© Semiconductor Components Industries, LLC, 2012
March, 2017 − Rev. 9 1Publication Order Number:
AR0134CS/D
AR0134CS
1/3‐inch 1.2 Mp CMOS
Digital Image Sensor
with Global Shutter
Description
The AR0134CS from ON Semiconductor is a 1/3-inch 1.2 Mp
CMOS digital image sensor with an active-pixel array of 1280 (H) ×
960 (V). It is designed for low light performance and features a global
shutter for accurate capture of moving scenes. It includes sophisticated
camera functions such as auto exposure control, windowing, scaling,
row skip mode, and both video and single frame modes. It is
programmable through a simple two-wire serial interface. The
AR0134CS produces extraordinarily clear, sharp digital pictures, and
its ability to capture both continuous video and single frames makes it
the perfect choice for a wide range of applications, including scanning
and industrial inspection.
Table 1. KEY PERFORMANCE PARAMETERS
Parameter Typical Value
Optical Format 1/3-inch (6 mm)
Active Pixels 1280 (H) × 960 (V) = 1.2 Mp
Pixel Size 3.75 mm
Color Filter Array RGB Bayer or Monochrome
Shutter Type Global Shutter
Input Clock Range 6–50 MHz
Output Pixel Clock (Maximum) 74.25 MHz
Output
Serial
Parallel HiSPi
12-bit
Frame Rate
Full Resolution
720p 54 fps
60 fps
Responsivity
Monochrome
Color 6.1 V/lux−sec
5.3 V/lux−sec
SNRMAX 38.6 dB
Dynamic Range 64 dB
Supply Voltage
I/O
Digital
Analog
HiSPi
1.8 or 2.8 V
1.8 V
2.8 V
0.4 V
Power Consumption < 400 mW
Operating Temperature –30°C to + 70°C (Ambient)
–30°C to + 80°C (Junction)
Package Options 9 × 9 mm 63-pin iBGA
10 × 10 mm 48-pin iLCC
Bare Die
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F
eatures
ON Semiconductors 3rd Generation Globa
l
Shutter Technology
Superior Low-light Performance
HD Video (720p60)
Video/Single Frame Mode
Flexible Row-skip Modes
On-chip AE and Statistics Engine
Parallel and Serial Output
Support for External LED or Flash
Auto Black Level Calibration
Context Switching
A
pplications
Scene Processing
Scanning and Machine Vision
720p60 Video Applications
See detailed ordering and shipping information on page 2 o
f
this data sheet.
ORDERING INFORMATION
IBGA63 9 y 9
CASE 503AG
ILCC48 10 y 10
CASE 847AE
AR0134CS
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ORDERING INFORMATION
Table 2. ORDERABLE PART NUMBERS
Part Number Description
AR0134CSSM25SUEA0 Mono, iBGA, 25° Shift
AR0134CSSM00SUEA0 Mono, iBGA
AR0134CSSM00SUEAH Mono, iBGA, Head Board
AR0134CSSM00SUEAD Mono, iBGA, Demo Kit
AR0134CSSC00SUEA0 Color, iBGA
AR0134CSSC00SUEAH Color, iBGA, Head Board
AR0134CSSC00SUEAD Color, iBGA, Demo Kit
AR0134CSSM00SPCA0 Mono, iLCC (Parallel)
AR0134CSSM25SPCA0 Mono, iLCC (Parallel), 25° Shift
AR0134CSSC00SPCA0 Color, iLCC (Parallel)
AR0134CSSC00SPD20 Color, Bare Die
AR0134CSSM00SPD20 Mono, Bare Die
AR0134CSSM25SPD20 Mono, Bare Die, 25° Shift
See the ON Semiconductor Device Nomenclature
document (TND310/D) for a full description of the naming
convention used for image sensors. For reference
documentation, including information on evaluation kits,
please visit our web site at www.onsemi.com.
GENERAL DESCRIPTION
The ON Semiconductor AR0134CS can be operated in its
default mode or programmed for frame size, exposure, gain,
and other parameters. The default mode output is
a full-resolution image at 54 frames per second (fps). It
outputs 12-bit raw data, using either the parallel or serial
(HiSPi) output ports. The device may be operated in video
(master) mode or in frame trigger mode.
FRAME_VALID and LINE_VALID signals are output on
dedicated pins, along with a synchronized pixel clock.
A dedicated FLASH pin can be programmed to control
external LED or flash exposure illumination.
The AR0134CS includes additional features to allow
application-specific tuning: windowing, adjustable
auto-exposure control, auto black level correction, on-board
temperature sensor, and row skip and digital binning modes.
The sensor is designed to operate in a wide temperature
range (–30°C to +70°C).
FUNCTIONAL OVER VIEW
The AR0134CS is a progressive-scan sensor that
generates a stream of pixel data at a constant frame rate. It
uses an on-chip, phase-locked loop (PLL) that can be
optionally enabled to generate all internal clocks from a
single master input clock running between 6 and 50 MHz.
The maximum output pixel rate is 74.25 Mp/s,
corresponding t o a clock rate of 74.25 MHz. Figure 1 shows
a block diagram of the sensor.
Figure 1. Block Diagram
Control Registers
Analog Processing and
A/D Conversion
Active Pixel Sensor
(APS)
Array
Pixel Data Path
(Signal Processing)
Timing and Control
(Sequencer) Auto Exposure
and Stats Engine
Temperature
Sensor OTPM Memory PLL External
Clock
Serial
Output
Parallel
Output
Flash
Trigger
Two-wire
Serial
Interface
Power
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User interaction with the sensor is through the two-wire
serial bus, which communicates with the array control,
analog signal chain, and digital signal chain. The core of the
sensor is a 1.2 Mp Active-Pixel Sensor array. The
AR0134CS features global shutter technology for accurate
capture of moving images. The exposure of the entire array
is controlled by programming the integration time by
register setting. All rows simultaneously integrate light prior
to readout. Once a row has been read, the data from the
columns is sequenced through an analog signal chain
(providing offset correction and gain), and then through an
analog-to-digital converter (ADC). The output from the
ADC is a 12-bit value for each pixel in the array. The ADC
output passes through a digital processing signal chain
(which provides further data path corrections and applies
digital gain). The pixel data are output at a rate of up to
74.25 Mp/s, in parallel to frame and line synchronization
signals.
FEATURES OVERVIEW
The AR0134CS Global Sensor shutter has a wide array of
features to enhance functionality and to increase versatility.
A summary of features follows. Please refer to the
AR0134CS Developer Guide for detailed feature
descriptions, register settings, and tuning guidelines and
recommendations.
Operating Modes
The AR0134CS works in master (video), trigger (single
frame), or Auto Trigger modes. In master mode, the
sensor generates the integration and readout timing.
In trigger mode, it accepts an external trigger to start
exposure, then generates the exposure and readout
timing. The exposure time is programmed through the
two-wire serial interface for both modes. Trigger mode
is not compatible with the HiSPi interface.
Window Control
Configurable window size and blanking times allow
a wide range of resolutions and frame rates. Digital
binning and skipping modes are supported, as are
vertical and horizontal mirror operations.
Context Switching
Context switching may be used to rapidly switch
between two sets of register values. Refer to the
AR0134CS Developer Guide for a complete set of
context switchable registers.
Gain
The AR0134CS Global Shutter sensor can be
configured for analog gain of up to 8x, and digital gain
of up to 8x.
Automatic Exposure Control
The integrated automatic exposure control may be used
to ensure optimal settings of exposure and gain are
computed and updated every other frame. Refer to the
AR0134CS Developer Guide for more details.
HiSPi
The AR0134CS Global Shutter image sensor supports
two or three lanes of Streaming-SP or Packetized-SP
protocols of ON Semiconductors High-Speed Serial
Pixel Interface.
PLL
An on chip PLL provides reference clock flexibility and
supports spread spectrum sources for improved EMI
performance.
Reset
The AR0134CS may be reset by a register write, or by
a dedicated input pin.
Output Enable
The AR0134CS output pins may be tri-stated using
a dedicated output enable pin.
Temperature Sensor
The temperature sensor is only guaranteed to be
functional when the AR0134CS is initially powered-up
or is reset at temperatures at or above 0°C.
Black Level Correction
Row Noise Correction
Column Correction
Test Patterns
Several test patterns may be enabled for debug
purposes. These include a solid color, color bar, fade to
grey, and a walking 1s test pattern.
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PIXEL DATA FORMAT
Pixel Array Structure
The AR0134CS pixel array is configured as 1412 columns
by 1028 rows, (see Figure 2). The dark pixels are optically
black and are used internally to monitor black level. Of the
right 108 columns, 64 are dark pixels used for row noise
correction. Of the top 24 rows of pixels, 12 of the dark rows
are used for black level correction. There are 1296 columns
by 976 rows of optically active pixels. While the sensor s
format is 1280 × 960, the additional active columns and
active rows are included for use when horizontal or vertical
mirrored readout is enabled, to allow readout to start on the
same pixel. The pixel adjustment is always performed for
monochrome or color versions. The active area is
surrounded with optically transparent dummy pixels to
improve image uniformity within the active area. Not all
dummy pixels or barrier pixels can be read out.
Figure 2. Pixel Array Description
1412
1028
Dark Pixel Barrier Pixel Light Dummy
Pixel Active Pixel
2 Light Dummy +
4 Barrier +
24 Dark +
4 Barrier +
6 Dark Dummy
1296 × 976 (1288 × 968 Active)
4.86 × 3.66 mm2 (4.83 × 3.63 mm2)
2 Light Dummy +
4 Barrier +
100 Dark +
4 Barrier
2 Light Dummy +
4 Barrier
2 Light Dummy +
4 Barrier +
6 Dark Dummy
Figure 3. Pixel Color Pattern Detail (Top Right Corner)
G
B
G
B
G
B
R
G
R
G
R
G
R
G
R
G
R
G
R
G
R
G
R
G
R
G
R
G
R
G
G
B
G
B
G
B
G
B
G
B
G
B
G
B
G
B
G
B
Column Readout Direction
Row Readout Direction
Active Pixel (0, 0)
Array Pixel (110, 40)
Default Readout Order
By convention, the sensor core pixel array is shown with
the first addressable (logical) pixel (0,0) in the top right
corner (see Figure 3). This reflects the actual layout of the
array on the die. Also, the physical location of the first pixel
data read out of the sensor in default condition is that of pixel
(110, 40).
AR0134CS
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CONFIGURATION AND PINOUT
The figures and tables below show a typical configuration
for the AR0134CS image sensor and show the package
pinouts.
Figure 4. Serial 4-lane HiSPi Interface
1. All power supplies must be adequately decoupled.
2. ON Semiconductor recommends a resistor value of 1.5 kW, but a greater value may be used for slower two-wire speed.
3. This pull-up resistor is not required if the controller drives a valid logic level on SCLK at all times.
4. The parallel interface output pads can be left unconnected if the serial output interface is used.
5. ON Semiconductor recommends that 0.1 mF and 10 mF decoupling capacitors for each power supply are mounted as close as possible
to the pad. Actual values and results may vary depending on the layout and design considerations. Refer to the AR0134CS demo head
-
board schematics for circuit recommendations.
6. ON Semiconductor recommends that analog power planes be placed in a manner such that coupling with the digital power planes is mini
-
mized.
7. Although 4 serial lanes are shown, the AR0134CS supports only 2- or 3-lane HiSPi.
Notes:
FLASH
SLVS0_P
SLVS0_N
SLVS1_P
SLVS1_N
SLVS2_P
SLVS2_N
VDD_PLLVDD_IO VAA VAA_PIX
AGND
DGND
VAA_PIXVAA
VDD_IO VDD
SDATA
SCLK
EXTCLK
1.5 kW2
1.5 kW2, 3
OE_BAR
RESET_BAR
TEST
To Controller
From
Controller
Master Clock
(6−50 MHz)
Digital
I/O
Power1
Digital
Core
Power1Analog
Power1Analog
Power1
Analog
Ground
Digital
Ground
STANDBY
VDD_SLVS
HiSPi
Power1
VDD_PLL
PLL
Power1
SLVS3_P
SLVS3_N
SLVSC_P
SLVSC_N
VDD VDD_SLVS
7
7
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Figure 5. Parallel Pixel Data Interface
1. All power supplies must be adequately decoupled.
2. ON Semiconductor recommends a resistor value of 1.5 kW, but a greater value may be used for slower two-wire speed.
3. This pull-up resistor is not required if the controller drives a valid logic level on SCLK at all times.
4. The serial interface output pads can be left unconnected if the parallel output interface is used.
5. ON Semiconductor recommends that 0.1 mF and 10 mF decoupling capacitors for each power supply are mounted as close as possible
to the pad. Actual values and results may vary depending on the layout and design considerations. Refer to the AR0134CS demo head
-
board schematics for circuit recommendations.
6. ON Semiconductor recommends that analog power planes be placed in a manner such that coupling with the digital power planes is mini
-
mized.
Notes:
FRAME_VALID
LINE_VALID
PIXCLK
FLASH
VDD_IO VDD VAA VAA_PIX
AGND
DGND
VAA_PIXVAA
VDD_IO VDD
EXTCLK
SDATA
SCLK
1.5 kW2
1.5 kW2, 3
TRIGGER
OE_BAR
RESET_BAR
TEST
To Controller
From
Controller
Master Clock
(6−50 MHz)
Digital
I/O
Power1
Digital
Core
Power1Analog
Power1Analog
Power1
Analog
Ground
Digital
Ground
DOUT[11:0]
STANDBY
PLL
Power1
VDD_PLL
VDD_PLL
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Figure 6. 9 y 9 mm 63-ball iBGA Package
Top View
(Ball Down)
A
B
C
D
E
F
G
H
12345678
VDD_PLL
EXTCLK
SADDR
LINE_
VALID
DOUT8
DOUT4
DOUT0
SLVSCN
VDD_SLVS
SCLK
FRAME_
VALID
DOUT9
DOUT5
DOUT1
SLVS0N
SLVSCP
(SLVS3N)
SDATA
PIXCLK
DOUT10
DOUT6
DOUT2
SLVS0P
SLVS2N
(SLVS3P)
DGND
FLASH
DOUT11
DOUT7
DOUT3
SLVS1N
SLVS2P
DGND
DGND
DGND
DGND
DGND
DGND
SLVS1P
VDD
VDD
VDD
VDD_IO
VDD_IO
VDD_IO
VDD_IO
VDD
VAA
AGND
VAA_PIX
RESERVED
TEST
TRIGGER
VDD_IO
VDD
VAA
AGND
VAA_PIX
RESERVED
RESERVED
OE_BAR
RESET_
BAR
STANDBY
Table 3. PIN DESCRIPTIONS − 63-BALL IBGA PACKAGE
Name iBGA Pin Type Description
SLVS0_N A2 Output HiSPi serial data, lane 0, differential N
SLVS0_P A3 Output HiSPi serial data, lane 0, differential P
SLVS1_N A4 Output HiSPi serial data, lane 1, differential N
SLVS1_P A5 Output HiSPi serial data, lane 1, differential P
STANDBY A8 Input Standby-mode enable pin (active HIGH)
VDD_PLL B1 Power PLL power
SLVSC_N B2 Output HiSPi serial DDR clock differential N
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Table 3. PIN DESCRIPTIONS − 63-BALL IBGA PACKAGE (continued)
Name DescriptionTypeiBGA Pin
SLVSC_P B3 Output HiSPi serial DDR clock differential P
SLVS2_N B4 Output HiSPi serial data, lane 2, differential N
SLVS2_P B5 Output HiSPi serial data, lane 2, differential P
VAA B7, B8 Power Analog power
EXTCLK C1 Input External input clock
VDD_SLVS C2 Power HiSPi power (May leave unconnected if parallel interface is used)
SLVS3_N C3 Output (Unsupported) HiSPi serial data, lane 3, differential N
SLVS3_P C4 Output (Unsupported) HiSPi serial data, lane 3, differential P
DGND C5, D4, D5, E5, F5, G5, H5 Power Digital GND
VDD A6, A7, B6, C6, D6 Power Digital power
AGND C7, C8 Power Analog GND
SADDR D1 Input Two-Wire Serial address select
SCLK D2 Input Two-Wire Serial clock input
SDATA D3 I/O Two-Wire Serial data I/O
VAA_PIX D7, D8 Power Pixel power
LINE_VALID E1 Output Asserted when DOUT line data is valid
FRAME_VALID E2 Output Asserted when DOUT frame data is valid
PIXCLK E3 Output Pixel clock out. DOUT is valid on rising edge of this clock
FLASH E4 Output Control signal to drive external light sources
VDD_IO E6, F6, G6, H6, H7 Power I/O supply power
DOUT8 F1 Output Parallel pixel data output
DOUT9 F2 Output Parallel pixel data output
DOUT10 F3 Output Parallel pixel data output
DOUT11 F4 Output Parallel pixel data output (MSB)
TEST F7 Input Manufacturing test enable pin (connect to DGND)
DOUT4 G1 Output Parallel pixel data output
DOUT5 G2 Output Parallel pixel data output
DOUT6 G3 Output Parallel pixel data output
DOUT7 G4 Output Parallel pixel data output
TRIGGER G7 Input Exposure synchronization input (Connect to DGND if HiSPi interface
is used)
OE_BAR G8 Input Output enable (active LOW)
DOUT0 H1 Output Parallel pixel data output (LSB)
DOUT1 H2 Output Parallel pixel data output
DOUT2 H3 Output Parallel pixel data output
DOUT3 H4 Output Parallel pixel data output
RESET_BAR H8 Input Asynchronous reset (active LOW). All settings are restored to factory
default
Reserved E7, E8, F8 N/A Reserved (do not connect)
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Figure 7. 10 y 10 mm 48-pin iLCC Package, Parallel Output
42NC7
41NC8
40VAA
9
39AGND
10
38VAA_PIX11
37VAA_PIX12
36VAA
13
35AGND
14
34VAA
15
33Reserved16
32Reserved17
VDD_IO 31Reserved18
DOUT7
DOUT8
DOUT9
DOUT10
DOUT11
VDD_IO
PIXCLK
VDD
SCLK
SDATA
RESET_BAR
VDD 6DGND
19
NC 5EXTCLK20
NC 4VDD_PLL21
STANDBY 3DOUT622
OE_BAR 2DOUT523
SADDR 1DOUT424
TEST 48DOUT325
FLASH 47DOUT226
TRIGGER 46DOUT127
FRAME_VALID 45DOUT028
LINE_VALID 44DGND
29
DGND 43NC30
Table 4. PIN DESCRIPTIONS − 48-PIN ILCC PACKAGE, PARALLEL
Pin Number Name Type Description
1 DOUT4 Output Parallel pixel data output
2 DOUT5 Output Parallel pixel data output
3 DOUT6 Output Parallel pixel data output
4 VDD_PLL Power PLL power
5 EXTCLK Input External input clock
6 DGND Power Digital ground
7 DOUT7 Output Parallel pixel data output
8 DOUT8 Output Parallel pixel data output
9 DOUT9 Output Parallel pixel data output
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Table 4. PIN DESCRIPTIONS − 48-PIN ILCC PACKAGE, PARALLEL (continued)
Pin Number DescriptionTypeName
10 DOUT10 Output Parallel pixel data output
11 DOUT11 Output Parallel pixel data output (MSB)
12 VDD_IO Power I/O supply power
13 PIXCLK Output Pixel clock out. DOUT is valid on rising edge of this clock
14 VDD Power Digital power
15 SCLK Input Two-Wire Serial clock input
16 SDATA I/O Two-Wire Serial data I/O
17 RESET_BAR Input Asynchronous reset (active LOW). All settings are restored to factory default
18 VDD_IO Power I/O supply power
19 VDD Power Digital power
20 NC No connection
21 NC No connection
22 STANDBY Input Standby-mode enable pin (active HIGH)
23 OE_BAR Input Output enable (active LOW)
24 SADDR Input Two-Wire Serial address select
25 TEST Input Manufacturing test enable pin (connect to DGND)
26 FLASH Output Flash output control
27 TRIGGER Input Exposure synchronization input
28 FRAME_VALID Output Asserted when DOUT frame data is valid
29 LINE_VALID Output Asserted when DOUT line data is valid
30 DGND Power Digital ground
31 Reserved N/A Reserved (do not connect)
32 Reserved N/A Reserved (do not connect)
33 Reserved N/A Reserved (do not connect)
34 VAA Power Analog power
35 AGND Power Analog ground
36 VAA Power Analog power
37 VAA_PIX Power Pixel power
38 VAA_PIX Power Pixel power
39 AGND Power Analog ground
40 VAA Power Analog power
41 NC No connection
42 NC No connection
43 NC No connection
44 DGND Power Digital ground
45 DOUT0 Output Parallel pixel data output (LSB)
46 DOUT1 Output Parallel pixel data output
47 DOUT2 Output Parallel pixel data output
48 DOUT3 Output Parallel pixel data output
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TWO-WIRE SERIAL REGISTER INTERFACE
The two-wire serial interface bus enables read/write
access to control and status registers within the AR0134CS.
The interface protocol uses a master/slave model in which
a master controls one or more slave devices. The sensor acts
as a slave device. The master generates a clock (SCLK) that
is an input to the sensor and is used to synchronize transfers.
Data is transferred between the master and the slave on
a bidirectional signal (SDATA). SDATA is pulled up to
VDD_IO off-chip by a 1.5 kW resistor. Either the slave or
master device can drive SDATA LOW − the interface protocol
determines which device is allowed to drive SDATA at any
given time.
The protocols described in the two-wire serial interface
specification allow the slave device to drive SCLK LOW; the
AR0134CS uses SCLK as an input only and therefore never
drives it LOW.
Protocol
Data transfers on the two-wire serial interface bus are
performed by a sequence of low-level protocol elements:
1. a (repeated) start condition
2. a slave address/data direction byte
3. an (a no) acknowledge bit
4. a message byte
5. a stop condition
The bus is idle when both SCLK and SDATA are HIGH.
Control of the bus is initiated with a start condition, and the
bus is released with a stop condition. Only the master can
generate the start and stop conditions.
Start Condition
A start condition is defined as a HIGH-to-LOW transition
on SDATA while SCLK is HIGH. At the end of a transfer , the
master can generate a start condition without previously
generating a stop condition; this is known as a “repeated
start” or “restart” condition.
Stop Condition
A stop condition is defined as a LOW-to-HIGH transition
on SDATA while SCLK is HIGH.
Data Transfer
Data is transferred serially, 8 bits at a time, with the MSB
transmitted first. Each byte of data is followed by an
acknowledge bit or a no-acknowledge bit. This data transfer
mechanism is used for the slave address/data direction byte
and for message bytes.
One data bit is transferred during each SCLK clock period.
SDATA can change when SCLK is LOW and must be stable
while SCLK is HIGH.
Slave Address/Data Direction Byte
Bits [7:1] of this byte represent the device slave address
and bit [0] indicates the data transfer direction. A “0” in
bit [0] indicates a WRITE, and a “1” indicates a READ.
The default slave addresses used by the AR0134CS are 0x20
(write address) and 0x21 (read address) in accordance with
the specification. Alternate slave addresses of 0x30 (write
address) and 0x31 (read address) can be selected by enabling
and asserting the SADDR input.
An alternate slave address can also be programmed
through R0x31FC.
Message Byte
Message bytes are used for sending register addresses and
register write data to the slave device and for retrieving
register read data.
Acknowledge Bit
Each 8-bit data transfer is followed by an acknowledge bit
or a no-acknowledge bit in the SCLK clock period following
the data transfer. The transmitter (which is the master when
writing, or the slave when reading) releases SDATA.
The receiver indicates an acknowledge bit by driving SDATA
LOW. As for data transfers, SDATA can change when SCLK
is LOW and must be stable while SCLK is HIGH.
No-Acknowledge Bit
The no-acknowledge bit is generated when the receiver
does not drive SDATA LOW during the SCLK clock period
following a data transfer. A no-acknowledge bit is used to
terminate a read sequence.
Typical Sequence
A typical READ or WRITE sequence begins by the
master generating a start condition on the bus. After the start
condition, the master sends the 8-bit slave address/data
direction byte. The last bit indicates whether the request is
for a read or a write, where a “0” indicates a write and a “1”
indicates a read. If the address matches the address of the
slave device, the slave device acknowledges receipt of the
address by generating an acknowledge bit on the bus.
If the request was a WRITE, the master then transfers the
16-bit register address to which the WRITE should take
place. This transfer takes place as two 8-bit sequences and
the slave sends an acknowledge bit after each sequence to
indicate that the byte has been received. The master then
transfers the data as an 8-bit sequence; the slave sends an
acknowledge bit at the end of the sequence. The master stops
writing by generating a (re)start or stop condition.
If the request was a READ, the master sends the 8-bit write
slave address/data direction byte and 16-bit register address,
the same way as with a WRITE request. The master then
generates a (re)start condition and the 8-bit read slave
address/data direction byte, and clocks out the register data,
eight bits at a time. The master generates an acknowledge bit
after each 8-bit transfer. The slave’s internal register address
is automatically incremented after every 8 bits are
transferred. The data transfer is stopped when the master
sends a no-acknowledge bit.
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Single READ from Random Location
This sequence (Figure 8) starts with a dummy WRITE to
the 16-bit address that is to be used for the READ. The
master terminates the WRITE by generating a restart
condition. The master then sends the 8-bit read slave
address/data direction byte and clocks out one byte of
register data. The master terminates the READ by
generating a no-acknowledge bit followed by a stop
condition. Figure 8 shows how the internal register address
maintained by the AR0134CS is loaded and incremented as
the sequence proceeds.
Figure 8. Single READ from Random Location
Previous Reg Address, N Reg Address, M M+1
S0 1 PASr
Slave Ad-
dress Reg
Address[15:8] Reg
Address[7:0] Slave Address
S = Start Condition
P = Stop Condition
Sr = Restart Condition
A = Acknowledge
A = No-acknowledge Slave to Master
Master to Slave
A A A A Read Data
Single READ from Current Location
This sequence (Figure 9) performs a read using the
current value of the AR0134CS internal register address.
The master terminates the READ by generating
a no-acknowledge bit followed by a stop condition.
The figure shows two independent READ sequences.
Figure 9. Single READ from Current Location
Previous Reg Address, N Reg Address, N+1 N+2
S1Slave Address ARead Data S1 PSlave Address AARead DataPA
Sequential READ, Start from Random Location
This sequence (Figure 10) starts in the same way as the
single READ from random location (Figure 8). Instead of
generating a no-acknowledge bit after the first byte of data
has been transferred, the master generates an acknowledge
bit and continues to perform byte READs until “L” bytes
have been read.
Figure 10. Sequential READ, Start from Random Location
Previous Reg Address, N Reg Address, M
S0Slave Address A AReg Address[15:8]
PA
M+1
A A A1SrReg Address[7:0] Read DataSlave Address
M+LM+L−1M+L−2M+1 M+2 M+3
ARead Data A Read Data ARead Data Read Data
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Sequential READ, Start from Current Location
This sequence (Figure 11) starts in the same way as the
single READ from current location (Figure 9). Instead of
generating a no-acknowledge bit after the first byte of data
has been transferred, the master generates an acknowledge
bit and continues to perform byte READs until “L” bytes
have been read.
Figure 11. Sequential READ, Start from Current Location
N+LN+L−1N+2N+1Previous Reg Address, N
PAS 1 Read DataASlave Address Read DataRead Data Read DataAAA
Single WRITE to Random Location
This sequence (Figure 12) begins with the master
generating a start condition. The slave address/data
direction byte signals a WRITE and is followed by the HIGH
then LOW bytes of the register address that is to be written.
The master follows this with the byte of write data.
The WRITE is terminated by the master generating a stop
condition.
Figure 12. Single WRITE to Random Location
Previous Reg Address, N Reg Address, M M+1
S0 PSlave Address Reg Address[15:8] Reg Address[7:0] A
A
A
AA Write Data
Sequential WRITE, Start at Random Location
This sequence (Figure 13) starts in the same way as the
single WRITE to random location (Figure 12). Instead of
generating a no-acknowledge bit after the first byte of data
has been transferred, the master generates an acknowledge
bit and continues to perform byte WRITEs until “L” bytes
have been written. The WRITE is terminated by the master
generating a stop condition.
Figure 13. Sequential WRITE, Start at Random Location
Previous Reg Address, N Reg Address, M M+1
S0Slave Address A Reg Address[15:8] A A AReg Address[7:0] Write Data
M+LM+L−1M+L−2M+1 M+2 M+3
Write Data AA A
AP
A
Write Data Write Data Write Data
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ELECTRICAL SPECIFICATIONS
Unless otherwise stated, the following specifications
apply to the following conditions:
VDD = 1.8 V –0.10/+0.15;
VDD_IO = VDD_PLL = VAA = VAA_PIX = 2.8 V ±0.3 V;
VDD_SLVS = 0.4 V –0.1/+0.2;
TA = −30°C to +70°C;
Output Load = 10 pF;
PIXCLK Frequency = 74.25 MHz;
HiSPi off.
Two-Wire Serial Register Interface
The electrical characteristics of the two-wire serial
register interface (SCLK, SDATA) are shown in Figure 14 a nd
Table 5.
Figure 14. Two-Wire Serial Bus Timing Parameters
SDATA
SCLK
S Sr P S
tftrtftr
tSU;DAT tHD;STA
tSU;STO
tSU;STA
tBUF
tHD;DAT tHIGH
tLOW
tHD;STA
NOTE: Read sequence: For an 8-bit READ, read waveforms start after WRITE command and register address are issued.
Table 5. TWO-WIRE SERIAL BUS CHARACTERISTICS
(fEXTCLK = 27 MHz; VDD = 1.8 V; VDD_IO = 2.8 V; VAA = 2.8 V; VAA_PIX = 2.8 V; VDD_PLL = 2.8 V; VDD_DAC = 2.8 V; TA = 25°C)
Parameter Symbol
Standard Mode Fast-Mode
Unit
Min Max Min Max
SCLK Clock Frequency fSCL 0 100 0 400 kHz
Hold Time (Repeated) START
Condition
After This Period, the First Clock
Pulse is Generated tHD;STA 4.0 0.6 ms
LOW Period of the SCLK Clock tLOW 4.7 1.3 ms
HIGH Period of the SCLK Clock tHIGH 4.0 0.6 ms
Set-up Time for a Repeated
START Condition tSU;STA 4.7 0.6 ms
Data Hold Time tHD;DAT 0 (Note 4) 3.45 (Note 5) 0 (Note 6) 0.9 (Note 5) ms
Data Set-up Time tSU;DAT 250 100 (Note 6) ns
Rise Time of both SDATA and
SCLK Signals tr 1000 20 + 0.1Cb
(Note 7) 300 ns
Fall Time of both SDATA and SCLK
Signals tf 300 20 + 0.1Cb
(Note 7) 300 ns
Set-up Time for STOP Condition tSU;STO 4.0 0.6 ms
Bus Free Time between a STOP
and START Condition tBUF 4.7 1.3 ms
Capacitive Load for each Bus Line Cb 400 400 pF
Serial Interface Input Pin Capaci-
tance CIN_SI 3.3 3.3 pF
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Table 5. TWO-WIRE SERIAL BUS CHARACTERISTICS (continued)
(fEXTCLK = 27 MHz; VDD = 1.8 V; VDD_IO = 2.8 V; VAA = 2.8 V; VAA_PIX = 2.8 V; VDD_PLL = 2.8 V; VDD_DAC = 2.8 V; TA = 25°C)
Parameter Unit
Fast-ModeStandard Mode
Symbol
Parameter Unit
MaxMinMaxMin
Symbol
SDATA Max Load Capacitance CLOAD_SD 30 30 pF
SDATA Pull-up Resistor RSD 1.5 4.7 1.5 4.7 kW
1. This table is based on I2C standard (v2.1 January 2000). Philips Semiconductor.
2. Two-wire control is I2C-compatible.
3. All values referred to VIHmin = 0.9 VDD_IO and VILmax = 0.1 VDD_IO levels. Sensor EXCLK = 27 MHz.
4. A device must internally provide a hold time of at least 300 ns for the SDATA signal to bridge the undefined region of the falling edge of SCLK.
5. The maximum tHD;DAT has only to be met if the device does not stretch the LOW period (tLOW) of the SCLK signal.
6. A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the requirement tSU;DAT 250 ns must then be met. This
will automatically be the case if the device does not stretch the LOW period of the SCLK signal. If such a device does stretch the LOW period
of the SCLK signal, it must output the next data bit to the SDATA line tr max + tSU;DAT = 1000 + 250 = 1250 ns (according to the Standard-mode
I2C-bus specification) before the SCLK line is released.
7. Cb = total capacitance of one bus line in pF.
I/O Timing
By default, the AR0134CS launches pixel data, FV and
LV with the falling edge of PIXCLK. The expectation is that
the user captures DOUT[11:0], FV and LV using the rising
edge of PIXCLK. The launch edge of PIXCLK can be
configured in register R0x3028. See Figure 15 and Table 6
for I/O timing (AC) characteristics.
Figure 15. I/O Timing Diagram
EXTCLK
PIXCLK
Data[11:0]
LINE_VALID/
FRAME_VALID
Pxl_0 Pxl_1 Pxl_2 Pxl_n
tPF
L
tPL
L
tFP
tRP
tF
tR
90% 90% 90% 90%
10% 10% 10% 10%
tEXTCLK
tPD
tPLH
tPFH FRAME_VALID Leads LINE_VALID
by 6 PIXCLKs FRAME_VALID Trails LINE_VALID
by 6 PIXCLKs
Table 6. I/O TIMING CHARACTERISTICS, PARALLEL OUTPUT (1.8 V VDD_IO) (Note 8)
Symbol Definition Condition Min Typ Max Unit
fEXTCLK Input Clock Frequency 6 50 MHz
tEXTCLK Input Clock Period 20 166 ns
tRInput Clock Rise Time PLL Enabled 3 ns
tFInput Clock Fall Time PLL Enabled 3 ns
tJITTER Input Clock Jitter 600 ns
tcp EXTCLK to PIXCLK
Propagation Delay Nominal Voltages, PLL Disabled,
PIXCLK Slew Rate = 4 5.7 14.3 ns
tRP PIXCLK Rise Time PCLK Slew Rate = 6 1.3 4.0 ns
tFP PIXCLK Fall Time PCLK Slew Rate = 6 1.3 3.9 ns
PIXCLK Duty Cycle 40 50 60 %
fPIXCLK PIXCLK Frequency PIXCLK Slew Rate = 6, Data Slew Rate = 7 6 74.25 MHz
tPD PIXCLK to Data Valid PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
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Table 6. I/O TIMING CHARACTERISTICS, PARALLEL OUTPUT (1.8 V VDD_IO) (Note 8) (continued)
Symbol UnitMaxTypMinConditionDefinition
tPFH PIXCLK to FV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
tPLH PIXCLK to LV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −3 1.5 ns
tPFL PIXCLK to FV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
tPLL PIXCLK to LV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −3 1.5 ns
CIN Input Pin Capacitance 2.5 pF
8. Minimum and maximum values are taken at 70°C, 1.7 V and −30°C, 1.95 V. All values are taken at the 50% transition point. The loading used
is 10 pF.
9. Jitter from PIXCLK is already taken into account in the data for all of the output parameters.
Table 7. I/O TIMING CHARACTERISTICS, PARALLEL OUTPUT (2.8 V VDD_IO) (Note 10)
Symbol Definition Condition Min Typ Max Unit
fEXTCLK Input Clock Frequency 6 50 MHz
tEXTCLK Input Clock Period 20 166 ns
tRInput Clock Rise Time PLL Enabled 3 ns
tFInput Clock Fall Time PLL Enabled 3 ns
tJITTER Input Clock Jitter 600 ns
tcp EXTCLK to PIXCLK
Propagation Delay Nominal Voltages, PLL Disabled,
PIXCLK Slew Rate = 4 5.3 13.4 ns
tRP PIXCLK Rise Time PCLK Slew Rate = 6 1.3 4.0 ns
tFP PIXCLK Fall Time PCLK slew rate = 6 1.3 3.9 ns
PIXCLK Duty Cycle 40 50 60 %
fPIXCLK PIXCLK Frequency PIXCLK Slew Rate = 6, Data Slew Rate = 7 6 74.25 MHz
tPD PIXCLK to Data Valid PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
tPFH PIXCLK to FV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
tPLH PIXCLK to LV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
tPFL PIXCLK to FV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
tPLL PIXCLK to LV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 2 ns
CIN Input Pin Capacitance 2.5 pF
10.Minimum and maximum values are taken at 70°C, 2.5 V and −30°C, 3.1 V. All values are taken at the 50% transition point. The loading used
is 10 pF.
11.Jitter from PIXCLK is already taken into account in the data for all of the output parameters.
Table 8. I/O RISE SLEW RATE (2.8 V VDD_IO) (Note 12)
Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit
7 Default 1.50 2.50 3.90 V/ns
6 Default 0.98 1.62 2.52 V/ns
5 Default 0.71 1.12 1.79 V/ns
4 Default 0.52 0.82 1.26 V/ns
3 Default 0.37 0.58 0.88 V/ns
2 Default 0.26 0.40 0.61 V/ns
1 Default 0.17 0.27 0.40 V/ns
0 Default 0.10 0.16 0.23 V/ns
12.Minimum and maximum values are taken at 70°C, 2.5 V and −30°C, 3.1 V. The loading used is 10 pF.
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Table 9. I/O FALL SLEW RATE (2.8 V VDD_IO) (Note 13)
Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit
7 Default 1.40 2.30 3.50 V/ns
6 Default 0.97 1.61 2.48 V/ns
5 Default 0.73 1.21 1.86 V/ns
4 Default 0.54 0.88 1.36 V/ns
3 Default 0.39 0.63 0.88 V/ns
2 Default 0.27 0.43 0.66 V/ns
1 Default 0.18 0.29 0.44 V/ns
0 Default 0.11 0.17 0.25 V/ns
13.Minimum and maximum values are taken at 70°C, 2.5 V and −30°C, 3.1 V. The loading used is 10 pF.
Table 10. I/O RISE SLEW RATE (1.8 V VDD_IO) (Note 14)
Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit
7 Default 0.57 0.91 1.55 V/ns
6 Default 0.39 0.61 1.02 V/ns
5 Default 0.29 0.46 0.75 V/ns
4 Default 0.22 0.34 0.54 V/ns
3 Default 0.16 0.24 0.39 V/ns
2 Default 0.12 0.17 0.27 V/ns
1 Default 0.08 0.11 0.18 V/ns
0 Default 0.05 0.07 0.10 V/ns
14.Minimum and maximum values are taken at 70°C, 1.7 V and −30°C, 1.95 V. The loading used is 10 pF.
Table 11. I/O FALL SLEW RATE (1.8 V VDD_IO) (Note 15)
Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit
7 Default 0.57 0.92 1.55 V/ns
6 Default 0.40 0.64 1.08 V/ns
5 Default 0.31 0.50 0.82 V/ns
4 Default 0.24 0.38 0.61 V/ns
3 Default 0.18 0.27 0.44 V/ns
2 Default 0.13 0.19 0.31 V/ns
1 Default 0.09 0.13 0.20 V/ns
0 Default 0.05 0.08 0.12 V/ns
15.Minimum and maximum values are taken at 70°C, 1.7 V and −30°C, 1.95 V. The loading used is 10 pF.
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DC Electrical Characteristics
The DC electrical characteristics are shown in Table 12,
Table 13, Table 14, and Table 15.
Table 12. DC ELECTRICAL CHARACTERISTICS
Symbol Definition Condition Min Typ Max Unit
VDD Core Digital Voltage 1.7 1.8 1.95 V
VDD_IO I/O Digital Voltage 1.7/2.5 1.8/2.8 1.9/3.1 V
VAA Analog Voltage 2.5 2.8 3.1 V
VAA_PIX Pixel Supply Voltage 2.5 2.8 3.1 V
VDD_PLL PLL Supply Voltage 2.5 2.8 3.1 V
VDD_SLVS HiSPi Supply Voltage 0.3 0.4 0.6 V
VIH Input HIGH Voltage VDD_IO × 0.7 V
VIL Input LOW Voltage VDD_IO × 0.3 V
IIN Input Leakage Current No Pull-up Resistor;
VIN = VDD_IO or DGND 20 mA
VOH Output HIGH Voltage VDD_IO – 0.3 V
VOL Output LOW Voltage VDD_IO = 2.8 V 0.4 V
IOH Output HIGH Current At Specified VOH –22 mA
IOL Output LOW Current At Specified VOL 22 mA
CAUTION: Stresses greater than those listed in Table 13 may cause permanent damage to the device. This is a stress rating only, and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this
specification is not implied.
Table 13. ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Minimum Maximum Unit
VSUPPLY Power Supply Voltage (All Supplies) –0.3 4.5 V
ISUPPLY Total Power Supply Current 200 mA
IGND Total Ground Current 200 mA
VIN DC Input Voltage –0.3 VDD_IO + 0.3 V
VOUT DC Output Voltage –0.3 VDD_IO + 0.3 V
TSTG Storage Temperature (Note 16) –40 +85 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be af fected.
16.Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Table 14. OPERATING CURRENT CONSUMPTION FOR PARALLEL OUTPUT
(VAA = VAA_PIX = VDD_IO = VDD_PLL = 2.8 V; VDD = 1.8 V; PLL Enabled and PIXCLK = 74.25 MHz; T A = 25°C; CLOAD = 10 pF)
Symbol Parameter Condition Min Typ Max Unit
IDD1Digital Operating Current Parallel, Streaming, Full Resolution 54 fps 46 60 mA
IDD_IO I/O Digital Operating Current Parallel, Streaming, Full Resolution 54 fps 52 mA
IAA Analog Operating Current Parallel, Streaming, Full Resolution 54 fps 46 55 mA
IAA_PIX Pixel Supply Current Parallel, Streaming, Full Resolution 54 fps 7 9 mA
IDD_PLL PLL Supply Current Parallel, Streaming, Full Resolution 54 fps 8 10 mA
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Table 15. STANDBY CURRENT CONSUMPTION
(Analog − VAA + VAA_PIX + VDD_PLL; Digital − VDD + VDD_IO; TA = 25°C)
Definition Condition Min Typ Max Unit
Hard Standby (Clock Off, Driven Low) Analog, 2.8 V 3 15 mA
Digital, 1.8 V 25 80 mA
Hard Standby (Clock On, EXTCLK = 20 MHz) Analog, 2.8 V 12 25 mA
Digital, 1.8 V 1.1 1.7 mA
Soft Standby (Clock Off, Driven Low) Analog, 2.8 V 3 15 mA
Digital, 1.8 V 25 80 mA
Soft Standby (Clock On, EXTCLK = 20 MHz) Analog, 2.8 V 12 25 mA
Digital, 1.8 V 1.1 1.7 mA
HiSPi Electrical Specifications
The ON Semiconductor AR0134CS sensor supports
SLVS mode only, and does not have a DLL for timing
adjustments. Refer to the High-Speed Serial Pixel (HiSPi)
Interface Physical Layer Specification v2.00.00 for
electrical definitions, specifications, and timing
information. The VDD_SLVS supply in this data sheet
corresponds to VDD_TX in the HiSPi Physical Layer
Specification. Similarly, VDD is equivalent to VDD_HiSPi
as referenced in the specification. The HiSPi transmitter
electrical specifications are listed at 700 MHz.
Table 16. INPUT VOLTAGE AND CURRENT (HiSPi POWER SUPPLY 0.4 V)
(Measurement Conditions: Max Freq. 700 MHz)
Symbol Parameter Min Typ Max Unit
IDD_SLVS Supply Current (PWRHiSPi) (Driving 100 W Load) 10 15 mA
VCMD HiSPi Common Mode Voltage (Driving 100 W Load) VDD_SLVS ×
0.45 VDD_SLVS/2 VDD_SLVS ×
0.55 V
|VOD|HiSPi Differential Output Voltage (Driving 100 W Load) VDD_SLVS ×
0.36 VDD_SLVS/2 VDD_SLVS ×
0.64 V
DVCM Change in VCM between Logic 1 and 0 25 mV
|VOD|Change in |VOD| between Logic 1 and 0 25 mV
NM VOD Noise Margin 30 %
|DVCM|Difference in VCM between any Two Channels 50 mV
|DVOD|Difference in VOD between any Two Channels 100 mV
DVCM_ac Common-mode AC Voltage (pk) without VCM Cap Termina-
tion 50 mV
DVCM_ac Common-mode AC Voltage (pk) with VCM Cap Termination 30 mV
VOD_ac Max Overshoot Peak |VOD| 1.3 × |VOD| V
Vdiff_pkpk Max Overshoot Vdiff pk-pk 2.6 × |VOD| V
Veye Eye Height 1.4 × VOD
RoSingle-ended Output Impedance 35 50 70 W
DRoOutput Impedance Mismatch 20 %
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Figure 16. Differential Output Voltage for Clock and Data Pairs
VDIFFmin VDIFFmax
0 V (Diff)
Output Signal
is ‘Cp − Cn’ or
‘Dp − Dn’
Table 17. RISE AND FALL TIMES
(Measurement Conditions: HiSPi Power Supply 0.4 V, Max Freq. 700 MHz)
Symbol Parameter Min Typ Max Unit
1/UI Data Rate 280 700 Mb/s
TxPRE Max Setup Time from Transmitter (Note 17) 0.3 UI
TxPost Max Hold Time from Transmitter 0.3 UI
RISE Rise T ime (20% − 80%) 0.25 UI
FALL Fall Time (20% − 80%) 150 ps 0.25 UI
PLL_DUTY Clock Duty 45 50 55 %
tpw Bitrate Period (Note 17) 1.43 3.57 ns
teye Eye Width (Notes 17, 18) 0.3 UI
ttotaljit Data Total Jitter (pk pk)@1e−9 (Notes 17, 18) 0.2 UI
tckjit Clock Period Jitter (RMS) (Note 18) 50 ps
tcyjit Clock Cycle to Cycle Jitter (RMS) (Note 18) 100 ps
tchskew Clock to Data Skew (Notes 17, 18) −0.1 0.1 UI
t|PHYskew| PHY-to-PHY Skew (Notes 17, 21) 2.1 UI
tDIFFSKEW Mean Differential Skew (Note 22) –100 100 ps
17.One UI is defined as the normalized mean time between one edge and the following edge of the clock.
18.Taken from 0 V crossing point.
19.Also defined with a maximum loading capacitance of 10 pF on any pin. The loading capacitance may also need to be less for higher bitrates
so the rise and fall times do not exceed the maximum 0.3 UI.
20.The absolute mean skew between the Clock lane and any Data Lane in the same PHY between any edges.
21.The absolute mean skew between any Clock in one PHY and any Data lane in any other PHY between any edges.
22.Differential skew is defined as the skew between complementary outputs. It is measured as the absolute time between the two
complementary edges at mean VCM point.
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Figure 17. Eye Diagram for Clock and Data Signals
DATA MASK
CLOCK MASK
Trigger/Reference
UI/2 UI/2
RISE
FALL
VDIFF
Max VDIFF
TxPre TxPost
80%
20%
VDIFF
CLKJITTER
Figure 18. Skew within the PHY and Output Channels
VCMD
tCMPSKEW tCHSKEW1PHY
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POWER-ON RESET AND STANDBY TIMING
Power-Up Sequence
The recommended power -up sequence for the AR0134CS
is shown in Figure 19. The available power supplies
(VDD_IO, VDD, VDD_SLVS, VDD_PLL, VAA, VAA_PIX)
must have the separation specified below.
1. Turn on VDD_PLL power supply.
2. After 0−10 ms, turn on VAA and VAA_PIX power
supply.
3. After 0−10 ms, turn on VDD_IO power supply.
4. After the last power supply is stable, enable
EXTCLK.
5. If RESET_BAR is in a LOW state, hold
RESET_BAR LOW for at least 1 ms.
If RESET_BAR is in a HIGH state, assert
RESET_BAR for at least 1 ms.
6. Wait 160000 EXTCLKs (for internal initialization
into software standby).
7. Configure PLL, output, and image settings to
desired values.
8. Wait 1 ms for the PLL to lock.
9. Set streaming mode (R0x301a[2] = 1).
Figure 19. Power Up
EXTCLK
VDD_SLVS (0.4)
VAA_PIX
VAA (2.8)
VDD_IO (1.8/2.8)
VDD (1.8)
VDD_PLL (2.8) t0
t1
t2
t3
t4t5t6
tXHard
Reset Internal Ini-
tialization Software
Standby PLL Clock Streaming
RESET_BAR
Table 18. POWER-UP SEQUENCE
Symbol Definition Min Typ Max Unit
t0VDD_PLL to VAA/VAA_PIX 0 10 ms
t1VAA/VAA_PIX to VDD_IO 0 10 ms
t2VDD_IO to VDD 0 10 ms
t3VDD to VDD_SLVS 0 10 ms
tXXtal Settle Time 30 (Note 23) ms
t4Hard Reset 1 (Note 24) ms
t5Internal Initialization 160000 EXTCLKs
t6PLL Lock Time 1 ms
23.Xtal settling time is component-dependent, usually taking about 10–100 ms.
24.Hard reset time is the minimum time required after power rails are settled. In a circuit where hard reset is held down by RC circuit, then the
RC time must include the all power rail settle time and Xtal settle time.
25.It is critical that VDD_PLL is not powered up after the other power supplies. It must be powered before or at least at the same time as the
others. If the case happens that VDD_PLL is powered after other supplies then the sensor may have functionality issues and will experience
high current draw on this supply.
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Power-Down Sequence
The recommended power-down sequence for the
AR0134CS is shown in Figure 20. The available power
supplies (VDD_IO, VDD, VDD_SLVS, VDD_PLL, VAA,
VAA_PIX) must have the separation specified below.
1. Disable streaming if output is active by setting
standby R0x301a[2] = 0.
2. The soft standby state is reached after the current
row or frame, depending on configuration, has
ended.
3. Turn off VDD_SLVS.
4. Turn off VDD.
5. Turn off VDD_IO.
6. Turn off VAA/VAA_PIX.
7. Turn off VDD_PLL.
Figure 20. Power Down
EXTCLK
VDD_PLL (2.8)
VDD_IO (1.8/2.8)
VDD (1.8)
VDD_SLVS (0.4) t0
Power Down until Next
Power Up Cycle
t1
t2
t3
t4
VAA_PIX
VAA (2.8)
Table 19. POWER-DOWN SEQUENCE
Symbol Parameter Min Typ Max Unit
t0VDD_SLVS to VDD 0 ms
t1VDD to VDD_IO 0 ms
t2VDD_IO to VAA/VAA_PIX 0 ms
t3VAA/VAA_PIX to VDD_PLL 0 ms
t4PwrDn until Next PwrUp Time 100 ms
26.t4 is required between power down and next power up time; all decoupling caps from regulators must be completely discharged.
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Standby Sequence
Figure 21 and Figure 22 show timing diagrams for
entering and exiting standby. Delays are shown indicating
the last valid register write prior to entering standby as well
as the first valid write upon exiting standby. Also shown is
timing if the EXTCLK is to be disabled during standby.
Figure 21. Enter Standby Timing
EXTCLK
STANDBY
FV
SDATA Register W rites Not ValidRegister Writes Valid
750 EXTCLKs
50 EXTCLKs
Figure 22. Exit Standby Timing
EXTCLK
STANDBY
FV
TRIGGER
SDATA Register Writes Not Valid Register Writes Valid
1ms
10 EXTCLKs
28 Rows + CIT
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Figure 23. Quantum Efficiency − Monochrome Sensor (Typical)
0
10
20
30
40
50
60
70
80
350 450 550 650 750 850 950 1050
Quantum Efficiency (%)
Wavelength (nm)
400 500 600 700 800 900 1000 1100
Figure 24. Quantum Efficiency − Color Sensor (Typical)
0
10
20
30
40
50
60
70
350 450 550 650 750 850 950 1050
Quantum Efficiency (%)
Wavelength (nm)
Red
Green
Blue
400 500 600 700 800 1000
900
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CRA vs. Image Height Plot
Image Height CRA
(%) (mm) (deg)
Chief Ray Angle (Degrees)
Image Height (%)
AR0134CS CRA Characteristic
0 102030405060708090100110
0
2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
Figure 25. Chief Ray Angle − 255 Mono
0 0 0
5 0.150 1.35
10 0.300 2.70
15 0.450 4.04
20 0.600 5.39
25 0.750 6.73
30 0.900 8.06
35 1.050 9.39
40 1.200 10.71
45 1.350 12.02
50 1.500 13.33
55 1.650 14.62
60 1.800 15.90
65 1.950 17.16
70 2.100 18.41
75 2.250 19.64
80 2.400 20.85
85 2.550 22.05
90 2.700 23.22
95 2.850 24.38
100 3.000 25.51
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PACKAGE DIMENSIONS
IBGA63 9x9
CASE 503AG
ISSUE O
Notes:
1. Dimensions in mm.
Dimensions in () are for reference only.
2. Encapsulant: Epoxy.
3. Substrate material: Plastic laminate 0.25 thickness.
4. Lid material: Borosilicate glass 0.4 ±0.04 thickness.
5. Refractive index at 20C = 1.5255 @ 546 nm and
1.5231 @ 588 nm.
6. Double side AR Coating: 530−570 nm R< 1%;
420−700 nm R < 2%.
7. Image sensor die: 0.2 mm thickness.
8. Solder ball material: SAC305 (95% Sn, 3% Ag,
0.5% Cu).
9. Dimensions apply to solder balls post reflow.
Pre-flow ball is 0.5 on a 0.4 SMD ball pad.
10.Maximum rotation of optical area relative to pack-
age edges: 1°.
11.Maximum tilt of optical area relative to substrate
plane D: 25 mm.
12.Maximum tilt of cover glass relative to optical area
plane E: 50 mm.
AR0134CS
www.onsemi.com
28
PACKAGE DIMENSIONS
ILCC48 10x10
CASE 847AE
ISSUE O
Notes:
1. Dimensions in mm.
Dimensions in () are for reference only.
2. Encapsulant: Epoxy.
3. Substrate material: Plastic laminate 0.25 thickness.
4. Lid material: Borosilicate glass 0.4 ±0.04 thickness.
5. Refractive index at 20C = 1.5255 @ 546 nm and
1.5231 @ 588 nm.
6. Double side AR Coating: 530−570 nm R< 1%;
420−700 nm R < 2%.
7. Lead finish: Gold plating, 0.5 mm min. thickness.
8. Image sensor die: 0.2 mm thickness.
9. Maximum rotation of optical area relative to package
edges: 0.75°.
10.Maximum tilt of optical area relative to substrate
plane D: 25 mm.
11.Maximum tilt of cover glass relative to optical area
plane E: 50 mm.
AR0134CS
www.onsemi.com
29
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