ICS601-01
Low Phase Noise Clock Multiplier
MDS 601-01 G 4Revision 090800 Printed 11/14/00
Integrated Circuit Systems, Inc. • 525 Race Street • San Jose •CA•95126• (408) 295-9800tel • www.icst.com
Parameter Conditions Minimum Typical Maximum Units
ABSOLUTE MAXIMUM RATINGS (note 1)
ABSOLUTE MAXIMUM RATINGS (note 1)
Supply voltage, VDD Referenced to GND 7 V
Inputs and Clock Outputs Referenced to GND -0.5 VDD+0.5 V
Ambient Operating Temperature 0 70 °C
Ambient Operating Temperature, I version Industrial temperature -40 85 °C
Soldering Temperature Max of 10 seconds 260 °C
Storage temperature -65 150 °C
DC CHARACTERISTICS (VDD = 3.3 V unless noted)
DC CHARACTERISTICS (VDD = 3.3 V unless noted)
Operating Voltage, VDD 3.0 5.5 V
Input High Voltage, VIH, X1/ICLK pin only Note 3 (VDD/2)+1 V
Input Low Voltage, VIL, X1/ICLK pin only Note 3 (VDD/2)-1 V
Input High Voltage, VIH 2 V
Input Low Voltage, VIL 0.8 V
Output High Voltage, VOH, CMOS level IOH=-4mA VDD-0.4 V
Output High Voltage, VOH IOH=-12mA 2.4 V
Output Low Voltage, VOL IOL=12mA 0.4 V
Operating Supply Current, IDD No Load, 125 MHz 22 30 mA
Short Circuit Current Each output ±40 ±60 mA
Input Capacitance OE, select pins 5 pF
AC CHARACTERISTICS (VDD = 3.3 V unless noted)
AC CHARACTERISTICS (VDD = 3.3 V unless noted)
Input Frequency 10 27 MHz
Output Frequency at 3.3V or 5V 156 MHz
Output Clock Rise Time 0.8 to 2.0V, no load 1.5 ns
Output Clock Fall Time 0.8 to 2.0V, no load 1.5 ns
Output Clock Duty Cycle At VDD/2 45 50 55 %
Maximum Absolute Jitter, short term, 125 MHz No load, REF off ±50 ±75 ps
Maximum Jitter, one sigma, 125 MHz (x5) No load, REF off 18 25 ps
Phase Noise, relative to carrier, 125 MHz (x5) 100 Hz offset -105 -108 dBc/Hz
Phase Noise, relative to carrier, 125 MHz (x5) 1 kHz offset -120 -123 dBc/Hz
Phase Noise, relative to carrier, 125 MHz (x5) 10 kHz offset -128 -132 dBc/Hz
Phase Noise, relative to carrier, 125 MHz (x5) 100 kHz offset -121 -125 dBc/Hz
Electrical Specifications
Notes: 1. Stresses beyond those listed under Absolute Maximum Ratings could cause permanent damage to the device. Prolonged
exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability.
2. The phase relationship between input and output can change at power up. For a fixed phase relationship, see the ICS570
or ICS670.
3. Switching occurs nominally at VDD/2.