S-1003 Series www.ablic.com www.ablicinc.com MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 (c) ABLIC Inc., 2013 The S-1003 Series is a high-accuracy voltage detector developed using CMOS technology. The detection voltage is fixed internally with an accuracy of 1.0% (VDET 2.2 V). It operates with current consumption of 500 nA typ. The release signal can be delayed by setting a capacitor externally. Delay time accuracy is 15%. Moreover, since the S-1003 Series includes the manual reset function, the reset signal can be also output forcibly. Two output forms Nch open-drain output and CMOS output are available. Features Detection voltage: Detection voltage accuracy: Current consumption: Operation voltage range: Hysteresis width: Manual reset function: Delay time accuracy: Output form: Operation temperature range: Lead-free (Sn 100%), halogen-free 1.2 V to 5.0 V (0.1 V step) 1.0% (2.2 V VDET 5.0 V) 22 mV (1.2 V VDET 2.2 V) 500 nA typ. 0.95 V to 10.0 V 5% 2% MR pin logic active "L", active "H" 15% (CD = 4.7 nF) Nch open-drain output (Active "L") CMOS output (Active "L") Ta = 40C to 85C Applications Power supply monitor for microcomputer and reset for CPU Constant voltage power supply monitor for TV, Blu-ray recorder and home appliance Power supply monitor for portable devices such as notebook PC, digital still camera and mobile phone Packages SOT-23-5 SNT-6A 1 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Block Diagrams 1. Nch open-drain output product (S-1003NAxxI) Function VDD Status Output logic Active "L" *1 Delay circuit *1 MR pin logic Active "L" OUT *1 VREF *1 MR circuit *1 VSS CD MR *1. Parasitic diode Figure 1 2. Nch open-drain output product (S-1003NBxxI) Function VDD Output logic Active "L" *1 MR pin logic Active "H" Delay circuit *1 OUT *1 VREF *1 MR circuit *1 VSS MR *1. CD Parasitic diode Figure 2 2 Status MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 3. CMOS output product (S-1003CAxxI) Function VDD Status Output logic Active "L" *1 *1 Delay circuit *1 MR pin logic Active "L" OUT VREF *1 MR circuit *1 *1 VSS CD MR *1. Parasitic diode Figure 3 4. CMOS output product (S-1003CBxxI) Function VDD Status Output logic Active "L" *1 *1 Delay circuit *1 MR pin logic Active "H" OUT VREF *1 *1 MR circuit *1 VSS MR *1. CD Parasitic diode Figure 4 3 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Product Name Structure Users can select the output form, MR pin logic, detection voltage value, and package type for the S-1003 Series. Refer to "1. Product name" regarding the contents of product name, "2. Product type list" regarding the product types, "3. Packages" regarding the package drawings and "4. Product name list" regarding details of product name. 1. Product name S-1003 x x xx I - xxxx U Environmental code U: Lead-free (Sn 100%), halogen-free Package abbreviation and IC packing specifications*1 M5T1: SOT-23-5, Tape I6T1: SNT-6A, Tape Operation temperature I: Ta = 40C to 85C Detection voltage value 12 to 50 (e.g., when the detection voltage is 1.2 V, it is expressed as 12.) MR pin logic*2 A: Active "L" B: Active "H" Output form*2 N: Nch open-drain output (Active "L")*3 C: CMOS output (Active "L")*3 *1. *2. *3. 2. Refer to the tape drawing. Refer to "2. Product type list". If you request the product with output logic active "H", contact our sales office. Product type list Table 1 Product Type NA NB CA CB 3. Output Form Nch open-drain output CMOS output Output Logic Active "L" Active "L" Active "L" Active "L" Packages Table 2 Package Name SOT-23-5 SNT-6A 4 MR Pin Logic Active "L" Active "H" Active "L" Active "H" Package Drawing Codes Dimension Tape Reel Land MP005-A-P-SD PG006-A-P-SD MP005-A-C-SD PG006-A-C-SD MP005-A-R-SD PG006-A-R-SD PG006-A-L-SD MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 4. Product name list 4. 1 S-1003 Series NA type Output form: Nch open-drain output (Active "L") MR pin logic: Active "L" Table 3 Detection Voltage 1.2 V 22 mV 1.3 V 22 mV 1.4 V 22 mV 1.5 V 22 mV 1.6 V 22 mV 1.7 V 22 mV 1.8 V 22 mV 1.9 V 22 mV 2.0 V 22 mV 2.1 V 22 mV 2.2 V 1.0% 2.3 V 1.0% 2.4 V 1.0% 2.5 V 1.0% 2.6 V 1.0% 2.7 V 1.0% 2.8 V 1.0% 2.9 V 1.0% 3.0 V 1.0% 3.1 V 1.0% 3.2 V 1.0% 3.3 V 1.0% 3.4 V 1.0% 3.5 V 1.0% 3.6 V 1.0% 3.7 V 1.0% 3.8 V 1.0% 3.9 V 1.0% 4.0 V 1.0% 4.1 V 1.0% 4.2 V 1.0% 4.3 V 1.0% 4.4 V 1.0% 4.5 V 1.0% 4.6 V 1.0% 4.7 V 1.0% 4.8 V 1.0% 4.9 V 1.0% 5.0 V 1.0% SOT-23-5 S-1003NA12I-M5T1U S-1003NA13I-M5T1U S-1003NA14I-M5T1U S-1003NA15I-M5T1U S-1003NA16I-M5T1U S-1003NA17I-M5T1U S-1003NA18I-M5T1U S-1003NA19I-M5T1U S-1003NA20I-M5T1U S-1003NA21I-M5T1U S-1003NA22I-M5T1U S-1003NA23I-M5T1U S-1003NA24I-M5T1U S-1003NA25I-M5T1U S-1003NA26I-M5T1U S-1003NA27I-M5T1U S-1003NA28I-M5T1U S-1003NA29I-M5T1U S-1003NA30I-M5T1U S-1003NA31I-M5T1U S-1003NA32I-M5T1U S-1003NA33I-M5T1U S-1003NA34I-M5T1U S-1003NA35I-M5T1U S-1003NA36I-M5T1U S-1003NA37I-M5T1U S-1003NA38I-M5T1U S-1003NA39I-M5T1U S-1003NA40I-M5T1U S-1003NA41I-M5T1U S-1003NA42I-M5T1U S-1003NA43I-M5T1U S-1003NA44I-M5T1U S-1003NA45I-M5T1U S-1003NA46I-M5T1U S-1003NA47I-M5T1U S-1003NA48I-M5T1U S-1003NA49I-M5T1U S-1003NA50I-M5T1U SNT-6A S-1003NA12I-I6T1U S-1003NA13I-I6T1U S-1003NA14I-I6T1U S-1003NA15I-I6T1U S-1003NA16I-I6T1U S-1003NA17I-I6T1U S-1003NA18I-I6T1U S-1003NA19I-I6T1U S-1003NA20I-I6T1U S-1003NA21I-I6T1U S-1003NA22I-I6T1U S-1003NA23I-I6T1U S-1003NA24I-I6T1U S-1003NA25I-I6T1U S-1003NA26I-I6T1U S-1003NA27I-I6T1U S-1003NA28I-I6T1U S-1003NA29I-I6T1U S-1003NA30I-I6T1U S-1003NA31I-I6T1U S-1003NA32I-I6T1U S-1003NA33I-I6T1U S-1003NA34I-I6T1U S-1003NA35I-I6T1U S-1003NA36I-I6T1U S-1003NA37I-I6T1U S-1003NA38I-I6T1U S-1003NA39I-I6T1U S-1003NA40I-I6T1U S-1003NA41I-I6T1U S-1003NA42I-I6T1U S-1003NA43I-I6T1U S-1003NA44I-I6T1U S-1003NA45I-I6T1U S-1003NA46I-I6T1U S-1003NA47I-I6T1U S-1003NA48I-I6T1U S-1003NA49I-I6T1U S-1003NA50I-I6T1U 5 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 4. 2 S-1003 Series NB type Output form: Nch open-drain output (Active "L") MR pin logic: Active "H" Table 4 Detection Voltage 1.2 V 22 mV 1.3 V 22 mV 1.4 V 22 mV 1.5 V 22 mV 1.6 V 22 mV 1.7 V 22 mV 1.8 V 22 mV 1.9 V 22 mV 2.0 V 22 mV 2.1 V 22 mV 2.2 V 1.0% 2.3 V 1.0% 2.4 V 1.0% 2.5 V 1.0% 2.6 V 1.0% 2.7 V 1.0% 2.8 V 1.0% 2.9 V 1.0% 3.0 V 1.0% 3.1 V 1.0% 3.2 V 1.0% 3.3 V 1.0% 3.4 V 1.0% 3.5 V 1.0% 3.6 V 1.0% 3.7 V 1.0% 3.8 V 1.0% 3.9 V 1.0% 4.0 V 1.0% 4.1 V 1.0% 4.2 V 1.0% 4.3 V 1.0% 4.4 V 1.0% 4.5 V 1.0% 4.6 V 1.0% 4.7 V 1.0% 4.8 V 1.0% 4.9 V 1.0% 5.0 V 1.0% 6 SOT-23-5 S-1003NB12I-M5T1U S-1003NB13I-M5T1U S-1003NB14I-M5T1U S-1003NB15I-M5T1U S-1003NB16I-M5T1U S-1003NB17I-M5T1U S-1003NB18I-M5T1U S-1003NB19I-M5T1U S-1003NB20I-M5T1U S-1003NB21I-M5T1U S-1003NB22I-M5T1U S-1003NB23I-M5T1U S-1003NB24I-M5T1U S-1003NB25I-M5T1U S-1003NB26I-M5T1U S-1003NB27I-M5T1U S-1003NB28I-M5T1U S-1003NB29I-M5T1U S-1003NB30I-M5T1U S-1003NB31I-M5T1U S-1003NB32I-M5T1U S-1003NB33I-M5T1U S-1003NB34I-M5T1U S-1003NB35I-M5T1U S-1003NB36I-M5T1U S-1003NB37I-M5T1U S-1003NB38I-M5T1U S-1003NB39I-M5T1U S-1003NB40I-M5T1U S-1003NB41I-M5T1U S-1003NB42I-M5T1U S-1003NB43I-M5T1U S-1003NB44I-M5T1U S-1003NB45I-M5T1U S-1003NB46I-M5T1U S-1003NB47I-M5T1U S-1003NB48I-M5T1U S-1003NB49I-M5T1U S-1003NB50I-M5T1U SNT-6A S-1003NB12I-I6T1U S-1003NB13I-I6T1U S-1003NB14I-I6T1U S-1003NB15I-I6T1U S-1003NB16I-I6T1U S-1003NB17I-I6T1U S-1003NB18I-I6T1U S-1003NB19I-I6T1U S-1003NB20I-I6T1U S-1003NB21I-I6T1U S-1003NB22I-I6T1U S-1003NB23I-I6T1U S-1003NB24I-I6T1U S-1003NB25I-I6T1U S-1003NB26I-I6T1U S-1003NB27I-I6T1U S-1003NB28I-I6T1U S-1003NB29I-I6T1U S-1003NB30I-I6T1U S-1003NB31I-I6T1U S-1003NB32I-I6T1U S-1003NB33I-I6T1U S-1003NB34I-I6T1U S-1003NB35I-I6T1U S-1003NB36I-I6T1U S-1003NB37I-I6T1U S-1003NB38I-I6T1U S-1003NB39I-I6T1U S-1003NB40I-I6T1U S-1003NB41I-I6T1U S-1003NB42I-I6T1U S-1003NB43I-I6T1U S-1003NB44I-I6T1U S-1003NB45I-I6T1U S-1003NB46I-I6T1U S-1003NB47I-I6T1U S-1003NB48I-I6T1U S-1003NB49I-I6T1U S-1003NB50I-I6T1U MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 4. 3 S-1003 Series CA type Output form: CMOS output (Active "L") MR pin logic: Active "L" Table 5 Detection Voltage 1.2 V 22 mV 1.3 V 22 mV 1.4 V 22 mV 1.5 V 22 mV 1.6 V 22 mV 1.7 V 22 mV 1.8 V 22 mV 1.9 V 22 mV 2.0 V 22 mV 2.1 V 22 mV 2.2 V 1.0% 2.3 V 1.0% 2.4 V 1.0% 2.5 V 1.0% 2.6 V 1.0% 2.7 V 1.0% 2.8 V 1.0% 2.9 V 1.0% 3.0 V 1.0% 3.1 V 1.0% 3.2 V 1.0% 3.3 V 1.0% 3.4 V 1.0% 3.5 V 1.0% 3.6 V 1.0% 3.7 V 1.0% 3.8 V 1.0% 3.9 V 1.0% 4.0 V 1.0% 4.1 V 1.0% 4.2 V 1.0% 4.3 V 1.0% 4.4 V 1.0% 4.5 V 1.0% 4.6 V 1.0% 4.7 V 1.0% 4.8 V 1.0% 4.9 V 1.0% 5.0 V 1.0% SOT-23-5 S-1003CA12I-M5T1U S-1003CA13I-M5T1U S-1003CA14I-M5T1U S-1003CA15I-M5T1U S-1003CA16I-M5T1U S-1003CA17I-M5T1U S-1003CA18I-M5T1U S-1003CA19I-M5T1U S-1003CA20I-M5T1U S-1003CA21I-M5T1U S-1003CA22I-M5T1U S-1003CA23I-M5T1U S-1003CA24I-M5T1U S-1003CA25I-M5T1U S-1003CA26I-M5T1U S-1003CA27I-M5T1U S-1003CA28I-M5T1U S-1003CA29I-M5T1U S-1003CA30I-M5T1U S-1003CA31I-M5T1U S-1003CA32I-M5T1U S-1003CA33I-M5T1U S-1003CA34I-M5T1U S-1003CA35I-M5T1U S-1003CA36I-M5T1U S-1003CA37I-M5T1U S-1003CA38I-M5T1U S-1003CA39I-M5T1U S-1003CA40I-M5T1U S-1003CA41I-M5T1U S-1003CA42I-M5T1U S-1003CA43I-M5T1U S-1003CA44I-M5T1U S-1003CA45I-M5T1U S-1003CA46I-M5T1U S-1003CA47I-M5T1U S-1003CA48I-M5T1U S-1003CA49I-M5T1U S-1003CA50I-M5T1U SNT-6A S-1003CA12I-I6T1U S-1003CA13I-I6T1U S-1003CA14I-I6T1U S-1003CA15I-I6T1U S-1003CA16I-I6T1U S-1003CA17I-I6T1U S-1003CA18I-I6T1U S-1003CA19I-I6T1U S-1003CA20I-I6T1U S-1003CA21I-I6T1U S-1003CA22I-I6T1U S-1003CA23I-I6T1U S-1003CA24I-I6T1U S-1003CA25I-I6T1U S-1003CA26I-I6T1U S-1003CA27I-I6T1U S-1003CA28I-I6T1U S-1003CA29I-I6T1U S-1003CA30I-I6T1U S-1003CA31I-I6T1U S-1003CA32I-I6T1U S-1003CA33I-I6T1U S-1003CA34I-I6T1U S-1003CA35I-I6T1U S-1003CA36I-I6T1U S-1003CA37I-I6T1U S-1003CA38I-I6T1U S-1003CA39I-I6T1U S-1003CA40I-I6T1U S-1003CA41I-I6T1U S-1003CA42I-I6T1U S-1003CA43I-I6T1U S-1003CA44I-I6T1U S-1003CA45I-I6T1U S-1003CA46I-I6T1U S-1003CA47I-I6T1U S-1003CA48I-I6T1U S-1003CA49I-I6T1U S-1003CA50I-I6T1U 7 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 4. 4 S-1003 Series CB type Output form: CMOS output (Active "L") MR pin logic: Active "H" Table 6 Detection Voltage 1.2 V 22 mV 1.3 V 22 mV 1.4 V 22 mV 1.5 V 22 mV 1.6 V 22 mV 1.7 V 22 mV 1.8 V 22 mV 1.9 V 22 mV 2.0 V 22 mV 2.1 V 22 mV 2.2 V 1.0% 2.3 V 1.0% 2.4 V 1.0% 2.5 V 1.0% 2.6 V 1.0% 2.7 V 1.0% 2.8 V 1.0% 2.9 V 1.0% 3.0 V 1.0% 3.1 V 1.0% 3.2 V 1.0% 3.3 V 1.0% 3.4 V 1.0% 3.5 V 1.0% 3.6 V 1.0% 3.7 V 1.0% 3.8 V 1.0% 3.9 V 1.0% 4.0 V 1.0% 4.1 V 1.0% 4.2 V 1.0% 4.3 V 1.0% 4.4 V 1.0% 4.5 V 1.0% 4.6 V 1.0% 4.7 V 1.0% 4.8 V 1.0% 4.9 V 1.0% 5.0 V 1.0% 8 SOT-23-5 S-1003CB12I-M5T1U S-1003CB13I-M5T1U S-1003CB14I-M5T1U S-1003CB15I-M5T1U S-1003CB16I-M5T1U S-1003CB17I-M5T1U S-1003CB18I-M5T1U S-1003CB19I-M5T1U S-1003CB20I-M5T1U S-1003CB21I-M5T1U S-1003CB22I-M5T1U S-1003CB23I-M5T1U S-1003CB24I-M5T1U S-1003CB25I-M5T1U S-1003CB26I-M5T1U S-1003CB27I-M5T1U S-1003CB28I-M5T1U S-1003CB29I-M5T1U S-1003CB30I-M5T1U S-1003CB31I-M5T1U S-1003CB32I-M5T1U S-1003CB33I-M5T1U S-1003CB34I-M5T1U S-1003CB35I-M5T1U S-1003CB36I-M5T1U S-1003CB37I-M5T1U S-1003CB38I-M5T1U S-1003CB39I-M5T1U S-1003CB40I-M5T1U S-1003CB41I-M5T1U S-1003CB42I-M5T1U S-1003CB43I-M5T1U S-1003CB44I-M5T1U S-1003CB45I-M5T1U S-1003CB46I-M5T1U S-1003CB47I-M5T1U S-1003CB48I-M5T1U S-1003CB49I-M5T1U S-1003CB50I-M5T1U SNT-6A S-1003CB12I-I6T1U S-1003CB13I-I6T1U S-1003CB14I-I6T1U S-1003CB15I-I6T1U S-1003CB16I-I6T1U S-1003CB17I-I6T1U S-1003CB18I-I6T1U S-1003CB19I-I6T1U S-1003CB20I-I6T1U S-1003CB21I-I6T1U S-1003CB22I-I6T1U S-1003CB23I-I6T1U S-1003CB24I-I6T1U S-1003CB25I-I6T1U S-1003CB26I-I6T1U S-1003CB27I-I6T1U S-1003CB28I-I6T1U S-1003CB29I-I6T1U S-1003CB30I-I6T1U S-1003CB31I-I6T1U S-1003CB32I-I6T1U S-1003CB33I-I6T1U S-1003CB34I-I6T1U S-1003CB35I-I6T1U S-1003CB36I-I6T1U S-1003CB37I-I6T1U S-1003CB38I-I6T1U S-1003CB39I-I6T1U S-1003CB40I-I6T1U S-1003CB41I-I6T1U S-1003CB42I-I6T1U S-1003CB43I-I6T1U S-1003CB44I-I6T1U S-1003CB45I-I6T1U S-1003CB46I-I6T1U S-1003CB47I-I6T1U S-1003CB48I-I6T1U S-1003CB49I-I6T1U S-1003CB50I-I6T1U MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Pin Configurations 1. SOT-23-5 Table 7 Top view 5 Pin No. 4 1 2 3 4 5 1 2 3 Symbol CD VSS MR OUT VDD Description Connection pin for delay capacitor GND pin Manual reset pin Voltage detection output pin Voltage input pin Figure 5 2. SNT-6A Table 8 Top view 1 2 3 Pin No. 6 5 4 Figure 6 *1. Symbol Description 1 CD Connection pin for delay capacitor 2 VDD Voltage input pin 3 OUT Voltage detection output pin 4 MR Manual reset pin NC*1 5 No connection 6 VSS GND pin The NC pin is electrically open. The NC pin can be connected to the VDD pin or the VSS pin. 9 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Absolute Maximum Ratings Table 9 (Ta = 25C unless otherwise specified) Item Symbol Power supply voltage VDDVSS CD pin input voltage VCD MR pin input voltage VMR Nch open-drain output product Output voltage VOUT CMOS output product Output current IOUT SOT-23-5 Power dissipation PD SNT-6A Operation ambient temperature Topr Storage temperature Tstg *1. When mounted on board [Mounted board] (1) Board size: 114.3 mm 76.2 mm t1.6 mm (2) Name: JEDEC STANDARD51-7 Caution Absolute Maximum Rating Unit 12.0 VSS0.3 to VDD 0.3 VSS0.3 to VDD 0.3 VSS0.3 to 12.0 VSS0.3 to VDD 0.3 50 *1 600 400*1 40 to 85 40 to 125 V V V V V mA mW mW C C The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. Power Dissipation (PD) [mW] 700 600 500 300 10 SNT-6A 200 100 0 Figure 7 SOT-23-5 400 0 150 100 50 Ambient Temperature (Ta) [C] Power Dissipation of Package (When Mounted on Board) MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Electrical Characteristics 1. Nch open-drain output product Table 10 Item Symbol Condition 1.2 V VDET 2.2 V Detection voltage*1 VDET 2.2 V VDET 5.0 V Hysteresis width VHYS Current consumption Operation voltage ISS VDD VDD = VDET(S) 1.0 V IOUT Output transistor Nch VDS*2 = 0.5 V MR pin active Output current Leakage current ILEAK Delay time*3 Detection voltage temperature coefficient*4 tD MR pin input voltage "H" MR pin input voltage "L" VDD = 0.95 V VDD = 1.2 V VDD = 2.4 V VDD = 4.8 V Output transistor Nch VDD = 10.0 V, VOUT = 10.0 V MR pin non-active CD = 4.7 nF VDET Ta = 40C to 85C Ta VDET VMRH VMRL NA type (MR pin logic active "L") NB type (MR pin logic active "H") NA type (MR pin logic active "L") NB type (MR pin logic active "H") (Ta = 25C unless otherwise specified) Test Min. Typ. Max. Unit Circuit VDET(S) VDET(S) V 1 VDET(S) 0.022 0.022 VDET(S) VDET(S) VDET(S) V 1 0.99 1.01 VDET VDET VDET V 1 0.03 0.05 0.07 0.50 0.90 A 2 0.95 10.0 V 1 0.59 1.00 mA 3 0.73 1.33 mA 3 1.47 2.39 mA 3 1.86 2.50 mA 3 0.08 A 3 8.5 10.0 11.5 ms 4 100 350 ppm/C 1 VDD 0.3 V 6 1.2 V 6 VDD 1.2 V 6 0.3 V 6 MR pin RMR 0.5 1.0 1.6 M 6 input resistance *1. VDET: Actual detection voltage value, VDET(S): Set detection voltage value (the center value of the detection voltage range in Table 3 or Table 4.) *2. VDS: Drain-to-source voltage of the output transistor *3. The time period from when the pulse voltage of 0.95 V VDET(S)1.0 V is applied to the VDD pin to when VOUT reaches VDD 0.9, after the output pin is pulled up to VDD by the resistance of 100 k *4. The temperature change of the detection voltage [mV/C] is calculated by using the following equation. VDET VDET [mV/C]*1 = VDET(S) (typ.)[V]*2 Ta V [ppm/C]*3 1000 Ta DET *1. Temperature change of the detection voltage *2. Set detection voltage *3. Detection voltage temperature coefficient 11 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 2. CMOS output product Table 11 Item Symbol Condition 1.2 V VDET 2.2 V Detection voltage*1 VDET 2.2 V VDET 5.0 V Hysteresis width VHYS Current consumption Operation voltage ISS VDD Output current IOUT VDD = VDET(S) 1.0 V VDD = 0.95 V Output transistor VDD = 1.2 V Nch *2 VDS = 0.5 V VDD = 2.4 V MR pin active VDD = 4.8 V VDD = 4.8 V Output transistor S-1003Cx12 to 43 Pch VDS*2 = 0.5 V *3 Delay time Detection voltage temperature coefficient*4 MR pin input voltage "H" MR pin input voltage "L" tD VDD = 6.0 V CD = 4.7 nF VDET Ta = 40C to 85C Ta VDET VMRH VMRL CA type (MR pin logic active "L") CB type (MR pin logic active "H") CA type (MR pin logic active "L") CB type (MR pin logic active "H") (Ta = 25C unless otherwise specified) Test Min. Typ. Max. Unit Circuit VDET(S) VDET(S) V 1 VDET(S) 0.022 0.022 VDET(S) VDET(S) VDET(S) V 1 0.99 1.01 VDET VDET VDET V 1 0.03 0.05 0.07 0.50 0.90 A 2 0.95 10.0 V 1 0.59 1.00 mA 3 0.73 1.33 mA 3 1.47 2.39 mA 3 1.86 2.50 mA 3 1.62 2.60 mA 5 1.78 2.86 mA 5 8.5 10.0 11.5 ms 4 100 350 ppm/C 1 VDD 0.3 V 6 1.2 V 6 VDD 1.2 V 6 0.3 V 6 MR pin RMR 0.5 1.0 1.6 M 6 input resistance *1. VDET: Actual detection voltage value, VDET(S): Set detection voltage value (the center value of the detection voltage range in Table 5 or Table 6.) *2. VDS: Drain-to-source voltage of the output transistor *3. The time period from when the pulse voltage of 0.95 V VDET(S)1.0 V is applied to the VDD pin to when VOUT reaches VDD 0.9. *4. The temperature change of the detection voltage [mV/C] is calculated by using the following equation. VDET VDET [mV/C]*1 = VDET(S) (typ.)[V]*2 Ta V [ppm/C]*3 1000 Ta DET *1. Temperature change of the detection voltage *2. Set detection voltage *3. Detection voltage temperature coefficient 12 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Test Circuits VDD MR *2 *1. *2. R*1 100 k VDD V VSS CD VDD VDD OUT V MR OUT VSS CD *1 R is unnecessary for CMOS output product. Set to VDD or GND (MR pin non-active). Figure 8 A *1. Set to VDD or GND (MR pin non-active). Test Circuit 1 Figure 9 Test Circuit 2 Oscilloscope VDD VDD VDD V *1 *1 MR OUT VSS CD A VDS P.G. *2 V MR OUT VSS CD R 100 k VOUT CD *1. Set to VDD or GND. Figure 10 *1. *2. R is unnecessary for CMOS output product. Set to VDD or GND (MR pin non-active). Test Circuit 3 Figure 11 Test Circuit 4 VDS V VDD MR V *1 *1. *1 VDD VSS OUT A A VMR MR OUT VSS CD V Set to VDD or GND (MR pin non-active). Figure 12 VDD VDD CD R 100 k Test Circuit 5 *1. V R is unnecessary for CMOS output product. Figure 13 Test Circuit 6 13 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Timing Charts 1. Nch open-drain output product VDD Release voltage (VDET) Hysteresis width (VHYS) Detection voltage (VDET) Minimum operation voltage VSS VDD R 100 k VDD VDD *1 MR OUT VSS CD V Output from OUT pin VSS *1. tD Set to VDD or GND (MR pin non-active). Figure 14 2. CMOS output product VDD Release voltage (VDET) Hysteresis width (VHYS) Detection voltage (VDET) Minimum operation voltage VSS VDD VDD *1 VDD MR OUT VSS CD V Output from OUT pin VSS *1. Set to VDD or GND (MR pin non-active). tD Remark When VDD is the minimum operation voltage or less, the output voltage from the OUT pin is indefinite in the shaded area. Figure 15 14 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Operation 1. Basic operation: CMOS output (active "L") product (1) (2) (3) (4) (5) When the power supply voltage (VDD) is the release voltage (VDET) or more, the Nch transistor is OFF and the Pch transistor is ON to output VDD ("H"). Since the Nch transistor N1 in Figure 16 is OFF, the comparator (RB RC ) VDD input voltage is . RA RB RC Although VDD decreases to VDET or less, VDD is output when VDD is higher than the detection voltage (VDET). When VDD decreases to VDET or less (point A in Figure 17), the Nch transistor is ON and the Pch transistor is OFF so that VSS ("L") is output. At this time, the Nch transistor N1 in Figure 16 is turned on, and the input RB VDD voltage to the comparator is . RA RB The output is indefinite by decreasing VDD to the IC's minimum operation voltage or less. If the output is pulled up, it will be VDD. VSS is output by increasing VDD to the minimum operation voltage or more. Although VDD exceeds VDET and VDD is less than VDET, the output is VSS. When increasing VDD to VDET or more (point B in Figure 17), the Nch transistor is OFF and the Pch transistor is ON so that VDD is output. At this time, VDD is output from the OUT pin after the passage of the delay time (tD). VDD *1 Pch *1 RA Delay circuit *1 OUT *1 RB Nch VREF *1 RC MR circuit *1 N1 VSS MR *1. CD CD Parasitic diode Figure 16 (1) (2) (3) Operation 1 (4) B A Hysteresis width (VHYS) (5) VDD Release voltage (VDET) Detection voltage (VDET) Minimum operation voltage VSS VDD Output from OUT pin VSS Remark tD When VDD is the minimum operation voltage or less, the output voltage from the OUT pin is indefinite in the shaded area. Figure 17 Operation 2 15 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 2. Manual reset function The OUT pin voltage can be changed to detection status forcibly by the MR pin input voltage (VMR). When not using the manual reset function, set VMR = VDD in the S-1003 Series xA type, and VMR = VSS in the S-1003 Series xB type. Caution Perform thorough evaluation in the actual application when using the MR pin in open. Due to the parasitic capacitance of the MR pin, the manual reset function may malfunction when the power supply fluctuates. 2. 1 S-1003 Series xA type (MR pin logic active "L") (1) MR pin = "L" When the VDD pin voltage is the release voltage (VDET) or more, the OUT pin changes to the detection status from the release status immediately if a voltage of the MR pin input voltage "L" (VMRL) or less is applied to the MR pin. (2) MR pin = "H" If a voltage of the MR pin input voltage "H" (VMRH) or more is applied to the MR pin, output from the OUT pin is determined to be "H" or "L" depending on the VDD pin voltage. After the passage of the delay time (tD), the OUT pin changes to the release status from the detection status. (1) (2) Input from VDD pin VDD (VDET) Input from MR pin MR pin input voltage "H" (VMRH) MR pin input voltage "L" (VMRL) VDD Output from OUT pin VSS tD Figure 18 Remark Timing Chart of MR Pin Logic Active "L" Since the MR pin is pulled up to the VDD pin internally, output from the OUT pin is determined to be "H" or "L" in the floating status depending on the VDD pin voltage (Refer to Figure 19). *1 VDD RMR MR *1 VSS *1. Parasitic diode Figure 19 16 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 2. 2 S-1003 Series xB type (MR pin logic active "H") (1) MR pin = "H" When the VDD pin voltage is the release voltage (VDET) or more, the OUT pin changes to the detection status from the release status immediately if a voltage of the MR pin input voltage "H" (VMRH) or more is applied to the MR pin. (2) MR pin = "L" If a voltage of the MR pin input voltage "L" (VMRL) or less is applied to the MR pin, output from the OUT pin is determined to be "H" or "L" depending on the VDD pin voltage. After the passage of the delay time (tD), the OUT pin changes to the release status from the detection status. (2) (1) Input from VDD pin VDD (VDET) Input from MR pin MR pin input voltage "H" (VMRH) MR pin input voltage "L" (VMRL) VDD Output from OUT pin VSS tD Figure 20 Remark Timing Chart of MR Pin Logic Active "H" Since the MR pin is pulled down to the VSS pin internally, output from the OUT pin is determined to be "H" or "L" in the floating status depending on the VDD pin voltage (Refer to Figure 21). *1 VDD MR RMR *1 VSS *1. Parasitic diode Figure 21 17 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 2. 3 Cautions of manual reset function 2. 3. 1 Slew rate when switching manual reset function Although there is a hysteresis width between the MR pin input voltage "L" (VMRL) and the MR pin input voltage "H" (VMRH), note that the IC may malfunction if the slew rate (Refer to Figure 22, Figure 23) is low when the MR pin voltage is changed. The slew rate is calculated by using the following equation. Slew rate = VMRH VMRL t (1) When MR pin logic is active "L" The OUT pin voltage may oscillate if the parasitic resistance (RP) between the power supply and the VDD pin is high. In case of RP 8 k Connect a capacitor of 1 nF or more between the VDD pin and the VSS pin. In case of 5 k RP 8 kCapacitors are unnecessary if the slew rate is 100 V/s or higher. In case of RP 5 k Capacitors are unnecessary if the slew rate is 1 V/s or higher. VMR VMRH VMRL Time t Figure 22 (2) When MR pin logic is active "H" Connect a capacitor of 100 pF or more to the CD pin, and set the slew rate 20 V/s or higher. VMR VMRH VMRL Time t Figure 23 18 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 2. 4 When connecting resistance (RA) between power supply voltage (VDD) and VDD pin When the MR pin voltage (VMR) is an intermediate voltage (especially VMRLVMRVMRH), the current consumption increases by 25 A max. A voltage drop occurs since this current flows through RA. If the VDD pin voltage (VIN) becomes the detection voltage (VDET) or less for that reason, the OUT pin changes to the detection status, and the detection status or the release status are not controlled by VMR. The OUT pin may not be able to change to the release status unless VDD is raised (Refer to Figure 24). (1) When MR pin logic is active "L" In case of VIN VMR, a current also flows through the MR pin input resistance (RMR). For example, when VIN = 10 V, VMR = 1 V, RMR = 0.5 M (min.), a current of 18 A flows from the VDD pin to the MR pin. Therefore, set RA so as to satisfy the following equation. RA (VDD (VDET)) / (25 AMR pin current) (2) When MR pin logic is active "H" Set RA so as to satisfy the following equation. RA (VDD (VDET)) / 25 A VDD RA VIN VDD OUT MR VSS CD VMR (Nch open-drain output product) GND Figure 24 19 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 3. Delay circuit The delay circuit delays the output signal to the OUT pin from the time at which the power supply voltage (VDD) exceeds the release voltage (VDET) when VDD is turned on. The output signal is not delayed when VDD decreases to the detection voltage (VDET) or less (refer to "Figure 17 Operation 2"). The delay time (tD) is determined by the time constant of the built-in constant current (approx. 100 nA) and the attached delay capacitor (CD), or the delay time (tD0) when the CD pin is open, and calculated from the following equation. When the CD value is sufficiently large, the tD0 value can be disregarded. tD [ms] = Delay coefficient CD [nF] tD0 [ms] Table 12 Delay Coefficient Delay Coefficient Operation Temperature Min. 1.60 1.78 2.01 Ta = 85C Ta = 25C Ta = 40C Table 13 Operation Temperature Ta = 40C to 85C Caution 1. Typ. 1.89 2.05 2.31 Max. 2.13 2.30 2.71 Delay Time Min. 0.021 ms Delay Time (tD0) Typ. 0.044 ms Max. 0.147 ms When the CD pin is open, a double pulse shown in Figure 25 may appear at release. To avoid the double pulse, attach a 100 pF or larger capacitor to the CD pin. Do not apply voltage to the CD pin from the exterior. VOUT Time Figure 25 2. 3. 20 Mounted board layout should be made in such a way that no current flows into or flows from the CD pin since the impedance of the CD pin is high, otherwise correct delay time cannot be provided. There is no limit for the capacitance of CD as long as the leakage current of the capacitor can be ignored against the built-in constant current value. Leakage current causes deviation in delay time. When the leakage current is larger than the built-in constant current, no release takes place. MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 4. Other characteristics 4. 1 Temperature characteristics of detection voltage The shaded area in Figure 26 shows the temperature characteristics of detection voltage in the operation temperature range. VDET [V] 0.945 mV/C VDET25 *1 0.945 mV/C 40 *1. Figure 26 4. 2 25 85 Ta [C] VDET25 is an actual detection voltage value at Ta = 25C. Temperature Characteristics of Detection Voltage (Example for VDET = 2.7 V) Temperature characteristics of release voltage The temperature change VDET of the release voltage is calculated by using the temperature change Ta VDET of the detection voltage as follows: Ta VDET VDET VDET = Ta VDET Ta The temperature change of the release voltage and the detection voltage has the same sign consequently. 4. 3 Temperature characteristics of hysteresis voltage The temperature change of the hysteresis voltage is expressed as VDET VDET and is calculated as Ta Ta follows: VDET VDET VHYS VDET = Ta Ta VDET Ta 21 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Standard Circuit R*1 100 k VDD MR VSS OUT CD CD *1. *2. *2 R is unnecessary for CMOS output product. The delay capacitor (CD) should be connected directly to the CD pin and the VSS pin. Figure 27 Caution 22 The above connection diagram and constant will not guarantee successful operation. Perform thorough evaluation using the actual application to set the constant. MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Explanation of Terms 1. Detection voltage (VDET) The detection voltage is a voltage at which the output in Figure 30 turns to "L". The detection voltage varies slightly among products of the same specification. The variation of detection voltage between the specified minimum (VDET min.) and the maximum (VDET max.) is called the detection voltage range (Refer to Figure 28). Example: 2. In the S-1003Cx15, the detection voltage is either one in the range of 1.478 V VDET 1.522 V. This means that some S-1003Cx15 have VDET = 1.478 V and some have VDET = 1.522 V. Release voltage (VDET) The release voltage is a voltage at which the output in Figure 30 turns to "H". The release voltage varies slightly among products of the same specification. The variation of release voltage between the specified minimum (VDET min.) and the maximum (VDET max.) is called the release voltage range (Refer to Figure 29). The range is calculated from the actual detection voltage (VDET) of a product and is in the range of VDET 1.03 VDET VDET 1.07. Example: For the S-1003Cx15, the release voltage is either one in the range of 1.522 V VDET 1.629 V. This means that some S-1003Cx15 have VDET = 1.522 V and some have VDET = 1.629 V. VDD VDD Release voltage Detection voltage VDET max. VDET max. Detection voltage range VDET min. Release voltage range VDET min. OUT OUT tD Figure 28 Detection Voltage VDD Figure 29 R*1 100 k VDD V MR *2 VSS Release Voltage OUT CD V *1. R is unnecessary for CMOS output product. *2. Set to VDD or GND (MR pin non-active). Figure 30 Test Circuit of Detection Voltage and Release Voltage 23 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 3. Hysteresis width (VHYS) The hysteresis width is the voltage difference between the detection voltage and the release voltage (the voltage at point B the voltage at point A = VHYS in "Figure 17 Operation 2"). Setting the hysteresis width between the detection voltage and the release voltage, prevents malfunction caused by noise on the input voltage. 4. Delay time (tD) The delay time in the S-1003 Series is a period from the input voltage to the VDD pin exceeding the release voltage (VDET) until the output from the OUT pin inverts. The delay time changes according to the delay capacitor (CD). VDD VDET OUT tD Figure 31 5. Delay Time Feed-through current Feed-through current is a current that flows instantaneously at the time of detection and release of a voltage detector. The feed-through current is large in CMOS output product, small in Nch open-drain output product. 6. Oscillation In applications where a resistor is connected to the voltage detector input (Figure 32), taking a CMOS active "L" product for example, the feed-through current which is generated when the output goes from "L" to "H" (release) causes a voltage drop equal to [feed-through current] [input resistance] across the resistor. When the input voltage drops below the detection voltage (VDET) as a result, the output voltage goes to "L". In this status, the feed-through current stops and its resultant voltage drop disappears, and the output goes from "L" to "H". The feed-through current is then generated again, a voltage drop appears, and repeating the process finally induces oscillation. VDD RA VIN VDD OUT MR VSS CD RB (CMOS output product) GND Figure 32 24 Example for Bad Implementation Due to Detection Voltage Change MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Precautions Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic protection circuit. In CMOS output product of the S-1003 Series, the feed-through current flows at the detection and the release. If the input impedance is high, oscillation may occur due to the voltage drop by the feed-through current when releasing. In CMOS output product oscillation may occur when a pull-down resistor is used, and falling speed of the power supply voltage (VDD) is slow near the detection voltage. When designing for mass production using an application circuit described herein, the product deviation and temperature characteristics of the external parts should be taken into consideration. ABLIC Inc. shall not bear any responsibility for patent infringements related to products using the circuits described herein. ABLIC Inc. claims no responsibility for any disputes arising out of or in connection with any infringement by products including this IC of patents owned by a third party. As seen in Figure 33, when connecting an input resistance (RA) in Nch open-drain output product of the S-1003 Series, RA should be 100 k or less to prevent oscillation. Moreover, note that the hysteresis width may be larger as the following equation. Maximum hysteresis width = VHYSRA 20 A When using the manual reset function, refer to "2. 4 When connecting resistance (RA) between power supply voltage (VDD) and VDD pin" in " Operation" to set the constant. VDD RA (RA 100 k) VIN Set to VIN or GND (MR pin non-active) VDD OUT MR VSS CD (Nch open-drain output product) GND Figure 33 Caution The above connection diagram and constant will not guarantee successful operation. Perform thorough evaluation using the actual application to set the constant. 25 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Characteristics (Typical Data) 1. Detection voltage (VDET) vs. Temperature (Ta) S-1003CA12 1.40 S-1003CA24 2.60 1.20 -VDET 1.10 1.00 +VDET 2.50 +VDET VDET [V] VDET [V] 1.30 2.40 -VDET 2.30 -40 -25 2.20 0 25 Ta [C] 50 75 85 50 75 85 -40 -25 0 25 Ta [C] 50 75 85 0 25 Ta [C] 50 75 85 S-1003CA50 5.40 +VDET VDET [V] 5.20 5.00 -VDET 4.80 4.60 2. -40 -25 0 25 Ta [C] Hysteresis width (VHYS) vs. Temperature (Ta) S-1003CA12 7 S-1003CA24 7 6 VHYS [%] VHYS [%] 6 5 4 3 -40 -25 25 Ta [C] 50 75 85 0 25 Ta [C] 50 75 85 VHYS [%] 6 5 4 26 -40 -25 4 3 0 S-1003CA50 7 3 5 -40 -25 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 3. Current consumption (ISS) vs. Input voltage (VDD) Ta = 25C 1.25 1.25 1.00 1.00 0.75 0.50 Ta = 25C S-1003CA24 1.50 ISS [A] ISS [A] S-1003CA12 1.50 0.25 0.75 0.50 0.25 0 0 0 2 4 6 VDD [V] 8 10 0 2 4 6 VDD [V] 8 10 Ta = 25C S-1003CA50 1.50 ISS [A] 1.25 1.00 0.75 0.50 0.25 0 0 4. 2 4 6 VDD [V] 8 10 Current consumption (ISS) vs. Temperature (Ta) VDD = VDET(S) 1.0 V S-1003NA12 1.00 0.75 ISS [A] ISS [A] 0.75 0.50 0.25 0 VDD = VDET(S) 1.0 V S-1003NA24 1.00 0.50 0.25 -40 -25 0 0 25 Ta [C] 50 75 85 -40 -25 0 25 Ta [C] 50 75 85 VDD = VDET(S) 1.0 V S-1003NA50 1.00 ISS [A] 0.75 0.50 0.25 0 -40 -25 0 25 Ta [C] 50 75 85 27 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series IOUT [mA] S-1003NA12 Ta = 25C, MR pin active 20.0 VDD = 6.00 V 17.5 15.0 VDD = 4.80 V 12.5 VDD = 3.60 V 10.0 7.5 VDD = 2.40 V 5.0 VDD = 1.20 V 2.5 VDD = 0.95 V 0 0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 VDS [V] 7. Nch transistor output current (IOUT) vs. Input voltage (VDD) IOUT [mA] S-1003NA12 VDS = 0.5 V, MR pin active 4.0 Ta = -40C 3.0 2.0 Ta = +85C 1.0 Ta = +25C Pch transistor output current (IOUT) vs. VDS Ta = 25C S-1003CA12 40.0 VDD = 8.4 V 30.0 VDD = 7.2 V VDD = 6.0 V VDD = 4.8 V VDD = 3.6 V VDD = 2.4 V 20.0 10.0 0 0 8. 2.0 S-1003CA12 5.0 2.0 4.0 6.0 VDD [V] 8.0 10.0 Remark VDS: Drain-to-source voltage of the output transistor 8.0 10.0 VDS = 0.5 V Ta = -40C 4.0 3.0 2.0 Ta = +25C Ta = +85C 0 0 4.0 6.0 VDS [V] Pch transistor output current (IOUT) vs. Input voltage (VDD) 1.0 0 28 6. IOUT [mA] Nch transistor output current (IOUT) vs. VDS IOUT [mA] 5. 0 2.0 4.0 6.0 VDD [V] 8.0 10.0 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Minimum operation voltage (VOUT) vs. Input voltage (VDD) VOUT [V] S-1003NA12 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0 Pull-up to VDD Pull-up resistance: 100 k S-1003NA24 Pull-up to VDD Pull-up resistance: 100 k 3.0 2.5 Ta = -40C Ta = +25C VOUT [V] 9. S-1003NA50 1.5 Ta = -40C Ta = +25C Ta = +85C 1.0 0.5 Ta = +85C 0 2.0 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 VDD [V] 0 0.4 0.8 1.2 1.6 VDD [V] 2.0 2.4 2.8 Pull-up to VDD Pull-up resistance: 100 k 6.0 VOUT [V] 5.0 4.0 3.0 Ta = -40C 2.0 Ta = +25C Ta = +85C 1.0 0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 VDD [V] S-1003NA12 Pull-up to 10 V Pull-up resistance: 100 k S-1003NA24 12.0 12.0 Ta = -40C 8.0 Ta = +25C Ta = +85C 6.0 4.0 2.0 10.0 VOUT [V] 10.0 VOUT [V] Pull-up to 10 V Pull-up resistance: 100 k Ta = -40C 8.0 Ta = +25C Ta = +85C 6.0 4.0 2.0 0 0 0 S-1003NA50 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 VDD [V] 0 0.4 0.8 1.2 1.6 VDD [V] 2.0 2.4 2.8 Pull-up to 10 V Pull-up resistance: 100 k 12.0 VOUT [V] 10.0 8.0 6.0 4.0 Ta = -40C Ta = +25C Ta = +85C 2.0 0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 VDD [V] 29 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 10. Dynamic response vs. Output pin capacitance (COUT) (CD pin; open) S-1003CA24 1 0.1 tPLH 0.01 tPHL 0.001 0.00001 Response time [ms] Response time [ms] S-1003CA12 1 0.001 0.01 0.0001 Output pin capacitance [F] 0.1 0.1 tPLH 0.01 tPHL 0.001 0.00001 0.001 0.01 0.0001 Output pin capacitance [F] 0.1 Response time [ms] S-1003CA50 1 0.1 0.01 0.001 0.00001 tPLH tPHL 0.001 0.01 0.0001 Output pin capacitance [F] 0.1 S-1003NA24 100 Response time [ms] Response time [ms] S-1003NA12 100 10 1 tPLH 0.1 0.01 0.001 0.00001 tPHL 0.001 0.01 0.0001 Output pin capacitance [F] 0.1 Response time [ms] S-1003NA50 100 30 10 1 tPLH 0.1 0.01 0.001 0.00001 tPHL 0.001 0.01 0.0001 Output pin capacitance [F] 0.1 10 1 tPLH 0.1 0.01 0.001 0.00001 tPHL 0.001 0.01 0.0001 Output pin capacitance [F] 0.1 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 1 s 1 s VIH*1 Input voltage R VDD VIL*2 tPHL VDD MR OUT V VSS CD tPLH *3 VDD 90% *3 VDD *2 *1 100 k COUT Output voltage V VDD1 *1 *3 VDD 10% R and VDD1 are unnecessary for CMOS output product. *2. Set to VDD or GND (MR pin non-active). *1. *1. *2. *3. VIH = 10 V VIL = 0.95 V CMOS output product: VDD Nch open-drain product: VDD1 Figure 34 Caution Test Condition of Response Time Figure 35 Test Circuit of Response Time 1. The above connection diagram and constant will not guarantee successful operation. Perform thorough evaluation using the actual application to set the constant. 2. When the CD pin is open, a double pulse may appear at release. To avoid the double pulse, attach a 100 pF or more capacitor to the CD pin. Response time when detecting (tPHL) is not affected by CD pin capacitance. Besides, response time when releasing (tPLH) can set the delay time by attaching the CD pin. Refer to "11. Delay time (tD) vs. CD pin capacitance (CD) (Without output pin capacitance)" for details. 11. Delay time (tD) vs. CD pin capacitance (CD) (Without output pin capacitance) Ta = 25C 1000 1000 100 100 10 1 0.1 0.01 0.01 Ta = 25C S-1003NA24 10000 tD [ms] tD [ms] S-1003NA12 10000 10 1 0.1 0.1 1 10 CD [nF] 100 1000 0.01 0.01 0.1 1 10 CD [nF] 100 1000 Ta = 25C S-1003NA50 10000 tD [ms] 1000 100 10 1 0.1 0.01 0.01 0.1 1 10 CD [nF] 100 1000 31 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 12. Delay time (tD) vs. Temperature (Ta) S-1003NA24 CD = 4.7 nF, VDD = 0.95 V VDET(S) 1.0 V 12 12 11 11 tD [ms] tD [ms] S-1003NA12 CD = 4.7 nF, VDD = 0.95 V VDET(S) 1.0 V 10 9 8 10 9 -40 -25 8 0 25 Ta [C] 50 75 85 -40 -25 0 25 Ta [C] 50 75 85 S-1003NA50 CD = 4.7 nF, VDD = 0.95 V VDET(S) 1.0 V 12 tD [ms] 11 10 9 8 -40 -25 0 25 Ta [C] 50 75 85 1 s VIH *1 R*1 VDD Input voltage VIL*2 tD VDD MR V VSS OUT CD *2 CD VDD 90% 100 k V Output voltage VSS *1. *2. VIH = VDET(S)1.0 V VIL = 0.95 V Figure 36 Caution 32 Test Condition for Delay Time *1. *2. R is unnecessary for CMOS output product. Set to VDD or GND (MR pin non-active). Figure 37 Test Circuit for Delay Time The above connection diagram and constant will not guarantee successful operation. Perform thorough evaluation using the actual application to set the constant. MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series Application Circuit Examples 1. Microcomputer reset circuits In microcomputers, when the power supply voltage is lower than the guaranteed operation voltage, an unspecified operation may be performed or the contents of the memory register may be lost. When power supply voltage returns to the normal level, the microcomputer needs to be initialized. Otherwise, the microcomputer may malfunction after that. Reset circuits to protect microcomputer in the event of current being momentarily switched off or lowered. Using the S-1003 Series which has the low operation voltage, a high accuracy detection voltage and hysteresis, reset circuits can be easily constructed as seen in Figure 38 and Figure 39. VDD VDD1 VDD VDD VDD *1 MR OUT VSS CD MR *1 Microcomputer GND *1. Set to VDD or GND (MR pin non-active). Figure 38 Example of Reset Circuit (CMOS Output Product) Caution OUT Microcomputer VSS CD GND *1. Set to VDD or GND (MR pin non-active). Figure 39 Example of Reset Circuit (Nch Open-drain Output Product) The above connection diagram and constant will not guarantee successful operation. Perform thorough evaluation using the actual application to set the constant. 33 MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR Rev.1.0_03 S-1003 Series 2. Change of detection voltage (Nch open-drain output product only) If there is not a product with a specified detection voltage value in the S-1003N Series, the detection voltage can be changed by using a resistance divider or a diode, as seen in Figure 40 and Figure 41. In Figure 40, hysteresis width also changes. VDD VDD RA Vf1 R *1 100 k (RA 100 k) VIN VDD R 100 k VIN VDD OUT MR VSS CD OUT MR VSS CD RB RA RB VDET RB RA RB VHYS Hysteresis width = RB Detection voltage = Detection voltage = Vf1 (VDET) *1. Set to VIN or GND (MR pin non-active). RA should be 100 k or less to prevent oscillation. Set to VIN or GND (MR pin non-active). Caution If RA and RB are large, the hysteresis width may also be larger than the value given by the above equation due to the feed-through current. Figure 40 Caution 1. 2. 3. Figure 41 The above connection diagram and constant will not guarantee successful operation. Perform thorough evaluation using the actual application to set the constant. Note that the hysteresis width may be larger as the following equation shows when using the above connections. Perform thorough evaluation using the actual application to set the constant. Maximum hysteresis width = 34 (Nch open-drain output product) GND GND *1. *2. *1 (Nch open-drain output product) *2 R A RB VHYSRA 20 A RB When using the manual reset function, refer to "2. 4 When connecting resistance (RA) between power supply voltage (VDD) and VDD pin" in " Operation" to set the constant. 2.90.2 1.90.2 4 5 1 2 +0.1 0.16 -0.06 3 0.950.1 0.40.1 No. MP005-A-P-SD-1.3 TITLE SOT235-A-PKG Dimensions No. MP005-A-P-SD-1.3 ANGLE UNIT mm ABLIC Inc. 4.00.1(10 pitches:40.00.2) +0.1 o1.5 -0 +0.2 o1.0 -0 2.00.05 0.250.1 4.00.1 1.40.2 3.20.2 3 2 1 4 5 Feed direction No. MP005-A-C-SD-2.1 TITLE SOT235-A-Carrier Tape No. MP005-A-C-SD-2.1 ANGLE UNIT mm ABLIC Inc. 12.5max. 9.00.3 Enlarged drawing in the central part o130.2 (60) (60) No. MP005-A-R-SD-1.1 SOT235-A-Reel TITLE No. MP005-A-R-SD-1.1 ANGLE QTY. UNIT mm ABLIC Inc. 3,000 1.570.03 6 1 5 4 2 3 +0.05 0.08 -0.02 0.5 0.480.02 0.20.05 No. PG006-A-P-SD-2.1 TITLE SNT-6A-A-PKG Dimensions No. PG006-A-P-SD-2.1 ANGLE UNIT mm ABLIC Inc. +0.1 o1.5 -0 4.00.1 2.00.05 0.250.05 +0.1 1.850.05 o0.5 -0 4.00.1 0.650.05 3 2 1 4 5 6 Feed direction No. PG006-A-C-SD-2.0 TITLE SNT-6A-A-Carrier Tape No. PG006-A-C-SD-2.0 ANGLE UNIT mm ABLIC Inc. 12.5max. 9.00.3 Enlarged drawing in the central part o130.2 (60) (60) No. PG006-A-R-SD-1.0 SNT-6A-A-Reel TITLE No. PG006-A-R-SD-1.0 ANGLE QTY. UNIT mm ABLIC Inc. 5,000 0.52 1.36 2 0.52 0.2 0.3 1. 2. 1 (0.25 mm min. / 0.30 mm typ.) (1.30 mm ~ 1.40 mm) 0.03 mm SNT 1. Pay attention to the land pattern width (0.25 mm min. / 0.30 mm typ.). 2. Do not widen the land pattern to the center of the package ( 1.30 mm ~ 1.40 mm ). Caution 1. Do not do silkscreen printing and solder printing under the mold resin of the package. 2. The thickness of the solder resist on the wire pattern under the package should be 0.03 mm or less from the land pattern surface. 3. Match the mask aperture size and aperture position with the land pattern. 4. Refer to "SNT Package User's Guide" for details. 1. 2. (0.25 mm min. / 0.30 mm typ.) (1.30 mm ~ 1.40 mm) No. PG006-A-L-SD-4.1 TITLE SNT-6A-A -Land Recommendation No. PG006-A-L-SD-4.1 ANGLE UNIT mm ABLIC Inc. Disclaimers (Handling Precautions) 1. All the information described herein (product data, specifications, figures, tables, programs, algorithms and application circuit examples, etc.) is current as of publishing date of this document and is subject to change without notice. 2. The circuit examples and the usages described herein are for reference only, and do not guarantee the success of any specific mass-production design. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by the reasons other than the products described herein (hereinafter "the products") or infringement of third-party intellectual property right and any other right due to the use of the information described herein. 3. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by the incorrect information described herein. 4. Be careful to use the products within their ranges described herein. Pay special attention for use to the absolute maximum ratings, operation voltage range and electrical characteristics, etc. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by failures and / or accidents, etc. due to the use of the products outside their specified ranges. 5. Before using the products, confirm their applications, and the laws and regulations of the region or country where they are used and verify suitability, safety and other factors for the intended use. 6. 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The products are not designed to be used as part of any device or equipment that may affect the human body, human life, or assets (such as medical equipment, disaster prevention systems, security systems, combustion control systems, infrastructure control systems, vehicle equipment, traffic systems, in-vehicle equipment, aviation equipment, aerospace equipment, and nuclear-related equipment), excluding when specified for in-vehicle use or other uses by ABLIC, Inc. Do not apply the products to the above listed devices and equipments. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by unauthorized or unspecified use of the products. 9. In general, semiconductor products may fail or malfunction with some probability. The user of the products should therefore take responsibility to give thorough consideration to safety design including redundancy, fire spread prevention measures, and malfunction prevention to prevent accidents causing injury or death, fires and social damage, etc. that may ensue from the products' failure or malfunction. The entire system in which the products are used must be sufficiently evaluated and judged whether the products are allowed to apply for the system on customer's own responsibility. 10. The products are not designed to be radiation-proof. The necessary radiation measures should be taken in the product design by the customer depending on the intended use. 11. The products do not affect human health under normal use. However, they contain chemical substances and heavy metals and should therefore not be put in the mouth. The fracture surfaces of wafers and chips may be sharp. Be careful when handling these with the bare hands to prevent injuries, etc. 12. When disposing of the products, comply with the laws and ordinances of the country or region where they are used. 13. The information described herein contains copyright information and know-how of ABLIC Inc. The information described herein does not convey any license under any intellectual property rights or any other rights belonging to ABLIC Inc. or a third party. Reproduction or copying of the information from this document or any part of this document described herein for the purpose of disclosing it to a third-party is strictly prohibited without the express permission of ABLIC Inc. 14. For more details on the information described herein or any other questions, please contact ABLIC Inc.'s sales representative. 15. This Disclaimers have been delivered in a text using the Japanese language, which text, despite any translations into the English language and the Chinese language, shall be controlling. 2.4-2019.07 www.ablic.com