V DS=V GS, I D=0.37 mA 2.5 3 3.5 Zero gate voltage drain current I DSS V DS=500 V, V GS=0 V, T j=25 C - - 1 V DS=500 V, V GS=0 V, T j=150 C - 10 - A Gate-source leakage current I GSS V GS=20 V, V DS=0 V - - 100 nA Drain-source on-state resistance R DS(on) V GS=10 V, I D=5.6 A, T j=25 C - 0.32 0.35 W V GS=10 V, I D=5.6 A, T j=150 C - 0.80 - f =1 MHz, open drain - 2.2 - Gate resistance Rev. 2.1 RG page 2 W 2012-05-08 IPP50R350CP Parameter Values Symbol Conditions Unit min. typ. max. - 1020 - - 46 - - 43 - Dynamic characteristics Input capacitance C iss Output capacitance C oss Effective output capacitance, energy C o(er) related5) V GS=0 V, V DS=100 V, f =1 MHz pF V GS=0 V, V DS=0 V to 400 V Effective output capacitance, time related6) C o(tr) - 92 - Turn-on delay time t d(on) - 35 - Rise time tr - 14 - Turn-off delay time t d(off) - 80 - Fall time tf - 12 - Gate to source charge Q gs - 4 - Gate to drain charge Q gd - 6 - Gate charge total Qg - 19 25 Gate plateau voltage V plateau - 5.2 - V - 0.9 1.2 V - 250 - ns - 2.3 - C - 19 - A V DD=400 V, V GS=10 V, I D=5.6 A, R G=30.9 W ns Gate Charge Characteristics V DD=400 V, I D=5.6 A, V GS=0 to 10 V nC Reverse Diode Diode forward voltage V SD Reverse recovery time t rr Reverse recovery charge Q rr Peak reverse recovery current I rrm V GS=0 V, I F=5.6 A, T j=25 C V R=400 V, I F=I S, di F/dt =100 A/s 1) J-STD20 and JESD22 2) Pulse width t p limited by T j,max 3) Repetitive avalanche causes additional power losses that can be calculated as P AV=E AR*f. 4) I SDI D, di /dt 400A/s, V DClink=400V, V peak2|I D|R DS(on)max parameter: T j 0.9 35 25 C 0.8 30 0.7 25 0.5 20 ID [A] RDS(on) [W] 0.6 0.4 150 C 15 0.3 98 % typ 10 0.2 5 0.1 0 -60 -20 20 60 100 140 180 Tj [C] Rev. 2.1 0 0 2 4 6 8 10 VGS [V] page 5 2012-05-08 IPP50R350CP 9 Typ. gate charge 10 Forward characteristics of reverse diode V GS=f(Q gate); I D=5.6 A pulsed I F=f(V SD) parameter: V DD parameter: T j 102 10 25 C, 98% 8 150 C, 98% 100 V 150 C 101 25 C 400 V IF [A] VGS [V] 6 4 100 2 10-1 0 0 5 10 15 0 20 0.5 1 Qgate [nC] 1.5 2 VSD [V] 11 Avalanche energy 12 Drain-source breakdown voltage E AS=f(T j); I D=3.7 A; V DD=50 V V BR(DSS)=f(T j); I D=0.25 mA 250 580 560 200 540 EAS [mJ] VBR(DSS) [V] 150 100 520 500 480 50 460 0 440 25 75 125 175 Tj [C] Rev. 2.1 -60 -20 20 60 100 140 180 Tj [C] page 6 2012-05-08 IPP50R350CP 13 Typ. capacitances 14 Typ. Coss stored energy C =f(V DS); V GS=0 V; f =1 MHz E oss= f(V DS) 5 104 4 Ciss 103 Eoss [J] C [pF] 3 Coss 102 2 101 1 Crss 100 0 0 100 200 300 400 500 VDS [V] Rev. 2.1 0 100 200 300 400 500 VDS [V] page 7 2012-05-08 IPP50R350CP Definition of diode switching characteristics Rev. 2.1 page 8 2012-05-08 IPP50R350CP PG-TO220-3-1/PG-TO220-3-21: Outline Rev. 2.1 page 9 2012-05-08 IPP50R350CP Published by Infineon Technologies AG 81726 Munchen, Germany (c) 2007 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this data sheet shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of noninfringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automotive, aviation and aerospace applications or systems only with the express written approval of Infineon Technologies. If a failure of such components can reasonably be expected to cause the failure of that life-support, automotive, aviation and aerospace device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 2.1 page 10 2012-05-08