Not recommended for new design
This is information on a product still in production but not recommended for new designs.
June 2011 Doc ID 5135 Rev 6 1/20
1
M48Z2M1Y
M48Z2M1V
5 V or 3.3 V, 16 Mbit (2 Mb x 8) ZEROPOWER® SRAM
Features
Integrated, ultra low power SRAM, power-fail
control circuit, and batteries
Conventional SRAM operation; unlimited
WRITE cycles
10 years of data retention in the absence of
power
Automatic power-fail chip deselect and WRITE
protection
WRITE protect voltages
(VPFD = power-fail deselect voltage):
–M48Z2M1Y: V
CC = 4.5 to 5.5 V;
4.2 V VPFD 4.5 V
–M48Z2M1V: V
CC = 3.0 to 3.6 V;
2.8 V VPFD 3.0 V
Batteries are internally isolated until power is
applied
Pin and function compatible with JEDEC
standard 2 Mb x 8 SRAMs
RoHS compliant
Lead-free second level interconnect
36
1
PLDIP36 module
www.st.com
Contents M48Z2M1Y, M48Z2M1V
2/20 Doc ID 5135 Rev 6
Contents
1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2 Operation modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1 READ mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.2 WRITE mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.3 Data retention mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.4 VCC noise and negative going transients . . . . . . . . . . . . . . . . . . . . . . . . . 11
3 Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
5 Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
6 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
7 Environmental information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
8 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
M48Z2M1Y, M48Z2M1V List of tables
Doc ID 5135 Rev 6 3/20
List of tables
Table 1. Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Table 2. Operating modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Table 3. READ mode AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Table 4. WRITE mode AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Table 5. Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Table 6. Operating and AC measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Table 7. Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Table 8. DC characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Table 9. Power down/up AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Table 10. Power down/up trip points DC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Table 11. PLDIP36 – 36-pin plastic DIP long module, package mechanical data . . . . . . . . . . . . . . . 16
Table 12. Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Table 13. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
List of figures M48Z2M1Y, M48Z2M1V
4/20 Doc ID 5135 Rev 6
List of figures
Figure 1. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Figure 2. DIP connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Figure 3. Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Figure 4. Address controlled, READ mode AC waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Figure 5. Chip enable or output enable controlled, READ mode AC waveforms. . . . . . . . . . . . . . . . . 8
Figure 6. WRITE enable controlled, WRITE mode AC waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Figure 7. Chip enable controlled, WRITE mode AC waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Figure 8. Supply voltage protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Figure 9. AC testing load circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Figure 10. Power down/up mode AC waveforms. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Figure 11. PLDIP36 – 36-pin plastic DIP long module, package outline . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 12. Recycling symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
M48Z2M1Y, M48Z2M1V Description
Doc ID 5135 Rev 6 5/20
1 Description
The M48Z2M1Y/V ZEROPOWER® RAM is a non-volatile 16,777,216-bit, static RAM
organized as 2,097,152 words by 8 bits. The device combines two internal lithium batteries,
CMOS SRAMs and a control circuit in a plastic 36-pin DIP, long module.
The ZEROPOWER RAM replaces industry standard SRAMs. It provides the non-volatility of
PROMs without any requirement for special WRITE timing or limitations on the number of
WRITEs that can be performed.
Figure 1. Logic diagram
Table 1. Signal names
A0-A20 Address inputs
DQ0-DQ7 Data inputs / outputs
EChip enable
GOutput enable
WWRITE enable
VCC Supply voltage
VSS Ground
NC Not connected internally
AI02048
21
A0-A20
W
DQ0-DQ7
VCC
M48Z2M1Y
M48Z2M1V
G
VSS
8
E
Description M48Z2M1Y, M48Z2M1V
6/20 Doc ID 5135 Rev 6
Figure 2. DIP connections
Figure 3. Block diagram
VSS
VCC
AI02049
M48Z2M1Y
M48Z2M1V
10
1
2
5
6
7
8
9
11
12
13
16
17
18
30
29
26
25
24
23
22
21
20
19
3
4
28
27
32
31
14
15
34
33
36
35
A1
A0
DQ0
A7
A4
A3
A2
A6
A5
A13
A10
A8
A9
DQ7
A15
A11
G
E
DQ5DQ1
DQ2
DQ3
DQ4
DQ6
A16
A18
A12
A14
W
A17
A20
NC
NC
A19
AI02050
INTERNAL
BATTERIES
E
VCC
VSS
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
2048K x 8
SRAM ARRAY
A0-A20
DQ0-DQ7
W
G
POWER
E
M48Z2M1Y, M48Z2M1V Operation modes
Doc ID 5135 Rev 6 7/20
2 Operation modes
The M48Z2M1Y/V has its own power-fail detect circuit. The control circuitry constantly
monitors the single 5 V supply for an out of tolerance condition. When VCC is out of
tolerance, the circuit write protects the SRAM, providing a high degree of data security in the
midst of unpredictable system operations brought on by low VCC. As VCC falls below
approximately 3 V, the control circuitry connects the batteries which sustain data until valid
power returns.
Table 2. Operating modes
Note: X = VIH or VIL; VSO = battery backup switchover voltage.
2.1 READ mode
The M48Z2M1Y/V is in the READ mode whenever W (WRITE enable) is high and E (chip
enable) is low. The device architecture allows ripple-through access of data from eight of
16,777,216 locations in the static storage array. Thus, the unique address specified by the
21 address inputs defines which one of the 2,097,152 bytes of data is to be accessed. Valid
data will be available at the data I/O pins within address access time (tAVQV) after the last
address input signal is stable, providing that the E (chip enable) and G (output enable)
access times are also satisfied. If the E and G access times are not met, valid data will be
available after the later of chip enable access time (tELQV) or output enable access time
(tGLQV). The state of the eight three-state data I/O signals is controlled by E and G. If the
outputs are activated before tAVQV, the data lines will be driven to an indeterminate state
until tAVQV. If the address inputs are changed while E and G remain low, output data will
remain valid for output data hold time (tAXQX) but will go indeterminate until the next address
access.
Figure 4. Address controlled, READ mode AC waveforms
Note: Chip enable (E) and output enable (G) = low, WRITE enable (W) = high.
Mode VCC E G W DQ0-
DQ7 Power
Deselect
3.0 to 3.6 V
or
4.5 to 5.5 V
VIH X X High Z Standby
WRITE VIL XV
IL DIN Active
READ VIL VIL VIH DOUT Active
READ VIL VIH VIH High Z Active
Deselect VSO to VPFD (min)(1)
1. See Table 10 on page 15 for details.
X X X High Z CMOS standby
Deselect VSO(1) X X X High Z Battery backup mode
AI02051
tAXQX
DATA VALID
A0-A20
DQ0-DQ7
tAVAV
tAVQV
Operation modes M48Z2M1Y, M48Z2M1V
8/20 Doc ID 5135 Rev 6
Figure 5. Chip enable or output enable controlled, READ mode AC waveforms
Note: WRITE enable (W) = high.
Table 3. READ mode AC characteristics
AI02052
tAVAV
tAVQV tAXQX
tELQV
tELQX
tEHQZ
tGLQV
tGLQX
tGHQZ
DATA OUT
A0-A20
E
G
DQ0-DQ7
VALID
Symbol Parameter(1)
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where
noted).
M48Z2M1Y M48Z2M1V
Unit–70 –85
Min Max Min Max
tAVAV READ cycle time 70 85 ns
tAVQV(2)
2. CL = 100 pF or 50 pF (see Figure 9 on page 13).
Address valid to output valid 70 85 ns
tAXQX(2) Address transition to output transition 5 5 ns
tEHQZ(3)
3. CL = 5 pF (see Figure 9 on page 13).
Chip enable high to output Hi-Z 30 35 ns
tELQV(2) Chip enable low to output valid 70 85 ns
tELQX(3) Chip enable low to output transition 5 5 ns
tGHQZ(3) Output enable high to output Hi-Z 25 35 ns
tGLQV(2) Output enable low to output valid 35 45 ns
tGLQX(3) Output enable low to output transition 5 5 ns
M48Z2M1Y, M48Z2M1V Operation modes
Doc ID 5135 Rev 6 9/20
2.2 WRITE mode
The M48Z2M1Y/V is in the WRITE mode whenever W and E are active. The start of a
WRITE is referenced from the latter occurring falling edge of W or E. A WRITE is terminated
by the earlier rising edge of W or E.
The addresses must be held valid throughout the cycle. E or W must return high for
minimum of tEHAX from E or tWHAX from W prior to the initiation of another READ or WRITE
cycle. Data-in must be valid tDVEH or tDVWH prior to the end of WRITE and remain valid for
tEHDX or tWHDX afterward. G should be kept high during WRITE cycles to avoid bus
contention; although, if the output bus has been activated by a low on E and G, a low on W
will disable the outputs tWLQZ after W falls.
Figure 6. WRITE enable controlled, WRITE mode AC waveforms
Note: Output enable (G) = high.
Figure 7. Chip enable controlled, WRITE mode AC waveforms
Note: Output enable (G) = high.
AI02053
tAVAV
tWHAX
tDVWH
DATA INPUT
A0-A20
E
W
DQ0-DQ7
VALID
tAVWH
tAVEL
tWLWH
tAVWL
tWLQZ
tWHDX
tWHQX
AI02054
tAVAV
tEHAX
tDVEH
A0-A20
E
W
DQ0-DQ7
VALID
tAVEH
tAVEL
tAVWL
tELEH
tEHDX
DATA INPUT
Operation modes M48Z2M1Y, M48Z2M1V
10/20 Doc ID 5135 Rev 6
Table 4. WRITE mode AC characteristics
2.3 Data retention mode
With valid VCC applied, the M48Z2M1Y/V operates as a conventional BYTEWIDE™ static
RAM. Should the supply voltage decay, the RAM will automatically power-fail deselect, write
protecting itself tWP after VCC falls below VPFD. All outputs become high impedance, and all
inputs are treated as “Don't care.
If power fail detection occurs during a valid access, the memory cycle continues to
completion. If the memory cycle fails to terminate within the time tWP
, write protection takes
place. When VCC drops below VSO, the control circuit switches power to the internal energy
source which preserves data.
The internal coin cells will maintain data in the M48Z2M1Y/V after the initial application of
VCC for an accumulated period of at least 10 years when VCC is less than VSO. As system
power returns and VCC rises above VSO, the batteries are disconnected, and the power
supply is switched to external VCC. Write protection continues for tER after VCC reaches
VPFD to allow for processor stabilization. After tER, normal RAM operation can resume.
For more information on battery storage life refer to the application note AN1012.
Symbol Parameter(1)
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6V (except where
noted).
M48Z2M1Y M48Z2M1V
Unit–70 –85
Min Max Min Max
tAVAV WRITE cycle time 70 85 ns
tAVEH Address valid to chip enable high 65 75 ns
tAVEL Address valid to chip enable low 0 0 ns
tAVWH Address valid to WRITE enable high 65 75 ns
tAVWL Address valid to WRITE enable low 0 0 ns
tDVEH Input valid to chip enable high 30 35 ns
tDVWH Input valid to WRITE enable high 30 35 ns
tEHAX Chip enable high to address transition 15 15 ns
tEHDX Chip enable high to input transition 10 15 ns
tELEH Chip enable low to chip enable high 55 75 ns
tWHAX WRITE enable high to address transition 5 5 ns
tWHDX WRITE enable high to input transition 0 0 ns
tWHQX(2)(3)
2. CL = 5 pF (see Figure 9 on page 13).
3. If E goes low simultaneously with W going low, the outputs remain in the high impedance state.
WRITE enable high to output transition 5 5 ns
tWLQZ(2)(3) WRITE enable low to output Hi-Z 25 30 ns
tWLWH WRITE enable pulse width 55 65 ns
M48Z2M1Y, M48Z2M1V Operation modes
Doc ID 5135 Rev 6 11/20
2.4 VCC noise and negative going transients
ICC transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the VCC bus. These transients can be reduced if
capacitors are used to store energy which stabilizes the VCC bus. The energy stored in the
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1 µF (as shown in
Figure 8) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on VCC that drive it to values below VSS by as much as
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, it is recommended to connect a
schottky diode from VCC to VSS (cathode connected to VCC, anode to VSS). Schottky diode
1N5817 is recommended for through hole and MBRS120T3 is recommended for surface
mount.
Figure 8. Supply voltage protection
AI02169
VCC
0.1µF DEVICE
VCC
VSS
Maximum ratings M48Z2M1Y, M48Z2M1V
12/20 Doc ID 5135 Rev 6
3 Maximum ratings
Stressing the device above the rating listed in the absolute maximum ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the operating sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Table 5. Absolute maximum ratings
Caution: Negative undershoots below –0.3 V are not allowed on any pin while in the battery backup
mode.
Symbol Parameter Value Unit
TAAmbient operating temperature 0 to 70 °C
TSTG Storage temperature (VCC off) –40 to 85 °C
TBIAS Temperature under bias –40 to 85 °C
TSLD(1)
1. Soldering temperature of the IC leads is to not exceed 260 °C for 10 seconds. Furthermore, the devices
shall not be exposed to IR reflow nor preheat cycles (as performed as part of wave soldering). ST
recommends the devices be hand-soldered or placed in sockets to avoid heat damage to the batteries.
Lead solder temperature for 10 seconds 260 °C
VIO Input or output voltages M48Z2M1Y –0.3 to 7 V
M48Z2M1V –0.3 to 4.6 V
VCC Supply voltage M48Z2M1Y –0.3 to 7 V
M48Z2M1V –0.3 to 4.6 V
IOOutput current 20 mA
PDPower dissipation 1 W
M48Z2M1Y, M48Z2M1V DC and AC parameters
Doc ID 5135 Rev 6 13/20
4 DC and AC parameters
This section summarizes the operating and measurement conditions, as well as the DC and
AC characteristics of the device. The parameters in the following DC and AC characteristic
tables are derived from tests performed under the measurement conditions listed in the
relevant tables. Designers should check that the operating conditions in their projects match
the measurement conditions when using the quoted parameters.
Table 6. Operating and AC measurement conditions
Note: Output Hi-Z is defined as the point where data is no longer driven.
Figure 9. AC testing load circuit
Parameter M48Z2M1Y M48Z2M1V Unit
Supply voltage (VCC) 4.5 to 5.5 3.0 to 3.6 V
Ambient operating temperature (TA) 0 to 70 0 to 70 °C
Load capacitance (CL) 100 50 pF
Input rise and fall times 5 5ns
Input pulse voltages 0 to 3 0 to 3 V
Input and output timing ref. voltages 1.5 1.5 V
AI07816
5V
OUT
CL = 100pF or 5pF (Y)
50pF or 5pF (V)
CL includes JIG capacitance
1.9kΩ
DEVICE
UNDER
TEST
1kΩ
DC and AC parameters M48Z2M1Y, M48Z2M1V
14/20 Doc ID 5135 Rev 6
Table 7. Capacitance
Table 8. DC characteristics
Symbol Parameter(1)(2)
1. Effective capacitance measured with power supply at 5 V; sampled only, not 100% tested.
2. Outputs deselected.
Min Max Unit
CIN Input capacitance - 40 pF
CIO(3)
3. At 25 °C.
Input / output capacitance - 40 pF
Sym Parameter Test condition(1)
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where noted).
M48Z2M1Y M48Z2M1V
Unit
Min Max Min Max
ILI(2)
2. Outputs deselected.
Input leakage current 0 V VIN VCC ±4 ±4 µA
ILO(2) Output leakage current 0 V VOUT VCC ±4 ±4 µA
ICC Supply current E = VIL,
Outputs open 140 70 mA
ICC1 Supply current (standby) TTL E = VIH 10 2 mA
ICC2 Supply current (standby) CMOS E VCC – 0.2 V 8 1 mA
VIL Input low voltage –0.3 0.8 –0.3 0.6 V
VIH Input high voltage 2.2 VCC + 0.3 2.2 VCC + 0.3 V
VOL Output low voltage IOL = 2.1 mA 0.4 0.4 V
VOH Output high voltage IOH = –1 mA 2.4 2.2 V
M48Z2M1Y, M48Z2M1V DC and AC parameters
Doc ID 5135 Rev 6 15/20
Figure 10. Power down/up mode AC waveforms
Table 9. Power down/up AC characteristics
Table 10. Power down/up trip points DC characteristics
Symbol Parameter(1)
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where
noted).
Min Max Unit
tER E recovery time 40 120 ms
tF(2)
2. VPFD (max) to VPFD (min) fall time of less than tF may result in deselection/write protection not occurring
until 200 µs after VCC passes VPFD (min).
VPFD (max) to VPFD (min) VCC fall time 300 µs
tFB(3)
3. VPFD (min) to VSS fall time of less than tFB may cause corruption of RAM data.
VPFD (min) to VSO VCC fall time M48Z2M1Y 10 µs
M48Z2M1V 150 µs
tRVPFD (min) to VPFD (max) VCC rise time 10 µs
tWP Write protect time from VCC = VPFD
M48Z2M1Y 40 150 µs
M48Z2M1V 40 250 µs
Symbol Parameter(1)(2)
1. All voltages referenced to VSS.
2. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where
noted).
Min Typ Max Unit
VPFD Power-fail deselect voltage M48Z2M1Y 4.2 4.3 4.5 V
M48Z2M1V 2.8 2.9 3.0 V
VSO Battery backup switchover voltage M48Z2M1Y 3.0 V
M48Z2M1V 2.45 V
tDR(3)
3. At 25 °C; VCC = 0 V.
Expected data retention time 10 YEARS
AI01031
VCC
E
(PER CONTROL INPUT)
OUTPUTS
DON'T CARE
HIGH-Z
tF
tFB
tR
tRB
tWP
tDR
VALID VALID
(PER CONTROL INPUT)
RECOGNIZEDRECOGNIZED
VPFD (max)
VPFD (min)
VSO
tER
Package mechanical data M48Z2M1Y, M48Z2M1V
16/20 Doc ID 5135 Rev 6
5 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
Figure 11. PLDIP36 – 36-pin plastic DIP long module, package outline
Note: Drawing is not to scale.
Table 11. PLDIP36 – 36-pin plastic DIP long module, package mechanical data
PMDIP
A1
A
L
Be1
D
E
N
1
eA
e3
S
C
Symb
mm inches
Typ Min Max Typ Min Max
A 9.27 9.52 0.3650 0.3748
A1 0.38 0.0150
B 0.43 0.59 0.0169 0.0232
C 0.20 0.33 0.0079 0.0130
D 52.58 53.34 2.0701 2.1000
E 18.03 18.80 0.7098 0.7402
e1 2.30 2.81 0.0906 0.1106
e3 43.18 1.7
eA 14.99 16.00 0.5902 0.6299
L 3.05 3.81 0.1201 0.1500
S 4.45 5.33 0.1752 0.2098
N36 36
M48Z2M1Y, M48Z2M1V Part numbering
Doc ID 5135 Rev 6 17/20
6 Part numbering
Table 12. Ordering information scheme
For other options, or for more information on any aspect of this device, please contact the
ST sales office nearest you.
Example: M48Z 2M1Y –70 PL 1
Device type
M48Z
Supply voltage and write protect voltage
2M1Y(1) = VCC = 4.5 to 5.5 V; VPFD = 4.2 to 4.5 V
1. Not recommended for new design. Contact ST sales office for availability.
2M1V(1) = VCC = 3.0 to 3.6 V; VPFD = 2.8 to 3.0 V
Speed
–70 = 70 ns (Y)
–85 = 85 ns (V)
Package
PL = PLDIP36
Temperature range
1 = 0 to 70°C
9 = extended temperature
Shipping method
blank = ECOPACK® package, tubes
Environmental information M48Z2M1Y, M48Z2M1V
18/20 Doc ID 5135 Rev 6
7 Environmental information
Figure 12. Recycling symbols
This product contains a non-rechargeable lithium (lithium carbon monofluoride chemistry)
button cell battery fully encapsulated in the final product.
Recycle or dispose of batteries in accordance with the battery manufacturer's instructions
and local/national disposal and recycling regulations.
M48Z2M1Y, M48Z2M1V Revision history
Doc ID 5135 Rev 6 19/20
8 Revision history
Table 13. Document revision history
Date Revision Changes
Jul-1999 1 First issue
31-Aug-2000 2 From preliminary data to datasheet
20-Mar-2002 3 Reformatted; temperature information added to tables (Ta bl e 7 , 8, 3, 4,
9, 10)
29-May-2002 3.1 Modified “VCC noise and negative going transients” text
28-Mar-2003 3.2 Remove 5 V/5%, add 3 V part (Figure 1, 2, 9; Ta bl e 5 , 6, 8, 2, 3, 4, 9,
10, 12)
02-Jul-2003 3.3 Changed characteristic (Ta b l e 8 )
18-Feb-2005 4 Reformatted; IR reflow update (Ta b l e 5 )
02-Aug-2010 5 Updated Features, Section 3, Ta bl e 1 2 ; added ECOPACK® text to
Section 5; added Section 7: Environmental information.
24-Jun-2011 6
Devices are not recommended for new design (updated cover page,
Ta bl e 1 2 ); updated footnote of Table 5: Absolute maximum ratings;
updated Section 7: Environmental information.
M48Z2M1Y, M48Z2M1V
20/20 Doc ID 5135 Rev 6
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