REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add figure 4. Change in terminal connections. Add subgroup 8 to Table II. Change vendor similar part number for case outline 2. Change IIL. Editorial changes throughout. mlp 89-03-07 Michael A. Frye B Changes to Table I and Table II and other changes per NOR 5962-R026-92. tvn 91-11-26 Monica L. Poelking C Add package CDFP4-F16. Change document to current electronic format. Editorial changes throughout. les 98-02-04 Raymond Monnin D Figure 4 modified to be consistent with Table I. ljs 98-08-10 Raymond Monnin The original first page of this drawing has been replaced. REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L.Poelking STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216 CHECKED BY Raymond Monnin APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, QUAD LINE DRAWING APPROVAL DATE RECEIVER, MONOLITHIC SILICON 87-11-10 REVISION LEVEL D SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 1 OF 5962-87501 13 5962-E449-98 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87501 01 E Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) Drawing number X 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 Circuit function 10H515 Quad line receiver 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter E F X 2 Descriptive designator GDIP1-T16 or CDIP2-T16 GDFP2-F16 or CDFP3-F16 CDFP4-F16 CQCC1-N20 Terminals Package style 16 16 16 20 Dual-in-line Flat package Flat package Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VEE) ............................................................... Input voltage range ........................................................................... Storage temperature range............................................................... Lead temperature (soldering, 10 seconds) ....................................... Junction temperature (TJ) ................................................................. Maximum power dissipation (PD) ...................................................... Thermal resistance, junction-to-case (JC) ....................................... -8.0 V dc to 0.0 V dc -5.2 V dc to 0.0 V dc -65C to +165C +300C +165C 196 mW See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) ............................................................... Supply voltage range (VCC ................................................................ Ambient operating temperature range (T A) ...................................... Minimum high level input voltage (VIH): TA = +25C .................................................................................. TA = +125C ................................................................................ TA = -55C ................................................................................... Maximum low level input voltage (VIL)............................................... STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 -5.46 V dc minimum to -4.94 V dc maximum -0.02 V dc to 0.02 V dc or 1.98 V dc to 2.02 V dc -55C to +125C -0.780 V -0.650 V -0.840 V -1.950 V SIZE 5962-87501 A REVISION LEVEL D SHEET 2 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 MIL-STD-973 MIL-STD-1835 - Test Method Standard Microcircuits. Configuration Management. Interface Standard For Microcircuit Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings (SMD's). Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for nonJAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MILPRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MILPRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 2. 3.2.4 Logic diagram(s). The logic diagram(s) shall be as specified on figure 3. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 3 3.2.5 Test circuit and switching waveforms. Test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristic are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 4 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Min Cases E, F, 2 and X Unit Max Quiescent tests 1/ VIL -0.780 -0.650 -0.840 -1.950 -1.950 -1.950 1 2 3 -1.010 -0.860 -1.060 -0.780 -0.650 -0.840 V High level output voltage VOH Low level output voltage VOL -0.780 -0.650 -0.840 -1.950 -1.950 -1.950 1 2 3 -1.950 -1.950 -1.950 -1.580 -1.565 -1.610 V High level threshold output voltage VOHA -1.110 -0.960 -1.160 -1.480 -1.465 -1.510 1 2 3 -1.010 -0.860 -1.060 -0.780 -0.650 -0.840 V Low level threshold output voltage VOLA -1.110 -0.960 -1.160 -1.480 -1.465 -1.510 1 2 3 -1.950 -1.950 -1.950 -1.580 -1.565 -1.610 V Power supply drain IEE current 3/ Outputs terminated VIH through 100 to -2 V VCC = 0.0 V VEE = -5.2 V 2/ VEE = -5.46 V VCC = 0.0 V High level input current IIH VIH = -0.780 V at +25C 1 -26 2,3 -29 mA 1 95 A 2,3 150 A -0.650 V at +125C -0.840 V at -55C A Input leakage current ICBO VEE = -5.46 V 3/ VCB = -5.2 V VCC = 0.0 V Reference bias supply VBB VEE = -5.46 V 1 -1.37 -1.25 VCC = 0.0 V 2 -1.31 -1.19 3 -1.41 -1.27 See 4.3.1c 7,8A,8B voltage Functional tests 1,2 3 -1.0 -1.5 V See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Min Cases E, F and X Unit Max Rapid tests 4/ Outputs terminated VIH VIL -0.788 -0.659 -0.849 -1.950 -1.950 -1.950 1 2 3 -1.017 -0.868 -1.068 -0.788 -0.659 -0.849 V High level output voltage VOH Low level output voltage VOL -0.788 -0.659 -0.849 -1.950 -1.950 -1.950 1 2 3 -1.950 -1.950 -1.950 -1.582 -1.568 -1.613 V High level threshold output voltage VOHA -1.117 -0.968 -1.168 -1.482 -1.468 -1.513 1 2 3 -1.017 -0.868 -1.068 -0.788 -0.659 -0.849 V Low level threshold output voltage VOLA -1.117 -0.968 -1.168 -1.482 -1.468 -1.513 1 2 3 -1.950 -1.950 -1.950 -1.582 -1.568 -1.613 V Power supply drain current 3/ IEE 1 2,3 -25 -28 High level input current IIH through 100 to -2 V VCC = 0.0 V VEE = -5.2 V 2/ VEE = -5.46 V VCC = 0.0 V VIH = -0.788 V at +25C mA 1 80 A 2, 3 135 A -0.659 V at +125C -0.849 V at -55C A Input leakage current ICBO VEE = -5.46 V 3/ VCB = -5.2 V VCC = 0.0 V Reference bias supply VBB VEE = -5.46 V 1 -1.377 -1.257 VCC = 0.0 V 2 -1.317 -1.197 3 -1.417 -1.277 See 4.3.1c 7,8A,8B voltage Functional tests 1,2 3 -1.0 -1.5 V See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Min Case 2 Unit Max Rapid tests 4/ VIL -0.793 -0.665 -0.855 -1.950 -1.950 -1.950 1 2 3 -1.022 -0.874 -1.074 -0.793 -0.665 -0.855 V High level output voltage VOH Low level output voltage VOL -0.793 -0.665 -0.855 -1.950 -1.950 -1.950 1 2 3 -1.950 -1.950 -1.950 -1.584 -1.570 -1.615 V High level threshold output voltage VOHA -1.122 -0.974 -1.174 -1.484 -1.470 -1.515 1 2 3 -1.022 -0.874 -1.074 -0.793 -0.665 -0.855 V Low level threshold output voltage VOLA -1.122 -0.974 -1.174 -1.484 -1.470 -1.515 1 2 3 -1.950 -1.950 -1.950 -1.584 -1.570 -1.615 V Power supply drain IEE current 3/ Outputs terminated VIH through 100 to -2 V VCC = 0.0 V VEE = -5.2 V 2/ VEE = -5.46 V VCC = 0.0 V High level input current IIH VIH = -0.793 V at +25C 1 -25 2,3 -28 mA 1 80 2, 3 135 A -0.665 V at +125C -0.855 V at -55C A Input leakage current ICBO VEE = -5.46 V 3/ VCB = -5.2 V VCC = 0.0 V Reference bias supply VBB VEE = -5.46 V 1 -1.381 -1.261 VCC = 0.0 V 2 -1.322 -1.202 3 -1.422 -1.281 See 4.3.1c 7, 8A, 8B voltage Functional tests 1,2 3 -1.0 -1.5 V See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 7 TABLE I. Electrical performance characteristics - Continued. Test Conditions -55C TA +125C unless otherwise specified Symbol Unit Group A subgroups Limits Min Cases E, F, 2 and X Max AC tests Transition time tTLH, tTHL Propagation delay time, input to output tPLH, tPHL, tPLL, tPHH VEE = -2.94 V VCC = 2.0 V CL < 5 pF 9 10 11 0.45 0.50 0.50 1.40 1.70 1.40 ns Load all outputs through 100 to ground See figure 4 9 10 11 0.45 0.50 0.45 1.20 1.80 1.20 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with > 500 LFPM of +25 C, +125 C or -55 C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. All devices shall be tested to the delta V (rapid test) conditions specified herein. The rapid test method is an equivalent method of testing quiescent conditions. 2/ The high and low level output current varies with temperature and shall be calculated using the following formulas: IOH = (-2 V - VOH)/100 and IOL = (-2 V - VOL)/100. 3/ The IEE limits, although specified in the minimum column, shall not be exceeded, in magnitude, as a maximum value. 4/ The DC rapid test forcing functions and limits are used for all dc testing. These limits are determined for each device type based on the power dissipation and package type. The rapid test (delta V) limits and forcing functions are skewed allowing rapid testing to be performed at standard temperatures without the addition of delta T's. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 8 Case outlines E Terminal number F, X 2 Terminal symbol 1 VCC1 D IN NC 2 AOUT COUT VCC1 3 BOUT DOUT AOUT 4 A IN VCC2 BOUT 5 AIN VCC1 A IN 6 BIN AOUT NC 7 B IN BOUT AIN 8 VEE A IN BIN 9 VBB AIN B IN 10 C IN BIN VEE 11 CIN B IN NC 12 DIN VEE VBB 13 D IN VBB C IN 14 COUT C IN CIN 15 DOUT CIN DIN 16 VCC2 D IN NC 17 --- --- D IN 18 --- --- COUT 19 --- --- DOUT 20 --- --- VCC2 NC = No connection FIGURE 1. Terminal connections. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 9 Inputs Inverting L H L H VBB VBB H L VBB = = = Output Noninverting H L VBB VBB H L L H L H L H High level Low level Irrelevant FIGURE 2. Truth table. FIGURE 3. Logic diagram. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 10 NOTES: 1. Unused outputs connected 100 to ground. 2. L1 = L2 : matched for equal time delays. 3. 2:1 divider may be used. 4. CL (test jig) 5 pF. 5. Pulse generator characteristics: PRR = 1MHz, tr and tf = 1.0 ns 0.2 ns (20% to 80%), duty cycle = 50%. FIGURE 4. Test circuit and switching waveforms. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 11 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 7* 8A, 8B, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8A, 8B, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1 and 7. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7, 8A, and 8B shall verify the truth table as specified on figure 2 herein. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 12 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0525. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone (614) 692-0674. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MILHDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DSCC FORM 2234 APR 97 SIZE 5962-87501 A REVISION LEVEL D SHEET 13 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 98-08-10 Approved sources of supply for SMD 5962-87501 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-8750101EA 0EU86 AS10H515C16/883C 5962-8750101FA 3/ 10H515/BFAJC 5962-87501012A 0EU86 AS10H515EC20/883C 5962-8750101XA 0EU86 AS10H515F16/883C 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ No longer available from the approved source of supply. Vendor CAGE number 0EU86 Vendor name and address Austin Semiconductor Inc. 8701 Cross Park Dr. Austin, TX 78754-4566 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.